Q4 - 1999

CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
QUARTER 4, 1999
PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION
Ed Russell
Reliability Director
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued: 4/3/00
STANDARD STRESS TEST DESCRIPTIONS
TEST
DESCRIPTION
HTOL
HTOL2
HTSSL
HTSSL2
DRET
DRET2
PCT
HAST
TC
TC2
HTS
High Temp Op Life, 150ºC, Dynamic 115% Vcc Nominal
High Temp Op Life, 125ºC, Dynamic 115% Vcc Nominal
High Temp Steady State Life, 150ºC, Static 115% Vcc Nominal
High Temp Steady State Life, 125ºC, Static 115% Vcc Nominal
Data Retension Test, Data Bake 165ºC, Plastic
Data Retension Test, Data Bake 250ºC, Hermetic
Pressure Cooker Test, 121ºC, 100%RH, No Bias
Hi-Accel Saturation Test, 140ºC/130ºC, 85%RH, Static 100% Vcc
Temp Cycle, 125ºC to -40ºC
Temp Cycle, 150ºC to -65ºC
High Temp Storage, 150ºC, No Bias
Page 2 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued: 4/3/00
WAFER FAB AREAS
FAB #
LOCATION
CA
TX
MN
TW
San Jose, California
Round Rock, Texas
Bloomington, Minnesota
TSMC, Taiwan
ASSEMBLY LOCATION
ID
COMPANY/LOCATION
KOREA-A
ASAT-B
USA-C
PHIL-D
USA-E
INDNS-F
TAIWAN-G
KOREA-H
MALAY-J
THLAND-AK
KOREA-L
PHIL-M
USA-N
INDNS-O
USA-P
KOREA-Q
CSPI-R
USA-S
TAIWAN-T
MALAY-U
USA-V
USA-W
ALPHA-X
THLAND-Z
USA-AP
KOREA-GQ
PHIL-GW
Anam-Buchon/Korea
Asat/Hongkong
Cypress/USA
Dynesem/Philippines
Cypress-Minnesota/USA
Astra/Indonesia
ASE/Taiwan
Hyundai/Korea
ASE/Malaysia
TMS/Thailand
Anam-Seoul/Korea
Anam/Philippines
Express/USA
Omedata/Indonesia
Pantronix/USA
Anam-Bupyong/Korea
Cypress/Philippines
ATM/USA
OSE/Taiwan
Unisem/Malaysia
VLSA/USA
Toshiba/USA
Alphatec/Thailand
Hana/Thailand
APLUS/USA
Anam-Khangju/Korea
Gateway Electronics/Philippines
Page 3 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued: 4/3/00
DESCRIPTION OF DATA TABLE COLUMN HEADINGS
COLUMN HEADING
DESCRIPTION OF COLUMN CONTENTS
Division
Test
Test Condition
Device ID
Date Code
Lot Number
Function
Description
Technology
Process
Pkg Material
Pkg Type
Pkg Location
# Pins
Duration
# Test
# Failed
Fail Mode
Cypress Manufacturing Division
Common code for the stress performed. See table on previous page for detail.
Tem/humidity/bias condition for the stress. See table on previous for detail
Cypress part number
Week in which specific lot was marked/sealed/molded.
Manufacturing (assembly) lot number
Generic product family at Cypress
Brief description of device function
Fabrication process technology.
Generic fabrication process
Generic packaging material
Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package).
Country Location + Initial of assembly house (see table on prvious page for detail).
Pin cont of package in which device is assembled.
Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours.
Quantity of devices submitted to this stress/test.
Quantity of devices failing at this specific readpoint.
Failure analysis results from this test, if any.
Page 4 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued: 4/3/00
RELIABILITY DATA SUMMARY
(Q499)
LONG TERM FAILURE RATE SUMMARY
PROCESS
DEVICE HOURS
125C
0
0
FAILED
TOTAL* @ 150C
0
0
FAMOS TOTAL
75,000
0
75,000
0
FLASH TOTAL
149,000
0
149,000
0
SRAM/LOGIC TOTAL
997,504
545,832
1,175,445
2
0
0
0
0
1,221,504
545,832
1,399,445
2
150C
E2PROM TOTAL
BICMOS TOTAL
LFR TOTAL
FAILURE MODE
2 UNKNOWN CAUSE
2 UNKNOWN CAUSE
EARLY FAILURE RATE SUMMARY
PROCESS
UNITS TESTED
125C
150C
E2PROM TOTAL
0
0
150
0
150
0
0
0
0
0
25,473
11,345
36,818
2
FAMOS TOTAL
FLASH TOTAL
SRAM/LOGIC TOTAL
BICMOS TOTAL
EFR TOTAL
FAILED
TOTAL @ 150C
0
0
0
0
0
0
25,623
11,345
36,968
2
FAILURE MODE
1 POLY STRINGERS/1 METAL FUSE
PROBLEM
1 POLY STRINGERS/1 METAL FUSE
PROBLEM
HTSSL FAILURE RATE SUMMARY
PROCESS
DEVICE HOURS
125C
150C
FAILED
TOTAL* @ 150C
0
0
FAMOS TOTAL
0
0
FLASH TOTAL
0
0
0
0
40,328
0
40,328
0
0
0
0
0
40,328
0
40,328
0
SRAM/LOGIC TOTAL
BICMOS TOTAL
HTSSL TOTAL
FAILURE MODE
TEMP CYCLE FAILURE RATE SUMMARY
PROCESS
E2PROM
150C
39,600
DEVICE CYCLE
125C
0
FAILED
TOTAL* @ 150C
39,600
0
FAMOS TOTAL
66,900
0
66,900
0
FLASH TOTAL
55,500
0
55,500
0
607,800
0
