Q1 - 1997

RELIABILITY MONITOR SUMMARY
QUARTERLY SUMMARY, QUARTER 1, 1997
April 17, 1997
PERFORMED PER THE REQUIREMENTS OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION.
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
STANDARD STRESS TEST DESCRIPTIONS
Test
HTOL
HTOL2
HTSSL
HTSSL2
DRET
DRET2
PCT
HAST
TC
TC2
HTS
TEV
Description
High Temp Op Life, 150°C, 5.75V
High Temp Op Life, 125°C, 5.75V
High Temp Steady State Life, 150°C, 5.75V
High Temp Steady State Life, 125°C, 5.75V
Data Retention Test, Data Bake 165°C, Plastic
Data Retention Test, Data Bake 250°C, Hermetic
Pressure Cooker Test, 121°C, 100% RH, No Bias
Hi-Accel Saturation Test, 140°C, 85% RH, 5.5V Bias
Temp Cycle, 125°C to -40°C
Temp Cycle, 150°C to -65°C
High Temp Storage, 165°C, No Bias
Temperature Extreme Verification
-- PAGE 2 --
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
WAFER FAB AREAS
FAB #
CA
TX
MN
FR
LOCATION
SAN JOSE, CALIFORNIA
ROUND ROCK, TEXAS
BLOOMINGTON, MINNESOTA
MHS, FRANCE
ASSEMBLY LOCATIONS
COMPANY/LOCATION
Anam-Buchon/Korea
Asat/Hongkong
Cypress/USA
Dynesem/Philippine
Cypress-Minesota/USA
Astra/Indonesia
ASE/Taiwan
Hyundai/Korea
ASE/Malaysia
TMS/Thailand
Anam-Seoul/Korea
Anam/Phillipine
Express/USA
Omedata/Indonesia
Pantronix/USA
Anam-Bupyong/Korea
Cypress/Philippines
AMT
OSE/Taiwan
Unisem/Malaysia
APLUS/USA
Toshiba/USA
Cypress Bangkok/Thailand
Alphatech/Thailand
Hana/Thailand
ID
KOREA-A
ASAT-B
USA-C
PHIL-D
USA-E
INDNS-F
TAIWAN-G
KOREA-HH
MALAY-J
THLAND-K
KOREA-L
PHIL-M
USA-N
INDNS-O
USA-P
KOREA-Q
PHIL-R
USA-S
TAIWAN-T
MALAY-U
USA-V
USA-W
ALPHA-X
ALPHA-Y
THLAND-Z
-- PAGE 3 --
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Description of Data Table Column Headings
Column Heading
Description of Column Contents
Division
Cypress Manufacturing Division
Test
Common code for the stress performed. See table on previous page for detail.
Test Condition
Temp/humidity/bias conditions for the stress. See table on previous page for detail.
Device ID
Cypress manufacturing part number for specific type.
Date Code
Week in which the specific lot was sealed/molded.
Lot Number
Manufacturing (assembly) lot number of material stressed.
Function
Generic product family at Cypress.
Description
Brief description of device function.
Technology
Fabrication process technology. See Cypress Product Matrix for detail.
Process
Generic fabrication process.
Process Location
State where fabrication facility is located. See table on previous page for detail.
Pkg Material
Generic packaging material
Pkg Type
Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package).
Package Location
Country Location + Initial of assembly house (see table on previous page for detail).
# Pins
Pin count of package in which device is assembled.
Duration
Data Readpoint of stress. For Temp Cycle (TC)=Cycles; all other stresses=Hours.
# Tested
Quantity of devices submitted to this stress/test.
# Failed
Quantity of devices failing at this specific readpoint.
Fail Mode
Failure analysis results from this test, if any.
-- PAGE 4 --
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---CPD
DRET
165C/NO BIAS
CY5037WAF
96388 9650
Assembly
Lot No
---------5037SWR
Function
----TTECH
ProDescription Technology
cess
----------- ---------------- -----CLOCK SYN. SRAM/LOGIC-L28
CMOS
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------20 168
76
0
552
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
140C/5.5V
CY2295PVC
96436 NA
3544833
TTECH CLOCK SYN. SRAM/LOGIC-L28
CMOS
MN SSOP PHIL-M
28 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.50V
CY5037WAF
96388 9650 5037SWR
TTECH CLOCK SYN. SRAM/LOGIC-L28
CMOS
MN SOIC PHIL-M
20
48 1001
0 1 EOS
48 1014
0
80
116
0
500
116
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 110C/6.50V
CY82C691-NC
96435 9647 349614962 PCLOG PC CHIPSET SRAM/LOGIC-R28
CMOS
MN PQFP MALAY-J 208
48
176
0
349614963 PCLOG PC CHIPSET SRAM/LOGIC-R28
CMOS
MN PQFP MALAY-J 208
48
187
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY82C694-NC
96431 9646 349614854 SYNCHR HYPER CACHE SRAM/LOGIC-R28
CMOS
MN PQFP MALAY-J 128 168
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
CY2295PVC
96436 NA
3544833
TTECH CLOCK SYN. SRAM/LOGIC-L28
CMOS
MN SSOP PHIL-M
28 100
45
0
200
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CY2295PVC
96436 9641 349612823 TTECH CLOCK SYN. SRAM/LOGIC-L28
CMOS
MN SSOP PHIL-M
28 300
47
0
9646 349614629 TTECH CLOCK SYN. SRAM/LOGIC-L28
CMOS
MN SSOP PHIL-M
28 300
47
0
NA
3544833
TTECH CLOCK SYN. SRAM/LOGIC-L28
CMOS
MN SSOP PHIL-M
28 300
45
0
1000
45
0
CY82C694-NC
96431 9646 349614854 SYNCHR HYPER CACHE SRAM/LOGIC-R28
CMOS
MN PQFP MALAY-J 128 300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
