CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 1999 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 STANDARD STRESS TEST DESCRIPTIONS TEST DESCRIPTION HTOL HTOL2 HTSSL HTSSL2 DRET DRET2 PCT HAST TC TC2 HTS High Temp Op Life, 150ºC, Dynamic 115% Vcc Nominal High Temp Op Life, 125ºC, Dynamic 115% Vcc Nominal High Temp Steady State Life, 150ºC, Static 115% Vcc Nominal High Temp Steady State Life, 125ºC, Static 115% Vcc Nominal Data Retension Test, Data Bake 165ºC, Plastic Data Retension Test, Data Bake 250ºC, Hermetic Pressure Cooker Test, 121ºC, 100%RH, No Bias Hi-Accel Saturation Test, 140ºC, 85%RH, Static 100% Vcc Nominal Temp Cycle, 125ºC to -40ºC Temp Cycle, 150ºC to -65ºC High Temp Storage, 165ºC, No Bias Page 2 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 WAFER FAB AREAS FAB # LOCATION CA TX MN San Jose, California Round Rock, Texas Bloomington, Minnesota ASSEMBLY LOCATION ID COMPANY/LOCATION KOREA-A ASAT-B USA-C PHIL-D USA-E INDNS-F TAIWAN-G KOREA-H MALAY-J THLAND-K KOREA-L PHIL-M USA-N INDNS-O USA-P KOREA-Q PHIL-R USA-S TAIWAN-T MALAY-U USA-V USA-W ALPHA-X ALPHA-Y THLAND-Z Anam-Buchon/Korea Asat/Hongkong Cypress/USA Dynesem/Philippines Cypress-Minnesota/USA Astra/Indonesia ASE/Taiwan Hyundai/Korea ASE/Malaysia TMS/Thailand Anam-Seoul/Korea Anam/Philippines Express/USA Omedata/Indonesia Pantronix/USA Anam-Bupyong/Korea Cypress/Philippines ATM/USA OSE/Taiwan Unisem/Malaysia Aplus/USA Toshiba/USA Cypress Bangkok/Thailand Alphatech/Thailand Hana/Thailand Page 3 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 DESCRIPTION OF DATA TABLE COLUMN HEADINGS COLUMN HEADING DESCRIPTION OF COLUMN CONTENTS Division Test Test Condition Device ID Date Code Lot Number Function Description Technology Process Pkg Material Pkg Type Pkg Location # Pins Duration # Test # Failed Fail Mode Cypress Manufacturing Division Common code for the stress performed. See table on previous page for detail. Tem/humidity/bias condition for the stress. See table on previous for detail Cypress part number Week in which specific lot was marked/sealed/molded. Manufacturing (assembly) lot number Generic product family at Cypress Brief description of device function Fabrication process technology. Generic fabrication process Generic packaging material Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package). Country Location + Initial of assembly house (see table on prvious page for detail). Pin cont of package in which device is assembled. Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours. Quantity of devices submitted to this stress/test. Quantity of devices failing at this specific readpoint. Failure analysis results from this test, if any. Page 4 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 RELIABILITY DATA SUMMARY (Q199) LONG TERM FAILURE RATE SUMMARY PROCESS DEVICE HOURS 125C 150C FAILED 68,832 240,000 TOTAL @ 150C 147,072 0 0 0 0 0 445,224 956,500 757,043 0 BICMOS TOTAL 0 240,000 78,240 0 LFR TOTAL 514,056 1,436,500 982,355 0 FAMOS TOTAL FLASH TOTAL SRAM/LOGIC TOTAL FAILURE MODE * EARLY FAILURE RATE SUMMARY PROCESS 1,167 UNITS TESTED 125C 124 0 150C FAMOS TOTAL FAILED FAILURE MODE TOTAL 1,291 0 0 0 0 16,807 12,182 28,989 3 BICMOS TOTAL 0 0 0 0 EFR TOTAL 17,974 12,306 30,280 3 1 BLOCKED CONTACT, 1 DELAMINATION AT OXIDE, 1 