Q2 - 2006

Product Reliability
2006 Q2 RELIABILITY REPORT
TABLE OF CONTENTS
1.0
OVERVIEW OF CYPRESS SEMICONDUCTOR TOTAL QUALITY MANAGEMENT SYSTEM
2
2.0
DEVICE RELIABILITY
3
3.0
2.1
EARLY FAILURE RATE SUMMARY
3
2.2
LONG TERM FAILURE RATE SUMMARY
4
2.3
DATA RETENTION SUMMARY
5
PACKAGE RELIABILITY
6
3.1
PRESSURE COOKER TEST
7
3.2
HAST (HIGHLY ACCELERATED STRESS TEST)
8
3.3
TEMPERATURE CYCLE
9
3.4
HIGH TEMPERATURE STORAGE
10
APPENDIX A: FAILURE RATE CALCULATION
11
APPENDIX B: TEMPERATURE CYCLING STRESS MODELS
15
APPENDIX C: EQUIVALENCE OF STRESS TEST CONDITIONS
17
APPENDIX D: RELIABILITY DATA
18
Note: The results reported herein are for 2nd Quarter 2006.
2006 Q2RELIABILITY REPORT
Page 1 of 93
Product Reliability
1.0 OVERVIEW OF CYPRESS SEMICONDUCTOR, INC. TOTAL QUALITY MANAGEMENT SYSTEM
This report summarizes Cypress Semiconductor Product Reliability for the period of the 2nd quarter of 2006. It
includes data from devices fabricated at the Round Rock, Texas; Minnesota and Fab foundry facilities and
packaged-device data from assembly sites at Cypress Philippines and sub-contractors.
Cypress Semiconductor has established aggressive reliability objectives to assure that all products exhibit
reliability, which exceeds customer reliability requirements for purchased components. The quality standard at
Cypress is zero defects resulting in a culture requiring continuous improvement in quality and reliability.
Product reliability is assured by a total quality management system. The quality management system is
described in detail in the Cypress Semiconductor Quality Manual (Cypress Semiconductor Document Number
90-00001). Key reliability-related programs of the total quality management system are: (1) design rule review
and approval; (2) control of raw materials and vendor quality; (3) manufacturing statistical process controls; (4)
manufacturing identification of "Maverick Lot" yield limits; (5) formal training and certification of manufacturing
personnel; (6) qualification of new products and manufacturing processes; (7) continuous reliability monitoring;
(8) formal failure analysis and corrective action; and (9) competitive benchmarking.
Product Reliability data is accumulated as a result of new product Qualification Test Plan activities (Cypress
Semiconductor Document Number 25-00040) as well as from the Reliability Monitor Program (Cypress
Semiconductor Document Number 25-00008). All reliability test samples are obtained from standard
production material. Sample selection is based on generic product families. These generic products are
designed with very similar design rules and manufactured from a core set of processes.
Reliability strategy requires that every failure that occurs during reliability testing be subjected to failure
analysis (Cypress Semiconductor Document Number 25-00039) to determine the failure mechanism.
Corrective action is then implemented to prevent future failures, resulting in continuous improvement in product
reliability.
Copies of the Cypress Semiconductor documents referenced herein are available through your Cypress
Semiconductor sales representative. Questions about product reliability may be addressed to the undersigned.
Sabbas Daniel
Vice-President for Quality
Cypress Semiconductor Corporation
3901 North First Street
San Jose, CA 95134-1599
Cypress Quality Fax: (408) 943-2165
2006 Q2RELIABILITY REPORT
Page 2 of 93
Product Reliability
2.0 PRODUCT RELIABILITY
In product stress testing, the main emphasis is on the useful life section of the bathtub curve. The test
methodology used to predict the useful life period is a steady-state life test under a dynamic bias and at
temperatures 125°C or 150°C for the maximum specified use voltage of the product. The duration at these
temperatures is 1,000 and 500 hours, respectively.
In Cypress, product reliability tests are performed as part of the qualification processes and as part of the
standard reliability monitoring program. Each fab site and technology family from each product line is being
sampled for product monitor. These reliability tests utilize the following stress factors to accelerate failure:
temperature, current and /or voltage. The product reliability tests currently employed at Cypress include Early
Failure Rate (EFR) and Long Term Failure Rate (LFR).
2.1
EARLY FAILURE RATE SUMMARY
Early Failure Rate Determination: High Temperature Operating Life testing (HTOL), for as long as 96
hours, is used to estimate device early failure rate. This stress will typically correspond to the first
2000 hours of device operation in a system environment. The remainder of the device’s lifetime is
characterized with extended LFR testing (See Section 3)
Test
:
High Temperature Operating Life Test (HTOL)
Conditions :
Dynamic Operating Conditions, VCC nominal + 15%, 150°C or 125°C.
Duration
:
48 hours HTOL at 150°C or 96 hours at 125°C.
(Refer to Appendix C for derating factor calculation)
Failure
:
A failure is any device that fails to meet data sheet electrical requirements.
Table 1. Early Failure Rate Summary
Technology
B53
C8
C9
Notes:
Device Hours
31,587
97,796
306,288
# Failed
0
0
2
FIT Rate
Insufficient
Insufficient
30
PPM
0
0
313
P26
POWER 165
PROMOS S12
R28
R42
R52
R7
304,592
451,011
276,302
32,400
296,947
401,470
2,325,336
0
0
0
0
0
0
10
18
12
19
Insufficient
18
13
15
0
0
0
0
0
0
193
R8
R9
530,725
4,547,202
1
6
11
5
72
59
R95
S4
STARM
TSMC 130
TSMC 180
TSMC 500
Grand Total
721,146
325,973
30,968
21,739
20,410
14,304
10,736,195
0
0
0
0
0
0
19
7
17
Insufficient
Insufficient
Insufficient
Insufficient
6
0
0
0
0
0
0
72
Failure Mode
None
None
Local Interconnect Shorting -1
No visual defect -1
None
None
None
None
None
None
No visual defect - 6
Embedded particle -2
Metal stringer -1
Poor salicidation -1
Timing Failure -1
No visual defect - 4
Metal stringer -1
Abnormal poly contact - 1
None
None
None
None
None
None
See above
Insufficient data – interpret as insufficient accumulated life-time hours to project a 60%confidence bound for a zero-fails sample.
2006 Q2RELIABILITY REPORT
Page 3 of 93
Product Reliability
2.2
LONG TERM FAILURE RATE SUMMARY
A High Temperature Operating Life test (HTOL) is used to estimate long-term reliability. By operating
the devices at accelerated temperature and voltage, hundreds of thousands of use hours can be
compressed into hundreds of test hours.
Test
:
Conditions :
Duration
:
Failure
Fit Rate
High Temperature Operating Life Test (HTOL)
Dynamic Operating Conditions, VCC nominal +15% 150°C or 125°C.
A minimum of 80 hours at 150°C or 168 hours at 125°C
Generally 500 hours at 150°C or 1000 hours at 125°C.
(Refer to Appendix C for derating factor calculation)
:
A failure is any device that fails to meet data sheet electrical requirements.
:
Derated to 55° C ambient, with 60% upper confidence bound for 0 failures,
Ea =0.7ev (Refer to Appendix A)
Table 2. Long Term Failure Rate Summary
Technology
B53
C8
C9
P26
POWER 165
PROMOS S12
R28
R42
R52
R7
R8
R9
S4
STARM
TSMC 130
TSMC 180
TSMC 500
Grand Total
Notes:
Device Hours
58,065
197,723
1,013,720
553,684
171,774
96,000
216,340
885,566
868,817
894,374
414,839
2,478,776
1,767,621
235,106
36,184
78,052
81,180
10,047,820
# Failed
0
0
0
0
0
0
0
0
0
0
0
2
FIT Rate
Insufficient
27
5
10
31
Insufficient
25
6
6
6
13
4
0
0
0
0
0
2
3
23
Insufficient
Insufficient
Insufficient
1
Failure Mode
None
None
None
None
None
None
None
None
None
None
None
Blocked Contact - 1
No visual defect -1
None
None
None
None
None
Blocked Contact - 1
No visual defect -1
Insufficient data – interpret as insufficient accumulated life-time hours to project a 60% confidence bound for a zero-fails sample
2006 Q2RELIABILITY REPORT
Page 4 of 93
Product Reliability
2.3
DATA RETENTION SUMMARY
A high-temperature, non-biased bake test ensures that data retention meets established reliability
goals. The devices are baked without bias at either 165oC for plastic-packaged devices, or 250oC for
hermetically-packaged devices. DRET is performed on programmed devices to establish a failure rate
for cell charge loss. The reliability at nominal system ambient temperature is related to the failure rate
at elevated temperatures through the Arrhenius equation.
Test
:
Conditions :
Duration
:
Failure
:
Data Retention Testing (DRET)
High temperature non-biased bake
A minimum of 500 hours at 150°C or 168 hours at 165°C
Generally 1000 hours at 150°C or 500 hours at 165°C.
Devices are programmed with a worst case program pattern before being subjected to
data retention testing. The memory pattern is verified at each readpoint and any
device with altered bits is classified a failure.
Table 3. Data Retention Summary
Technology
P26
S4
TSMC 500
Grand Total
2006 Q2RELIABILITY REPORT
Sample Size
804
2653
152
3609
Device-Hours # Failed
291,099
0
1,326,500
0
76,000
0
1,693,599
0
PPM
0
0
0
0
Failure Mode
None
None
None
None
Page 5 of 93
Product Reliability
3.0
PACKAGE RELIABILITY
Package-level reliability testing refers to the assessment of the over-all reliability of the device in packaged
form. This consists of subjecting packaged samples to reliability tests that expose the various sample sets to
different stress conditions, after which the samples are tested for any degradation in quality after the stress.
In Cypress, package reliability tests are performed as part of the qualification processes and as part of the
standard reliability monitoring program. The reliability test employed is chosen based on the failure
mechanism, as different stress tests accelerate different failure mechanisms. These reliability tests utilize one
or more of the following stress factors to accelerate failure: temperature, moisture or humidity, current, voltage,
and pressure. The package reliability tests currently employed at Cypress include Pressure Cooker Test
(PCT, Highly Accelerated Stress Test (HAST), Temperature Cycle Test (TCT), and High Temperature Storage
(HTS). Figure 1 shows the Cypress package reliability stress flow.
Surface-mount samples are preconditioned per Jedec Std JESD22-A113 prior to package reliability testing.
This is required prior TCT, PCT and HAST testing. Preconditioning simulates the board mounting process of
the customer. It normally consists of a temperature cycle to simulate exposure to different temperatures during
shipping, a bake to drive away the moisture inside the packages of the samples, a soak to drive a controlled
amount of moisture into the package, and three cycles of convection reflow. Packages are soaked and
reflowed based on its shipping moisture sensitivity classification. The samples are tested (acoustic and
electrical) after preconditioning, failures from which are considered as preconditioning failures and not reliability
failures. Preconditioning failures should be taken seriously, since these imply that the samples are not robust
enough to even withstand the board mounting process.
Cypress conducts all major classes of package reliability tests on each of its package families. The package
characteristics and assembly locations are the primary considerations when grouping packages into package
families. A package family may consist of a group of 44-lead to 144-lead TQFP packages manufactured at a
particular manufacturing location.
Initital
Electrical Testing
Time Zero
Acoustic Analysis
(serialized 15 units)
Moisture
Pre-conditioning
Post Pre-Con
Electrical Testing
Post Pre-Con
Acoustic Analysis
(same serialized units)
Temperature Cycle Test
(TCT)
(300, 500, 1000 cycles))
Pressure Cooker Test
(PCT)
(168 hours)
Highly Accelerated
Stress Test (HAST)
(128 hours)
High Temperature
Storage (HTS)
(500, 1000 hours)
Post Stress
Electrical Testing
Figure 1. Cypress Package Reliability Stress Flow
2006 Q2RELIABILITY REPORT
Page 6 of 93
Product Reliability
3.1
PRESSURE COOKER TEST (PCT)
The Pressure Cooker Test is a highly accelerated packaging stress test used to ensure environmental
durability of epoxy-packaged parts.
Passivation cracks, ionic contamination, and corrosion
susceptibility are all accelerated by this stress.
Conditions
Pre-Conditioning
Failure Modes
Failure Mechanism
:
:
15 PSIG, 121°C, No bias, for a minimum of 168 hours.
5 cycles Temperature Cycles –65/+150, 24 hr Bake 125°C, Moisture
loading to qualified MSL level
:
Parametric shifts, high leakage, and/or catastrophic
:
Die corrosion or contaminants such as foreign material on or within
the package materials. Poor package sealing.
Table 4. Pressure Cooker Test Failure Rate Summary
Package
FBGA (0.75-0.8)
FBGA (0.75-0.8, Pb-Free)
FBGA (1.0)
FLIPCHIP (Build-Up Substrate w/ HS)
FVBGA (0.75-0.8, 0.3mm)
LK
PBGA (1.27)
PBGA (Cavity/Heatsink)
PBGA (Cavity/Heatsink, Pb-Free)
PBGA (Heat Spreader)
PDIP
PDIP (Pb-Free)
PLCC
PLCC (Pb-Free)
PQFP
PQFP (Pb-Free)
QFN (Punch Type)
QFN (Punch Type, Pb-Free)
QSOP (Pb-Free)
SOIC (GullWing)
SOIC (GullWing, 450 footprint)
SOIC (GullWing, 450 footprint, Pb-Free)
SOIC (GullWing, Pb-Free)
SOIC (J lead)
SOIC (J lead, Pb-Free)
SSOP
SSOP (Pb-Free)
TQFP
TQFP (10x10)
TQFP (Pb-Free)
TQFP (Thermal)
TSOP (Pb-Free)
TSOP (Reverse)
TSOP (Reverse, Pb-Free)
TSOP I
TSOP I (Pb-Free)
TSOP II
TSOP II (Pb-Free)
TSOP/ TSSOP
TSSOP (Pb-Free)
VFBGA (0.75-0.8, Pb-Free)
Grand Total
2006 Q2RELIABILITY REPORT
Sample Size
148
50
194
94
855
89
94
104
95
39
145
340
300
150
50
150
200
445
100
539
95
229
980
485
390
430
445
295
150
1,479
50
198
95
50
149
93
519
396
248
646
190
11,793
# Failed Defects %
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
40
7.71
0
0
0
0
0
0
0
0
40
0.34
Failure Mode
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
Die edge delamination
None
None
None
None
Die edge delamination
Page 7 of 93
Product Reliability
3.2
HIGHLY ACCELERATED STRESS TEST (HAST)
Cypress uses HAST to accelerate temperature, humidity, bias failure mechanisms. This change was
necessary because our package reliability had improved to the point where the old 85°C/85% R.H.
Temperature-humidity-bias testing would not induce failures. Failures are necessary to judge progress
and compare packaging changes. HAST testing has been shown to be at least twenty times more
accelerated then 85°C/85% R.H. temperature-humidity-bias testing.
Conditions
:
Pre-Conditioning
:
Failure Modes
Failure Mechanism
:
:
Present Conditions: 130°C / 85% RH minimum power dissipation, for
a minimum of 128 hours.
5 cycles Temperature Cycles –65/+150, 24 hr Bake 125°C, Moisture
loading to qualified MSL level
Parametric shifts, high leakage, and/or catastrophic
Die corrosion or contaminants such as foreign material on or within
the package materials. Poor package sealing.
Table 5. Highly Accelerated Stress Test (HAST) Failure Rate Summary
Package
FBGA (0.75-0.8)
FBGA (1.0)
FLIPCHIP (Build-Up Substrate w/ HS)
FVBGA (0.75-0.8, 0.3mm)
PBGA (Cavity/Heatsink, Pb-Free)
PBGA (Heat Spreader)
PBGA (Heat Spreader, Pb-Free)
PDIP
PDIP (Pb-Free)
PLCC
PLCC (Pb-Free)
QFN (Punch Type)
QFN (Punch Type, Pb-Free)
QSOP (Pb-Free)
SOIC (GullWing)
SOIC (GullWing, 450 footprint)
SOIC (GullWing, 450 footprint, Pb-Free)
SOIC (GullWing, Pb-Free)
SOIC (J lead)
SOIC (J lead, Pb-Free)
SSOP
SSOP (Pb-Free)
TQFP
TQFP (10x10)
TQFP (Pb-Free)
TQFP (Thermal)
TQFP (Thermal, Pb-Free)
TSOP (Pb-Free)
TSOP (Reverse)
TSOP (Reverse, Pb-Free)
TSOP I
TSOP I (Pb-Free)
TSOP II
TSOP II (Pb-Free)
TSOP/ TSSOP
TSSOP (Pb-Free)
VFBGA (0.75-0.8, Pb-Free)
Grand Total
2006 Q2RELIABILITY REPORT
Sample Size
175
121
83
597
196
48
24
95
384
248
141
128
284
134
369
91
292
865
413
441
100
211
86
146
432
35
46
245
77
47
141
91
411
605
238
635
142
8,817
# Failed
0
0
0
5
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
5
Defects %
0
0
0
0.84%
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0.06%
Failure Mode
None
None
None
Copper trace shorting
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
Copper trace shorting
Page 8 of 93
Product Reliability
3.3
TEMPERATURE CYCLE TEST (TC)
Differences in thermal expansion coefficients are accentuated by cycling devices through temperature
extremes. If the materials do not expand and contract equally, large stresses can develop. The
Temperature Cycle test stresses mechanical integrity by exposing a device to alternating temperature
extremes. Weakness and thermal expansion mismatches in die interconnections, die attach, and wire
bonds are often detected with this acceleration test.
Condition
:
Pre-Condition
:
Duration
:
Failure Mode
Failure Mechanism
:
:
MIL-STD-883D, Method 1010, Condition B, -55°C to 125°C
MIL-STD-883D, Method 1010, Condition C, -65°C to 150°C
(Refer to Appendix C for derating factor calculation)
5 cycles Temperature Cycles –65/+150, 24 hr Bake 125°C, Moisture
loading to qualified MSL level
300 cycles minimum at Condition C,
1000 cycles minimum at Condition B
Parametric shifts and catastrophic failures
Wire bond, cracked or lifted die and package failure.
Table 6. Temperature Cycling Failure Rate Summary
Package
Chip On Board (Pb-Free)
FBGA (0.75-0.8)
FBGA (0.75-0.8, Pb-Free)
FBGA (1.0)
FLIPCHIP (Build-Up Substrate w/ HS)
FVBGA (0.75-0.8, 0.3mm)
LCC
LCC (Windowed Plastic)
LK
PBGA (1.27)
PBGA (Cavity/Heatsink)
PBGA (Cavity/Heatsink, Pb-Free)
PBGA (Heat Spreader)
PDIP
PDIP (Pb-Free)
PLCC
PLCC (Pb-Free)
PQFP
PQFP (Pb-Free)
QFN (Punch Type)
QFN (Punch Type, Pb-Free)
QSOP (Pb-Free)
SOIC (GullWing)
SOIC (GullWing, 450 footprint)
SOIC (GullWing, 450 footprint, Pb-Free)
SOIC (GullWing, Pb-Free)
SOIC (J lead)
SOIC (J lead, Pb-Free)
SSOP
SSOP (Pb-Free)
TQFP
TQFP (10x10)
TQFP (Pb-Free)
TQFP (Thermal)
TQFP (Thermal, Pb-Free)
TSOP (Pb-Free)
TSOP (Reverse)
TSOP (Reverse, Pb-Free)
TSOP I
TSOP I (Pb-Free)
TSOP II
TSOP II (Pb-Free)
TSOP/ TSSOP
TSSOP (Pb-Free)
VFBGA (0.75-0.8, Pb-Free)
Grand Total
2006 Q2RELIABILITY REPORT
Sample Size
270
428
48
170
279
1,446
200
461
150
200
349
245
138
195
288
299
150
50
150
200
643
248
685
95
317
1,097
726
495
528
739
294
150
1,251
50
99
350
95
50
149
91
699
694
197
1,217
423
17,098
# Failed
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
29
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
29
Defects %
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
2.64
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0.17
Failure Mode
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
Cut wedge
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
Cut wedge
Page 9 of 93
Product Reliability
3.4
HIGH TEMPERATURE STORAGE (HTS)
A high-temperature, non-biased bake test is performed to determine the effect on devices of long-term
storage at elevated temperatures without any electrical stresses applied. The devices are baked
without bias at either or 150oC or 165oC for plastic-packaged devices. The reliability at nominal system
ambient temperature is related to the failure rate at elevated temperatures through the Arrhenius
equation.
Test
Conditions
Duration
Failure Mode
Failure Mechanism
:
:
:
:
:
High Temperature Storage (HTS)
High temperature non-biased bake
A minimum of 500 hours tested up to 1000 hours at 150°C
Parametric shifts and catastrophic failures
Lifted ball bonds due to gross intermetallic growth
Table 7. High Temperature Storage Failure Rate Summary
Package
Chip On Board (Pb-Free)
FBGA (0.75-0.8)
FBGA (0.75-0.8, Pb-Free)
FBGA (1.0)
FVBGA (0.75-0.8, 0.3mm)
LCC
LCC (Windowed Plastic)
LK
PBGA (1.27)
PBGA (Cavity/Heatsink)
PBGA (Cavity/Heatsink, Pb-Free)
PDIP
PDIP (Pb-Free)
PLCC
PLCC (Pb-Free)
PQFP
PQFP (Pb-Free)
QFN (Punch Type)
QFN (Punch Type, Pb-Free)
QSOP (Pb-Free)
SOIC (GullWing)
SOIC (GullWing, 450 footprint)
SOIC (GullWing, 450 footprint, Pb-Free)
SOIC (GullWing, Pb-Free)
SOIC (J lead)
SOIC (J lead, Pb-Free)
SSOP
SSOP (Pb-Free)
TQFP
TQFP (10x10)
TQFP (Pb-Free)
TSOP (Pb-Free)
TSOP (Reverse)
TSOP (Reverse, Pb-Free)
TSOP I
TSOP I (Pb-Free)
TSOP II
TSOP II (Pb-Free)
TSOP/ TSSOP
TSSOP (Pb-Free)
VFBGA (0.75-0.8, Pb-Free)
Grand Total
2006 Q2RELIABILITY REPORT
Sample Size
360
190
100
190
1,325
100
459
100
300
190
100
390
380
600
300
100
294
399
400
300
982
190
150
1,200
803
876
1,060
199
489
200
593
399
190
100
300
190
538
300
200
598
372
16,506
# Failed
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Defects %
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
Failure Mode
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
None
Page 10 of 93
Product Reliability
APPENDIX A: FAILURE RATE CALCULATION
Thermal Acceleration Factors
Acceleration factors (AF) for thermal stresses (Early Failure Rate, Latent Failure Rate, Data Retention and
High Temperature Storage) are calculated from the Arrhenius equation)
AF = exp
Ea
k
1 - 1
Tu Tt
where :
Ea = Activation Energy of the defect mechanism
K = Boltzmann’s constant = 8.62 x 10 –5 eV/Kelvin
Tt is the junction temperature of the device under stress
Tu is the junction temperature of the device at use conditions
While there is no substitute for experimentally determining the activation energy, obtaining this information is
very difficult because few devices fail stress tests. In the absence of experimental data, the following literature
values are used.
Activation
Energy Ea
Failure Mechanism
Charge Gain
Charge Loss (defects)
Charge Loss (Ionic contamination, edge bits)
(eV)
0.3-0.6
0.6
0.9
Charge loss (intrinsic wear out)
0.3-0.6
Electromigration
0.6-1.0
Intermetallic Growth
1.0
Ionic Contamination
1.0-1.4
Silicon Bulk Defects
0.5
Oxide Defects
0.3
Unknown/Non-Visual Defect (NVD)
0.45
2006 Q2RELIABILITY REPORT
Page 11 of 93
Product Reliability
APPENDIX A: FAILURE RATE CALCULATION (cont.)
Temperature-Humidity Acceleration Factors
Cypress estimates acceleration factors for temperature-humidity stresses (Pressure Cooker Test and Highly
Accelerated Stress Test) from a model developed by Hallberg and Peck (“Quality and Reliability Engineering
International”. Vol. 7, 1991).
-3
AF = RHt exp Ea
RHu
k
1 - 1
Tu Tt
where :
Tu = use environment junction temperature (°K)
Tt = test environment junction temperature (°K)
Ea = failure mechanism activation energy (0.9 for corrosion)
k = Boltzman’s Constant (8.62 x 10 –5 eV/oKelvin)
RHu = use environment relative humidity
RHt = test environment relative humidity
AF = acceleration factor
The Hallberg and Peck model requires the stress junction temperature and relative humidity as well as the use
temperature and relative humidity. To estimate the use relative humidity, we assume that the device room
temperature is 35 oC (95 oF) and the room relative humidity is 100%. From any Handbook of Chemistry and
Physics, the vapor pressure of water VP (water) at 35 oC is 41.175 mm Hg. If we assume that the device will
operate with a junction temperature of 70 oC (VP (water) at 70 oC is 233.7 mm Hg), the junction relative
humidity (RHj) is
RHj
= 100%
41.175
233.7
= 17.6%
The operating conditions of the devices are then 70 oC and 17.6% relative humidity.