607,800
1
40,500
0
40,500
0
810,300
0
810,300
1
SRAM/LOGIC TOTAL
BICMOS TOTAL
TC TOTAL
Page 5 of
32
FAILURE MODE
1 UNKNOWN CAUSE
1 UNKNOWN CAUSE
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued: 4/3/00
RELIABILITY DATA SUMMARY
(Q499)
HAST FAILURE RATE SUMMARY
PROCESS
DEVICE HOURS
130C
140C
E2PROM
0
0
FAMOS TOTAL
0
5760
3058.56
0
FLASH TOTAL
0
11,392
6,049
0
36,352
100,992
89,979
1
0
17,024
9,040
0
36,352
135,168
108,126
1
SRAM/LOGIC TOTAL
BICMOS TOTAL
HAST TOTAL
FLASH TOTAL
0
0
SRAM/LOGIC TOTAL
0
0
BICMOS TOTAL
0
0
0
0
LTOL TOTAL
FAMOS TOTAL
52,920
3
FLASH TOTAL
30,240
0
196,896
1
15,120
0
295,176
4
SRAM/LOGIC TOTAL
BICMOS TOTAL
PCT TOTAL
E2PROM TOTAL
98,500
0
0
0
FLASH TOTAL
109,000
0
0
0
76,000
0
0
0
0
0
0
0
321,500
0
0
0
BICMOS
DRET TOTAL
1 UNKNOWN CAUSE
FAILURE MODE
FAILURE MODE
3 OPEN - HEEL OR NECK BREAK
1 TOPSIDE CRACK
3 OPEN – HEEL OR NECK BREAK/1
TOPSIDE CRACK
DRET FAILURE RATE SUMMARY
PLASTIC (165C)
HERMETIC(250C)
DHR
REJ
DHR
REJ
38,000
0
0
0
FAMOS TOTAL
SRAM/LOGIC TOTAL
1 UNKNOWN CAUSE
PCT FAILURE RATE SUMMARY
DEVICE HOURS
FAILED
22,344
0
PROCESS
E2PROM
PROCESS
FAILURE MODE
LTOL FAILURE RATE SUMMARY
DEVICE HOURS
FAILED
0
0
PROCESS
FAMOS TOTAL
∗
FAILED
TOTAL @ 140C
0
0
∗
Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress conditions.
Page 6 of
32
FAILURE MODE
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
BICMOS-SM1
CY7B923-JI
MR94048 9939 619927753
HOTLink
BiCMOS TX
PLCC ALPHA-X
28
128
43
0
CY7B991-JC
MR94042 9938 619926775
PSCB
BiCMOS TX
PLCC ALPHA-X
32
128
45
0
HAST
130C/
DCD
CHNL
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7B9910-SC
MR94036 9940 519915425 LSCB
BiCMOS TX SOIC INDNS-O
24 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
DCD
CHNL
CY7B923-JI
MR94049 9939 619927753
HOTLink
BiCMOS TX
PLCC ALPHA-X
28
500
45
0
CY7B991-JC
MR93214 9932 619922425
PSCB
BiCMOS TX
PLCC ALPHA-X
32
500
1000
45
45
0
0
CY7B9910-SC
MR94037 9940 519915425 LSCB
BiCMOS TX SOIC INDNS-O
24 500
43
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
CHNL
CY7B923-JI
MR94046 9939 619927753
HOTLink
BiCMOS TX
PLCC ALPHA-X
28
168
45
0
CY7B9910-SC
MR94034 9940 519915425 LSCB
BiCMOS TX SOIC INDNS-O
24 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
CHNL
CY7B923-JI
MR94047 9939 619927753
HOTLink
BiCMOS TX
PLCC ALPHA-X
28
300
45
0
CY7B991-JC
MR93212 9932 619922425
PSCB
BiCMOS TX
PLCC ALPHA-X
32
300
45
0
MR94041 9938 619926775 PSCB
BiCMOS TX PLCC ALPHA-X
32 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 7 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
E2PROM-E3
DRET
165C/NO BIAS
PLD
37K
CY37032P44-AC
MR94078 9938 619925910 32 MCEL
CMOS
TW TQFP TAIWAN-G 44 500
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
PLD
37K
CY37032P44-AC
MR94076 9938 619925910
32 MCEL
CMOS
TW
TQFP TAIWAN-G
44
168
44
0
CY37256P208-NC
MR94081 9932 619921607
256 MCEL
CMOS
TW
PQFP TAIWAN-G 208
168
45
0
CY73064VP100-AI MR94071 9933 619923474 64 MCEL
CMOS
168
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
PLD
37K
CY37032P44-AC
MR94077 9938 619925910
32 MCEL
CMOS
TW
TQFP TAIWAN-G
44
300
45
0
CY37064VP100-AI MR94072 9933 619923474
64 MCEL
CMOS
TW
TQFP TAIWAN-G 100
300
43
0
CY37512P208-NC MR93224 9930 619919927 512 MCEL
CMOS
TW PQFP TAIWAN-G 208 300
44
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 8 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
FAMOS-P20
CY7C344-JI
DRET
165C/NO BIAS
PLD
MAX
MR93061 9927 619918944
REPROG.PAL
CMOS
TX
PLCC ALPHA-X
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------28
168
76
0
1000
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75
PLD
PLD
PALC22V10B-15PC MR93024 9925 519911235 REPROG. PAL CMOS
TX PDIP INDNS-O
24
48
150
0
500
150
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
MPD
PROM
CY7C291A-35JC
MR94121 9940 619924782 2K x 8
CMOS
TX PLCC PHIL-M
28 500
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
PROM
CY7C291A-35JC
MR94118 9940 619924782
2K x 8
CMOS
TX
PLCC PHIL-M
28
168
45
0
PLD
MAX
CY7C344-PC
MR94215 9942 619928805
REPROG.PAL
CMOS
TX
PDIP ALPHA-X
28
168
45
0
PLD
PALC22V10B-15PC MR94234 9942 519916341 REPROG. PAL CMOS