LOST UNIT FAILED FAILURE MODE FLASH TOTAL SRAM/LOGIC TOTAL 1 BLOCKED CONTACT, 1 DELAMINATION AT OXIDE, 1 LOST UNIT HTSSL FAILURE RATE SUMMARY PROCESS DEVICE HOURS 125C 150C FAMOS TOTAL 0 TOTAL* @ 150C 0 0 FLASH TOTAL 0 0 0 0 13,440 239,096 91,385 0 0 60,000 19,560 0 13,440 299,096 110,945 0 SRAM/LOGIC TOTAL BICMOS TOTAL HTSSL TOTAL 0 TEMP CYCLE FAILURE RATE SUMMARY PROCESS 0 15,000 0 15,000 0 354,300 43,200 365,532 1 BICMOS TOTAL 0 0 0 0 TC TOTAL 423,200 43,200 434,432 1 FLASH TOTAL SRAM/LOGIC TOTAL * FAILED TOTAL* @ 150C 0 53,900 FAMOS TOTAL 150C 53,900 DEVICE CYCLE 125C FAILURE MODE 1 DIE CRACKING 1 DIE CRACKING Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress condition. Page 5 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 RELIABILITY DATA SUMMARY (Q199) HAST FAILURE RATE SUMMARY PROCESS DEVICE HOURS 130C 140C FAILED TOTAL* @ 140C 0 0 FAMOS TOTAL 0 FLASH TOTAL 0 5,632 2,991 0 99,584 24,832 112,770 9 0 0 0 0 99,584 30,464 115,760 9 SRAM/LOGIC TOTAL BICMOS TOTAL HAST TOTAL 0 LTOL FAILURE RATE SUMMARY DEVICE HOURS FAILED 0 0 PROCESS FAMOS TOTAL FLASH TOTAL SRAM/LOGIC TOTAL BICMOS TOTAL LTOL TOTAL 0 0 47,000 0 0 0 47,000 0 PCT FAILURE RATE SUMMARY DEVICE HOURS FAILED 14,400 0 PROCESS FAMOS TOTAL FLASH TOTAL 7,392 0 200,808 2 BICMOS TOTAL 0 0 PCT TOTAL 222,600 2 SRAM/LOGIC TOTAL PROCESS FAMOS TOTAL DRET FAILURE RATE SUMMARY PLASTIC (165C) HERMETIC(250C) DHR REJ DHR REJ 0 0 0 0 FLASH TOTAL 0 0 0 0 SRAM/LOGIC TOTAL 0 0 0 0 BICMOS 0 0 0 0 0 0 0 0 DRET TOTAL Page 6 of 28 FAILURE MODE 1 TOPSIDE DEFECT/1 TOPSIDE CRACK/1 PINHOLES IN TOPSIDE/4 ASSEMBLY DEFECT/1OPEN BOND LIFT/1 UNKNOWN 1 TOPSIDE DEFECT/1 TOPSIDE CRACK/1 PINHOLES IN TOPSIDE/4 ASSEMBLY DEFECT/1OPEN BOND LIFT/1 UNKNOWN FAILURE MODE FAILURE MODE 1 UNKNOWN/1 OPEN BOND LIFT 1 UNKNOWN/1 OPEN BOND LIFT FAILURE MODE CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- BICMOS-SM1 CY7B991-JC HTOL2 125C/5.75V DCD CHNL M84015 9838 219806615 PSCB BiCMOS TX PLCC ALPHA-X No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------32 500 120 0 1000 120 0 2000 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V DCD CHNL CY7B991-JC M84016 9838 219806615 PSCB BiCMOS TX PLCC ALPHA-X 32 96 120 0 500 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 7 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- FAMOS-E3 HTOL 150C/5.75V PLD 37K CY37192P44-JC 98405 9851 619816688 64 MCEL CMOS TW PLCC KOREA-A 44 48 125 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V PLD 37K CY37128P84-JC 98404 9850 619816468 128 MCEL CMOS TW PLCC KOREA-A 84 48 61 0 2 EOS 48 63 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH PLD 37K CY37128P84-JC 98404 9850 619816468 128 MCEL CMOS TW PLCC KOREA-A 84 168 50 0 288 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C PLD 37K CY37128P84-JC 98404 9850 619816468 128 MCEL CMOS TW PLCC KOREA-A 84 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 8 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- FAMOS-P20 HTOL 150C/5.75V PLD MAX CY7C346-RMB 98369 9842 219807311 REPROG.PAL CMOS TX WPGA ALPHA-X 100 184 8 0 184 40 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V PLD MAX CY7C341-JC M84040 9843 619812108 REPROG.PAL CMOS TX PLCC KOREA-A 84 TC2 -65 TO 150C PLD MAX CY7C346-RMB 98369 9842 219807311 REPROG.PAL CMOS TX WPGA ALPHA-X 100 500 120 0 