CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 2, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 STANDARD STRESS TEST DESCRIPTIONS TEST DESCRIPTION HTOL HTOL2 HTSSL HTSSL2 DRET DRET2 PCT HAST TC TC2 HTS High Temp Op Life, 150ºC, Dynamic 115% Vcc Nominal High Temp Op Life, 125ºC, Dynamic 115% Vcc Nominal High Temp Steady State Life, 150ºC, Static 115% Vcc Nominal High Temp Steady State Life, 125ºC, Static 115% Vcc Nominal Data Retension Test, Data Bake 165ºC, Plastic Data Retension Test, Data Bake 250ºC, Hermetic Pressure Cooker Test, 121ºC, 100%RH, No Bias Hi-Accel Saturation Test, 140ºC, 85%RH, Static 100% Vcc Nominal Temp Cycle, 125ºC to -40ºC Temp Cycle, 150ºC to -65ºC High Temp Storage, 165ºC, No Bias Page 2 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 WAFER FAB AREAS FAB # LOCATION CA TX MN TW San Jose, California Round Rock, Texas Bloomington, Minnesota TSMC, Taiwan ASSEMBLY LOCATION ID COMPANY/LOCATION KOREA-A ASAT-B USA-C PHIL-D USA-E INDNS-F TAIWAN-G KOREA-H MALAY-J THLAND-K KOREA-L PHIL-M USA-N INDNS-O USA-P KOREA-Q PHIL-R USA-S TAIWAN-T MALAY-U USA-V USA-W ALPHA-X ALPHA-Y THLAND-Z Anam-Buchon/Korea Asat/Hongkong Cypress/USA Dynesem/Philippines Cypress-Minnesota/USA Astra/Indonesia ASE/Taiwan Hyundai/Korea ASE/Malaysia TMS/Thailand Anam-Seoul/Korea Anam/Philippines Express/USA Omedata/Indonesia Pantronix/USA Anam-Bupyong/Korea Cypress/Philippines ATM/USA OSE/Taiwan Unisem/Malaysia Aplus/USA Toshiba/USA Cypress Bangkok/Thailand Alphatech/Thailand Hana/Thailand Page 3 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 DESCRIPTION OF DATA TABLE COLUMN HEADINGS COLUMN HEADING DESCRIPTION OF COLUMN CONTENTS Division Test Test Condition Device ID Date Code Lot Number Function Description Technology Process Pkg Material Pkg Type Pkg Location # Pins Duration # Test # Failed Fail Mode Cypress Manufacturing Division Common code for the stress performed. See table on previous page for detail. Tem/humidity/bias condition for the stress. See table on previous for detail Cypress part number Week in which specific lot was marked/sealed/molded. Manufacturing (assembly) lot number Generic product family at Cypress Brief description of device function Fabrication process technology. Generic fabrication process Generic packaging material Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package). Country Location + Initial of assembly house (see table on prvious page for detail). Pin cont of package in which device is assembled. Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours. Quantity of devices submitted to this stress/test. Quantity of devices failing at this specific readpoint. Failure analysis results from this test, if any. Page 4 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 RELIABILITY DATA SUMMARY (Q299) LONG TERM FAILURE RATE SUMMARY PROCESS FAILED 0 134,500 0 134,500 0 0 57,500 18,745 0 2,331,948 0 2,331,948 2 BICMOS TOTAL 0 0 0 0 LFR TOTAL 2,590,608 57,500 2,609,353 2 FAMOS TOTAL FLASH TOTAL SRAM/LOGIC TOTAL FAILURE MODE * TOTAL* @ 150C 0 124,160 E2PROM TOTAL 150C 124,160 DEVICE HOURS 125C 2 UNKNOWN 2 UNKNOWN EARLY FAILURE RATE SUMMARY PROCESS UNITS TESTED 125C 150C 537 0 TOTAL @ 150C 537 4,641 0 4,641 1 0 115 115 0 23,757 667 24,424 1 E2PROM TOTAL FAMOS TOTAL FLASH TOTAL SRAM/LOGIC TOTAL FAILED 0 BICMOS TOTAL 0 0 0 0 EFR TOTAL 28,935 782 29,717 2 FAILURE MODE 1 GATE OXIDE DEFECT 1 UNKNOWN 1 GATE OXIDE DEFECT/1 UNKNOWN HTSSL FAILURE RATE SUMMARY PROCESS DEVICE HOURS 125C 150C FAMOS TOTAL 0 0 TOTAL* @ 150C 0 0 FLASH TOTAL 0 0 0 0 13,440 0 13,440 0 0 0 0 0 13,440 0 13,440 0 SRAM/LOGIC TOTAL BICMOS TOTAL HTSSL TOTAL * FAILED Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress condition. Page 5 of 40 FAILURE MODE CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 RELIABILITY DATA SUMMARY (Q299) TEMP CYCLE FAILURE RATE SUMMARY PROCESS DEVICE CYCLE 150C E2PROM FAILED 125C 137,800 TOTAL* @ 150C 0 137,800 0 FAMOS TOTAL 101,304 0 101,304 0 FLASH TOTAL 59,100 0 59,100 0 897,900 0 897,900 5 BICMOS TOTAL 13,500 0 13,500 0 TC TOTAL 1,209,604 0 1,209,604 5 SRAM/LOGIC TOTAL FAILURE MODE * 1 DESTROY DURING ANALYSIS/1 TOPSIDE CRACK/2 OPEN-BOND LIFT/1 PLASTIC PKG DEFECT 1 DESTROY DURING ANALYSIS/1 TOPSIDE CRACK/2 OPEN-BOND LIFT/1 PLASTIC PKG DEFECT HAST FAILURE RATE SUMMARY PROCESS DEVICE HOURS 140C FAILED 130C TOTAL* @ 140C E2PROM 12,544 0 12,544 FAMOS TOTAL 39680 0 39680 FLASH TOTAL 6,272 0 6,272 0 146,816 0 146,816 3 5,760 0 5,760 0 211,072 0 211,072 8 SRAM/LOGIC TOTAL BICMOS TOTAL HAST TOTAL FAILURE MODE 0 5 1 UNKOWN/2 BROKEN LEADS/2 OPENBOND LIFT 1 OPEN-BOND LIFT/1 TOPSIDE CRACK/1 UNKNOWN 2 UNKOWN/2 BROKEN LEADS/3 OPENBOND LIFT/1 UNKNOWN LTOL FAILURE RATE SUMMARY DEVICE HOURS FAILED FAMOS TOTAL PROCESS 0 0 