-- PAGE 5 --
Wfr
Loc
--MN
Pkg
type
---SOIC
Assy
Loc
------PHIL-M
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
----- ------ ---------------- --------------DCD
HAST
140C/5.5V
CY7B135-JC
CY7B933-JIT
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------52 128
78
0
28 128
12
0
128
12
0
128
27
0
CY7C130-PC
M64010 9634 519610210 SPCM
1K x 8 DP
SRAM/LOGIC-R21
CMOS
TX PDIP INDNS-O
48 128
30
0 1 EOS
128
48
0
CY7C136-JC
97045 9648 349614991 SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
TX PLCC PHIL-M
52 128
48
0
CY7C4265-JC
M71010 9642 349612938 SPCM
16KX18 FIFO SRAM/LOGIC-R30
CMOS
CA PLCC PHIL-M
68 128
77
0
CY7C4851-AC
96361 9640 349612849 SPCM
8Kx9x2 FIFO SRAM/LOGIC-R28
CMOS
MN TQFP KOREA-Q
64 128
34
0
128
50
1 1 OXIDE DEFECT
9644 349612847 SPCM
8Kx9x2 FIFO SRAM/LOGIC-R28
CMOS
MN TQFP KOREA-Q
64 128
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
CY7C136-JC
97045 9648 349614991 SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
TX PLCC PHIL-M
52
80
116
0
500
116
0
CY7C140-DMB
96362 9643 219612739 SPCM
1K x 8 DP
SRAM/LOGIC-R21
CMOS
TX CERD ALPAH-X
48 184
48
0
CY7C4851-AC
96361 9644 349612847 SPCM
8Kx9x2 FIFO SRAM/LOGIC-R28
CMOS
MN TQFP KOREA-Q
64
80
124
0
500
124
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CY7C4851-AC
96361 9644 349612847 SPCM
8Kx9x2 FIFO SRAM/LOGIC-R28
CMOS
MN TQFP KOREA-Q
64 336
90
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.75V
CY7C136-JC
97045 9648 349614991 SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
TX PLCC PHIL-M
52
80
80
0
168
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY7C130-PC
M64011 9634 519610210 SPCM
1K x 8 DP
SRAM/LOGIC-R21
CMOS
TX PDIP INDNS-O
48
96
78
0 2 ESD
168
76
0
CY7C611A-NC
M64023 9640 349608857 VME
RISC CONTRL SRAM/LOGIC-L20
CMOS
TX PQFP HK-B
160
96
80
0 18 EXTERNAL CONTAMINATION
VIC068A-AC
M71045 9650 349615349 VME
VME INTERF. SRAM/LOGIC-C2AN CMOS
MN TQFP HK-B
144 168
80
0
288
80
0
VIC068A-BC
M64024 9636 349610885 VME
VME INTERF. SRAM/LOGIC-C2AN CMOS
MN PPGA PHIL-M
144
96
79
1 3 EXTERNAL
CONTAMINATION/1 OXIDIZED
168
75
0 16 EXTERNAL CONTAMINATION
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
CY7C4851-AC
96361 9644 349612847 SPCM
8Kx9x2 FIFO SRAM/LOGIC-R28
CMOS
MN TQFP KOREA-Q
64 100
90
0
200
90
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CY7B145-JC
96391 9646 349614209 SPCM
8K x 9 DP
BICMOS-SM2
BiCMOS TX PLCC KOREA-A
68 300
48
0
349614210 SPCM
8K x 9 DP
BICMOS-SM2
BiCMOS TX PLCC KOREA-A
68 300
48
0
CY7B933-JIT
96501 9647 349614957 CHNL
HOTLink
BICMOS-SM1
BiCMOS TX PLCC KOREA-A
28 300
50
0
1000
50
0
349614958 CHNL
HOTLink
BICMOS-SM1
BiCMOS TX PLCC KOREA-A
28 300
50
0
300
50
0
1000
50
0
1000
50
0
CY7C136-JC
97045 9648 349614991 SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
TX PLCC PHIL-M
52 300
48
0
M64006 9639 349612051 SPCM
2K x 8 DP
SRAM/LOGIC-R21
CMOS
TX PLCC PHIL-M
52 300
48
0
CY7C140-DMB
96362 9643 219612739 SPCM
1K x 8 DP
SRAM/LOGIC-R21
CMOS
TX CERD ALPHA-X
48 100
46
0
1000
46
0
CY7C4851-AC
96361 9640 349612849 SPCM
8Kx9x2 FIFO SRAM/LOGIC-R28
CMOS
MN TQFP KOREA-Q
64 300
84
0
Eval#
-----M71055
96501
D/C
---9640
9647
Assembly
Lot No
---------349612257
349614957
Function
----SPCM
CHNL
Description
----------4K x 8 DP
HOTLink
Technology
---------------BICMOS-SM2
BICMOS-SM1
-- PAGE 6 --
Process
-----BiCMOS
BiCMOS
Wfr
Loc
--TX
TX
Pkg
type
---PLCC
PLCC
Assy
Loc
------KOREA-A
KOREA-A
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---DCD
TC2
-65C TO 150C
CY7C4851-AC
96361 9644
Assembly
Lot No
---------349612847
Function
----SPCM
ProDescription Technology
cess
----------- ---------------- -----8Kx9x2 FIFO SRAM/LOGIC-R28
CMOS
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------64 300
80
0
1000
80
0
9645 349612848 SPCM
8Kx9x2 FIFO SRAM/LOGIC-R28
CMOS
MN TQFP KOREA-Q
64 300
84
0
1000
84
0
CY7C611A-NC
M64022 9640 349608857 VME
RISC CONTRL SRAM/LOGIC-L20
CMOS
TX PQFP HK-B
160 300
49
14 13 TOPSIDE CRACKS/1
LIFTING BOND/S
VIC068A-BC
M64038 9636 349610885 VME
VME INTERF. SRAM/LOGIC-C2AN CMOS
MN PPGA PHIL-M
144 300
48
0
1000
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
CY7B135-JC
M71052 9640 349612257 SPCM
4K x 8 DP
BICMOS-SM2
BiCMOS TX PLCC KOREA-A
52
-5
119
0
25
119
0
85
119
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
-- PAGE 7 --
Wfr
Loc
--MN
Pkg
type
---TQFP
Assy
Loc
------KOREA-Q
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
----- ------ ---------------MPD
HAST
140C/3.6V
140C/5.5V
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------28 128
47
0
28 128
78
0
28 128
80
0
CY62256-SNC
28 128
48
0
28 128
48
0
CY62256-VC
28 128
48
0
CY7C1009-VC
32 128
55
0
32 128
9
0
128
24
0
128
47
0
CY7C1021-VC