1000 120 0 2000 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------100 47 0 -65C TO 150C PLD MAX CY7C341-JC M84038 9843 619812108 REPROG.PAL CMOS TX PLCC KOREA-A 84 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 9 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- FAMOS-P26 CY7C63413-PC HTOL 150C/5.75V CPD USB 98365 9848 519815333/ USB CMOS TX PDIP INDNS-O No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------40 48 48 330 712 0 0 MPD PROM CY27H010-WMB 98366 9840 619810906 128K x 8 CMOS TX WCER PHIL-AS 32 80 120 0 500 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65 TO 150C MPD PROM CY27H010-WMB 98366 9840 619810906 128K x 8 CMOS TX WCER PHIL-AS 32 100 48 0 -65C TO 150C CPD USB CY7C63101A-SC MR84015 9837 619810677 USB CMOS TX SOIC CSPI-R 24 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 10 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- FLASH-FL28D CY7C375I-AC 160 HAST 130C/5.5V PLD FLASH M84029 9839 619811116 128 MCEL FL CMOS TX TQFP KOREA-Q 77 7 0 128 8 0 128 16 0 128 20 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C PLD FLASH CY7C371I-JC M99103 9901 219900163 32-MCEL FL CMOS TX PLCC ALPHA-X 44 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 11 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-L27 PCT 121C/100%RH CPD FCT CY74FCT162827TP MR91042 9852 619817458 10 BIT REG. CMOS MN SSOP CSPI-R 56 168 44 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 12 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-L28 HAST 130C/5.5V CPD FCT CY74FCT543TSOC 99034 9848 619815038 140C/3.63 CPD TTECH CY2280PVC MR84025 9821 619805614 CLOCK SYN. 140C/3.63V CPD TTECH CY22751PVC M83019 9804 619800309 150C/3.8V CPD TTECH CY2287PVC 150C/5.75V CPD FCT CY74FCT543TSOC No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- BUS SWITCH CMOS TX SOIC CSPI-R 24 128 256 48 48 0 0 9851 619817238/ BUS SWITCH CMOS TX SOIC CSPI-R 24 128 50 0 CMOS MN SSOP CSPI-R 48 128 44 0 CLOCK SYN. CMOS MN SSOP CSPI-R 48 98333 9847 619814987/ CLOCK SYN. CMOS TX SSOP CSPI-R 56 48 48 48 48 80 120 300 300 300 120 0 0 0 0 0 99034 9848 619815038 BUS SWITCH CMOS TX SOIC CSPI-R 24 48 80 184 500 524 524 118 118 0 0 0 0 9851 619817235/ BUS SWITCH CMOS TX SOIC CSPI-R 24 48 80 500 340 118 118 0 0 0 619817238/ BUS SWITCH CMOS TX SOIC CSPI-R 24 48 80 500 340 119 119 0 0 0 128 9 0 128 67 0 2 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL DCD VME CY7C960-UMB 98461 9839 619810095 BUS Inter. CMOS TX CQFP USA-V 64 80 78 0 2 EOS 184 47 0 500 76 0 2 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V DCD VME CY7C960-NC 98461 9831 619808580/ BUS Inter. CMOS TX PQFP HK-B 64 96 405 0 96 600 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS CPD FCT CY74FCT543TSOC 99034 9848 619815038 BUS SWITCH CMOS TX SOIC CSPI-R 24 HTSSL 150C/5.5V CPD FCT CY74FCT543TSOC 99034 9848 619815038 BUS SWITCH CMOS TX SOIC CSPI-R 24 336 48 0 1000 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------80 80 0 168 80 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 13 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-L28 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- LTOL -30C/6.50V CPD FCT CY74FCT543TSOC 99034 9848 619815038 BUS SWITCH CMOS TX SOIC CSPI-R 24 500 47 0 1000 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH CPD