Our Pressure Cooker Test (PCT) submits the devices to a temperature of 121 oC and 100% relative humidity.
Using the Hallberg and Peck model, the acceleration factor for the PCT stress can be calculated:
-3
AF =
2006 Q2RELIABILITY REPORT
17.6
100
exp 0.9
k
1_ - 1_
343 394
= 9, 433
Page 12 of 93
Product Reliability
APPENDIX A: FAILURE RATE CALCULATION (cont.)
The acceleration factor for HAST is calculated similarly, except that junction temperature heating effects must
be included when estimating the relative humidity at the die surface.
Assuming an average junction
temperature rise of 5 oC, the relative humidity at the die surface during 130 C HAST testing can be calculated.
VP (130 oC) = 2026.10 mm Hg
VP (135 oC) = 2347.26 mm Hg
RHj
= 85%
2026.10
2347.26
= 73.4%
-3
AF =
17.6
73.4
exp 0.9
k
1_ - 1_
343 408
= 9,261
Similarly, for 140 oC HAST testing,
VP (140 oC) = 2710.92 mm Hg
VP (145 oC) = 3116.76 mm Hg
RHj
= 85%
2710.92
3116.76
= 73.9%
-3
AF =
2006 Q2RELIABILITY REPORT
17.6
73.9
exp 0.9
k
1_ - 1_
343 418
= 17,433
Page 13 of 93
Product Reliability
APPENDIX A: FAILURE RATE CALCULATION (cont.)
Failure Rate Calculation
For all but LFR test, Cypress reports the failure rate in terms of ppm. Early life reliability is reported in terms of
ppm defective expected during the first year of use under typical use conditions. No upper confidence bound
will be used for this estimate. The ppm defective is the ratio of the number of rejects to the number of samples
and expressed in ppm.
PPM =
Total Rejects x 1,000,000
Total Samples
Intrinsic, or later life reliability, shall be reported using the exponential model, in terms of FITs, with a 60%
upper confidence bound for 0 failures or the demonstrated FIT estimate in the case there are failures.
FR (FIT) =χ2α, 2n +2 /(2 * AF * Device Hours) * 10 9
where:
χ2 α,2n +2 = Chi square factor for 2n +2 degrees of freedom at 60% confidence level.
n = number of failure.
AF = Thermal Acceleration factor and is calculated per Arrhenius equation assuming a 0.7eV activation energy.
Voltage acceleration factor is not included in failure rate calculation even though voltage acceleration may be
used during stress. Typical use conditions shall be considered to be 55°C ambient with a 15°C temperature
rise at the junction. Thus, use junction temperature is 70°C.
2006 Q2RELIABILITY REPORT
Page 14 of 93
Product Reliability
APPENDIX B: TEMPERATURE CYCLING STRESS MODELS
Two acceleration factor (AF) models are used to model temperature cycle failures. The model proposed by
Zelenka [1] and others uses the epoxy molding temperature (Tmold = 170 °C) and the minimum temperature
reached during temperature cycling , (Tmin).
m
AFbrittle =
Tmold - Tmin,stress
Tmold - Tmin,stress
The model constant, m, is experimentally calculated for each failure mechanism. The acceleration factor is
labeled ‘brittle’ because the derivation of this equation assumes brittle fracture mechanics. Basically, the
model assumed that cracks advance a little every time the maximum stress is reached. The maximum stress
is assumed to be proportional to the difference in temperature between the minimum and maximum stress
temperatures. For plastic-encapsulated devices, the stress is minimum during molding, (Tmold), and a
maximum during the lowest temperature reached during temperature cycling, (Tmin).
The model constant, m, is a function of the failure mechanism.
Thin film cracking
Al/Au Intermetallic fractures
Chip-out (cratering) bond failures
m = 12 (Blish and Vaney [2])
m=4
m = 7 (Dunn and McPherson [3])
For ductile materials, dislocation movement dominates the fracture mechanics and a different model is used.
The second, and most widely accepted model, use the difference between the minimum and maximum
temperatures during temperature cycle testing (Tmin and Tmax) to calculate an acceleration factor.
m
AFductile =
Tmax, stress - Tmin,stress
Tmax,use - Tmin,use
The model constant, ‘m’, is again experimentally calculate for each failure mechanism.
Coffin and Manson [4] developed this model from empirical observations of metal fatigue. In ductile materials,
if the applied stress is high enough, dislocation are produced. At the high temperature condition of the
temperature cycling stress, dislocations are forced towards one metal surface. At the low temperature , the
dislocations try to glide back to their original position, but many cannot because they became entangled with
other dislocations. After many cyles, these tangles grow until cracking, and finally failure, occurs. Both
minimum and maximum temperatures are important, because both contribute to dislocation movement and
entanglement. This model is recommended for any failures involving ductile materials. Model constants for
ductile failure mechanism follow.
Wirebond breakage
Solder Fatigue
2006 Q2RELIABILITY REPORT
m = 5.16 (Cypress experimentation)
m = 2 (Blish and Vaney [2])
Page 15 of 93
Product Reliability
APPENDIX B: TEMPERATURE CYCLING STRESS MODELS (cont.)
Our commercial devices are specified to operate between 0°C and 70 °C. Using this information, the
acceleration factor, AF, between use and Military Condition C stress testing (-65°C to 150°C), for the brittle,
thin film cracking failure mechanism and ductile, wire bond breakage failure mechanism can be calculated.
12
AF brittle
=
170 - (-65)
170 - 0
AF ductile
=
150 - (-65)
70 - 0
=
49
5.16
=
327
References:
[1] R.L. Zelenka, IEEE/IRPS, pp. 30-34, 1991
[2] R.C. Blish and P.R. Vaney, IEEE/IRPS, pp 22-29, 1991
[3] C.F. Dunn and J.W. McPherson, IEEE/IRPS, pp 252-258, 1990
[4] S.S. Manson, thermal Stress and Low-Cycle Fatigue, (Robert Krieger : Malabar, Florida), 1981.
2006 Q2RELIABILITY REPORT
Page 16 of 93
Product Reliability
APPENDIX C: EQUIVALENCE OF DIFFERENT STRESS TEST CONDITIONS
During stress testing, more than one set of test conditions were used. To account for this difference, stress
test hours or cycles at the lower stress condition were derated and then added to the total for the most severe
stress test condition.
Dynamic (HTOL)
HTOL (EFR/LFR) test is performed at 150 °C and 125 °C. Using the Arrhenius equation (Appendix A) and an
activation energy of 0.7 eV, the derating factor, DF, between 125°C and 150 °C can be calculated.
DF (between 125C and 150C) = exp
0.6 ____1 _______ - ______1______
k 150 + 15 + 273
125 + 15 + 273
= 0.326
Derating calculation assumes a 15 °C rise due to junction heating.
Temperature Cycling
Two different temperature cycling conditions were used to measure reliability, -65°C to 150°C and –55°C to
125°C. Using the brittle failure mechanism model with m = 12, the derating factor between -65°C to 150°C and
–55°C to 125°C is calculated.
12
DF
=
170 - (-55)
170 – (-65)
=
1.685
Using the ductile failure mechanism model with m = 5.16, the derating factor between -65°C to 150°C and –
55°C to 125°C is obtained.
5.16
DF
=
125 - (-55)
150 - (-65)
=
2.501
HAST
The derating factor between two HAST conditions, 140 °C / 85%RH and 130 °C / 85% RH is simply the ratio of
the acceleration factors (See Appendix A)
DF
2006 Q2RELIABILITY REPORT
=
9,261_
17, 433
=
0.531
Page 17 of 93
Product Reliability
APPENDIX D: RELIABILITY DATA
Summary Detail -- EFR Performance Over Time
Device
From: 7/4/2005
To: 6/30/2006
Technology
Division Eval Num
TV
Temp
Volt
Duration
B53
CCD
052404
1
7B6936AC-LLYC
125C
3.8V
96
340
0
CCD
052404
1(1)
7B6936AC-LLYC
125C
3.8V
96
340
0
CCD
052404
1(2)
7B6936AC-LLYC
125C
3.8V
96
340
0
125C
2.35V
96
Summary for 'Technology' = B53 (3 detail records)
Sum
C8
7C87741A
1020
0
89
0
043004
1B
CCD
043004
3A
7C87742A
125C
2.35
96
134
0
CCD
043004
3C
7C87741A
125C
2.35V
96
276
0
CCD
043004
4
7C87740A
125C
2.35V
96
169
0
CCD
043004
5A
7C87741A
125C
2.35V
96
175
0
CCD
043004
6
7C87741A
125C
2.35V
96
304
0
CCD
043004
6A
7C87742A
125C
2.35V
96
406
0
CCD
043004
8
7C87742A
125C
2.35V
96
434
0
CCD
043004
8A
7C87741A
125C
2.35
96
671
0
CCD
043004
9
7C87741A
125C
2.35V
96
500
0
3158
0
150C
3.77
48
1301
0
CY7C1041DV33
Results
MID
052207
R1
MID
052207
R1A
CY7C1041DV33
150C
3.77
48
250
MID
052207
R2
CY7C1041DV33
150C
3.77
48
1517
1 052207-2E1
Local Interconnect shorting
MID
052207
R3
CY7C1041DV33
150C
3.77
48
1519
1 052207-3E1
No visual defect
MID
052207
R3(1)
CY7C1041DV33
150C
3.77
48
1794
0
150C
5.75V
48
Summary for 'Technology' = C9 (5 detail records)
Sum
P26
Rejects FA
CCD
Summary for 'Technology' = C8 (10 detail records)
Sum
C9
SS
0
6381
2
667
0
CCD
054604
3
7C634131CU-OPZC
CCD
054604
3(1)
7C634131CU-OPZC
150C
5.75V
48
484
0
CCD
054604
R2
CY7C65113C-SXC
150C
5.75
48
612
0
CCD
054604
R2(1)
CY7C65113C-SXC
150C
5.75
48
612
0
CCD
054604
R3
CY7C65113C-SXC
150C
5.75
48
612
0
CCD
054604
R3(1)
CY7C65113C-SXC
150C
5.75
48
204
0
CCD
054604
R5
CY7C65113C-SXC
150C
5.75
48
407
0
CCD
054604
R5(1)
CY7C65113C-SXC
150C
5.75
48
191
0
CCD
054604
R5(2)
CY7C65113C-SXC
150C
5.75
48
408
0
CCD
054605
1
7C637402AU-OPZC
150C
5.75V
64
335
0
2006 Q2 RELIABILITY REPORT
Page 18 of 93
Product Reliability
Technology
Division Eval Num
TV
Temp
Volt
Duration
P26
CCD
054605
2
7C637402AU-OPZC
Device
150C
5.75V
48
335
0
CCD
054605
3
7C637402AU-OPZC
150C
5.75V
48
351
0
CCD
054805
R1
CY7C651131
150C
5.75
48
506
0
CCD
054805
R2
CY7C651131
150C
5.75
48
510
0
Summary for 'Technology' = P26 (14 detail records)
Sum
POWER 165
6234
0
051502
R1
CYK512K16SCCAU
125C
5.5
96
1912
0
MID
051502
R2
CYK512K16SCCAU
125C
5.5
96
1944
0
MID
051502
R3
CYK512K16SCCAU
125C
5.5
96
1865
0
MID
052102
R1
CYK128K16MCCBU-70BVIT
125C
3.8
96
1499
0
MID
052102
R2
CYK128K16MCCBU-70BVIT
125C
3.8
96
1498
0
MID
052102
R3
CYK128K16MCCBU-70BVIT
125C
3.8
96
1499
0
MID
052102
R4
CYK128K16MCCBU-70BVIT
125C
3.8
96
1000
0
MID
052102
R5
CYK128K16MCCBU-70BVIT
125C
3.8
96
1000
0
MID
052102
R6
CYK128K16MCCBU-70BVIT
125C
3.8
96
1000
0
MID
MR051083
R1
CYK128K16SCBU-55BVXI
125C
3.8
96
200
0
MID
MR052047
R1
CYK128K16MCCBU-55BVIT
150C
3.8
96
249
0
MID
MR054051
R1
CYK128K6C7BW-70BVI
125C
3.8
120
300
0
13966
0
MID
054601
R5A
CYU01M6TF53CZ
125C
2.1
84
985
0
MID
054601
R6
CYU01M6TF53CZ
125C
2.0
84
1690
0
MID
054601
R6
CYU01M6TF53CZ
125C
2.0
12
1690
0
MID
054601
R6A
CYU01M6TF53CZ
125C
2.1
12
970
0
MID
054601
R6A
CYU01M6TF53CZ
125C
2.1
84
970
0
MID
054601
R7
CYU01M6TF53CZ
125C
2.0
84
1715
0
MID
054601
R7
CYU01M6TF53CZ
125C
2.0
12
1715
0
MID
054601
R7A
CYU01M6TF53CZ
125C
2.1
12
972
0
MID
054601
R7A
CYU01M6TF53CZ
125C
2.1
84
972
0
MID
061204
R3
CYU01M16SCEU-BXI
125C
2.0
84
3101
0
Summary for 'Technology' = PROMOS S12 (10 detail records)
Sum
R28
14780
0
DCD
MR062066
R1
7C433DT-MJZC
150C
5.75
48
300
0
MID
MR052086
R1
CY7C185-25VC
150C
5.75
60
300
0
Summary for 'Technology' = R28 (2 detail records)
Sum
R42
Rejects FA
MID
Summary for 'Technology' = POWER 165 (12 detail records)
Sum
PROMOS S12
SS
600
0
DCD
053007
R2C
CY7C027V
150C
3.8
48
388
0
DCD
053007
R2D
CY7C027V
150C
3.8
48
366
0
DCD
053007
R3C
CY7C027V
150C
3.8
48
1059
2006 Q2 RELIABILITY REPORT
0
Page 19 of 93
Results
Product Reliability
Technology
Division Eval Num
TV
Temp
Volt
Duration
R42
DCD
MR053011
R1
CY7C038V-25AC
Device
150C
3.8
48
150
0
DCD
MR054046
R1
CY7C024AV-20AXI
125C
3.8
96
150
0
DCD
MR054046
R1A
CY7C024AV-20AXI
125C
3.8
96
150
0
DCD
MR054063
R1
CY7C026AV-25AXI
125C
3.8
96
295
0
MID
053407
R1
CY62256LL
150C
5.75
48
849
0
MID
053407
R2
CY62256LL
150C
5.75
48
846
0
MID
053407
R3
CY62256LL
150C
5.75
48
850
0
MID
MR053024
R1
CG6521M
125C
5.75
96
196
0
MID
MR053034
R1
CG6520AM
125C
5.25
144
299
0
MID
MR054031
R1
CY62256LL-55SNXI
125C
5.75
96
297
0
MID
MR054053
R1
CG6519AM
125C
5.75
96
300
0
MID
MR061014
R1
CS5756AT
125C
5.75
48
300
0
MID
MR061030
R1
CS5756AT
125C
5.75
48
300
0
MID
MR062043
R1
CY7C199-25VC
150C
5.75
48
300
0
Summary for 'Technology' = R42 (17 detail records)
Sum
R52
SS
Rejects FA
7095
0
CCD
043801
1
7C823C09AC-MSZI
150C
3.8V
48
504
0
CCD
043801
1(1)
7C823C09AC-MSZI
150C
3.8V
48
496
0
CCD
051903
R1
CY221R28-ZXC
150C
2.875
48
500
0
CCD
051903
R1(1)
CY221R28-ZXC
150C
2.875
48
500
0
CCD
051903
R2
CY221R28-ZXC
150C
2.875
48
499
0
CCD
051903
R2(1)
CY221R28-ZXC
150C
2.875
48
492
0
CCD
052805
R1
CY7C67300-100AXI
150C
3.8
24
50
0
CCD
052805
R1(1)
CY7C67300-100AXI
150C
3.8
24
405
0
CCD
052805
R1(2)
CY7C67300-100AXI
150C
3.8
24
441
0
CCD
052805
R2
CY7C67300-100AXI
150C
3.8
24
448
0
CCD
052805
R2(1)
CY7C67300-100AXI
150C
3.8
24
419
0
CCD
052805
R3
CY7C67300-100AXI
150C
3.8
24
449
0
CCD
052805
R3(1)
CY7C67300-100AXI
150C
3.8
24
409
0
DCD
052103
1BA
7C02628AC-RAZI
150C
3.45V
48
330
0
DCD
052103
1BB
7C02628AC-RAZI
150C
3.45V
48
328
0
DCD
052103
1BC
7C02628AC-RAZI
150C
3.45V
48
332
0
DCD
052103
R1
CYD256B16-55AXI
150C
3.45
48
330
0
DCD
052103
R2
CYD256B16-55AXI
150C
3.45
48
328
0
DCD
052103
R3
CYD256B16-55AXI
150C
3.45
48
332
0
2006 Q2 RELIABILITY REPORT
Page 20 of 93
Results
Product Reliability
Technology
Division Eval Num
TV
Device
Temp
Volt
Duration
R52
MID
MR052029
R1
CY62136VLL-70ZI
125C
3.8
96
MID
MR053007
R1
CG6513AM
150C
2.3
48
200
0
MID
MR053022
R1
CY62136VLL-70ZXI
150C
2.3
96
298
0
MID
MR053048
R1
CY7C1399B-12VC
150C
2.45
48
300
0
MID
MR054020
R1
CY62136VLL-55ZI
125C
3.8
96
300
0
MID
MR054030
R1
CY7C1399B-12VC
150C
3.8
48
300
0
MID
MR062048
R1
CY7C1399B-12VC
150C
3.8
48
300
0
Summary for 'Technology' = R52 (26 detail records)
Sum
R7
SS
299
Rejects FA
9589
0
CCD
MR052042
R1
CY7C1018CV33-15VC
150C
3.8
48
300
0
DCD
060305
R1A
CY7C0832AV
125C
2.3
96
207
0
DCD
060305
R1B
CY7C0832AV
125C
2.3
96
206
0
DCD
060305
R1C
CY7C0832AV
125C
2.3
96
207
0
DCD
060305
R1D
CY7C0832AV
125C
2.3
96
207
0
DCD
060305
R1E
CY7C0832AV
125C
2.3
96
206
0
DCD
060305
R2A
CY7C0852V
125C
2.3
96
321
0
DCD
060305
R2B
CY7C0852V
125C
2.3
96
324
0
DCD
060305
R2C
CY7C0852V
125C
2.3
96
328
0
DCD
060305
R2D
CY7C0852V
125C
2.3
96
335
0
DCD
060305
R2E
CY7C0852V
125C
2.3
96
325
0
0
DCD
060305
R3
CY7C0852V
125C
2.3
96
784
MID
050505
R3A
CY7C1360B
150C
2.3
48
3486
0
MID
053206
R1
CY7C1313V18
125C
2.07
96
1774
0
MID
053206
R2
CY7C1313V18
125C
2.07
96
197
0
MID
053206
R3
CY7C1313V18
125C
2.07
96
295
0
MID
053703
R1B
CYC1021CV33
150C
2.3
48
3530
0
MID
053703
R2B
CYC1370CC
150C
2.3
48
1667
4 053703-1E1
MID
055103
R1
CY7C1313AVIB
125C
2.07
48
1486
0
MID
055103
R2
CY7C1313AVIB
125C
2.07
48
744
0
MID
055103
R3
CY7C1313AVIB
125C
2.07
48
495
0
MID
MR044074
R1
CY7C1061AV33-10ZC
125C
2.45
138
200
0
MID
MR052048
R1
CY7C1049CV33-10VC
150C
2.3
48
330
0
MID
MR052080
R1
CY7C1041CV33-10ZXCT
150C
2.3
60
399
0
MID
MR052081
R1
CY7C1049CV33-12ZCT
150C
2.3
48
615
0
MID
MR052087
R1
CY7C1021CV33-8VC
150C
2.3
60
598
2 MR052087-1E1
MID
MR052091
R1
CY7C1041CV33-15ZC
150C
2.3
48
493
0
MID
MR052092
R1
CY7C1041CV33-10ZC
150C
2.3
60
400
2006 Q2 RELIABILITY REPORT
Results
0
0
Page 21 of 93
No visual defect
Metal stringer, No visual defect
Product Reliability
Technology
Division Eval Num
TV
Temp
Volt
Duration
R7
MID
MR052094
R1
CY7C1041CV33-20ZC
Device
150C
2.3
60
270
0
MID
MR052095
R1
CY7C1049CV33-20VC
150C
2.3
60
246
0
MR052097
R1
CY7C1021CV33-12ZC
150C
2.3
48
195
1 MR052097-1E1
MID
MR052100
R1
CY7C1021CV33-15ZC
150C
2.3
48
500
0
MID
MR052101
R1
CY7C1041CV33-15ZC
150C
2.3
60
200
0
MID
MR052102
R1
CY7C1041CV33-10ZC
150C
2.3
48
598
0
MID
MR052104
R1
CY7C1049CV33-20VC
150C
2.3
60
200
0
MID
MR053025
R1
CY7C1021CV33-15VC
150C
2.3
48
200
0
MID
MR053026
R1