96454 9648 349614989 COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
44 128
48
0
97051 9648 349614989 COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
44 128
48
0
CY7C1031-JC
M64060 9627 519608948/ SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN PLCC INDNS-O
52 128
78
2 1 EOS/2 POPCORN
CY7C109-VC
M64037 9637 519611640/ COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32 128
80
0
M71073 9703 519700412 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32 128
78
0
CY7C1335-AC
97145 9639 349611958 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100 128
46
0
9641 349612518 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100 128
47
0
256
47
0
CY7C1512-SC
M64079 9641 349613171 COMDTY 64Kx8
SRAM/LOGIC-R28
CMOS
MN SOIC TAIWAN-G 32 128
26
0
128
54
0
CY7C185-VC
96453 9646 219614640/ COMDTY SML/64K
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28 128
48
0
CY7C186-ZC
M64064 9628 349609461 COMDTY SML/64K
SRAM/LOGIC-R28
CMOS
MN TSOP KOREA-Q
32 128
50
0
M71031 9651 349615740/ COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX TSOP KOREA-Q
32 128
80
0
CY7C188-VC
M64054 9641 349612373/ COMDTY 32K x 9
SRAM/LOGIC-R28
CMOS
MN SOJ KOREA-L
32 128
32
0
128
46
0
128
46
0
M71034 9701 349615949 COMDTY 32K x 9
SRAM/LOGIC-R28
CMOS
MN SOJ KOREA-L
32 128
32
0
128
48
0
CY7C199-VC
96389 9633 619600094 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28 128
50
0
M64029 9639 219613113/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28 128
78
2 2 TOPSIDE SCRATCHES
M64031 9642 619600945 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28 128
77
0
M64051 9639 619600540 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28 128
78
0
M64058 9645 619601025 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28 128
78
0
CY7C199-ZC
M64073 9643 349613792 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP PHIL-M
28 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.63
CY62256V-SNC
97063 9646 519613860 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28
80
120
0
500
120
0
150C/3.63V
CY62256V-SNC
97063 9646 519613860 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28
48
513
0
150C/3.65V
CY7C1335-AC
97145 9639 349611958 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100
80
116
1 1 PARTICLE
500
115
0
1000
87
0 13 EOS
9641 349612517 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100
80
405
0 1 EOS
255
404
0
500
403
0 2 EOS
349612518 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100
80
118
0
500
118
1 1 PARTICLE
580
117
0
9710 619700541 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100
80
118
0
Device
--------------CY7C1399-VC
CY62256-NSC
Assembly
Lot No
---------219615780/
519614750
519614048
519700213
519700217
97063 9651 519615270
M64056 9637 349611273
M64067 9648 349613726
Eval#
-----97142
M64076
M71064
97063
D/C
---9650
9648
9647
9702
Function
----SYNCHR
COMDTY
COMDTY
COMDTY
COMDTY
COMDTY
COMDTY
COMDTY
Description
----------32K x 8
32K x 8
32K x 8
32K x 8
32K x 8
32K x 8
256K x 4
256K x 4
Technology
---------------SRAM/LOGIC-R31
SRAM/LOGIC-R28
SRAM/LOGIC-R28
SRAM/LOGIC-R32
SRAM/LOGIC-R32
SRAM/LOGIC-R32
SRAM/LOGIC-R28
SRAM/LOGIC-R28
-- PAGE 8 --
Process
-----CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
Wfr
Loc
--MN
MN
MN
CA
CA
CA
MN
MN
Pkg
type
---SOJ
NSOI
NSOI
NSOI
NSOI
SOJ
SOJ
SOJ
Assy
Loc
------ALPHA-X
INDNS-O
INDNS-O
INDNS-O
INDNS-O
INDNS-O
TAIWN-G
TAIWN-G
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
----- ------ ---------------MPD
HTOL
150C/3.65V
150C/5.75V
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------100 500
118
0
28
48
528
1 1 LIFTING BOND
80
119
0
224
119
0
500
119
0
1000
119
0 1 EOS
CY62256-VC
97063 9649 519614957 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA SOJ INDNS-O
28
48
513
0
80
120
0 1 EOS
500
119
0
CY7C1021-VC
97051 9648 349614765 COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
44
80
120
0
500
120
0
349614989 COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
44
80
120
0
500
120
0
CY7C109-VC
96521 9644 519613262 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
400
0
48
527
0
500
120
0
97041 9648 519614394 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
575
0
519614395 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
606
0
9649 519614878 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
577
0
97113 9707 519701586 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
614
0
519701587 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
595
0
519701588 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
709
0
CY7C1509-LMB
96254 9640 219613444 COMDTY 1MEG
SRAM/LOGIC-R3
CMOS
TX LCC ALPHA-X
32
80
116
0
184
32
0
184
49
0
500
116
0
1000
115
1 1 UNKNOWN
