MC56F844xx Advance Information - Data Sheet

Freescale Semiconductor
Data Sheet: Technical Data
Document Number: MC56F844XX
Rev. 3, 06/2014
MC56F844XX
MC56F844XX
Supports the 56F84462VLH,
56F84452VLH, 56F84451VLF,
56F84442VLH, 56F84441VLF
Features
• This family of digital signal controllers (DSCs) is
based on the 32-bit 56800EX core. Each device
combines, on a single chip, the processing power of a
DSP and the functionality of an MCU with a flexible
set of peripherals to support many target applications:
– Industrial control
– Home appliances
– Smart sensors
– Fire and security systems
– Switched-mode power supply and power
management
– Uninterruptible Power Supply (UPS)
– Solar and wind power generator
– Power metering
– Motor control (ACIM, BLDC, PMSM, SR, stepper)
– Handheld power tools
– Circuit breaker
– Medical device/equipment
– Instrumentation
– Lighting
• DSC based on 32-bit 56800EX core
– Up to 60 MIPS at 60 MHz core frequency
– DSP and MCU functionality in a unified, C-efficient
architecture
• On-chip memory
– Up to 160 KB (128 KB + 32 KB) flash memory,
including up to 32 KB FlexNVM
– Up to 24 KB RAM
– Up to 2 KB FlexRAM with EEE capability
– 60 MHz program execution from both internal flash
memory and RAM
– On-chip flash memory and RAM can be mapped
into both program and data memory spaces
• Analog
– Two high-speed, 8-channel, 12-bit ADCs with
dynamic x2, x4 programmable amplifier
– One 20-channel, 16-bit ADC
– Up to four analog comparators with integrated 6-bit
DAC references
– One 12-bit DAC
• PWMs and timers
– One eFlexPWM module with up to 9 PWM outputs
– Two 16-bit quad timer (2 x 4 16-bit timers)
– Two Periodic Interval Timers (PITs)
– One Quadrature Decoder
– Two Programmable Delay Blocks (PDBs)
• Communication interfaces
– Two high-speed queued SCI (QSCI) modules with
LIN slave functionality
– One queued SPI (QSPI) module
– Two SMBus-compatible I2C ports
– One flexible controller area network (FlexCAN)
module
• Security and integrity
– Cyclic Redundancy Check (CRC) generator
– Computer operating properly (COP) watchdog
– External Watchdog Monitor (EWM)
• Clocks
– Two on-chip relaxation oscillators: 8 MHz (400 kHz
at standby mode) and 32 kHz
– Crystal / resonator oscillator
• System
– DMA controller
– Integrated power-on reset (POR) and low-voltage
interrupt (LVI) and brown-out reset module
– Inter-module crossbar connection
– JTAG/enhanced on-chip emulation (EOnCE) for
unobtrusive, real-time debugging
Freescale reserves the right to change the detail specifications as may be
required to permit improvements in the design of its products.
© 2014 Freescale Semiconductor, Inc.
• Operating characteristics
– Single supply: 3.0 V to 3.6 V
– 5 V–tolerant I/O (except RESETB pin)
• LQFP packages:
– 48-pin
– 64-pin
MC56F844XX Data Sheet, Rev. 3, 06/2014.
2
Freescale Semiconductor, Inc.
Table of Contents
1
Overview.................................................................................4
7
Ratings....................................................................................33
1.1
MC56F844xx/5xx/7xx product family............................4
7.1
Thermal handling ratings...............................................33
1.2
56800EX 32-bit Digital Signal Controller (DSC) core....5
7.2
Moisture handling ratings..............................................33
1.3
Operation parameters...................................................6
7.3
ESD handling ratings.....................................................33
1.4
On-chip memory and memory protection......................6
7.4
Voltage and current operating ratings...........................34
1.5
Interrupt Controller........................................................7
1.6
Peripheral highlights......................................................7
8.1
General characteristics..................................................35
1.7
Block diagrams..............................................................13
8.2
AC electrical characteristics..........................................35
2
MC56F844xx signal and pin descriptions...............................16
8.3
Nonswitching electrical specifications...........................36
3
Signal groups..........................................................................26
8.4
Switching specifications................................................42
4
Ordering parts.........................................................................27
8.5
Thermal specifications...................................................43
4.1
5
6
Determining valid orderable parts.................................27
8
9
General...................................................................................35
Peripheral operating requirements and behaviors..................44
Part identification.....................................................................27
9.1
Core modules................................................................44
5.1
Description....................................................................27
9.2
System modules............................................................46
5.2
Format...........................................................................27
9.3
Clock modules...............................................................46
5.3
Fields.............................................................................28
9.4
Memories and memory interfaces.................................49
5.4
Example........................................................................28
9.5
Analog...........................................................................52
Terminology and guidelines....................................................28
9.6
PWMs and timers..........................................................61
6.1
Definition: Operating requirement.................................28
9.7
Communication interfaces.............................................62
6.2
Definition: Operating behavior.......................................29
10 Design Considerations............................................................68
6.3
Definition: Attribute........................................................29
10.1 Thermal design considerations.....................................68
6.4
Definition: Rating...........................................................30
10.2 Electrical design considerations....................................70
6.5
Result of exceeding a rating..........................................30
11 Obtaining package dimensions...............................................71
6.6
Relationship between ratings and operating
12 Pinout......................................................................................71
requirements.................................................................30
12.1 Signal Multiplexing and Pin Assignments......................71
6.7
Guidelines for ratings and operating requirements.......31
12.2 Pinout diagrams............................................................73
6.8
Definition: Typical value................................................31
13 Product documentation...........................................................76
6.9
Typical value conditions................................................32
14 Revision history.......................................................................76
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
3
Overview
1 Overview
1.1 MC56F844xx/5xx/7xx product family
The following table lists major features, including features that differ among members of
the family. Features not listed are shared by all members of the family.
Table 1. 56F844xx/5xx/7xx family
Part
Number
MC56F84
789
786
769
766
763
553
550
543
540
587
585
567
565
462
452
451
442
441
Core freq.
(MHz)
100
100
100
100
100
80
80
80
80
80
80
80
80
60
60
60
60
60
Flash
memory
(KB)
256
256
128
128
128
96
96
64
64
256
256
128
128
128
96
96
64
64
FlevNVM/
FlexRAM
(KB)
32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2 32/2
Total flash
memory
(KB)1
288
288
160
160
160
128
128
96
96
288
288
160
160
160
128
128
96
96
RAM (KB)
32
32
24
24
24
16
16
8
8
32
32
24
24
24
16
16
8
8
Memory
resource
protection
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
External
Watchdog
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
12-bit
2x8
Cyclic ADC
Channels
(ADCA and
ADCB)
2x8
2x8
2x8
2x8
2x8
2x5
2x8
2x5
2x8
2x8
2x8
2x8
2x8
2x8
2x5
2x8
2x5
12-bit
300
Cyclic ADC ns
Conversion
time
(ADCA and
ADCB)
300
ns
300
ns
300
ns
300
ns
300
ns
300
ns
300
ns
300
ns
600
ns
600
ns
600
ns
600
ns
600
ns
600
ns
600
ns
600
ns
600
ns
16-bit SAR
ADC (with
Temperatu
re Sensor)
channels
(ADCC)
16
10
16
10
8
8
̶
8
̶
16
10
16
10
̶
8
̶
8
̶
PWMA
High-res
channels
8
8
8
8
8
8
6
8
6
0
0
0
0
0
0
0
0
0
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
4
Freescale Semiconductor, Inc.
Overview
Table 1. 56F844xx/5xx/7xx family (continued)
Part
Number
MC56F84
789
786
769
766
763
553
550
543
540
587
585
567
565
462
452
451
442
441
PWMA Std
channels
4
1
4
1
1
1
0
1
0
12
12
12
12
9
9
6
9
6
PWMA
Input
capture
channels
12
9
12
9
9
9
6
9
6
12
12
12
12
9
9
6
9
6
PWMB Std
channels
12
92
12
92
̶
̶
̶
̶
̶
12
92
12
92
̶
̶
̶
̶
̶
PWMB
Input
capture
channels
12
7
12
7
̶
̶
̶
̶
̶
12
7
12
7
̶
̶
̶
̶
̶
12-bit DAC
1
1
1
1
1
1
1
1
1
1
1
̶
̶
1
̶
̶
̶
̶
Quad
Decoder
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
DMA
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
CMP
4
4
4
4
4
4
3
4
3
4
4
4
4
4
4
3
4
3
QSCI
3
3
3
3
2
2
2
2
2
3
3
3
3
2
2
2
2
2
QSPI
3
2
3
2
1
1
1
1
1
3
2
3
2
1
1
1
1
1
I2C/SMBus
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
FlexCAN
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
LQFP
package
pin count
100
80
100
80
64
64
48
64
48
100
80
100
80
64
64
48
64
48
1. This total includes FlexNVM and assumes no FlexNVM is used with FlexRAM for EEPROM.
2. The outputs of PWMB_3A and PWM_3B are available through the on-chip inter-module crossbar.
1.2 56800EX 32-bit Digital Signal Controller (DSC) core
• Efficient 32-bit 56800EX Digital Signal Processor (DSP) engine with modified dual
Harvard architecture:
• Three internal address buses
• Four internal data buses: two 32-bit primary buses, one 16-bit secondary data
bus, and one 16-bit instruction bus
• 32-bit data accesses
• Supports concurrent instruction fetches in the same cycle, and dual data accesses
in the same cycle
• 20 addressing modes
• As many as 60 million instructions per second (MIPS) at 60 MHz core frequency
• 162 basic instructions
• Instruction set supports both fractional arithmetic and integer arithmetic
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
5
Overview
• 32-bit internal primary data buses support 8-bit, 16-bit, and 32-bit data movement,
plus addition, subtraction, and logical operations
• Single-cycle 16 × 16-bit -> 32-bit and 32 x 32-bit -> 64-bit multiplier-accumulator
(MAC) with dual parallel moves
• 32-bit arithmetic and logic multi-bit shifter
• Four 36-bit accumulators, including extension bits
• Parallel instruction set with unique DSP addressing modes
• Hardware DO and REP loops
• Bit reverse address mode, which effectively supports DSP and Fast Fourier
Transform algorithms
• Full shadowing of the register stack for zero-overhead context saves and restores:
nine shadow registers correspond to nine address registers (R0, R1, R2, R3, R4, R5,
N, N3, M01)
• Instruction set supports both DSP and controller functions
• Controller-style addressing modes and instructions enable compact code
• Enhanced bit manipulation instruction set
• Efficient C compiler and local variable support
• Software subroutine and interrupt stack, with the stack's depth limited only by
memory
• Priority level setting for interrupt levels
• JTAG/Enhanced On-Chip Emulation (OnCE) for unobtrusive, real-time debugging
that is independent of processor speed
1.3 Operation parameters
• Up to 60 MHz operation at -40 °C to 105 °C ambient temperature
• Single 3.3 V power supply
• Supply range: VDD - VSS = 2.7 V to 3.6 V, VDDA - VSSA = 2.7 V to 3.6 V
1.4 On-chip memory and memory protection
• Modified dual Harvard architecture permits as many as three simultaneous accesses
to program and data memory
• Internal flash memory with security and protection to prevent unauthorized access
• Memory resource protection (MRP) unit to protect supervisor programs and
resources from user programs
• Programming code can reside in flash memory during flash programming
• The dual-ported RAM controller supports concurrent instruction fetches and data
accesses, or dual data accesses, by the DSC core.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
6
Freescale Semiconductor, Inc.
Peripheral highlights
• Concurrent accesses provide increased performance.
• The data and instruction arrive at the core in the same cycle, reducing latency.
• On-chip memory
• Up to 144 KW program/data flash memory, including FlexNVM
• Up to 16 KW dual port data/program RAM
• Up to 16 KW FlexNVM, which can be used as additional program or data flash
memory
• Up to 1 KW FlexRAM, which can be configured as enhanced EEPROM (used in
conjunction with FlexNVM) or used as additional RAM
1.5 Interrupt Controller
• Five interrupt priority levels
• Three user-programmable priority levels for each interrupt source: level 0, level
1, level 2
• Unmaskable level 3 interrupts include illegal instruction, hardware stack
overflow, misaligned data access, SWI3 instruction
• Interrupt level 3 is highest priority and non-maskable. Its sources include:
• Illegal instructions
• Hardware stack overflow
• SWI instruction
• EOnce interrupts
• Misaligned data accesses
• Lowest-priority software interrupt: level LP
• Support for nested interrupts, so that a higher priority level interrupt request can
interrupt lower priority interrupt subroutine
• Masking of interrupt priority level is managed by the 56800EX core
• Two programmable fast interrupts that can be assigned to any interrupt source
• Notification to System Integration Module (SIM) to restart clock when in wait and
stop states
• Ability to relocate interrupt vector table
1.6 Peripheral highlights
1.6.1 Flex Pulse Width Modulator (FlexPWM)
• One PWM module contains 4 identical submodules, with up to 3 outputs per
submodule, and up to 60 MHz PWM operating clock
• 16 bits of resolution for center, edge-aligned, and asymmetrical PWMs
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
7
Peripheral highlights
• PWM outputs can be configured as complementary output pairs or independent
outputs
• Dedicated time-base counter with period and frequency control per submodule
• Independent top and bottom deadtime insertion for each complementary pair
• Independent control of both edges of each PWM output
• Enhanced input capture and output compare functionality on each input:
• Channels not used for PWM generation can be used for buffered output compare
functions.
• Channels not used for PWM generation can be used for input capture functions.
• Enhanced dual edge capture functionality
• Synchronization of submodule to external hardware (or other PWM) is supported.
• Double-buffered PWM registers
• Integral reload rates from 1 to 16
• Half-cycle reload capability
• Multiple output trigger events can be generated per PWM cycle via hardware.
• Support for double-switching PWM outputs
• Up to eight fault inputs can be assigned to control multiple PWM outputs
• Programmable filters for fault inputs
• Independently programmable PWM output polarity
• Individual software control of each PWM output
• All outputs can be programmed to change simultaneously via a FORCE_OUT event.
• PWMX pin can optionally output a third PWM signal from each submodule
• Option to supply the source for each complementary PWM signal pair from any of
the following:
• Crossbar module outputs
• External ADC input, taking into account values set in ADC high and low limit
registers
1.6.2 12-bit Analog-to-Digital Converter (Cyclic type)
• Two independent 12-bit analog-to-digital converters (ADCs):
• 2 x 8-channel external inputs
• Built-in x1, x2, x4 programmable gain pre-amplifier
• Maximum ADC clock frequency up to 10 MHz, having period as low as 100-ns
• Single conversion time of 8.5 ADC clock cycles
• Additional conversion time of 6 ADC clock cycles
• Support of analog inputs for single-ended and differential conversions
• Sequential, parallel, and independent scan mode
• First 8 samples have offset, limit and zero-crossing calculation supported
• ADC conversions can be synchronized by any module connected to the internal
crossbar module, such as PWM, timer, GPIO, and comparator modules.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
8
Freescale Semiconductor, Inc.
Peripheral highlights
• Support for simultaneous triggering and software-triggering conversions
• Support for a multi-triggering mode with a programmable number of conversions on
each trigger
• Each ADC has ability to scan and store up to 8 conversion results.
• Current injection protection
1.6.3 Inter-Module Crossbar and AND-OR-INVERT logic
• Provides generalized connections between and among on-chip peripherals: ADCs,
12-bit DAC, comparators, quad-timers, FlexPWMs, PDBs, EWM, quadrature
decoder, and select I/O pins
• User-defined input/output pins for all modules connected to the crossbar
• DMA request and interrupt generation from the crossbar
• Write-once protection for all registers
• AND-OR-INVERT function provides a universal Boolean function generator that
uses a four-term sum-of-products expression, with each product term containing true
or complement values of the four selected inputs (A, B, C, D).
1.6.4 Comparator
•
•
•
•
•
•
•
Full rail-to-rail comparison range
Support for high and low speed modes
Selectable input source includes external pins and internal DACs
Programmable output polarity
6-bit programmable DAC as a voltage reference per comparator
Three programmable hysteresis levels
Selectable interrupt on rising-edge, falling-edge, or toggle of a comparator output
1.6.5 12-bit Digital-to-Analog Converter
• 12-bit resolution
• Powerdown mode
• Automatic mode allows the DAC to automatically generate pre-programmed output
waveforms, including square, triangle, and sawtooth waveforms (for applications like
slope compensation)
• Programmable period, update rate, and range
• Output can be routed to an internal comparator, ADC, or optionally to an off-chip
destination
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
9
Peripheral highlights
1.6.6 Quad Timer
• Four 16-bit up/down counters, with a programmable prescaler for each counter
• Operation modes: edge count, gated count, signed count, capture, compare, PWM,
signal shot, single pulse, pulse string, cascaded, quadrature decode
• Programmable input filter
• Counting start can be synchronized across counters
1.6.7 Queued Serial Communications Interface (QSCI) modules
•
•
•
•
•
•
•
•
Operating clock can be up to two times the CPU operating frequency
Four-word-deep FIFOs available on both transmit and receive buffers
Standard mark/space non-return-to-zero (NRZ) format
13-bit integer and 3-bit fractional baud rate selection
Full-duplex or single-wire operation
Programmable 8-bit or 9-bit data format
Error detection capability
Two receiver wakeup methods:
• Idle line
• Address mark
• 1/16 bit-time noise detection
1.6.8 Queued Serial Peripheral Interface (QSPI) modules
•
•
•
•
•
•
•
•
•
Maximum 25 Mbit/s baud rate
Selectable baud rate clock sources for low baud rate communication
Baud rate as low as Baudrate_Freq_in / 8192
Full-duplex operation
Master and slave modes
Double-buffered operation with separate transmit and receive registers
Four-word-deep FIFOs available on transmit and receive buffers
Programmable length transmissions (2 bits to 16 bits)
Programmable transmit and receive shift order (MSB as first bit transmitted)
1.6.9 Inter-Integrated Circuit (I2C)/System Management Bus (SMBus)
modules
• Compatible with I2C bus standard
• Support for System Management Bus (SMBus) specification, version 2
• Multi-master operation
MC56F844XX Data Sheet, Rev. 3, 06/2014.
