Q2 - 1999

CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
QUARTER 2, 1999
PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION
Ed Russell
Reliability Director
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
STANDARD STRESS TEST DESCRIPTIONS
TEST
DESCRIPTION
HTOL
HTOL2
HTSSL
HTSSL2
DRET
DRET2
PCT
HAST
TC
TC2
HTS
High Temp Op Life, 150ºC, Dynamic 115% Vcc Nominal
High Temp Op Life, 125ºC, Dynamic 115% Vcc Nominal
High Temp Steady State Life, 150ºC, Static 115% Vcc Nominal
High Temp Steady State Life, 125ºC, Static 115% Vcc Nominal
Data Retension Test, Data Bake 165ºC, Plastic
Data Retension Test, Data Bake 250ºC, Hermetic
Pressure Cooker Test, 121ºC, 100%RH, No Bias
Hi-Accel Saturation Test, 140ºC, 85%RH, Static 100% Vcc Nominal
Temp Cycle, 125ºC to -40ºC
Temp Cycle, 150ºC to -65ºC
High Temp Storage, 165ºC, No Bias
Page 2 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
WAFER FAB AREAS
FAB #
LOCATION
CA
TX
MN
TW
San Jose, California
Round Rock, Texas
Bloomington, Minnesota
TSMC, Taiwan
ASSEMBLY LOCATION
ID
COMPANY/LOCATION
KOREA-A
ASAT-B
USA-C
PHIL-D
USA-E
INDNS-F
TAIWAN-G
KOREA-H
MALAY-J
THLAND-K
KOREA-L
PHIL-M
USA-N
INDNS-O
USA-P
KOREA-Q
PHIL-R
USA-S
TAIWAN-T
MALAY-U
USA-V
USA-W
ALPHA-X
ALPHA-Y
THLAND-Z
Anam-Buchon/Korea
Asat/Hongkong
Cypress/USA
Dynesem/Philippines
Cypress-Minnesota/USA
Astra/Indonesia
ASE/Taiwan
Hyundai/Korea
ASE/Malaysia
TMS/Thailand
Anam-Seoul/Korea
Anam/Philippines
Express/USA
Omedata/Indonesia
Pantronix/USA
Anam-Bupyong/Korea
Cypress/Philippines
ATM/USA
OSE/Taiwan
Unisem/Malaysia
Aplus/USA
Toshiba/USA
Cypress Bangkok/Thailand
Alphatech/Thailand
Hana/Thailand
Page 3 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
DESCRIPTION OF DATA TABLE COLUMN HEADINGS
COLUMN HEADING
DESCRIPTION OF COLUMN CONTENTS
Division
Test
Test Condition
Device ID
Date Code
Lot Number
Function
Description
Technology
Process
Pkg Material
Pkg Type
Pkg Location
# Pins
Duration
# Test
# Failed
Fail Mode
Cypress Manufacturing Division
Common code for the stress performed. See table on previous page for detail.
Tem/humidity/bias condition for the stress. See table on previous for detail
Cypress part number
Week in which specific lot was marked/sealed/molded.
Manufacturing (assembly) lot number
Generic product family at Cypress
Brief description of device function
Fabrication process technology.
Generic fabrication process
Generic packaging material
Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package).
Country Location + Initial of assembly house (see table on prvious page for detail).
Pin cont of package in which device is assembled.
Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours.
Quantity of devices submitted to this stress/test.
Quantity of devices failing at this specific readpoint.
Failure analysis results from this test, if any.
Page 4 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
RELIABILITY DATA SUMMARY
(Q299)
LONG TERM FAILURE RATE SUMMARY
PROCESS
FAILED
0
134,500
0
134,500
0
0
57,500
18,745
0
2,331,948
0
2,331,948
2
BICMOS TOTAL
0
0
0
0
LFR TOTAL
2,590,608
57,500
2,609,353
2
FAMOS TOTAL
FLASH TOTAL
SRAM/LOGIC TOTAL
FAILURE MODE
*
TOTAL* @ 150C
0
124,160
E2PROM TOTAL
150C
124,160
DEVICE HOURS
125C
2 UNKNOWN
2 UNKNOWN
EARLY FAILURE RATE SUMMARY
PROCESS
UNITS TESTED
125C
150C
537
0
TOTAL @ 150C
537
4,641
0
4,641
1
0
115
115
0
23,757
667
24,424
1
E2PROM TOTAL
FAMOS TOTAL
FLASH TOTAL
SRAM/LOGIC TOTAL
FAILED
0
BICMOS TOTAL
0
0
0
0
EFR TOTAL
28,935
782
29,717
2
FAILURE MODE
1 GATE OXIDE DEFECT
1 UNKNOWN
1 GATE OXIDE DEFECT/1 UNKNOWN
HTSSL FAILURE RATE SUMMARY
PROCESS
DEVICE HOURS
125C
150C
FAMOS TOTAL
0
0
TOTAL* @ 150C
0
0
FLASH TOTAL
0
0
0
0
13,440
0
13,440
0
0
0
0
0
13,440
0
13,440
0
SRAM/LOGIC TOTAL
BICMOS TOTAL
HTSSL TOTAL
*
FAILED
Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress condition.