2000
114
0
9643 219613941 COMDTY 1MEG
SRAM/LOGIC-R3
CMOS
TX LCC ALPHA-X
32 500
117
0 13 EOS
CY7C1599-VC
97142 9709 619700447 COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN SOJ CSPI-R
28
80
212
0
500
212
0
CY7C185-VC
96453 9646 219614640/ COMDTY SML/64K
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28
48 1508
0
80
119
0
500
119
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V
CY7B185-VC
M63091 9611 349603514/ SYNCHR 64K BI
BICMOS-SM2
BiCMOS TX SOJ INDNS-F
28
96
119
0 1 EOS
500
119
0
1000
119
0
2000
119
0
CY7C1031-JC
M63044 9621 519607404 SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN PLCC INDNS-O
52
96
117
1 2 EOS/1 UNKNOWN
500
110
0 4 EOS
1000
108
0 11 EOS
2000
93
0 13 EOS
M63086 9623 519608024/ SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN PLCC INDNS-O
52
96
120
0 7 EOS
500
100
2 11 EOS/2 PACKAGING/ASSY
PROB
1000
98
0 5 EOS
2000
93
0 11 EOS
Device
--------------CY7C1335-AC
CY62256-SNC
Eval#
-----97145
97063
D/C
---9710
9645
Assembly
Lot No
---------619700541
519613576
Function
----SYNCHR
COMDTY
Description
----------32K x 32
32K x 8
Technology
---------------SRAM/LOGIC-R33
SRAM/LOGIC-R32
-- PAGE 9 --
Process
-----CMOS
CMOS
Wfr
Loc
--MN
CA
Pkg
type
---TQFP
NSOI
Assy
Loc
------TAIWAN-G
INDNS-O
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---MPD
HTOL2 125C/5.75V
CY7C109-VC
M63048 9624
Assembly
Lot No
---------349607456
FuncProtion
Description Technology
cess
----- ----------- ---------------- -----COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
96
118
0
500
118
0
1000
118
0
2000
118
0
M63053 9626 349608813 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ KOREA-L
32
96
118
0
500
118
0
1000
118
1 1 UNKNOWN
2000
115
0 2 EOS
M64034 9637 519611640/ COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
96
125
0
500
125
0
1000
125
0
2000
125
0
CY7C199-VC
M63060 9628 349606015 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28
96
120
0
500
120
0
1000
120
0
2000
120
0
M63062 9632 349608727 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28
96
120
0
500
120
0
1000
120
0
2000
120
0
M63066 9630 349608549 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28
96
120
0
500
120
0
1000
116
0
2000
116
0
M63068 9631 619600032 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28
96
117
0
500
117
0
1000
116
0
2000
116
0
CY82C692-NC
96473 9648 349615221 SYNCHR PC CHIPSET SRAM/LOGIC-R28
CMOS
MN PQFP MALAY-J 208
48
77
0
349615224 SYNCHR PC CHIPSET SRAM/LOGIC-R28
CMOS
MN PQFP MALAY-J 208
48
85
0
349615229 SYNCHR PC CHIPSET SRAM/LOGIC-R28
CMOS
MN PQFP MALAY-J 208
48
86
0 1 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CY62256-SNC
97063 9645 519613576 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28 336
48
0
1000
48
0
CY7C1021-VC
96454 9648 349614989 COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
44 336
48
0
1000
48
0
CY7C1335-AC
97145 9639 349611958 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100 336
46
0
250C/NO BIAS
CY7C1509-LMB
96254 9643 219613941 COMDTY 1MEG
SRAM/LOGIC-R3
CMOS
TX LCC ALPHA-X
32
96
48
0
168
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/3.60V
CY7C1399-VC
97142 9650 219615780/ SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
MN SOJ ALPHA-X
28
80
77
0
168
77
0
150C/3.63V
CY62256V-SNC
97063 9646 519613860 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28
80
81
0
168
81
0
150C/5.75V
CY62256-SNC
97063 9645 519613576 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28
80
81
0
168
81
0
CY62256-VC
97063 9649 519614957 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA SOJ INDNS-O
28
80
81
0
168
81
0
-- PAGE 10 --
Wfr
Loc
--MN
Pkg
type
---SOJ
Assy
Loc
------KOREA-L
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---MPD
HTSSL 150C/5.75V
CY7C1021-VC
97051 9648
Assembly
Lot No
---------349614765
FuncProtion
Description Technology
cess
----- ----------- ---------------- -----COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------44
80
80
0
168
80
0
349614989 COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
44
80
78
0
168
78
0
CY7C109-VC
96521 9644 519613262 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32 168
80
0
CY7C1509-LMB
96254 9640 219613444 COMDTY 1MEG
SRAM/LOGIC-R3
CMOS
TX LCC ALPHA-X
32
80
74
1 1 UNKNOWN
168
71
0
9643 219613941 COMDTY 1MEG
SRAM/LOGIC-R3
CMOS
TX LCC ALPHA-X
32
80
80
0
168
68
0 13 EOS
CY7C185-VC
96453 9646 219614640/ COMDTY SML/64K
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28
80
80
0
168
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/3.63V
CY7C1335-AC
97145 9639 349611957 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100 168
90
0
336
90
0
9641 349612519 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100 168