TX PDIP INDNS-O
24 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
PROM
CY7C291A-35JC
MR94119 9940 619924782
2K x 8
CMOS
TX
PLCC PHIL-M
28
300
45
0
PLD
MAX
CY7C344-PC
MR94216 9942 619928805
REPROG.PAL
CMOS
TX
PDIP ALPHA-X
28
300
45
0
PLD
PALC22V10B-15PC MR94235 9942 519916341 REPROG. PAL CMOS
TX PDIP INDNS-O
24 300
44
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 9 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
FAMOS-P26
DRET
165C/NO BIAS
PLD
MAX
CY7C342B-JC
MR94207 9942 619928954 REPROG.PAL CMOS
TX PLCC ALPHA-X
68 500
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
130C/5.5
IPD
USB
CY7C63413-OC
MR94103 9941 619927219 USB
BiCMOS TX SSOP CSPI-R
48 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
PCT
121C/100%RH
IPD
500
45
0
1000
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
IPD
USB
CY7C63613-SC
MR93081 9928 619919235
USB
CMOS
TX
SOIC CSPI-R
24
USB
CY7C63413-
MR94101 9941 619927219
USB
CMOS
TX
SSOP CSPI-R
48
168
45
0
USB
CY7C63000A-SC
MR94112 9944 619928386
USB
CMOS
TX
SOIC CSPI-R
20
168
45
0
CY7C63613-SC
MR93078 9928 619919235
USB
CMOS
TX
SOIC CSPI-R
24
168
45
3 3 Open- Heel or Neck
Break
PLD
MAX
CY7C342B-JC
MR94205 9942 619928954 REPROG.PAL CMOS
TX PLCC ALPHA-X
68 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
IPD
USB
CY7C63613-SC
MR93079 9928 619919235
USB
CMOS
TX
SOIC CSPI-R
24
300
44
0
PLD
MAX
CY7C342B-JC
MR94206 9942 619928954 REPROG.PAL CMOS
TX PLCC ALPHA-X
68 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 10 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
FLASH-FL24D
HAST
130C/5.5
PLD
PLD
PALC22V10D-JC
MR94067 9935 619923901 FLASH ERAS. CMOS
TX PLCC ALPHA-X
28 128
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
PLD
PLD
PALC22V10D-7JC MR93190 9930 519912784 FLASH ERAS. CMOS
TX PLCC INDNS-O
28 500
45
0
1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
PLD
PLD
PALC22V10D-JC
MR94065 9935 619923901 FLASH ERAS. CMOS
TX PLCC ALPHA-X
28 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
PLD
FLASH
CY7C373I-JC
99313
9936 619925111
64-MCEL FL
CMOS
TX
PLCC PHIL-M
44
300
50
0
PLD
PALC22V10D-JC
MR94066 9935 619923901 FLASH ERAS. CMOS
TX PLCC ALPHA-X
28 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 11 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
FLASH-FL28D
CY7C373I-JC
MR94062 9927 619918706
64-MCEL FL
CMOS
TX
PLCC PHIL-M
84
CY7C375I-AC
MR93106 9927 619917921
128 MCEL FL CMOS
TX
TQFP KOREA-Q
160
DRET
165C/NO BIAS
PLD
FLASH
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------500
76
0
168
71
0
1000
71
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
130C/
PLD
FLASH CY7C371-JC
MR94055 9938 619927229 32-MCEL FL CMOS
TX PLCC ALPHA-X
44 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75
PLD
FLASH
CY7C371-AC
MR93048 9926 619917919
32-MCEL FL
CMOS
TX
TQFP KOREA-Q
44
48
500
150
148
0
0 2 EOS
CY7C371-JC
MR92188 9916 619910273
32-MCEL FL
CMOS
TX
PLCC ALPHA-X
44
CY7C371-JC
MR94053 9938 619927229
32-MCEL FL
CMOS
TX
PLCC ALPHA-X
44
168
45
0
CY7C373I-JC
MR94059 9927 619918706
64-MCEL FL
CMOS
TX
PLCC PHIL-M
44
168
45
0
48
150
0
96
150
0
500
150
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
PLD
FLASH
CY7C375I-AC
MR94246 9945 619929003 128 MCEL FL CMOS
TX TQFP KOREA-Q 160 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
PLD
FLASH
CY7C371-JC
MR94054 9938 619927229
32-MCEL FL
CMOS
TX
PLCC ALPHA-X
44
300
45
0
CY7C373I-JC
MR94060 9927 619918706 64-MCEL FL CMOS
TX PLCC PHIL-M
44 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 12 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L20
CY7C611A-NC
160
HTS2
150C/NO BIAS
DCD
VME
M99361
9924 619916051Q RISC CONTRL CMOS
500
50
0
1000
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 13 of
32
TX
PQFP HK-B
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L27
TC2
-65C TO 150C
DCD
VME
CY7C960-ASC
M99304 9910 619905955 BUS Inter. CMOS
MN TQFP HK-B
64 300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 14 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-L28
CY2277APAC
MR93041 9928 619918960
CLOCK SYN.