Page 5 of 40
FAILURE MODE
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
RELIABILITY DATA SUMMARY
(Q299)
TEMP CYCLE FAILURE RATE SUMMARY
PROCESS
DEVICE CYCLE
150C
E2PROM
FAILED
125C
137,800
TOTAL* @ 150C
0
137,800
0
FAMOS TOTAL
101,304
0
101,304
0
FLASH TOTAL
59,100
0
59,100
0
897,900
0
897,900
5
BICMOS TOTAL
13,500
0
13,500
0
TC TOTAL
1,209,604
0
1,209,604
5
SRAM/LOGIC TOTAL
FAILURE MODE
*
1 DESTROY DURING ANALYSIS/1
TOPSIDE CRACK/2 OPEN-BOND LIFT/1
PLASTIC PKG DEFECT
1 DESTROY DURING ANALYSIS/1
TOPSIDE CRACK/2 OPEN-BOND LIFT/1
PLASTIC PKG DEFECT
HAST FAILURE RATE SUMMARY
PROCESS
DEVICE HOURS
140C
FAILED
130C
TOTAL* @ 140C
E2PROM
12,544
0
12,544
FAMOS TOTAL
39680
0
39680
FLASH TOTAL
6,272
0
6,272
0
146,816
0
146,816
3
5,760
0
5,760
0
211,072
0
211,072
8
SRAM/LOGIC TOTAL
BICMOS TOTAL
HAST TOTAL
FAILURE MODE
0
5 1 UNKOWN/2 BROKEN LEADS/2 OPENBOND LIFT
1 OPEN-BOND LIFT/1 TOPSIDE CRACK/1
UNKNOWN
2 UNKOWN/2 BROKEN LEADS/3 OPENBOND LIFT/1 UNKNOWN
LTOL FAILURE RATE SUMMARY
DEVICE HOURS
FAILED
FAMOS TOTAL
PROCESS
0
0
FLASH TOTAL
0
0
45,000
0
0
0
45,000
0
SRAM/LOGIC TOTAL
BICMOS TOTAL
LTOL TOTAL
*
Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress condition.
Page 6 of 40
FAILURE MODE
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
RELIABILITY DATA SUMMARY
(Q299)
PCT FAILURE RATE SUMMARY
DEVICE HOURS
FAILED
22,776
0
PROCESS
E2PROM
FAMOS TOTAL
23,184
0
FLASH TOTAL
7,560
0
418,152
16
14,952
0
463,848
16
SRAM/LOGIC TOTAL
BICMOS TOTAL
PCT TOTAL
PROCESS
E2PROM TOTAL
FAMOS TOTAL
4 UNKNOWN/2 DELAMINATION IN
TOPSIDE/1 PARTICLE DEFECT/6 OPENBOND LIFT/1 OPEN-HEEL/1 MIX REJ/1
ASSEMBLY DEFECT
4 UNKNOWN/2 DELAMINATION IN
TOPSIDE/1 PARTICLE DEFECT/6 OPENBOND LIFT/1 OPEN-HEEL/1 MIX REJ/1
ASSEMBLY DEFECT
DRET FAILURE RATE SUMMARY
PLASTIC (165C)
HERMETIC(250C)
DHR
REJ
DHR
REJ
85,560
0
7,296
0
44,160
0
0
0
FLASH TOTAL
0
0
0
0
SRAM/LOGIC TOTAL
0
0
0
0
BICMOS
0
0
0
0
DRET TOTAL
FAILURE MODE
129,720
0
7,296
Page 7 of
40
FAILURE MODE
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
BICMOS-SM1
HAST
140C/3.63V
DCD
CHNL
CY7B991-VC
MR92111 9830 219805230 PSCB
BiCMOS TX PLCC ALPHA-X
32 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
DCD
CHNL
CY7B991-JC
MR91119 9907 619903134 PSCB
BiCMOS TX PLCC ALPHA-X
32 336
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
CHNL
CY7B991-JC
MR92123 9903 219900322
PSCB
BiCMOS TX
PLCC ALPHA-X
32
168
45
0
CY7B991-VC
MR92109 9830 219805230 PSCB
BiCMOS TX PLCC ALPHA-X
32 168
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
CHNL
CY7B991-JC
MR92124 9903 219900322 PSCB
BiCMOS TX PLCC ALPHA-X
32 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 8 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CMOS-.5MU
HAST
140C/5.5V
CPD
TTECH W42C31-03G
M99211 9913 SD10-1
CLOCK
CMOS
SS SOIC KOREA-A
8 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CPD
TTECH W42C31-03G
M99213 9907 SD10-1
CLOCK
CMOS
SS SOIC KOREA-A
8 300
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 9 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CMOS-.65MU
HAST
140C/3.63V
CPD
TTECH W48C101-01H
M99229 9909 BK0482-11 CLOCK
CMOS
TW SSOP KOREA-A
48 128
45
0 3 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CPD
TTECH
W48C101-01H
M99228
9909 BK0482-11
CLOCK
CMOS
TW
SSOP KOREA-A
48
168
48
0
M99232 9904 BK0482-11 CLOCK
CMOS
TW SSOP KOREA-A
48 168
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CPD
TTECH
W48C101-01H
M99230
9909 BK0482-11
CLOCK
CMOS
TW
SSOP KOREA-A
48
300
48
0
M99234 9904 BK0482-11 CLOCK
CMOS
TW SSOP KOREA-A
48 300
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 10 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
E2PROM-E3
CY37512P208-NC
DRET
165C/NO BIAS
PLD
37K
98403
9903 619817611
512 MCEL
CMOS
TW
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
PQFP TAIWAN-G 208
168
552
76
76
0
0
9905 619901312 512 MCEL
CMOS
TW PQFP TAIWAN-G 208 168
79
0
552
79
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------DRET2 250C/NO BIAS
PLD
37K
CY37256P208-UMB 98521
9848 619815285 256 MCEL
CMOS
TW CQFP USA-GA
160
96
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
140C/5.5V
PLD
37K
CY37512P208-NC
99045
9903 619817611
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
128
48
0
CY37512P352-BG 99043
9902 619900229 512 MCEL
CMOS
TW BGA TAIWAN-G 388 128
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
PLD
37K
CY37256P208-UMB 98521
9848 619815285
256 MCEL
CMOS
TW
CQFP USA-GA
160
80
184
500
500
48
48
24
44
CY37512P208-NC
98403
9905 619903378
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
48
80
500
275
273
83
CY37512P256-BGC 98403
9901 619817515
512 MCEL
CMOS
TW
BGA
CY37512P208-NC
9903 619817611
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
0
0
0 4 ATE-Induced EOS
0 4 ATE-Induced EOS
0
0
0
48
18
0
48
244
0
80
81
0
500
73
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
PLD
37K
99045
TAIWAN-G 292
336
1000
50
50
0
0
CY37512P352-BG 99043
9902 619816568 512 MCEL
CMOS
TW BGA TAIWAN-G 388 336
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
PLD
37K
CY37256P256-BGC MR92197 9904 619900830
256 MCEL
CMOS
TW
BGA
TAIWAN-G 292
CY37512P208-NC
98403
9903 619817611