10
Freescale Semiconductor, Inc.
Peripheral highlights
•
•
•
•
•
General call recognition
10-bit address extension
Start/Repeat and Stop indication flags
Support for dual slave addresses or configuration of a range of slave addresses
Programmable glitch input filter
1.6.10 Flex Controller Area Network (FlexCAN) module
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Clock source from PLL or XOSC/CLKIN
Implementation of CAN protocol Version 2.0 A/B
Standard and extended data frames
Data length of 0 to 8 bytes
Programmable bit rate up to 1 Mbps
Support for remote frames
Sixteen Message Buffers: each Message Buffer can be configured as receive or
transmit, and supports standard and extended messages
Individual Rx Mask Registers per Message Buffer
Internal timer for time-stamping of received and transmitted messages
Listen-only mode capability
Programmable loopback mode, supporting self-test operation
Programmable transmission priority scheme: lowest ID, lowest buffer number, or
highest priority
Global network time, synchronized by a specific message
Low power modes, with programmable wakeup on bus activity
1.6.11 Computer Operating Properly (COP) watchdog
• Programmable timeout period
• Support for operation in all power modes: run mode, wait mode, stop mode
• Causes loss of reference reset 128 cycles after loss of reference clock to the PLL is
detected
• Selectable reference clock source in support of EN60730 and IEC61508
• Selectable clock sources:
• External crystal oscillator/external clock source
• On-chip low-power 32 kHz oscillator
• System bus (IPBus up to 60 MHz)
• 8 MHz / 400 kHz ROSC
• Support for interrupt triggered when the counter reaches the timeout value
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
11
Clock sources
1.6.12 Power supervisor
• Power-on reset (POR) to reset CPU, peripherals, and JTAG/EOnCE controllers (VDD
> 2.1 V)
• Brownout reset (VDD < 1.9 V)
• Critical warn low-voltage interrupt (LVI2.0)
• Peripheral low-voltage interrupt (LVI2.7)
1.6.13 Phase-locked loop
•
•
•
•
Wide programmable output frequency: 240 MHz to 400 MHz
Input reference clock frequency: 8 MHz to 16 MHz
Detection of loss of lock and loss of reference clock
Ability to power down
1.6.14 Clock sources
1.6.14.1 On-chip oscillators
• Tunable 8 MHz relaxation oscillator with 400 kHz at standby mode (divide-by-two
output)
• 32 kHz low frequency clock as secondary clock source for COP, EWM, PIT
1.6.14.2 Crystal oscillator
• Support for both high ESR crystal oscillator (ESR greater than 100 Ω) and ceramic
resonator
• Operating frequency: 4–16 MHz
1.6.15 Cyclic Redundancy Check (CRC) generator
•
•
•
•
•
Hardware 16/32-bit CRC generator
High-speed hardware CRC calculation
Programmable initial seed value
Programmable 16/32-bit polynomial
Error detection for all single, double, odd, and most multi-bit errors
MC56F844XX Data Sheet, Rev. 3, 06/2014.
12
Freescale Semiconductor, Inc.
Clock sources
• Option to transpose input data or output data (CRC result) bitwise or bytewise,1
which is required for certain CRC standards
• Option for inversion of final CRC result
1.6.16 General Purpose I/O (GPIO)
•
•
•
•
•
•
•
5 V tolerance (except RESETB pin)
Individual control of peripheral mode or GPIO mode for each pin
Programmable push-pull or open drain output
Configurable pullup or pulldown on all input pins
All pins (except JTAG and RESETB) default to be GPIO inputs
2 mA / 9 mA source/sink capability
Controllable output slew rate
1.7 Block diagrams
The 56800EX core is based on a modified dual Harvard-style architecture, consisting of
three execution units operating in parallel, and allowing as many as six operations per
instruction cycle. The MCU-style programming model and optimized instruction set
enable straightforward generation of efficient and compact code for the DSP and control
functions. The instruction set is also efficient for C compilers, to enable rapid
development of optimized control applications.
The device's basic architecture appears in Figure 1 and Figure 2. Figure 1 shows how the
56800EX system buses communicate with internal memories, and the IPBus interface
and the internal connections among the units of the 56800EX core. Figure 2 shows the
peripherals and control blocks connected to the IPBus bridge. See the specific device’s
Reference Manual for details.
1.
A bytewise transposition is not possible when accessing the CRC data register via 8-bit accesses. In this case, user
software must perform the bytewise transposition.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
13
Clock sources
DSP56800EX Core
Program Control Unit
PC
LA
LA2
HWS0
HWS1
FIRA
OMR
SR
LC
LC2
FISR
Address
Generation
Unit
(AGU)
Instruction
Decoder
Interrupt
Unit
ALU1
ALU2
R0
R1
R2
R2
R3
R3
R4
R4
R5
R5
N
M01
N3
Looping
Unit
Program
Memory
SP
XAB1
XAB2
PAB
PDB
Data/
Program
RAM
CDBW
CDBR
XDB2
A2
B2
C2
D2
BitManipulation
Unit
Enhanced
OnCE™
JTAG TAP
Y
A1
B1
C1
D1
Y1
Y0
X0
MAC and ALU
A0
B0
C0
D0
IPBus
Interface
Data
Arithmetic
Logic Unit
(ALU)
Multi-Bit Shifter
Figure 1. 56800EX basic block diagram
MC56F844XX Data Sheet, Rev. 3, 06/2014.
14
Freescale Semiconductor, Inc.
Clock sources
56800EX CPU
Address
Generation
Unit (AGU)
Bit
Manipulation
Unit
Arithmetic
Logic Unit
(ALU)
Core Data Bus
Secondary Data Bus
Crystal OSC
Internal 32 kHz
CRC
Clock MUX
Internal 8 MHz
PLL
Platform Bus
Crossbar Swirch
Program
Controller
(PC)
Program Bus
Memory Resource
Protection Unit
4
EOnCE
Flash Controller
and Cache
JTAG
Program/Data Flash
Up to 128KB
Data Flash
32KB
FlexRAM
2KB
Data/Program RAM
Up to 24KB
DMA Controller
Interrupt Controller
Watchdog (COP)
Power Management
Controller (PMC)
Periodic Interrupt
Timer (PIT) 0, 1
System Integration
Module (SIM)
Peripheral Bus
FlexCAN
I2C
0, 1
QSPI
0
QSCI
0, 1
Quad Timer eFlexPWM A
A&B
Quadrature
Decoder
Inter Module Crossbar
Inputs
Inter Module
connection
Inter Module Crossbar Outputs
Inter-Module
Crossbar B
Peripheral Bus
AND-OR-INV
Logic
GPIO & Peripheral MUX
Inter-Module
Crossbar A
Inter Module Crossbar Outputs
Inter Module Crossbar Inputs
Package
Pins
EWM
ADC A ADC B
12-bit 12-bit
ADC C
16-bit
Comparators with
6-bit DAC A,B,C,D
DAC
12-bit
PDB
0, 1
Peripheral Bus
Figure 2. System diagram
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
15
MC56F844xx signal and pin descriptions
2 MC56F844xx signal and pin descriptions
After reset, each pin is configured for its primary function (listed first). Any alternative
functionality, shown in parentheses, must be programmed through the GPIO module
peripheral enable registers (GPIO_x_PER) and the SIM module GPIO peripheral select
(GPSx) registers. All GPIO ports can be individually programmed as an input or output
(using bit manipulation).
• There are 2 PWM modules: PWMA, PWMB. Each PWM module has 4 submodules:
PWMA has PWMA_0, PWMA_1, PWMA_2, PWMA_3; PWMB has PWMB_0,
PWMB_1, PWMB_2, PWMB_3. Each PWM module's submodules have 3 pins (A,
B, X) each, with the syntax for the pins being PWMA_0A, PWMA_0B, PWMA_0X,
and PWMA_1A, PWMA_1B, PWMA_1X, and so on. Each submodule pin can be
configured as a PWM output or as a capture input.
• EWM_OUT_B is the output of the External Watchdog Module (EWM), and is active
low (denoted by the "_B" part of the syntax).
For the MC56F844XX products, which use 48-pin LQFP and 64-pin LQFP packages:
Table 2. Signal descriptions
Signal Name
64
LQFP
48
LQFP
VDD
29
-
VDD
44
32
VDD
60
44
VSS
30
22
VSS
43
31
VSS
61
45
VDDA
22
VSSA
Type
State
During
Reset1
Signal Description
Supply
Supply
I/O Power — Supplies 3.3 V power to the chip I/
O interface.
Supply
Supply
I/O Ground — Provide ground for the device I/O
interface.
15
Supply
Supply
Analog Power — Supplies 3.3 V power to the
analog modules. It must be connected to a clean
analog power supply.
23
16
Supply
Supply
Analog Ground — Supplies an analog ground to
the analog modules. It must be connected to a
clean power supply.
VCAP
26
19
VCAP
57
43
On-chip
regulator
output
voltage
On-chip
regulator
output
voltage
Connect a 2.2uF or greater bypass capacitor
between this pin and VSS to stabilize the core
voltage regulator output required for proper
device operation. V<sub>CAP</sub> is used to
observe core voltage.
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
16
Freescale Semiconductor, Inc.
MC56F844xx signal and pin descriptions
Table 2. Signal descriptions (continued)
Signal Name
TDI
64
LQFP
64
48
LQFP
48
(GPIOD0)
TDO
62
46
(GPIOD1)
TCK
1
1
(GPIOD2)
TMS
63
47
Type
Input
State
During
Reset1
Input,
internal
pullup
enabled
Signal Description
Test Data Input — Provides a serial input data
stream to the JTAG/EOnCE port. It is sampled
on the rising edge of TCK and has an internal
pullup resistor. After reset, the default state is
TDI.
Input/Output Input,
internal
pullup
enabled
GPIO Port D0
Output
Test Data Output — This tri-stateable pin
provides a serial output data stream from the
JTAG/EOnCE port. It is driven in the shift-IR and
shift-DR controller states, and it changes on the
falling edge of TCK. After reset, the default state
is TDO.
Output
Input/Output Input,
internal
pullup
enabled
GPIO Port D1
Input
Test Clock Input — This input pin provides a
gated clock to synchronize the test logic and
shift serial data to the JTAG/EOnCE port. The
pin is connected internally to a pullup resistor. A
Schmitt-trigger input is used for noise immunity.
After reset, the default state is TCK.
Input,
internal
pullup
enabled
Input/Output Input,
internal
pullup
enabled
GPIO Port D2
Input
Test Mode Select Input — Used to sequence
the JTAG TAP controller state machine. It is
sampled on the rising edge of TCK and has an
internal pullup resistor. After reset, the default
state is TMS.
Input,
internal
pullup
enabled
NOTE: Always tie the TMS pin to VDD through
a 2.2K resistor, if needed to keep an
on-board debug capability. Otherwise,
tie the TMS pin directly to VDD.
(GPIOD3)
Input/Output Input,
internal
pullup
enabled
GPIO Port D2
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
17
MC56F844xx signal and pin descriptions
Table 2. Signal descriptions (continued)
Signal Name
RESET or RESETB
64
LQFP
2
48
LQFP
2
(GPIOD4)
Type
Input
State
During
Reset1
Input,
internal
pullup
enabled
(This pin is
3.3V only.)
Signal Description
Reset — A direct hardware reset on the
processor. When RESET is asserted low, the
device is initialized and placed in the reset state.
A Schmitt-trigger input is used for noise
immunity. The internal reset signal is deasserted
synchronously with the internal clocks after a
fixed number of internal clocks. After reset, the
default state is RESET. To filter noise on the
RESETB pin, install a capacitor (up to 0.1 uF)
on it.
Input/ Open- Input,
drain Output internal
pullup
enabled
GPIO Port D4 RESET functionality is disabled in
this mode and the device can be reset only
through Power-On Reset (POR), COP reset, or
software reset.
Input/Output Input
GPIO Port A0: After reset, the default state is
GPIOA0.
(ANA0&CMPA_IN3)
Input
ANA0 is input to channel 0 of ADCA; CMPA_IN3
is input 3 of analog comparator A. When used
as an analog input, the signal goes to both
places (ANA0 and CMPA_IN3), but the glitch on
this pin during ADC sampling may interfere with
other analog inputs shared on this pin.
(CMPC_O)
Output
Analog comparator C output
Input/Output Input
GPIO Port A1: After reset, the default state is
GPIOA1.
Input
ANA1 is input to channel 1 of ADCA; CMPA_IN0
is input 0 of analog comparator A. When used
as an analog input, the signal goes to both
places (ANA1 and CMPA_IN0), but the glitch on
this pin during ADC sampling may interfere with
other analog inputs shared on this pin.
Input/Output Input
GPIO Port A2: After reset, the default state is
GPIOA2.
Input
ANA2 is input to channel 2 of ADCA; VREFHA
is the reference high of ADCA; CMPA_IN1 is
input 1 of analog comparator A. When used as
an analog input, the signal goes to both places
(ANA2 and CMPA_IN1), but the glitch on this
pin during ADC sampling may interfere with
other analog inputs shared on this pin. This
input can be configured as either ANA2 or
VREFHA using the ADCA control register.
GPIOA0
GPIOA1
13
14
9
10
(ANA1&CMPA_IN0)
GPIOA2
(ANA2&VREFHA&
CMPA_IN1)
15
11
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
18
Freescale Semiconductor, Inc.
MC56F844xx signal and pin descriptions
Table 2. Signal descriptions (continued)
Signal Name
GPIOA3
64
LQFP
16
48
LQFP
12
(ANA3&VREFLA&
CMPA_IN2)
GPIOA4
12
8
(ANA4&ANC8&CMPD_IN0
)
GPIOA5
11
-
(ANA5&ANC9)
GPIOA6
10
-
(ANA6&ANC10)
GPIOA7
9
(ANA7&ANC11)
-
Type
State
During
Reset1
Signal Description
Input/Output Input
GPIO Port A3: After reset, the default state is
GPIOA3.
Input
ANA3 is input to channel 3 of ADCA; VREFLA is
the reference low of ADCA; CMPA_IN2 is input
2 of analog comparator A. When used as an
analog input, the signal goes to both places
(ANA3 and CMPA_IN2), but the glitch on this
pin during ADC sampling may interfere with
other analog inputs shared on this pin. This
input can be configured as either ANA3 or
VREFLA using the ADCA control register.
Input/Output Input
GPIO Port A4: After reset, the default state is
GPIOA4.
Input
ANA4 is input to channel 4 of ADCA; ANC8 is
input to channel 8 of ADCC; CMPD_IN0 is input
0 to comparator D. When used as an analog
input, the signal goes to all three places (ANA4
and ANC8 and CMPA_IN0), but the glitchon this
pin during ADC sampling may interfere with
other analog inputs shared on this pin.
Input/Output Input
GPIO Port A5: After reset, the default state is
GPIOA5.
Input
ANA5 is input to channel 5 of ADCA; ANC9 is
input to channel 9 of ADCC. When used as an
analog input, the signal goes to both places
(ANA5 and ANC9), but the glitch on this pin
during ADC sampling may interfere with other
analog inputs shared on this pin.
Input/ Output Input
GPIO Port A6: After reset, the default state is
GPIOA6.
Input
ANA6 is input to channel 5 of ADCA; ANC10 is
input to channel 10 of ADCC. When used as an
analog input, the signal goes to both places
(ANA6 and ANC10), but the glitch on this pin
during ADC sampling may interfere with other
analog inputs shared on this pin.
Input/Output Input
GPIO Port A7: After reset, the default state is
GPIOA7.
Input
ANA7 is input to channel 7 of ADCA; ANC11 is
input to channel 11 of ADCC. When used as an
analog input, the signal goes to both places
(ANA7 and ANC11), but the glitch on this pin
during ADC sampling may interfere with other
analog inputs shared on this pin.
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
19
MC56F844xx signal and pin descriptions
Table 2. Signal descriptions (continued)
Signal Name
GPIOB0
64
LQFP
24
48
LQFP
17
(ANB0&CMPB_IN3)
GPIOB1
25
18
(ANB1&CMPB_IN0)
GPIOB2
27
20
(ANB2&VREFHB&CMPC_
IN3)
GPIOB3
28
21
(ANB3&VREFLB&CMPC_I
N0)
GPIOB4
(ANB4&ANC12&CMPC_IN
1)
21
14
Type
State
During
Reset1
Signal Description
Input/Output Input
GPIO Port B0: After reset, the default state is
GPIOB0.