CMOS
TX
TSSO CSPI-R
48
500
1000
44
44
0
0
CY2287PVC
MR93012 9927 619918212
CLOCK SYN.
CMOS
TX
SSOP CSPI-R
56
500
1000
45
45
0
0
CY2318PVC
MR93147 9930 619920598
CLOCK
CMOS
TX
TSOP CSPI-R
48
HTS2
150C/NO BIAS
TTD
TTECH
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
500
45
0
1000
43
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
TTD
TTECH CY2287PVC
MR94107 9936 619925423 CLOCK SYN. CMOS
TX SSOP CSPI-R
56 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
TTD
TTECH CY2318PVC
MR93145 9930 619920598 CLOCK
CMOS
TX TSOP CSPI-R
48 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 15 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R28
HAST
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
130C/
DCD
DPORT
CY7C144-JC
MR94023 9937 619925819
8K x 8 DP
CMOS
TX
PLCC PHIL-M
68
128
45
0
130C/5.5
DCD
DPORT
CY7C024-JC
MR94126 9940 619925821
4K x 16 DP
CMOS
TX
PLCC KOREA-A
84
128
45
0
FIFO
CY7C4221-AC
MR94012 9939 619926689
1Kx9 FIFO
CMOS
TX
TQFP KOREA-Q
32
128
45
0
130C/5.5V
DCD
DPORT
CY7C0251-AC
99346
9923 619914903
8K x 16 DP
CMOS
TX
TQFP KOREA-Q
100
128
48
0
9929 619919457
8K x 16 DP
CMOS
TX
TQFP KOREA-Q
100
128
48
0
9814 619803478
4Kx36x2 FIF CMOS
MN
TQFP KOREA-Q
64
128
50
0
FIFO
CY7C4205V-SC
99346
140C/
MPD
COMDTY CY7C188-VC
98252
9829 619807917 32K x 9
CMOS
TX SOJ CSPI-R
32 128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/
MPD
COMDTY CY7C188-VC
98252
150C/5.75
DCD
DPORT
MPD
DCD
150C/5.75V
32K x 9
CMOS
TX
SOJ
32
48
80
500
1500
120
120
0
0
0
MR93175 9925 619915661
8K x 16 DP
CMOS
TX
TQFP TAIWAN-G 100
48
500
149
149
0
0
COMDTY CY7C188-VC
MR92040 9914 619907801
32K x 9
CMOS
TX
SOJ
32
48
96
500
150
150
149
0
0
0
DPORT
99413
9938 519915244/ 2K x 8 DP
CMOS
TX
PLCC INDNS-O
52
48
48
48
242
245
247
0
0
0
9939 519915337/ 2K x 8 DP
CMOS
TX
PLCC INDNS-O
52
48
48
48
238
247
248
0
0
0
9940 519915967/ 2K x 8 DP
CMOS
TX
PLCC INDNS-O
52
48
48
48
241
241
242
0
0
0
9949 519918734
CMOS
TX
PLCC INDNS-O
52
48
48
248
498
0
0
CMOS
TX
PLCC ALPHA-X
32
48
1004
0
FIFO
CY7C0251-AC
CY7C136-JC
CY7C4211-JC
99323
9829 619807917
2K x 8 DP
9936 619924952/ 512x9 FIFO
CSPI-R
CSPI-R
MPD
COMDTY CY7C199-DMB
99353
9934 619923231 32K x 8
CMOS
TX CERD ALPHA-X
28 184
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 16 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R28
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
HTS
165C/NO BIAS
DCD
FIFO
CY7C433-AC
MR92210 9915 619908948
4Kx9 FIFO
CMOS
TX
TQFP KOREA-Q
32
336
42
1 1 Broken Lead
1000
30
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
DCD
DPORT
CY7C006-JC
MR93202 9929 619920470
16K x 8 DP
CMOS
TX
PLCC PHIL-M
68
500
1000
45
45
0
0
CY7C024-JC
MR93196 9930 619919330
4K x 16 DP
CMOS
TX
PLCC KOREA-A
84
500
1000
45
45
0
0
MR94127 9940 619925821
4K x 16 DP
CMOS
TX
PLCC KOREA-A
84
500
45
0
CY7C0251-AC
MR93174 9925 619915661
8K x 16 DP
CMOS
TX
TQFP TAIWAN-G 100
500
1000
45
45
0
0
CY7C136-JC
MR93240 9929 519912467
2K x 8 DP
CMOS
TX
PLCC INDNS-O
52
500
1000
45
45
0
0
CY7C144-JC
MR94024 9937 619925819
8K x 8 DP
CMOS
TX
PLCC PHIL-M
68
500
45
0
CY7C4211-AC
MR93208 9931 619919397
512x9 FIFO
CMOS
TX
TQFP KOREA-Q
32
500
1000
45
45
0
0
CY7C4221-AC
MR94013 9939 619926689
1Kx9 FIFO
CMOS
TX
TQFP KOREA-Q
32
500
40
0
CY7C4245-AC
MR93246 9936 619924372
4Kx18 FIFO
CMOS
TX
TQFP TAIWAN-G
64
500
1000
45
45
0
0
CY7C4801-AC
MR94018 9936 619924502
256x9x2 FIF CMOS
TX
TQFP KOREA-Q
64
500
45
0
MR93179 9929 619919172
SML/64K
TX
PDIP ALPHA-X
22
500
1000
45
45
0
0
FIFO
MPD
COMDTY CY7C187-PC
CMOS
CY7C188-VC
MR94006 9932 619922430 32K x 9
CMOS
TX SOJ CSPI-R
32 500
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/
MPD
COMDTY CY7C188-VC
PCT
121C/100%RH
DCD
DPORT
98252
9829 619807917
32K x 9
CMOS
TX
SOJ
CSPI-R
32
80
81
0
168
81
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------CY7C024-JC
MR94124 9940 619925821
4K x 16 DP
CMOS
TX
PLCC KOREA-A
84
168
45
0
CY7C136-JC
MR93237 9929 519912467
2K x 8 DP
CMOS
TX
PLCC INDNS-O
52
168
45
0
CY7C144-JC
MR94021 9937 619925819
8K x 8 DP
CMOS
TX
PLCC PHIL-M
68
168
45
0
Page 17 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R28
CY7C420-PC