90
0
336
90
0
9710 619700541 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100 168
90
0
336
90
0
125C/5.75V
CY7C1031-JC
M63087 9623 519608024/ SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN PLCC INDNS-O
52
96
120
1 2 EOS/1 SINGLE BIT
500
117
0 5 EOS
1000
109
0 16 EOS
CY7C109-VC
M64035 9637 519611640/ COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
96
125
0
500
125
0
1000
125
0
2000
125
0
CY7C199-VC
M64049 9639 619600540 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28
96
120
0
500
120
0
1000
120
0
2000
120
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY62256-NSC
M64077 9648 519614750 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN NSOI INDNS-O
28
96
78
0
168
78
0
M71065 9647 519614048 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN NSOI INDNS-O
28
96
80
0
168
80
0
288
79
0
CY7C1009-VC
M71006 9650 349615862 COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
32 168
78
0
M71008 9647 349613727 COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
32 168
78
0
CY7C1031-JC
M64061 9627 519608948/ SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN PLCC INDNS-O
52
96
77
1 1 TOPSIDE CRACKS
168
76
1 1 TOPSIDE CRACKS
M71049 9652 519615077 SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN PLCC INDNS-O
52
96
78
0 3 EXTERNAL CONTAMINATION
168
75
0
CY7C109-20VC
M63056 9626 349608813 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ KOREA-L
32
96
80
0
168
80
0
CY7C109-ZC
M71026 9640 349612511 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP KOREA-L
32
96
80
0
168
80
0
288
80
0
CY7C1399-VC
M71085 9701 619601664 SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
CA SOJ CSPI-R
28 168
78
0
CY7C1512-SC
M64080 9633 349609710 COMDTY 64Kx8
SRAM/LOGIC-R28
CMOS
MN SOIC TAIWAN-G 32
96
80
0 1 EXTERNAL CONTAMINATION
-- PAGE 11 --
Wfr
Loc
--MN
Pkg
type
---SOJ
Assy
Loc
------TAIWN-G
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
----- ------ ---------------- --------------MPD
PCT
121C/100%RH
CY7C1512-SC
CY7C186-ZC
Assy
No Dura Qty
Qty
Loc
Pin tion Test Fail Fail Mode
------- --- ---- ----- ---- ------------------------TAIWAN-G 32 168
77
0
KOREA-Q
32
96
79
1 1 UNKNOWN
168
78
0
288
78
0
CY7C188-VC
M64055 9641 349612373/ COMDTY 32K x 9
SRAM/LOGIC-R28
CMOS
MN SOJ KOREA-L
32
96
78
0 1 EXTERNAL CONTAMINATION
168
76
1 1 SPEED DEGRADATION
M71035 9701 349615949 COMDTY 32K x 9
SRAM/LOGIC-R28
CMOS
MN SOJ KOREA-L
32
96
80
0
168
80
0
CY7C199-SI
M71038 9652 219616036 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOIC ALPHA-X
28
96
80
0
168
80
0
288
80
0
CY7C199-VC
M64052 9639 619600540 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28
96
78
0
168
78
0
M71004 9650 619601493 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28
96
78
0
168
78
0
M71062 9704 619700148 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28
96
78
0
168
78
0
M71068 9640 219613420 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28
96
80
0
168
80
0
288
80
0
CY7C199-ZC
M71002 9649 349615704 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP PHIL-M
28
96
78
0
168
75
0
288
74
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
CY7C1021-VC
96454 9648 349614989 COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
44 100
50
0
200
50
0
97051 9648 349614989 COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
44 100
50
0
200
50
0
CY7C1335-AC
97145 9639 349611957 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100 100
48
0
200
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC
-40C TO 125C
CY7C1335-AC
97145 9639 349611958 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100 500
48
0
1500
48
0
9641 349612518 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100 500
47
0
1500
47
0
9652 349616137 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWAN-G 100 500
47
0
1500
47
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CY62256-NSC
M64075 9648 519614750 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN NSOI INDNS-O
28 300
49
0
1000
49
0
CY62256-SNC
97063 9702 519700213 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28 300
48
0
519700217 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28 300
48
0
CY62256-VC
97063 9651 519615270 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA SOJ INDNS-O
28 300
48
0
1000
48
0
CY62256V-ZC
M71027 9648 349614698 COMDTY 32K x 8
SRAM/LOGIC-R3
CMOS
CA TSOP PHIL-M
28 300
50
0
1000
50
0
CY7C1009-VC
M71005 9650 349615862 COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
32 300
47
0
1000
47
0
Eval#
-----M64080
M71032
D/C
---9633
9651
Assembly
Lot No
---------349609710
349615740/
Function
----COMDTY
COMDTY
Description
----------64Kx8
SML/64K
Technology