Input
ANB0 is input to channel 0 of ADCB; CMPB_IN3
is input 3 of analog comparator B. When used
as an analog input, the signal goes to both
places (ANB0 and CMPB_IN3), but the glitch on
this pin during ADC sampling may interfere with
other analog inputs shared on this pin.
Input/ Output Input
GPIO Port B1: After reset, the default state is
GPIOB1.
Input
ANB1 is input to channel 1 of ADCB; CMPB_IN0
is input 0 of analog comparator B. When used
as an analog input, the signal goes to both
places (ANB1 and CMPB_IN0), but the glitch on
this pin during ADC sampling may interfere with
other analog inputs shared on this pin.
Input/ Output Input
GPIO Port B2: After reset, the default state is
GPIOB2.
Input
ANB2 is input to channel 2 of ADCB; VREFHB
is the reference high of ADCB; CMPC_IN3 is
input 3 of analog comparator C. When used as
an analog input, the signal goes to both places
(ANB2 and CMPC_IN3), but the glitch during
ADC sampling on this pin may interfere with
other analog inputs shared on this pin. This
input can be configured as either ANB2 or
VREFHB using the ADCB control register.
Input/ Output Input
GPIO Port B3: After reset, the default state is
GPIOB3.
Input
ANB3 is input to channel 3 of ADCB; VREFLB is
the reference low of ADCB; CMPC_IN0 is input
0 of analog comparator C. When used as an
analog input, the signal goes to both places
(ANB3 and CMPC_IN0), but the glitch during
ADC sampling on this pin may interfere with
other analog inputs shared on this pin. This
input can be configured as either ANB3 or
VREFLB using the ADCB control register.
Input/ Output Input
GPIO Port B4: After reset, the default state is
GPIOB4.
Input
ANB4 is input to channel 4 of ADCB; ANC12 is
input to channel 12 of ADCC; CMPC_IN1 is
input 1 of analog comparator C. When used as
an analog input, the signal goes to all three
places (ANB4 and ANC12 and CMPC_IN1), but
the glitch during ADC sampling on this pin may
interfere with other analog inputs shared on this
pin.
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
20
Freescale Semiconductor, Inc.
MC56F844xx signal and pin descriptions
Table 2. Signal descriptions (continued)
Signal Name
GPIOB5
64
LQFP
20
48
LQFP
-
Type
State
During
Reset1
Signal Description
Input/ Output Input
GPIO Port B5: After reset, the default state is
GPIOB5.
Input
ANB5 is input to channel 5 of ADCB; ANC13 is
input to channel 13 of ADCC; CMPC_IN2 is
input 2 of analog comparator C. When used as
an analog input, the signal goes to all three
places (ANB5 and ANC13 and CMPC_IN2), but
the glitch during ADC sampling on this pin may
interfere with other analog inputs shared on this
pin.
Input/ Output Input
GPIO Port B6: After reset, the default state is
GPIOB6.
Input
ANB6 is input to channel 6 of ADCB; ANC14 is
input to channel 14 of ADCC; CMPB_IN1 is
input 1 of analog comparator B. When used as
an analog input, the signal goes to all three
places (ANB6 and ANC14 and CMPB_IN1), but
the glitch during ADC sampling on this pin may
interfere with other analog inputs shared on this
pin.
Input/ Output Input
GPIO Port B7: After reset, the default state is
GPIOB7.
Input
ANB7 is input to channel 7 of ADCB; ANC15 is
input to channel 15 of ADCC; CMPB_IN2 is
input 2 of analog comparator B. When used as
an analog input, the signal goes to all three
places (ANB7 and ANC15 and CMPB_IN2), but
the glitch during ADC sampling on this pin may
interfere with other analog inputs shared on this
pin.
Input/Output Input
GPIO Port C0: After reset, the default state is
GPIOC0.
EXTAL
Analog Input
The external crystal oscillator input (EXTAL)
connects the internal crystal oscillator input to
an external crystal or ceramic resonator.
CLKIN0
Input
External clock input 0.2
Input/Output Input
GPIO Port C1: After reset, the default state is
GPIOC1.
Analog
Output
The external crystal oscillator output (XTAL)
connects the internal crystal oscillator output to
an external crystal or ceramic resonator.
(ANB5&ANC13&CMPC_IN
2)
GPIOB6
19
-
(ANB6&ANC14&CMPB_IN
1)
GPIOB7
17
-
(ANB7&ANC15&CMPB_IN
2)
GPIOC0
GPIOC1
3
4
(XTAL)
3
4
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
21
MC56F844xx signal and pin descriptions
Table 2. Signal descriptions (continued)
Signal Name
GPIOC2
64
LQFP
State
During
Reset1
Signal Description
GPIO Port C2: After reset, the default state is
GPIOC2.
(TXD0)
Output
SCI0 transmit data output or transmit/receive in
single-wire operation
(TB0)
Input/Output
Quad timer module B channel 0 input/output
(XB_IN2)
Input
Crossbar module input 2
(CLKO0)
Output
Buffered clock output 0: the clock source is
selected by clockout select (CLKOSEL) bits in
the clock output select register (CLKOUT) of the
SIM.
Input/ Output Input
GPIO Port C3: After reset, the default state is
GPIOC3.
(TA0)
Input/ Output
Quad timer module A channel 0 input/output
(CMPA_O)
Output
Analog comparator A output
(RXD0)
Input
SCI0 receive data input
(CLKIN1)
Input
External clock input 1
Input/ Output Input
GPIO Port C4: After reset, the default state is
GPIOC4.
(TA1)
Input/ Output
Quad timer module A channel 1 input/output
(CMPB_O)
Output
Analog comparator B output
(XB_IN8)
Input
Crossbar module input 8
(EWM_OUT_B)
Output
External Watchdog Module output
Input/ Output Input
GPIO Port C5: After reset, the default state is
GPIOC5.
(DACO)
Analog
Output
12-bit digital-to-analog output
(XB_IN7)
Input
Crossbar module input 7
Input/ Output Input,
GPIO Port C6: After reset, the default state is
GPIOC6.
(TA2)
Input/ Output
Quad timer module A channel 2 input/output
(XB_IN3)
Input
Crossbar module input 3
(CMP_REF)
Analog Input
Positive input 5 of analog comparator A and B
and C and D. Note: MC56F84451 and
MC56F84441 do not have CMPD.
Input/ Output Input
GPIO Port C7: After reset, the default state is
GPIOC7.
(SS0_B)
Input/ Output
In slave mode, SS0_B indicates to the SPI
module 0 that the current transfer is to be
received.
(TXD0)
Output
SCI0 transmit data output or transmit/receive in
single-wire operation
GPIOC4
GPIOC5
GPIOC6
GPIOC7
7
8
18
31
32
5
Type
Input/Output Input
GPIOC3
5
48
LQFP
6
7
13
23
24
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
22
Freescale Semiconductor, Inc.
MC56F844xx signal and pin descriptions
Table 2. Signal descriptions (continued)
Signal Name
GPIOC8
64
LQFP
State
During
Reset1
Signal Description
GPIO Port C8: After reset, the default state is
GPIOC8.
(MISO0)
Input/Output
Master in/slave out for SPI0 —In master mode,
MISO0 pin is the data input. In slave mode,
MISO0 pin is the data output. The MISO line of
a slave device is placed in the high-impedance
state if the slave device is not selected.
(RXD0)
Input
SCI0 receive data input
(XB_IN9)
Input
Crossbar module input 9
Input/ Output Input
GPIO Port C9: After reset, the default state is
GPIOC9.
(SCK0)
Input/ Output
SPI0 serial clock. In master mode, SCK0 pin is
an output, clocking slaved listeners. In slave
mode, SCK0 pin is the data clock input.
(XB_IN4)
Input
Crossbar module input 4
Input/ Output Input
GPIO Port C10: After reset, the default state is
GPIOC10.
(MOSI0)
Input/ Output
Master out/slave in for SPI0 — In master mode,
MOSI0 pin is the data output. In slave mode,
MOSI0 pin is the data input.
(XB_IN5)
Input
Crossbar module input 5
(MISO0)
Input/ Output
Master in/slave out for SPI0 — In master mode,
MISO0 pin is the data input. In slave mode,
MISO0 pin is the data output. The MISO line of
a slave device is placed in the high-impedance
state if the slave device is not selected.
Input/Output Input
GPIO Port C11: After reset, the default state is
GPIOC11.
(CANTX)
Open-drain
Output
CAN transmit data output
(SCL1)
Input/ Opendrain Output
I2C1 serial clock
(TXD1)
Output
SCI1 transmit data output or transmit/receive in
single wire operation
Input/ Output Input
GPIO Port C12: After reset, the default state is
GPIOC12.
(CANRX)
Input
CAN receive data input
(SDA1)
Input/ Opendrain Output
I2C1 serial data line
(RXD1)
Input
SCI1 receive data input
GPIOC10
GPIOC11
GPIOC12
34
35
37
38
25
Type
Input/Output Input
GPIOC9
33
48
LQFP
26
27
29
30
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
23
MC56F844xx signal and pin descriptions
Table 2. Signal descriptions (continued)
Signal Name
GPIOC13
64
LQFP
State
During
Reset1
Signal Description
GPIO Port C13: After reset, the default state is
GPIOC13.
(TA3)
Input/ Output
Quad timer module A channel 3 input/output
(XB_IN6)
Input
Crossbar module input 6
(EWM_OUT_B)
Output
External Watchdog Module output
Input/ Output Input
GPIO Port C14: After reset, the default state is
GPIOC14.
(SDA0)
Input/ Opendrain Output
I C0 serial data line
(XB_OUT4)
Input
Crossbar module output 4
Input/ Output Input
GPIO Port C15: After reset, the default state is
GPIOC15.
(SCL0)
Input/ Opendrain Output
I2C0 serial clock
(XB_OUT5)
Input
Crossbar module output 5
Input/ Output Input
GPIO Port E0: After reset, the default state is
GPIOE0.
Input/ Output
PWM module A, submodule 0, output B or input
capture B
Input/ Output Input
GPIO Port E1: After reset, the default state is
GPIOE1.
Input/ Output
PWM module A, submodule 0, output A or input
capture A
Input/ Output Input
GPIO Port E2: After reset, the default state is
GPIOE2.
Input/ Output
PWM module A, submodule 1, output B or input
capture B
Input/ Output Input
GPIO Port E3: After reset, the default state is
GPIOE3.
Input/ Output
PWM module A, submodule 1, output A or input
capture A
Input/ Output Input
GPIO Port E4: After reset, the default state is
GPIOE4.
Input/ Output
PWM module A, submodule 2, output B or input
capture B
GPIOC15
GPIOE0
55
56
45
37
Type
Input/ Output Input,
GPIOC14
49
48
LQFP
41
42
33
PWMA_0B
GPIOE1
46
34
(PWMA_0A)
GPIOE2
47
35
(PWMA_1B)
GPIOE3
48
38
(PWMA_1A)
GPIOE4
51
39
(PWMA_2B)
(XB_IN2)
2
Input
Crossbar module input 2
Input/ Output Input
GPIO Port E5: After reset, the default state is
GPIOE5.
(PWMA_2A)
Input/ Output
PWM module A, submodule 2, output A or input
capture A
(XB_IN3)
Input
Crossbar module input 3
GPIOE5
52
40
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
24
Freescale Semiconductor, Inc.
MC56F844xx signal and pin descriptions
Table 2. Signal descriptions (continued)
Signal Name
GPIOE6
64
LQFP
State
During
Reset1
Signal Description
GPIO Port E6: After reset, the default state is
GPIOE6.
(PWMA_3B)
Input/ Output
PWM module A, submodule 3, output B or input
capture B
(XB_IN4)
Input
Crossbar module input 4
(PWMB_2B)
Input/ Output
PWM module B, submodule 2, output B or input
capture B
Input/ Output Input
GPIO Port E7: After reset, the default state is
GPIOE7.
(PWMA_3A)
Input/ Output
PWM module A, submodule 3, output A or input
capture A
(XB_IN5)
Input
Crossbar module input 5
(PWMB_2A)
Input/ Output
PWM module B, submodule 2, output A or input
capture A
Input/ Output Input
GPIO Port F0: After reset, the default state is
GPIOF0.
(XB_IN6)
Input
Crossbar module input 6
(TB2)
Input/ Output
Quad timer module B Channel 2 input/output
Input/ Output Input
GPIO Port F1: After reset, the default state is
GPIOF1.
(CLKO1)
Output
Buffered clock output 1: the clock source is
selected by clockout select (CLKOSEL) bits in
the clock output select register (CLKOUT) of the
SIM.
(XB_IN7)
Input
Crossbar module input 7
(CMPD_O)
Output
Analog comparator D output
Input/ Output Input
GPIO Port F2: After reset, the default state is
GPIOF2.
(SCL1)
Input/ Opendrain Output
I2C1 serial clock
(XB_OUT6)
Output
Crossbar module output 6
Input/ Output Input
GPIO Port F3: After reset, the default state is
GPIOF3.
Input/ Opendrain Output
I2C1 serial data line
GPIOF0
GPIOF1
GPIOF2
GPIOF3
54
36
50
39
40
-
Type
Input/ Output Input
GPIOE7
53
48
LQFP
-
28
38
-
-
(SDA1)
(XB_OUT7)
Output
Crossbar module output 7
Input/ Output Input
GPIO Port F4: After reset, the default state is
GPIOF4.
(TXD1)
Output
SCI1 transmit data output or transmit/receive in
single wire operation
(XB_OUT8)
Output
Crossbar module output 8
GPIOF4
41
-
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
25
Signal groups
Table 2. Signal descriptions (continued)
Signal Name
GPIOF5
64
LQFP
State
During
Reset1
Signal Description
GPIO Port F5: After reset, the default state is
GPIOF5.
(RXD1)
Output
SCI1 receive data input
(XB_OUT9)
Output
Crossbar module output 9
Input/ Output Input
GPIO Port F6: After reset, the default state is
GPIOF6.
(TB2)
Input/ Output
Quad timer module B Channel 2 input/output
(PWMA_3X)
Input/ Output
PWM module A, submodule 3, output X or input
capture X
(PWMB_3X)
Input/ Output
PWM module B, submodule 3, output X or input
capture X
(XB_IN2)
Input
Crossbar module input 2
Input/ Output Input
GPIO Port F7: After reset, the default state is
GPIOF7.
(TB3)
Input/ Output
Quad timer module B Channel 3 input/output
(CMPC_O)
Output
Analog comparator C output
(XB_IN3)
Input
Crossbar module input 3
Input/ Output
GPIO Port F8: After reset, the default state is
GPIOF8.
(RXD0)
Input
SCI0 receive data input
(TB1)
Input/ Output
Quad timer module B Channel 1 input/output
(CMPD_O)
Output
Analog comparator D output
GPIOF7
GPIOF8
-
Type
Input/ Output Input
GPIOF6
42
48
LQFP
58
-
59
-
6
-
1. For all GPIO except GPIOD0 - GPIOD4, input only after reset (internal pullup and pull-down are disabled).
2. If CLKIN is selected as the device’s external clock input, then both the GPS_C0 bit (in GPS1) and the EXT_SEL bit (in
OCCS oscillator control register (OSCTL)) must be set. Also, the crystal oscillator should be powered down.
3 Signal groups
The input and output signals of the MC56F84xxx are organized into functional groups, as
listed in Table 3. Note that some package sizes may not be available for your specific
product. See MC56F844xx/5xx/7xx product family.
Table 3. Functional Group Pin Allocations
Functional Group
Number of Pins
48 LQFP
64 LQFP
80 LQFP
100 LQFP
Power Inputs (VDD, VDDA), Power Outputs (VCAP)
5
6
6
6
Ground (VSS, VSSA)
4
4
5
6
Reset
1
1
1
1
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
26
Freescale Semiconductor, Inc.
Ordering parts
Table 3. Functional Group Pin Allocations
(continued)
Functional Group
Number of Pins
48 LQFP
64 LQFP
80 LQFP
100 LQFP
eFlexPWM ports, not including fault pins
6
9
N/A
N/A
Queued Serial Peripheral Interface (QSPI) ports
5
5
8
15
Queued Serial Communications Interface (QSCI) ports
6
9
9
15
Inter-Integrated Circuit
(I2C)
4
6
6
6
12-bit Analog-to-Digital Converter (Cyclic ADC) inputs
interface ports
10
16
16
16
16-bit Analog-to-Digital Converter (SAR ADC) inputs
2
8
10
16
Analog Comparator inputs/outputs
10/4
13/6
13/6
16/6
12-bit Digital-to-Analog output
1
1
1
1
Quad Timer Module (TMR) ports
6
9
11
13
Controller Area Network (FlexCAN)
2
2
2
2
Inter-Module Crossbar inputs/outputs
12/2
16/6
19/17
25/19
Clock inputs/outputs
2/2
2/2
2/3
2/3
JTAG / Enhanced On-Chip Emulation (EOnCE)
4
4
4
4
4 Ordering parts
4.1 Determining valid orderable parts
Valid orderable part numbers are provided on the web. To determine the orderable part
numbers for this device, go to freescale.com and perform a part number search for the
following device numbers: MC56F84
5 Part identification
5.1 Description
Part numbers for the chip have fields that identify the specific part. You can use the
values of these fields to determine the specific part you have received.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
27
Terminology and guidelines
5.2 Format
Part numbers for this device have the following format: Q 56F8 4 C F P T PP N
5.3 Fields
This table lists the possible values for each field in the part number (not all combinations
are valid):
Field
Description
Values
Q
Qualification status
• MC = Fully qualified, general market flow
• PC = Prequalification
56F8
DSC family with flash memory and DSP56800/
DSP56800E/DSP56800EX core
• 56F8
4
DSC subfamily
• 4
C
Maximum CPU frequency (MHz)
• 4 = 60 MHz
• 5 = 80 MHz
• 7 = 100 MHz
F
Primary program flash memory size
•
•
•
•
4 = 64 KB
5 = 96 KB
6 = 128 KB
8 = 256 KB
P
Pin count
•
•
•
•
0 and 1 = 48
2 and 3 = 64
4, 5, and 6 = 80
7, 8, and 9 = 100
T
Temperature range (°C)
• V = –40 to 105
PP
Package identifier
•
•
•
•
N
Packaging type
• R = Tape and reel
• (Blank) = Trays
LF = 48LQFP
LH = 64LQFP
LK = 80LQFP
LL = 100LQFP
5.4 Example
This is an example part number: MC56F84789VLL
6 Terminology and guidelines
MC56F844XX Data Sheet, Rev. 3, 06/2014.