MR94257 9946 519915899
512x9 FIFO
CMOS
TX
PDIP INDNS-O
28
168
42
0
CY7C4221-AC
MR94010 9939 619926689
1Kx9 FIFO
CMOS
TX
TQFP KOREA-Q
32
168
43
0
CY7C4245-AC
MR93243 9936 619924372
4Kx18 FIFO
CMOS
TX
TQFP TAIWAN-G
64
168
45
0
CY7C4801-AC
MR94016 9936 619924502
256x9x2 FIF CMOS
TX
TQFP KOREA-Q
64
168
44
0
98252
32K x 9
TX
SOJ
32
96
168
50
50
0
0
PCT
121C/100%RH
DCD
MPD
FIFO
COMDTY CY7C188-VC
9829 619807917
CMOS
CSPI-R
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MR94003 9932 619922430 32K x 9
CMOS
TX SOJ CSPI-R
32 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
DPORT
FIFO
CY7C006-JC
MR93200 9929 619920470
16K x 8 DP
CMOS
TX
PLCC PHIL-M
68
300
45
0
CY7C024-JC
MR94125 9940 619925821
4K x 16 DP
CMOS
TX
CY7C0251-AC
99346
8K x 16 DP
CMOS
TX
PLCC KOREA-A
84
300
45
0
TQFP KOREA-Q
100
300
50
0
CY7C136-JC
MR93238 9929 519912467
2K x 8 DP
CMOS
TX
PLCC INDNS-O
52
300
45
0
CY7C144-JC
MR94022 9937 619925819
8K x 8 DP
CMOS
TX
PLCC PHIL-M
68
300
45
0
CY7C4205V-SC
99346
4Kx36x2 FIF CMOS
MN
TQFP KOREA-Q
64
300
49
0
CY7C4211-AC
MR93206 9931 619919397
512x9 FIFO
CMOS
TX
TQFP KOREA-Q
32
300
45
0
CY7C4221-AC
MR94011 9939 619926689
1Kx9 FIFO
CMOS
TX
TQFP KOREA-Q
32
300
43
0
CY7C4245-AC
MR93244 9936 619924372
4Kx18 FIFO
CMOS
TX
TQFP TAIWAN-G
64
300
45
0
CY7C4801-AC
MR94017 9936 619924502
256x9x2 FIF CMOS
TX
TQFP KOREA-Q
64
300
45
0
9929 619919457
9814 619803478
MPD
COMDTY CY7C188-VC
98252
9829 619807917 32K x 9
CMOS
TX SOJ CSPI-R
32 300
52
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 18 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R3
HAST
130C/5.5V
DCD
FIFO
CY7C4271-AC
99346
9853 619817576 32KX9 FIFO CMOS
MN TQFP KOREA-Q
32 128
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8
MPD
COMDTY CY7C1021-ZSC
MR92080 9832 619809027
64K x16
CMOS
MN
TSOP CSPI-R
44
SYNC
MR84103 9848 619812723
32K x 8
CMOS
MN
TSOP CSPI-R
28
CY7C1399-VC
48
96
500
1000
150
149
149
149
0
0
0
0
96
149
0
500
149
0 1 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
FIFO
CY7C4271-AC
99346
9853 619817576 32KX9 FIFO CMOS
MN TQFP KOREA-Q
32 300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 19 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R31
HTOL
150C/3.8
MPD
SYNC
CY7C1399-VC
MR84103 9848 619812723 32K x 8
CMOS
MN TSOP CSPI-R
28
48
150
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 20 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32
HAST
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
130C/5.5
MPD
COMDTY CY62256-SNC
MR94231 9942 619930304
32K x 8
CMOS
CA
NSOI CSPI-R
28
128
45
0
140C/5.5
MPD
COMDTY CY62128-SC
99412
128K x 8
CMOS
MN
SOIC CSPI-R
32
128
50
0
9935 619922743
CY62256-SNI
MR93152 9929 519912201 32K x 8
CMOS
MN NSOI INDNS-O
28 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75
MPD
COMDTY CY62256-SNC
MR94233 9942 619930304
32K x 8
CMOS
CA
NSOI CSPI-R
28
48
80
150
150
0
0
CY62256-SNI
MR93154 9929 519912201
32K x 8
CMOS
MN
NSOI INDNS-O
28
99412
9935 619922743
128K x 8
CMOS
MN
SOIC CSPI-R
32
500
1000
50
50
0
0
CY62128-ZI
MR94196 9940 619904071
128K x 8
CMOS
MN
TSOP PHIL-GW
32
500
45
0
CY62256-SNC
MR94232 9942 619930304
32K x 8
CMOS
CA
NSOI CSPI-R
28
500
45
0
CY62256-SNI
MR93153 9929 519912201
32K x 8
CMOS
MN
NSOI INDNS-O
28
MR94193 9940 619904071
128K x 8
CMOS
MN
TSOP PHIL-GW
32
48
150
0
500
150
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
MPD
COMDTY CY62128-SC
500
45
0
1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY62128-ZI
168
45
0
CY62256-SNC
MR94228 9942 619930304 32K x 8
CMOS
CA NSOI CSPI-R
28 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
MPD
COMDTY CY62128-SC
99412
9935 619922743
128K x 8
CMOS
MN
SOIC CSPI-R
32
100
50
0
200
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62128-SC
99412
9935 619922743
128K x 8
CMOS
MN
SOIC CSPI-R
32
300
50
0
619922743M 128K x 8
CMOS
MN
SOIC CSPI-R
32
300
300
50
50
0
0
CY62128-ZI
MR94194 9940 619904071 128K x 8
CMOS
MN TSOP PHIL-GW
32 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 21 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32D
HTOL
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
150C/5.75
MPD