---------------SRAM/LOGIC-R28
SRAM/LOGIC-R21
-- PAGE 12 --
Process
-----CMOS
CMOS
Wfr
Loc
--MN
TX
Pkg
type
---SOIC
TSOP
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---MPD
TC2
-65C TO 150C
CY7C1009-VC
M71007 9647
CY7C1021-VC
96454
97051
CY7C1031-JC
CY7C109-VC
Assembly
Lot No
---------349613727
FuncProtion
Description Technology
cess
----- ----------- ---------------- -----COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
Wfr
Loc
--MN
9648 349614989
COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN
9704 349616186
COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN
9712 619700807L COMDTY 64K x16
9648 349614989 COMDTY 64K x16
SRAM/LOGIC-R28
SRAM/LOGIC-R28
CMOS
CMOS
MN
MN
9704 349616186
SRAM/LOGIC-R28
CMOS
MN
SRAM/LOGIC-R28
SRAM/LOGIC-R3
SRAM/LOGIC-R3
SRAM/LOGIC-R3
CMOS
CMOS
CMOS
CMOS
MN
MN
MN
MN
8
8
8
8
8
SRAM/LOGIC-R28
SRAM/LOGIC-R28
SRAM/LOGIC-R28
SRAM/LOGIC-R28
SRAM/LOGIC-R28
CMOS
CMOS
CMOS
CMOS
CMOS
MN
MN
MN
MN
MN
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
COMDTY 64K x16
9712 619700807L COMDTY
M63046 9621 519607404 SYNCHR
M64059 9627 519608948/ SYNCHR
M71050 9652 519615077 SYNCHR
64K
64K
64K
64K
96389
96391
M63050
M63055
M64036
128K
128K
128K
128K
128K
9645
9648
9624
9626
9637
349523601
SWR13628
349607456
349608813
519611640/
M71072 9703 519700412
COMDTY
COMDTY
COMDTY
COMDTY
COMDTY
x16
x 18
x 18
x 18
x
x
x
x
x
CY7C1399-VC
97142
9650 219615780/ SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
MN
CY7C1509-LMB
96254
9640 219613444
COMDTY 1MEG
SRAM/LOGIC-R3
CMOS
TX
9643 219613941
COMDTY 1MEG
SRAM/LOGIC-R3
CMOS
TX
COMDTY
COMDTY
COMDTY
COMDTY
SRAM/LOGIC-R3
SRAM/LOGIC-R3
SRAM/LOGIC-R3
SRAM/LOGIC-R28
CMOS
CMOS
CMOS
CMOS
TX
TX
TX
MN
CY7C1512-SC
9644 219614092
219614093
9647 219614961
M64078 9641 349613171
CY7C185-VC
96453
SRAM/LOGIC-R28
CMOS
MN
CY7C186-ZC
M64063 9628 349609461
COMDTY SML/64K
SRAM/LOGIC-R28
CMOS
MN
M64065 9628 349609461
COMDTY SML/64K
SRAM/LOGIC-R28
CMOS
MN
M71030 9651 349615740/ COMDTY SML/64K
M64053 9641 349612373/ COMDTY 32K x 9
SRAM/LOGIC-R21
SRAM/LOGIC-R28
CMOS
CMOS
TX
MN
CY7C188-VC
1MEG
1MEG
1MEG
64Kx8
9646 219614640/ COMDTY SML/64K
-- PAGE 13 --
Pkg
type
---SOJ
Assy
Loc
------TAIWN-G
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32 300
47
0
1000
47
0
SOJ TAIWN-G
44 300
48
0
1000
48
0
SOJ TAIWN-G
44 300
48
0
1000
48
0
SOJ TAIWN-G
44 300
50
0
SOJ TAIWN-G
44 300
48
0
300
48
0
1000
48
0
1000
48
0
SOJ TAIWN-G
44 300
48
0
300
48
0
1000
48
0
1000
48
0
SOJ TAIWN-G
44 300
50
0
PLCC INDNS-O
52 300
77
0
PLCC INDNS-O
52 300
49
0
PLCC INDNS-O
52 300
48
0
1000
48
0
SOJ KOREA-L
32
50
48
0
SOJ KOREA-L
32 300
48
1 1 POPCORN
SOJ KOREA-L
32 300
47
0
SOJ KOREA-L
32 300
47
0
SOJ INDNS-O
32 300
50
0
1000
50
0
SOJ INDNS-O
32 300
48
0
1000
48
0
SOJ ALPHA-X
28 300
47
0
1000
47
0
LCC ALPHA-X
32 100
45
0
1000
38
0
LCC ALPHA-X
32 100
48
0
1000
47
0
LCC ALPHA-X
32 1000
71
0
LCC ALPHA-X
32 1000
72
0
LCC ALPHA-X
32 1000
72
0
SOIC TAIWAN-G 32 300
50
0
1000
50
0
SOJ ALPHA-X
28 300
48
0
1000
48
0
TSOP KOREA-Q
32 300
100
0
1000
100
0
TSOP KOREA-Q
32 300
100
0
1000
100
0
TSOP KOREA-Q
32 300
49
0
SOJ KOREA-L
32 300
49
0
1000
49
0
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---MPD
TC2
-65C TO 150C
CY7C188-VC
M71033 9701
Assembly
Lot No
---------349615949
FuncProtion
Description Technology
cess
----- ----------- ---------------- -----COMDTY 32K x 9
SRAM/LOGIC-R28
CMOS
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32 300
48
0
1000
48
0
CY7C199-SI
M71036 9652 219616036 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOIC ALPHA-X
28 300
50
0
1000
49
0
CY7C199-VC
96389 9633 619600094 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28 300
50
0
1000
50
0
96391 9641 619600940 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28 300
54
0
1000
54
0
619600941 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28 300
54
0
1000
54
0
9642 619600879 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28 300
54
0
1000
54
0
M63006 9622 219608589 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28 300
50
0
M63039 9625 349606017/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28 300
81
0
M63082 9633 619600092 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28 300
50
0
1000
50
0
M64002 9639 619600746 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28 300
47
0
M64028 9639 219613113/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28 300
47
0
1000
47
0
M64032 9641 619600945 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28 300
48
1 1 PARTICLE
M64050 9639 619600540 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28 300
47
0
1000
47
0
M64057 9645 619601025 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28 300
47
0