28
Freescale Semiconductor, Inc.
Terminology and guidelines
6.1 Definition: Operating requirement
An operating requirement is a specified value or range of values for a technical
characteristic that you must guarantee during operation to avoid incorrect operation and
possibly decreasing the useful life of the chip.
6.1.1 Example
This is an example of an operating requirement:
Symbol
VDD
Description
1.0 V core supply
voltage
Min.
0.9
Max.
1.1
Unit
V
6.2 Definition: Operating behavior
An operating behavior is a specified value or range of values for a technical
characteristic that are guaranteed during operation if you meet the operating requirements
and any other specified conditions.
6.2.1 Example
This is an example of an operating behavior:
Symbol
IWP
Description
Digital I/O weak pullup/ 10
pulldown current
Min.
Max.
130
Unit
µA
6.3 Definition: Attribute
An attribute is a specified value or range of values for a technical characteristic that are
guaranteed, regardless of whether you meet the operating requirements.
6.3.1 Example
This is an example of an attribute:
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
29
Terminology and guidelines
Symbol
CIN_D
Description
Input capacitance:
digital pins
Min.
—
Max.
7
Unit
pF
6.4 Definition: Rating
A rating is a minimum or maximum value of a technical characteristic that, if exceeded,
may cause permanent chip failure:
• Operating ratings apply during operation of the chip.
• Handling ratings apply when the chip is not powered.
6.4.1 Example
This is an example of an operating rating:
Symbol
VDD
Description
1.0 V core supply
voltage
Min.
–0.3
Max.
1.2
Unit
V
6.5 Result of exceeding a rating
Failures in time (ppm)
40
30
The likelihood of permanent chip failure increases rapidly as
soon as a characteristic begins to exceed one of its operating ratings.
20
10
0
Operating rating
Measured characteristic
MC56F844XX Data Sheet, Rev. 3, 06/2014.
30
Freescale Semiconductor, Inc.
Terminology and guidelines
6.6 Relationship between ratings and operating requirements
e
Op
ing
rat
r
(
ng
ati
in.
t (m
)
n.
mi
rat
e
Op
ing
)
t (m
e
ir
qu
re
n
me
ing
rat
e
Op
ax
.)
e
ir
qu
re
n
me
ing
rat
e
Op
ng
ati
ax
(m
.)
r
Fatal range
Degraded operating range
Normal operating range
Degraded operating range
Fatal range
Expected permanent failure
- No permanent failure
- Possible decreased life
- Possible incorrect operation
- No permanent failure
- Correct operation
- No permanent failure
- Possible decreased life
- Possible incorrect operation
Expected permanent failure
–∞
∞
Operating (power on)
g
lin
nd
Ha
in
rat
n.)
mi
g(
nd
Ha
g
lin
ing
rat
ax
(m
.)
Fatal range
Handling range
Fatal range
Expected permanent failure
No permanent failure
Expected permanent failure
–∞
Handling (power off)
∞
6.7 Guidelines for ratings and operating requirements
Follow these guidelines for ratings and operating requirements:
• Never exceed any of the chip’s ratings.
• During normal operation, don’t exceed any of the chip’s operating requirements.
• If you must exceed an operating requirement at times other than during normal
operation (for example, during power sequencing), limit the duration as much as
possible.
6.8 Definition: Typical value
A typical value is a specified value for a technical characteristic that:
• Lies within the range of values specified by the operating behavior
• Given the typical manufacturing process, is representative of that characteristic
during operation when you meet the typical-value conditions or other specified
conditions
Typical values are provided as design guidelines and are neither tested nor guaranteed.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
31
Terminology and guidelines
6.8.1 Example 1
This is an example of an operating behavior that includes a typical value:
Symbol
Description
IWP
Digital I/O weak
pullup/pulldown
current
Min.
10
Typ.
70
Max.
130
Unit
µA
6.8.2 Example 2
This is an example of a chart that shows typical values for various voltage and
temperature conditions:
5000
4500
4000
TJ
IDD_STOP (μA)
3500
150 °C
3000
105 °C
2500
25 °C
2000
–40 °C
1500
1000
500
0
0.90
0.95
1.00
1.05
1.10
VDD (V)
6.9 Typical value conditions
Typical values assume you meet the following conditions (or other conditions as
specified):
Symbol
Description
Value
Unit
TA
Ambient temperature
25
°C
VDD
3.3 V supply voltage
3.3
V
MC56F844XX Data Sheet, Rev. 3, 06/2014.
32
Freescale Semiconductor, Inc.
Ratings
7 Ratings
7.1 Thermal handling ratings
Symbol
Description
Min.
Max.
Unit
Notes
TSTG
Storage temperature
–55
150
°C
1
TSDR
Solder temperature, lead-free
—
260
°C
2
1. Determined according to JEDEC Standard JESD22-A103, High Temperature Storage Life.
2. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic
Solid State Surface Mount Devices.
7.2 Moisture handling ratings
Symbol
MSL
Description
Moisture sensitivity level
Min.
Max.
Unit
Notes
—
3
—
1
1. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic
Solid State Surface Mount Devices.
7.3 ESD handling ratings
Although damage from electrostatic discharge (ESD) is much less common on these
devices than on early CMOS circuits, use normal handling precautions to avoid exposure
to static discharge. Qualification tests are performed to ensure that these devices can
withstand exposure to reasonable levels of static without suffering any permanent
damage.
All ESD testing is in conformity with AEC-Q100 Stress Test Qualification. During the
device qualification ESD stresses were performed for the human body model (HBM), the
machine model (MM), and the charge device model (CDM).
All latch-up testing is in conformity with AEC-Q100 Stress Test Qualification.
A device is defined as a failure if after exposure to ESD pulses, the device no longer
meets the device specification. Complete DC parametric and functional testing is
performed as per the applicable device specification at room temperature followed by hot
temperature, unless specified otherwise in the device specification.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
33
Ratings
Table 4. ESD/Latch-up Protection
Characteristic1
Min
Max
Unit
ESD for Human Body Model (HBM)
–2000
+2000
V
ESD for Machine Model (MM)
–200
+200
V
ESD for Charge Device Model (CDM)
–500
+500
V
Latch-up current at TA= 85°C (ILAT)
–100
+100
mA
1. Parameter is achieved by design characterization on a small sample size from typical devices under typical conditions
unless otherwise noted.
7.4 Voltage and current operating ratings
Absolute maximum ratings are stress ratings only, and functional operation at the
maxima is not guaranteed. Stress beyond the limits specified in Table 5 may affect device
reliability or cause permanent damage to the device.
Table 5. Absolute Maximum Ratings (VSS = 0 V, VSSA = 0 V)
Characteristic
Symbol
Notes1
Min
Max
Unit
Supply Voltage Range
VDD
-0.3
4.0
V
Analog Supply Voltage Range
VDDA
-0.3
4.0
V
ADC High Voltage Reference
VREFHx
-0.3
4.0
V
Voltage difference VDD to VDDA
ΔVDD
-0.3
0.3
V
Voltage difference VSS to VSSA
ΔVSS
-0.3
0.3
V
Digital Input Voltage Range
VIN
Pin Group 1
-0.3
5.5
V
RESET Input Voltage Range
VIN_RESET
Pin Group 2
-0.3
4.0
V
VOSC
Pin Group 4
-0.4
4.0
V
VINA
Pin Group 3
-0.3
4.0
V
Oscillator Input Voltage Range
Analog Input Voltage Range
Input clamp current, per pin (VIN < VSS - 0.3
V)2, 3
VIC
—
-5.0
mA
pin4
VOC
—
±20.0
mA
Contiguous pin DC injection current—regional limit sum
of 16 contiguous pins
IICont
-25
25
mA
Output Voltage Range (normal push-pull mode)
VOUT
Pin Group 1, 2
-0.3
4.0
V
VOUTOD
Pin Group 1
-0.3
5.5
V
VOUTOD_RE
Pin Group 2
-0.3
4.0
V
Pin Group 5
Output clamp current, per
Output Voltage Range (open drain mode)
RESET Output Voltage Range
SET
DAC Output Voltage Range
-0.3
4.0
V
Ambient Temperature Industrial
VOUT_DAC
TA
-40
105
°C
Junction Temperature
Tj
-40
125
°C
TSTG
-55
150
°C
Storage Temperature Range (Extended Industrial)
1. Default Mode
• Pin Group 1: GPIO, TDI, TDO, TMS, TCK
• Pin Group 2: RESET
MC56F844XX Data Sheet, Rev. 3, 06/2014.
34
Freescale Semiconductor, Inc.
General
• Pin Group 3: ADC and Comparator Analog Inputs
• Pin Group 4: XTAL, EXTAL
• Pin Group 5: DAC analog output
2. Continuous clamp current
3. All 5 volt tolerant digital I/O pins are internally clamped to VSS through a ESD protection diode. There is no diode
connection to VDD. If VIN greater than VDIO_MIN (= VSS–0.3 V) is observed, then there is no need to provide current
limiting resistors at the pads. If this limit cannot be observed, then a current limiting resistor is required.
4. I/O is configured as push-pull mode.
8 General
8.1 General characteristics
The device is fabricated in high-density, low-power CMOS with 5 V–tolerant TTLcompatible digital inputs, except for the RESET pin which is 3.3V only. The term “5 V–
tolerant” refers to the capability of an I/O pin, built on a 3.3 V–compatible process
technology, to withstand a voltage up to 5.5 V without damaging the device.
5 V–tolerant I/O is desirable because many systems have a mixture of devices designed
for 3.3 V and 5 V power supplies. In such systems, a bus may carry both 3.3 V– and 5 V–
compatible I/O voltage levels (a standard 3.3 V I/O is designed to receive a maximum
voltage of 3.3 V ± 10% during normal operation without causing damage). This 5 V–
tolerant capability therefore offers the power savings of 3.3 V I/O levels combined with
the ability to receive 5 V levels without damage.
Absolute maximum ratings in Table 5 are stress ratings only, and functional operation at
the maximum is not guaranteed. Stress beyond these ratings may affect device reliability
or cause permanent damage to the device.
Unless otherwise stated, all specifications within this chapter apply over the temperature
range of -40°C to 105°C ambient temperature over the following supply ranges:
VSS=VSSA=0V, VDD=VDDA=3.0V to 3.6V, CL≤50 pF, fOP=60MHz.
CAUTION
This device contains protective circuitry to guard against
damage due to high static voltage or electrical fields. However,
normal precautions are advised to avoid application of any
voltages higher than maximum-rated voltages to this highimpedance circuit. Reliability of operation is enhanced if
unused inputs are tied to an appropriate voltage level.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
35
General
8.2 AC electrical characteristics
Tests are conducted using the input levels specified in Table 8. Unless otherwise
specified, propagation delays are measured from the 50% to the 50% point, and rise and
fall times are measured between the 10% and 90% points, as shown in Figure 3.
Low
VIH
Input Signal
High
90%
50%
10%
Midpoint1
VIL
Fall Time
Rise Time
The midpoint is VIL + (VIH – VIL)/2.
Figure 3. Input signal measurement references
Figure 4 shows the definitions of the following signal states:
• Active state, when a bus or signal is driven, and enters a low impedance state
• Tri-stated, when a bus or signal is placed in a high impedance state
• Data Valid state, when a signal level has reached VOL or VOH
• Data Invalid state, when a signal level is in transition between VOL and VOH
Data1 Valid
Data2 Valid
Data1
Data3 Valid
Data2
Data3
Data
Tri-stated
Data Invalid State
Data Active
Data Active
Figure 4. Signal states
8.3 Nonswitching electrical specifications
8.3.1 Voltage and current operating requirements
This section includes information about recommended operating conditions.
NOTE
Recommended VDD ramp rate is between 1 ms and 200 ms.
Table 6. Recommended Operating Conditions (VREFLx=0V, VSSA=0V, VSS=0V)
Characteristic
Supply voltage2
Symbol
Notes1
VDD, VDDA
Min
Typ
Max
Unit
2.7
3.3
3.6
V
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
36


Freescale Semiconductor, Inc.
General
Table 6. Recommended Operating Conditions (VREFLx=0V, VSSA=0V, VSS=0V) (continued)
Characteristic
Notes1
Symbol
Min
Typ
Max
Unit
3.0
VDDA
V
VDDA
V
ADC (Cyclic) Reference Voltage High
VREFHA
ADC (SAR) Reference Voltage High
VREFHC
2.0
Voltage difference VDD to VDDA
ΔVDD
-0.1
0
0.1
V
Voltage difference VSS to VSSA
ΔVSS
-0.1
0
0.1
V
5.5
V
VDD
V
0.35 x VDD
V
VREFHB
Input Voltage High (digital inputs)
RESET Voltage High
Input Voltage Low (digital inputs)
Oscillator Input Voltage High
VIH
Pin Group 1
0.7 x VDD
VIH_RESET
Pin Group 2
0.7 x VDD
VIL
Pin Groups 1, 2
VIHOSC
Pin Group 4
2.0
VDD + 0.3
V
VILOSC
Pin Group 4
-0.3
0.8
V
IOH
Pin Group 1
—
-2
mA
Pin Group 1
—
-9
Pin Groups 1, 2
—
2
Pin Groups 1, 2
—
9
—
XTAL driven by an external clock source
Oscillator Input Voltage Low
min.)3, 4
Output Source Current High (at VOH
• Programmed for low drive strength
• Programmed for high drive strength
Output Source Current Low (at VOL max.)3, 4
• Programmed for low drive strength
• Programmed for high drive strength
IOL
mA
1. Default Mode
• Pin Group 1: GPIO, TDI, TDO, TMS, TCK
• Pin Group 2: RESET
• Pin Group 3: ADC and Comparator Analog Inputs
• Pin Group 4: XTAL, EXTAL
• Pin Group 5: DAC analog output
2. ADC (Cyclic) specifications are not guaranteed when VDDA is below 3.0 V.
3.
4. Contiguous pin DC injection current of regional limit—including sum of negative injection currents or sum of positive
injection currents of 16 contiguous pins—is 25 mA.
8.3.2 LVD and POR operating requirements
Table 7. PMC Low-Voltage Detection (LVD) and Power-On Reset (POR)
Parameters
Characteristic
POR Assert
Symbol
Voltage1
Min
Typ
Max
Unit
POR
2.0
V
POR
2.7
V
LVI_2p7 Threshold Voltage
2.73
V
LVI_2p2 Threshold Voltage
2.23
V
POR Release
Voltage2
1. During 3.3-volt VDD power supply ramp down
2. During 3.3-volt VDD power supply ramp up (gated by LVI_2p7)
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
37
General
8.3.3 Voltage and current operating behaviors
The following table provides information about power supply requirements and I/O pin
characteristics.
Table 8. DC Electrical Characteristics at Recommended Operating
Conditions
Symbol
Notes1
Min
Typ
Max
Unit
Test Conditions
Output Voltage High
VOH
Pin Group 1
VDD - 0.5
—
—
V
IOH = IOHmax
Output Voltage Low
VOL
Pin Groups
1, 2
—
—
0.5
V
IOL = IOLmax
IIH
Pin Group 1
—
0
+/- 2.5
µA
VIN = 2.4 V to 5.5 V
Characteristic
Digital Input Current High
Pin Group 2
pull-up enabled or
disabled
Comparator Input Current
High
VIN = 2.4 V to VDD
IIHC
Pin Group 3
—
0
+/- 2
µA
VIN = VDDA
Oscillator Input Current
High
IIHOSC
Pin Group 3
—
0
+/- 2
µA
VIN = VDDA
Internal Pull-Up
Resistance
RPull-Up
20
—
50
kΩ
—
RPull-Down
20
—
50
kΩ
—
Internal Pull-Down
Resistance
Comparator Input Current
Low
IILC
Pin Group 3
—
0
+/- 2
µA
VIN = 0V
Oscillator Input Current
Low
IILOSC
Pin Group 3
—
0
+/- 2
µA
VIN = 0V
DAC Output Voltage
Range
VDAC
Pin Group 5
Typically
VSSA +
40mV
—
Typically
VDDA 40mV
V
RLD = 3 kΩ || CLD = 400 pF
IOZ
Pin Groups
1, 2
—
0
+/- 1
µA
—
VHYS
Pin Groups
1, 2
0.06 x VDD
—
—
V
—
Output Current1
High Impedance State
Schmitt Trigger Input
Hysteresis
1. Default Mode
• Pin Group 1: GPIO, TDI, TDO, TMS, TCK
• Pin Group 2: RESET
• Pin Group 3: ADC and Comparator Analog Inputs
• Pin Group 4: XTAL, EXTAL
• Pin Group 5: DAC
8.3.4 Power mode operating behaviors
Parameters listed are guaranteed by design.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
38
Freescale Semiconductor, Inc.
