Q2 - 1997

CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
QUARTER 2, 1997
PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION
Marc Hartranft
QA Engineering Department Manager
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
STANDARD STRESS TEST DESCRIPTIONS
TEST
DESCRIPTION
HTOL
HTOL2
HTSSL
HTSSL2
DRET
DRET2
PCT
HAST
TC
TC2
HTS
TEV
High Temp Op Life, 150ºC, 5.75V
High Temp Op Life, 125ºC, 5.75V
High Temp Steady State Life, 150ºC, 5.75V
High Temp Steady State Life, 125ºC, 5.75V
Data Retension Test, Data Bake 165ºC, Plastic
Data Retension Test, Data Bake 250ºC, Hermetic
Pressure Cooker Test, 121ºC, 100%RH, No Bias
Hi-Accel Saturation Test, 140ºC, 85%RH, 5.5V Bias
Temp Cycle, 125ºC to -40ºC
Temp Cycle, 150ºC to -65ºC
High Temp Storage, 165ºC, No Bias
Temperature Extreme Verification
Page 2 of 12
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
WAFER FAB AREAS
FAB #
LOCATION
CA
TX
MN
FR
San Jose, California
Round Rock, Texas
Bloomington, Minnesota
MHS, France
ASSEMBLY LOCATION
ID
COMPANY/LOCATION
KOREA-A
ASAT-B
USA-C
PHIL-D
USA-E
INDNS-F
TAIWAN-G
KOREA-H
MALAY-J
THLAND-K
KOREA-L
PHIL-M
USA-N
INDNS-O
USA-P
KOREA-Q
PHIL-R
USA-S
TAIWAN-T
MALAY-U
USA-V
USA-W
ALPHA-X
ALPHA-Y
THLAND-Z
Anam-Buchon/Korea
Asat/Hongkong
Cypress/USA
Dynesem/Philippines
Cypress-Minnesota/USA
Astra/Indonesia
ASE/Taiwan
Hyundai/Korea
ASE/Malaysia
TMS/Thailand
Anam-Seoul/Korea
Anam/Philippines
Express/USA
Omedata/Indonesia
Pantronix/USA
Anam-Bupyong/Korea
Cypress/Philippines
ATM/USA
OSE/Taiwan
Unisem/Malaysia
Aplus/USA
Toshiba/USA
Cypress Bangkok/Thailand
Alphatech/Thailand
Hana/Thailand
Page 3 of 12
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
DESCRIPTION OF DATA TABLE COLUMN HEADINGS
COLUMN HEADING
DESCRIPTION OF COLUMN CONTENTS
Division
Test
Test Condition
Device ID
Date Code
Lot Number
Function
Description
Technology
Process
Pkg Material
Pkg Type
Pkg Location
# Pins
Duration
# Test
# Failed
Fail Mode
Cypress Manufacturing Division
Common code for the stress performed. See table on previous page for detail.
Tem/humidity/bias condition for the stress. See table on previous for detail
Cypress part number
Week in which specific lot was marked/sealed/molded.
Manufacturing (assembly) lot number
Generic product family at Cypress
Brief description of device function
Fabrication process technology.
Generic fabrication process
Generic packaging material
Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package).
Country Location + Initial of assembly house (see table on prvious page for detail).
Pin cont of package in which device is assembled.
Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours.
Quantity of devices submitted to this stress/test.
Quantity of devices failing at this specific readpoint.
Failure analysis results from this test, if any.