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
CY37512P208-NC
99045
9903 619817611
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
168
55
0
168
47
0
288
47
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
PLD
37K
CY37512P352-BG
99043
9902 619816568
512 MCEL
Page 11 of
CMOS
40
TW
BGA
TAIWAN-G 388
100
48
100
200
0
50
50
0
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
E2PROM-E3
T/S
-55C TO 150C
PLD
37K
CY37512P352-BG 99043
9902 619816568 512 MCEL
CMOS
TW BGA TAIWAN-G 388 200
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
PLD
37K
CY37256P208-UMB 98521
9848 619815285
256 MCEL
CMOS
TW
CQFP USA-GA
160
100
46
0
-65C TO 150C
PLD
37K
CY37512P208-NC
9903 619817519
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
300
50
0
619817611
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
300
48
0
9905 619901312
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
300
50
0
9903 619817519
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
300
50
0
619817611
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
300
48
0
98403
99045
CY37512P352-BG
99043
9905 619901312
512 MCEL
CMOS
TW
PQFP TAIWAN-G 208
300
50
0
9902 619816568
512 MCEL
CMOS
TW
BGA
TAIWAN-G 388
300
48
0
619817346
512 MCEL
CMOS
TW
BGA
TAIWAN-G 388
300
50
0
619817683 512 MCEL
CMOS
TW BGA TAIWAN-G 388 300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 12 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
FAMOS-P26
DRET
165C/NO BIAS
CPD
USB
CY7C66013-PVC
98452
HAST
140C/5.5V
CPD
USB
CY7C63101A-SC
9834 519810652
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
FULL SP USB CMOS
TX
PDIP CSPI-R
48
168
80
0
552
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------MR84016 9837 619810677
USB
CMOS
TX
SOIC CSPI-R
24
128
79
1 1 Unknown Cause
MR92070 9912 619906570
USB
CMOS
TX
SOIC CSPI-R
24
128
45
0
CY7C64113-PVC
99101
HIGH SP USB CMOS
TX
SSOP CSPI-R
48
128
48
0
CY7C65113-SC
MR92168 9916 619910306
USB HUB
CMOS
TX
SOIC ALPHA-X
28
128
45
0
CY7C66113-PVC
98452
FULL SP USB CMOS
TX
SSOP CSPI-R
56
128
45
4 2 Broken Leads/2 OpenBond Lift (Lead Frame)
9907 619902497
9834 619809906
99022
9902 619900571 FULL SP USB CMOS
TX SSOP CSPI-R
56 128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.5V
CPD
USB
CY7C63101A-SC
99092
9912 619907797
USB
CMOS
TX
SOIC CSPI-R
24
40
40
48
48
520
530
520
530
0
0
0
0
150C/5.75V
CPD
USB
CY7C66013-PVC
98452
9842 519812947
FULL SP USB CMOS
TX
PDIP CSPI-R
48
56
500
80
149
149
0
0
9853 519817122
FULL SP USB CMOS
TX
PDIP CSPI-R
48
48
719
1 1 Gate oxide defect
9906 519902559
FULL SP USB CMOS
TX
PDIP CSPI-R
48
48
80
500
518
120
120
0
0
0
9912 619906716
USB HUB
CMOS
TX
SOIC ALPHA-X
28
45
48
202
298
0
0
619906719
USB HUB
CMOS
TX
SOIC ALPHA-X
28
57
295
0
619906875
USB HUB
CMOS
TX
SOIC ALPHA-X
28
150C/5.8V
CPD
USB
CY7C65113-SC
98452
48
210
0
48
299
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CPD
USB
CY7C63101A-OC
99101
9910 619905509
USB
CMOS
TX
SSOP CSPI-R
24
336
50
0
CY7C63101A-SC
MR91039 9853 619817456
USB
CMOS
TX
SOIC CSPI-R
24
336
1000
45
45
0
0
Page 13 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
FAMOS-P26
CY7C64113-PVC
HTS
165C/NO BIAS
CPD
USB
99101
9907 619902497
HIGH SP USB CMOS
TX
SSOP CSPI-R
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------48
336
50
0 2 EOS
CY7C66113-PVC
99022
9902 619900571 FULL SP USB CMOS
TX SSOP CSPI-R
56 336
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CPD
USB
CY7C63101A-SC
MR91036 9853 619817456
USB
CMOS
TX
SOIC CSPI-R
24
168
45
0
MR92068 9912 619906570
USB
CMOS
TX
SOIC CSPI-R
24
168
45
0
CY7C66113-PVC
98452
9853 619817974 FULL SP USB CMOS
TX SSOP CSPI-R
56 168
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
CPD
USB
CY7C66113-PVC
99022
9902 619900571
FULL SP USB CMOS
TX
SSOP CSPI-R
56
100
50
0
200
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
COD
USB
CY7C66113-PVC
99022
9902 619900605
FULL SP USB CMOS
TX
SSOP CSPI-R
56
300
50
0
CPD
USB
CY7C63101A-OC
99101
9910 619905509
USB
CMOS
TX
SSOP CSPI-R
24
300
50
0
CY7C63101A-SC
MR91037 9853 619817456
USB
CMOS
TX
SOIC CSPI-R
24
300
45
0
CY7C64113-PVC
99101
9907 619902497
HIGH SP USB CMOS
TX
SSOP CSPI-R
48
298
48
0
CY7C66113-PVC
98452
9829 619807023
FULL SP USB CMOS
TX
SSOP CSPI-R
56
300
46
0
99022
9902 619900571
FULL SP USB CMOS
TX
SSOP CSPI-R
56
300
50
0
619900663 FULL SP USB CMOS
TX SSOP CSPI-R
56 300
49
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 14 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
FLASH-FL24D
TC2
-65C TO 150C
PLD
FLASH CY7C371-JC
M99104 9903 219900332 32-MCEL FL CMOS
TX PLCC ALPHA-X
44 300
49
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 15 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
FLASH-FL28D
HAST
140C/5.5V
PLD
FLASH CY7C374I-AC
99052
9909 619902518 128 MCEL FL CMOS
TX TQFP TAIWAN-T 100 128
49
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V
PLD
FLASH CY7C374I-JC
M84028 9838 619811084 128 MCEL FL CMOS
TX PLCC ALPHA-X
84
96
115
0
500
115
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
PLD
FLASH CY7C374I-AC
99052
9909 619902518 128 MCEL FL CMOS
TX TQFP TAIWAN-T 100 336
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
PLD
FLASH CY7C371-JC