General
NOTE
To filter noise on the RESETB pin, install a capacitor (up to 0.1
uF) on it.
Table 9. Reset, stop, wait, and interrupt timing
Characteristic
Symbol
Typical Min
Typical
Max
Unit
See
Figure
Minimum RESET Assertion Duration
tRA
161
—
ns
—
RESET deassertion to First Address Fetch
tRDA
865 x TOSC + 8 x T
ns
—
tIF
361.3
ns
—
Delay from Interrupt Assertion to Fetch of first
instruction (exiting Stop)
570.9
1. If the RESET pin filter is enabled by setting the RST_FLT bit in the SIM_CTRL register to 1, the minimum pulse assertion
must be greater than 21 ns.
NOTE
In the Table 9, T = system clock cycle and TOSC = oscillator
clock cycle. For an operating frequency of 60MHz, T=16.6ns.
At 4MHz (used coming out of reset and stop modes), T=250ns.
Table 10. Power-On-Reset mode transition times
Symbol
TPOR
Description
Min
Max
Unit
After a POR event, the amount of delay from when VDD
reaches 2.7V to when the first instruction executes (over the
operating temperature range).
199
225
us
Notes
LPS mode to LPRUN mode
240
551
us
4
VLPS mode to VLPRUN mode
1424
1500
us
5
STOP mode to RUN mode
6.79
7.29
us
3
WAIT mode to RUN mode
0.70
0.87
us
2
VLPWAIT mode to VLPRUN mode
1413
1500
us
5
LPWAIT mode to LPRUN mode
237.2
554
us
4
1. Normal boot (FTFL_OPT[LPBOOT]=1)
2. Clock configuration: CPU clock = 60 MHz, bus clock = 60 MHz, flash clock = 15
MHz
3. Clock configuration: CPU clock = 4 MHz, system clock source is 8 MHz IRC
4. CPU Clock = 200 kHz and 8 Mhz IRC in standby mode
5. Clock configuration: Using 64 kHz external clock source, CPU Clock = 32 kHz
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
39
General
8.3.5 Power consumption operating behaviors
Table 11. Current Consumption
Mode
Maximum
Frequency
Conditions
Typical at 3.3 V,
25°C
IDD1
RUN
60 MHz
•
•
•
•
•
IDDA
Maximum at 3.6
V, 105°C
IDD1
IDDA
31.4 mA 15.5 mA 55.2 mA 24.5 mA
•
•
•
•
•
60 MHz Device Clock
Regulators are in full regulation
Relaxation Oscillator on
PLL powered on
Continuous MAC instructions with fetches from
Program Flash
All peripheral modules enabled.
TMRs and SCIs using 1X Clock
NanoEdge within PWMA using 1X clock
ADC/DAC powered on and clocked at 5 MHz2
Comparator powered on
WAIT
60 MHz
•
•
•
•
•
•
•
•
•
60 MHz Device Clock
Regulators are in full regulation
Relaxation Oscillator on
PLL powered on
Processor Core in WAIT state
All Peripheral modules enabled.
TMRs and SCIs using 1X Clock
NanoEdge within PWMA using 2X clock
ADC/DAC/Comparator powered off
28.2 mA 13.36 μA 50.1 mA 44.10 μA
STOP
4 MHz
•
•
•
•
•
•
•
4 MHz Device Clock
Regulators are in full regulation
Relaxation Oscillator on
PLL powered off
Processor Core in STOP state
All peripheral module and core clocks are off
ADC/DAC/Comparator powered off
8.99 mA 12.97 μA
LPRUN
(LsRUN)
2 MHz
• 200 kHz Device Clock from Relaxation Oscillator
1.84 mA
(ROSC)
• ROSC in standby mode
• Regulators are in standby
• PLL disabled
• Repeat NOP instructions
• All peripheral modules enabled, except NanoEdge
and cyclic ADCs3
• Simple loop with running from platform instruction
buffer
LPWAIT
(LsWAIT)
2 MHz
• 200 kHz Device Clock from Relaxation Oscillator
1.81 mA 2.67 mA 15.4 mA 4.87 mA
(ROSC)
• ROSC in standby mode
• Regulators are in standby
• PLL disabled
• All peripheral modules enabled, except NanoEdge
and cyclic ADCs3
• Processor core in wait mode
3 mA
28.13
mA
41.55 μA
15.61
mA
4.87 mA
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
40
Freescale Semiconductor, Inc.
General
Table 11. Current Consumption (continued)
Mode
Maximum
Frequency
Conditions
Typical at 3.3 V,
25°C
IDD1
LPSTOP
(LsSTOP)
2 MHz
VLPRUN
IDDA
Maximum at 3.6
V, 105°C
IDD1
IDDA
14.49
mA
41.55 μA
• 200 kHz Device Clock from Relaxation Oscillator
(ROSC)
• ROSC in standby mode
• Regulators are in standby
• PLL disabled
• Only PITs and COP enabled; other peripheral
modules disabled and clocks gated off3
• Processor core in stop mode
1.06 mA 12.68 μA
200 kHz
•
•
•
•
•
•
•
•
•
32 kHz Device Clock
Clocked by a 32 kHz external clock source
Oscillator in power down
All ROSCs disabled
Large regulator is in standby
Small regulator is disabled
PLL disabled
Repeat NOP instructions
All peripheral modules, except COP and EWM,
disabled and clocks gated off
• Simple loop running from platform instruction
buffer
0.57 mA 12.20 μA 8.14 mA 15.00 μA
VLPWAIT
200 kHz
•
•
•
•
•
•
•
•
32 kHz Device Clock
Clocked by a 32 kHz external clock source
Oscillator in power down
All ROSCs disabled
Large regulator is in standby
Small regulator is disabled
PLL disabled
All peripheral modules, except COP, disabled and
clocks gated off
• Processor core in wait mode
0.56 mA 11.04 μA 8.13 mA 13.29 μA
VLPSTOP
200 kHz
•
•
•
•
•
•
•
•
0.56 mA 10.23 μA
32 kHz Device Clock
Clocked by a 32 kHz external clock source
Oscillator in power down
All ROSCs disabled
Large regulator is in standby
Small regulator is disabled
PLL disabled
All peripheral modules, except COP, disabled and
clocks gated off
• Processor core in stop mode
12.10
mA
12.04 μA
1. No output switching, all ports configured as inputs, all inputs low, no DC loads
2. ADC power consumption at higher frequency can be found in Table 28
3. In all chip LP modes and flash memory VLP modes, the maximum frequency for flash memory operation is 250 kHz,
because of the fixed frequency ratio of 1:4 between the CPU clock and the flash clock (when using a 2 MHz external input
clock and the CPU is operating at 1 MHz).
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
41
General
8.3.6 Designing with radiated emissions in mind
To find application notes that provide guidance on designing your system to minimize
interference from radiated emissions:
1. Go to www.freescale.com.
2. Perform a keyword search for “EMC design.”
8.3.7 Capacitance attributes
Table 12. Capacitance attributes
Description
Symbol
Min.
Typ.
Max.
Unit
CIN
—
10
—
pF
COUT
—
10
—
pF
Input capacitance
Output capacitance
8.4 Switching specifications
8.4.1 Device clock specifications
Table 13. Device clock specifications
Symbol
Description
Min.
Max.
Unit
0.001
60
MHz
0
60
—
60
Notes
Normal run mode
fSYSCLK
fIPBUS
Device (system and core) clock frequency
• using relaxation oscillator
• using external clock source
IP bus clock
MHz
8.4.2 General switching timing
Table 14. Switching timing
Symbol
Description
Min
GPIO pin interrupt pulse width1
1.5
Max
Synchronous path
Unit
Notes
IP Bus
Clock
Cycles
2
Port rise and fall time (high drive strength), Slew disabled 2.7
≤ VDD ≤ 3.6V.
5.5
15.1
ns
3
Port rise and fall time (high drive strength), Slew enabled 2.7
≤ VDD ≤ 3.6V.
1.5
6.8
ns
3
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
42
Freescale Semiconductor, Inc.
General
Table 14. Switching timing (continued)
Symbol
Description
Min
Max
Unit
Notes
Port rise and fall time (low drive strength). Slew disabled . 2.7
≤ VDD ≤ 3.6V
8.2
17.8
ns
4
Port rise and fall time (low drive strength). Slew enabled . 2.7
≤ VDD ≤ 3.6V
3.2
9.2
ns
4
1. Applies to a pin only when it is configured as GPIO and configured to cause an interrupt by appropriately programming
GPIOn_IPOLR and GPIOn_IENR.
2. The greater synchronous and asynchronous timing must be met.
3. 75 pF load
4. 15 pF load
8.5 Thermal specifications
8.5.1 Thermal operating requirements
Table 15. Thermal operating requirements
Symbol
Description
Min.
Max.
Unit
TJ
Die junction temperature
–40
°C
TA
Ambient temperature (extended industrial)
–40
°C
8.5.2 Thermal attributes
This section provides information about operating temperature range, power dissipation,
and package thermal resistance. Power dissipation on I/O pins is usually small compared
to the power dissipation in on-chip logic and voltage regulator circuits, and it is userdetermined rather than being controlled by the MCU design. To account for PI/O in power
calculations, determine the difference between actual pin voltage and VSS or VDD and
multiply by the pin current for each I/O pin. Except in cases of unusually high pin current
(heavy loads), the difference between pin voltage and VSS or VDD is very small.
See Thermal design considerations for more detail on thermal design considerations.
Board type
Symbol
Description
48 LQFP
Single-layer
(1s)
RθJA
Thermal
70
resistance,
junction to
ambient (natural
convection)
64 LQFP
Unit
Notes
64
°C/W
1, 2
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
43
Peripheral operating requirements and behaviors
Board type
Symbol
Description
64 LQFP
Unit
Notes
Four-layer
(2s2p)
RθJA
Thermal
46
resistance,
junction to
ambient (natural
convection)
46
°C/W
1, 3
Single-layer
(1s)
RθJMA
Thermal
57
resistance,
junction to
ambient (200 ft./
min. air speed)
52
°C/W
1,3
Four-layer
(2s2p)
RθJMA
Thermal
39
resistance,
junction to
ambient (200 ft./
min. air speed)
39
°C/W
1,3
—
RθJB
Thermal
resistance,
junction to
board
23
28
°C/W
4
—
RθJC
Thermal
resistance,
junction to case
17
15
°C/W
5
—
ΨJT
Thermal
3
characterization
parameter,
junction to
package top
outside center
(natural
convection)
3
°C/W
6
1.
2.
3.
4.
5.
6.
48 LQFP
Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air) with the single layer board horizontal. For the LQFP, the board meets the
JESD51-3 specification.
Determined according to JEDEC Standard JESD51-6, Integrated Circuits Thermal Test Method Environmental
Conditions—Forced Convection (Moving Air) with the board horizontal.
Determined according to JEDEC Standard JESD51-8, Integrated Circuit Thermal Test Method Environmental
Conditions—Junction-to-Board. Board temperature is measured on the top surface of the board near the package.
Determined according to Method 1012.1 of MIL-STD 883, Test Method Standard, Microcircuits, with the cold plate
temperature used for the case temperature. The value includes the thermal resistance of the interface material
between the top of the package and the cold plate.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental
Conditions—Natural Convection (Still Air).
9 Peripheral operating requirements and behaviors
9.1 Core modules
MC56F844XX Data Sheet, Rev. 3, 06/2014.
44
Freescale Semiconductor, Inc.
Peripheral operating requirements and behaviors
9.1.1 JTAG timing
Table 16. JTAG timing
Characteristic
Symbol
Min
Max
Unit
See
Figure
TCK frequency of operation
fOP
DC
SYS_CLK/ 16
MHz
Figure 5
TCK clock pulse width
tPW
50
—
ns
Figure 5
TMS, TDI data set-up time
tDS
5
—
ns
Figure 6
TMS, TDI data hold time
tDH
5
—
ns
Figure 6
TCK low to TDO data valid
tDV
—
30
ns
Figure 6
TCK low to TDO tri-state
tTS
—
30
ns
Figure 6
1/fOP
VIH
TCK
(Input)
tPW
tPW
VM
VM
VIL
VM = VIL + (VIH – VIL)/2
Figure 5. Test clock input timing diagram
TCK
(Input)
TDI
TMS
(Input)
tDS
tDH
Input Data Valid
tDV
TDO
(Output)
Output Data Valid
tTS
TDO
(Output)
Figure 6. Test access port timing diagram
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
45
System modules
9.2 System modules
9.2.1 Voltage regulator specifications
The voltage regulator supplies approximately 1.2 V to the MC56F84xxx’s core logic. For
proper operations, the voltage regulator requires an external 2.2 µF capacitor on each
VCAP pin. Ceramic and tantalum capacitors tend to provide better performance
tolerances. The output voltage can be measured directly on the VCAP pin. The
specifications for this regulator are shown in Table 17.
Table 17. Regulator 1.2 V parameters
Characteristic
Symbol
Min
Typ
Max
Unit
Output Voltage1
VCAP
—
1.22
—
V
Short Circuit Current2
ISS
—
600
—
mA
Short Circuit Tolerance (VCAP shorted to ground)
TRSC
—
—
30
Minutes
1. Value is after trim
2. Guaranteed by design
Table 18. Bandgap electrical specifications
Characteristic
Symbol
Min
Typ
Max
Unit
Reference Voltage (after trim)
VREF
—
1.21
—
V
9.3 Clock modules
9.3.1 External clock operation timing
Parameters listed are guaranteed by design.
Table 19. External clock operation timing requirements
Characteristic
Symbol
Min
Typ
Max
Unit
fosc
—
—
50
MHz
tPW
8
trise
—
—
1
ns
tfall
—
—
1
ns
Input high voltage overdrive by an external clock
Vih
0.85VDD
—
—
V
Input low voltage overdrive by an external clock
Vil
—
—
0.3VDD
V
Frequency of operation (external clock driver)1
Clock pulse
width2
External clock input rise
External clock input fall
time3
time4
ns
MC56F844XX Data Sheet, Rev. 3, 06/2014.
46
Freescale Semiconductor, Inc.
System modules
1.
2.
3.
4.
See Figure 7 for detail on using the recommended connection of an external clock driver.
The chip may not function if the high or low pulse width is smaller than 6.25 ns.
External clock input rise time is measured from 10% to 90%.
External clock input fall time is measured from 90% to 10%.
External
Clock
90%
50%
10%
tPW
tfall
tPW
trise
VIH
90%
50%
10%
VIL
Note: The midpoint is VIL + (VIH – VIL)/2.
Figure 7. External clock timing
9.3.2 Phase-Locked Loop timing
Table 20. Phase-Locked Loop timing
Characteristic
PLL input reference
PLL output
frequency1
frequency2
PLL lock
time3
Allowed Duty Cycle of input reference
Symbol
Min
Typ
Max
Unit
fref
8
8
16
MHz
—
400
MHz
73.2
µs
60
%
fop
tplls
35.5
tdc
40
50
1. An externally supplied reference clock should be as free as possible from any phase jitter for the PLL to work correctly.
The PLL is optimized for 8 MHz input.
2. The frequency of the core system clock cannot exceed 60 MHz.
3. This is the time required after the PLL is enabled to ensure reliable operation.
9.3.3 External crystal or resonator requirement
Table 21. Crystal or resonator requirement
Characteristic
Symbol
Min
Typ
Max
Unit
Frequency of operation
fXOSC
4
8
16
MHz
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
47
System modules
9.3.4 Relaxation oscillator timing
Table 22. Relaxation oscillator electrical specifications
Characteristic
Min
Typ
Max
Unit
7.84
8
8.16
MHz
7.76
8
8.24
266.8
402
554.3
RUN Mode
+/- 1.5
+/-2
Due to temperature
• 0°C to 105°C
+/- 1.5
+/-3
32
33.9
kHz
+/-2.5
+/-4
%
0.12
0.4
µs
14.4
16.2
50
52
8 MHz Output
Symbol
Frequency1
RUN Mode
• 0°C to 105°C
• -40°C to 105°C
kHz
Standby Mode (IRC trimmed @ 8 MHz)
• -40°C to 105°C
8 MHz Frequency Variation
%
• -40°C to 105°C
32 kHz Output Frequency2
30.1
RUN Mode
• -40°C to 105°C
32 kHz Output Frequency Variation
RUN Mode
Due to temperature
• -40°C to 105°C
Stabilization Time
• 8 MHz output3
• 32 kHz output4
tstab
Output Duty Cycle
1.
2.
3.
4.