Page 4 of 12
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 2, 1997
Prod
Assembly
Func- Descr
ProWfr Pkg Assy
No Dura Qty
Qty
line Test
Test Condition
Device
Eval# D/C Lot No
tion
Description Technology
cess
Loc type Loc
Pin tion Test Fail Fail Mode
----- ------ ---------------- --------------- ------ ---- ---------- ----- ----------- ---------------- ------ --- ---- ------- --- ---- ----- ---- ------------------------CPD
HAST
140C/5.5V
CY74FCT16827TPV 96475
4647440-SW FCT
10 BIT REG. SRAM/LOGIC-R3
CMOS
MN SSOP MALAY-U
56 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
CY74FCT16827TPV 96475
4647440-SW FCT
10 BIT REG. SRAM/LOGIC-R3
CMOS
MN SSOP MALAY-U
56
48
192
0
48
63
0
48
96
0
48
128
0
48
186
0
48
192
0
48
192
0
48
240
0
80
128
0
500
128
0
CY7C960-UMB
96512 9643 349612710 VME
BUS Inter. SRAM/LOGIC-L27
CMOS
MN TQFP USA-B
64
48
130
0
184
50
0
9704 349615989 VME
BUS Inter. SRAM/LOGIC-L27
CMOS
MN TQFP USA-B
64
48
130
0
48
130
0
500
80
0
9706 349700538 VME
BUS Inter. SRAM/LOGIC-L27
CMOS
MN TQFP USA-B
64
48
130
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CY7C611A-NC
M71041 9645 349613552 VME
RISC CONTRL SRAM/LOGIC-L20
CMOS
TX PQFP HK-B
160 336
80
0
1000
80
0
VIC068A-AC
M71044 9650 349615349 VME
VME INTERF. SRAM/LOGIC-C2AN CMOS
MN TQFP HK-B
144 336
80
7 7 LIFTING BOND/S
VIC068A-BC
M64039 9636 349610885 VME
VME INTERF. SRAM/LOGIC-C2AN CMOS
MN PPGA PHIL-M
144 336
78
0
1000
78
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.75V
CY74FCT16827TPV 96475
4647440-SW FCT
10 BIT REG. SRAM/LOGIC-R3
CMOS
MN SSOP MALAY-U
56
80
78
0
168
78
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY7C611A-NC
M71042 9645 349613552 VME
RISC CONTRL SRAM/LOGIC-L20
CMOS
TX PQFP HK-B
160 168
80
0 42 EXTERNAL CONTAMINATION
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
CY7C960-UMB
96512 9704 349615989 VME
BUS Inter. SRAM/LOGIC-L27
CMOS
MN TQFP USA-B
64 100
50
0
1000
50
0
-65C TO 150C
CY2260PVC
97121 9706 619700255 TTECH CLOCK SYN. SRAM/LOGIC-L27
CMOS
MN SOIC CSPI-R
28 300
50
0
300
50
0
1000
50
0
1000
50
0
CY74FCT16827TPV 96475
4647440-SW FCT
10 BIT REG. SRAM/LOGIC-R3
CMOS
MN SSOP MALAY-U
56 300
45
0
SRAM/LOGIC-R3
CMOS
MN SSOP MALAY-U
56 1000
45
0
CY7C611A-NC
M71040 9645 349613552 VME
RISC CONTRL SRAM/LOGIC-L20
CMOS
TX PQFP HK-B
160 300
50
2 2 TOPSIDE CRACKS
VIC068A-AC
M71043 9650 349615349 VME
VME INTERF. SRAM/LOGIC-C2AN CMOS
MN TQFP HK-B
144 300
50
0
1000
49
0
VIC068A-BC
M71039 9702 349615489 VME
VME INTERF. SRAM/LOGIC-C2AN CMOS
MN PPGA PHIL-M
144 300
50
0
1000
48
1 1 UNKNOWN
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 5 of 12
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 2, 1997
Prod
Assembly
Func- Descr
ProWfr Pkg Assy
No Dura Qty
Qty
line Test
Test Condition
Device
Eval# D/C Lot No
tion
Description Technology
cess
Loc type Loc
Pin tion Test Fail Fail Mode
----- ------ ---------------- --------------- ------ ---- ---------- ----- ----------- ---------------- ------ --- ---- ------- --- ---- ----- ---- ------------------------DCD
HAST
140C/5.5V
CY7C136-JC
M72026 9717 349701709 SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN PLCC PHIL-M
52 128
80
0
CY7C955-NC
97105 9649 349614873 CHNL
TRANSCEIVER SRAM/LOGIC-L27
CMOS
MN PQFP KOREA-Q 128 128
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
CY7C131-JC
97154 9711 349701602L SPCM
1K x 8 DP
SRAM/LOGIC-R28
CMOS
MN PLCC PHIL-M
52
48
412
0
CY7C136-JC
97139 9705 349701602 SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN PLCC PHIL-M
52
48
342
0