MR92184 9916 619910273 32-MCEL FL CMOS
TX PLCC ALPHA-X
44 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
PLD
FLASH
CY7C374I-AC
99052
9909 619902518
128 MCEL FL CMOS
TX
TQFP TAIWAN-T 100
100
50
0
200
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
PLD
FLASH
CY7C374I-AC
99052
9909 619902517
128 MCEL FL CMOS
TX
TQFP TAIWAN-T 100
300
49
0
619902518
128 MCEL FL CMOS
TX
TQFP TAIWAN-T 100
300
50
0
619902519 128 MCEL FL CMOS
TX TQFP TAIWAN-T 100 300
49
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 16 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
MTI-STD
CYM1836V33DPZ
TC
-40C TO 100C
MPD
MTI
9921 349900181
128K x 32
SMT
CA
ZIP
SJ
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------64
500
16
0
CYM1841APR
9916 349900117 256K x 32
SMT
TH ZIP SJ
64 500
16
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 17 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L20
CY7C611A-NC
160
HTS
165C/NO BIAS
DCD
VME
98422
9844 619813226
336
48
0
1000
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 18 of
RISC CONTRL CMOS
40
TX
PQFP HK-B
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L27
HAST
140C/5.5V
CPD
FCT
CY74FCT162827TP MR91044 9852 619817458 10 BIT REG. CMOS
MN SSOP CSPI-R
56 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CPD
FCT
CY74FCT162827TP MR91045 9852 619817458 10 BIT REG. CMOS
MN SSOP CSPI-R
56 1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CPD
FCT
CY74FCT162827TP MR92050 9915 619908472 10 BIT REG. CMOS
MN SSOP CSPI-R
56 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CPD
FCT
CY74FCT162827TP MR91043 9852 619817458
10 BIT REG. CMOS
MN
SSOP CSPI-R
56
300
45
0
CY74FCT2646ATQC 99101
8 BIT TRANS CMOS
MN
SSOP CSPI-R
24
300
50
0
9906 619901183
MR92139 9917 619910754 8 BIT TRANS CMOS
MN SSOP CSPI-R
24 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 19 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L28
HTOL
150C/5.75V
CPD
FCT
CY74FCT2245ATDM 99174
NA
619904050 8 BIT TRAN. CMOS
TX CERD ALPHA-X
20 184
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-L28
PCT
121C/100%RH
CPD
FCT
CY74FCT2827ATQC MR92130 9916 619909475 10 BIT BUF. CMOS
TX SSOP CSPI-R
24 168
44
0
CY74FCT257ATQC
MR91147 9904 619901722
MULTIPLEXER CMOS
TX
SSOP MALAY-U
16
168
42
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
CPD
FCT
CY74FCT2245ATDM 99174
9908 619904050
8 BIT TRAN. CMOS
TX
CERD ALPHA-X
20
100
100
1000
50
50
50
0
0
0
TC2
-65 TO 150C
CPD
FCT
CY74FCT2245ATQC 99101
9907 619903565M 8 BIT TRANS CMOS
TX
SSOP CSPI-R
20
300
50
0
CY74FCT2827ATQC MR92131 9916 619909475 10 BIT BUF. CMOS
TX SSOP CSPI-R
24 300
44
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 20 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L31
HTS
165C/NO BIAS
CPD
FCT
CY74FCT162827TP MR91045 9852 619817458 10 BIT REG. CMOS
MN SSOP CSPI-R
56 336
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CPD
FCT
CY74FCT16244ATP 99101A 9911 619904891 16 BIT BUFF CMOS
MN SSOP CSPI-R
48 300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 21 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R21
PCT
121C/100%RH
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C185-VC
MR91195 9825 619806933
SML/64K
CMOS
TX
SOJ
CSPI-R
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------28
168
46
1 1 Unknown Cause
MR91210 9836 619810465 SML/64K
CMOS
TX SOJ CSPI-R
28 168
45
2 2 Delamination in Topside
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY7C185-VC
MR91196 9825 619806933
SML/64K
CMOS
TX
SOJ
CSPI-R
28
300
36
0
MR91211 9836 619810465 SML/64K
CMOS
TX SOJ CSPI-R
28 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 22 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R28
CY7C136-JC
HAST
140C/5.5V
DCD
DPORT
MPD
COMDTY CY6264-SNC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MR92202 9912 519903133
2K x 8 DP
CMOS
MN
PLCC INDNS-O
52
128
45
0
99151
32K x 8
CMOS
TX
NSOI CSPI-R
28
128
50
0
9915 619907866
CY7C185-VI
MR92064 9909 619903571 SML/64K
CMOS
TX SOJ CSPI-R
28 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8V
150C/5.75V
DCD
MPD
FIFO
CY7C4245V-ASC
99085
9908 619903784
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
333
0
619903786
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
333
0
619903788
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
336
0
COMDTY CY7C185-PC
MR91033 9852 519816332
SML/64K
CMOS
TX
PDIP INDNS-O
28
48
96
500
1000
150
150
150
150
0
0
0
0
CY7C188-VC
MR84067 9836 619810239
32K x 9
CMOS
MN
SOJ
CSPI-R
32
48
96
500
1000
150
150
150
150
0
0
0
0
CY7C199-VC
MR91015 9847 619813801
32K x 8
CMOS
TX
SOJ
CSPI-R
28
48
96
500
1000
115
115
115
114
0
0
1 1 Unknown Cause
0
MR91019 9850 619814990
32K x 8
CMOS
TX
SOJ
CSPI-R
28
99151
9915 619907866
32K x 8
CMOS
TX
NSOI CSPI-R
28
336
1000
50
50
0
0
CY7C185-PC
MR91032 9852 519816332
SML/64K
CMOS
TX
PDIP INDNS-O
28
336
1000
45
45
0
0
CY7C188-VC
MR91010 9852 619813043
32K x 9
CMOS
TX
SOJ
CSPI-R
32
336
44
0
CY7C197-VC
MR91025 9849 519815657
256K x 1
CMOS
TX
SOJ
CSPI-R
24
48
115
0
96
115
0
500
115
0
1000
115
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY6264-SNC
336
45
0
1000
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 23 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R28