FCT CY74FCT543TSOC 99034 9848 619815038 BUS SWITCH CMOS TX SOIC CSPI-R 24 168 288 48 48 0 0 TTECH CY2280PVC MR84023 9821 619805614 CLOCK SYN. CMOS MN SSOP CSPI-R 48 168 79 0 CY2287PVC 98333 9847 619814987/ CLOCK SYN. CMOS TX SSOP CSPI-R 56 168 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65 TO 150C DCD VME CY7C960-UMB 98461 9839 619810095 BUS Inter. CMOS TX CQFP USA-V 64 100 46 0 -65C TO 150C CPD FCT CY74FCT543TSOC 99034 9822 619805959/ BUS SWITCH CMOS TX SOIC CSPI-R 24 300 48 0 9823 619806310/ BUS SWITCH CMOS TX SOIC CSPI-R 24 300 47 0 9848 619815038 BUS SWITCH CMOS TX SOIC CSPI-R 24 300 48 0 9851 619817238/ BUS SWITCH CMOS TX SOIC CSPI-R 24 300 50 0 TTECH CY2287PVC 98333 9847 619814987/ CLOCK SYN. CMOS TX SSOP CSPI-R 56 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 14 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-L31 PCT 121C/100%RH CPD FCT CY74FCT162245AT MR84006 9833 619809457 16 BIT TRAN CMOS MN SSOP CSPI-R 48 168 79 0 1 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 15 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R21 Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- HTOL 150C/5.75V MPD COMDTY CY7C199-DMB 98366 9837 619810589 32K x 8 CMOS TX CERD PHIL-AS 28 80 116 0 500 116 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65 TO 150C MPD COMDTY CY7C199-DMB 98366 9837 619810589 32K x 8 CMOS TX CERD PHIL-AS 28 100 47 0 -65C TO 150C DCD DPORT CY7C136-JC M84006 9828 619806900 2K x 8 DP CMOS TX PLCC KOREA-A 52 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 16 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R28 HAST 140C/5.5 MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- COMDTY CY7C188-VC MR84065 9836 619810239 32K x 9 CMOS MN SOJ CSPI-R 32 128 45 0 CY7C197-VC MR91023 9849 519815657 256K x 1 CMOS TX SOJ CSPI-R 24 128 44 0 128 44 0 1 BI (or HAST) Board / Circuit Problem 128 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 140C/5.5V DCD DPORT CY7C0251-AC 98302 9833 619809165 8K x 16 DP CMOS TX TQFP KOREA-Q 100 150C/3.8V DCD FIFO CY7C4245V-ASC 99083 9901 619818118 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 48 48 48 48 287 300 731 741 0 0 1 1 Blocked Contact 0 1 EOS 150C/5.75 MPD COMDTY CY7C192-VC 99011 9848 219808135N 64K x 4 CMOS TX SOJ ALPHA-X 28 48 616 0 64K x 4 CMOS TX SOJ ALPHA-X 28 48 874 0 150C/5.75V DCD DPORT CY7C0241-AC 98393 9837 619810551 4K x 18 4K x 18 DP CMOS CMOS TX TX TQFP KOREA-Q TQFP KOREA-Q 100 100 48 80 999 125 0 0 CY7C0251-AC 98302 9833 619809165 8K x 16 DP CMOS TX TQFP KOREA-Q 100 48 48 48 48 80 500 125 467 505 536 125 125 0 0 0 0 0 0 9837 619810549 8K x 16 DP CMOS TX TQFP KOREA-Q 100 219808300 150C/7.0V DCD DPORT CY7C136-JC 98482 9832 519809589/ 2K x 8 DP CMOS TX PLCC INDNS-O 52 48 509 1 1 Delamination at Oxide/Dielectric Layer 80 500 120 120 0 0 48 1001 0 9844 519813532/ 2K x 8 DP CMOS TX PLCC INDNS-O 52 48 1003 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V DCD DPORT CY7C136-JC M84009 9839 519811761 2K x 8 DP CMOS MN PLCC INDNS-O 52 500 120 0 1000 120 0 1500 120 0 2000 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY7C188-VC MR84066 9836 619810239 32K x 9 CMOS MN SOJ CSPI-R 32 336 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 17 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R28 DPORT CY7C136-JC DCD DPORT