9710 349700387 SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN PLCC PHIL-M
52
48
334
0
9711 349701448 SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN PLCC PHIL-M
52
48
334
0
97154 9712 349701709L SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN PLCC PHIL-M
52
48
438
0
349701725L SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN PLCC PHIL-M
52
48
432
0
CY7C146-JC
97154 9710 349701448L SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN PLCC PHIL-M
52
48
208
0
CY7C433-DMB
97218 9619 219608526 SPCM
4Kx9 FIFO
SRAM/LOGIC-R28
CMOS
MN CERD ALPHA-X
28
48 1008
0
SRAM/LOGIC-R28
CMOS
MN CERD ALPHA-X
28
80
210
0
500
210
0
184
49
0
CY7C457-JC
96302 9618 349605637 SPCM
2Kx18 FIFO SRAM/LOGIC-R28
CMOS
MN PLCC KOREA-A
52
48
700
0
48
800
0
80
205
0
500
205
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/6.50V
CY7C955-NC
97105 9705 349700256 CHNL
TRANSCEIVER SRAM/LOGIC-L27
CMOS
MN PQFP KOREA-Q 128
48
311
0
48
442
0
48
485
0
80
120
0
125C/6.5V
CY7C955-NC
97105 9705 349700256 CHNL
TRANSCEIVER SRAM/LOGIC-L27
CMOS
MN PQFP KOREA-Q 128 500
120
0 2 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.50V
CY7C955-NC
97105 9645 349613627 CHNL
TRANSCEIVER SRAM/LOGIC-L27
CMOS
MN PQFP KOREA-L 128
80
80
0
168
80
0
150C/5.75V
CY7C433-DMB
97218 9619 219608526 SPCM
4Kx9 FIFO
SRAM/LOGIC-R28
CMOS
MN CERD ALPHA-X
28
80
138
0
28 168
138
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY7C136-JC
M72027 9717 349701709 SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN PLCC PHIL-M
52
96
80
0
168
80
0
CY7C4245-AC
M72060 9703 349700347 SPCM
4Kx18 FIFO SRAM/LOGIC-R28
CMOS
MN TQFP KOREA-Q
64
96
80
0
168
80
0
CY7C4265-JC
M71011 9642 349612938 SPCM
16KX18 FIFO SRAM/LOGIC-R30
CMOS
CA PLCC PHIL-M
68
96
80
0
168
80
8 8 TOPSIDE CRACKS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
CY7C433-DMB
97218 9619 219608526 SPCM
4Kx9 FIFO
SRAM/LOGIC-R28
CMOS
MN CERD ALPHA-X
28 1000
48
0
-65C TO 150C
CY7C136-JC
M72025 9717 349701709 SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN PLCC PHIL-M
52 300
47
0
CY7C4265-JC
M71009 9642 349612938 SPCM
16KX18 FIFO SRAM/LOGIC-R30
CMOS
CA PLCC PHIL-M
68 300
50
1 1 TOPSIDE CRACKS
1000
49
0
CY7C955-NC
97105 9649 349614873 CHNL
TRANSCEIVER SRAM/LOGIC-L27
CMOS
MN PQFP KOREA-Q 128 300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 6 of 12
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 2, 1997
Prod
line Test
Test Condition
----- ------ ---------------MPD
HAST
130C/3.3V
140C/3.6V
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------100 128
80
0
28 128
50
0
28 128
47
0
140C/5.5V
28 128
50
0
28 128
90
0
256
90
0
CY62256V-ZC
M71028 9648 349614698 COMDTY 32K x 8
SRAM/LOGIC-R3
CMOS
CA TSOP PHIL-M
28 128
25
1 1 UNKNOWN
128
29
0 24 EOS
CY7C1009-VC
97172
619702133 COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
32 128
45
0
M72038 9710 349701371 COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN SOJ TAIWN-G
32 128
78
0
CY7C1020-VC
97044 9712 619701268 COMDTY 32K x16
SRAM/LOGIC-R3
CMOS
MN SOJ TAIWN-G
44 128
48
0
CY7C109-VC
96302 9626 349608918 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ KOREA-L
32 128
48
0
CY7C109-ZC
M71025 9640 349612511 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP KOREA-L
32 128
11
0 1 EOS
128
69
0 2 EOS
CY7C1335-AC
97227
619702650 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP CSPI-R
100 128
43
0
619702652 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP CSPI-R
100 128
44
0
CY7C199-15VC
M71067 9640 219613420 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28 128