COMDTY CY7C199-ZC
MR92007 9912 619906781
150C/6.5V
MPD
COMDTY CY7C106-VC
99201
32K x 8(5V) CMOS
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MN
TSOP CSPI-R
28
48
96
500
149
149
143
0
0
0 1 EOS
9917 519907607D 256K x 4
CMOS
MN
SOJ
INDNS-O
28
48
1062
0
519907669D 256K x 4
CMOS
MN
SOJ
INDNS-O
28
48
1070
0
519907720D 256K x 4
CMOS
MN SOJ INDNS-O
28
48 1055
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
DCD
FIFO
CY7C4285-ASC
MR93160 9930 619919829
500
44
0
1000
44
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 22 of
64Kx18 FIFO CMOS
32
MN
TQFP KOREA-Q
64
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42
HTS2
150C/NO BIAS
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C62127V-ZSIB MR93133 9912 619906916
1 MEG SRAM
CMOS
MN
TSOP CSPI-R
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------44
500
45
0
1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C62127V-ZSIB MR93130 9912 619906916 1 MEG SRAM CMOS
MN TSOP CSPI-R
44 168
44
1 1 TOPSIDE CRACK
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62126V-ZSI
CY62148-SC
MR94138 9935 619922725
64K x 16
CMOS
MN
TSOP CSPI-R
44
300
50
0
99233
9919 619908966
512K x 8
CMOS
MN
TSOP KOREA-H
32
300
48
0
9939 619923897
512K x 8
CMOS
MN
TSOP KOREA-H
32
300
47
0
619923900
512K x 8
CMOS
MN
TSOP KOREA-H
32
300
48
0
CY7C62127V-ZSIB MR93131 9912 619906916 1 MEG SRAM CMOS
MN TSOP CSPI-R
44 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 23 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42D
HAST
130C/3.63
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
COMDTY CY7C1021V33-VC
MR94222 9939 619926626
64K x16
CMOS
MN
SOJ
CSPI-R
44
128
45
0
CY7C1049V33-VC
MR94242 9945 619929938
512K x 8
CMOS
MN
SOJ
CSPI-R
36
128
45
0
CY7C1334-AC
MR94201 9941 619927329
64K x 32
CMOS
MN
TQFP CSPI-R
100
128
45
0
SYNC
140C/5.5V
DCD
DPORT CY7C038V-AC
MR93181 9907 619903203 64K x 18 DP CMOS
MN TQFP TAIWAN-G 100 128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8
MPD
COMDTY CY7C1049V33-VC
150C/3.80
MPD
150C/3.8V
DCD
512K x 8
CMOS
MN
SOJ
COMDTY CY7C1021V33-ZSC MR93140 9927 619916650
64K x16
CMOS
MN
TSOP KOREA-H
DPORT
64K x 16 DP CMOS
CY7C028V-AC
CY7C09289-AC
MR91141 9901 619815629
99345
99345
36
48
96
500
150
150
150
0
0
1 1 Unknown Cause
44
48
150
0
MN
TQFP TAIWAN-G 100
48
48
122
238
0
0
619922330L 64K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
48
7
350
0
0
9933 619922048L 64K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
350
0
64K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
48
170
180
0
0
9923 619915215
64K x16
CMOS
MN
SOJ
CSPI-R
44
48
2196
0
9925 619916924
64K x16
CMOS
MN
SOJ
CSPI-R
44
48
1102
1 1 Metal Fuse Problem
9940 619928566
64K x16
CMOS
MN
SOJ
CSPI-R
44
48
2852
0
9933 619922330
619922049
MPD
COMDTY CY7C1021V33-VC
99401
CSPI-R
9943 619931968 64K x16
CMOS
MN SOJ CSPI-R
44
48 3184
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
MPD
COMDTY CY7C1021V33-VC
MR94223 9939 619926626
64K x16
CMOS
MN
SOJ
CY7C1021V33-ZSC MR93139 9927 619916650
64K x16
CMOS
MN
CY7C1338-AC
MR93087 9928 619918771
128K x 32
CMOS
CY7C1353-AC
MR93100 9927 619917277
256K x 18
CMOS
Page 24 of
32
CSPI-R
44
500
45
0
TSOP KOREA-H
44
500
1000
45
45
0
0
MN
TQFP CSPI-R
100
500
1000
45
45
0
0
MN
TQFP CSPI-R
100
500
1000
45
43
0
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R42D
CY7C1334-AC
100
HTS2
150C/NO BIAS
MPD
SYNC
PCT
121C/100%RH
MPD
COMDTY CY7C1021V33-VC
MR93093 9926 619917220
64K x 32
CMOS
MN
TQFP CSPI-R
500
45
0
1000
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------MR94220 9939 619926626
64K x16
CMOS
MN
SOJ
CSPI-R
44
168
45
0
SYNC
CY7C1334-AC
MR94199 9941 619927329 64K x 32
CMOS
MN TQFP CSPI-R
100 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY7C1021V33-VC
MR94221 9939 619926626
64K x16
CMOS
MN
SOJ
CY7C1021V33-ZSC MR93137 9927 619916650
64K x16
CMOS
MN
CY7C1049V33-VC
MR94141 9925 619909834
512K x 8
CMOS
MN
MR94143 9925 619909834
512K x 8
CMOS
CY7C1353-AC
M99221
256K x 18
CMOS
9903 619817919
CSPI-R
44
300
45
0
TSOP KOREA-H
44
300
45
0
SOJ
CSPI-R
36
300
50
0
MN
SOJ
CSPI-R
36
300
50
0
MN
TQFP CSPI-R
100
50
300
50
50
0
0
SYNC