CY7C0251-AC 8K x 16 DP CMOS MPD COMDTY CY7C185-PC MR91029 9852 519816332 SML/64K CMOS CY7C188-VC MR84063 9836 619810239 32K x 9 CMOS MN HTSSL2 125C/5.5V 96 120 0 500 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH DCD M84020 9839 519811761 98302 9833 619809165 2K x 8 DP CMOS MN No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- PLCC INDNS-O 52 TX TQFP KOREA-Q 100 168 47 0 TX PDIP INDNS-O 28 168 45 0 SOJ 32 168 50 0 CSPI-R MR91007 9852 619813043 32K x 9 CMOS TX SOJ CSPI-R 32 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C DCD DPORT CY7C0251-AC CY7C136-JC MPD 98302 98482 9833 619809165 8K x 16 DP CMOS TX TQFP KOREA-Q 100 300 47 0 9837 619810548 8K x 16 DP CMOS TX TQFP KOREA-Q 100 300 50 0 619810549 8K x 16 DP CMOS TX TQFP KOREA-Q 100 300 50 0 CMOS TX PLCC INDNS-O 52 300 48 0 9844 519813532/ 2K x 8 DP COMDTY CY7C185-PC MR91030 9852 519816332 SML/64K CMOS TX PDIP INDNS-O 28 300 45 0 CY7C188-VC MR84064 9836 619810239 32K x 9 CMOS MN SOJ 32 300 50 0 CSPI-R MR91008 9852 619813043 32K x 9 CMOS TX SOJ CSPI-R 32 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 18 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R3 HAST 140C/5.5 MPD COMDTY CY7C199-VC MR84037 9842 619811723 256K CMOS MN SOJ CSPI-R 28 128 42 0 3 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY7C199-VC MR84038 9842 619811723 256K CMOS MN SOJ CSPI-R 28 336 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY7C1021-VC MR83051 9821 619805130 64K x16 CMOS MN SOJ CSPI-R 44 168 90 1 1 UNKNOWN CY7C1021-ZSC MR83060 9825 619806720 64K x16 CMOS MN TSOP CSPI-R 44 168 80 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY7C1021-ZSC MR83061 9825 619806720 64K x16 CMOS MN TSOP CSPI-R 44 300 56 1 1 Die Cracking CY7C199-VC MR84036 9842 619811723 256K CMOS MN SOJ CSPI-R 28 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 19 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R31 PCT 121C/100%RH MPD SYNC CY7C1399-VC MR84099 9848 619812723 32K x 8 CMOS MN TSOP CSPI-R 28 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD SYNC CY7C1399-VC MR84100 9848 619812723 32K x 8 CMOS MN TSOP CSPI-R 28 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 20 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32 HAST 140C/3.3 MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY62256V-ZC MR83023 9807 619801398 32K x 8 CMOS MN TSOP CSPI-G No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------28 128 76 3 1 Topside Defect/1 Topside Crack/1 Pinholes ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/3.45V MPD COMDTY CY62256V-ZC M84024 9803 619800354 32K x 8 CMOS MN TSOP CSPI-G 28 125C/5.75V MPD COMDTY CY62256V-SC M84026 9838 619811100 32K x 8 CMOS CA SOIC KOREA-L 28 HTSSL2 125C/3.3V MPD COMDTY CY62256V-ZC M84025 9803 619800354 32K x 8 CMOS MN TSOP CSPI-G 28 125C/5.5V MPD COMDTY CY62256V-SC M84030 9838 619811100 32K x 8 CMOS CA SOIC KOREA-L 28 121C/100%RH MPD COMDTY CY62256-SNC MR84056 9837 519811387 32K x 8 CMOS CA NSOI INDNS-O 28 97346 32K x 8 CMOS MN TSOP CSPI-G 28 96 500 1000 2000 120 120 120 120 0 0 0 0 96 120 0 500 119 0 1 EOS 1000 119 0 2000 119 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------96 500 120 120 0 0 96 120 0 500 119 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT CY62256V-ZC 9812 619803151 168 45 0 96 45 0 