80
0
CY7C199-SI
M71037 9652 219616036 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOIC ALPHA-X
28 128
80
2 2 METAL/POLY SHORTS
CY7C199-VC
96302 9617 219606653 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28 128
46
0
M71061 9704 619700148 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28 128
6
1 1 TOP SIDE DEFECT
128
72
25 25 TOP SIDE DEFECT
M72005 9716 619702338 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28 128
80
0
CY7C199-ZC
97098 9707 349700963 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP PHIL-M
28 128
43
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.80V
CY62256V-VC
97132 9706 519701211 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28
80
540
0
500
540
0
150C/3.90V
CY62256V-VC
97132 9704 519700560 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28
80
522
0
500
522
0
1000
522
0
2000
522
0
150C/4.60V
CY7C1399-VC
96423 9650 219615780 SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
MN SOJ ALPHA-X
28
80
125
0
500
125
0
150C/5.75V
CY62256-SNC
97095 9710 519702461D COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28 500
255
0
519702512 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28 500
255
0
97162 9711 519702761D COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28
48 1144
0
519702921D COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28
48 1186
0
9712 519702974D COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28
48 1217
0
CY62256-VC
97132 9705 519701274 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28
80
540
0
500
540
1 1 UNKNOWN
CY7C1020-VC
97044 9712 619701268 COMDTY 32K x16
SRAM/LOGIC-R3
CMOS
MN SOJ TAIWN-G
44
80
118
0
500
118
0
CY7C109-VC
96302 9626 349608918 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ KOREA-L
32
48
506
0
80
120
0
500
120
0
97251 9723 519705986D COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
761
0
519706004D COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
775
0
519706010D COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
786
0
9724 519706278D COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
48
765
0
Device
--------------CY7C1335-AC
CY62256V-VC
CY7C1399-VC
CY62256-VC
CY62256V-VC
Eval#
-----M72041
97132
96423
97132
97132
D/C
---9710
9706
9650
9705
9704
Assembly
Lot No
---------619701129
519701211
219615780
519701274
519700560
Function
----SYNCHR
COMDTY
SYNCHR
COMDTY
COMDTY
Descr
Description
----------32K x 32
32K x 8
32K x 8
32K x 8
32K x 8
Technology
---------------SRAM/LOGIC-R33
SRAM/LOGIC-R32
SRAM/LOGIC-R31
SRAM/LOGIC-R32
SRAM/LOGIC-R32
Page 7 of 12
Process
-----CMOS
CMOS
CMOS
CMOS
CMOS
Wfr
Loc
--MN
MN
MN
MN
MN
Pkg
type
---TQFP
SOJ
SOJ
SOJ
SOJ
Assy
Loc
------TAIWAN-G
INDNS-O
ALPHA-X
INDNS-O
INDNS-O
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 2, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---MPD
HTOL
150C/5.75V
CY7C185-VC
97236 9646
9719
9720
97237 9646
9715
9719
9720
CY7C199-VC
96302 9617
Assembly
Lot No
---------219614640
619702794N
619702545N
219614640
619701704
619702794N
619702545N
219606653
Function
----COMDTY
COMDTY
COMDTY
COMDTY
COMDTY
COMDTY
COMDTY
COMDTY
Descr
Description
----------SML/64K
SML/64K
SML/64K
SML/64K
SML/64K
SML/64K
SML/64K
32K x 8
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------28
48 1508
0
28
48 1581
0
28
48 1515
0
28
48 1508
0
28
48 1180
0
28
48 1581
0
28
48 1515
0
28
48
513
0
80
116
0
500
116
0
97126
619700447 COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN SOJ CSPI-R
28 500
167
0
500
167
0