48
%
Frequency after application of 8 MHz trim
Frequency after application of 32 kHz trim
Standby to run mode transition
Power down to run mode transition
MC56F844XX Data Sheet, Rev. 3, 06/2014.
48
Freescale Semiconductor, Inc.
System modules
Figure 8. Relaxation oscillator temperature variation (typical) after trim (preliminary)
9.4 Memories and memory interfaces
9.4.1 Flash electrical specifications
This section describes the electrical characteristics of the flash memory module.
9.4.1.1
Flash timing specifications — program and erase
The following specifications represent the amount of time the internal charge pumps are
active and do not include command overhead.
Table 23. NVM program/erase timing specifications
Symbol
Description
thvpgm4
Longword Program high-voltage time
Min.
Typ.
Max.
Unit
Notes
—
7.5
18
μs
—
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
49
System modules
Table 23. NVM program/erase timing specifications (continued)
Symbol
Description
Min.
Typ.
Max.
Unit
Notes
thversscr
Sector Erase high-voltage time
—
13
113
ms
1
thversblk32k Erase Block high-voltage time for 32 KB
—
52
452
ms
1
thversblk256k Erase Block high-voltage time for 256 KB
—
104
904
ms
1
Unit
Notes
1. Maximum time based on expectations at cycling end-of-life.
9.4.1.2
Symbol
Flash timing specifications — commands
Table 24. Flash command timing specifications
Description
Min.
Typ.
Max.
Read 1s Block execution time
—
trd1blk32k
• 32 KB data flash
—
—
0.5
ms
trd1blk256k
• 256 KB program flash
—
—
1.7
ms
trd1sec1k
Read 1s Section execution time (data flash
sector)
—
—
60
μs
1
trd1sec2k
Read 1s Section execution time (program flash
sector)
—
—
60
μs
1
tpgmchk
Program Check execution time
—
—
45
μs
1
trdrsrc
Read Resource execution time
—
—
30
μs
1
tpgm4
Program Longword execution time
—
65
145
μs
—
Erase Flash Block execution time
2
tersblk32k
• 32 KB data flash
—
55
465
ms
tersblk256k
• 256 KB program flash
—
122
985
ms
—
14
114
ms
tersscr
Erase Flash Sector execution time
Program Section execution time
2
—
tpgmsec512p
• 512 B program flash
—
2.4
—
ms
tpgmsec512d
• 512 B data flash
—
4.7
—
ms
tpgmsec1kp
• 1 KB program flash
—
4.7
—
ms
tpgmsec1kd
• 1 KB data flash
—
9.3
—
ms
trd1all
Read 1s All Blocks execution time
—
—
1.8
ms
—
trdonce
Read Once execution time
—
—
25
μs
1
Program Once execution time
—
65
—
μs
—
tersall
Erase All Blocks execution time
—
175
1500
ms
2
tvfykey
Verify Backdoor Access Key execution time
—
—
30
μs
1
tpgmonce
Program Partition for EEPROM execution time
tpgmpart32k
• 32 KB FlexNVM
—
—
70
—
ms
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
50
Freescale Semiconductor, Inc.
System modules
Table 24. Flash command timing specifications (continued)
Symbol
Description
Min.
Typ.
Max.
Unit
Set FlexRAM Function execution time:
Notes
—
tsetramff
• Control Code 0xFF
—
50
—
μs
tsetram8k
• 8 KB EEPROM backup
—
0.3
0.5
ms
tsetram32k
• 32 KB EEPROM backup
—
0.7
1.0
ms
260
μs
Byte-write to FlexRAM for EEPROM operation
teewr8bers
Byte-write to erased FlexRAM location execution
time
—
175
Byte-write to FlexRAM execution time:
3
—
teewr8b8k
• 8 KB EEPROM backup
—
340
1700
μs
teewr8b16k
• 16 KB EEPROM backup
—
385
1800
μs
teewr8b32k
• 32 KB EEPROM backup
—
475
2000
μs
260
μs
Word-write to FlexRAM for EEPROM operation
teewr16bers Word-write to erased FlexRAM location
execution time
—
175
Word-write to FlexRAM execution time:
—
—
teewr16b8k
• 8 KB EEPROM backup
—
340
1700
μs
teewr16b16k
• 16 KB EEPROM backup
—
385
1800
μs
teewr16b32k
• 32 KB EEPROM backup
—
475
2000
μs
540
μs
Longword-write to FlexRAM for EEPROM operation
teewr32bers Longword-write to erased FlexRAM location
execution time
—
360
Longword-write to FlexRAM execution time:
—
—
teewr32b8k
• 8 KB EEPROM backup
—
545
1950
μs
teewr32b16k
• 16 KB EEPROM backup
—
630
2050
μs
teewr32b32k
• 32 KB EEPROM backup
—
810
2250
μs
1. Assumes 25 MHz flash clock frequency.
2. Maximum times for erase parameters based on expectations at cycling end-of-life.
3. For byte-writes to an erased FlexRAM location, the aligned word containing the byte must be erased.
9.4.1.3
Flash high voltage current behaviors
Table 25. Flash high voltage current behaviors
Symbol
Description
Min.
Typ.
Max.
Unit
IDD_PGM
Average current adder during high voltage
flash programming operation
—
2.5
6.0
mA
IDD_ERS
Average current adder during high voltage
flash erase operation
—
1.5
4.0
mA
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
51
System modules
9.4.1.4
Reliability specifications
Table 26. NVM reliability specifications
Symbol
Description
Min.
Typ.1
Max.
Unit
Notes
Program Flash
tnvmretp10k Data retention after up to 10 K cycles
5
50
—
years
—
tnvmretp1k
Data retention after up to 1 K cycles
20
100
—
years
—
nnvmcycp
Cycling endurance
10 K
50 K
—
cycles
2
Data Flash
tnvmretd10k Data retention after up to 10 K cycles
5
50
—
years
—
tnvmretd1k
Data retention after up to 1 K cycles
20
100
—
years
—
nnvmcycd
Cycling endurance
10 K
50 K
—
cycles
2
FlexRAM as EEPROM
tnvmretee100 Data retention up to 100% of write endurance
5
50
—
years
—
tnvmretee10 Data retention up to 10% of write endurance
20
100
—
years
—
Write endurance
3
nnvmwree16
• EEPROM backup to FlexRAM ratio = 16
35 K
175 K
—
writes
nnvmwree128
• EEPROM backup to FlexRAM ratio = 128
315 K
1.6 M
—
writes
nnvmwree512
• EEPROM backup to FlexRAM ratio = 512
1.27 M
6.4 M
—
writes
nnvmwree4k
• EEPROM backup to FlexRAM ratio = 4096
10 M
50 M
—
writes
nnvmwree8k
• EEPROM backup to FlexRAM ratio = 8192
20 M
100 M
—
writes
1. Typical data retention values are based on measured response accelerated at high temperature and derated to a constant
25 °C use profile. Engineering Bulletin EB618 does not apply to this technology. Typical endurance defined in Engineering
Bulletin EB619.
2. Cycling endurance represents number of program/erase cycles at -40 °C ≤ Tj ≤ 125 °C.
3. Write endurance represents the number of writes to each FlexRAM location at -40 °C ≤Tj ≤ 125 °C influenced by the
cycling endurance of the FlexNVM (same value as data flash) and the allocated EEPROM backup. Minimum and typical
values assume all byte-writes to FlexRAM.
9.5 Analog
9.5.1 12-bit cyclic Analog-to-Digital Converter (ADC) parameters
Table 27. 12-bit ADC electrical specifications
Characteristic
Symbol
Min
Typ
Max
Unit
VDDA
2.7
3.3
3.6
V
Vrefhx
3.0
VDDA
V
fADCCLK
0.6
10
MHz
RAD
VREFL
VREFH
V
Recommended Operating Conditions
Supply Voltage1
Vrefh Supply
Voltage2
ADC Conversion
Clock3
Conversion Range
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
52
Freescale Semiconductor, Inc.
System modules
Table 27. 12-bit ADC electrical specifications (continued)
Characteristic
Symbol
Input Voltage Range
VADIN
External Reference
Internal Reference
Min
Typ
Max
VREFL
VREFH
VSSA
VDDA
Unit
V
Timing and Power
Conversion Time
tADC
Sample Time
tADS
ADC Power-Up Time (from adc_pdn)
tADPU
ADC RUN Current (per ADC block)
IADRUN
• at 600 kHz ADC Clock, LP mode
1
ADC Clock Cycles
5
13
ADC Clock Cycles
ADC Clock Cycles
mA
1
5.7
• ≤ 8.33 MHz ADC Clock, 00 mode
10.5
• ≤ 12.5 MHz ADC Clock, 01 mode
17.7
• ≤ 16.67 MHz ADC Clock, 10 mode
22.6
• ≤ 20 MHz ADC Clock, 11 mode
ADC Powerdown Current (adc_pdn enabled)
VREFH Current
6
IADPWRDWN
0.02
µA
IVREFH
0.001
µA
INL
+/- 3
+/- 5
LSB5
DNL
+/- 0.6
+/- 0.9
LSB5
Accuracy (DC or Absolute)
Integral non-Linearity4
Differential non-Linearity4
Monotonicity
Offset
LSB 4
VOFFSET
Gain Error (normalized)
EGAIN
0.994 to
1.004
0.990 to
1.010
Signal to Noise Ratio
SNR
59
dB
Total Harmonic Distortion
THD
64
dB
Spurious Free Dynamic Range
SFDR
65
dB
Signal to Noise plus Distortion
SINAD
59
dB
Effective Number of Bits
ENOB
AC Specifications6
bits
ADC Inputs
Input Leakage Current
Input Injection Current
IIN
7
Input Capacitance
0
IINJ
CADI
-
Sampling Capacitor
-
• 1x mode
1.4
• 2x mode
2.8
• 4x mode
5.6
+/-2
µA
+/-3
mA
pF
1. If the ADC’s reference is from VDDA: When VDDA is below 3.0 V, then the ADC functions, but the ADC specifications are
not guaranteed.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
53
System modules
2. When the input is at the Vrefl level, then the resulting output will be all zeros (hex 000), plus any error contribution due to
offset and gain error. When the input is at the Vrefh level, then the output will be all ones (hex FFF), minus any error
contribution due to offset and gain error.
3. ADC clock duty cycle min/max is 45/55%
4. INL measured from VIN = VREFL to VIN = VREFH.
5. LSB = Least Significant Bit = 0.806 mV at 3.3 V VDDA, x1 Gain Setting
6. Measured when converting a 1 kHz input Full Scale sine wave.
7. The current that can be injected into or sourced from an unselected ADC input, without affecting the performance of the
ADC.
9.5.1.1
Equivalent circuit for ADC inputs
The following figure shows the ADC input circuit during sample and hold. S1 and S2 are
always opened/closed at non-overlapping phases, and
both S1 and S2 operate at the ADC
clock frequency. The following equation gives equivalent input impedance when the
input is selected.
1
-12
(ADC ClockRate) x 
1.4x10
+ 100ohm + 125ohm
C1: Single Ended Mode
2XC1: Differential Mode
Analog Input
1
125 ESD
Resistor
2
Channel Mux
equivalent resistance
100Ohms
S1
C1
S1
S/H
S1
3
C1
S2
S2
S1
(VREFHx - VREFLx ) / 2
C1: Single Ended Mode
2XC1: Differential Mode
1. Parasitic capacitance due to package, pin-to-pin and pin-to-package base coupling =
1.8pF
2. Parasitic capacitance due to the chip bond pad, ESD protection devices and signal
routing = 2.04pF
3. 8 pF noise damping capacitor
4. Sampling capacitor at the sample and hold circuit. Capacitor C1 (4.8pF) is normally
disconnected from the input, and is only connected to the input at sampling time.
5. S1 and S2 switch phases are non-overlapping and operate at the ADC clock
frequency
32
54
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semicond
Freescale Semiconductor, Inc.
System modules
S1
S2
Figure 9. Equivalent circuit for A/D loading
9.5.2 16-bit SAR ADC electrical specifications
9.5.2.1
16-bit ADC operating conditions
Table 28. 16-bit ADC operating conditions
Symbol
Description
Conditions
Min.
Typ.1
Max.
Unit
Notes
VDDA
Supply voltage
Absolute
2.7
—
3.6
V
—
ΔVDDA
Supply voltage
Delta to VDD (VDD – VDDA)
-100
0
+100
mV
2
ΔVSSA
Ground voltage
Delta to VSS (VSS – VSSA)
-100
0
+100
mV
2
VREFH
ADC reference
voltage high
Absolute
VDDA
VDDA
VDDA
V
3
VREFL
ADC reference
voltage low
Absolute
VSSA
VSSA
VSSA
V
4
VADIN
Input voltage
VSSA
—
VDDA
V
—
CADIN
Input capacitance
• 16-bit mode
—
8
10
pF
—
• 8-bit / 10-bit / 12-bit
modes
—
4
5
—
2
5
kΩ
—
RADIN
RAS
Input series
resistance
Analog source
resistance
(external)
12-bit modes
fADCK < 4 MHz
—
—
5
kΩ
fADCK
ADC conversion
clock frequency
≤ 12-bit mode
1.0
—
18.0
MHz
6
fADCK
ADC conversion
clock frequency
16-bit mode
2.0
—
12.0
MHz
6
Crate
ADC conversion
rate
≤ 12-bit modes
No ADC hardware averaging
5
7
20.000
—
818.330
Ksps
Continuous conversions
enabled, subsequent
conversion time
Crate
ADC conversion
rate
16-bit mode
No ADC hardware averaging
7
37.037
—
461.467
Ksps
Continuous conversions
enabled, subsequent
conversion time
1. Typical values assume VDDA = 3.0 V, Temp = 25 °C, fADCK = 1.0 MHz, unless otherwise stated. Typical values are for
reference only, and are not tested in production.
2. DC potential difference.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
55
System modules
3. VREFH is internally tied to VDDA.
4. VREFL is internally tied to VSSA.
5. This resistance is external to MCU. To achieve the best results, the analog source resistance must be kept as low as
possible. The results in this data sheet were derived from a system that had < 8 Ω analog source resistance. The RAS/CAS
time constant should be kept to < 1 ns.
6. To use the maximum ADC conversion clock frequency, CFG2[ADHSC] must be set and CFG1[ADLPC] must be clear.
7. For guidelines and examples of conversion rate calculation, download the ADC calculator tool.
SIMPLIFIED
INPUT PIN EQUIVALENT
CIRCUIT
ZADIN
SIMPLIFIED
CHANNEL SELECT
CIRCUIT
Pad
leakage
due to
input
protection
ZAS
RAS
ADC SAR
ENGINE
RADIN
VADIN
CAS
VAS
RADIN
INPUT PIN
RADIN
INPUT PIN
RADIN
INPUT PIN
CADIN
Figure 10. ADC input impedance equivalency diagram
9.5.2.2
16-bit ADC electrical characteristics
Table 29. 16-bit ADC characteristics (VREFH = VDDA, VREFL = VSSA)
Symbol
Description
IDDA_ADC
Supply current
fADACK
ADC
asynchronous
clock source
Sample Time
TUE
DNL
Conditions1
Min.
Typ.2
Max.
Unit
Notes
—
1.7
mA
3
tADACK = 1/
fADACK
• ADLPC=1, ADHSC=0
1.2
2.4
3.9
MHz
• ADLPC=1, ADHSC=1
3.0
4.0
7.3
MHz
• ADLPC=0, ADHSC=0
2.4
5.2
6.1
MHz
• ADLPC=0, ADHSC=1
4.4
6.2
9.5
MHz
LSB4
5
LSB4
5
See Reference Manual chapter for sample times
Total unadjusted
error
• 12-bit modes
—
±4
±6.8
• <12-bit modes
—
±1.4
±2.1
Differential nonlinearity
• 16-bit modes
—
-1 to +4
—
• 12-bit modes
—
±0.7
—
• <12-bit modes
—
±0.2
-0.3 to 0.5
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
56
Freescale Semiconductor, Inc.
System modules
Table 29. 16-bit ADC characteristics (VREFH = VDDA, VREFL = VSSA) (continued)
Symbol
Description
INL
Integral nonlinearity
EFS
Full-scale error
Conditions1
Min.
Typ.2
Max.
Unit
Notes
• 16-bit modes
—
±7.0
—
LSB4
5
• 12-bit modes
—
±1.0
-2.7 to +1.9
• <12-bit modes
—
±0.5
-0.7 to +0.5
• 12-bit modes
—
-4
-5.4
LSB4
• <12-bit modes
—
-1.4
-1.8
VADIN =
VDDA
5
EQ
ENOB
Quantization
error
• 16-bit modes
—
-1 to 0
—
• 12-bit modes
—
—
±0.5
Effective number 16-bit single-ended mode
of bits
• Avg=32
• Avg=4
LSB4
6
12.2
13.9
—
bits
11.4
13.1
—
bits
10.8
—
bits
10.2
—
bits
12-bit single-ended mode
• Avg=32
• Avg=1
SINAD
THD
Signal-to-noise
plus distortion
See ENOB
Total harmonic
distortion
16-bit single-ended mode
• Avg=32
6.02 × ENOB + 1.76
dB
7
—
-85
—
dB
—
-74
—
dB
12-bit single-ended mode
• Avg=32
SFDR
Spurious free
dynamic range
16-bit single-ended mode
• Avg=32
7
78
90
—
dB
78
—
dB
12-bit single-ended mode
• Avg=32
EIL
Input leakage
error
IIn × RAS
mV
IIn =
leakage
current
(refer to
the
device's
voltage
and current
operating
ratings)
VTEMP25
Temp sensor
slope
–40°C to 105°C
—
1.715
—
mV/°C
Temp sensor
voltage
25°C
—
722
—
mV
8
1. All accuracy numbers assume the ADC is calibrated with VREFH = VDDA
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
57
System modules
2. Typical values assume VDDA = 3.0 V, Temp = 25°C, fADCK = 2.0 MHz, unless otherwise stated. Typical values are for
reference only, and are not tested in production.