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 21 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R32D PCT 121C/100%RH MPD COMDTY CY7C199-VC MR91076 9903 619900012 32K x 8(5) CMOS MN SOJ CSPI-R 28 168 45 1 1 Open - Bond Lift ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 22 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R42 HAST 130C/3.63V MPD COMDTY CY7C62127V-BAI 98373 9834 619807063 1 MEG SRAM CMOS MN SBGA TAIWAN-G 48 128 48 4 4 Assembly Defect ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.8V MPD COMDTY CY62256V-ZC 99012 9851 619815366L 32K x 8 CMOS MN TSOP CSPI-R 28 48 493 0 619816611L 32K x 8 CMOS MN TSOP CSPI-R 28 48 469 0 619816612L 32K x 8 CMOS MN TSOP CSPI-R 28 48 490 1 1 Lost Device 619816684L 32K x 8 CMOS MN TSOP CSPI-R 28 48 478 0 619816727L 32K x 8 CMOS MN TSOP CSPI-R 28 48 498 0 619816731L 32K x 8 CMOS MN TSOP CSPI-R 28 48 498 0 9852 619816728L 32K x 8 CMOS MN TSOP CSPI-R 28 48 489 0 619816729L 32K x 8 CMOS MN TSOP CSPI-R 28 48 496 0 619816730L 32K x 8 CMOS MN TSOP CSPI-R 28 48 494 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V MPD COMDTY CY62148-SC 98502 9851 619816794 512K x 8 CMOS MN SOIC TAIWAN-G 32 96 1397 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY7C62127V-BAI 98373 9834 619807063 1 MEG SRAM CMOS MN SBGA TAIWAN-G 48 336 47 0 1000 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY7C62127V-BAI M99102 9830 619808658 1 MEG SRAM CMOS MN SBGA TAIWAN-G 48 168 49 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C MPD COMDTY CY7C62127V-BAI 98373 9834 619807063 1 MEG SRAM CMOS MN SBGA TAIWAN-G 48 100 48 0 200 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC -40C TO 125C MPD COMDTY CY7C62127V-BAI 98373 9834 619807063 1 MEG SRAM CMOS MN SBGA TAIWAN-G 48 300 48 0 619807065 1 MEG SRAM CMOS MN SBGA TAIWAN-G 48 300 48 0 619808617 1 MEG SRAM CMOS MN SBGA TAIWAN-G 48 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 23 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42D HAST Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 140C/3.3 MPD COMDTY CY7C1021V33-ZSC MR83087 9812 619802905 64K x16 CMOS MN TSOP KOREA-H 44 128 80 2 1 Open- Bond Lift / 1 Unknown 140C/3.63 MPD COMDTY CY7C1021V33-VC 64K x16 CMOS MN SOJ 44 128 45 0 MR84080 9845 619811706 CSPI-R CY7C1021V33-ZSC MR84044 9839 619810959 64K x16 CMOS MN TSOP KOREA-H 44 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.8V DCD FIFO CY7C43684V-AC PCT 121C/100%RH MPD COMDTY CY7C1021V33-VC 98517 9853 619817891 48 14 0 48 990 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------MR84078 9845 619811706 16Kx36x2 CMOS MN TQFP KOREA-Q 64K x16 CMOS MN SOJ CSPI-R 128 44 168 45 0 CY7C1021V33-ZSC MR84042 9839 619810959 64K x16 CMOS MN TSOP KOREA-H 44 168 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY7C1021V33-VC MR84079 9845 619811706 64K x16 CMOS MN SOJ CSPI-R 44 300 45 0 CY7C1021V33-ZSC MR84043 9839 619810959 64K x16 CMOS MN TSOP KOREA-H 44 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 24 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R42H HTOL2 125C/5.75V MPD COMDTY CY62148-SC 98502 9851 619816877 512K x 8 CMOS MN SOIC TAIWAN-G 32 96 131 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL3 125C/6.5V MPD COMDTY CY62128-SC CY62256-SNC 99106 99084 9847 619814532 128K x 8 CMOS MN SOIC TAIWAN-G 32 48 1687 0 9905 