FLASH TOTAL 0 0 45,000 0 0 0 45,000 0 SRAM/LOGIC TOTAL BICMOS TOTAL LTOL TOTAL * Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress condition. Page 6 of 40 FAILURE MODE CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 RELIABILITY DATA SUMMARY (Q299) PCT FAILURE RATE SUMMARY DEVICE HOURS FAILED 22,776 0 PROCESS E2PROM FAMOS TOTAL 23,184 0 FLASH TOTAL 7,560 0 418,152 16 14,952 0 463,848 16 SRAM/LOGIC TOTAL BICMOS TOTAL PCT TOTAL PROCESS E2PROM TOTAL FAMOS TOTAL 4 UNKNOWN/2 DELAMINATION IN TOPSIDE/1 PARTICLE DEFECT/6 OPENBOND LIFT/1 OPEN-HEEL/1 MIX REJ/1 ASSEMBLY DEFECT 4 UNKNOWN/2 DELAMINATION IN TOPSIDE/1 PARTICLE DEFECT/6 OPENBOND LIFT/1 OPEN-HEEL/1 MIX REJ/1 ASSEMBLY DEFECT DRET FAILURE RATE SUMMARY PLASTIC (165C) HERMETIC(250C) DHR REJ DHR REJ 85,560 0 7,296 0 44,160 0 0 0 FLASH TOTAL 0 0 0 0 SRAM/LOGIC TOTAL 0 0 0 0 BICMOS 0 0 0 0 DRET TOTAL FAILURE MODE 129,720 0 7,296 Page 7 of 40 FAILURE MODE 0 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- BICMOS-SM1 HAST 140C/3.63V DCD CHNL CY7B991-VC MR92111 9830 219805230 PSCB BiCMOS TX PLCC ALPHA-X 32 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS DCD CHNL CY7B991-JC MR91119 9907 619903134 PSCB BiCMOS TX PLCC ALPHA-X 32 336 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH DCD CHNL CY7B991-JC MR92123 9903 219900322 PSCB BiCMOS TX PLCC ALPHA-X 32 168 45 0 CY7B991-VC MR92109 9830 219805230 PSCB BiCMOS TX PLCC ALPHA-X 32 168 44 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C DCD CHNL CY7B991-JC MR92124 9903 219900322 PSCB BiCMOS TX PLCC ALPHA-X 32 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 8 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- CMOS-.5MU HAST 140C/5.5V CPD TTECH W42C31-03G M99211 9913 SD10-1 CLOCK CMOS SS SOIC KOREA-A 8 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C CPD TTECH W42C31-03G M99213 9907 SD10-1 CLOCK CMOS SS SOIC KOREA-A 8 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 9 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- CMOS-.65MU HAST 140C/3.63V CPD TTECH W48C101-01H M99229 9909 BK0482-11 CLOCK CMOS TW SSOP KOREA-A 48 128 45 0 3 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CPD TTECH W48C101-01H M99228 9909 BK0482-11 CLOCK CMOS TW SSOP KOREA-A 48 168 48 0 M99232 9904 BK0482-11 CLOCK CMOS TW SSOP KOREA-A 48 168 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C CPD TTECH W48C101-01H M99230 9909 BK0482-11 CLOCK CMOS TW SSOP KOREA-A 48 300 48 0 M99234 9904 BK0482-11 CLOCK CMOS TW SSOP KOREA-A 48 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 10 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- E2PROM-E3 CY37512P208-NC DRET 165C/NO BIAS PLD 37K 98403 9903 619817611 512 MCEL CMOS TW No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- PQFP TAIWAN-G 208 168 552 76 76 0 0 9905 619901312 512 MCEL CMOS TW PQFP TAIWAN-G 208 168 79 0 552 79 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------DRET2 250C/NO BIAS PLD 37K CY37256P208-UMB 98521 9848 619815285 256 MCEL CMOS TW CQFP USA-GA 160 96 76 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST 140C/5.5V PLD 37K CY37512P208-NC 99045 9903 619817611 512 MCEL CMOS TW PQFP TAIWAN-G 208 128 48 0 CY37512P352-BG 99043 9902 619900229 512 MCEL CMOS TW BGA TAIWAN-G 388 128 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75V PLD 37K CY37256P208-UMB 98521 9848 619815285 256 MCEL CMOS TW CQFP USA-GA 160 80 184 500 500 48 48 24 44 CY37512P208-NC 98403 9905 619903378 512 MCEL CMOS TW PQFP TAIWAN-G 208 48 80 500 275 273 83 CY37512P256-BGC 98403 9901 619817515 512 MCEL CMOS TW BGA CY37512P208-NC 9903 619817611 512 MCEL CMOS TW PQFP TAIWAN-G 208 0 0 0 4 ATE-Induced EOS 0 4 ATE-Induced EOS 0 0 0 48 18 0 48 244 0 80 81 0 500 73 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS PLD 37K 99045 TAIWAN-G 292 336 1000 50 50 0 0 CY37512P352-BG 99043 9902 619816568 512 MCEL CMOS TW BGA TAIWAN-G 388 336 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH PLD 37K CY37256P256-BGC MR92197 9904 619900830 256 MCEL CMOS TW BGA TAIWAN-G 292 CY37512P208-NC 98403 9903 619817611 512 MCEL CMOS TW PQFP TAIWAN-G 208 CY37512P208-NC 99045 9903 619817611 512 MCEL CMOS TW PQFP TAIWAN-G 208 168 55 0 168 47 0 288 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C PLD 37K CY37512P352-BG 99043 9902 619816568 512 MCEL Page 11 of CMOS 40 TW BGA TAIWAN-G 388 100 48 100 200 0 50 50 0 0 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- E2PROM-E3 T/S -55C TO 150C PLD 37K CY37512P352-BG 99043 9902 619816568 512 MCEL CMOS TW BGA TAIWAN-G 388 200 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65 TO 150C PLD 37K CY37256P208-UMB 98521 9848 619815285 256 MCEL CMOS TW CQFP USA-GA 160 100 46 0 -65C TO 150C PLD 37K CY37512P208-NC 9903 619817519 512 MCEL CMOS TW PQFP