DPORT
CY7C136-JC
MR92200 9912 519903133
2K x 8 DP
CMOS
MN
PLCC INDNS-O
52
168
45
0
FIFO
CY7C4221V-AC
PCT
121C/100%RH
DCD
MPD
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MR92153 9805 619800934
1Kx9 FIFO
CMOS
MN
TQFP KOREA-A
32
168
45
0
COMDTY CY7C185-VC
MR91198 9901 619817996
SML/64K
CMOS
TX
SOJ
CSPI-R
28
168
45
0
CY7C185-VI
MR91222 9912 619904918
SML/64K
CMOS
TX
SOJ
CSPI-R
28
168
45
0
MR91225 9908 619902201
SML/64K
CMOS
TX
SOJ
CSPI-R
28
168
45
0
MR92062 9909 619903571
SML/64K
CMOS
TX
SOJ
CSPI-R
28
168
45
0
CY7C188-VC
MR92036 9914 619907801
32K x 9
CMOS
TX
SOJ
CSPI-R
32
168
40
0
CY7C195-VC
MR92191 9827 519807582
64K x 4
CMOS
MN
SOJ
INDNS-O
28
168
45
0
CY7C197-VC
MR91022 9849 519815657
256K x 1
CMOS
TX
SOJ
CSPI-R
24
168
45
1 1 Particle Defect
CY7C199-12VC
MR91204 9850 219808699
32K x 8
CMOS
MN
SOJ
ALPHA-X
28
168
45
1 1 Unknown Cause
MR91213 9851 619815914
32K x 8
CMOS
MN
SOJ
PHIL-M
28
168
45
0
MR91144 9805 619800916
32K x 8
CMOS
TX
SOJ
PHIL-GW
28
168
43
0
MR91234 9804 619800829
32K x 8
CMOS
TX
SOJ
PHIL-GW
28
168
44
0 1 EOS
CY7C199-VC
MR91240 9906 619901833 32K x 8
CMOS
MN SOJ ALPHA-X
28 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
MPD
COMDTY CY6264-SNC
99151
9915 619907866
32K x 8
CMOS
TX
NSOI CSPI-R
28
100
60
0
200
60
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY6264-SNC
99151
9915 619907866
32K x 8
CMOS
TX
NSOI CSPI-R
28
300
50
0
619907866M 32K x 8
CMOS
TX
NSOI CSPI-R
28
300
300
50
50
0
0
CMOS
TX
SOJ
28
300
45
0
CY7C185-VC
MR91199 9901 619817996
MR91238 9850 219808808
SML/64K
CMOS
TX
SOJ
ALPHA-X
28
300
35
0
CY7C185-VI
MR91223 9912 619904918
SML/64K
CMOS
TX
SOJ
CSPI-R
28
300
45
0
MR91226 9908 619902201
SML/64K
CMOS
TX
SOJ
CSPI-R
28
300
43
0
Page 24 of
SML/64K
40
CSPI-R
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R28
TC2
-65C TO 150C
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C188-VC
CY7C199-VC
MR92037 9914 619907801
99101
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
32K x 9
CMOS
TX
SOJ
CSPI-R
32
300
45
1 1 Topside Crack - Buss
9908 619904034M 32K x 8
CMOS
MN
SOJ
PHIL-M
28
300
50
0
MR91145 9805 619800916
32K x 8
CMOS
TX
SOJ
PHIL-GW
28
300
45
1 1 Destroyed During
Analysis
MR91205 9850 219808699
32K x 8
CMOS
MN
SOJ
ALPHA-X
28
300
45
2 2 Open- Bond Lift (Lead
Frame)
MR91214 9851 619815914
32K x 8
CMOS
MN
SOJ
PHIL-M
28
300
41
0
MR91235 9804 619800829
32K x 8
CMOS
TX
SOJ
PHIL-GW
28
300
45
0
MR91241 9906 619901833 32K x 8
CMOS
MN SOJ ALPHA-X
28 300
46
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 25 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R3
HAST
140C/5.5V
MPD
COMDTY CY7C1021-VC
MR91091 9901 619815906 64K x16
CMOS
MN SOJ CSPI-R
44 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
MPD
COMDTY CY7C1021-VC
MR91094 9901 619815906
64K x16
CMOS
MN
SOJ
CSPI-R
44
48
150
0
96
150
0
500
150
0
1000
150
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY7C1021-VC
MR91093 9901 619815906
64K x16
CMOS
MN
SOJ
CSPI-R
44
336
45
0
1000
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C199-VC
MR91165 9904 619814223 256K
CMOS
MN SOJ CSPI-R
28 168
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY7C1021-VC
MR91092 9901 619815906
64K x16
CMOS
MN
SOJ
CSPI-R
44
300
45
0
CY7C199-VC
MR91166 9904 619814223 256K
CMOS
MN SOJ CSPI-R
28 300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 26 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R31
HAST
140C/3.3V
MPD
SYNC
CY7C1399-VC
99101
9908 619903699 32K x 8
CMOS
MN SOJ CSPI-R
28 128
47
1 1 Open- Bond Lift/1 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.45V
MPD
SYNC
CY7C1399-VC
99101
9908 619903699 32K x 8
CMOS
MN SOJ CSPI-R
28
48
120
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
SYNC
CY7C1399-VC
99101
9908 619903699
32K x 8
CMOS
MN
SOJ
CSPI-R
28
336
1000
50
50
0
0
MR84102 9848 619812723
32K x 8
CMOS
MN
TSOP CSPI-R
28
MR91201 9845 219807600
32K x 8
CMOS
MN
SOJ
ALPHA-X
28
168
44
0
MR91207 9850 619812005
32K x 8
CMOS
MN
SOJ
CSPI-R
28
168
45
4 2 unknown, 1 open bond
lift, 1 mix
MR91231 9833 619809217
32K x 8
CMOS
MN
SOJ
CSPI-R
28
168
45
0
336
45
0
1000
43
0 2 Thermal EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
SYNC
CY7C1399-VC
CY7C1399-VI
MR91216 9910 619904878 32K x 8
CMOS
MN SOJ CSPI-R
28 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
SYNC
CY7C1399-VC
99101
9908 619903699
32K x 8
CMOS
MN
SOJ
CSPI-R
28
300
50
0
MR91202 9845 219807600
32K x 8
CMOS
MN
SOJ
ALPHA-X
28
300
45
0
MR91232 9833 619809217
32K x 8
CMOS
MN
SOJ
CSPI-R
28
300
44
0
CY7C1399-VI
MR91220 9909 619904880 32K x 8
CMOS
MN SOJ CSPI-R
28 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 27 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R32
HAST
140C/5.5V
MPD
COMDTY CY62256-SNC
MR84058 9837 519811387 32K x 8
CMOS
CA NSOI INDNS-O
28 128
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY62256-SNC
MR84059 9837 519811387
32K x 8
CMOS
CA
NSOI INDNS-O
28
MR91100 9853 519900063
32K x 8
CMOS
CA
NSOI INDNS-O
28
MR91099 9853 519900063
32K x 8
CMOS
CA
NSOI INDNS-O
28
336
45
0
336
46
0
1000
46
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62256-SNC
300
45
0
MR92103 9915 519906723 32K x 8