619901754 128K x 8 CMOS MN SOIC TAIWAN-G 32 48 1674 0 9905 519901754 32K x 8 CMOS MN NSOI INDNS-O 28 48 48 48 20 533 910 0 0 0 519901755 32K x 8 CMOS MN NSOI INDNS-O 28 48 48 48 17 611 849 0 0 0 519901756 32K x 8 CMOS MN NSOI INDNS-O 28 48 14 0 48 696 0 48 700 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 25 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HAST 140C/5.5 MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1021-VC CY7C109-VC No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- MR91049 9851 619815548 64K x16 CMOS MN SOJ CSPI-R 44 128 45 0 MR84051 9840 519812158 128K x 8(5) CMOS MN SOJ INDNS-O 32 128 50 0 140C/5.5V MPD COMDTY CY7C1009-VC 98446 9842 619811835 256K x 4 CMOS MN SOJ CSPI-R 32 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.8V DCD DPORT CY7C028V-AC 98533 9908 619903365 64K x 16 DP CMOS MN TQFP TAIWAN-G 100 48 360 0 CY7C038V-AC 98533 9908 619902997 64K x 18 DP CMOS MN TQFP TAIWAN-G 100 48 360 0 9909 619904710 64K x 18 DP CMOS MN TQFP TAIWAN-G 100 48 360 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V MPD COMDTY CY7C109-VC M84031 SYNC 98515 CY7C1011-ZC 9835 519810178 128K x 8(5) CMOS MN SOJ INDNS-O 32 96 500 1000 2000 120 120 119 119 0 0 0 0 619814769L 128K x 16 CMOS MN TSOP CSPI-R 44 96 496 0 1 EOS 619814770L 128K x 16 CMOS MN TSOP CSPI-R 44 96 543 0 619814771L 128K x 16 CMOS MN TSOP CSPI-R 44 96 539 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY7C1049-VCB MR84031 9839 619810988 512K x 8 CMOS MN SOJ CSPI-R 36 336 50 0 CY7C109-VC MR84052 9840 519812158 128K x 8(5) CMOS MN SOJ INDNS-O 32 336 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V MPD COMDTY CY7C109-VC M84032 PCT 96 119 0 500 119 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------MPD COMDTY CY7C1021-VC 121C/100%RH CY7C109-VC 9835 519810178 128K x 8(5) CMOS MN SOJ INDNS-O 32 MR84085 9851 619811004 64K x16 CMOS MN SOJ CSPI-R 44 168 45 0 MR91048 9851 619815548 64K x16 CMOS MN SOJ CSPI-R 44 168 45 0 MR84049 9840 519812158 128K x 8(5) CMOS MN SOJ INDNS-O 32 168 50 0 SYNC CY7C1011-ZC MR91083 9903 619815422 128K x 16 CMOS MN TSOP CSPI-R 44 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY7C1009-VC 98446 9841 619811577 Page 26 of 256K x 4 28 CMOS MN SOJ CSPI-R 32 300 46 0 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD TC2 -65C TO 150C MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1009-VC 98446 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 9842 619811745 256K x 4 CMOS MN SOJ CSPI-R 32 300 46 0 619811835 256K x 4 CMOS MN SOJ CSPI-R 32 300 46 0 CY7C1049-VCB MR84029 9839 619810988 512K x 8 CMOS MN SOJ CSPI-R 36 300 50 0 CY7C109-VC MR84050 9840 519812158 128K x 8(5) CMOS MN SOJ INDNS-O 32 300 50 0 SYNC CY7C1011-ZC MR91086 9903 619815422 128K x 16 CMOS MN TSOP CSPI-R 44 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 27 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 1999 Issued: 4/29/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 1, 1999 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R52H HAST 140C/3.63 MPD COMDTY CY62128V-ZAIB MR84072 9848 619814823 128K x 8 CMOS MN STSO CSPI-R 32 128 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY62128V-ZAIB MR84070 9848 619814823 128K x 8 CMOS MN STSO CSPI-R 32 168 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 28 of 28