CY7C1021CV33-15VXC
150C
2.3
48
200
0
MID
MR053040
R1
CY7C1041CV33-10
150C
3.8
48
3097
MID
MR053053
R1
CY7C1021CV33-12ZXI
150C
2.3
48
831
0
MID
MR053062
R1
CG5978AT
150C
2.3
48
8997
0
MID
MR053063
R1
CG5978AT
150C
2.3
48
2000
0
MID
MR053064
R1
CG5978AT
150C
2.3
48
5985
0
MID
MR054045
R1
CY7C1041CV33-10ZC
150C
2.3
48
3000
0
MID
MR054073
R1
CY7C1041CV33
150C
2.3
48
3998
MID
MR061031
R1
CY7C1381C-100AC
150C
2.3
48
298
1 MR053040-1E1
2 MR054073-1E1
MR061048
R1
CY7C1021CV33-10ZC
150C
2.3
48
181
0
MID
MR062036
R1
CY7C1021GC-RZSC
150C
2.3
48
300
0
51755
10
MID
050505
R1A
CY62157
125C
2.4
168
3796
0
MID
050505
R1A
CY62157
125C
2.4
96
3800
1 050505-1E1
MID
054806
R1
CY62167DV30
125C
2.4
96
1490
0
MID
054806
R2
CY62167DV30
125C
2.4
96
1750
0
MID
054806
R3
CY62167DV30
125C
2.4
96
1627
0
MID
MR052028
R1
CY62128DV30LL-55ZI
150C
2.4
48
300
0
MID
MR054032
R1
CY62167DV30LL-70BVI
125C
2.4
96
298
0
MID
MR062037
R1
CY62128DV30LL-70SI
150C
2.4
48
300
0
MID
MR062051
R1
CY62147DV18LL-70BVI
125C
2.4
96
300
0
MID
MR062056
R1
CY62147DV30L-55ZSXI
125C
2.4
96
300
0
150C
2.25
48
13961
1
1490
0
ALL
053901
R1
CY7C1370D
ALL
053901
R2
CY7C1370D
150C
2.25
48
1954
0
MID
045202
R1
CY62127EV
125C
1.85
96
3488
0
MID
051006
R1A
CY7C1470
150C
2.25
48
801
0
MID
051006
R2A
CY7C1347G
150C
2.25
48
3478
0
2006 Q2 RELIABILITY REPORT
Results
Poor salicidation
No visual defect
Embedded particle
0
MID
Summary for 'Technology' = R8 (10 detail records)
Sum
R9
Rejects FA
MID
Summary for 'Technology' = R7 (47 detail records)
Sum
R8
SS
Page 22 of 93
Timing failure
Product Reliability
Technology
Division Eval Num
TV
Device
Temp
Volt
Duration
R8
MID
051006
R2C
CY7C1347G
150C
2.25
48
SS
1679
Rejects FA
0
MID
051006
R2D
CY7C1347G
150C
2.25
48
1727
0
MID
052203
R1
CY7C1370
150C
2.25
48
1167
0
MID
052203
R2
CY7C1370
150C
2.25
48
1076
0
MID
052203
R3
CY7C1370
150C
2.25
48
1285
0
MID
052607
R1
CY7C1339G
150C
2.25
24
848
0
MID
052607
R2
CY7C1339G
150C
2.25
24
850
0
MID
052607
R3
CY7C1339G
150C
2.25
24
847
0
MID
053405
R1
CY7C1360C
150C
2.25
48
2846
0
MID
053405
R2
CY7C1360C
150C
2.25
48
2851
0
MID
053405
R3A
CY7C1360C
150C
2.25
48
1281
0
MID
053405
R3B
CY7C1360C
150C
2.25
48
1562
1 053405-3BE1
MID
053704
R1A
CY7C1370
150C
2.25
48
2123
0
MID
053704
R2A1
CY7C1347
150C
2.25
48
800
0
MID
053704
R2A2
CY7C1347
150C
2.25
48
795
0
MID
054003
R1
CY7C1514AC
125C
2.25
96
600
0
MID
054003
R2
CYC15121AC
125C
2.25
96
1113
0
MID
054003
R3
CY7C1513AC
125C
2.25
96
273
0
MID
054302
R1A
CY62147EV30*
125C
1.85
96
679
0
MID
054302
R4
CY62147EV30*
125C
1.85
96
4031
0
MID
054302
R5
CY62147EV30*
125C
1.85
96
1711
0
MID
054302
R7
CY62147EV30*
125C
1.85
96
916
1 043306-2E1
MID
054801
R1
CY7C1470V33
150C
2.25
48
590
0
MID
054801
R2
CY7C1470V33
150C
2.25
48
1161
0
MID
054801
R3
CY7C1470V33
150C
2.25
48
705
0
MID
054909
R2
CY62157EV
125C
1.85
96
683
0
MID
054909
R2A
CY62157EV
125C
1.85
96
608
0
MID
054909
R2A(1) CY62157EV
125C
1.85
96
299
0
MID
054909
R2A(2) CY62157EV
125C
1.85
96
677
0
MID
054909
R2B
CY62157EV
125C
1.85
96
283
0
MID
054909
R2B(1) CY62157EV
125C
1.85
96
315
0
MID
054909
R2C
CY62157EV
125C
1.85
96
419
0
MID
061206
R1
CY7C1460AV33
150C
2.5
48
497
0
MID
061206
R2
CY7C1460AV33
150C
2.25
48
1008
0
MID
062604
R2
CY7C1370D
150C
2.25V
48
1957
0
MID
062604
R3
CY7C1370D
150C
2.25V
48
1269
0
MID
062604
R3(1)
CY7C1370D
150C
2.25
48
1225
0
2006 Q2 RELIABILITY REPORT
Page 23 of 93
Results
Metal stringer
Abnormal poly contact
Product Reliability
Technology
Division Eval Num
TV
Device
Temp
Volt
Duration
R9
MID
062604
R4
CY7C1370D
150C
2.25V
48
MID
062604
R5
CY7C1370D
150C
2.25V
48
2534
0
MID
062605
R1A
CY7C1360C
150C
2.25V
48
932
0
MID
062605
R1B
CY7C1360C
150C
2.25V
48
1882
0
MID
062605
R1C
CY7C1360C
150C
2.25V
48
2864
0
MID
062605
R1D
CY7C1360C
150C
2.25V
48
2919
0
MID
062605
R2
CY7C1360C
150C
2.25V
48
1935
0
MID
MR052054
R1
CY7C1347G-133AXC
150C
2.25
48
200
0
MID
MR052056
R1
CY7C1347G-133AXC
150C
2.25
48
148
0
MID
MR052058
R1
CY7C1347G-133AXC
150C
2.25
48
199
0
MID
MR052060
R1
CY7C1327G-133AXC
150C
2.25
48
199
0
MID
MR052068
R1
CY7C1347G-166AXC
150C
2.25
48
214
0
MID
MR052068
R1A
CY7C1347G-166AXC
150C
2.25
48
202
0
MID
MR052105
R1
CY7C1347G-166AXC
150C
2.25
48
1674
1 MR052105-1E1
No visual defect
MID
MR052105
R1A
CY7C1347G-166AXC
150C
2.3
48
4309
2 MR052105-1E1
No visual defect
MID
MR053051
R1
CY7C1347G-166AXC
150C
2.25
48
2393
0
MID
MR053052
R1
CY7C1347G-133AXI
150C
2.3
48
3512
0
MID
MR053065
R1
CY7C1370D-167AXI
150C
2.3
48
1846
0
MID
MR053066
R1
CY7C1370D-167AXI
150C
2.3
48
2732
0
Rejects FA
MR053067
R1
CY7C1370D-167AXI
150C
2.3
48
1070
0
MID
MR054070
R1
CY7C1347G-250AXC
150C
2.25
48
299
0
MID
MR054071
R1
CY7C13560CC-RAZC
150C
2.25
48
299
MID
MR061072
R1
CY7C1347G-133AXI
150C
2.3
48
3342
0
MID
MR061073
R1
CY7C1339G-200AXC
150C
2.3
48
1060
0
MID
MR061074
R1
CY7C1327G
150C
2.3
48
1190
0
MID
MR061075
R1
CY7C1382D-167AXC
150C
2.3
48
1263
0
MID
MR061076
R1
CY7C1382D-167AXC
150C
2.3
48
2050
0
MID
MR061077
R1
CY7C1382D-167AXC
150C
2.3
48
735
0
1 MR054071-1E1
MID
MR061079
R1
CY7C1370
150C
2.3
48
1964
0
MID
MR061080
R1
CY7C1370EC
150C
2.25
48
2493
0
101717
6
MID
061502
R1
CY62127EV30LL
125C
1.85V
96
4411
0
MID
061502
R2A
CY62127EV30LL
125C
1.85V
96
2936
0
MID
061502
R2B
CY62127EV30LL
125C
1.85V
96
1440
0
MID
061503
R1B
CY62147EV30
125C
1.85
96
2193
0
MID
061503
R1C
CY62147EV30
125C
1.85
96
2319
2006 Q2 RELIABILITY REPORT
Results
0
MID
Summary for 'Technology' = R9 (72 detail records)
Sum
R95
SS
1291
0
Page 24 of 93
No visual defect
Product Reliability
Technology
Division Eval Num
TV
Device
Temp
Volt
Duration
R95
MID
061503
R2B
CY62147EV30
125C
1.85
96
2357
0
MID
061503
R3A
CY62147EV30
125C
1.85
96
2502
0
MID
061503
R3B
CY62147EV30
125C
1.85
96
2533
0
MID
061503
R3C
CY62147EV30
125C
1.85
96
2596
0
150C
3.8V
48
Summary for 'Technology' = R95 (9 detail records)
Sum
S4
23287
0
540
0
050507
1B
7C84980AT-TZZC
CCD
050507
1B(1)
7C84980AT-TZZC
150C
3.8V
48
496
0
CCD
052004
R1
CY8C21234-24SXI
125C
5.5
120
1002
0
CCD
053402
R2
CY8C27443-24PVXI
125C
5.5
96
1010
0
CCD
053403
R1
CY8C24423A-24PVXI
125C
5.5
96
999
0
CCD
053403
R1(1)
CY8C24423A-24PVXI
125C
5.5
96
1004
0
CCD
053603
R1
CY8C24794-24LFXI
125C
5.5
96
923
0
CCD
060401
2
8C21534AC-TSPI
125C
5.5V
120
1002
0
CCD
MR052082
R1
CY8C24223A-24PVXI
125C
2.3
96
200
0
CCD
MR052083
R1
CY8C26443-24PVI
125C
5.5
96
149
0
CCD
MR053020
R1
CY22392ZXI-353
150C
3.8
48
270
0
CCD
MR054013
R1
CS6326AAT
150C
2.3
48
299
0
CCD
MR054075
R1
CY8C24423A-24PVXI
125C
5.5
96
224
0
0
CCD
MR061015
R1
CY8C27443-24PVXI
125C
5.5
96
251
CCD
MR061024
R1A
CY22394FC
150C
3.8
48
299
0
CCD
MR061025
R1
CY22392ZI-341
150C
3.8
48
200
0
8868
0
CCD
MR054023
R1
CY7B991-5JC
125C
6.6
96
200
0
CCD
MR054023
R1A
CY7B991-5JC
125C
6.6
96
100
0
DCD
MR051034
R1
CY7B933-JC
125C
6.5
96
75
0
DCD
MR051034
R1A
CY7B933-JC
125C
6.5
96
75
0
DCD
MR051034
R1B
CY7B933-JC
125C
6.5
96
50
0
DCD
MR052076
R1
CY7B991-7JCT
125C
6.6
96
200
0
DCD
MR054033
R1
CY7B933-JC
125C
6.5V
96
85
0
DCD
MR054033
R1A
CY7B933-JC
125C
6.5
96
85
0
DCD
MR054033
R1B
CY7B933-JC
125C
6.5
96
85
0
DCD
MR054033
R1C
CY7B933-JC
125C
6.5
96
45
0
Summary for 'Technology' = STARM (10 detail records)
Sum
TSMC 130
Rejects FA
CCD
Summary for 'Technology' = S4 (16 detail records)
Sum
STARM
SS
1000
0
DCD
034001
1B
7C72250AJ-GQFGC
125C
1.8V
96
143
0
DCD
034001
3B
7C72250BJ-GQFGC
125C
1.38V
96
129
0
2006 Q2 RELIABILITY REPORT
Page 25 of 93
Results
Product Reliability
Technology
Division Eval Num
TV
Temp
Volt
Duration
TSMC 130
DCD
034001
5
7C72250BJ-GQFGCB
Device
125C
1.38V
96
181
0
DCD
034001
6
7C72220BJ-GQFGCB
125C
1.38V
96
127
0
DCD
044108
1B
7C71051CJ-GQFGCB
125C
1.35V
96
36
0
DCD
044108
1C
7C71051CJ-GQFGCB
125C
1.35V
96
27
0
DCD
044108
2B
7C71051CJ-GQFGCB
125C
1.35V
96
31
0
DCD
044108
2C
7C71051CJ-GQFGCB
125C
1.35V
96
28
0
Summary for 'Technology' = TSMC 130 (8 detail records)
Sum
TSMC 180
DCD
044108
R2
CYNSE10512A
125C
1.35
96
Rejects FA
702
0
70
0
DCD
044108
R2(1)
CYNSE10512A
125C
1.35
120
2
0
DCD
044108
R3(1)A CYNSE10512A
125C
1.35
120
1
0
DCD
044108
R3(1)B CYNSE10512A
125C
1.35
96
85
0
DCD
044108
R3(2)B CYNSE10512A
125C
1.35
120
2
0
DCD
044108
R3A
CYNSE10512A
125C
1.35
96
144
0
DCD
044108
R3B
CYNSE10512A
125C
1.35
96
130
0
DCD
044108
R3C
CYNSE10512A
125C
1.35
96
32
0
MID
052003
2
7ISC305BF-IPQYC
150C
2.07V
48
55
0
MID
052003
3
7ISC305BF-IPQYC
150C
2.07V
60
55
0
576
0
150C
5.75
48
298
0
298
0
264987
19
Summary for 'Technology' = TSMC 180 (10 detail records)
Sum
TSMC 500
SS
DCD
MR054057
R1
CY37128P84
Summary for 'Technology' = TSMC 500 (1 detail record)
Sum
Grand Total
2006 Q2 RELIABILITY REPORT
Page 26 of 93
Results
Product Reliability
Summary Detail -- LFR Performance Over Time
Device
From: 7/4/2005
To: 6/29/2006
Technology
Div
Eval Num
TV
Temp Volt
Duration
B53
CCD
052404
1
7B6936AC-LLYC
125C
3.8V
168
360
0
CCD
052404
1
7B6936AC-LLYC
125C
3.8V
332
360
0
Summary for 'Technology' = B53 (2 detail records)
Sum
C8
720
0
043004
1B
7C87741A
125C
2.35V
168
89
0
CCD
043004
3C
7C87741A
125C
2.35V
1000
253
0
CCD
043004
4
7C87740A
125C
2.35V
168
166
0
CCD
043004
5A
7C87741A
125C
2.35V
524
175
0
CCD
043004
5A
7C87741A
125C
2.35V
168
175
0
CCD
043004
6
7C87741A
125C
2.35V
1000
196
0
1054
0
MID
052207
R1
CY7C1041DV33
150C
3.77
80
1295
0
MID
052207
R1
CY7C1041DV33
150C
3.77
420
1293
0
MID
052207
R1A
CY7C1041DV33
150C
3.77
80
249
0
MID
052207
R1A
CY7C1041DV33
150C
3.77
420
249
0
MID
052207
R2
CY7C1041DV33
150C
3.77
80
1516
0
MID
052207
R3
CY7C1041DV33
150C
3.77
80
1516
0
150C
5.75V
420
Summary for 'Technology' = C9 (6 detail records)
Sum
P26
Rejects FA
CCD
Summary for 'Technology' = C8 (6 detail records)
Sum
C9
SS
6118
0
117
0
CCD
054604
3
7C634131CU-OPZC
CCD
054604
3
7C634131CU-OPZC
150C
5.75V
80
117
0
CCD
054604
R2
CY7C65113C-SXC
150C
5.75
80
130
0
CCD
054604
R2
CY7C65113C-SXC
150C
5.75
420
130
0
CCD
054604
R3
CY7C65113C-SXC
150C
5.75
80
130
0
CCD
054604
R3
CY7C65113C-SXC
150C
5.75
420
130
0
CCD
054605
1
7C637402AU-OPZC
150C
5.75V
169
240
0
CCD
054605
1
7C637402AU-OPZC
150C
5.75V
100
240
0
CCD
054605
2
7C637402AU-OPZC
150C
5.75V
256
239
0
CCD
054605
3
7C637402AU-OPZC
150C
5.75V
256
240
0
CCD
060304
R4
CY7C65113
150C
5.5
80
120
0
CCD
060304
R4
CY7C65113
150C
5.5
420
120
0
CCD
060304
R5
CY7C65113
150C
5.5
80
116
0
CCD
060304
R5
CY7C65113
150C
5.5
420
116
0
CCD
060304
R6
CY7C65113
150C
5.5
80
120
0
2006 Q2 RELIABILITY REPORT
Page 27 of 93
Results
Product Reliability
Technology
Div
Eval Num
TV
CCD
060304
R6
Device
CY7C65113
Temp Volt
Duration
150C
5.5
420
Summary for 'Technology' = P26 (16 detail records)
Sum
POWER 165
0
2425
0
R1
CYK128K16SCBU-55BVXI
125C
3.8
check
150
0
MID
MR052047
R1
CYK128K16MCCBU-55BVIT
150C
3.8
168
150
0
MID
MR052047
R1
CYK128K16MCCBU-55BVIT
150C
3.8
332
150
0
MID
MR054051
R1
CYK128K6C7BW-70BVI
125C
3.8
168
300
0
MID
MR054051
R1
CYK128K6C7BW-70BVI
125C
3.8
832
300
0
1050
0
150C
2.1
80H
400
0
0
MID
054601
R2(1)
CYU01M6TF53CZ
MID
054601
R2(1)
CYU01M6TF53CZ
150C
2.1
check
400
MID
054601
R3
CYU01M6TF53CZ
150C
2.1
80H
400
0
MID
054601
R3
CYU01M6TF53CZ
150C
2.1
check
400
0
MID
054601
R4
CYU01M6TF53CZ
150C
2.1
80H
400
0
MID
054601
R4
CYU01M6TF53CZ
150C
2.1
check
399
0
2399
0
0
DCD
MR062066
R1
7C433DT-MJZC
150C
5.75
500
300
MID
MR052086
R1
CY7C185-25VC
150C
5.75
44
150
0
MID
MR052086
R1
CY7C185-25VC
150C
5.75
412
145
0
595
0
150C
3.8
420
150
0
Summary for 'Technology' = R28 (3 detail records)
Sum
R42
Rejects FA
MR051083
Summary for 'Technology' = PROMOS S12 (6 detail records)
Sum
R28
120
MID
Summary for 'Technology' = POWER 165 (5 detail records)
Sum
PROMOS S12
SS
DCD
MR053011
R1
CY7C038V-25AC
DCD
MR053011
R1
CY7C038V-25AC
150C
3.8
80
150
0
DCD
MR054046
R1
CY7C024AV-20AXI
125C
3.8
832
297
0
DCD
MR054046
R1
CY7C024AV-20AXI
125C
3.8
168
297
0
DCD
MR054063
R1
CY7C026AV-25AXI
125C
3.8
832
294
0
DCD
MR054063
R1
CY7C026AV-25AXI
125C
3.8
168
294
0
MID
053407
R1
CY62256LL
150C
5.75
500
125
0
MID
053407
R2
CY62256LL
150C
5.75
500
125
0
MID
053407
R3
CY62256LL
150C
5.75
500
125
0
MID
MR053024
R1
CG6521M
125C
5.75
832
150
0
MID
MR053024
R1
CG6521M
125C
5.75
168
150
0
MID
MR053034
R1
CG6520AM
125C
5.25
832
147
0
MID
MR053034
R1
CG6520AM
125C
5.25
168
150
0
MID
MR054031
R1
CY62256LL-55SNXI
125C
5.75
832
150
2006 Q2 RELIABILITY REPORT
0
Page 28 of 93
Results
Product Reliability
Technology
Div
Eval Num
TV
Temp Volt
Duration
MID
MR054031
R1
CY62256LL-55SNXI
Device
125C
5.75
96
MID
MR054053
R1
CG6519AM
125C
5.75
96
150
0
MID
MR054053
R1
CG6519AM
125C
5.75
832
150
0
MID
MR061014
R1
CS5756AT
125C
5.75
12
300
0
MID
MR061014
R1
CS5756AT
125C
5.75
832
MID
MR061030
R1
CS5756AT
125C
5.75
1000
296
0
MID
MR062043
R1
CY7C199-25VC
150C
5.75
420
300
0
MID
MR062043
R1
CY7C199-25VC
150C
5.75
80
300
0
Summary for 'Technology' = R42 (22 detail records)
Sum
R52
SS
Rejects FA
150
0
0
4250
0
CCD
043801
1
7C823C09AC-MSZI
150C
3.8V
80
120
0
CCD
043801
1
7C823C09AC-MSZI
150C
3.8V
420
120
0
CCD
051903
R1
CY221R28-ZXC
150C
2.875
80
116
0
CCD
051903
R1
CY221R28-ZXC
150C
2.875
420
116
0
CCD
051903
R2
CY221R28-ZXC
150C
2.875
80
116
0
CCD
051903
R2
CY221R28-ZXC
150C
2.875
420
116
0
CCD
052805
R1
CY7C67300-100AXI
150C
3.8
500
49
0
CCD
052805
R1
CY7C67300-100AXI
150C
3.8
408
50
0
DCD
052103
R1
CYD256B16-55AXI
150C
3.45
420
119
0
DCD
052103
R1
CYD256B16-55AXI
150C
3.45
80
120
0
MID
MR052029
R1
CY62136VLL-70ZI
125C
3.8
832
150
0
MID
MR052029
R1
CY62136VLL-70ZI
125C
3.8
168
150
0
MID
MR053007
R1
CG6513AM
150C
2.3
80
150
0
MID
MR053007
R1
CG6513AM
150C
2.3
432
150
0
MID
MR053022
R1
CY62136VLL-70ZXI
150C
2.3
168
150
0
MID
MR053022
R1
CY62136VLL-70ZXI
150C
2.3
832
150
0
MID
MR053048
R1
CY7C1399B-12VC
150C
2.45
468
150
0
MID
MR053048
R1
CY7C1399B-12VC
150C
2.45
80
150
0
MID
MR054020
R1
CY62136VLL-55ZI
125C
3.8
check
298
0
MID
MR054020
R1
CY62136VLL-55ZI
125C
3.8
168
298
MID
MR054030
R1
CY7C1399B-12VC
150C
3.8
80
MID
MR054030
R1
CY7C1399B-12VC
150C
3.8
408
150
MID
MR054030
R1
CY7C1399B-12VC
150C
3.8
12
300
0
MID
MR062048
R1
CY7C1399B-12VC
150C
3.8
420
300
0
MID
MR062048
R1
CY7C1399B-12VC
150C
3.8
80
300
0
3888
0
Summary for 'Technology' = R52 (25 detail records)
Sum
2006 Q2 RELIABILITY REPORT
0
0
0
Page 29 of 93
Results
Product Reliability
Technology
Div
Eval Num
TV
Temp Volt
Duration
R7
CCD
MR052042
R1
CY7C1018CV33-15VC
Device
150C
3.8
402
150
0
CCD
MR052042
R1
CY7C1018CV33-15VC
150C
3.8
98
150
0
MID
055103
R1
CY7C1313AVIB
125C
2.07
80
126
0
MID
055103
R2
CY7C1313AVIB
125C
2.07
80
126
0
MID
MR044074
R1
CY7C1061AV33-10ZC
125C
2.45
179
150
0
MID
MR044074
R1
CY7C1061AV33-10ZC
125C
2.45
821
150
0
MID
MR052048
R1
CY7C1049CV33-10VC
150C
2.3
432
150
0
MID
MR052048
R1
CY7C1049CV33-10VC
150C
2.3
80
150
0
MID
MR053025
R1
CY7C1021CV33-15VC
150C
2.3
420
150
0
MID
MR053025
R1
CY7C1021CV33-15VC
150C
2.3
80
150
0
MID
MR053026
R1
CY7C1021CV33-15VXC
150C
5.5
80
150
0
MID
MR053026
R1
CY7C1021CV33-15VXC
150C
5.5
420
150
0
MID
MR061031
R1
CY7C1381C-100AC
150C
2.3
80
299
0
MID
MR061031
R1
CY7C1381C-100AC
150C
2.3
420
292
0
MID
MR061048
R1
CY7C1021CV33-10ZC
150C
2.3
420
181
0
Rejects FA
MID
MR061048
R1
CY7C1021CV33-10ZC
150C
2.3
80
181
0
MID
MR062036
R1
CY7C1021GC-RZSC
150C
2.3
404
300
0
MID
MR062036
R1
CY7C1021GC-RZSC
150C
2.3
96
300
0
MID
MR062042
R1
7C1319GC-RVC
150C
2.3
297
0
MID
MR062042
R1
7C1319GC-RVC
150C
2.3
12
297
0
MID
MR062042
R1
7C1319GC-RVC
150C
2.3
80
MID
MR062042