CY7C1334-AC
M99242 9905 619900285 64K x 32
CMOS
MN TQFP CSPI-R
100 300
200
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 25 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42H
HAST
130C/5.5V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY62128-ZC
99344
9928 619919886
128K x 8
CMOS
MN
TSOP KOREA-GQ
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
128
49
0
140C/5.5V
MPD
COMDTY CY62148-SC
99233
9919 619908966 512K x 8
CMOS
MN TSOP KOREA-H
32 128
48
1 1 Unknown Cause
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75
MPD
COMDTY CY62256-SNI
MR94184 9942 519915797
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
150
0
80
150
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
MPD
COMDTY CY62148-SC
99342
9945 619931040
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
48
1947
0
9949 619934768
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
48
1843
0
125C/6.5V
MPD
COMDTY CY62128-SC
99463
9941 619930113G 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
48
768
0
CY62148-SC
99342
9917 619910358
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
48
723
0
CY62256-SNC
99343
9935 519914180
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
348
0
519914192
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
346
0
519914193
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
346
0
519914209
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
348
0
519914210
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
350
1 1 Poly Stringers
519914223
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
348
0
519914239
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
348
0
519914240
32K x 8
CMOS
MN
NSOI INDNS-O
28
48
343
0
519914418 32K x 8
CMOS
MN NSOI INDNS-O
28
48
350
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
MPD
COMDTY CY62128-ZC
MR94170 9942 619928105
128K x 8
CMOS
MN
TSOP KOREA-GQ
32
500
45
0
CY62256-SNI
MR94183 9942 519915797 32K x 8
CMOS
MN NSOI INDNS-O
28 500
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY62128-ZC
MR94167 9942 619928105
128K x 8
CMOS
MN
TSOP KOREA-GQ
32
168
45
0
CY62256-SNI
MR94180 9942 519915797 32K x 8
CMOS
MN NSOI INDNS-O
28 168
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 26 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42H
TC2
-65C TO 150C
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY62128-ZC
MR94168 9942 619928105
128K x 8
CMOS
MN
TSOP KOREA-GQ
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
300
45
0
CY62148-SC
99233
9919 619908966 512K x 8
CMOS
MN TSOP KOREA-H
32 300
90
1 1 Unknown Cause
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 27 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R42HD DRET
CY7C09379V-AC
168
76
0
1000
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
165C/NO BIAS
DCD
DPORT
MR93184
32K x 18 DP CMOS
MN
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
TQFP TAIWAN-G 100
130C/
MPD
COMDTY CY7C1021-VC
MR93252 9936 619924646
64K x16
CMOS
MN
SOJ
TAIWN-G
44
128
45
0
130C/5.5
MPD
COMDTY CY7C109-VC
MR94175 9942 519916020
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
128
42
0
130C/5.5V
DCD
FIFO
CY7C43684-AC
99325
9935 619925738 16Kx36x2 FI CMOS
MN TQFP KOREA-Q 128 128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
135C/6.5V
150C/5.75
150C/5.75V
DCD
MPD
DCD
FIFO
CY7C43643-AC
99325
9942 619927955
1Kx36 FIFO
CMOS
MN
TQFP KOREA-Q
128
48
501
0
CY7C43664-AC
99325
9942 619928058
4Kx36x2 FIF CMOS
MN
TQFP KOREA-Q
128
48
503
0
COMDTY CY7C1021-VC
MR93254 9936 619924646
64K x16
CMOS
MN
SOJ
TAIWN-G
44
48
500
149
149
0
0
CY7C1021-VI
MR93127 9930 619919776
64K x16
CMOS
MN
SOJ
CSPI-R
44
48
500
150
149
0
0
CY7C1041-ZSC
MR92027 9914 619908567
256K x 16
CMOS
MN
TSOP CSPI-R
44
48
96
500
1000
149
149
149
149
0
0
0
0
CY7C199-VC
MR94214 9943 619928997
32K x 8(5V) CMOS
MN
SOJ
28
48
80
150
150
0
0
DPORT
CSPI-R
CY7C026-AC
99281
9839 619811293L 16K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
660
0 5 EOS
CY7C09269-AC
99395
9940 619928230L 16K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
48
500
518
0
0
CY7C09359-AC
99281
9915 619908652
8K x 18 DP
CMOS