TAIWAN-G 208 300 50 0 619817611 512 MCEL CMOS TW PQFP TAIWAN-G 208 300 48 0 9905 619901312 512 MCEL CMOS TW PQFP TAIWAN-G 208 300 50 0 9903 619817519 512 MCEL CMOS TW PQFP TAIWAN-G 208 300 50 0 619817611 512 MCEL CMOS TW PQFP TAIWAN-G 208 300 48 0 98403 99045 CY37512P352-BG 99043 9905 619901312 512 MCEL CMOS TW PQFP TAIWAN-G 208 300 50 0 9902 619816568 512 MCEL CMOS TW BGA TAIWAN-G 388 300 48 0 619817346 512 MCEL CMOS TW BGA TAIWAN-G 388 300 50 0 619817683 512 MCEL CMOS TW BGA TAIWAN-G 388 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 12 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- FAMOS-P26 DRET 165C/NO BIAS CPD USB CY7C66013-PVC 98452 HAST 140C/5.5V CPD USB CY7C63101A-SC 9834 519810652 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- FULL SP USB CMOS TX PDIP CSPI-R 48 168 80 0 552 80 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------MR84016 9837 619810677 USB CMOS TX SOIC CSPI-R 24 128 79 1 1 Unknown Cause MR92070 9912 619906570 USB CMOS TX SOIC CSPI-R 24 128 45 0 CY7C64113-PVC 99101 HIGH SP USB CMOS TX SSOP CSPI-R 48 128 48 0 CY7C65113-SC MR92168 9916 619910306 USB HUB CMOS TX SOIC ALPHA-X 28 128 45 0 CY7C66113-PVC 98452 FULL SP USB CMOS TX SSOP CSPI-R 56 128 45 4 2 Broken Leads/2 OpenBond Lift (Lead Frame) 9907 619902497 9834 619809906 99022 9902 619900571 FULL SP USB CMOS TX SSOP CSPI-R 56 128 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.5V CPD USB CY7C63101A-SC 99092 9912 619907797 USB CMOS TX SOIC CSPI-R 24 40 40 48 48 520 530 520 530 0 0 0 0 150C/5.75V CPD USB CY7C66013-PVC 98452 9842 519812947 FULL SP USB CMOS TX PDIP CSPI-R 48 56 500 80 149 149 0 0 9853 519817122 FULL SP USB CMOS TX PDIP CSPI-R 48 48 719 1 1 Gate oxide defect 9906 519902559 FULL SP USB CMOS TX PDIP CSPI-R 48 48 80 500 518 120 120 0 0 0 9912 619906716 USB HUB CMOS TX SOIC ALPHA-X 28 45 48 202 298 0 0 619906719 USB HUB CMOS TX SOIC ALPHA-X 28 57 295 0 619906875 USB HUB CMOS TX SOIC ALPHA-X 28 150C/5.8V CPD USB CY7C65113-SC 98452 48 210 0 48 299 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS CPD USB CY7C63101A-OC 99101 9910 619905509 USB CMOS TX SSOP CSPI-R 24 336 50 0 CY7C63101A-SC MR91039 9853 619817456 USB CMOS TX SOIC CSPI-R 24 336 1000 45 45 0 0 Page 13 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- FAMOS-P26 CY7C64113-PVC HTS 165C/NO BIAS CPD USB 99101 9907 619902497 HIGH SP USB CMOS TX SSOP CSPI-R No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------48 336 50 0 2 EOS CY7C66113-PVC 99022 9902 619900571 FULL SP USB CMOS TX SSOP CSPI-R 56 336 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CPD USB CY7C63101A-SC MR91036 9853 619817456 USB CMOS TX SOIC CSPI-R 24 168 45 0 MR92068 9912 619906570 USB CMOS TX SOIC CSPI-R 24 168 45 0 CY7C66113-PVC 98452 9853 619817974 FULL SP USB CMOS TX SSOP CSPI-R 56 168 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C CPD USB CY7C66113-PVC 99022 9902 619900571 FULL SP USB CMOS TX SSOP CSPI-R 56 100 50 0 200 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C COD USB CY7C66113-PVC 99022 9902 619900605 FULL SP USB CMOS TX SSOP CSPI-R 56 300 50 0 CPD USB CY7C63101A-OC 99101 9910 619905509 USB CMOS TX SSOP CSPI-R 24 300 50 0 CY7C63101A-SC MR91037 9853 619817456 USB CMOS TX SOIC CSPI-R 24 300 45 0 CY7C64113-PVC 99101 9907 619902497 HIGH SP USB CMOS TX SSOP CSPI-R 48 298 48 0 CY7C66113-PVC 98452 9829 619807023 FULL SP USB CMOS TX SSOP CSPI-R 56 300 46 0 99022 9902 619900571 FULL SP USB CMOS TX SSOP CSPI-R 56 300 50 0 619900663 FULL SP USB CMOS TX SSOP CSPI-R 56 300 49 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 14 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- FLASH-FL24D TC2 -65C TO 150C PLD FLASH CY7C371-JC M99104 9903 219900332 32-MCEL FL CMOS TX PLCC ALPHA-X 44 300 49 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 15 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- FLASH-FL28D HAST 140C/5.5V PLD FLASH CY7C374I-AC 99052 9909 619902518 128 MCEL FL CMOS TX TQFP TAIWAN-T 100 128 49 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V PLD FLASH CY7C374I-JC M84028 9838 619811084 128 MCEL FL CMOS TX PLCC ALPHA-X 84 96 115 0 500 115 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS PLD FLASH CY7C374I-AC 99052 9909 619902518 128 MCEL FL CMOS TX TQFP TAIWAN-T 100 336 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH PLD FLASH CY7C371-JC MR92184 9916 619910273 32-MCEL FL CMOS TX PLCC ALPHA-X 44 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C PLD FLASH CY7C374I-AC 99052 9909 619902518 128 MCEL FL CMOS TX TQFP TAIWAN-T 100 100 50 0 200 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C PLD FLASH CY7C374I-AC 99052 9909 619902517 128 MCEL FL CMOS TX TQFP TAIWAN-T 100 300 49 0 619902518 128 MCEL FL CMOS TX TQFP TAIWAN-T 100 300 50 0 