9709 619700447L COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN SOJ CSPI-R
28
80
15
0
80
15
0
80
103
0
80
103
0
500
15
0
500
15
0
500
103
0
500
103
0
97204 9716 619701965N COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN SOJ CSPI-R
28
48
504
0
CY7C199-ZC
97204 9714 349701876L COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN TSOP PHIL-M
28
48
467
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V
CY7C109-VC
M71070 9703 519700412 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
96
120
0
500
120
0
1000
120
0
2000
118
0 29 EOS
CY7C199-15VC
M64048 9639 619600540 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
28
96
120
0
500
120
0
1000
120
0
2000
119
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CY62256V-VC
97132 9704 519700560 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28 336
48
0
1000
48
0
CY7C1335-AC
97227
619702650 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP CSPI-R
100 336
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/3.60V
CY7C1399-VC
96423 9650 219615780 SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
MN SOJ ALPHA-X
28
80
77
0
168
77
0
150C/3.63V
CY62256V-VC
97132 9706 519701211 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28
80
162
0
168
162
0
150C/3.90V
CY62256V-VC
97132 9704 519700560 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28 168
152
0
150C/5.50
CY62256-VC
97132 9705 519701274 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28 168
162
0
150C/5.50V
CY62256-VC
97132 9705 519701274 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28
80
162
0
150C/5.75V
CY62256-SNC
97095 9710 519702461D COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28 168
155
0
519702512 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28 168
155
1 1 UNKNOWN
CY62256V-VC
97132 9704 519700560 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28
80
152
0
CY7C1020-VC
97044 9712 619701268 COMDTY 32K x16
SRAM/LOGIC-R3
CMOS
MN SOJ TAIWN-G
44
80
78
0
168
78
0
Technology
---------------SRAM/LOGIC-R28
SRAM/LOGIC-R28
SRAM/LOGIC-R28
SRAM/LOGIC-R28
SRAM/LOGIC-R28
SRAM/LOGIC-R28
SRAM/LOGIC-R28
SRAM/LOGIC-R28
Page 8 of 12
Process
-----CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
Wfr
Loc
--MN
MN
MN
MN
MN
MN
MN
MN
Pkg
type
---SOJ
SOJ
SOJ
SOJ
SOJ
SOJ
SOJ
SOJ
Assy
Loc
------ALPHA-X
CSPI-R
CSPI-R
ALPHA-X
CSPI-R
CSPI-R
CSPI-R
ALPHA-X
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 2, 1997
Prod
Assembly
Func- Descr
ProWfr Pkg Assy
No Dura Qty
Qty
line Test
Test Condition
Device
Eval# D/C Lot No
tion
Description Technology
cess
Loc type Loc
Pin tion Test Fail Fail Mode
----- ------ ---------------- --------------- ------ ---- ---------- ----- ----------- ---------------- ------ --- ---- ------- --- ---- ----- ---- ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------MPD
HTSSL2 125C/5.75V
CY7C109-VC
M71071 9703 519700412 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
96
120
0
500
120
0
1000
120
0
2000
120
0
CY7C199-VC
M71059 9704 619700148 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28
96
120
0
500
120
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL
-30C/6.5V
CY62256-VC
97132 9705 519701274 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28 500
52
0
500
52
0
1000
52
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY62256V-ZC
M71029 9648 349614698 COMDTY 32K x 8
SRAM/LOGIC-R3
CMOS
CA TSOP PHIL-M
28 168
79
10 10 TOPSIDE CRACKS
CY7C109-VC
M71074 9703 519700412 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ INDNS-O
32
96
78
0
168
78
0 8 EXTERNAL CONT.