R1
7C1319GC-RVC
150C
2.3
12
MID
MR062055
R1
CY7C1041CV33-15VI
150C
2.3
420
293
0
MID
MR062055
R1
CY7C1041CV33-15VI
150C
2.3
80
300
0
4492
0
Summary for 'Technology' = R7 (24 detail records)
Sum
R8
SS
0
0
MID
MR051080
R1
CY62157DV30LL-70BV
125C
2.4
524
149
0
MID
MR051080
R1
CY62157DV30LL-70BV
125C
2.4
168
150
0
MID
MR052028
R1
CY62128DV30LL-55ZI
150C
2.4
420
148
0
MID
MR052028
R1
CY62128DV30LL-55ZI
150C
2.4
44
150
0
MID
MR054032
R1
CY62167DV30LL-70BVI
125C
2.4
168
298
0
MID
MR054032
R1
CY62167DV30LL-70BVI
125C
2.4
832
298
0
MID
MR062037
R1
CY62128DV30LL-70SI
150C
2.4
80
300
0
MID
MR062037
R1
CY62128DV30LL-70SI
150C
2.4
check
300
0
MID
MR062051
R1
CY62147DV18LL-70BVI
125C
2.4
168
298
0
MID
MR062051
R1
CY62147DV18LL-70BVI
125C
2.4
832
297
0
2006 Q2 RELIABILITY REPORT
Page 30 of 93
Results
Product Reliability
Technology
Div
Eval Num
TV
Temp Volt
Duration
R8
MID
MR062056
R1
CY62147DV30L-55ZSXI
Device
125C
2.4
168
300
0
MID
MR062056
R1
CY62147DV30L-55ZSXI
125C
2.4
832
300
0
Summary for 'Technology' = R8 (12 detail records)
Sum
R9
SS
Rejects FA
2988
0
ALL
053901
R1
CY7C1370D
150C
2.25
80
120
0
ALL
053901
R1
CY7C1370D
150C
2.25
420
120
0
ALL
053901
R2
CY7C1370D
150C
2.25
80
120
0
ALL
053901
R2
CY7C1370D
150C
2.25
420
119
0
MID
045202
R1
CY62127EV
150C
1.85
80
399
0
MID
045202
R1
CY62127EV
150C
1.85
420
396
0
MID
052203
R3
CY7C1370
150C
2.25
500
398
0
MID
052607
R1
CY7C1339G
150C
2.25
408
50
0
MID
053704
R1A
CY7C1370
150C
2.25
80
390
0
MID
053704
R1A
CY7C1370
150C
2.25
420
390
0
MID
054302
R1A
CY62147EV30*
150C
1.85
80
400
0
MID
054302
R1A
CY62147EV30*
150C
1.85
420
399
1 043306-1L2
MID
054302
R5
CY62147EV30*
150C
1.85
80
400
0
MID
054302
R5
CY62147EV30*
150C
1.85
420
400
0
MID
054302
R7
CY62147EV30*
150C
1.85
80
400
0
MID
054302
R7
CY62147EV30*
150C
1.85
420
400
0
MID
054801
R3
CY7C1470V33
150C
2.25
80
394
0
MID
054909
R1
CY62157EV
150C
1.85
420
498
0
MID
054909
R1
CY62157EV
150C
1.85
80
499
0
MID
054909
R2
CY62157EV
150C
1.85
420
150
0
MID
054909
R2
CY62157EV
150C
1.85
80
150
0
MID
054909
R2A
CY62157EV
150C
1.85
420
298
0
MID
054909
R2A
CY62157EV
150C
1.85
80
299
0
MID
MR052054
R1
CY7C1347G-133AXC
150C
2.25
40
150
0
MID
MR052054
R1
CY7C1347G-133AXC
150C
2.25
412
150
0
MID
MR052056
R1
CY7C1347G-133AXC
150C
2.25
408
146
0
MID
MR052056
R1
CY7C1347G-133AXC
150C
2.25
44
150
0
MID
MR052058
R1
CY7C1347G-133AXC
150C
2.25
44
147
0
MID
MR052058
R1
CY7C1347G-133AXC
150C
2.25
420
147
0
MID
MR054070
R1
CY7C1347G-250AXC
150C
2.25
420
292
0
MID
MR054070
R1
CY7C1347G-250AXC
150C
2.25
80
297
1 MR054070-1L1
MID
MR054071
R1
CY7C13560CC-RAZC
150C
2.25
420
290
2006 Q2 RELIABILITY REPORT
0
Page 31 of 93
Results
Bloacked contact
No visual defect
Product Reliability
Technology
Div
Eval Num
TV
Temp Volt
Duration
MID
MR054071
R1
CY7C13560CC-RAZC
Device
150C
2.25
80
297
0
MID
MR062054
R1
CY7C1347C-133AXC
150C
2.25
420
296
0
MID
MR062054
R1
CY7C1347C-133AXC
150C
2.25
80
298
0
150C
3.8V
420
Summary for 'Technology' = R9 (35 detail records)
Sum
S4
SS
Rejects FA
9849
2
120
0
CCD
050507
1B
7C84980AT-TZZC
CCD
050507
1B
7C84980AT-TZZC
150C
3.8V
80
120
0
CCD
052004
R1
CY8C21234-24SXI
125C
5.5
750
235
0
CCD
052004
R4
CY8C21234-24SXI
125C
5.5
630
235
0
CCD
052004
R4
CY8C21234-24SXI
125C
5.5
120
235
0
CCD
052004
R5
CY8C21234-24SXI
125C
5.5
120
235
0
CCD
052004
R5
CY8C21234-24SXI
125C
5.5
630
235
0
CCD
052701
1
7C825701A
125C
3.8V
92
645
0
CCD
052701
1
7C825701A
125C
3.8V
408
600
0
CCD
052701
1
7C825701A
125C
3.8V
500
600
0
CCD
052701
1A
7C825701AT-ERLC
125C
3.8V
420
600
0
CCD
052701
1A
7C825701AT-ERLC
125C
3.8V
500
597
0
CCD
052701
1A
7C825701AT-ERLC
125C
3.8V
80
646
0
CCD
053603
R1
CY8C24794-24LFXI
125C
5.5
24
177
0
CCD
060401
2
8C21534AC-TSPI
125C
5.5V
750
235
0
CCD
MR052082
R1
CY8C24223A-24PVXI
125C
2.3
832
143
0
CCD
MR052082
R1
CY8C24223A-24PVXI
125C
2.3
168
143
0
CCD
MR052083
R1
CY8C26443-24PVI
125C
5.5
500
149
0
CCD
MR052083
R1
CY8C26443-24PVI
125C
5.5
168
149
0
CCD
MR053020
R1
CY22392ZXI-353
150C
3.8
44
150
0
CCD
MR054028
R1
CY8C26443-24PVI
125C
2.3
168
300
0
CCD
MR054028
R1
CY8C26443-24PVI
125C
2.3
832
300
0
CCD
MR054047
R1
CY8C24223A-24PVXI
150C
2.3
168
200
0
CCD
MR054047
R1
CY8C24223A-24PVXI
150C
2.3
832
200
0
CCD
MR054074
R1
CY8C21534-24PVXI
125C
5.5
832
250
0
CCD
MR054074
R1
CY8C21534-24PVXI
125C
5.5
168
250
0
CCD
MR054075
R1
CY8C24423A-24PVXI
125C
5.5
check
224
0
CCD
MR061015
R1
CY8C27443-24PVXI
125C
5.5
check
251
0
CCD
MR061015
R1
CY8C27443-24PVXI
125C
5.5
832
251
0
CCD
MR061016
R1
CP6458BM
125C
5.5
832
192
0
CCD
MR061016
R1
CP6458BM
125C
5.5
168
192
0
CCD
MR061024
R1A
CY22394FC
150C
3.8
80
299
CCD
MR061024
2006 Q2 RELIABILITY REPORT
R1A
CY22394FC
150C
3.8
420
299
0
0
Page 32 of 93
Results
Product Reliability
Technology
Div
Eval Num
TV
Device
Temp Volt
Duration
S4
CCD
MR061025
R1
CY22392ZI-341
150C
3.8
80
200
0
CCD
MR061025
R1
CY22392ZI-341
150C
3.8
420
200
0
CCD
MR061028
R1
CY22392ZXC-345
150C
2.3
420
295
0
CCD
MR061028
R1
CY22392ZXC-345
150C
2.3
check
299
0
CCD
MR061029
R1
CY22393FI
150C
2.3
check
295
0
CCD
MR061029
R1
CY22393FI
150C
2.3
420
297
0
Summary for 'Technology' = S4 (39 detail records)
Sum
STARM
11043
0
MR054023
R1
CY7B991-5JC
125C
6.6
168
200
0
CCD
MR054023
R1
CY7B991-5JC
125C
6.6
832
200
0
DCD
MR051034
R1
CY7B933-JC
125C
6.5
168
75
0
DCD
MR051034
R1
CY7B933-JC
125C
6.5
832
75
0
DCD
MR051034
R1A
CY7B933-JC
125C
6.5
168
75
0
DCD
MR051034
R1A
CY7B933-JC
125C
6.5
832
75
0
DCD
MR052076
R1
CY7B991-7JCT
125C
6.6
168
149
0
DCD
MR052076
R1
CY7B991-7JCT
125C
6.6
832
149
0
DCD
MR054033
R1
CY7B933-JC
125C
6.5V
196
85
0
DCD
MR054033
R1A
CY7B933-JC
125C
6.5
168
85
0
DCD
MR054033
R1A
CY7B933-JC
125C
6.5
832
85
0
DCD
MR054033
R1B
CY7B933-JC
125C
6.5
832
84
0
DCD
MR054033
R1B
CY7B933-JC
125C
6.5
168
84
0
DCD
MR054033
R1C
CY7B933-JC
125C
6.5
168
45
0
DCD
MR054033
R1C
CY7B933-JC
125C
6.5
832
44
0
1510
0
DCD
034001
1B
7C72250AJ-GQFGC
125C
1.8V
487
141
0
DCD
034001
3B
7C72250BJ-GQFGC
125C
1.38V
168
46
0
DCD
034001
3B
7C72250BJ-GQFGC
125C
1.38V
500
43
0
DCD
034001
3B
7C72250BJ-GQFGC
125C
1.38V
332
43
0
Summary for 'Technology' = TSMC 130 (4 detail records)
Sum
TSMC 180
Rejects FA
CCD
Summary for 'Technology' = STARM (15 detail records)
Sum
TSMC 130
SS
273
0
MID
052003
1
7ISC305BF-IPQYC
150C
2.07V
408
51
0
MID
052003
1
7ISC305BF-IPQYC
150C
2.07V
44
51
0
MID
052003
2
7ISC305BF-IPQYC
150C
2.07V
420
55
0
MID
052003
2
7ISC305BF-IPQYC
150C
2.07V
80
55
0
MID
052003
3
7ISC305BF-IPQYC
150C
2.07V
420
55
0
MID
052003
3
7ISC305BF-IPQYC
150C
2.07V
80
55
0
Summary for 'Technology' = TSMC 180 (6 detail records)
Sum
2006 Q2 RELIABILITY REPORT
322
0
Page 33 of 93
Results
Product Reliability
Technology
Div
Eval Num
TV
Temp Volt
Duration
TSMC 500
DCD
MR054057
R1
CY37128P84
Device
150C
5.75
80
146
0
DCD
MR054057
R1A
CY37128P84
150C
5.75
80
139
0
DCD
MR054057
R1A
CY37128P84
150C
5.75
420
139
0
Summary for 'Technology' = TSMC 500 (3 detail records)
Sum
Grand Total
2006 Q2 RELIABILITY REPORT
SS
Rejects FA
424
0
53400
2
Page 34 of 93
Results
Product Reliability
Summary Detail -- DRET Performance Over Time
Device
From: 7/6/2005
To: 6/29/2006
Technology
Div
Eval Num
TV
P26
CCD
054604
R1
CY7C64013C-SXC
Temp Volt
150C
500
Duration
500
80
0
CCD
054604
R1
CY7C64013C-SXC
150C
1000
500
80
0
CCD
054604
R2
CY7C65113C-SXC
150C
500
500
80
0
CCD
054604
R2
CY7C65113C-SXC
150C
1000
500
80
0
CCD
054604
R4
CY7C63413
150C
500
500
80
0
Rejects FA
CCD
054604
R4
CY7C63413
150C
1000
500
80
0
CCD
054605
1
7C637402AU-OPZC
165C
552
384
80
0
CCD
054605
1
7C637402AU-OPZC
165C
168
168
80
0
CCD
054605
2
7C637402AU-OPZC
165C
552
384
82
0
CCD
054605
2
7C637402AU-OPZC
165C
168
168
82
0
Summary for 'Technology' = P26 (10 detail records)
Sum
S4
SS
804
0
CCD
052004
R1
CY8C21234-24SXI
150C
500
500
256
0
CCD
052004
R1
CY8C21234-24SXI
150C
1000
500
256
0
CCD
052004
R2
CY8C21234-24SXI
150C
500
500
256
0
CCD
052004
R2
CY8C21234-24SXI
150C
1000
500
254
0
CCD
052004
R3
CY8C21234-24SXI
150C
1000
500
252
0
CCD
052004
R3
CY8C21234-24SXI
150C
500
500
252
0
CCD
MR051052
R1
CY23FP12OXC-003
150C
500
500
49
0
CCD
MR051052
R1
CY23FP12OXC-003
150C
1000
500
48
0
0
CCD
MR053010
R1
CY8C24794-24LFXI
150C
500
500
50
CCD
MR053059
R1
CY26049ZC-36
150C
500
500
50
0
CCD
MR053059
R1
CY26049ZC-36
150C
1000
500
50
0
CCD
MR054017
R1
CY22392ZXC
150C
500
500
50
0
CCD
MR054017
R1
CY22392ZXC
150C
1000
500
50
0
CCD
MR054047
R1
CY8C24223A-24PVXI
150C
500
500
76
0
CCD
MR054047
R1
CY8C24223A-24PVXI
150C
1000
500
76
0
CCD
MR054075
R1
CY8C24423A-24PVXI
150C
500
500
76
0
CCD
MR061015
R1
CY8C27443-24PVXI
150C
1000
500
76
0
CCD
MR061015
R1
CY8C27443-24PVXI
150C
500
500
76
0
CCD
MR061019
R1
C722393FI
150C
1000
500
50
0
CCD
MR061019
R1
C722393FI
150C
500
500
50
0
CCD
MR061049
R1
CY22392ZC-347
150C
1000
500
50
0
CCD
MR061049
R1
CY22392ZC-347
150C
500
500
50
0
CCD
MR061050
2006 Q2 RELIABILITY REPORT
R1
CY23FS04ZXI
150C
1000
500
50
0
Page 35 of 93
Results
Product Reliability
Technology
Div
Eval Num
TV
Device
S4
CCD
MR061050
R1
CY23FS04ZXI
Temp Volt
150C
500
Duration
500
50
0
CCD
MR062009
R1
CY22392ZXI
150C
500
500
50
0
CCD
MR062009
R1
CY22392ZXI
150C
1000
500
50
0
Summary for 'Technology' = S4 (26 detail records)
Sum
TSMC 500
SS
Rejects FA
2653
0
DCD
MR054056
R1
CY37064P84-125JC
150C
500
500
76
0
DCD
MR054056
R1
CY37064P84-125JC
150C
1000
500
76
0
Summary for 'Technology' = TSMC 500 (2 detail records)
Sum
Grand Total
2006 Q2 RELIABILITY REPORT
152
0
3609
0
Page 36 of 93
Results
Product Reliability
Summary Detail, Package -- HAST Performance Over Time
From: 7/6/2005
To: 7/2/2006
BldKit
AssyLoc
EvalNum
TV
Device
Temp
Volt
Readout
SS Rejects FA
Results
FBGA (0.75-0.8)
BA48AUALE
RA-CML
MR052085
R1
CY7C1021BV33L-15BAI
130C
3.63
128
12
0
BA48AUALE
RA-CML
MR052085
R1A
CY7C1021BV33L-15BAI
130C
5.5
128
25
0
BA48BQAALE
RA-CML
MR061059
R1
CY62137CVSL-70BAI
130C
5.5
128
35
0
BA48BQAALE
RA-CML
MR061059
R1A
CY62137CVSL-70BAI
130C
5.5
128
13
0
BA48DJALE
G-TAIWAN
045101
R2
7C62172DC-GBAI
130C
3.63
128
45
0
BA48DJALE
G-TAIWAN
052502
R1
CY62177DV30L
130C
3.63
128
45
0
175
0
Summary for 'PkgFamily' = FBGA (0.75-0.8) (6 detail records)
Sum
FBGA (1.0)
BB165WALE
RA-CML
055103
1
7R1313BC-RABBC
130C
2.07V
128
24
0
BB165WALE
RA-CML
055103
2
7R1313BC-RABBC
130C
1.8V
128
25
0
BB165WALE
RA-CML
055103
2(1)
7R1313BC-RABBC
130C
1.8V
128
25
0
BB165WALE
RA-CML
055103
3
7R1313BC-RABBC
130C
2.07V
128
25
0
BB165WALE
RA-CML
055103
3(1)
7R1313BC-RABBC
130C
2.07V
128
22
0
121
0
Summary for 'PkgFamily' = FBGA (1.0) (5 detail records)
Sum
FLIPCHIP (Build-Up Substrate w/ HS)
FG1152AGE
GQ-KOREA 034001
1A
7C72250AJ-GQFGC
130C
0.65V
128
32
0
FG1152AGE
GQ-KOREA 034001
1C
7C72250AJ-GQFGC
130C
.66V
128
36
0
FG1152AGE
GQ-KOREA 034001
1C(1)
7C72250AJ-GQFGC
130C
0.65V
128
15
0
83
0
Summary for 'PkgFamily' = FLIPCHIP (Build-Up Substrate w/ HS) (3 detail records)
Sum
FVBGA (0.75-0.8, 0.3mm)
BV48ASALE
RA-CML
MR061056
R1
CY62147DV30LL-70BVI
130C
5.5
128
49
0
BV48ASALE
RA-CML
MR062039
R1
CY62147DV18LL-70BVI
130C
2.2
128
50
0
BV48BKALE
RA-CML
MR053023
R1
CYK128K6C7BW-70BVI
130C
3.63
128
44
5 MR053023-1A1
BV48BZALL
RA-CML
054601
1C
U01M6TF53CZ-RABVI
130C
1.95V
128
44
0
2006 Q2 RELIABILITY REPORT
Page 37 of 93
5-Copper trace shorting. CAR# to
follow.
Product Reliability
BldKit
AssyLoc
EvalNum
TV
Device
Temp
Volt
Readout
SS Rejects FA
FVBGA (0.75-0.8, 0.3mm)
BV48BZALL
RA-CML
054601
R1
CYU01M6TF53CZ
130C
1.95
128
25
0
BV48CAALL
G-TAIWAN
054601
5
U01M6TF53CZ-GBZI
130C
1.95V
128
46
0
BV48CAALL
G-TAIWAN
054601
6
U01M6TF53CZ-GBZI
130C
1.95V
128
48
0
BV48HAALE
G-TAIWAN
MR051014
R1
CY62147CV33LL-70BVI
130C
3.63
128
45
0
BV48VAALE
G-TAIWAN
MR052084
R1
CY62137CV30LL-70BVIT
130C
5.5
128
20
0
BV52BGAGE
G-TAIWAN
043004
3A
7C87742A
130C
1.8
128
46
0
BV52BGAGE
G-TAIWAN
043004
3C
7C87741A
130C
2.35V
128
45
0
BV52BGAGE
G-TAIWAN
043004
6
7C87741A
130C
1.8V
128
43
0
BV52BGAGE
G-TAIWAN
043004
6A
7C87742A
130C
2.35V
128
46
0
BV52BGAGE
G-TAIWAN
043004
8
7C87742A
130C
2.35V
128
46
0
597
5
Summary for 'PkgFamily' = FVBGA (0.75-0.8, 0.3mm) (14 detail records)
Sum
PBGA (Cavity/Heatsink, Pb-Free)
BJ504AAGL
G-TAIWAN
044507
4
7C9536CH-GBJC
130C
1.98V
128
39
0
BJ504AAGL
G-TAIWAN
044507
4(1)
7C9536CH-GBJC
130C
1.98V
128
11
0
BJ504AAGL
G-TAIWAN
044507
5
7C9536CH-GBJC
130C
1.98V
128
28
0
BJ504AAGL
G-TAIWAN
044507
5(1)
7C9536CH-GBJC
130C
1.98V
128
20
0
BJ504AAGL
G-TAIWAN
044507
R4
CY7C9536B-BLXC
130C
1.98
128
39
0
BJ504AAGL
G-TAIWAN
044507
R4(1)
CY7C9536B-BLXC
130C
1.98
128
11
0
BJ504AAGL
G-TAIWAN
044507
R5
CY7C9536B-BLXC
130C
1.98
128
28
0
BJ504AAGL
G-TAIWAN
044507
R5(1)
CY7C9536B-BLXC
130C
1.98
128
20
0
196
0
Summary for 'PkgFamily' = PBGA (Cavity/Heatsink, Pb-Free) (8 detail records)
Sum
PBGA (Heat Spreader)
BH388AAGE
G-TAIWAN
050703
1B
7C7040AH-GBTC
130C
1.58V
128
24
0
BH388AAGE
G-TAIWAN
050703
1B
7C7040AH-GBTC
130C
1.58V
128
24
0
48
0
Summary for 'PkgFamily' = PBGA (Heat Spreader) (2 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 38 of 93
Results
Product Reliability
BldKit
AssyLoc
EvalNum
TV
Device
Temp
Volt
Readout
SS Rejects FA
PBGA (Heat Spreader, Pb-Free)
BT388AGAL
G-TAIWAN
050703
2
7C7040AH-GBTC
130C
1.58V
128
Summary for 'PkgFamily' = PBGA (Heat Spreader, Pb-Free) (1 detail record)
Sum
24
0
24
0
PDIP
P203CGAGB
O-INDNS
MR053013
R1
CY7C168A-35PC
130C
5.5
128
45
0
P286EGAGB
O-INDNS
MR054044
R1
CY62256LL-70PC
130C
5.5
128
50
0
95
0
Summary for 'PkgFamily' = PDIP (2 detail records)
Sum
PDIP (Pb-Free)
PZ183AXGN
O-INDNS
MR054048
R1
CY7C63723-PXC
130C
5.5
128
50
0
PZ183AXGN
O-INDNS
MR061013
R1
CP6238BM
130C
5.5
128
45
0
PZ243AAGN
X-THAI
051206
R1
CY7C63743-PXC
130C
5.5
128
48
0
PZ243AAGN
X-THAI
051206
R2
CY7C63743-PXC
130C
5.5
128
49
0
PZ243DXGN
O-INDNS
054605
1
7C637402AU-OPZC
130C
5.75V
128
48
0
PZ243DXGN
O-INDNS
054605
2
7C637402AU-OPZC
130C
5.75V
128
51
0
PZ2831GAN
O-INDNS
MR053014
R1
CY7C64013A-PXC
130C
5.5
128
45
0
PZ406AGN
O-INDNS
054604
3
7C634131CU-OPZC
130C
5.5V
128
24
0
PZ406AGN
O-INDNS
054604
3(1)
7C634131CU-OPZC
130C
5.5V
128
24
0
384
0
Summary for 'PkgFamily' = PDIP (Pb-Free) (9 detail records)
Sum
PLCC
J28SEGAGB
M-PHIL
MR054019
R1
CY7B923-JC
130C
5.5
128
50
0
J32RBGAGB
X-THAI
MR061051
R1
CY7B991-7JC
130C
5.5
128
50
0
J32RNGAGE
M-PHIL
MR053031
R1
CY7C4271V-25JC
130C
5.5
128
50
0
J52SFGAGB
M-PHIL
MR061020
R1
CY7C136-55JI
130C
5.5
128
50
0
J68SCGAGB
X-THAI
MR054061
R1
CY7C144-55JCT
130C
5.5
128
48
0
248
0
Summary for 'PkgFamily' = PLCC (5 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 39 of 93
Results
Product Reliability
BldKit
AssyLoc
EvalNum
TV
Device
Temp
Volt
Readout
SS Rejects FA
PLCC (Pb-Free)
JZ32RBGAN
M-PHIL
MR053028
R1
CY7C419-15JXC
130C
5.5
128
41
0
JZ52SFGAN
M-PHIL
MR061061
R1
CYC131-25JXC
130C
5.5
128
50
0
JZ52SFGAN
M-PHIL
MR062017
R1
CY7C136-25JXC
130C
5.5V
128
50
0
141
0
Summary for 'PkgFamily' = PLCC (Pb-Free) (3 detail records)
Sum
QFN (Punch Type)
LF56AGAGE
L-SEOL
MR051075
R1
CY7C65640A-LFC
130C
3.63
128
43
0
LF56AGAGE
L-SEOL
MR052016
R1
CY7C65640A-LFC
130C
5.5
128
40
0
LF56EGAGE
AC-ASE
054207
R4
CY7C65640-LFC
130C
5.5
128
45
0
128
0
Summary for 'PkgFamily' = QFN (Punch Type) (3 detail records)
Sum
QFN (Punch Type, Pb-Free)
LY32BGAGL
RA-CML
052610
R1
CY8C21434-24LFXI
130C
5.25
128
47
0
LY48EGAGL
L-SEOL
052401
1A
7B6953B-LLYC
130C
3.6V
128
50
0
LY56AGAGL
L-SEOL
MR062031
R1
CY7C65640A-LFXC
130C
3.63
128
45
0
LY56DGAGL
L-SEOL
MR053010
R1