619902519 128 MCEL FL CMOS TX TQFP TAIWAN-T 100 300 49 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 16 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- MTI-STD CYM1836V33DPZ TC -40C TO 100C MPD MTI 9921 349900181 128K x 32 SMT CA ZIP SJ No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------64 500 16 0 CYM1841APR 9916 349900117 256K x 32 SMT TH ZIP SJ 64 500 16 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 17 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-L20 CY7C611A-NC 160 HTS 165C/NO BIAS DCD VME 98422 9844 619813226 336 48 0 1000 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 18 of RISC CONTRL CMOS 40 TX PQFP HK-B CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-L27 HAST 140C/5.5V CPD FCT CY74FCT162827TP MR91044 9852 619817458 10 BIT REG. CMOS MN SSOP CSPI-R 56 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS CPD FCT CY74FCT162827TP MR91045 9852 619817458 10 BIT REG. CMOS MN SSOP CSPI-R 56 1000 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CPD FCT CY74FCT162827TP MR92050 9915 619908472 10 BIT REG. CMOS MN SSOP CSPI-R 56 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C CPD FCT CY74FCT162827TP MR91043 9852 619817458 10 BIT REG. CMOS MN SSOP CSPI-R 56 300 45 0 CY74FCT2646ATQC 99101 8 BIT TRANS CMOS MN SSOP CSPI-R 24 300 50 0 9906 619901183 MR92139 9917 619910754 8 BIT TRANS CMOS MN SSOP CSPI-R 24 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 19 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-L28 HTOL 150C/5.75V CPD FCT CY74FCT2245ATDM 99174 NA 619904050 8 BIT TRAN. CMOS TX CERD ALPHA-X 20 184 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-L28 PCT 121C/100%RH CPD FCT CY74FCT2827ATQC MR92130 9916 619909475 10 BIT BUF. CMOS TX SSOP CSPI-R 24 168 44 0 CY74FCT257ATQC MR91147 9904 619901722 MULTIPLEXER CMOS TX SSOP MALAY-U 16 168 42 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65 TO 150C CPD FCT CY74FCT2245ATDM 99174 9908 619904050 8 BIT TRAN. CMOS TX CERD ALPHA-X 20 100 100 1000 50 50 50 0 0 0 TC2 -65 TO 150C CPD FCT CY74FCT2245ATQC 99101 9907 619903565M 8 BIT TRANS CMOS TX SSOP CSPI-R 20 300 50 0 CY74FCT2827ATQC MR92131 9916 619909475 10 BIT BUF. CMOS TX SSOP CSPI-R 24 300 44 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 20 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-L31 HTS 165C/NO BIAS CPD FCT CY74FCT162827TP MR91045 9852 619817458 10 BIT REG. CMOS MN SSOP CSPI-R 56 336 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C CPD FCT CY74FCT16244ATP 99101A 9911 619904891 16 BIT BUFF CMOS MN SSOP CSPI-R 48 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 21 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R21 PCT 121C/100%RH MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C185-VC MR91195 9825 619806933 SML/64K CMOS TX SOJ CSPI-R No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------28 168 46 1 1 Unknown Cause MR91210 9836 619810465 SML/64K CMOS TX SOJ CSPI-R 28 168 45 2 2 Delamination in Topside ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY7C185-VC MR91196 9825 619806933 SML/64K CMOS TX SOJ CSPI-R 28 300 36 0 MR91211 9836 619810465 SML/64K CMOS TX SOJ CSPI-R 28 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 22 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R28 CY7C136-JC HAST 140C/5.5V DCD DPORT MPD COMDTY CY6264-SNC No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- MR92202 9912 519903133 2K x 8 DP CMOS MN PLCC INDNS-O 52 128 45 0 99151 32K x 8 CMOS TX NSOI CSPI-R 28 128 50 0 9915 619907866 CY7C185-VI MR92064 9909 619903571 SML/64K CMOS TX SOJ CSPI-R 28 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.8V 150C/5.75V DCD MPD FIFO CY7C4245V-ASC 99085 9908 619903784 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 48 333 0 619903786 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 48 333 0 619903788 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 48 336 0 COMDTY CY7C185-PC MR91033 9852 519816332 SML/64K CMOS TX PDIP INDNS-O 28 48 96 500 1000 150 150 150 150 0 0 0 0 CY7C188-VC MR84067 9836 619810239 32K x 9 CMOS MN SOJ CSPI-R 32 48 96 500 1000 150 150 150 150 0 0 0 0 CY7C199-VC MR91015 9847 619813801 32K x 8 CMOS TX SOJ CSPI-R 28 48 96 500 1000 115 115 115 114 0 0 1 1 Unknown Cause 0 MR91019 9850 619814990 32K x 8 CMOS TX SOJ CSPI-R 28 99151 9915 619907866 32K x 8 CMOS TX NSOI CSPI-R 28 336 1000 50 50 0 0 CY7C185-PC MR91032 9852 519816332 SML/64K CMOS TX PDIP INDNS-O 28 336 1000 45 45 0 0 CY7C188-VC MR91010 9852 619813043 32K x 9 CMOS TX SOJ CSPI-R 32 336 44 0 CY7C197-VC MR91025 9849 519815657 256K x 1 CMOS TX SOJ CSPI-R 24 48 115 0 96 115 0 500 115 0 1000 115 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY6264-SNC 336 45 0 1000 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 