288
70
0
CY7C186-ZC
M72030 9713 619701453 COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX TSOP KOREA-Q
32
96
78
0
168
78
0
CY7C199-VC
M72033 9715 219703386 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28
96
77
0
168
77
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
CY7C1009-VC
97172
619702133 COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
32 100
45
0
200
45
0
CY7C1335-AC
97227
619702650 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP CSPI-R
100 100
45
0
200
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CY62256-NSC
M71063 9647 519614048 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN NSOI INDNS-O
28 300
50
0
1000
50
0
CY62256-VC
97132 9705 519701274 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28 300
48
0
1000
48
0
CY62256V-VC
97132 9704 519700560 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28 300
88
0
1000
88
0
9706 519701211 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ INDNS-O
28 300
46
0
1000
46
0
CY7C1009-VC
97172
619702133 COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
32 300
45
0
619702134 COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
32 300
45
0
619702191 COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN SOJ CSPI-R
32 300
45
0
CY7C1020-VC
97044 9712 619701268 COMDTY 32K x16
SRAM/LOGIC-R3
CMOS
MN SOJ TAIWN-G
44 300
48
0
CY7C109-VC
96302 9626 349608918 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ KOREA-L
32 300
48
0
CY7C109-ZC
M71024 9640 349612511 COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP KOREA-L
32 300
50
0
CY7C1335-AC
97227
619702650 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP CSPI-R
100 300
45
0
619702651 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP CSPI-R
100 300
38
0
619702652 SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP CSPI-R
100 300
28
0
CY7C1399-VC
96423 9650 219615780 SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
MN SOJ ALPHA-X
28 300
47
0
1000
47
0
M71086 9701 619601664 SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
CA SOJ CSPI-R
28 300
48
0
CY7C186-ZC
M71088 9651 349615740 COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX TSOP KOREA-Q
32 300
97
0
CY7C199-VC
96302 9617 219606653 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ ALPHA-X
28 300
48
0
Page 9 of 12
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 2, 1997
Prod
line Test
Test Condition
Device
Eval#
----- ------ ---------------- --------------- -----MPD
TC2
-65C TO 150C
CY7C199-VC
96302
M72004
Dura Qty
Qty
tion Test Fail Fail Mode
---- ----- ---- ------------------------1000
48
0
300
50
0
1000
50
0
CY7C199-ZC
97098 9707 349700963 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP PHIL-M
28 300
47
0
300
48
0
300
48
0
1000
47
0
1000
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
CY62256-SNC
M72079 9721 519705680 COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA NSOI INDNS-O
28
-5
120
0
25
120
0
85
120
0
CY7C1031-JC
M72019 9718 519704043 SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN PLCC INDNS-O
52
-5
118
0
25
118
0
85
116
0
CY7C1399-ZI
M72051 9704 349700156 SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
CA TSOP PHIL-M
28
-5
114
0
25
114
0
85
114
0
CY7C199-VC
M72001 9716 619702338 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28
-5
120
0
25
120
0
85
120
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------D/C
---9617
9716
Assembly
Lot No
---------219606653
619702338
Function
----COMDTY
COMDTY
Descr
Description
----------32K x 8
32K x 8
Technology
---------------SRAM/LOGIC-R28
SRAM/LOGIC-R28
Page 10 of 12
Process
-----CMOS
CMOS
Wfr
Loc
--MN
MN
Pkg
type
---SOJ
SOJ
Assy
Loc
------ALPHA-X
PHIL-M
No
Pin
--28
28
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 2, 1997
Prod
line Test
Test Condition
Device
Eval# D/C
----- ------ ---------------- --------------- ------ ---NMD
DRET
165C/NO BIAS
CY27H512-JC