CMOS
CA NSOI INDNS-O
28 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 28 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R32D
CY7C4285-JC
HAST
140C/5.5V
DCD
FIFO
99053
9905 619902522
64Kx18 FIFO CMOS
MN
PLCC PHIL-GW
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------64
128
48
0
MPD
COMDTY CY7C199-VC
MR91077 9903 619900012 32K x 8(5V) CMOS
MN SOJ CSPI-R
28 128
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
DCD
FIFO
MPD
MPD
CY7C4285-JC
99053
9905 619902522
64Kx18 FIFO CMOS
MN
PLCC PHIL-GW
68
336
1000
48
48
0
0
COMDTY CY7C199-VC
MR91079 9903 619900012
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
COMDTY CY7C199-VC
MR91183 9911 619904105
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
168
40
5 3 EOS/4 Open- Bond Lift/1
Open- Heel
MR91186 9908 619904258
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
168
49
0
336
35
0
1000
35
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
SYNC
CY7C1399-VC
MR91192 9911 619905946 32K x 8
CMOS
MN SOJ CSPI-R
28 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
DCD
FIFO
CY7C4285-JC
99053
9905 619902522
64Kx18 FIFO CMOS
MN
PLCC PHIL-GW
68
100
48
0
200
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
FIFO
CY7C4285-JC
99053
9905 619902521
64Kx18 FIFO CMOS
MN
PLCC PHIL-GW
68
300
48
0
619902521- 64Kx18 FIFO CMOS
MN
PLCC PHIL-GW
68
300
48
0
MPD
COMDTY CY7C199-VC
619902522
64Kx18 FIFO CMOS
MN
PLCC PHIL-GW
68
300
48
0
MR91078 9903 619900012
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
45
1 1 Plastic Package Defect
MR91184 9911 619904105
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
44
0
MR91187 9908 619904258
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
48
0
CY7C199-VI
MR91157 9909 619900813 32K x 8(5V) CMOS
MN SOJ CSPI-R
28 300
46
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 29 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R42
HAST
140C/3.63V
MPD
COMDTY CY62256V-ZC
MR91125 9911 619816728 32K x 8
CMOS
MN TSOP CSPI-R
28 128
43
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY62256V-ZC
MR91126 9911 619816728 32K x 8
CMOS
MN TSOP CSPI-R
28 336
45
0
1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY62256V-ZC
MR91123 9911 619816728 32K x 8
CMOS
MN TSOP CSPI-R
28 168
39
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62256V-VC
99101
9910 619903700
32K x 8
CMOS
MN
SOJ
CSPI-R
28
300
50
0
CY62256V-ZC
MR91124 9911 619816728 32K x 8
CMOS
MN TSOP CSPI-R
28 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 30 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42D
HAST
140C/3.63V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1021V33-ZSI MR91106 9842 619811676
64K x16
CMOS
MN
TSOP KOREA-H
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------44
128
45
0
MR92018 9909 619904569 64K x16
CMOS
MN TSOP CSOU-R
44 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8V
DCD
MPD
150C/4.3V
MPD
DPORT
CY7C028V-AC
98516
9908 619904225
64K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
48
48
80
500
240
345
420
396
120
0
0
0
0
0
CY7C038V-AC
98516
9907 619903202
64K x 18 DP CMOS
MN
TQFP TAIWAN-G 100
48
80
500
505
120
120
0
0
0
99097
9822 519806013D 128K x 8
CMOS
MN
SOJ
INDNS-O
32
48
1449
0
9831 519809136
128K x 8
CMOS
MN
SOJ
INDNS-O
32
48
1217
0
519809139D 128K x 8
CMOS
MN
SOJ
INDNS-O
32
48
1580
0
64K x16
CMOS
MN
SOJ
CSPI-R
44
48
1364
0
9922 619911273N 64K x16
CMOS
MN
SOJ
CSPI-R
44
48
901
0
619911274N 64K x16
CMOS
MN
SOJ
CSPI-R
44
48
815
0
COMDTY CY7C1019V33-VC
COMDTY CY7C1021V33-VC
SYNCHR CY7C1350-AC
99258
99181
9921 619911346
9923 619911346N 64K x16
CMOS
MN
SOJ
CSPI-R
44
48
1182
0
9917 619904889
128K x 36
CMOS
MN
TQFP CSPI-R
100
48
1364
0
619905086
128K x 36
CMOS
MN
TQFP CSPI-R
100
48
1079
0
619905086L 128K x 36
CMOS
MN TQFP CSPI-R
100
48
328
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY7C1021V33-VC
MR84081 9845 619811706
64K x16
CMOS
MN
SOJ
CSPI-R
44
336
1000
45
45
0
0
CY7C1021V33-ZSC MR84045 9839 619810959 64K x16
CMOS
MN TSOP KOREA-H
44 336
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C1021V33-ZSI MR91104 9842 619811676
64K x16
CMOS
MN
TSOP KOREA-H
44
168
45
0
MR92016 9909 619904569
64K x16
CMOS
MN
TSOP CSOU-R
44
168
45
0
Page 31 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R42D
CY7C1334-AC
100
PCT
121C/100%RH
MPD
SYNC
M99223
9901 619817737
64K x 32
CMOS
MN
TQFP CSPI-R
168
46
0
M99224 9911 619901398 64K x 32
CMOS
MN TQFP CSPI-R
100 168
46
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
SYNC
CY7C1334-AC
M99218
9901 619817737
64K x 32
CMOS
MN
TQFP CSPI-R
100
M99219
9911 619901398
64K x 32
CMOS
MN
TQFP CSPI-R
100
50
100
46
46
0
0
50
46
0
300
46
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 32 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42H
HTS
165C/NO BIAS
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY62128-ZAC
MR91133 9829 619807930
128K x 8
CMOS
MN
STSO CSPI-R
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
336
45
0
1000
43
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY62128-ZAC
MR91130 9829 619807930 128K x 8
CMOS
MN STSO CSPI-R
32 168
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62128-ZAC
MR91131 9829 619807930 128K x 8