MN
TQFP TAIWAN-G 100
48
646
0
CY7C09369-AC
99281
9936 619924394
16K x 18 DP CMOS
MN
TQFP TAIWAN-G 100
48
298
0
619924802L 16K x 18 DP CMOS
MN
TQFP TAIWAN-G 100
48
381
0
150C/6.5V
DCD
DPORT CY7C09369-AC
99281
9936 619924394 16K x 18 DP CMOS
MN TQFP TAIWAN-G 100
48
382
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
MPD
COMDTY CY7C1020-VC
CY7C1021-VC
MR94092 9933 619922192
MR93253 9936 619924646
64K x16
Page 28 of
32K x16
CMOS
32
MN
CMOS
SOJ
MN
SOJ
TAIWN-G
44
TAIWN-G
500
44
45
500
0
45
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HTS2
150C/NO BIAS
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
COMDTY CY7C1021-VC
MR93253 9936 619924646
64K x16
CMOS
MN
SOJ
TAIWN-G
44 1000
45
0
CY7C1021-VI
MR93126 9930 619919776
64K x16
CMOS
MN
SOJ
CSPI-R
44
500
1000
45
44
0
0 1 EOS
CY7C1049-VCB
MR93119 9930 619918414
512K x 8
CMOS
MN
SOJ
CSPI-R
36
500
1000
45
45
0
0
CY7C109-ZC
MR93220 9928 619918244
128K x 8(5) CMOS
MN
SOJ
KOREA-GQ
32
500
1000
45
44
0
0
CY7C199-VC
MR94190 9942 619929685
32K x 8(5V) CMOS
MN
TSOP CSPI-R
28
500
45
0
MR94213 9943 619928997 32K x 8(5V) CMOS
MN SOJ CSPI-R
28 500
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
MPD
DPORT
CY7C09379V-AC
MR94027 9932 619921143
32K x 18 DP CMOS
MN
TQFP TAIWAN-G 100
168
45
0
FIFO
CY7C43684-AC
99325
16Kx36x2 FI CMOS
MN
TQFP KOREA-Q
128
168
48
0
9915 619909326
COMDTY CY7C1020-VC
MR94089 9933 619922192
32K x16
CMOS
MN
SOJ
TAIWN-G
44
168
45
0
CY7C1021-VC
MR93250 9936 619924646
64K x16
CMOS
MN
SOJ
TAIWN-G
44
168
45
0
CY7C109-VC
MR94173 9942 519916020
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
168
45
0
CY7C199-VC
MR94187 9942 619929685
32K x 8(5V) CMOS
MN
TSOP CSPI-R
28
168
45
0
MR94210 9943 619928997 32K x 8(5V) CMOS
MN SOJ CSPI-R
28 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
FIFO
CY7C43684-AC
MPD
COMDTY CY7C1041-VC
99325
9915 619909326
16Kx36x2 FI CMOS
MN
TQFP KOREA-Q
128
300
48
0
MR94144 9939 619927406
256K x 16
CMOS
MN
SOJ
CSPI-R
44
300
50
0
CY7C1049-VCB
MR93117 9930 619918414
512K x 8
CMOS
MN
SOJ
CSPI-R
36
300
45
0
CY7C109-ZC
MR93218 9928 619918244
128K x 8(5) CMOS
MN
SOJ
KOREA-GQ
32
300
45
0
CY7C199-VC
MR93072 9929 619920539
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
45
0
MR94211 9943 619928997 32K x 8(5V) CMOS
MN SOJ CSPI-R
28 300
44
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 29 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R42LD HAST
CY7C924DX-AC
130C/5.5V
DCD
CHNL
99041
9922 349900163L TRANSCEIVER CMOS
MN
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
TQFP TAIWAN-G 100
128
46
0
9924 619915601L TRANSCEIVER CMOS
MN TQFP TAIWAN-G 100 128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
DCD
CHNL
CY7C924DX-AC
99041
9941 349900307
TRANSCEIVER CMOS
MN
TQFP TAIWAN-G 100
84
168
500
770
997
239
239
239
0 1 EOS
0
0
0
125C/6.5V
DCD
CHNL
CY7C924DX-AC
99041
9922 349900163L TRANSCEIVER CMOS
MN
TQFP TAIWAN-G 100
84
168
770
1009
240
239
0 1 EOS
0 1 EOS
0 4 EOS
9924 619915601L TRANSCEIVER CMOS
MN
TQFP TAIWAN-G 100
84
967
0 2 EOS
168
115
0 1 EOS
168
118
0
770
230
1 2 EOS/1 Unknown Cause
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
CHNL
CY7C924DX-AC
99041
9922 349900163L TRANSCEIVER CMOS
MN TQFP TAIWAN-G 100 168
46
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
CHNL
CY7C924DX-AC
99041
9922 349900163L TRANSCEIVER CMOS
MN
TQFP TAIWAN-G 100
300
46
0
9924 619915601L TRANSCEIVER CMOS
MN TQFP TAIWAN-G 100 300
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 30 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R52D HAST
140C/3.63
MPD
COMDTY CY7C1329-AC
MR93232 9918 619911326 64K x 32
CMOS
MN TQFP CSPI-R
100 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY7C1329-AC
MR93231 9918 619911326 64K x 32
CMOS
MN TQFP CSPI-R
100 300
43
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 31 of
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 4, 1999
Issued 4/3/00
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R52LD PCT
121C/100%RH
MPD
COMDTY CY62137-AI
MR94085 9938 619927554 128K x 16
CMOS
TW SBGA TAIWAN-G 48 168
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 32 of
32