3. The ADC supply current depends on the ADC conversion clock speed, conversion rate and the ADLPC bit (low power).
For lowest power operations: the ADLPC bit should be set, the HSC bit should be clear, with 1MHz ADC conversion clock
speed.
4. 1 LSB = (VREFH - VREFL)/2N
5. ADC conversion clock <16MHz, Max hardware averaging (AVGE = %1, AVGS = %11)
6. Input data is 100 Hz sine wave. ADC conversion clock <12MHz. When running 12-bit Cyclic ADC and 12-bit DAC, some
degradation of ENOB (of 16-bit SAR ADC) may occur.
7. Input data is 1 kHz sine wave. ADC conversion clock <12MHz.
8. System Clock = 4 MHz, ADC Clock = 2 MHz, AVG = Max, Long Sampling = Max
Typical ADC 16-bit Single-Ended ENOB vs ADC Clock
100Hz, 90% FS Sine Input
14.00
13.75
13.50
13.25
13.00
ENOB
12.75
12.50
12.25
12.00
11.75
11.50
11.25
Averaging of 4 samples
Averaging of 32 samples
11.00
1
2
3
4
5
6
7
8
9
10
11
12
ADC Clock Frequency (MHz)
Figure 11. Typical ENOB vs. ADC_CLK for 16-bit single-ended mode
9.5.3 12-bit Digital-to-Analog Converter (DAC) parameters
Table 30. DAC parameters
Parameter
Conditions/Comments
Symbol
Min
Typ
Max
Unit
12
12
12
bits
—
1
—
—
11
µs
—
+/- 3
+/- 4
LSB3
DC Specifications
Resolution
Settling time1
At output load
µs
RLD = 3 kΩ
CLD = 400 pF
Power-up time
Time from release of PWRDWN
signal until DACOUT signal is valid
tDAPU
Accuracy
Integral
non-linearity2
Range of input digital words:
INL
410 to 3891 ($19A - $F33)
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
58
Freescale Semiconductor, Inc.
System modules
Table 30. DAC parameters (continued)
Parameter
Conditions/Comments
Symbol
Min
Typ
Max
Unit
Differential nonlinearity2
Range of input digital words:
DNL
—
+/- 0.8
+/- 0.9
LSB3
Monotonicity
> 6 sigma monotonicity,
Offset error2
Range of input digital words:
Gain error2
Range of input digital words: 410 to
3891 ($19A - $F33)
410 to 3891 ($19A - $F33)
guaranteed
—
< 3.4 ppm non-monotonicity
VOFFSET
—
+/- 25
+/- 43
mV
EGAIN
—
+/- 0.5
+/- 1.5
%
VSSA +
0.04 V
—
VDDA - 0.04
V
V
410 to 3891 ($19A - $F33)
DAC Output
Output voltage range
Within 40 mV of either VSSA or VDDA
VOUT
AC Specifications
Signal-to-noise ratio
SNR
—
85
—
dB
Spurious free dynamic
range
SFDR
—
-72
—
dB
Effective number of bits
ENOB
—
11
—
bits
1. Settling time is swing range from VSSA to VDDA
2. No guaranteed specification within 5% of VDDA or VSSA
3. LSB = 0.806 mV
9.5.4 CMP and 6-bit DAC electrical specifications
Table 31. Comparator and 6-bit DAC electrical specifications
Symbol
Description
Min.
Typ.
Max.
Unit
VDD
Supply voltage
2.7
—
3.6
V
IDDHS
Supply current, high-speed mode (EN=1, PMODE=1)
—
—
200
μA
IDDLS
Supply current, low-speed mode (EN=1, PMODE=0)
—
—
20
μA
VAIN
Analog input voltage
VSS – 0.3
—
VDD
V
VAIO
Analog input offset voltage
—
—
20
mV
• CR0[HYSTCTR] = 00
—
5
13
mV
• CR0[HYSTCTR] = 01
—
10
48
mV
• CR0[HYSTCTR] = 10
—
20
105
mV
• CR0[HYSTCTR] = 11
—
30
148
mV
VH
Analog comparator
hysteresis1
VCMPOh
Output high
VDD – 0.5
—
—
V
VCMPOl
Output low
—
—
0.5
V
tDHS
Propagation delay, high-speed mode (EN=1,
PMODE=1)2
50
ns
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
59
System modules
Table 31. Comparator and 6-bit DAC electrical specifications (continued)
Symbol
Description
tDLS
Min.
Typ.
Propagation delay, low-speed mode (EN=1,
PMODE=0)
IDAC6b
Max.
Unit
250
ns
Analog comparator initialization delay3
—
—
40
μs
6-bit DAC current adder (enabled)
—
7
—
μA
VDDA
—
VDD
V
6-bit DAC reference inputs: Vin1,Vin2
There are two reference input options selectable (via
VRSEL control bit). The reference options must fall
within this range.
INL
6-bit DAC integral non-linearity
–0.5
—
0.5
LSB4
DNL
6-bit DAC differential non-linearity
–0.3
—
0.3
LSB
1. Typical hysteresis is measured with input voltage range limited to 0.6 to VDD-0.6V.
2. Signal swing is 100 mV
3. Comparator initialization delay is defined as the time between software writes (to DACEN, VRSEL, PSEL, MSEL, VOSEL),
to change the control inputs and for the comparator output to settle to a stable level.
4. 1 LSB = Vreference/64
0.08
0.07
CMP Hystereris (V)
0.06
HYSTCTR
Setting
0.05
00
0.04
01
10
11
0.03
0.02
0.01
0
0.1
0.4
0.7
1
1.3
1.6
1.9
2.2
2.5
2.8
3.1
Vin level (V)
Figure 12. Typical hysteresis vs. Vin level (VDD = 3.3 V, PMODE = 0)
MC56F844XX Data Sheet, Rev. 3, 06/2014.
60
Freescale Semiconductor, Inc.
PWMs and timers
0.18
0.16
0.14
CMP Hysteresis (V)
0.12
HYSTCTR
Setting
0.1
00
01
10
11
0.08
0.06
0.04
0.02
0
0.1
0.4
0.7
1.3
1.6
1.9
Vin level (V)
1
2.2
2.5
2.8
3.1
Figure 13. Typical hysteresis vs. Vin level (VDD = 3.3 V, PMODE = 1)
9.6 PWMs and timers
9.6.1 PWM characteristics
Table 32. PWM timing parameters
Characteristic
Symbol
Min
PWM clock frequency
Typ
Max
60
Unit
MHz
9.6.2 Quad Timer timing
Parameters listed are guaranteed by design.
Table 33. Timer timing
Characteristic
Symbol
Min1
Max
Unit
See Figure
Timer input period
PIN
2T + 6
—
ns
Figure 14
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
61
PWMs and timers
Table 33. Timer timing (continued)
Characteristic
Symbol
Min1
Max
Unit
See Figure
Timer input high/low period
PINHL
1T + 3
—
ns
Figure 14
Timer output period
POUT
33
—
ns
Figure 14
Timer output high/low period
POUTHL
16.7
—
ns
Figure 14
1. T = clock cycle. For 60 MHz operation, T = 16.7 ns.
Timer Inputs
PIN
PINHL
PINHL
POUT
POUTHL
POUTHL
Timer Outputs
Figure 14. Timer timing
9.7 Communication interfaces
9.7.1 Queued Serial Peripheral Interface (SPI) timing
Parameters listed are guaranteed by design.
Table 34. SPI timing
Characteristic
Symbol
Min
Max
Unit
Cycle time
tC
55
—
ns
55
—
ns
Master
Slave
See Figure
Figure 15
Figure 16
Figure 17
Figure 18
Enable lead time
tELD
—
Master
—
ns
—
ns
—
ns
—
ns
Figure 18
Slave
Enable lag time
Master
tELG
—
Figure 18
Slave
Table continues on the next page...
MC56F844XX Data Sheet, Rev. 3, 06/2014.
62
Freescale Semiconductor, Inc.
PWMs and timers
Table 34. SPI timing (continued)
Characteristic
Symbol
Min
Max
Unit
Clock (SCK) high time
tCH
27.6
—
ns
27.6
—
ns
Master
Slave
See Figure
Figure 15
Figure 16
Figure 17
Figure 18
Clock (SCK) low time
tCL
Master
27.6
—
ns
27.6
—
ns
27.6
—
ns
1
—
ns
Figure 18
Slave
Data set-up time required for inputs
tDS
Master
Slave
Figure 15
Figure 16
Figure 17
Figure 18
Data hold time required for inputs
tDH
Master
1
—
ns
3
—
ns
Slave
Figure 15
Figure 16
Figure 17
Figure 18
Access time (time to data active
from high-impedance state)
tA
5
—
ns
tD
5
—
ns
tDV
—
8.3
ns
—
25
ns
Figure 18
Slave
Disable time (hold time to highimpedance state)
Figure 18
Slave
Data valid for outputs
Master
Slave (after enable edge)
Figure 15
Figure 16
Figure 17
Figure 18
Data invalid
tDI
Master
0
—
ns
0
—
ns
Slave
Figure 15
Figure 16
Figure 17
Figure 18
Rise time
tR
Master
—
1
ns
—
1
ns
Slave
Figure 15
Figure 16
Figure 17
Figure 18
Fall time
Master
tF
—
1
ns
—
1
ns
Slave
Figure 15
Figure 16
Figure 17
Figure 18
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
63
PWMs and timers
SS
(Input)
SS is held high on master
tC
tR
tF
tCL
SCLK (CPOL = 0)
(Output)
tCH
tF
tR
tCL
SCLK (CPOL = 1)
(Output)
tDH
tCH
tDS
MISO
(Input)
MSB in
Bits 14–1
tDI
MOSI
(Output)
LSB in
tDI(ref)
tDV
Master MSB out
Bits 14–1
Master LSB out
tR
tF
Figure 15. SPI master timing (CPHA = 0)
SS
(Input)
SS is held High on master
tC
tF
tCL
SCLK (CPOL = 0)
(Output)
tR
tCH
tF
tCL
SCLK (CPOL = 1)
(Output)
tCH
tDS
tR
MISO
(Input)
MSB in
tDI
tDV(ref)
MOSI
(Output)
Master MSB out
tDH
Bits 14–1
tDV
Bits 14– 1
tF
LSB in
tDI(ref)
Master LSB out
tR
Figure 16. SPI master timing (CPHA = 1)
MC56F844XX Data Sheet, Rev. 3, 06/2014.
64
Freescale Semiconductor, Inc.
PWMs and timers
SS
(Input)
tC
tF
tCL
SCLK (CPOL = 0)
(Input)
tELG
tR
tCH
tELD
tCL
SCLK (CPOL = 1)
(Input)
tCH
tA
MISO
(Output)
Slave MSB out
tF
tR
Bits 14–1
tDS
Slave LSB out
tDV
tDI
tDH
MOSI
(Input)
MSB in
tD
Bits 14–1
tDI
LSB in
Figure 17. SPI slave timing (CPHA = 0)
SS
(Input)
tF
tC
tR
tCL
SCLK (CPOL = 0)
(Input)
tCH
tELG
tELD
tCL
SCLK (CPOL = 1)
(Input)
tDV
tCH
tR
tA
MISO
(Output)
Slave MSB out
Bits 14–1
tDS
tDV
tDH
MOSI
(Input)
tD
tF
MSB in
Bits 14–1
Slave LSB out
tDI
LSB in
Figure 18. SPI slave timing (CPHA = 1)
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
65
PWMs and timers
9.7.2 Queued Serial Communication Interface (SCI) timing
Parameters listed are guaranteed by design.
Table 35. SCI timing
Characteristic
Symbol
Min
Max
Unit
See Figure
BR
—
(fMAX/16)
Mbit/s
—
RXD pulse width
RXDPW
0.965/BR
1.04/BR
ns
Figure 19
TXD pulse width
TXDPW
0.965/BR
1.04/BR
ns
Figure 20
-14
14
%
—
Baud
rate1
LIN Slave Mode
Deviation of slave node clock from nominal FTOL_UNSYNCH
clock rate before synchronization
Deviation of slave node clock relative to
the master node clock after
synchronization
FTOL_SYNCH
-2
2
%
—
Minimum break character length
TBREAK
13
—
Master
node bit
periods
—
11
—
Slave node
bit periods
—
1. fMAX is the frequency of operation of the SCI clock in MHz, which can be selected as the bus clock (max.120 MHz
depending on part number) or 2x bus clock (max. MHz) for the devices.
RXD
SCI receive
data pin
(Input)
RXDPW
Figure 19. RXD pulse width
TXD
SCI transmit
data pin
(output)
TXDPW
Figure 20. TXD pulse width
9.7.3 Freescale’s Scalable Controller Area Network (FlexCAN)
Table 36. FlexCAN Timing Parameters
Characteristic
Symbol
Min
Max
Unit
Baud Rate
BRCAN
—
1
Mbps
CAN Wakeup dominant pulse filtered
TWAKEUP
—
2
µs
CAN Wakeup dominant pulse pass
TWAKEUP
5
—
µs
MC56F844XX Data Sheet, Rev. 3, 06/2014.
66
Freescale Semiconductor, Inc.


PWMs and timers
CAN_RX
CAN receive
data pin
(Input)
TWAKEUP
Figure 21. Bus Wake-up Detection
9.7.4 Inter-Integrated Circuit Interface (I2C) timing
Table 37. I 2C timing
Characteristic
Symbol
Standard Mode
Fast Mode
Unit
Minimum
Maximum
Minimum
Maximum
SCL Clock Frequency
fSCL
0
100
0
400
kHz
Hold time (repeated) START condition.
After this period, the first clock pulse is
generated.
tHD; STA
4
—
0.6
—
µs
LOW period of the SCL clock
tLOW
4.7
—
1.3
—
HIGH period of the SCL clock
tHIGH
4
—
0.6
—

µs
µs
Set-up time for a repeated START
condition
tSU; STA
4.7
—
0.6
—

Data hold time for I2C bus devices
tHD; DAT
01
3.452
03
0.91

Data set-up time
tSU; DAT
2504
—
1002, 5
—
Rise time of SDA and SCL signals
tr
—
1000
20 +0.1Cb6
300
5
300

µs
µs
ns
ns
Fall time of SDA and SCL signals
tf
—
300
20 +0.1Cb
Set-up time for STOP condition
tSU; STO
4
—
0.6
—
µs
Bus free time between STOP and
START condition
tBUF
4.7
—
1.3
—
µs
Pulse width of spikes that must be
suppressed by the input filter
tSP
N/A
N/A
0
50
ns

ns
1. The master mode I2C deasserts ACK of an address byte simultaneously with the falling edge of SCL. If no slaves
acknowledge this address byte, then a negative hold time can result, depending on the edge rates of the SDA and SCL
lines.
2. The maximum tHD; DAT must be met only if the device does not stretch the LOW period (tLOW) of the SCL signal.
3. Input signal Slew = 10 ns and Output Load = 50 pF
4. Set-up time in slave-transmitter mode is 1 IPBus clock period, if the TX FIFO is empty.
5. A Fast mode I2C bus device can be used in a Standard mode I2C bus system, but the requirement tSU; DAT ≥ 250 ns must
then be met. This is automatically the case if the device does not stretch the LOW period of the SCL signal. If such a
device does stretch the LOW period of the SCL signal, then it must output the next data bit to the SDA line trmax + tSU; DAT
= 1000 + 250 = 1250 ns (according to the Standard mode I2C bus specification) before the SCL line is released.
6. Cb = total capacitance of the one bus line in pF.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
67
Design Considerations
SDA
tf
tLOW
tSU; DAT
tr
tf
tHD; STA
tr
tSP
tBUF
SCL
S
tHD; STA
tHD; DAT
tHIGH
tSU; STA
SR
tSU; STO
P
S
Figure 22. Timing definition for fast and standard mode devices on the I2C bus
10 Design Considerations
10.1 Thermal design considerations
An estimate of the chip junction temperature (TJ) can be obtained from the equation:
TJ = TA + (RΘJA x PD)
Where,
TA = Ambient temperature for the package (°C)
RΘJA = Junction-to-ambient thermal resistance (°C/W)
PD = Power dissipation in the package (W)
The junction-to-ambient thermal resistance is an industry-standard value that provides a
quick and easy estimation of thermal performance. Unfortunately, there are two values in
common usage: the value determined on a single-layer board and the value obtained on a
board with two planes. For packages such as the PBGA, these values can be different by
a factor of two. Which TJ value is closer to the application depends on the power
dissipated by other components on the board.
• The TJ value obtained on a single layer board is appropriate for a tightly packed
printed circuit board.
• The TJ value obtained on a board with the internal planes is usually appropriate if the
board has low-power dissipation and if the components are well separated.