CMOS
MN STSO CSPI-R
32 300
44
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 33 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HAST
140C/5.5V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1021-VC
MR84087 9851 619811004
64K x16
CMOS
MN
SOJ
CSPI-R
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------44
128
44
0 1 EOS
MR92045 9911 619816998
64K x16
CMOS
MN
SOJ
CSPI-R
44
128
45
0
CY7C1049-VCB
MR91064 9901 619815482
512K x 8
CMOS
MN
SOJ
CSPI-R
36
128
44
0
CY7C109-VC
MR91070 9904 519901259
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
128
45
0
MR92118 9912 519905501 128K x 8(5) CMOS
MN SOJ INDNS-O
32 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
125C/6.5V
MPD
COMDTY CY7C1021-VC
99257
9918 619910995N 64K x16
CMOS
MN
SOJ
CSPI-R
44
48
951
0
9920 619910952N 64K x16
CMOS
MN
SOJ
CSPI-R
44
48
948
0
CSPI-R
9922 619911631
64K x16
CMOS
MN
SOJ
44
48
965
0
150C/3.8V
DCD
DPORT
CY7C026V-AC
99122
9915 619908661
16K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
48
48
119
417
468
0
0
0
150C/5.75V
DCD
FIFO
CY7C4265-AC
99152
9914 619908289
16KX18 FIFO CMOS
MN
TQFP KOREA-Q
64
48
360
0
9915 619909123
16KX18 FIFO CMOS
MN
TQFP KOREA-Q
64
48
360
0
9917 619910128
16KX18 FIFO CMOS
MN
TQFP KOREA-Q
64
48
360
0
MR84089 9851 619811004
64K x16
CMOS
MN
SOJ
CSPI-R
44
48
96
500
1000
149
149
149
149
0 1 EOS
0
0
0
MR91066 9901 619815482
512K x 8
CMOS
MN
SOJ
CSPI-R
36
MR84088 9851 619811004
64K x16
CMOS
MN
SOJ
CSPI-R
44
MPD
COMDTY CY7C1021-VC
CY7C1049-VCB
48
150
0
168
150
0
500
149
0
1000
149
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY7C1021-VC
336
45
0
MR91051 9851 619815548
64K x16
CMOS
MN
SOJ
CSPI-R
44
336
45
0
CY7C1041-ZSC
MR92026 9914 619908567
256K x 16
CMOS
MN
TSOP CSPI-R
44
336
1000
45
45
0
0
CY7C1049-VCB
MR91065 9901 619815482
512K x 8
CMOS
MN
SOJ
36
336
45
0
Page 34 of
40
CSPI-R
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HTS
165C/NO BIAS
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1049-VCB
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MR91065 9901 619815482
512K x 8
CMOS
MN
SOJ
CSPI-R
36 1000
45
0
MR92077 9914 619905722
512K x 8
CMOS
MN
SOJ
CSPI-R
36
336
1000
45
45
0
0
CY7C109-VC
MR91072 9904 519901259
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
336
1000
50
50
0
0
CY7C109-ZC
MR92013 9908 619903670
128K x 8(5) CMOS
MN
TSOP PHIL-GW
32
336
1000
45
45
0
0
SYNC
CY7C1011-ZC
MR91086 9903 619815422 128K x 16
CMOS
MN TSOP CSPI-R
44 336
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C1021-VC
MR92043 9911 619816998
64K x16
CMOS
MN
SOJ
CSPI-R
44
168
45
0
CY7C1041-ZSC
MR92023 9914 619908567
256K x 16
CMOS
MN
TSOP CSPI-R
44
168
45
0
CY7C1049-VCB
MR91062 9901 619815482
512K x 8
CMOS
MN
SOJ
CSPI-R
36
168
45
1 1 Assembly Defect
MR92074 9914 619905722
512K x 8
CMOS
MN
SOJ
CSPI-R
36
168
45
0
MR91069 9904 519901259
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
168
48
0
MR92116 9912 519905501
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
168
45
0
CY7C109-ZC
MR92010 9908 619903670
128K x 8(5) CMOS
MN
TSOP PHIL-GW
32
168
45
0
CY7C199-VC
MR91153 9909 619901743
32K x 8(5V) CMOS
MN
SOJ
ALPHA-X
28
168
45
0
MR91162 9913 619907915
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
168
39
0
MR91168 9905 619900850
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
168
44
0
MR91171 9906 619901240
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
168
50
0
MR91177 9907 619901334
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
168
49
0
MR91180 9912 619907459
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
168
50
1 1 Open- Bond Lift
MR91189 9913 619907977
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
168
43
0
CY7C109-VC
MR91243 9908 619901753 32K x 8(5V) CMOS
MN SOJ ALPHA-X
28 168
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY7C1021-VC
MR84086 9851 619811004
Page 35 of
64K x16
40
CMOS
MN
SOJ
CSPI-R
44
300
45
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
SRAM/LOGIC-R42HD TC2
-65C TO 150C
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
COMDTY CY7C1041-ZSC
MR92024 9914 619908567
256K x 16
CMOS
MN
TSOP CSPI-R
44
300
45
0
CY7C1049-VCB
MR91063 9901 619815482
512K x 8
CMOS
MN
SOJ
CSPI-R
36
300
45
0
MR92075 9914 619905722
512K x 8
CMOS
MN
SOJ
CSPI-R
36
300
45
0
MR91154 9909 619901743
32K x 8(5V) CMOS
MN
SOJ
ALPHA-X
28
300
45
0
MR91160 9914 619908641
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
44
0
MR91163 9913 619907915
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
51
0
MR91169 9905 619900850
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
45
0
MR91172 9906 619901240
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
48
0
MR91175 9906 619901277
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
43
0
MR91178 9907 619901334
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
45
0
MR91181 9912 619907459
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
300
48
0
CY7C199-VC
MR91190 9913 619907977 32K x 8(5V) CMOS
MN SOJ CSPI-R
28 300
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 36 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R42LD HTOL
CY2211SC
98377
9923 619915605
CLOCK GEN.