23 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R28 DPORT CY7C136-JC MR92200 9912 519903133 2K x 8 DP CMOS MN PLCC INDNS-O 52 168 45 0 FIFO CY7C4221V-AC PCT 121C/100%RH DCD MPD No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- MR92153 9805 619800934 1Kx9 FIFO CMOS MN TQFP KOREA-A 32 168 45 0 COMDTY CY7C185-VC MR91198 9901 619817996 SML/64K CMOS TX SOJ CSPI-R 28 168 45 0 CY7C185-VI MR91222 9912 619904918 SML/64K CMOS TX SOJ CSPI-R 28 168 45 0 MR91225 9908 619902201 SML/64K CMOS TX SOJ CSPI-R 28 168 45 0 MR92062 9909 619903571 SML/64K CMOS TX SOJ CSPI-R 28 168 45 0 CY7C188-VC MR92036 9914 619907801 32K x 9 CMOS TX SOJ CSPI-R 32 168 40 0 CY7C195-VC MR92191 9827 519807582 64K x 4 CMOS MN SOJ INDNS-O 28 168 45 0 CY7C197-VC MR91022 9849 519815657 256K x 1 CMOS TX SOJ CSPI-R 24 168 45 1 1 Particle Defect CY7C199-12VC MR91204 9850 219808699 32K x 8 CMOS MN SOJ ALPHA-X 28 168 45 1 1 Unknown Cause MR91213 9851 619815914 32K x 8 CMOS MN SOJ PHIL-M 28 168 45 0 MR91144 9805 619800916 32K x 8 CMOS TX SOJ PHIL-GW 28 168 43 0 MR91234 9804 619800829 32K x 8 CMOS TX SOJ PHIL-GW 28 168 44 0 1 EOS CY7C199-VC MR91240 9906 619901833 32K x 8 CMOS MN SOJ ALPHA-X 28 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C MPD COMDTY CY6264-SNC 99151 9915 619907866 32K x 8 CMOS TX NSOI CSPI-R 28 100 60 0 200 60 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY6264-SNC 99151 9915 619907866 32K x 8 CMOS TX NSOI CSPI-R 28 300 50 0 619907866M 32K x 8 CMOS TX NSOI CSPI-R 28 300 300 50 50 0 0 CMOS TX SOJ 28 300 45 0 CY7C185-VC MR91199 9901 619817996 MR91238 9850 219808808 SML/64K CMOS TX SOJ ALPHA-X 28 300 35 0 CY7C185-VI MR91223 9912 619904918 SML/64K CMOS TX SOJ CSPI-R 28 300 45 0 MR91226 9908 619902201 SML/64K CMOS TX SOJ CSPI-R 28 300 43 0 Page 24 of SML/64K 40 CSPI-R CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R28 TC2 -65C TO 150C MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C188-VC CY7C199-VC MR92037 9914 619907801 99101 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 32K x 9 CMOS TX SOJ CSPI-R 32 300 45 1 1 Topside Crack - Buss 9908 619904034M 32K x 8 CMOS MN SOJ PHIL-M 28 300 50 0 MR91145 9805 619800916 32K x 8 CMOS TX SOJ PHIL-GW 28 300 45 1 1 Destroyed During Analysis MR91205 9850 219808699 32K x 8 CMOS MN SOJ ALPHA-X 28 300 45 2 2 Open- Bond Lift (Lead Frame) MR91214 9851 619815914 32K x 8 CMOS MN SOJ PHIL-M 28 300 41 0 MR91235 9804 619800829 32K x 8 CMOS TX SOJ PHIL-GW 28 300 45 0 MR91241 9906 619901833 32K x 8 CMOS MN SOJ ALPHA-X 28 300 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 25 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R3 HAST 140C/5.5V MPD COMDTY CY7C1021-VC MR91091 9901 619815906 64K x16 CMOS MN SOJ CSPI-R 44 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75V MPD COMDTY CY7C1021-VC MR91094 9901 619815906 64K x16 CMOS MN SOJ CSPI-R 44 48 150 0 96 150 0 500 150 0 1000 150 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY7C1021-VC MR91093 9901 619815906 64K x16 CMOS MN SOJ CSPI-R 44 336 45 0 1000 44 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY7C199-VC MR91165 9904 619814223 256K CMOS MN SOJ CSPI-R 28 168 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY7C1021-VC MR91092 9901 619815906 64K x16 CMOS MN SOJ CSPI-R 44 300 45 0 CY7C199-VC MR91166 9904 619814223 256K CMOS MN SOJ CSPI-R 28 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 26 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R31 HAST 140C/3.3V MPD SYNC CY7C1399-VC 99101 9908 619903699 32K x 8 CMOS MN SOJ CSPI-R 28 128 47 1 1 Open- Bond Lift/1 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.45V MPD SYNC CY7C1399-VC 99101 9908 619903699 32K x 8 CMOS MN SOJ CSPI-R 28 48 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD SYNC CY7C1399-VC 99101 9908 619903699 32K x 8 CMOS MN SOJ CSPI-R 28 336 1000 50 50 0 0 MR84102 9848 619812723 32K x 8 CMOS MN TSOP CSPI-R 28 MR91201 9845 219807600 32K x 8 CMOS MN SOJ ALPHA-X 28 168 44 0 MR91207 9850 619812005 32K x 8 CMOS MN SOJ CSPI-R 28 168 45 4 2 unknown, 1 open bond lift, 1 mix MR91231 9833 619809217 32K x 8 CMOS MN SOJ CSPI-R 28 168 45 0 336 45 0 1000 43 0 2 Thermal EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD SYNC CY7C1399-VC CY7C1399-VI MR91216 9910 619904878 32K x 8 CMOS MN SOJ CSPI-R 28 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD SYNC CY7C1399-VC 99101 9908 619903699 32K x 8 CMOS MN SOJ CSPI-R 28 300 50 0 MR91202 9845 219807600 32K x 8 CMOS MN SOJ ALPHA-X 28 300 45 0 MR91232 9833 619809217 32K x 8 CMOS MN SOJ CSPI-R 28 300 44 0 CY7C1399-VI MR91220 9909 619904880 32K x 8 CMOS MN SOJ CSPI-R 28 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 27 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R32 HAST 140C/5.5V MPD