CY8C24794-24LFXI
130C
5.5
128
49
0
LY56DGAGL
L-SEOL
MR054024
R1
CY7C68300B-56LFXC
130C
5.5
128
45
0
LY72AGAGL
L-SEOL
054206
R1
CY28447LF-XC
130C
3.3
128
48
0
284
0
Summary for 'PkgFamily' = QFN (Punch Type, Pb-Free) (6 detail records)
Sum
QSOP (Pb-Free)
SQ2414AGN
R-CML
MR054062
R1
CY7C63101A-QXC
130C
3.63
128
45
0
SQ2414AGN
R-CML
MR061071
R1
CY7C63101A-QXC
130C
3.63
128
44
0
SQ2414AGN
R-CML
MR062008
R1
CY7C637433-QXC
130C
5.5
128
45
0
134
0
44
0
Summary for 'PkgFamily' = QSOP (Pb-Free) (3 detail records)
Sum
SOIC (GullWing)
S1615AAGB
O-INDNS
2006 Q2 RELIABILITY REPORT
MR054041
R1
CY2308SC-1H
130C
3.8
128
Page 40 of 93
Results
Product Reliability
BldKit
AssyLoc
EvalNum
TV
Device
Temp
Volt
Readout
SS Rejects FA
S1615AAGB
O-INDNS
MR061012
R1
CY2308SI-1T
130C
3.8
128
45
0
S1615EAGB
M-PHIL
MR053002
R1
CY2309SC-1H
130C
3.8
128
41
0
S283HGAGB
O-INDNS
MR052073
R1
CY7B933-SC
130C
3.8
128
50
0
S324513GB
R-CML
MR061065
R1
CS5761AT
130C
5.5
128
45
0
S324513GB
R-CML
MR062004
R1
CS5761AT
130C
5.5
128
45
0
S324513GN
R-CML
MR053003
R1
CY6525AM
130C
5.5
128
50
0
S324513GN
R-CML
MR062022
R1
CY62128DV30LL-70SI
130C
5.5
128
49
0
369
0
Summary for 'PkgFamily' = SOIC (GullWing) (8 detail records)
Sum
SOIC (GullWing, 450 footprint)
SN2831AHB
R-CML
MR061036
R1
CS5756AT
130C
3.8
128H
45
0
SN2831AHN
R-CML
MR053037
R1
CY22313
130C
3.8
128
46
0
91
0
Summary for 'PkgFamily' = SOIC (GullWing, 450 footprint) (2 detail records)
Sum
SOIC (GullWing, 450 footprint, Pb-Free)
SY2831AHN
R-CML
053407
R1
CY62256LL
130C
5.25
128
45
0
SY2831AHN
R-CML
053407
R1(1)
CY62256LL
130C
5.25
128
32
0
SY2831AHN
R-CML
053407
R2
CY62256LL
130C
5.25
128
33
0
SY2831AHN
R-CML
053407
R2(1)
CY62256LL
130C
5.25
128
52
0
SY2831AHN
R-CML
053407
R3
CY62256LL
130C
5.25
128
85
0
SY2831AHN
R-CML
MR062047
R1
CY62256LL-70SNXI
130C
5.5
128
45
0
292
0
Summary for 'PkgFamily' = SOIC (GullWing, 450 footprint, Pb-Free) (6 detail records)
Sum
SOIC (GullWing, Pb-Free)
SZ1615
RA-CML
061704
R1
W129AG
130C
3.63
128
50
0
SZ1615
RA-CML
061704
R3A
W129AG
130C
3.63
128
45
0
SZ1615DGN
M-PHIL
052004
R1A
CY8C21234-24SXI
130C
5.25
128
49
0
SZ1615DGN
M-PHIL
052004
R2
CY8C21234-24SXI
130C
5.25
128
44
0
SZ1615DGN
M-PHIL
052004
R3
CY8C21234-24SXI
130C
5.25
128
44
0
SZ1615EGN
M-PHIL
MR052046
R1
CY2309SXC-1H
130C
3.8
128
47
0
SZ1615FAL
T-TAIWAN
MR061034
R1
CY23EP09SXC-1H
130C
3.8
128
48
2006 Q2 RELIABILITY REPORT
0
Page 41 of 93
Results
Product Reliability
BldKit
AssyLoc
EvalNum
TV
Device
Temp
Volt
Readout
SS Rejects FA
SOIC (GullWing, Pb-Free)
SZ1615FAL
T-TAIWAN
MR062060
R1
CY23EP09SXC-1H
130C
3.63
128
48
0
SZ1615KGN
RA-CML
MR062005
R1
7C80727AT-RASZI
130C
3.8
128
49
0
SZ18
OP-PHIL
060304
R1
CY7C63723
130C
5.5
128
50
0
SZ18
OP-PHIL
060304
R2
CY7C63723
130C
5.5
128
50
0
SZ1813AGAN
M-PHIL
MR062011
R1
CY7C63723-SXC
130C
5.5
128
47
0
SZ183CGAN
RA-CML
MR054016
R1
CY7C63723-SXC
130C
5.5
128
50
0
SZ24312GN
R-CML
MR061009
R1
CY7B951-SXC
130C
5.5
128
50
0
SZ24315GN
RA-CML
MR053032
R1
CY7C63743-SXC
130C
5.5
128
50
0
SZ28327GL
R-CML
054604
R1
CY7C64013C-SXC
130C
5.5
128
50
0
SZ28327GL
R-CML
054604
R2
CY7C65113C-SXC
130C
5.5
128
49
0
SZ324514LL
R-CML
MR062044
R1
CY62148DV30LL-55SXI
130C
3.6
128
45
0
865
0
Summary for 'PkgFamily' = SOIC (GullWing, Pb-Free) (18 detail records)
Sum
SOIC (J lead)
V2439GAGB
O-INDNS
MR054004
R1
CY7C128A-15VC
130C
5.5
128
50
0
V243GGBLE
O-INDNS
MR061083
R1
CY7C197B-15VC
130C
5.5
128
45
0
V32421GLN
R-CML
061401
R1
CY7C1019
130C
3.6
128
45
0
V324EGAGB
O-INDNS
MR052014
R1
CY7C1019B-10VC
130C
5.5
128
44
0
V324FGAGB
O-INDNS
MR053015
R1
CY7C109B-20VC
130C
3.63
128
44
0
V444ZGALL
R-CML
MR053004
R1
CY7C1021CV33
130C
5.5
128
50
0
V444ZGALL
R-CML
MR054001
R1
CY7C1021CV33-15VC
130C
5.5
128
45
0
V444ZGALL
R-CML
MR061006
R1
CY7C1021CV33-12VC
130C
5.5
128
45
0
V444ZGALL
R-CML
MR062026
R1
CY7C1021CV33-12VC
130C
3.6
128
45
0
413
0
Summary for 'PkgFamily' = SOIC (J lead) (9 detail records)
Sum
SOIC (J lead, Pb-Free)
VZ243GGBLL
O-INDNS
052801
R1
CY7C197
130C
5.25
128
50
0
VZ243GGBLL
O-INDNS
052801
R2
CY7C197
130C
5.25
128
50
0
VZ28311GL
R-CML
NR061004
R1
CY7C199C-15VXC
130C
5.5
128
50
0
VZ28311GL
R-CML
NR061004
R2
CY7C199C-15VXI
130C
5.5
128
50
2006 Q2 RELIABILITY REPORT
0
Page 42 of 93
Results
Product Reliability
BldKit
AssyLoc
EvalNum
TV
Device
Temp
Volt
Readout
SS Rejects FA
SOIC (J lead, Pb-Free)
VZ32311ALL
R-CML
NR061004
R3
CY7C1009B-15VXC
130C
5.5
128
50
0
VZ3644GALL
R-CML
MR053038
R1
CY7C1049B-20VXI
130C
5.5
128
46
0
VZ444YALL
R-CML
MR062001
R1
CY7C1041CV33-12VXC
130C
3.3
128
45
0
VZ444ZALL
R-CML
MR053005
R1
CY7C1021CV33-8VXC
130C
5.5
128
50
0
VZ444ZALL
R-CML
MR054002
R1
CY7C1021CV33-12VXC
130C
5.5
128
50
0
441
0
Summary for 'PkgFamily' = SOIC (J lead, Pb-Free) (9 detail records)
Sum
SSOP
O56
R-CML
MR061007
R1
CY284690CT
130C
5.5
128
O5615GAGB
T-TAIWAN
MR054039
R1
CY283410C-2
130C
3.8
128
45
0
O5615GAGB
T-TAIWAN
MR054039
R1A
CY283410C-2
130C
3.8
128
23
0
O563AXAGB
R-CML
MR053029
R1
CY28346OC
130C
3.3
128
32
0
100
0
Summary for 'PkgFamily' = SSOP (4 detail records)
Sum
0
SSOP (Pb-Free)
SP28214GL
T-TAIWAN
052004
R1
CY8C21234-24SXI
130C
5.25
128
22
0
SP28214GL
T-TAIWAN
MR062059
R1
CY8C24423A-24PVXI
130C
5.25
128
45
0
SP2824CAN
T-TAIWAN
053005
R1
CY28400OXC
130C
3.63
128
48
0
SP563AAGN
R-CML
MR053021
R1
CY28410OXC
130C
5.5
128
33
0
SP563AAGN
R-CML
MR053021
R1A
CY28410OXC
130C
5.5
128
13
0
SP563CAGE
T-TAIWAN
053502
R1
CY7C66113A-PVXC
130C
5.25
128
50
0
211
0
Summary for 'PkgFamily' = SSOP (Pb-Free) (6 detail records)
Sum
TQFP
A100SEGAGL
R-CML
MR053027
R1
CY7C9689A-AC
130C
5.5
128
41
0
A100SGAGL
R-CML
MR061002
R1
CY7C027V-25AC
130C
3.63
128
45
0
86
0
0
Summary for 'PkgFamily' = TQFP (2 detail records)
Sum
TQFP (10x10)
AS64BGAGB
G-TAIWAN
MR062080
R1
CY7C1012AV33-BBGC
130C
3.8
128
50
AS64CGAGB
Q-KOREA
MR053050
2006 Q2 RELIABILITY REPORT
R1
CY7C4275V-15ASC
130C
5.5
128
50
0
Page 43 of 93
Results
Product Reliability
BldKit
AS6513GAGB
AssyLoc
EvalNum
G-TAIWAN
MR052089
TV
R1
Device
CY7C4215V-15ASC
Temp
130C
Volt
5.5
Readout
128
Summary for 'PkgFamily' = TQFP (10x10) (3 detail records)
Sum
SS Rejects FA
46
0
146
0
TQFP (Pb-Free)
AZ100RIALL
R-CML
053901
R1
CY7C1370D
130C
3.6
128
48
0
AZ100RIALL
R-CML
053901
R2
CY7C1370D
130C
3.6
128
50
0
AZ100RIALL
R-CML
053901
R3
CY7C1370D
130C
3.6
128
47
0
AZ100RRLL
RA-CML
051702
R4
CY7C1470V33
130C
3.6
128
46
0
AZ100RSLL
R-CML
MR061068
R1
CY7C1347G-133AXC
130C
5.5
128
47
0
AZ100RSLL
R-CML
MR061068
R1A
CY7C1347G-133AXC
130C
5.5
128
50
0
AZ100SFAL
R-CML
MR061003
R1
7C024CT-RAZC
130C
5.5
128
45
0
AZ100SGAL
R-CML
053007
R2A
CY7C027V
130C
3.63
128
49
0
AZ52ASGAL
Q-KOREA
051902
R5
CY7B9945V-5AXCT
130C
3.63
128
50
0
432
0
Summary for 'PkgFamily' = TQFP (Pb-Free) (9 detail records)
Sum
TQFP (Thermal)
AT120AHAGE
L-SEOL
041701
R1
CYS25G0101DX-ATC
130C
3.63
128
28
0
AT120AHAGE
L-SEOL
041701
R1(1)
CYS25G0101DX-ATC
130C
3.63
128
3
0
AT120AHAGE
L-SEOL
041701
R1(2)
CYS25G0101DX-ATC
130C
3.63
128
4
0
35
0
46
0
46
0
Summary for 'PkgFamily' = TQFP (Thermal) (3 detail records)
Sum
TQFP (Thermal, Pb-Free)
AG120AGAL
L-SEOL
041701
2
7B9532BC-LAGC
130C
3.63V
128
Summary for 'PkgFamily' = TQFP (Thermal, Pb-Free) (1 detail record)
Sum
TSOP (Pb-Free)
ZT28R2AGN
R-CML
MR061010
R1
CY7C199-15ZXC
130C
5.5
128
49
0
ZT28R4AGL
R-CML
MR052011
R1
CY7C1399B-15ZXC
130C
5.5
128
50
0
ZT28R5GAGL
R-CML
060904
R4
CY7C199-15ZXC
130C
5.5
128
49
0
2006 Q2 RELIABILITY REPORT
Page 44 of 93
Results
Product Reliability
BldKit
AssyLoc
EvalNum
TV
Device
Temp
Volt
Readout
SS Rejects FA
ZT32RKGGL
T-TAIWAN
MR052044
R1
CY7C109B-15ZXC
130C
5.5
128
48
0
ZT32RYAGL
T-TAIWAN
MR051079
R1
CY2308SC-1
130C
3.63
128
49
0
245
0
TSOP (Pb-Free)
Summary for 'PkgFamily' = TSOP (Pb-Free) (5 detail records)
Sum
TSOP (Reverse)
ZR28R2AGN
R-CML
MR051013
R1
CY62256LL-70ZRI
130C
3.63
128
38
0
ZR28R2AGN
R-CML
MR053049
R1
CY62256LL-70ZRI
130C
5.5
128
39
0
77
0
47
0
47
0
Summary for 'PkgFamily' = TSOP (Reverse) (2 detail records)
Sum
TSOP (Reverse, Pb-Free)
ZY28R2AGN
R-CML
MR053057
R1
CY62256LL-70ZRXI
130C
5.5
128
Summary for 'PkgFamily' = TSOP (Reverse, Pb-Free) (1 detail record)
Sum
TSOP I
ZA32RHAALB
R-CML
MR052020
R1
CY62128DV30LL-55ZAI
130C
5.5
128
48
0
ZA32RHAALB
R-CML
MR053056
R1
CY62128DV30LL-55ZAI
130C
5.5
128
46
0
ZA32RHAALN
R-CML
MR062027
R1
CY62128DV30LL-70ZAI
130C
3.6
128
47
0
141
0
Summary for 'PkgFamily' = TSOP I (3 detail records)
Sum
TSOP I (Pb-Free)
ZB32RHALL
R-CML
MR061069
R1
CS6368AM
130C
5.5
128
42
0
ZB32RHALL
R-CML
MR062019
R1
CY62128DV30LL-70ZAXI
130C
3.6
128
49
0
91
0
Summary for 'PkgFamily' = TSOP I (Pb-Free) (2 detail records)
Sum
TSOP II
ZS324FAGE
T-TAIWAN
MR052009
R1
CY7C1019CV33-12ZC
130C
5.5
128
48
0
ZS324FAGE
T-TAIWAN
MR053055
R1
CY7C1019CV33-12ZC
130C
5.5
128
48
0
ZS444ABALE
R-CML
MR053058
R1
CS6125AT
130C
5.5
128
44
0
ZS444ABALE
R-CML
MR061067
R1
CS6334AS
130C
5.5
128
44
0
ZS444AJALN
R-CML
MR054008
R1
CY7C1021CV33-15ZC
130C
3.65
128
45
0
ZS444VAGL
R-CML
MR061063
2006 Q2 RELIABILITY REPORT
R1
CY7C1021B-15ZC
130C
5.5
128
87
0
Page 45 of 93
Results
Product Reliability
BldKit
AssyLoc
EvalNum
TV
Device
Temp
Volt
Readout
SS Rejects FA
TSOP II
ZS444YAGL
R-CML
053007
R5
CY7C1041B-15ZC
130C
5.5
128
50
0
ZS444YBLL
R-CML
060905
R5
CY7C1041AV33-20ZC
130C
3.63
128
45
0
411
0
Summary for 'PkgFamily' = TSOP II (8 detail records)
Sum
TSOP II (Pb-Free)
ZW324CBLL
T-TAIWAN
060901
R1
CY7C1019CV33
130C
5.5
128
50
0
ZW324FAGL
T-TAIWAN
MR052021
R1
CY7C1019CV33-12ZXC
130C
5.5
128
44
0
ZW444ABLL
R-CML
MR061066
R1
CY7C1021CV26-15ZSXE
130C
5.5
128
43
0
ZW444AFLL
R-CML
054302
1
7C62137FC-RZWI
130C
3.6V
128
54
0
ZW444AFLL
R-CML
054302
5A
7C62147FC-RZWI
130C
3.6V
128
50
0
ZW444AFLL
R-CML
054302
R2C
CY62137EV30*
130C
3.63
128
45
0
ZW444AFLL
R-CML
054302
R4
CY62147EV30*
130C
5.5
128
45
0
ZW444AFLL
R-CML
054909
R1
CY62157EV
130C
3.63
128
45
0
ZW444AFLL
R-CML
054909
R1A
CY62157EV
130C
5.5
128
45
0
ZW444RAGN
R-CML
053102
R1(1)
CY62137VLL-ZSXE
130C
3.63
128
49
0
ZW444VAGL
R-CML
052207
R1
CY7C1041DV33
130C
3.65
128
45
0
ZW444VAGL
R-CML
052207
R2
CY7C1041DV33
130C
3.65
128
45
0
ZW444VAGL
R-CML
052207
R3
CY7C1041DV33
130C
3.65
128
45
0
605
0
Summary for 'PkgFamily' = TSOP II (Pb-Free) (13 detail records)
Sum
TSOP/ TSSOP
Z1614GAGB
T-TAIWAN
MR061049
R1
CY22392ZC-347
130C
3.8
128
48
0
Z1619GAGN
RA-CML
MR053059
R1
CY26049ZC-36
130C
3.8
128
47
0
Z1619GAGN
RA-CML
MR061019
R1
C722393FI
130C
3.8
128
47
0
Z5624BAGN
R-CML
MR053046
r1
CY28409ZC
130C
3.8
128
48
0
Z5624BAGN
R-CML
MR061005
R1
CY28409ZC
130C
3.8
128
48
0
238
0
Summary for 'PkgFamily' = TSOP/ TSSOP (5 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 46 of 93
Results
Product Reliability
BldKit
AssyLoc
EvalNum
TV
Device
Temp
Volt
Readout
SS Rejects FA
ZZ1613GAN
T-TAIWAN
MR052077
R1
CY2309ZXI-1H
130C
3.8
128
48
0
ZZ1614HAN
T-TAIWAN
MR061050
R1
CY23FS04ZXI
130C
3.8
128
48
0
ZZ1619GAN
RA-CML
MR054017
R1
CY22392ZXC
130C
3.8
128
48
0
ZZ1619GAN
RA-CML
MR061021
R1
CY22393FXC
130C
3.63
128
48
0
ZZ1619GAN
RA-CML
MR062009
R1
CY22392ZXI
130C
3.63
128
47
0
ZZ2813AAGL
T-TAIWAN
MR062032
R1
CY28517ZXC
130C
3.63
128
50
0
ZZ2813AAGL
T-TAIWAN
NR054005
R1
CY28517ZXC
130C
3.8
128
45
0
ZZ2813AAGL
T-TAIWAN
NR054005
R3
CY28517ZXC
130C
128
50
0
ZZ2813AGN
T-TAIWAN
053006
R1
CYI5002ZXC
130C
3.63
128
48
0
ZZ2817AGL
RA-CML
051903
R1
CY221R28-ZXC
130C
2.875
128
31
0
ZZ2817AGL
RA-CML
051903
R2
CY221R28-ZXC
130C
2.875
128
27
0
ZZ5624BGN
R-CML
MR061008
R1
CY28441ZXC
130C
3.8
128
48
0
ZZ5624BGN
R-CML
MR062006
R1
7C828411DC-RZZC
130C
3.63
128
50
0
ZZ6421GAGL
M-PHIL
060306
R1
CY28505ZXC-2
130C
3.63
128
47
0
635
0
TSSOP (Pb-Free)
Summary for 'PkgFamily' = TSSOP (Pb-Free) (14 detail records)
Sum
VFBGA (0.75-0.8, Pb-Free)
BZ100AALE
G-TAIWAN
052002
1A
7C02618AC-GBZI
130C
3.3V
128
48
0
BZ100AALE
G-TAIWAN
052002
1B
7C02618AC-GBZIB
130C
3.3V
128
48
0
BZ52BGAGL
G-TAIWAN
043004
3B
7C87741A
130C
2.35V
128
46
0
142
0
Summary for 'PkgFamily' = VFBGA (0.75-0.8, Pb-Free) (3 detail records)
Sum
Grand Total
2006 Q2 RELIABILITY REPORT
8817
5
Page 47 of 93
Results
Product Reliability
Summary Detail, Package -- PCT Performance Over Time
BldKit
Assy Site
EvalNum
TV
Device
Temp
From: 7/3/2005
To: 7/2/2006
RH
Readout SS
Rejects
FA
FBGA (0.75-0.8)
BA48AUALE
RA-CML
MR052085
R1
CY7C1021BV33L-15BAI
121C
100%RH
176
23
0
BA48DJALE
G-TAIWAN
045101
R2
7C62172DC-GBAI
121C
100%RH
168
33
0
BA48DJALE
G-TAIWAN
052502
R2
CY62177DV30L
121C
100%RH
168
42
0
BA48HVALE
RA-CML
MR051066
R1
CS5854AT
121C
100%RH
168
50
0
148
0
50
0
50
0
Summary for 'PkgFamily' = FBGA (0.75-0.8) (4 detail records)
Sum
FBGA (0.75-0.8, Pb-Free)
BK48CDALL
G-TAIWAN
MR053012
R1
CY7C1041CV33-10BAXC
121C
100%RH
176
Summary for 'PkgFamily' = FBGA (0.75-0.8, Pb-Free) (1 detail record)
Sum
FBGA (1.0)
BB165WALE
RA-CML
055103
121C
100%RH
168
44
0
MR062002
R2(1 CY7C1313AVIB
)
R1
CY7C09569V-100BBC
BB172AAGE
AC-ASE
121C
100%RH
168
50
0
BB256GAGE
G-TAIWAN
MR054069
R1A
CYNSE70130B-125BBC
121C
100%RH
168
50
0
BB256GAGE
G-TAIWAN
MR054069
R2A
CYNSE70130D-125BBC
121C
100%RH
168
50
0
194
0
Summary for 'PkgFamily' = FBGA (1.0) (4 detail records)
Sum
FLIPCHIP (Build-Up Substrate w/ HS)
FG1152AGE
GQ-KOREA 034001
1A
7C72250AJ-GQFGC
121C
100%RH
168
48
0
FG1152AGE
GQ-KOREA 034001
1C
7C72250AJ-GQFGC
121C
100%RH
168
46
0
94
0
Summary for 'PkgFamily' = FLIPCHIP (Build-Up Substrate w/ HS) (2 detail records)
Sum
FVBGA (0.75-0.8, 0.3mm)
BV48ASALE
RA-CML
MR061056
R1
CY62147DV30LL-70BVI
121C
100%RH
168
47
0
BV48ASALE
RA-CML
MR062039
R1
CY62147DV18LL-70BVI
121C
100%RH
168
49
0
BV48BKALE
RA-CML
MR053023
R1
CYK128K6C7BW-70BVI
121C
100%RH
176
49
0
BV48BTALN
RA-CML
054302
R2B
CY62147EV30*
121C
100%RH
168
50
0
BV48BTALN
RA-CML
054302
R5
CY62147EV30*
121C
100%RH
168
50
0
2006 Q2 RELIABILITY REPORT
Page 48 of 93
Results
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
RH
Readout SS
Rejects
FA
FVBGA (0.75-0.8, 0.3mm)
BV48BTLAN
RA-CML
054302
R3A
BV48BZALL
RA-CML
054601
BV48BZALL
RA-CML
054601
BV48BZALL
RA-CML
054601
BV48BZALL
RA-CML
BV48HAALE
CY62147EV30*
121C
100%RH
168
50
0
R2(1 CYU01M6TF53CZ
)
R3
CYU01M6TF53CZ
121C
100%RH
168
76
0
121C
100%RH
168
50
0
121C
100%RH
168
27
0
054601
R3(1 CYU01M6TF53CZ
)
R4
CYU01M6TF53CZ
121C
100%RH
168
77
0
G-TAIWAN
MR051014
R1
CY62147CV33LL-70BVI
121C
100%RH
176
50
0
BV48QAALE
G-TAIWAN
050505
R2
CY62147
121C
100%RH
168
46
0
BV48VAALE
G-TAIWAN
MR052084
R1
CY62137CV30LL-70BVIT
121C
100%RH
176
50
0
BV52BGAGE
G-TAIWAN
043004
3A
7C87742A
121C
100%RH
168
46
0
BV52BGAGE
G-TAIWAN
043004
3C
7C87741A
121C
100%RH
168
46
0
BV52BGAGE
G-TAIWAN
043004
6
7C87741A
121C
100%RH
168
46
0
BV52BGAGE
G-TAIWAN
043004
8
7C87742A
121C
100%RH
168
46
0
855
0
Summary for 'PkgFamily' = FVBGA (0.75-0.8, 0.3mm) (17 detail records)
Sum
LK
LK32
RA-CML
061701
R1
CY8C21434-24LXI
121C
100%RH
168
44
0
LK32
RA-CML
061701
R2
CY8C21434-24LXI
121C
100%RH
168
45
0
89
0
Summary for 'PkgFamily' = LK (2 detail records)
Sum
PBGA (1.27)
BG119VALE
G-TAIWAN
052602
1
7C1330DC-GBGC
121C
100%RH
168
50
0
BG272AAGE
G-TAIWAN
MR052034
R1
CY7C0430BV-100BGI
121C
100%RH
168
44
0
94
0
Summary for 'PkgFamily' = PBGA (1.27) (2 detail records)
Sum
PBGA (Cavity/Heatsink)
BL256L2GE
G-TAIWAN
MR054018
R1
CYP15G0401DXB-BGC
121C
100%RH
168
50
0
BL304ABGE
G-TAIWAN
MR044043
R1
CYNSE70129A-125BGC
121C
100%RH
176
7
0
BL304ABGE
G-TAIWAN
MR054069
R3A
CYNSE70129D-125BGC
121C
100%RH
168
47
0
104
0