M71020 9651
Assembly
Lot No
---------219615860
Function
----PROM
Descr
Description Technology
----------- ---------------64K x 8
FAMOS-P26
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32 168
46
0
1000
46
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
140C/5.5V
CY27C010-PC
M71022 9702 349616299 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32 128
32
0
128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.75V
CY27H512-JC
M71016 9651 219615860 PROM
64K x 8
FAMOS-P26
CMOS
TX PLCC ALPHA-X
32
96
118
0
500
118
0
1000
118
0
2000
118
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY27C010-PC
M72013 9707 349700791 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32
96
78
0
168
78
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
CY27C512-WC
M71012 9643 219614017 PROM
64K x 8
FAMOS-P26
CMOS
TX WCER ALPHA-X
28 100
50
0
CY27H010-WC
M71013 9652 219616133 PROM
128K x 8
FAMOS-P26
CMOS
TX WCER ALPHA-X
32 100
50
0
1000
50
0
-65C TO 150C
CY27C010-PC
M72014 9707 349700791 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32 300
48
0
1000
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
CY27C010-PC
M72008 9707 349700791 PROM
128K x 8
FAMOS-P26
CMOS
TX PDIP KOREA-H
32
-5
119
0
25
119
0
85
119
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 11 of 12
Process
-----CMOS
Wfr
Loc
--TX
Pkg
type
---PLCC
Assy
Loc
------ALPHA-X
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 2, 1997
Issued: 7/15/97
Cypress Semiconductor Corporation
Quarterly Reliability report
Quarter 2, 1997
Prod
Assembly
Func- Descr
ProWfr Pkg Assy
No Dura Qty
Qty
line Test
Test Condition
Device
Eval# D/C Lot No
tion
Description Technology
cess
Loc type Loc
Pin tion Test Fail Fail Mode
----- ------ ---------------- --------------- ------ ---- ---------- ----- ----------- ---------------- ------ --- ---- ------- --- ---- ----- ---- ------------------------PPD
DRET2 250C/NO BIAS
CY7C374I-YMB
97127 9712 219702728 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX CLCC ALPHA-X
84
96
81
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
140C/5.5V
CY7C374I-JC
97127 9707 219701614 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC ALPHA-X
84 128
23
0
128
25
0
CY7C384A-JC
96302 9628 219610501 FPGA
2K GATE
FAMOS-VL26D
CMOS
TX PLCC ALPHA-X
84 128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
CY7C344-WMB
97239 9719 219704467 MAX
REPROG.PAL FAMOS-P20
CMOS
TX WCER ALPHA-X
28
81
168
0
9720 219704725 MAX
REPROG.PAL FAMOS-P20
CMOS
TX WCER ALPHA-X
28
81
158
0
9721 219705133 MAX
REPROG.PAL FAMOS-P20
CMOS
TX WCER ALPHA-X
28
81
172
0
CY7C372I-YMB
96472 9704 219700639 FLASH 64-MCEL FL FLASH-FL28D
CMOS
TX CLCC ALPHA-X
44 184
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/6.50V
CY7C374I-JC
97127 9707 219701614 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC ALPHA-X
84
48
79
0
80
79
0
500
79
0
9712 219702747 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC ALPHA-X
84
12
495
0
48
494
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY7C374I-JC
M71079 9643 349613266 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-A
84
96
77
1 1 UNKNOWN
168
76
0
288
76
0 1 EOS
CY7C375I-AC
M71089 9706 349701025 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX TQFP TAIWAN-G 160 168
78
0 9 EXTERNAL CONTAMINATION
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CY7C374I-JC
M71080 9643 349613266 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC KOREA-A
84 300
47
0
1000
47
0
CY7C375U-AC
M71091 9652 349615541 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX TQFP KOREA-Q 160 300
47
0
1000
47
0
CY7C384A-JC
96302 9628 219610501 FPGA
2K GATE
FAMOS-VL26D
CMOS
TX PLCC ALPHA-X
84 300
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
CY7C374I-JC
M72044 9715 219703283 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC ALPHA-X
84
-5
118
0
25
118
0
85
118
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 12 of 12