COMDTY CY62256-SNC MR84058 9837 519811387 32K x 8 CMOS CA NSOI INDNS-O 28 128 44 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY62256-SNC MR84059 9837 519811387 32K x 8 CMOS CA NSOI INDNS-O 28 MR91100 9853 519900063 32K x 8 CMOS CA NSOI INDNS-O 28 MR91099 9853 519900063 32K x 8 CMOS CA NSOI INDNS-O 28 336 45 0 336 46 0 1000 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY62256-SNC 300 45 0 MR92103 9915 519906723 32K x 8 CMOS CA NSOI INDNS-O 28 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 28 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R32D CY7C4285-JC HAST 140C/5.5V DCD FIFO 99053 9905 619902522 64Kx18 FIFO CMOS MN PLCC PHIL-GW No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------64 128 48 0 MPD COMDTY CY7C199-VC MR91077 9903 619900012 32K x 8(5V) CMOS MN SOJ CSPI-R 28 128 44 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS DCD FIFO MPD MPD CY7C4285-JC 99053 9905 619902522 64Kx18 FIFO CMOS MN PLCC PHIL-GW 68 336 1000 48 48 0 0 COMDTY CY7C199-VC MR91079 9903 619900012 32K x 8(5V) CMOS MN SOJ CSPI-R 28 COMDTY CY7C199-VC MR91183 9911 619904105 32K x 8(5V) CMOS MN SOJ CSPI-R 28 168 40 5 3 EOS/4 Open- Bond Lift/1 Open- Heel MR91186 9908 619904258 32K x 8(5V) CMOS MN SOJ CSPI-R 28 168 49 0 336 35 0 1000 35 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH SYNC CY7C1399-VC MR91192 9911 619905946 32K x 8 CMOS MN SOJ CSPI-R 28 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C DCD FIFO CY7C4285-JC 99053 9905 619902522 64Kx18 FIFO CMOS MN PLCC PHIL-GW 68 100 48 0 200 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C DCD FIFO CY7C4285-JC 99053 9905 619902521 64Kx18 FIFO CMOS MN PLCC PHIL-GW 68 300 48 0 619902521- 64Kx18 FIFO CMOS MN PLCC PHIL-GW 68 300 48 0 MPD COMDTY CY7C199-VC 619902522 64Kx18 FIFO CMOS MN PLCC PHIL-GW 68 300 48 0 MR91078 9903 619900012 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 45 1 1 Plastic Package Defect MR91184 9911 619904105 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 44 0 MR91187 9908 619904258 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 48 0 CY7C199-VI MR91157 9909 619900813 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 29 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R42 HAST 140C/3.63V MPD COMDTY CY62256V-ZC MR91125 9911 619816728 32K x 8 CMOS MN TSOP CSPI-R 28 128 43 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY62256V-ZC MR91126 9911 619816728 32K x 8 CMOS MN TSOP CSPI-R 28 336 45 0 1000 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY62256V-ZC MR91123 9911 619816728 32K x 8 CMOS MN TSOP CSPI-R 28 168 39 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY62256V-VC 99101 9910 619903700 32K x 8 CMOS MN SOJ CSPI-R 28 300 50 0 CY62256V-ZC MR91124 9911 619816728 32K x 8 CMOS MN TSOP CSPI-R 28 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 30 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42D HAST 140C/3.63V MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1021V33-ZSI MR91106 9842 619811676 64K x16 CMOS MN TSOP KOREA-H No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------44 128 45 0 MR92018 9909 619904569 64K x16 CMOS MN TSOP CSOU-R 44 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.8V DCD MPD 150C/4.3V MPD DPORT CY7C028V-AC 98516 9908 619904225 64K x 16 DP CMOS MN TQFP TAIWAN-G 100 48 48 48 80 500 240 345 420 396 120 0 0 0 0 0 CY7C038V-AC 98516 9907 619903202 64K x 18 DP CMOS MN TQFP TAIWAN-G 100 48 80 500 505 120 120 0 0 0 99097 9822 519806013D 128K x 8 CMOS MN SOJ INDNS-O 32 48 1449 0 9831 519809136 128K x 8 CMOS MN SOJ INDNS-O 32 48 1217 0 519809139D 128K x 8 CMOS MN SOJ INDNS-O 32 48 1580 0 64K x16 CMOS MN SOJ CSPI-R 44 48 1364 0 9922 619911273N 64K x16 CMOS MN SOJ CSPI-R 44 48 901 0 619911274N 64K x16 CMOS MN SOJ CSPI-R 44 48 815 0 COMDTY CY7C1019V33-VC COMDTY CY7C1021V33-VC SYNCHR CY7C1350-AC 99258 99181 9921 619911346 9923 619911346N 64K x16 CMOS MN SOJ CSPI-R 44 48 1182 0 9917 619904889 128K x 36 CMOS MN TQFP CSPI-R 100 48 1364 0 619905086 128K x 36 CMOS MN TQFP CSPI-R 100 48 1079 0 619905086L 128K x 36 CMOS MN TQFP CSPI-R 100 48 328 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY7C1021V33-VC MR84081 9845 619811706 64K x16 CMOS MN SOJ CSPI-R 44 336 1000 45 45 0 0 CY7C1021V33-ZSC MR84045 9839 619810959 64K x16 CMOS MN TSOP KOREA-H 44 336 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY7C1021V33-ZSI MR91104 9842 619811676 64K x16 CMOS MN TSOP KOREA-H 44 168 45 0 MR92016 9909 619904569 64K x16 CMOS MN TSOP CSOU-R 44 168 45 0 Page 31 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R42D CY7C1334-AC 100 PCT 121C/100%RH MPD SYNC M99223 9901 619817737 64K x 32 CMOS MN TQFP CSPI-R 168 46 0 M99224 9911 619901398 64K x 32 CMOS MN TQFP CSPI-R 100 168 