1000
47
0
M71003 9650 619601493 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28 300
47
0
1000
47
0
M71060 9704 619700148 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28 300
48
0
1000
48
0
M71066 9640 219613420 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28 300
50
0
1000
50
0
CY7C199-ZC
M64072 9643 349613792 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP PHIL-M
28 300
45
0
1000
45
0
M71001 9649 349615704 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP PHIL-M
28 300
46
0
1000
46
0
CY7C199-ZI
M64001 9638 349612141 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP PHIL-M
28 100
109
0
300
109
0
1000
108
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
CY7C1031-JC
M71051 9652 519615077 SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN PLCC INDNS-O
52
-5
120
0
25
120
0
85
120
0
CY7C109-VC
M64033 9637 519611640/ COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
-5
120
0
25
120
0
85
120
0
M71069 9703 519700412 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
-5
120
0
25
120
0
85
120
0
CY7C1399-VC
M71082 9701 619601664 SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
CA SOJ CSPI-R
28
-5
120
0
-- PAGE 14 --
Wfr
Loc
--MN
Pkg
type
---SOJ
Assy
Loc
------KOREA-L
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---MPD
TEV
0 READ POINT
CY7C1399-VC
M71082 9701
Assembly
Lot No
---------619601664
FuncProtion
Description Technology
cess
----- ----------- ---------------- -----SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------28
25
120
0
85
120
0
CY7C199-VC
M64047 9639 619600540 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28
-5
120
0
25
121
1 1 UNKNOWN
85
120
0
M71057 9704 619700148 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28
-5
120
1 1 UNKNOWN
25
120
0
85
120
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
-- PAGE 15 --
Wfr
Loc
--CA
Pkg
type
---SOJ
Assy
Loc
------CSPI-R
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---NVM
DRET2 250C/NO BIAS
CY27C010-WC
96352 9618
Assembly
Lot No
---------219606661
Function
----PROM
ProDescription Technology
cess
----------- ---------------- -----128K x 8
FAMOS-P26
CMOS
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
96
76
0
168
75
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
140C/5.5V
CY27C010-JC
96352 9622 349607242 PROM
128K x 8
FAMOS-P26
CMOS
TX PLCC PHIL-M
32 128
45
0
CY27C010-PC
M63037 9618 349605142 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32 128
48
1 1 UNKNOWN
M64014 9641 349611357 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32 128
30
0
128
48
0
M64027 9637 349610308 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32 128
30
0
128
48
0
CY27H010-ZC
96422 9639 349611599 PROM
128K x 8
FAMOS-P26
CMOS
TX TSOP PHIL-M
32 128
48
0
CY27H512-JC
M71018 9651 219615860 PROM
64K x 8
FAMOS-P26
CMOS
TX PLCC ALPHA-X
32 128
78
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
CY27C010-PC
96352 9646 349614268 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32
48
500
0
80
116
0
500
116
0
1000
116
0
2000
116
0
CY27C010-WC
96352 9646 219614680 PROM
128K x 8
FAMOS-P26
CMOS
TX WCER ALPHA-X
32
48
500
0
500
116
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CY27H010-ZC
96422 9639 349611599 PROM
128K x 8
FAMOS-P26
CMOS
TX TSOP PHIL-M
32 336
48
0
1000
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.75V
CY27C010-PC
96352 9646 349614268 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32 168
76
0
150C/6.50V
CY27C010-PC
96352 9646 349614268 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32 168
76
0
500
76
0
1000
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY27C010-PC
M71023 9702 349616299 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32
96
80
1 1 LIFTING BOND/S
168
79
0
288
79
0
CY27H512-JC
M71019 9651 219615860 PROM
64K x 8
FAMOS-P26
CMOS
TX PLCC ALPHA-X
32
96
77
0
168
77
0
288
77
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
CY27H010-ZC
96422 9639 349611599 PROM
128K x 8
FAMOS-P26
CMOS
TX TSOP PHIL-M
32 100
49
0
200
49
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CY27C010-JC
96352 9622 349607242 PROM
128K x 8
FAMOS-P26
CMOS
TX PLCC PHIL-M
32 300
45
0
1000
45
0
CY27C010-PC
M64026 9637 349610308 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32 300
49
0
1000
49
0
CY27C010-WC
96352 9618 219606661 PROM
128K x 8
FAMOS-P26
CMOS
TX WCER ALPHA-X
32 100
45
0
1000
45
0
CY27H010-WC
M64004 9626 219610345 PROM
128K x 8
FAMOS-P26
CMOS
TX WCER ALPHA-X
32 100
50
0
1000
49
0
M64005 9634 349610779 PROM
128K x 8
FAMOS-P26
CMOS
TX WCER PHIL-M
32 100
50
0
1000
50
0
-- PAGE 16 --
Wfr
Loc
--TX
Pkg
type
---WCER
Assy
Loc
------ALPHA-X
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---NVM