Summary for 'PkgFamily' = PBGA (Cavity/Heatsink) (3 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 49 of 93
Results
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
RH
Readout SS
Rejects
FA
PBGA (Cavity/Heatsink, Pb-Free)
BJ256L2GL
G-TAIWAN
044507
R3
CY28323BPVC
121C
100%RH
168
50
0
BJ256L2GL
G-TAIWN
044507
R1
CY28323BPVC
121C
100%RH
168
45
0
95
0
39
0
39
0
Summary for 'PkgFamily' = PBGA (Cavity/Heatsink, Pb-Free) (2 detail records)
Sum
PBGA (Heat Spreader)
BH388AAGE
G-TAIWAN
050703
R3
CYNSE70128
121C
100%RH
168
Summary for 'PkgFamily' = PBGA (Heat Spreader) (1 detail record)
Sum
PDIP
P203CGAGB
O-INDNS
MR053013
R1
CY7C168A-35PC
121C
100%RH
168
45
0
P286EGAGB
O-INDNS
MR054044
R1
CY62256LL-70PC
121C
100%RH
168
50
0
P4865GAGE
X-THAI
MR062010
R1
CY7C130-55PC
121C
100%RH
168
50
0
145
0
Summary for 'PkgFamily' = PDIP (3 detail records)
Sum
PDIP (Pb-Free)
PZ06AAGN
O-INDNS
054604
R4
CY7C63413
121C
100%RH
168
50
0
PZ183AXGN
O-INDNS
MR054048
R1
CY7C63723-PXC
121C
100%RH
176
50
0
PZ183AXGN
O-INDNS
MR061013
R1
CP6238BM
121C
100%RH
168
45
0
PZ243AAGN
X-THAI
051206
R1
CY7C63743-PXC
121C
100%RH
168
50
0
PZ243DXGN
R-CML
054605
R1
CY7C63743-PXC
121C
100%RH
168
50
0
PZ243DXGN
R-CML
054605
R2
CY7C63743C-PXC
121C
100%RH
168
50
0
PZ2831GAN
O-INDNS
MR053014
R1
CY7C64013A-PXC
121C
100%RH
168
45
0
340
0
Summary for 'PkgFamily' = PDIP (Pb-Free) (7 detail records)
Sum
PLCC
J28SEGAGB
M-PHIL
MR054019
R1
CY7B923-JC
121C
100%RH
168
50
0
J32RBGAGB
X-THAI
MR054059
R1
CY7B9911-5JC
121C
100%RH
168
50
0
J32RBGAGB
X-THAI
MR061051
R1
CY7B991-7JC
121C
100%RH
168
50
0
J32RNGAGE
M-PHIL
MR053031
R1
CY7C4271V-25JC
121C
100%RH
168
50
0
J52SFGAGB
M-PHIL
MR061020
R1
CY7C136-55JI
121C
100%RH
168
50
0
J68SCGAGB
X-THAI
MR054061
R1
CY7C144-55JCT
121C
100%RH
168
50
0
Summary for 'PkgFamily' = PLCC (6 detail records)
Sum
2006 Q2 RELIABILITY REPORT
300
0
Page 50 of 93
Results
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
RH
Readout SS
Rejects
FA
PLCC (Pb-Free)
JZ32RBGAN
M-PHIL
MR053028
R1
CY7C419-15JXC
121C
100%RH
168
50
0
JZ52SFGAN
M-PHIL
MR061061
R1
CYC131-25JXC
121C
100%RH
168
50
0
JZ52SFGAN
M-PHIL
MR062017
R1
CY7C136-25JXC
121C
100%RH
168
50
0
150
0
50
0
50
0
Summary for 'PkgFamily' = PLCC (Pb-Free) (3 detail records)
Sum
PQFP
N52DXGAGB
G-TAIWAN
MR054060
R1
CY7C131-55NC
121C
100%RH
168
Summary for 'PkgFamily' = PQFP (1 detail record)
Sum
PQFP (Pb-Free)
NZ52DXGAN
G-TAIWAN
MR061044
R1
CY7C131GT-GNZC
121C
100%RH
168
50
0
NZ52DXGAN
G-TAIWAN
MR061062
R1
CY7C136-55NXC
121C
100%RH
168
50
0
NZ52DXGAN
G-TAIWAN
MR062067
R1
7C136GT-GNZC
121C
100%RH
168
50
0
150
0
Summary for 'PkgFamily' = PQFP (Pb-Free) (3 detail records)
Sum
QFN (Punch Type)
LF56AGAGE
L-SEOL
MR051075
R1
CY7C65640A-LFC
121C
100%RH
176
50
0
LF56AGAGE
L-SEOL
MR061018
R1
CY7C68300A-56LFC
121C
100%RH
172
50
0
LF56AGAGE
L-SEOL
MR062007
R1
CY7C68001EC-56LFC
121C
100%RH
168
50
0
LF56EGAGE
AC-ASE
054207
R4
CY7C65640-LFC
121C
100%RH
176
50
0
200
0
Summary for 'PkgFamily' = QFN (Punch Type) (4 detail records)
Sum
QFN (Punch Type, Pb-Free)
LY32BGAGL
RA-CML
052610
R1
CY8C21434-24LFXI
121C
100%RH
168
50
0
LY48AGAGL
L-SEOL
052404
3
LY48EGAGL
L-SEOL
052401
1A
7B6934AC-LLYC
121C
100%RH
168
50
0
7B6953B-LLYC
121C
100%RH
168
50
0
LY56AGAGL
L-SEOL
MR062031
R1
CY7C65640A-LFXC
121C
100%RH
168
50
0
LY56AGAL
L-SEOL
044504
R1
CY7C65630-56LFXC
121C
100%RH
168
45
0
LY56DGAGL
L-SEOL
MR053010
R1
CY8C24794-24LFXI
121C
100%RH
168
50
0
LY56DGAGL
L-SEOL
MR054024
R1
CY7C68300B-56LFXC
121C
100%RH
172
50
0
LY56DGAGL
L-SEOL
MR061040
R1
CY7C68013A-56LFXC
121C
100%RH
168
50
0
LY72AGAGL
L-SEOL
054206
R2
CY28447LF-XC
121C
100%RH
168
50
0
2006 Q2 RELIABILITY REPORT
Page 51 of 93
Results
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
RH
Readout SS
Summary for 'PkgFamily' = QFN (Punch Type, Pb-Free) (9 detail records)
Sum
Rejects
445
0
FA
QSOP (Pb-Free)
SQ2414AGN
R-CML
MR054062
R1
CY7C63101A-QXC
121C
100%RH
172
50
0
SQ2414AGN
R-CML
MR062008
R1
CY7C637433-QXC
121C
100%RH
168
50
0
100
0
Summary for 'PkgFamily' = QSOP (Pb-Free) (2 detail records)
Sum
SOIC (GullWing)
S1615AAGB
O-INDNS
MR054041
R1
CY2308SC-1H
121C
100%RH
168
48
0
S1615AAGB
O-INDNS
MR061012
R1
CY2308SI-1T
121C
100%RH
168
45
0
S1615EAGB
M-PHIL
MR053002
R1
CY2309SC-1H
121C
100%RH
168
50
0
S1615EAGB
M-PHIL
MR061024
R1
CY2308SC-3
121C
100%RH
168
49
0
S1615KAGN
R-CML
MR061011
R1
CY2308SC-1H
121C
100%RH
168
48
0
S183AGAGB
M-PHIL
MR054034
R1
CY7C63231A-SC
121C
100%RH
168
50
0
S283HGAGB
O-INDNS
MR052073
R1
CY7B933-SC
121C
100%RH
168
49
0
S324513GB
R-CML
MR061065
R1
CS5761AT
121C
100%RH
168
50
0
S324513GB
R-CML
MR062004
R1
CS5761AT
121C
100%RH
168
50
0
S324513GN
R-CML
MR053003
R1
CY6525AM
121C
100%RH
168
50
0
S324513GN
R-CML
MR062022
R1
CY62128DV30LL-70SI
121C
100%RH
168
50
0
539
0
Summary for 'PkgFamily' = SOIC (GullWing) (11 detail records)
Sum
SOIC (GullWing, 450 footprint)
SN2831AHB
R-CML
MR061036
R1
CS5756AT
121C
100%RH
168
45
0
SN2831AHN
R-CML
MR053037
R1
CY22313
121C
100%RH
168
50
0
95
0
Summary for 'PkgFamily' = SOIC (GullWing, 450 footprint) (2 detail records)
Sum
SOIC (GullWing, 450 footprint, Pb-Free)
SY2831AHN
R-CML
053407
R2
CY62256LL
121C
100%RH
168
90
0
SY2831AHN
R-CML
053407
R3
CY62256LL
121C
100%RH
168
90
0
SY2831AHN
R-CML
MR062047
R1
CY62256LL-70SNXI
121C
100%RH
168
49
0
229
0
Summary for 'PkgFamily' = SOIC (GullWing, 450 footprint, Pb-Free) (3 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 52 of 93
Results
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
RH
Readout SS
Rejects
FA
SOIC (GullWing, Pb-Free)
SZ1615
RA-CML
061704
R1
W129AG
121C
100%RH
168
50
0
SZ1615
RA-CML
061704
R3A
W129AG
121C
100%RH
168
45
0
SZ1615DGN
M-PHIL
043801
1
7C823C09AC-MSZI
121C
100%RH
168
48
0
SZ1615DGN
M-PHIL
043801
1(1)
7C823C09AC-MSZI
121C
100%RH
168
48
0
SZ1615DGN
M-PHIL
052004
R2
CY8C21234-24SXI
121C
100%RH
168
45
0
SZ1615DGN
M-PHIL
052004
R3
CY8C21234-24SXI
121C
100%RH
168
45
0
SZ1615EGN
M-PHIL
MR052046
R1
CY2309SXC-1H
121C
100%RH
168
50
0
SZ1615EGN
M-PHIL
MR054025
R1
CY2308SXC-3
121C
100%RH
168
50
0
SZ1615FAL
T-TAIWAN
MR061034
R1
CY23EP09SXC-1H
121C
100%RH
168
50
0
SZ1615FAL
T-TAIWAN
MR062060
R1
CY23EP09SXC-1H
121C
100%RH
168
50
0
SZ1615KGN
RA-CML
MR062005
R1
7C80727AT-RASZI
121C
100%RH
168
50
0
SZ18
OP-PHIL
060304
R1
CY7C63723
121C
100%RH
168
50
0
SZ1813AGAN
M-PHIL
MR062011
R1
CY7C63723-SXC
121C
100%RH
168
50
0
SZ183AGAN
M-PHIL
MR061037
R1
CY7C63723-SXC
121C
100%RH
168
50
0
SZ183CGAN
RA-CML
MR054016
R1
CY7C63723-SXC
121C
100%RH
168
50
0
SZ24312GN
R-CML
MR061009
R1
CY7B951-SXC
121C
100%RH
168
49
0
SZ24315GN
RA-CML
MR053032
R1
CY7C63743-SXC
121C
100%RH
168
50
0
SZ28327GL
R-CML
054604
R1
CY7C64013C-SXC
121C
100%RH
168
50
0
SZ28327GL
R-CML
054604
R2
CY7C65113C-SXC
121C
100%RH
168
50
0
SZ324514LL
R-CML
MR062044
R1
CY62148DV30LL-55SXI
121C
100%RH
168
50
0
980
0
Summary for 'PkgFamily' = SOIC (GullWing, Pb-Free) (20 detail records)
Sum
SOIC (J lead)
V2439GAGB
O-INDNS
MR054004
R1
CY7C128A-15VC
121C
100%RH
176
50
0
V243GGBLE
O-INDNS
MR061083
R1
CY7C197B-15VC
121C
100%RH
168
45
0
V3233GALN
R-CML
054502
R1
CY7C188
121C
100%RH
168
50
0
V32421GLN
R-CML
061401
R1
CY7C1019
121C
100%RH
168
50
0
V324EGAGB
O-INDNS
MR052014
R1
CY7C1019B-10VC
121C
100%RH
168
45
0
V324FGAGB
O-INDNS
MR053015
R1
CY7C109B-20VC
121C
100%RH
168
45
0
V444ZGALL
R-CML
MR053004
R1
CY7C1021CV33
121C
100%RH
168
50
0
2006 Q2 RELIABILITY REPORT
Page 53 of 93
Results
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
RH
Readout SS
Rejects
FA
SOIC (J lead)
V444ZGALL
R-CML
MR054001
R1
CY7C1021CV33-15VC
121C
100%RH
168
50
0
V444ZGALL
R-CML
MR061006
R1
CY7C1021CV33-12VC
121C
100%RH
168
50
0
V444ZGALL
R-CML
MR062026
R1
CY7C1021CV33-12VC
121C
100%RH
168
50
0
485
0
Summary for 'PkgFamily' = SOIC (J lead) (10 detail records)
Sum
SOIC (J lead, Pb-Free)
VZ243GGBLL
O-INDNS
052801
R1
CY7C197
121C
100%RH
168
50
0
VZ28311LL
R-CML
NR061004
R7
CY7C199C-12VXC
121C
100%RH
168
50
0
VZ28311LL
R-CML
NR061004
R8
CY7C199C-12VXC
121C
100%RH
168
50
0
VZ32311ALL
R-CML
NR061004
R3
CY7C1009B-15VXC
121C
100%RH
168
50
0
VZ3644GALL
R-CML
MR053038
R1
CY7C1049B-20VXI
121C
100%RH
168
46
0
VZ444YALL
R-CML
MR062001
R1
CY7C1041CV33-12VXC
121C
100%RH
168
50
0
VZ444ZALL
R-CML
MR053005
R1
CY7C1021CV33-8VXC
121C
100%RH
168
49
0
VZ444ZALL
R-CML
MR054002
R1
CY7C1021CV33-12VXC
121C
100%RH
168
45
0
390
0
Summary for 'PkgFamily' = SOIC (J lead, Pb-Free) (8 detail records)
Sum
SSOP
O2024GAGE
M-PHIL
MR053001
R1
CY2DP3140I
121C
100%RH
168
50
0
O2026XAGB
T-TAIWAN
053205
R1
IMISM530AYB
121C
100%RH
168
45
0
O2026XAGB
T-TAIWAN
053205
R4
IMISM530AYB
121C
100%RH
168
45
0
O2028GAGE
T-TAIWAN
053205
R5
CY2CC810OI
121C
100%RH
176
50
0
O2824GAGB
T-TAIWAN
053205
R2
CY28506OC
121C
100%RH
168
45
0
O4816XAGB
T-TAIWAN
053205
R3
CY28342OC
121C
100%RH
168
45
0
O5615GAGB
T-TAIWAN
MR054039
R1
CY283410C-2
121C
100%RH
168
50
0
O563AXAGB
R-CML
MR053029
R1
CY28346OC
121C
100%RH
168
50
0
O563BXAGL
R-CML
MR054037
R1
CY7C68300A-56PVC
121C
100%RH
176
50
0
430
0
Summary for 'PkgFamily' = SSOP (9 detail records)
Sum
SSOP (Pb-Free)
SP28214GL
T-TAIWAN
052004
R1
CY8C21234-24SXI
121C
100%RH
168
45
0
SP28214GL
T-TAIWAN
MR062059
R1
CY8C24423A-24PVXI
121C
100%RH
168
50
0
SP2824CAN
T-TAIWAN
053005
R1
CY28400OXC
121C
100%RH
176
50
2006 Q2 RELIABILITY REPORT
0
Page 54 of 93
Results
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
RH
Readout SS
Rejects
FA
SSOP (Pb-Free)
SP2824GAN
T-TAIWAN
MR051052
R1
CY23FP12OXC-003
121C
100%RH
176
50
0
SP2824GAN
T-TAIWAN
MR052008
R1
CY28508OXC
121C
100%RH
176
50
0
SP563AAGN
R-CML
MR053021
R1
CY28410OXC
121C
100%RH
168
50
0
SP563AAGN
R-CML
MR062030
R1
CY284100XC
121C
100%RH
168
50
0
SP563BAGL
R-CML
060911
R1
CY7C68003-56PVXC
121C
100%RH
168
50
0
SP563CAGE
T-TAIWAN
053502
R1
CY7C66113A-PVXC
121C
100%RH
168
50
0
445
0
Summary for 'PkgFamily' = SSOP (Pb-Free) (9 detail records)
Sum
TQFP
A100
054904
1
7CL8Q01AC
121C
100%RH
168
100
0
A100SEGAGL
R-CML
MR053027
R1
CY7C9689A-AC
121C
100%RH
168
50
0
A100SGAGL
R-CML
MR061002
R1
CY7C027V-25AC
121C
100%RH
168
50
0
A52AEGAGE
Q-KOREA
MR052004
R1
CY29972AI
121C
100%RH
176
50
0
A64FXGAGE
G-TAIWAN
MR054058
R1
CY7C144AV-25AC
121C
100%RH
168
45
0
295
0
Summary for 'PkgFamily' = TQFP (5 detail records)
Sum
TQFP (10x10)
AS64BGAGB
G-TAIWAN
MR062080
R1
CY7C1012AV33-BBGC
121C
100%RH
168
50
0
AS64CGAGB
Q-KOREA
MR053050
R1
CY7C4275V-15ASC
121C
100%RH
168
50
0
AS6513GAGB
G-TAIWAN
MR052089
R1
CY7C4215V-15ASC
121C
100%RH
168
50
0
150
0
Summary for 'PkgFamily' = TQFP (10x10) (3 detail records)
Sum
TQFP (Pb-Free)
AZ100RIALL
R-CML
053901
R1
CY7C1370D
121C
100%RH
168
50
0
AZ100RIALL
R-CML
053901
R2
CY7C1370D
121C
100RH
168
50
0
AZ100RIALL
R-CML
053901
R3
CY7C1370D
121C
100%RH
168
50
0
AZ100RRLL
RA-CML
051702
R1
CY7C1470V33
121C
100%RH
168
50
0
AZ100RRLL
RA-CML
051702
R4
CY7C1470V33
121C
100%RH
168
50
0
AZ100RRLL
R-CML
051006
R1A
CY7C1470
121C
100%RH
168
50
0
AZ100SEGL
R-CML
052805
121C
100%RH
168
50
0
AZ100SFAL
R-CML
MR061003
R1(1 CY7C67300-100AXI
)
R1
7C024CT-RAZC
121C
100%RH
168
50
0
2006 Q2 RELIABILITY REPORT
Page 55 of 93
Results
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
RH
Readout SS
Rejects
FA
TQFP (Pb-Free)
AZ100SGAL
R-CML
053007
R1A
CY7C038V
121C
100%RH
168
315
0
AZ100SGAL
R-CML
053007
R1B
CY7C038V
121C
100%RH
168
347
0
AZ100SGAL
R-CML
053007
R2A
CY7C027V
121C
100%RH
168
50
0
AZ100SGAL
R-CML
053007
121C
100%RH
168
60
0
AZ100SGAL
R-CML
053007
R2A( CY7C027V
1)
R3A CY7C027V
121C
100%RH
168
50
0
AZ100SGAL
R-CML
053007
121C
100%RH
168
59
0
AZ128BGAL
G-TAIWAN
MR054010
R3A( CY7C027V
1)
R1
CY7C68013A-128AXC
121C
100%RH
176
50
0
AZ144GGAL
G-TAIWAN
MR052074
R1
121C
100%RH
168
49
0
AZ52ASGAL
Q-KOREA
051902
R1
CY7B9945V-5AXCT
121C
100%RH
168
50
0
AZ64FXGAL
G-TAIWAN
MR061046
R1
CY7C144-55AXC
121C
100%RH
168
49
0
1479
0
50
0
50
0
CY7C056V-12AXC
Summary for 'PkgFamily' = TQFP (Pb-Free) (18 detail records)
Sum
TQFP (Thermal)
AT120AHAGE
L-SEOL
041701
R1
CYS25G0101DX-ATC
121C
100%RH
176
Summary for 'PkgFamily' = TQFP (Thermal) (1 detail record)
Sum
TSOP (Pb-Free)
ZT28R2AGN
R-CML
MR061010
R1
CY7C199-15ZXC
121C
100%RH
168
50
0
ZT28R4AGL
R-CML
MR052011
R1
CY7C1399B-15ZXC
121C
100%RH
176
49
0
ZT28R5GAGL
R-CML
060904
R5
CY7C199-15ZXC
121C
100%RH
168
50
0
ZT32RKGGL
T-TAIWAN
MR052044
R1
CY7C109B-15ZXC
121C
100%RH
168
49
0
198
0
Summary for 'PkgFamily' = TSOP (Pb-Free) (4 detail records)
Sum
TSOP (Reverse)
ZR28R2AGN
R-CML
MR051013
R1
CY62256LL-70ZRI
121C
100%RH
168
50
0
ZR28R2AGN
R-CML
MR053049
R1
CY62256LL-70ZRI
121C
100%RH
168
45
0
95
0
Summary for 'PkgFamily' = TSOP (Reverse) (2 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 56 of 93
Results
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
RH
Readout SS
Rejects
FA
Results
TSOP (Reverse, Pb-Free)
ZY28R2AGN
R-CML
MR053057
R1
CY62256LL-70ZRXI
121C
100%RH
168
Summary for 'PkgFamily' = TSOP (Reverse, Pb-Free) (1 detail record)
Sum
50
0
50
0
TSOP I
ZA32RHAALB
R-CML
MR052020
R1
CY62128DV30LL-55ZAI
121C
100%RH
168
50
0
ZA32RHAALB
R-CML
MR053056
R1
CY62128DV30LL-55ZAI
121C
100%RH
168
50
0
ZA32RHAALN
R-CML
MR062027
R1
CY62128DV30LL-70ZAI
121C
100%RH
168
49
0
149
0
Summary for 'PkgFamily' = TSOP I (3 detail records)
Sum
TSOP I (Pb-Free)
ZB32RHALL
R-CML
MR061069
R1
CS6368AM
121C
100%RH
168
43
0
ZB32RHALL
R-CML
MR062019
R1
CY62128DV30LL-70ZAXI
121C
100%RH
168
50
0
93
0
Summary for 'PkgFamily' = TSOP I (Pb-Free) (2 detail records)
Sum
TSOP II
ZS324FAGE
T-TAIWAN
MR052009
R1
CY7C1019CV33-12ZC
121C
100%RH
168
50
0
ZS324FAGE
T-TAIWAN
MR053055
R1
CY7C1019CV33-12ZC
121C
100%RH
168
50
0
ZS444ABALE
R-CML
MR053058
R1
CS6125AT
121C
100%RH
168
50
0
ZS444AJALN
R-CML
MR054008
R1
CY7C1021CV33-15ZC
121C
100%RH
168
49
0
ZS444VAGL
R-CML
MR061063
R1
CY7C1021B-15ZC
121C
100%RH
168
200
0
ZS444YAGL
R-CML
053007
R5
CY7C1041B-15ZC
121C
100%RH
168
60
0
ZS444YBLL
R-CML
060905
R4
CY7C1041AV33-20ZC
121C
100%RH
168
50
0
ZS544AALE
G-TAIWAN
MR052030
R1
CY7C1069AV33-12ZC
121C
100%RH
176
10
Summary for 'PkgFamily' = TSOP II (8 detail records)
Sum
40 MR052030-1P1
519
40
TSOP II (Pb-Free)
ZW324CBLL
T-TAIWAN
060901
R1
CY7C1019CV33
121C
100%RH
168
50
0
ZW324FAGL
T-TAIWAN
MR052021
R1
CY7C1019CV33-12ZXC
121C
100%RH
168
50
0
ZW444ABLL
R-CML
MR061066
R1
CY7C1021CV26-15ZSXE
121C
100%RH
168
50
0
2006 Q2 RELIABILITY REPORT
Page 57 of 93
Die edge delamination
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
Volt
Readou
SS
Rejects
ZW444AFLL
R-CML
054909
R1
CY62157EV
121C
100%RH
168
50
0
ZW444AHGLL
R-CML
045202
R1
CY62127EV
121C
100%RH
168
50
0
ZW444VAGL
R-CML
052207
R1
CY7C1041DV33
121C
100%RH
168
46
0
ZW444VAGL
R-CML
052207
R2
CY7C1041DV33
121C
100%RH
168
50
0
ZW444VAGL
R-CML
052207
R3
CY7C1041DV33
121C
100%RH
168
50
0
396
0
Summary for 'PkgFamily' = TSOP II (Pb-Free) (8 detail records)
Sum
FA
TSOP/ TSSOP
Z1614GAGB
T-TAIWAN
MR061049
R1
CY22392ZC-347
121C
100%RH
168
50
0
Z1619GAGN
RA-CML
MR053059
R1
CY26049ZC-36
121C
100%RH
168
48
0
Z1619GAGN
RA-CML
MR061019
R1
C722393FI
121C
100%RH
168
50
0
Z5624BAGN
R-CML
MR053046
r1
CY28409ZC
121C
100%RH
168
50
0
Z5624BAGN
R-CML
MR061005
R1
CY28409ZC
121C
100%RH
168
50
0
248
0
Summary for 'PkgFamily' = TSOP/ TSSOP (5 detail records)
Sum
TSSOP (Pb-Free)
ZZ1613GAN
T-TAIWAN
MR052077
R1
CY2309ZXI-1H
121C
100%RH
168
50
0
ZZ1614HAN
T-TAIWAN
MR061050
R1
CY23FS04ZXI
121C
100%RH
168
50
0
ZZ1619GAN
RA-CML
MR054017
R1
CY22392ZXC
121C
100%RH
168
49
0
ZZ1619GAN
RA-CML