When a heat sink is used, the thermal resistance is expressed as the sum of a junction-tocase thermal resistance and a case-to-ambient thermal resistance:
RΘJA = RΘJC + RΘCA
Where,
MC56F844XX Data Sheet, Rev. 3, 06/2014.
68
Freescale Semiconductor, Inc.
Design Considerations
RΘJA = Package junction-to-ambient thermal resistance (°C/W)
RΘJC = Package junction-to-case thermal resistance (°C/W)
RΘCA = Package case-to-ambient thermal resistance (°C/W)
RΘJC is device related and cannot be adjusted. You control the thermal environment to
change the case to ambient thermal resistance, RΘCA. For instance, you can change the
size of the heat sink, the air flow around the device, the interface material, the mounting
arrangement on printed circuit board, or change the thermal dissipation on the printed
circuit board surrounding the device.
To determine the junction temperature of the device in the application when heat
sinks are not used, the thermal characterization parameter (YJT) can be used to
determine the junction temperature with a measurement of the temperature at the top
center of the package case using the following equation:
TJ = TT + (ΨJT x PD)
Where,
TT = Thermocouple temperature on top of package (°C/W)
ΨJT = hermal characterization parameter (°C/W)
PD = Power dissipation in package (W)
The thermal characterization parameter is measured per JESD51–2 specification using a
40-gauge type T thermocouple epoxied to the top center of the package case. The
thermocouple should be positioned so that the thermocouple junction rests on the
package. A small amount of epoxy is placed over the thermocouple junction and over
about 1 mm of wire extending from the junction. The thermocouple wire is placed flat
against the package case to avoid measurement errors caused by cooling effects of the
thermocouple wire.
To determine the junction temperature of the device in the application when heat
sinks are used, the junction temperature is determined from a thermocouple inserted at
the interface between the case of the package and the interface material. A clearance slot
or hole is normally required in the heat sink. Minimizing the size of the clearance is
important to minimize the change in thermal performance caused by removing part of the
thermal interface to the heat sink. Because of the experimental difficulties with this
technique, many engineers measure the heat sink temperature and then back-calculate the
case temperature using a separate measurement of the thermal resistance of the interface.
From this case temperature, the junction temperature is determined from the junction-tocase thermal resistance.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
69
Design Considerations
10.2 Electrical design considerations
CAUTION
This device contains protective circuitry to guard against
damage due to high static voltage or electrical fields. However,
take normal precautions to avoid application of any voltages
higher than maximum-rated voltages to this high-impedance
circuit. Reliability of operation is enhanced if unused inputs are
tied to an appropriate voltage level.
Use the following list of considerations to assure correct operation of the device:
• Provide a low-impedance path from the board power supply to each VDD pin on the
device and from the board ground to each VSS (GND) pin.
• The minimum bypass requirement is to place 0.01–0.1 µF capacitors positioned as
near as possible to the package supply pins. The recommended bypass configuration
is to place one bypass capacitor on each of the VDD/VSS pairs, including VDDA/VSSA.
Ceramic and tantalum capacitors tend to provide better tolerances.
• Ensure that capacitor leads and associated printed circuit traces that connect to the
chip VDD and VSS (GND) pins are as short as possible.
• Bypass the VDD and VSS with approximately 100 µF, plus the number of 0.1 µF
ceramic capacitors.
• PCB trace lengths should be minimal for high-frequency signals.
• Consider all device loads as well as parasitic capacitance due to PCB traces when
calculating capacitance. This is especially critical in systems with higher capacitive
loads that could create higher transient currents in the VDD and VSS circuits.
• Take special care to minimize noise levels on the VREF, VDDA, and VSSA pins.
• Using separate power planes for VDD and VDDA and separate ground planes for VSS
and VSSA are recommended. Connect the separate analog and digital power and
ground planes as near as possible to power supply outputs. If an analog circuit and
digital circuit are powered by the same power supply, then connect a small inductor
or ferrite bead in serial with VDDA. Traces of VSS and VSSA should be shorted
together.
• Physically separate analog components from noisy digital components by ground
planes. Do not place an analog trace in parallel with digital traces. Place an analog
ground trace around an analog signal trace to isolate it from digital traces.
• Because the flash memory is programmed through the JTAG/EOnCE port, SPI, SCI,
or I2C, the designer should provide an interface to this port if in-circuit flash
programming is desired.
• If desired, connect an external RC circuit to the RESET pin. The resistor value
should be in the range of 4.7 kΩ–10 kΩ; the capacitor value should be in the range of
0.22 µF–4.7 µF.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
70
Freescale Semiconductor, Inc.
Obtaining package dimensions
• Configuring the RESET pin to GPIO output in normal operation in a high-noise
environment may help to improve the performance of noise transient immunity.
• Add a 2.2 kΩ external pullup on the TMS pin of the JTAG port to keep EOnCE in a
restate during normal operation if JTAG converter is not present.
• During reset and after reset but before I/O initialization, all I/O pins are at tri-state.
• To eliminate PCB trace impedance effect, each ADC input should have a no less than
33 pF 10Ω RC filter.
11 Obtaining package dimensions
Package dimensions are provided in package drawings.
To find a package drawing, go to freescale.com and perform a keyword search for the
drawing’s document number:
Drawing for package
Document number to be used
48-pin LQFP
98ASH00962A
64-pin LQFP
98ASS23234W
12 Pinout
12.1 Signal Multiplexing and Pin Assignments
This section shows the signals available on each package pin and the locations of these
pins on the devices supported by this document. The SIM's GPS registers are responsible
for selecting which ALT functionality is available on most pins.
NOTE
The RESETB pin is a 3.3 V pin only.
NOTE
If the GPIOC1 pin is used as GPIO, the XOSC should be
powered down.
NOTE
PWMB signals—including PWMB_2A, PWMB_2B, and
PWMB_3X—are not available on the 64 LQFP package or the
48 LQFP package.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
71
Pinout
64
48
LQFP LQFP
Pin Name
Default
ALT0
ALT1
ALT2
ALT3
1
1
TCK
TCK
GPIOD2
2
2
RESETB
RESETB
GPIOD4
3
3
GPIOC0
GPIOC0
EXTAL
4
4
GPIOC1
GPIOC1
XTAL
5
5
GPIOC2
GPIOC2
TXD0
TB0
XB_IN2
6
—
GPIOF8
GPIOF8
RXD0
TB1
CMPD_O
7
6
GPIOC3
GPIOC3
TA0
CMPA_O
RXD0
CLKIN1
8
7
GPIOC4
GPIOC4
TA1
CMPB_O
XB_IN8
EWM_OUT_B
9
—
GPIOA7
GPIOA7
ANA7&ANC11
10
—
GPIOA6
GPIOA6
ANA6&ANC10
11
—
GPIOA5
GPIOA5
ANA5&ANC9
12
8
GPIOA4
GPIOA4
ANA4&ANC8&CMPD_IN0
13
9
GPIOA0
GPIOA0
ANA0&CMPA_IN3
14
10
GPIOA1
GPIOA1
ANA1&CMPA_IN0
15
11
GPIOA2
GPIOA2
ANA2&VREFHA&CMPA_IN1
16
12
GPIOA3
GPIOA3
ANA3&VREFLA&CMPA_IN2
17
—
GPIOB7
GPIOB7
ANB7&ANC15&CMPB_IN2
18
13
GPIOC5
GPIOC5
DACO
19
—
GPIOB6
GPIOB6
ANB6&ANC14&CMPB_IN1
20
—
GPIOB5
GPIOB5
ANB5&ANC13&CMPC_IN2
21
14
GPIOB4
GPIOB4
ANB4&ANC12&CMPC_IN1
22
15
VDDA
VDDA
23
16
VSSA
VSSA
24
17
GPIOB0
GPIOB0
ANB0&CMPB_IN3
25
18
GPIOB1
GPIOB1
ANB1&CMPB_IN0
26
19
VCAP
VCAP
27
20
GPIOB2
GPIOB2
ANB2&VREFHB&CMPC_IN3
28
21
GPIOB3
GPIOB3
ANB3&VREFLB&CMPC_IN0
29
—
VDD
VDD
30
22
VSS
VSS
31
23
GPIOC6
GPIOC6
TA2
XB_IN3
32
24
GPIOC7
GPIOC7
SS0_B
TXD0
33
25
GPIOC8
GPIOC8
MISO0
RXD0
34
26
GPIOC9
GPIOC9
SCLK0
XB_IN4
35
27
GPIOC10
GPIOC10
MOSI0
XB_IN5
MISO0
36
28
GPIOF0
GPIOF0
XB_IN6
TB2
SCLK1
37
29
GPIOC11
GPIOC11
CANTX
SCL1
TXD1
38
30
GPIOC12
GPIOC12
CANRX
SDA1
RXD1
39
—
GPIOF2
GPIOF2
SCL1
XB_OUT6
40
—
GPIOF3
GPIOF3
SDA1
XB_OUT7
41
—
GPIOF4
GPIOF4
TXD1
XB_OUT8
CLKIN0
CLKO0
CMPC_O
XB_IN7
CMP_REF
XB_IN9
MC56F844XX Data Sheet, Rev. 3, 06/2014.
72
Freescale Semiconductor, Inc.
Pinout
64
48
LQFP LQFP
Pin Name
Default
ALT0
RXD1
ALT1
ALT2
42
—
GPIOF5
GPIOF5
43
31
VSS
VSS
44
32
VDD
VDD
45
33
GPIOE0
GPIOE0
PWMA_0B
46
34
GPIOE1
GPIOE1
PWMA_0A
47
35
GPIOE2
GPIOE2
PWMA_1B
48
36
GPIOE3
GPIOE3
PWMA_1A
49
37
GPIOC13
GPIOC13
TA3
XB_IN6
EWM_OUT_B
50
38
GPIOF1
GPIOF1
CLKO1
XB_IN7
CMPD_O
51
39
GPIOE4
GPIOE4
PWMA_2B
XB_IN2
52
40
GPIOE5
GPIOE5
PWMA_2A
XB_IN3
53
—
GPIOE6
GPIOE6
PWMA_3B
XB_IN4
54
—
GPIOE7
GPIOE7
PWMA_3A
XB_IN5
55
41
GPIOC14
GPIOC14
SDA0
XB_OUT4
56
42
GPIOC15
GPIOC15
SCL0
XB_OUT5
57
43
VCAP
VCAP
58
—
GPIOF6
GPIOF6
TB2
PWMA_3X
59
—
GPIOF7
GPIOF7
TB3
CMPC_O
60
44
VDD
VDD
61
45
VSS
VSS
62
46
TDO
TDO
GPIOD1
63
47
TMS
TMS
GPIOD3
64
48
TDI
TDI
GPIOD0
ALT3
XB_OUT9
XB_IN2
SS1_B
XB_IN3
12.2 Pinout diagrams
The following diagrams show pinouts for the packages. For each pin, the diagrams show
the default function. However, many signals may be multiplexed onto a single pin.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
73
TDI
TMS
TDO
VSS
VDD
GPIOF7
GPIOF6
VCAP
GPIOC15
GPIOC14
GPIOE7
GPIOE6
GPIOE5
GPIOE4
GPIOF1
GPIOC13
64
63
62
61
60
59
58
57
56
55
54
53
52
51
50
49
Pinout
GPIOF4
GPIOA7
9
40
GPIOF3
GPIOA6
10
39
GPIOF2
GPIOA5
11
38
GPIOC12
GPIOA4
12
37
GPIOC11
GPIOA0
13
36
GPIOF0
GPIOA1
14
35
GPIOC10
GPIOA2
15
34
GPIOC9
GPIOA3
16
33
GPIOC8
GPIOC7
32
41
31
8
GPIOC6
GPIOC4
30
GPIOF5
VSS
42
29
7
VDD
GPIOC3
28
VSS
GPIOB3
43
27
6
GPIOB2
GPIOF8
26
VDD
VCAP
44
25
5
GPIOB1
GPIOC2
24
GPIOE0
GPIOB0
45
23
4
VSSA
GPIOC1
22
GPIOE1
VDDA
46
21
3
GPIOB4
GPIOC0
20
GPIOE2
GPIOB5
47
19
2
GPIOB6
RESETB
18
GPIOE3
GPIOC5
48
17
1
GPIOB7
TCK
Figure 23. 64-pin LQFP
NOTE
The RESETB pin is a 3.3 V pin only.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
74
Freescale Semiconductor, Inc.
TDI
TMS
TDO
VSS
VDD
VCAP
GPIOC15
GPIOC14
GPIOE5
GPIOE4
GPIOF1
GPIOC13
48
47
46
45
44
43
42
41
40
39
38
37
Pinout
GPIOC4
7
30
GPIOC12
GPIOA4
8
29
GPIOC11
GPIOA0
9
28
GPIOF0
GPIOA1
10
27
GPIOC10
GPIOA2
11
26
GPIOC9
GPIOA3
12
25
GPIOC8
24
VSS
GPIOC7
31
23
6
GPIOC6
GPIOC3
22
VDD
VSS
32
21
5
GPIOB3
GPIOC2
20
GPIOE0
GPIOB2
33
19
4
VCAP
GPIOC1
18
GPIOE1
GPIOB1
34
17
3
GPIOB0
GPIOC0
16
GPIOE2
VSSA
35
15
2
VDDA
RESETB
14
GPIOE3
GPIOB4
36
13
1
GPIOC5
TCK
Figure 24. 48-pin LQFP
NOTE
The RESETB pin is a 3.3 V pin only.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
75
Product documentation
13 Product documentation
The documents listed in Table 38 are required for a complete description and proper
design with the device. Documentation is available from local Freescale distributors,
Freescale Semiconductor sales offices, or online at freescale.com.
Table 38. Device documentation
Topic
DSP56800E/DSP56800EX
Reference Manual
Description
Document Number
Detailed description of the 56800EX family architecture, 32-bit
digital signal controller core processor, and the instruction set
DSP56800ERM
MC56F844xx Reference Manual
Detailed functional description and programming model
MC56F844XXRM
MC56F844xx Data Sheet
Electrical and timing specifications, pin descriptions, and
package information (this document)
MC56F844XX
MC56F84xxx Errata
Details any chip issues that might be present
MC56F84XXX_0N27E
14 Revision history
The following table summarizes changes to this document since the release of the
previous version.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
76
Freescale Semiconductor, Inc.
Revision history
Table 39. Revision history
Rev.
Date
3
06/2014
Substantial Changes
Changes include:
• Correction to "PWMs and timers" feature group on page 1
• Correction: there is 1 queued SPI module, not 2.
• Updates and corrections to "56F844xx/5xx/7xx family" table.
• In "Interrupt Controller" section, added info about Interrupt level 3.
• In "Enhanced Flex Pulse Width Modulator (eFlexPWM)" section,
• Upated PWM frequencies based on device frequency, plus updated resolution of
fractional clock digital dithering.
• Updated feature list.
• Added new section "MC56F844xx signal and pin descriptions".
• In "Signal groups" section, in "Functional Group Pin Allocations" table, made corrections to
"Functional Group Pin Allocations" table.
• In "Voltage and current operating requirements" section, added RESET voltage high to
"Recommended Operating Conditions" table.
• In "Voltage and current operating behaviors" section, in "DC Electrical Characteristics" table,
updated Digital Input Current High for Pin Group 2.
• For "Power mode transition operating behaviors" section,
• Changed the name to "Power mode operating behaviors".
• In "Reset, Stop, Wait, and Interrupt Timing" table, updated "RESET deassertion to First
Address Fetch" parameters.
• Added new table "Power-On-Reset mode transition times".
• In "Power consumption operating behaviors" section, updated mode currrent values in
"Current Consumption" table.
• In "JTAG Timing" section, changed "TCK frequency of operation" to SYS_CLK/16 from
SYS_CLK/8.
• In "System modules" section, in "Voltage regulator specifications" section, in "Regulator 1.2 V
parameters" table, updated "Short Circuit Current" parameter.
• In "Relaxation Oscillator Timing" section, updates in "Relaxation Oscillator Electrical
Specifications" table.
• In "Memories and memory interfaces" section,
• "Flash Memory Characteristics" section is now called "Flash electrical specifications"
section.
• Added new section "Flash timing specifications — program and erase", where the
"Flash Timing Parameters" table (now called "NVM program/erase timing specifications"
table, and table was updated.
• Added new section "Flash high voltage current behaviors".
• In "Analog" section, in "12-bit cyclic Analog-to-Digital Converter (ADC) parameters" section,
updated "12-bit ADC electrical specifications" table.
• In "Pinout" section, in "Signal Multiplexing and Pin Assignments" section,
• Added 3 notes.
• In pin mux table, changed SCK0 to SCLK0, SCK1 to SCLK1, updates to 64LQFP[62-64]
and 48LQFP[46-48].
• In "64-pin LQFP" figure, made updates to pins 62-64, and added a note.
• In "48-pin LQFP" figure, made updates to pins 46-48, and added a note.
• In "Product Documentation" section, in "Device Documentation" table, removed Serial
Bootloader User Guide, because it is not used for these devices.
MC56F844XX Data Sheet, Rev. 3, 06/2014.
Freescale Semiconductor, Inc.
77
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Document Number: MC56F844XX
Rev. 3, 06/2014
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sales representative.
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http://www.freescale.com/epp.
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