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD SYNC CY7C1334-AC M99218 9901 619817737 64K x 32 CMOS MN TQFP CSPI-R 100 M99219 9911 619901398 64K x 32 CMOS MN TQFP CSPI-R 100 50 100 46 46 0 0 50 46 0 300 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 32 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42H HTS 165C/NO BIAS MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY62128-ZAC MR91133 9829 619807930 128K x 8 CMOS MN STSO CSPI-R No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------32 336 45 0 1000 43 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY62128-ZAC MR91130 9829 619807930 128K x 8 CMOS MN STSO CSPI-R 32 168 44 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY62128-ZAC MR91131 9829 619807930 128K x 8 CMOS MN STSO CSPI-R 32 300 44 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 33 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HAST 140C/5.5V MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1021-VC MR84087 9851 619811004 64K x16 CMOS MN SOJ CSPI-R No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------44 128 44 0 1 EOS MR92045 9911 619816998 64K x16 CMOS MN SOJ CSPI-R 44 128 45 0 CY7C1049-VCB MR91064 9901 619815482 512K x 8 CMOS MN SOJ CSPI-R 36 128 44 0 CY7C109-VC MR91070 9904 519901259 128K x 8(5) CMOS MN SOJ INDNS-O 32 128 45 0 MR92118 9912 519905501 128K x 8(5) CMOS MN SOJ INDNS-O 32 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 125C/6.5V MPD COMDTY CY7C1021-VC 99257 9918 619910995N 64K x16 CMOS MN SOJ CSPI-R 44 48 951 0 9920 619910952N 64K x16 CMOS MN SOJ CSPI-R 44 48 948 0 CSPI-R 9922 619911631 64K x16 CMOS MN SOJ 44 48 965 0 150C/3.8V DCD DPORT CY7C026V-AC 99122 9915 619908661 16K x 16 DP CMOS MN TQFP TAIWAN-G 100 48 48 48 119 417 468 0 0 0 150C/5.75V DCD FIFO CY7C4265-AC 99152 9914 619908289 16KX18 FIFO CMOS MN TQFP KOREA-Q 64 48 360 0 9915 619909123 16KX18 FIFO CMOS MN TQFP KOREA-Q 64 48 360 0 9917 619910128 16KX18 FIFO CMOS MN TQFP KOREA-Q 64 48 360 0 MR84089 9851 619811004 64K x16 CMOS MN SOJ CSPI-R 44 48 96 500 1000 149 149 149 149 0 1 EOS 0 0 0 MR91066 9901 619815482 512K x 8 CMOS MN SOJ CSPI-R 36 MR84088 9851 619811004 64K x16 CMOS MN SOJ CSPI-R 44 MPD COMDTY CY7C1021-VC CY7C1049-VCB 48 150 0 168 150 0 500 149 0 1000 149 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY7C1021-VC 336 45 0 MR91051 9851 619815548 64K x16 CMOS MN SOJ CSPI-R 44 336 45 0 CY7C1041-ZSC MR92026 9914 619908567 256K x 16 CMOS MN TSOP CSPI-R 44 336 1000 45 45 0 0 CY7C1049-VCB MR91065 9901 619815482 512K x 8 CMOS MN SOJ 36 336 45 0 Page 34 of 40 CSPI-R CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HTS 165C/NO BIAS MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1049-VCB No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- MR91065 9901 619815482 512K x 8 CMOS MN SOJ CSPI-R 36 1000 45 0 MR92077 9914 619905722 512K x 8 CMOS MN SOJ CSPI-R 36 336 1000 45 45 0 0 CY7C109-VC MR91072 9904 519901259 128K x 8(5) CMOS MN SOJ INDNS-O 32 336 1000 50 50 0 0 CY7C109-ZC MR92013 9908 619903670 128K x 8(5) CMOS MN TSOP PHIL-GW 32 336 1000 45 45 0 0 SYNC CY7C1011-ZC MR91086 9903 619815422 128K x 16 CMOS MN TSOP CSPI-R 44 336 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY7C1021-VC MR92043 9911 619816998 64K x16 CMOS MN SOJ CSPI-R 44 168 45 0 CY7C1041-ZSC MR92023 9914 619908567 256K x 16 CMOS MN TSOP CSPI-R 44 168 45 0 CY7C1049-VCB MR91062 9901 619815482 512K x 8 CMOS MN SOJ CSPI-R 36 168 45 1 1 Assembly Defect MR92074 9914 619905722 512K x 8 CMOS MN SOJ CSPI-R 36 168 45 0 MR91069 9904 519901259 128K x 8(5) CMOS MN SOJ INDNS-O 32 168 48 0 MR92116 9912 519905501 128K x 8(5) CMOS MN SOJ INDNS-O 32 168 45 0 CY7C109-ZC MR92010 9908 619903670 128K x 8(5) CMOS MN TSOP PHIL-GW 32 168 45 0 CY7C199-VC MR91153 9909 619901743 32K x 8(5V) CMOS MN SOJ ALPHA-X 28 168 45 0 MR91162 9913 619907915 32K x 8(5V) CMOS MN SOJ CSPI-R 28 168 39 0 MR91168 9905 619900850 32K x 8(5V) CMOS MN SOJ CSPI-R 28 168 44 0 MR91171 9906 619901240 32K x 8(5V) CMOS MN SOJ CSPI-R 28 168 50 0 MR91177 9907 619901334 32K x 8(5V) CMOS MN SOJ CSPI-R 28 168 49 0 MR91180 9912 619907459 32K x 8(5V) CMOS MN SOJ CSPI-R 28 168 50 1 1 Open- Bond Lift MR91189 9913 619907977 32K x 8(5V) CMOS MN SOJ CSPI-R 28 168 43 0 CY7C109-VC MR91243 9908 619901753 32K x 8(5V) CMOS MN SOJ ALPHA-X 28 168 44 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY7C1021-VC MR84086 9851 619811004 Page 35 of 64K x16 40 CMOS MN SOJ CSPI-R 44 300 45 0 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- SRAM/LOGIC-R42HD TC2 -65C TO 150C MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- COMDTY CY7C1041-ZSC MR92024 9914 619908567 256K x 16 CMOS MN TSOP CSPI-R 44 300 45 0 CY7C1049-VCB MR91063 9901 619815482 512K x 8 CMOS MN SOJ CSPI-R 36 300 45 0 MR92075 9914 619905722 