MR061021
R1
CY22393FXC
121C
100%RH
168
50
0
ZZ1619GAN
RA-CML
MR062009
R1
CY22392ZXI
121C
100%RH
168
50
0
ZZ2813AAGL
T-TAIWAN
MR062032
R1
CY28517ZXC
121C
100%RH
168
50
0
ZZ2813AGN
T-TAIWAN
053006
R1
CYI5002ZXC
121C
100%RH
168
49
0
ZZ2817AGL
RA-CML
051903
R1
CY221R28-ZXC
121C
100%RH
168
50
0
ZZ2817AGL
RA-CML
060903
R1
CY28517ZXC
121C
100%RH
168
50
0
ZZ5624BG
R-CML
052802
R1
CY28411ZXC
121C
100%RH
168
49
0
ZZ5624BGN
R-CML
MR061008
R1
CY28441ZXC
121C
100%RH
168
50
0
ZZ5624BGN
R-CML
MR062006
R1
7C828411DC-RZZC
121C
100%RH
168
49
0
ZZ6421GAGL
M-PHIL
060306
R1
CY28505ZXC-2
121C
100%RH
168
50
0
646
0
Summary for 'PkgFamily' = TSSOP (Pb-Free) (13 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 58 of 93
Results
Product Reliability
BldKit
Assy Site
EvalNum
TV
Device
Temp
RH
Readout SS
Rejects
FA
VFBGA (0.75-0.8, Pb-Free)
BZ48BKALE
RA-CML
MR052088
R1
CYK128K16SCBU-55BVXI
121C
100%RH
176
50
0
BZ52BGAGL
G-TAIWAN
043004
1A
7C87740A
121C
100%RH
168
47
0
BZ52BGAGL
G-TAIWAN
043004
2C
7C87742A
121C
100%RH
168
46
0
BZ52BGAGL
G-TAIWAN
043004
3B
7C87741A
121C
100%RH
168
47
0
190
0
11793
40
Summary for 'PkgFamily' = VFBGA (0.75-0.8, Pb-Free) (4 detail records)
Sum
Grand Total
2006 Q2 RELIABILITY REPORT
Page 59 of 93
Results
Product Reliability
Summary Detail, Package -- TC Performance Over Time
From:
7/3/2005
To: 7/2/2006
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
Chip On Board (Pb-Free)
DE001AAGL
EC-CHINA
052403
1A
7M6341AT-ECDEC
65C
-25C
120
45
0
DE001AAGL
EC-CHINA
052403
1B
7M6341AT-ECDEC
65C
-25C
120
45
0
DE001AAGL
EC-CHINA
052403
1C
7M6341AT-ECDEC
65C
-25C
120
45
0
DE001AAGL
SV-CHINA
052405
1A
7M6341AT-SVDEC
65C
-25C
120
45
0
DE001AAGL
SV-CHINA
052405
1B
7M6341AT-SVDEC
65C
-25C
120
45
0
DE001AAGL
SV-CHINA
052405
1C
7M6341AT-SVDEC
65C
-25C
120
45
0
270
0
Summary for 'PkgFamily' = Chip On Board (Pb-Free) (6 detail records)
Sum
FBGA (0.75-0.8)
BA48AUALE
RA-CML
MR052085
R1
CY7C1021BV33L-15BAI
150C
-65C
300
50
0
BA48BQAALE RA-CML
MR061059
R1
CY62137CVSL-70BAI
150C
-65C
300
50
0
BA48DJALE
G-TAIWAN
045101
R1
7C62172DC-GBAI
150C
-65C
300
45
0
BA48DJALE
G-TAIWAN
045101
R2
7C62172DC-GBAI
150C
-65C
300
44
0
BA48DJALE
G-TAIWAN
045101
R3
7C62172DC-GBAI
150C
-65C
300
45
0
BA48DJALE
G-TAIWAN
052502
R1
CY62177DV30L
150C
-65C
300
45
0
BA48DJALE
G-TAIWAN
052502
R2
CY62177DV30L
150C
-65C
300
50
0
BA48DJALE
G-TAIWAN
052502
R3
CY62177DV30L
150C
-65C
300
50
0
BA48HVALE
RA-CML
MR051066
R1
CS5854AT
150C
-65C
300
49
0
428
0
48
0
48
0
Summary for 'PkgFamily' = FBGA (0.75-0.8) (9 detail records)
Sum
FBGA (0.75-0.8, Pb-Free)
BK48CDALL
G-TAIWAN
MR053012
R1
CY7C1041CV33-10BAXC
Summary for 'PkgFamily' = FBGA (0.75-0.8, Pb-Free) (1 detail record)
Sum
2006 Q2 RELIABILITY REPORT
150C
-65C
300
Page 60 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
FBGA (1.0)
BB165WALE
RA-CML
055103
R1
CY7C1313AVIB
150C
-65C
300
33
0
BB165WALE
RA-CML
055103
R2
CY7C1313AVIB
150C
-65C
300
44
0
BB165WALE
RA-CML
055103
R3
CY7C1313AVIB
150C
-65C
300
45
0
BB172AAGE
AC-ASE
MR062002
R1
CY7C09569V-100BBC
150C
-65C
300
48
0
170
0
Summary for 'PkgFamily' = FBGA (1.0) (4 detail records)
Sum
FLIPCHIP (Build-Up Substrate w/ HS)
FG1152AGE
GQ-KOREA 034001
1C
7C72250AJ-GQFGC
125C
-55C
1000
47
0
FG1152AGE
GQ-KOREA 034001
1C
7C72250AJ-GQFGC
125C
-55C
500
47
0
FG1152AGE
GQ-KOREA 034001
1D
7C72220AJ-GQFGC
125C
-55C
1000
43
0
FG1152AGE
GQ-KOREA 034001
1D
7C72220AJ-GQFGC
125C
-55C
500
46
0
FG1152AGE
GQ-KOREA 034001
4
7C72250BJ-GQFGCB
125C
-55C
1000
48
0
FG1152AGE
GQ-KOREA 034001
4
7C72250BJ-GQFGCB
125C
-55C
500
48
0
279
0
Summary for 'PkgFamily' = FLIPCHIP (Build-Up Substrate w/ HS) (6 detail records)
Sum
FVBGA (0.75-0.8, 0.3mm)
BV48ASALE
RA-CML
MR061056
R1
CY62147DV30LL-70BVI
150C
-65C
300
49
0
BV48ASALE
RA-CML
MR062039
R1
CY62147DV18LL-70BVI
150C
-65C
300
49
0
BV48BKALE
RA-CML
MR053023
R1
CYK128K6C7BW-70BVI
150C
-65C
300
45
0
BV48BTALN
RA-CML
054302
R5
CY62147EV30*
150C
-65C
300
49
0
BV48BZALL
RA-CML
054601
150C
-65C
300
77
0
BV48BZALL
RA-CML
054601
R2(1 CYU01M6TF53CZ
)
R3
CYU01M6TF53CZ
150C
-65C
300
49
0
BV48BZALL
RA-CML
054601
BV48BZALL
RA-CML
BV48HAALE
BV48VAALE
150C
-65C
300
27
0
054601
R3(1 CYU01M6TF53CZ
)
R4
CYU01M6TF53CZ
150C
-65C
300
77
0
G-TAIWAN
MR051014
R1
CY62147CV33LL-70BVI
150C
-65C
300
50
0
G-TAIWAN
MR052084
R1
CY62137CV30LL-70BVIT
150C
-65C
300
50
0
2006 Q2 RELIABILITY REPORT
Page 61 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
FVBGA (0.75-0.8, 0.3mm)
BV52BGAGE
G-TAIWAN
043004
3A
7C87742A
150C
-65C
300
46
0
BV52BGAGE
G-TAIWAN
043004
3C
7C87741A
150C
-65C
300
46
0
BV52BGAGE
G-TAIWAN
043004
6
7C87741A
150C
-65C
300
45
0
BV52BGAGE
G-TAIWAN
043004
6A
7C87742A
150C
-65C
300
46
0
BV52BGAGE
G-TAIWAN
043004
8
7C87742A
150C
-65C
300
46
0
BV52BGAGE
G-TAIWAN
043004
8A
7C87741A
150C
-65C
300
347
0
BV52BGAGE
G-TAIWAN
043004
9
7C87741A
150C
-65C
300
348
0
1446
0
Summary for 'PkgFamily' = FVBGA (0.75-0.8, 0.3mm) (17 detail records)
Sum
LCC
L04AA
052701
1
7C825701A
125C
-55C
100
50
0
L04AA
052701
1
7C825701A
125C
-55C
1000
50
0
L04AA
052701
1A
7C825701AT-ERLC
125C
-55C
100
50
0
L04AA
052701
1A
7C825701AT-ERLC
125C
-55C
1000
50
0
200
0
Summary for 'PkgFamily' = LCC (4 detail records)
Sum
LCC (Windowed Plastic)
QY48AAALL
IP-TAIWA
060702
R1
CAIMG20400-2
125C
-40C
300
43
0
QY48AAALL
IP-TAIWA
060702
R2
CAIMG20400-2
125C
-40C
300
36
0
QY48AAALL
IP-TAIWA
060702
R3
CAIMG20400-2
125C
-40C
300
45
0
QY48AAALL
IP-TAIWA
060702
R4
CAIMG20400-2
125C
-40C
300
37
0
QY48AAALL
IP-TAIWAN
052003
1
7ISC305BF-IPQYC
125C
-40C
500
50
0
QY48AAALL
IP-TAIWAN
052003
1
7ISC305BF-IPQYC
125C
-40C
1000
50
0
QY48AAALL
IP-TAIWAN
052003
2
7ISC305BF-IPQYC
125C
-40C
500
50
0
QY48AAALL
IP-TAIWAN
052003
2
7ISC305BF-IPQYC
125C
-40C
1000
50
0
QY48AAALL
IP-TAIWAN
052003
3
7ISC305BF-IPQYC
125C
-40C
1000
50
0
2006 Q2 RELIABILITY REPORT
Page 62 of 93
Results
Product Reliability
BldKit
QY48AAALL
Assy
IP-TAIWAN
Eval Num
052003
TV
Device
Temp
3
7ISC305BF-IPQYC
125C
Temp
-40C
Cycles
500
Summary for 'PkgFamily' = LCC (Windowed Plastic) (10 detail records)
Sum
SS
Reject FA
50
0
461
0
Results
LK
LK32
RA-CML
061701
R1
CY8C21434-24LXI
150C
-65C
300
50
0
LK32
RA-CML
061701
R2
CY8C21434-24LXI
150C
-65C
300
50
0
LK32
RA-CML
061701
R3
CY8C21434-24LXI
150C
-65C
300
50
0
150
0
Summary for 'PkgFamily' = LK (3 detail records)
Sum
PBGA (1.27)
BG119JALE
G-TAIWAN
MR061045
R1
CY7C1062AV33-12BGI
150C
-65C
300
50
0
BG119NALE
G-TAIWAN
MR053018
R1
CY7C1354B-166GBC
150C
-65C
300
50
0
BG119VALE
G-TAIWAN
052602
1
7C1330DC-GBGC
150C
-65C
300
50
0
BG272AAGE
G-TAIWAN
MR052034
R1
CY7C0430BV-100BGI
150C
-65C
300
50
0
200
0
Summary for 'PkgFamily' = PBGA (1.27) (4 detail records)
Sum
PBGA (Cavity/Heatsink)
BL256L2GE
G-TAIWAN
MR054018
R1
CYP15G0401DXB-BGC
150C
-65C
300
50
0
BL304ABGE
G-TAIWAN
MR054069
R1B
CYNSE70129B-125BGC
150C
-65C
300
49
0
BL304ABGE
G-TAIWAN
MR054069
R1D CYNSE70129B-1125BGC
150C
-65C
300
50
0
BL304ABGE
G-TAIWAN
MR054069
R1F
CS6262AT
150C
-65C
300
50
0
BL304ABGE
G-TAIWAN
MR054069
R2B
CYNSE70129A-100BGC
150C
-65C
300
50
0
BL304ABGE
G-TAIWAN
MR054069
R2D CYNSE70129B-125BGC
150C
-65C
300
50
0
MR054069
R2F
CYNSE70129A-167BGC
150C
-65C
300
TV
Device
Temp
BL304ABGE
BldKit
G-TAIWAN
Assy
EvalNum
Summary for 'PkgFamily' = PBGA (Cavity/Heatsink) (7 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Temp
Cycles
50
SS
349
0
Reject FA
0
Page 63 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
PBGA (Cavity/Heatsink, Pb-Free)
BJ256L2GL
G-TAIWAN
044507
R2
CY28323BPVC
150C
-65C
300
49
0
BJ256L2GL
G-TAIWAN
044507
R3
CY28323BPVC
150C
-65C
300
50
0
BJ256L2GL
G-TAIWN
044507
R1
CY28323BPVC
150C
-65C
300
47
0
BJ504AAGL
G-TAIWAN
044507
R4
CY7C9536B-BLXC
150C
-65C
300
49
0
BJ504AAGL
G-TAIWAN
044507
R5
CY7C9536B-BLXC
150C
-65C
300
50
0
245
0
Summary for 'PkgFamily' = PBGA (Cavity/Heatsink, Pb-Free) (5 detail records)
Sum
PBGA (Heat Spreader)
BH388AAGE
G-TAIWAN
050703
R1
CYNSE70128
150C
-65C
300
48
0
BH388AAGE
G-TAIWAN
050703
R2
CYNSE70128
150C
-65C
300
48
0
BH388AAGE
G-TAIWAN
050703
R3
CYNSE70128
150C
-65C
300
42
0
138
0
Summary for 'PkgFamily' = PBGA (Heat Spreader) (3 detail records)
Sum
PDIP
P203CGAGB
O-INDNS
MR053013
R1
CY7C168A-35PC
150C
-65C
300
45
0
P286EGAGB
O-INDNS
MR054044
R1
CY62256LL-70PC
150C
-65C
300
50
0
P4865GAGE
G-TAIWAN
MR061057
R1
CY7C130-55PC
150C
-65C
300
50
0
P4865GAGE
X-THAI
MR062010
R1
CY7C130-55PC
150C
-65C
300
50
0
195
0
Summary for 'PkgFamily' = PDIP (4 detail records)
Sum
PDIP (Pb-Free)
PZ183AXGN
O-INDNS
MR054048
R1
CY7C63723-PXC
150C
-65C
300
50
0
PZ183AXGN
O-INDNS
MR061013
R1
CP6238BM
150C
-65C
300
45
0
PZ243AAGN
X-THAI
051206
R1
CY7C63743-PXC
150C
-65C
300
50
0
PZ243AAGN
X-THAI
051206
R2
CY7C63743-PXC
150C
-65C
300
48
0
PZ243AAGN
X-THAI
051206
R3
CY7C63743-PXC
150C
-65C
300
50
0
2006 Q2 RELIABILITY REPORT
Page 64 of 93
Results
Product Reliability
BldKit
Assy
PZ2831GAN
O-INDNS
Eval Num
TV
Device
Temp
MR053014
R1
CY7C64013A-PXC
150C
Temp
-65C
Cycles
300
Summary for 'PkgFamily' = PDIP (Pb-Free) (6 detail records)
Sum
SS
Reject FA
45
0
288
0
PLCC
J28SEGAGB
M-PHIL
MR054019
R1
CY7B923-JC
150C
-65C
300
50
0
J32RBGAGB
X-THAI
MR054059
R1
CY7B9911-5JC
150C
-65C
300
50
0
J32RBGAGB
X-THAI
MR061051
R1
CY7B991-7JC
150C
-65C
300
49
0
J32RNGAGE
M-PHIL
MR053031
R1
CY7C4271V-25JC
150C
-65C
300
50
0
J52SFGAGB
M-PHIL
MR061020
R1
CY7C136-55JI
150C
-65C
300
50
0
J68SCGAGB
X-THAI
MR054061
R1
CY7C144-55JCT
150C
-65C
300
50
0
299
0
Summary for 'PkgFamily' = PLCC (6 detail records)
Sum
PLCC (Pb-Free)
JZ32RBGAN
M-PHIL
MR053028
R1
CY7C419-15JXC
150C
-65C
300
50
0
JZ52SFGAN
M-PHIL
MR061061
R1
CYC131-25JXC
150C
-65C
300
50
0
JZ52SFGAN
M-PHIL
MR062017
R1
CY7C136-25JXC
150C
-65C
300
50
0
150
0
50
0
50
0
Summary for 'PkgFamily' = PLCC (Pb-Free) (3 detail records)
Sum
PQFP
N52DXGAGB
G-TAIWAN
MR054060
R1
CY7C131-55NC
150C
-65C
300
Summary for 'PkgFamily' = PQFP (1 detail record)
Sum
PQFP (Pb-Free)
NZ52DXGAN
G-TAIWAN
MR061044
R1
CY7C131GT-GNZC
150C
-65C
300
50
0
NZ52DXGAN
G-TAIWAN
MR061062
R1
CY7C136-55NXC
150C
-65C
300
50
0
NZ52DXGAN
G-TAIWAN
MR062067
R1
7C136GT-GNZC
150C
-65C
300
50
0
150
0
Summary for 'PkgFamily' = PQFP (Pb-Free) (3 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 65 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
QFN (Punch Type)
LF56AGAGE
L-SEOL
MR051075
R1
CY7C65640A-LFC
150C
-65C
300
50
0
LF56AGAGE
L-SEOL
MR052016
R1
CY7C65640A-LFC
150C
-65C
300
50
0
LF56AGAGE
L-SEOL
MR061018
R1
CY7C68300A-56LFC
150C
-65C
300
50
0
LF56AGAGE
L-SEOL
MR062007
R1
CY7C68001EC-56LFC
150C
-65C
300
50
0
200
0
Summary for 'PkgFamily' = QFN (Punch Type) (4 detail records)
Sum
QFN (Punch Type, Pb-Free)
LY32BGAGL
RA-CML
052610
R1
CY8C21434-24LFXI
150C
-65C
300
50
0
LY32BGAGL
RA-CML
052610
R2
CY8C21434-24LFXI
150C
-65C
300
50
0
LY32BGAGL
RA-CML
052610
R3
CY8C21434-24LFXI
150C
-65C
300
49
0
LY48EGAGL
L-SEOL
052401
1A
7B6953B-LLYC
150C
-65C
300
50
0
LY48EGAGL
L-SEOL
052401
1B
7B6953B-LLYC
150C
-65C
300
50
0
LY48EGAGL
L-SEOL
052401
1C
7B6953B-LLYC
150C
-65C
300
50
0
LY56AGAGL
L-SEOL
MR062031
R1
CY7C65640A-LFXC
150C
-65C
300
50
0
LY56AGAL
L-SEOL
044504
R1
CY7C65630-56LFXC
150C
-65C
300
45
0
LY56DGAGL
L-SEOL
MR054024
R1
CY7C68300B-56LFXC
150C
-65C
300
50
0
LY56DGAGL
L-SEOL
MR061040
R1
CY7C68013A-56LFXC
150C
-65C
300
49
0
LY72AGAGL
L-SEOL
054206
R1
CY28447LF-XC
150C
-65C
300
50
0
LY72AGAGL
L-SEOL
054206
R2
CY28447LF-XC
150C
-65C
300
50
0
LY72AGAGL
L-SEOL
054206
R3
CY28447LF-XC
150C
-65C
300
50
0
643
0
Summary for 'PkgFamily' = QFN (Punch Type, Pb-Free) (13 detail records)
Sum
QSOP (Pb-Free)
SQ2414AGN
R-CML
060902
R2
CY7C63743-QXC
150C
-65C
300
49
0
SQ2414AGN
R-CML
060902
R3
CY7C63743-QXC
150C
-65C
300
50
0
SQ2414AGN
R-CML
MR054062
R1
CY7C63101A-QXC
150C
-65C
300
49
0
2006 Q2 RELIABILITY REPORT
Page 66 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
R-CML
MR061071
R1
CY7C63101A-QXC
150C
-65C
300
50
0
R-CML
MR062008
R1
CY7C637433-QXC
150C
-65C
300
50
0
248
0
QSOP (Pb-Free)
SQ2414AGN
SQ2414AGN
Summary for 'PkgFamily' = QSOP (Pb-Free) (5 detail records)
Sum
SOIC (GullWing)
S1615AAGB
O-INDNS
MR054041
R1
CY2308SC-1H
150C
-65C
300
45
0
S1615AAGB
O-INDNS
MR061012
R1
CY2308SI-1T
150C
-65C
300
45
0
S1615EAGB
M-PHIL
MR053002
R1
CY2309SC-1H
150C
-65C
300
48
0
S1615EAGB
M-PHIL
MR061024
R1
CY2308SC-3
150C
-65C
300
50
0
S1615KAGN
R-CML
MR061011
R1
CY2308SC-1H
150C
-65C
300
49
0
S183AGAGB
M-PHIL
MR054034
R1
CY7C63231A-SC
150C
-65C
300
48
0
S283HGAGB
O-INDNS
MR052073
R1
CY7B933-SC
150C
-65C
300
50
0
S324513GB
R-CML
MR062004
R1
CS5761AT
150C
-65C
300
S324513GN
R-CML
MR053003
R1
CY6525AM
150C
-65C
300
50
0
S324513GN
R-CML
MR062022
R1
CY62128DV30LL-70SI
150C
-65C
300
300
0
685
0
Summary for 'PkgFamily' = SOIC (GullWing) (10 detail records)
Sum
0
SOIC (GullWing, 450 footprint)
SN2831AHB
R-CML
MR061036
R1
CS5756AT
150C
-65C
300
45
0
SN2831AHN
R-CML
MR053037
R1
CY22313
150C
-65C
300
50
0
95
0
Summary for 'PkgFamily' = SOIC (GullWing, 450 footprint) (2 detail records)
Sum
SOIC (GullWing, 450 footprint, Pb-Free)
SY2831AHN
R-CML
053407
R1
CY62256LL
150C
-65C
300
90
0
SY2831AHN
R-CML
053407
R2
CY62256LL
150C
-65C
300
87
0
SY2831AHN
R-CML
053407
R3
CY62256LL
150C
-65C
300
90
0
SY2831AHN
R-CML
MR062047
R1
CY62256LL-70SNXI
150C
-65C
300
50
0
2006 Q2 RELIABILITY REPORT
Page 67 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
Results
QSOP (Pb-Free)
Summary for 'PkgFamily' = SOIC (GullWing, 450 footprint, Pb-Free) (4 detail records)
Sum
317
0
SOIC (GullWing, Pb-Free)
SZ1615
RA-CML
061704
R1
W129AG
150C
-65C
300
49
0
SZ1615
RA-CML
061704
R2
W129AG
150C
-65C
300
50
0
SZ1615
RA-CML
061704
R3A
W129AG
150C
-65C
300
43
0
SZ1615
RA-CML
061704
R3B
W129AG
150C
-65C
300
45
0
SZ1615DGN
M-PHIL
043801
1(1)
7C823C09AC-MSZI
150C
-65C
300
48
0
SZ1615DGN
M-PHIL
052004
R2
CY8C21234-24SXI
150C
-65C
300
45
0
SZ1615DGN
M-PHIL
052004
R3
CY8C21234-24SXI
150C
-65C
300
45
0
SZ1615EGN
M-PHIL
MR052046
R1
CY2309SXC-1H
150C
-65C
300
48
0
SZ1615EGN
M-PHIL
MR054025
R1
CY2308SXC-3
0
300
35
0
SZ1615EGN
M-PHIL
MR054025
R1A
CY2308SXC-3
150C
-65C
300
24
0
SZ1615FAL
T-TAIWAN
MR061034
R1
CY23EP09SXC-1H
150C
-65C
300
48
0
SZ1615FAL
T-TAIWAN
MR062060
R1
CY23EP09SXC-1H
150C
-65C
300
50
0
SZ1615KGN
RA-CML
MR062005
R1
7C80727AT-RASZI
150C
-65C
300
47
0
SZ18
OP-PHIL
060304
R1
CY7C63723
150C
-65C
300
50
0
SZ18
OP-PHIL
060304
R2
CY7C63723
150C
-65C
300
50
0
SZ18
OP-PHIL
060304
R3
CY7C63723
150C
-65C
300
50
0
SZ1813AGAN M-PHIL
MR062011
R1
CY7C63723-SXC
150C
-65C
300
50
0
SZ183AGAN
M-PHIL
MR061037
R1
CY7C63723-SXC
150C
-65C
300
50
0
SZ183CGAN
RA-CML
MR054016
R1
CY7C63723-SXC
150C
-65C
300
50
0
SZ24312GN
R-CML
MR061009
R1
CY7B951-SXC
150C
-65C
300
49
0
SZ24315GN
RA-CML
MR053032
R1
CY7C63743-SXC
150C
-65C
300
49
1 MR053032-1T1
SZ28327GL
R-CML
054604
R1
CY7C64013C-SXC
150C
-65C
300
33
17 054604-1T1
Cut wedge
SZ28327GL
R-CML
054604
2006 Q2 RELIABILITY REPORT
R2
CY7C65113C-SXC
150C
-65C
300
39
11 054604-2T1
Page 68 of 93
Cut wedge
Cut wedge
Product Reliability
BldKit
SZ324514LL
Assy
R-CML
Eval Num
TV
Device
Temp
MR062044
R1
CY62148DV30LL-55SXI
150C
Temp
-65C
Cycles
300
Summary for 'PkgFamily' = SOIC (GullWing, Pb-Free) (24 detail records)
Sum
SS
Reject FA
50
0
1097
29
SOIC (J lead)
V2439GAGB
O-INDNS
MR054004
R1
CY7C128A-15VC
150C
-65C
300
50
0
V3233GALN
R-CML
054502
R1
CY7C188
150C
-65C
300
50
0
V3233GALN
R-CML
054502
R2
CY7C188
150C
-65C
300
50
0
V3233GALN
R-CML