TC2
-65C TO 150C
CY27H010-ZC
96422 9639
Assembly
Lot No
---------349611598
349611599
Function
----PROM
PROM
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32 300
48
0
32 300
48
0
1000
46
0
349611600 PROM
128K x 8
FAMOS-P26
CMOS
TX TSOP PHIL-M
32 300
48
0 1 ESD
CY27H512-JC
M71017 9651 219615860 PROM
64K x 8
FAMOS-P26
CMOS
TX PLCC ALPHA-X
32 300
46
0
1000
46
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
CY27H512-JC
M71014 9651 219615860 PROM
64K x 8
FAMOS-P26
CMOS
TX PLCC ALPHA-X
32
-5
118
0
25
118
0
85
118
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------Description
----------128K x 8
128K x 8
Technology
---------------FAMOS-P26
FAMOS-P26
-- PAGE 17 --
Process
-----CMOS
CMOS
Wfr
Loc
--TX
TX
Pkg
type
---TSOP
TSOP
Assy
Loc
------PHIL-M
PHIL-M
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---PLD
DRET
165C/NO BIAS
CY7C373I-JC
96471 9645
Assembly
Lot No
---------349613900
Function
----FLASH
ProDescription Technology
cess
----------- ---------------- -----64-MCEL FL FLASH-FL28D
CMOS
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------44 168
79
0
552
79
0
CY7C374I-JC
M64019 9635 349611013 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-A
84 168
80
0
1000
80
1 1 CHARGE GAIN/LOSS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
140C/5.5V
CY7C346-NC
M63078 9622 349607020 MAX
REPROG.PAL FAMOS-P20
CMOS
TX PQFP HK-B
100 128
19
2 2 UNKNOWN
128
30
0
CY7C372-JC
M64041 9635 349610976 FLASH 64-MCEL FL FLASH-FL22D
CMOS
CA PLCC PHIL-M
44 128
12
0
128
13
0
128
24
0
CY7C373I-JC
96471 9645 349613900 FLASH 64-MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-L
44 128
48
0
CY7C374I-JC
96502 9643 349613077 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-A
84 128
15
0
M64021 9635 349611013 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-A
84 128
14
0
128
29
0
128
37
0
M71076 9643 349613266 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-A
84 128
7
0
128
28
0
128
42
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V
CY7C346-NC
M63075 9622 349607020 MAX
REPROG.PAL FAMOS-P20
CMOS
TX PQFP HK-B
100
96
120
0
500
120
0
1500
120
0
2000
120
0
125C/6.50V
CY7C372I-JC
96471 9705 219701008 FLASH 64-MCEL FL FLASH-FL28D
CMOS
TX PLCC ALPHA-X
44
48
503
0
CY7C373I-JC
96471 9645 349613900 FLASH 64-MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-L
44
48
501
1 1 PARTICLE
80
79
0
500
79
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.75V
CY7C373I-JC
96471 9645 349613900 FLASH 64-MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-L
44 168
79
0
336
79
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY7C371-JC
96381 9632 349609203 FLASH 32-MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-Q
44 168
48
0
288
48
0
CY7C375I-AC
96457 9643 349612981 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX TQFP KOREA-Q 160 168
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC
-40C TO 125C
CY7C371-JC
96381 9632 349609203 FLASH 32-MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-Q
44
10
48
0
349610149 FLASH 32-MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-Q
44
10
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CY7C372-JC
M64040 9635 349610976 FLASH 64-MCEL FL FLASH-FL22D
CMOS
CA PLCC PHIL-M
44 300
49
1 1 CHARGE GAIN/LOSS
CY7C373I-JC
96471 9645 349613900 FLASH 64-MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-L
44 300
48
0
1000
48
0
CY7C374I-JC
96502 9643 349613077 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-A
84 300
50
0 1 EOS
1000
49
0
M64020 9635 349611013 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-A
84 300
48
5 5 LIFTING BOND/S
CY7C375I-AC
96457 9643 349612980 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX TQFP KOREA-Q 160 300
48
0
1000
48
0
349612981 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX TQFP KOREA-Q 160 300
48
0
1000
48
0
-- PAGE 18 --
Wfr
Loc
--TX
Pkg
type
---PLCC
Assy
Loc
------KOREA-L
CYPRESS
SEMICONDUCTOR
PRODUCT RELIABILITY
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 1, 1997
Prod
Assembly
FuncProWfr Pkg Assy
No Dura Qty
Qty
line Test
Test Condition
Device
Eval# D/C Lot No
tion
Description Technology
cess
Loc type Loc
Pin tion Test Fail Fail Mode
----- ------ ---------------- --------------- ------ ---- ---------- ----- ----------- ---------------- ------ --- ---- ------- --- ---- ----- ---- ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PLD
TEV
0 READ POINT
CY7C374I-JC
M64016 9635 349611013 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-A
84
-5
116
0
25
116
0
85
116
0
M71081 9643 349613266 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-A
84
-5
116
0
25
116
0
85
116
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
-- PAGE 19 --