512K x 8 CMOS MN SOJ CSPI-R 36 300 45 0 MR91154 9909 619901743 32K x 8(5V) CMOS MN SOJ ALPHA-X 28 300 45 0 MR91160 9914 619908641 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 44 0 MR91163 9913 619907915 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 51 0 MR91169 9905 619900850 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 45 0 MR91172 9906 619901240 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 48 0 MR91175 9906 619901277 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 43 0 MR91178 9907 619901334 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 45 0 MR91181 9912 619907459 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 48 0 CY7C199-VC MR91190 9913 619907977 32K x 8(5V) CMOS MN SOJ CSPI-R 28 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 36 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R42LD HTOL CY2211SC 98377 9923 619915605 CLOCK GEN. CMOS MN SOIC CSPI-R 24 28 CY2211ZC 99141 9919 619912991/ CLOCK GEN. CMOS MN TSOP PHIL-M 16 150C/3.8V CPD TTECH No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------48 48 210 300 0 0 48 100 0 48 300 0 48 300 0 48 300 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/3.8V CPD TTECH CY2211SC 98377 9915 619909813/ CLOCK GEN. CMOS MN SOIC CSPI-R 24 48 117 0 48 250 0 48 300 0 48 300 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CPD TTECH CY2211SC 98377 9915 619909813/ CLOCK GEN. CMOS MN SOIC CSPI-R 24 168 48 0 CY2211ZC 99141 9919 619912994 CLOCK GEN. CMOS MN TSOP PHIL-M 16 168 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C CPD TTECH CY2211SC 98377 9915 619909813/ CLOCK GEN. CMOS MN SOIC CSPI-R 24 300 48 0 CY2211ZC 99141 9919 619912994 CLOCK GEN. CMOS MN TSOP PHIL-M 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 37 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 DiviTechnology Test Test Condition sion ---------------- ------ ---------------- ----SRAM/LOGIC-R52H HTS 165C/NO BIAS MPD FuncAssembly ProWfr tion Device Eval# D/C Lot No Description cess Loc ----- --------------- ------- ---- ---------- ----------- ------ --COMDTY CY62128V-ZIB MR92033 9849 619815623 128K x 8 CMOS MN Pkg type ---TSOP Assy No Dura Qty Qty Loc Pin tion Test Fail Fail Mode ------- --- ---- ----- ---- ------------------------KOREA-GQ 32 336 45 0 1000 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY62128V-ZIB MR92030 9849 619815623 128K x 8 CMOS MN TSOP KOREA-GQ 32 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY62128V-ZIB MR92031 9849 619815623 128K x 8 CMOS MN TSOP KOREA-GQ 32 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 38 of 40 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R52LD HAST Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 140/3.63V MPD COMDTY CY62137VL-ZSIB 99075 9914 619907944 128K x 16 CMOS MN TSOP CSPI-R 44 128 48 0 140c/3.63V MPD COMDTY CY62137VL-ZSIB 99075 9910 619905577 128K x 16 CMOS MN TSOP CSPI-R 44 128 256 48 48 0 0 140C/3.63V MPD COMDTY CY62137VL-ZSIB 99075 9907 619903364 128K x 16 CMOS MN TSOP CSPI-R 44 150C/3.8V MPD COMDTY CY62137VL-ZSIB 99075 9907 619903364 128K x 16 CMOS MN TSOP CSPI-R 44 48 80 500 1505 405 405 0 0 1 1 Unknown Cause 9910 619905577 128K x 16 CMOS MN TSOP CSPI-R 44 48 80 500 1504 396 396 1 1 Unknown Cause 0 0 9907 619903364 128K x 16 CMOS MN TSOP CSPI-R 44 1000 2000 403 403 128 48 0 128 48 2 1 Topside Crack/1 Unknown 256 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75V MPD COMDTY CY62137VL-ZSIB 99075 0 1 EOS 0 9910 619905577 128K x 16 CMOS MN TSOP CSPI-R 44 1000 396 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY62137VL-ZSIB 99075 9907 619903364 128K x 16 CMOS MN TSOP CSPI-R 44 336 1000 47 47 0 0 9910 619905577 128K x 16 CMOS MN TSOP CSPI-R 44 336 48 0 1000 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/3.63V MPD COMDTY CY62137VL-ZSIB 99075 9907 619903364 128K x 16 CMOS MN TSOP CSPI-R 44 80 9 0 80 71 0 168 80 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL -30C/3.8V MPD COMDTY CY62137VL-ZSIB 99075 9907 619903364 128K x 16 CMOS MN TSOP CSPI-R 44 PCT 121C/100%RH MPD COMDTY CY62137VL-ZSIB 99075 9907 619903364 128K x 16 CMOS MN TSOP CSPI-R 44 500 45 0 1000 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------168 48 0 9910 619905577 128K x 16 CMOS MN TSOP CSPI-R 44 168 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY62137VL-ZSIB 99075 9907 619903364 Page 39 of 128K x 16 40 CMOS MN TSOP CSPI-R 44 300 48 0 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 2, 1999 Issued: 8/6/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 2, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R52LD TC2 -65C TO 150C MPD COMDTY CY62137VL-ZSIB 99075 9910 619905577 128K x 16 CMOS MN TSOP CSPI-R 44 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 40 of 40