CMOS
MN
SOIC CSPI-R
24
28
CY2211ZC
99141
9919 619912991/ CLOCK GEN.
CMOS
MN
TSOP PHIL-M
16
150C/3.8V
CPD
TTECH
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------48
48
210
300
0
0
48
100
0
48
300
0
48
300
0
48
300
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/3.8V
CPD
TTECH
CY2211SC
98377
9915 619909813/ CLOCK GEN.
CMOS
MN
SOIC CSPI-R
24
48
117
0
48
250
0
48
300
0
48
300
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CPD
TTECH
CY2211SC
98377
9915 619909813/ CLOCK GEN.
CMOS
MN
SOIC CSPI-R
24
168
48
0
CY2211ZC
99141
9919 619912994 CLOCK GEN. CMOS
MN TSOP PHIL-M
16 168
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CPD
TTECH
CY2211SC
98377
9915 619909813/ CLOCK GEN.
CMOS
MN
SOIC CSPI-R
24
300
48
0
CY2211ZC
99141
9919 619912994 CLOCK GEN. CMOS
MN TSOP PHIL-M
300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 37 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
DiviTechnology
Test
Test Condition
sion
---------------- ------ ---------------- ----SRAM/LOGIC-R52H HTS
165C/NO BIAS
MPD
FuncAssembly
ProWfr
tion
Device
Eval#
D/C Lot No
Description cess
Loc
----- --------------- ------- ---- ---------- ----------- ------ --COMDTY CY62128V-ZIB
MR92033 9849 619815623 128K x 8
CMOS
MN
Pkg
type
---TSOP
Assy
No Dura Qty
Qty
Loc
Pin tion Test Fail Fail Mode
------- --- ---- ----- ---- ------------------------KOREA-GQ 32 336
45
0
1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY62128V-ZIB
MR92030 9849 619815623 128K x 8
CMOS
MN TSOP KOREA-GQ 32 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62128V-ZIB
MR92031 9849 619815623 128K x 8
CMOS
MN TSOP KOREA-GQ 32 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 38 of
40
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R52LD HAST
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
140/3.63V
MPD
COMDTY CY62137VL-ZSIB
99075
9914 619907944
128K x 16
CMOS
MN
TSOP CSPI-R
44
128
48
0
140c/3.63V
MPD
COMDTY CY62137VL-ZSIB
99075
9910 619905577
128K x 16
CMOS
MN
TSOP CSPI-R
44
128
256
48
48
0
0
140C/3.63V
MPD
COMDTY CY62137VL-ZSIB
99075
9907 619903364
128K x 16
CMOS
MN
TSOP CSPI-R
44
150C/3.8V
MPD
COMDTY CY62137VL-ZSIB
99075
9907 619903364
128K x 16
CMOS
MN
TSOP CSPI-R
44
48
80
500
1505
405
405
0
0
1 1 Unknown Cause
9910 619905577
128K x 16
CMOS
MN
TSOP CSPI-R
44
48
80
500
1504
396
396
1 1 Unknown Cause
0
0
9907 619903364
128K x 16
CMOS
MN
TSOP CSPI-R
44 1000
2000
403
403
128
48
0
128
48
2 1 Topside Crack/1 Unknown
256
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
MPD
COMDTY CY62137VL-ZSIB
99075
0 1 EOS
0
9910 619905577 128K x 16
CMOS
MN TSOP CSPI-R
44 1000
396
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY62137VL-ZSIB
99075
9907 619903364
128K x 16
CMOS
MN
TSOP CSPI-R
44
336
1000
47
47
0
0
9910 619905577 128K x 16
CMOS
MN TSOP CSPI-R
44 336
48
0
1000
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/3.63V
MPD
COMDTY CY62137VL-ZSIB
99075
9907 619903364
128K x 16
CMOS
MN
TSOP CSPI-R
44
80
9
0
80
71
0
168
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL
-30C/3.8V
MPD
COMDTY CY62137VL-ZSIB
99075
9907 619903364
128K x 16
CMOS
MN
TSOP CSPI-R
44
PCT
121C/100%RH
MPD
COMDTY CY62137VL-ZSIB
99075
9907 619903364
128K x 16
CMOS
MN
TSOP CSPI-R
44
500
45
0
1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------168
48
0
9910 619905577 128K x 16
CMOS
MN TSOP CSPI-R
44 168
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62137VL-ZSIB
99075
9907 619903364
Page 39 of
128K x 16
40
CMOS
MN
TSOP CSPI-R
44
300
48
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1999
Issued: 8/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 2, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R52LD TC2
-65C TO 150C
MPD
COMDTY CY62137VL-ZSIB 99075
9910 619905577 128K x 16
CMOS
MN TSOP CSPI-R
44 300
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 40 of
40