054502
R3
CY7C188
150C
-65C
300
50
0
V32419GLL
R-CML
052803
R3
CY7C1019D
150C
-65C
300
45
0
V324218LL
R-CML
061401
R4
CY7C109
150C
-65C
300
45
0
V32421GLN
R-CML
061401
R1
CY7C1019
150C
-65C
300
50
0
V32421GLN
R-CML
061401
R2
CY7C1019
150C
-65C
300
50
0
V32421GLN
R-CML
061401
R3
CY7C1019
150C
-65C
300
49
0
V324EGAGB
O-INDNS
MR052014
R1
CY7C1019B-10VC
150C
-65C
300
45
0
V324FGAGB
O-INDNS
MR053015
R1
CY7C109B-20VC
150C
-65C
300
45
0
V444ZGALL
R-CML
MR053004
R1
CY7C1021CV33
150C
-65C
300
50
0
V444ZGALL
R-CML
MR054001
R1
CY7C1021CV33-15VC
150C
-65C
300
50
0
V444ZGALL
R-CML
MR061006
R1
CY7C1021CV33-12VC
150C
-65C
300
47
0
V444ZGALL
R-CML
MR062026
R1
CY7C1021CV33-12VC
150C
-65C
300
50
0
726
0
Summary for 'PkgFamily' = SOIC (J lead) (15 detail records)
Sum
SOIC (J lead, Pb-Free)
VZ243GGBLL
O-INDNS
052801
R1
CY7C197
150C
-65C
300
50
0
VZ243GGBLL
O-INDNS
052801
R2
CY7C197
150C
-65C
300
50
0
VZ243GGBLL
O-INDNS
052801
R3
CY7C197
150C
-65C
300
50
0
VZ28311GL
R-CML
NR061004
R1
CY7C199C-15VXC
150C
-65C
300
50
0
VZ28311GL
R-CML
NR061004
R2
CY7C199C-15VXI
150C
-65C
300
50
0
2006 Q2 RELIABILITY REPORT
Page 69 of 93
Results
Product Reliability
BldKit
Eval Num
TV
Device
Temp
R-CML
NR061004
R3
CY7C1009B-15VXC
150C
-65C
300
50
0
VZ3644GALL
R-CML
MR053038
R1
CY7C1049B-20VXI
150C
-65C
300
48
0
VZ444YALL
R-CML
MR062001
R1
CY7C1041CV33-12VXC
150C
-65C
300
50
0
VZ444ZALL
R-CML
MR053005
R1
CY7C1021CV33-8VXC
150C
-65C
300
50
0
VZ444ZALL
R-CML
MR054002
R1
CY7C1021CV33-12VXC
150C
-65C
300
47
0
495
0
VZ32311ALL
Assy
Temp
Cycles
Summary for 'PkgFamily' = SOIC (J lead, Pb-Free) (10 detail records)
Sum
SS
Reject FA
SSOP
O2024GAGE
M-PHIL
MR053001
R1
CY2DP3140I
150C
-65C
300
50
0
O2026XAGB
T-TAIWAN
053205
R1
IMISM530AYB
150C
-65C
300
45
0
O2026XAGB
T-TAIWAN
053205
R4
IMISM530AYB
150C
-65C
300
45
0
O2028GAGE
T-TAIWAN
053205
R5
CY2CC810OI
150C
-65C
300
50
0
O2824GAGB
T-TAIWAN
053205
R2
CY28506OC
150C
-65C
300
45
0
O2824GAGB
T-TAIWAN
053205
R6
CY28508OC
150C
-65C
300
49
0
O4816XAGB
T-TAIWAN
053205
R3
CY28342OC
150C
-65C
300
45
0
O56
R-CML
MR061007
R1
CY284690CT
150C
-65C
300
50
0
O5615GAGB
T-TAIWAN
MR054039
R1
CY283410C-2
150C
-65C
300
50
0
O563AXAGB
R-CML
MR053029
R1
CY28346OC
150C
-65C
300
49
0
O563BXAGL
R-CML
MR054037
R1
CY7C68300A-56PVC
150C
-65C
300
50
0
528
0
Summary for 'PkgFamily' = SSOP (11 detail records)
Sum
SSOP (Pb-Free)
SP2814GAL
T-TAIWAN
053402
R1
CY8C27443-24PVXI
150C
-65C
300
45
0
SP28214GL
T-TAIWAN
052004
R1
CY8C21234-24SXI
150C
-65C
300
50
0
2006 Q2 RELIABILITY REPORT
Page 70 of 93
Results
Product Reliability
BldKit
Assy
EvalNum
TV
Device
Temp
Temp
Cycles
SS
Reject FA
SP28214GL
T-TAIWAN
MR062059
R1
CY8C24423A-24PVXI
150C
-65C
300
50
0
SP2824CAN
T-TAIWAN
053005
R1
CY28400OXC
150C
-65C
300
50
0
SP2824CAN
T-TAIWAN
053005
R2
CY28400OXC
150C
-65C
300
49
0
SP2824CAN
T-TAIWAN
053005
R3
CY28400OXC
150C
-65C
300
50
0
SP2824GAN
T-TAIWAN
MR051052
R1
CY23FP12OXC-003
150C
-65C
300
45
0
SP2824GAN
T-TAIWAN
MR052008
R1
CY28508OXC
150C
-65C
300
50
0
SP483BAGL
R-CML
060911
R2
CY7C64113A-PVXCT
150C
-65C
300
50
0
SP563AAGN
R-CML
MR053021
R1
CY28410OXC
150C
-65C
300
50
0
SP563AAGN
R-CML
MR062030
R1
CY284100XC
150C
-65C
300
50
0
SP563BAGL
R-CML
060911
R1
CY7C68003-56PVXC
150C
-65C
300
50
0
SP563CAGE
T-TAIWAN
053502
R1
CY7C66113A-PVXC
150C
-65C
300
50
0
SP563CAGE
T-TAIWAN
053502
R2
CY7C66113A-PVXC
150C
-65C
300
50
0
SP563CAGE
T-TAIWAN
053502
R3
CY7C66113A-PVXC
150C
-65C
300
50
0
739
0
Summary for 'PkgFamily' = SSOP (Pb-Free) (15 detail records)
Sum
TQFP
A100
054904
1
7CL8Q01AC
150C
-65C
300
100
0
A100SEGAGL R-CML
MR053027
R1
CY7C9689A-AC
150C
-65C
300
50
0
A100SGAGL
R-CML
MR061002
R1
CY7C027V-25AC
150C
-65C
300
49
0
A52AEGAGE
Q-KOREA
MR052004
R1
CY29972AI
150C
-65C
300
50
0
A64FXGAGE
G-TAIWAN
MR054058
R1
CY7C144AV-25AC
150C
-65C
300
45
0
294
0
Summary for 'PkgFamily' = TQFP (5 detail records)
Sum
TQFP (10x10)
AS64BGAGB
G-TAIWAN
MR062080
R1
CY7C1012AV33-BBGC
150C
-65C
300
50
0
AS64CGAGB
Q-KOREA
MR053050
R1
CY7C4275V-15ASC
150C
-65C
300
50
0
MR052089
R1
CY7C4215V-15ASC
150C
-65C
300
50
0
AS6513GAGB G-TAIWAN
2006 Q2 RELIABILITY REPORT
Page 71 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
Summary for 'PkgFamily' = TQFP (10x10) (3 detail records)
Sum
SS
Reject FA
150
0
TQFP (Pb-Free)
AZ100RIALL
R-CML
053901
R1
CY7C1370D
150C
-65C
300
50
0
AZ100RIALL
R-CML
053901
R2
CY7C1370D
150C
-65C
300
49
0
AZ100RIALL
R-CML
053901
R3
CY7C1370D
150C
-65C
300
50
0
AZ100RRLL
RA-CML
051702
R1
CY7C1470V33
150C
-65C
300
49
0
AZ100RRLL
RA-CML
051702
R2
CY7C1470V33
150C
-65C
300
50
0
AZ100RRLL
RA-CML
051702
R3
CY7C1470V33
150C
-65C
300
50
0
AZ100RSLL
R-CML
MR061068
R1
CY7C1347G-133AXC
150C
-65C
300
100
0
AZ100SFAL
R-CML
MR061003
R1
7C024CT-RAZC
150C
-65C
300
50
0
AZ100SGAL
R-CML
053007
R2A
CY7C027V
150C
-65C
300
60
0
AZ100SGAL
R-CML
053007
150C
-65C
300
50
0
AZ100SGAL
R-CML
053007
R2A( CY7C027V
1)
R3A CY7C027V
150C
-65C
300
60
0
AZ100SGAL
R-CML
053007
AZ128BGAL
G-TAIWAN
AZ144GGAL
150C
-65C
300
50
0
MR054010
R3A( CY7C027V
1)
R1
CY7C68013A-128AXC
150C
-65C
300
50
0
G-TAIWAN
MR052074
R1
CY7C056V-12AXC
150C
-65C
300
49
0
AZ32BXGAN
Q-KOREA
NR052002
R7
CY7B995AXC
150C
-65C
300
15
0
AZ52AAGAL
Q-KOREA
NR052002
R1
CY29775AXI
150C
-65C
300
48
0
AZ52AAGAL
Q-KOREA
NR052002
R2
CY29775AXI
150C
-65C
300
50
0
AZ52AAGAL
Q-KOREA
NR052002
R3
CY29972AXI
150C
-65C
300
42
0
AZ52ASGAL
Q-KOREA
051902
R1
CY7B9945V-5AXCT
150C
-65C
300
46
0
AZ52ASGAL
Q-KOREA
051902
R2
CY7B9945V-5AXCT
150C
-65C
300
50
0
AZ52ASGAL
Q-KOREA
051902
R3
CY7B9945V-5AXCT
150C
-65C
300
50
0
AZ52ASGAL
Q-KOREA
NR054002
R1
CY7B9945V-2AXI
150C
-65C
300
43
0
AZ52ASGAL
Q-KOREA
NR054002
R2
CY7B9945V-2AXI
150C
-65C
300
45
0
2006 Q2 RELIABILITY REPORT
Page 72 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
AZ52ASGAL
Q-KOREA
NR054002
R3
CY7B9973V-AXC
150C
-65C
300
45
0
AZ64FXGAL
G-TAIWAN
MR061046
R1
CY7C144-55AXC
150C
-65C
300
50
0
1251
0
50
0
50
0
Summary for 'PkgFamily' = TQFP (Pb-Free) (25 detail records)
Sum
TQFP (Thermal)
AT120AHAGE L-SEOL
041701
R1
CYS25G0101DX-ATC
150C
-65C
300
Summary for 'PkgFamily' = TQFP (Thermal) (1 detail record)
Sum
TQFP (Thermal, Pb-Free)
AG120AGAL
L-SEOL
041701
R2
CYS25G0101DX-ATC
150C
-65C
300
50
0
AG120AGAL
L-SEOL
041701
R3
CYS25G0101DX-ATC
150C
-65C
300
49
0
99
0
Summary for 'PkgFamily' = TQFP (Thermal, Pb-Free) (2 detail records)
Sum
TSOP (Pb-Free)
ZT28R2AGN
R-CML
MR061010
R1
CY7C199-15ZXC
150C
-65C
300
50
0
ZT28R4AGL
R-CML
MR052011
R1
CY7C1399B-15ZXC
150C
-65C
300
50
0
ZT28R5GAGL R-CML
060904
R1
CY7C199-15ZXC
150C
-65C
300
50
0
ZT28R5GAGL R-CML
060904
R2
CY7C199-15ZXC
150C
-65C
300
50
0
ZT28R5GAGL R-CML
060904
R3
CY7C199-15ZXC
150C
-65C
300
50
0
ZT32RKGGL
T-TAIWAN
MR052044
R1
CY7C109B-15ZXC
150C
-65C
300
50
0
ZT32RYAGL
T-TAIWAN
MR051079
R1
CY2308SC-1
150C
-65C
300
50
0
350
0
Summary for 'PkgFamily' = TSOP (Pb-Free) (7 detail records)
Sum
TSOP (Reverse)
ZR28R2AGN
R-CML
MR051013
R1
CY62256LL-70ZRI
150C
-65C
300
50
0
ZR28R2AGN
R-CML
MR053049
R1
CY62256LL-70ZRI
150C
-65C
300
45
0
95
0
50
0
Summary for 'PkgFamily' = TSOP (Reverse) (2 detail records)
Sum
TSOP (Reverse, Pb-Free)
ZY28R2AGN
R-CML
MR053057
2006 Q2 RELIABILITY REPORT
R1
CY62256LL-70ZRXI
150C
-65C
300
Page 73 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
Summary for 'PkgFamily' = TSOP (Reverse, Pb-Free) (1 detail record)
Sum
SS
Reject FA
50
0
TSOP I
ZA32RHAALB R-CML
MR052020
R1
CY62128DV30LL-55ZAI
150C
-65C
300
49
0
ZA32RHAALB R-CML
MR053056
R1
CY62128DV30LL-55ZAI
150C
-65C
300
50
0
ZA32RHAALN R-CML
MR062027
R1
CY62128DV30LL-70ZAI
150C
-65C
300
50
0
149
0
Summary for 'PkgFamily' = TSOP I (3 detail records)
Sum
TSOP I (Pb-Free)
ZB32RHALL
R-CML
MR061069
R1
CS6368AM
150C
-65C
300
45
0
ZB32RHALL
R-CML
MR062019
R1
CY62128DV30LL-70ZAXI
150C
-65C
300
46
0
91
0
Summary for 'PkgFamily' = TSOP I (Pb-Free) (2 detail records)
Sum
TSOP II
ZS324FAGE
T-TAIWAN
MR052009
R1
CY7C1019CV33-12ZC
150C
-65C
300
50
0
ZS324FAGE
T-TAIWAN
MR053055
R1
CY7C1019CV33-12ZC
150C
-65C
300
50
0
ZS444ABALE
R-CML
MR053058
R1
CS6125AT
150C
-65C
300
50
0
ZS444ABALE
R-CML
MR061067
R1
CS6334AS
150C
-65C
300
50
0
ZS444AJALN
R-CML
MR054008
R1
CY7C1021CV33-15ZC
150C
-65C
300
50
0
ZS444VAGL
R-CML
MR061063
R1
CY7C1021B-15ZC
150C
-65C
300
199
0
ZS444YAGL
R-CML
053007
R5
CY7C1041B-15ZC
150C
-65C
300
50
0
ZS444YBLL
R-CML
060905
R1
CY7C1041AV33-20ZC
150C
-65C
300
50
0
ZS444YBLL
R-CML
060905
R2
CY7C1041AV33-20ZC
150C
-65C
300
50
0
ZS444YBLL
R-CML
060905
R3
CY7C1041AV33-20ZC
150C
-65C
300
50
0
ZS544AALE
G-TAIWAN
MR052030
R1
CY7C1069AV33-12ZC
150C
-65C
300
50
0
699
0
Summary for 'PkgFamily' = TSOP II (11 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 74 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
TSOP II (Pb-Free)
ZW324CBLL
T-TAIWAN
060901
R1
CY7C1019CV33
150C
-65C
300
50
0
ZW324CBLL
T-TAIWAN
060901
R2
CY7C1019CV33
150C
-65C
300
50
0
ZW324CBLL
T-TAIWAN
060901
R3
CY7C1019CV33
150C
-65C
300
50
0
ZW324FAGL
T-TAIWAN
MR052021
R1
CY7C1019CV33-12ZXC
150C
-65C
300
50
0
ZW444AFLL
R-CML
054909
R1
CY62157EV
150C
-65C
300
50
0
ZW444AFLL
R-CML
054909
R2
CY62157EV
150C
-65C
300
50
0
ZW444AFLL
R-CML
054909
R2A
CY62157EV
150C
-65C
300
50
0
ZW444AHGLL R-CML
045202
R1
CY62127EV
150C
-65C
300
49
0
ZW444RAGN
R-CML
053102
R1
CY62137VLL-ZSXE
150C
-65C
300
50
0
ZW444RAGN
R-CML
053102
R2
CY62137VLL-ZSXE
150C
-65C
300
50
0
ZW444RAGN
R-CML
053102
R3
CY62137VLL-ZSXE
150C
-65C
300
50
0
ZW444VAGL
R-CML
052207
R1
CY7C1041DV33
150C
-65C
300
45
0
ZW444VAGL
R-CML
052207
R2
CY7C1041DV33
150C
-65C
300
50
0
ZW444VAGL
R-CML
052207
R3
CY7C1041DV33
150C
-65C
300
50
0
694
0
Summary for 'PkgFamily' = TSOP II (Pb-Free) (14 detail records)
Sum
TSOP/ TSSOP
Z1614GAGB
T-TAIWAN
MR061049
R1
CY22392ZC-347
150C
-65C
300
50
0
Z1619GAGN
RA-CML
MR053059
R1
CY26049ZC-36
150C
-65C
300
47
0
Z1619GAGN
RA-CML
MR061019
R1
C722393FI
150C
-65C
300
50
0
Z5624BAGN
R-CML
MR053046
r1
CY28409ZC
150C
-65C
300
50
0
197
0
Summary for 'PkgFamily' = TSOP/ TSSOP (4 detail records)
Sum
TSSOP (Pb-Free)
ZZ1613GAN
T-TAIWAN
MR052077
R1
CY2309ZXI-1H
150C
-65C
300
50
0
ZZ1614HAN
T-TAIWAN
MR061050
R1
CY23FS04ZXI
150C
-65C
300
50
0
2006 Q2 RELIABILITY REPORT
Page 75 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
TSSOP (Pb-Free)
ZZ1619GAN
RA-CML
MR054017
R1
CY22392ZXC
150C
-65C
300
50
0
ZZ1619GAN
RA-CML
MR061021
R1
CY22393FXC
150C
-65C
300
50
0
ZZ1619GAN
RA-CML
MR062009
R1
CY22392ZXI
150C
-65C
300
50
0
ZZ2813AAGL
T-TAIWAN
MR062032
R1
CY28517ZXC
150C
-65C
300
50
0
ZZ2813AAGL
T-TAIWAN
NR054005
R1
CY28517ZXC
150C
-65C
300
50
0
ZZ2813AAGL
T-TAIWAN
NR054005
R2
CY28517ZXC
150C
-65C
300
44
0
ZZ2813AAGL
T-TAIWAN
NR054005
R3
CY28517ZXC
150C
-65C
300
45
0
ZZ2813AGN
T-TAIWAN
053006
R1
CYI5002ZXC
150C
-65C
300
50
0
ZZ2813AGN
T-TAIWAN
053006
R2
CYI5002ZXC
150C
-65C
300
50
0
ZZ2813AGN
T-TAIWAN
053006
R3
CYI5002ZXC
150C
-65C
300
49
0
ZZ2817AGL
RA-CML
051903
R1
CY221R28-ZXC
150C
-65C
300
50
0
ZZ2817AGL
RA-CML
051903
R2
CY221R28-ZXC
150C
-65C
300
50
0
ZZ2817AGL
RA-CML
060903
R1
CY28517ZXC
150C
-65C
300
50
0
ZZ2817AGL
RA-CML
060903
R2
CY28517ZXC
150C
-65C
300
49
0
ZZ2817AGL
RA-CML
060903
R3
CY28517ZXC
150C
-65C
300
48
0
ZZ5624BG
R-CML
052802
R1
CY28411ZXC
150C
-65C
300
46
0
ZZ5624BG
R-CML
052802
R2
CY28411ZXC
150C
-65C
300
47
0
ZZ5624BG
R-CML
052802
R3
CY28411ZXC
150C
-65C
300
45
0
ZZ5624BGN
R-CML
MR061008
R1
CY28441ZXC
150C
-65C
300
45
0
ZZ5624BGN
R-CML
MR062006
R1
7C828411DC-RZZC
150C
-65C
300
50
0
ZZ6421GAGL
M-PHIL
060306
R1
CY28505ZXC-2
150C
-65C
300
50
0
ZZ6421GAGL
M-PHIL
060306
R2
CY28505ZXC-2
150C
-65C
300
49
0
ZZ6421GAGL
M-PHIL
060306
R3
CY28505ZXC-2
150C
-65C
300
50
0
1217
0
Summary for 'PkgFamily' = TSSOP (Pb-Free) (25 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 76 of 93
Results
Product Reliability
BldKit
Assy
Eval Num
TV
Device
Temp
Temp
Cycles
SS
Reject FA
VFBGA (0.75-0.8, Pb-Free)
BZ48BKALE
RA-CML
054906
R1
CYK128K16MCBLI-70BVXT
150C
-65C
300
47
0
BZ48BKALE
RA-CML
054906
R2
CYK128K16MCBLI-70BVXT
150C
-65C
300
50
0
BZ48BKALE
RA-CML
054906
R3
CYK128K16MCBLI-70BVXT
150C
-65C
300
50
0
BZ48BKALE
RA-CML
MR052088
R1
CYK128K16SCBU-55BVXI
150C
-65C
300
49
0
BZ48BTALN
RA-CML
054302
R1A
CY62147EV30*
150C
-65C
300
42
0
BZ48BTALN
R-CML
054302
R7
CY62147EV30*
150C
-65C
300
45
0
BZ52BGAGL
G-TAIWAN
043004
1A
7C87740A
150C
-65C
300
46
0
BZ52BGAGL
G-TAIWAN
043004
2C
7C87742A
150C
-65C
300
47
0
BZ52BGAGL
G-TAIWAN
043004
3B
7C87741A
150C
-65C
300
47
0
Summary for 'PkgFamily' = VFBGA (0.75-0.8, Pb-Free) (9 detail records)
Sum
Grand Total
2006 Q2 RELIABILITY REPORT
423
0
17098
29
Page 77 of 93
Results
Product Reliability
Summary Detail, Package -- HTS Performance Over Time
From:
To: 7/2/2006
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
SS Rejects FA
Chip On Board (Pb-Free)
DE001AAGL 052403
1A
EC-CHINA
7M6341AT-ECDEC
65C
120
45
0
DE001AAGL 052403
1A
EC-CHINA
7M6341AT-ECDEC
65C
240
45
0
DE001AAGL 052403
1B
EC-CHINA
7M6341AT-ECDEC
65C
120
45
0
DE001AAGL 052403
1B
EC-CHINA
7M6341AT-ECDEC
65C
240
45
0
DE001AAGL 052405
1A
SV-CHINA
7M6341AT-SVDEC
65C
120
45
0
DE001AAGL 052405
1A
SV-CHINA
7M6341AT-SVDEC
65C
240
45
0
DE001AAGL 052405
1B
SV-CHINA
7M6341AT-SVDEC
65C
120
45
0
DE001AAGL 052405
1B
SV-CHINA
7M6341AT-SVDEC
65C
240
45
0
360
0
Summary for 'PkgFamily' = Chip On Board (Pb-Free) (8 detail records)
Sum
FBGA (0.75-0.8)
BA48DJALE
045101
R1
G-TAIWAN
7C62172DC-GBAI
150C 1000
45
0
BA48DJALE
045101
R1
G-TAIWAN
7C62172DC-GBAI
150C 500
45
0
BA48BQAALE MR061059
R1
RA-CML
CY62137CVSL-70BAI
150C 1000
50
0
BA48BQAALE MR061059
R1
RA-CML
CY62137CVSL-70BAI
150C 500
50
0
190
0
Summary for 'PkgFamily' = FBGA (0.75-0.8) (4 detail records)
Sum
FBGA (0.75-0.8, Pb-Free)
BK48CDALL MR053012
R1
G-TAIWAN
CY7C1041CV33-10BAXC 150C 1000
50
0
BK48CDALL MR053012
R1
G-TAIWAN
CY7C1041CV33-10BAXC 150C 500
50
0
100
0
Summary for 'PkgFamily' = FBGA (0.75-0.8, Pb-Free) (2 detail records)
Sum
FBGA (1.0)
BB165WALE 055103
R1
RA-CML
CY7C1313AVIB
150C 1000
45
0
BB165WALE 055103
R1
RA-CML
CY7C1313AVIB
150C 500
45
0
BB172AAGE MR062002
R1
AC-ASE
CY7C09569V-100BBC
150C 1000
50
0
BB172AAGE MR062002
R1
AC-ASE
CY7C09569V-100BBC
150C 500
50
0
2006 Q2 RELIABILITY REPORT
Page 78 of 93
Results
7/3/2005
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
Summary for 'PkgFamily' = FBGA (1.0) (4 detail records)
Sum
SS Rejects FA
190
0
FVBGA (0.75-0.8, 0.3mm)
BV52BGAGE 043004
3A
G-TAIWAN
7C87742A
150C 1000
46
0
BV52BGAGE 043004
3A
G-TAIWAN
7C87742A
150C 500
46
0
BV52BGAGE 043004
3C
G-TAIWAN
7C87741A
150C 1000
45
0
BV52BGAGE 043004
3C
G-TAIWAN
7C87741A
150C 500
45
0
BV52BGAGE 043004
6
G-TAIWAN
7C87741A
150C 1000
46
0
BV52BGAGE 043004
6
G-TAIWAN
7C87741A
150C 500
46
0
BV52BGAGE 043004
6A
G-TAIWAN
7C87742A
150C 1000
46
0
BV52BGAGE 043004
6A
G-TAIWAN
7C87742A
150C 500
46
0
BV52BGAGE 043004
8
G-TAIWAN
7C87742A
150C 1000
46
0
BV52BGAGE 043004
8
G-TAIWAN
7C87742A
150C 500
46
0
BV48BZALL
054601
R2(1) RA-CML
CYU01M6TF53CZ
150C 1000
80
0
BV48BZALL
054601
R2(1) RA-CML
CYU01M6TF53CZ
150C 500
80
0
BV48BZALL
054601
R3
RA-CML
CYU01M6TF53CZ
150C 1000
50
0
BV48BZALL
054601
R3
RA-CML
CYU01M6TF53CZ
150C 500
50
0
BV48BZALL
054601
R3(1) RA-CML
CYU01M6TF53CZ
150C 1000
27
0
BV48BZALL
054601
R3(1) RA-CML
CYU01M6TF53CZ
150C 500
27
0
BV48BZALL
054601
R4
RA-CML
CYU01M6TF53CZ
150C 1000
77
0
BV48BZALL
054601
R4
RA-CML
CYU01M6TF53CZ
150C 500
77
0
BV48HAALE MR051014
R1
G-TAIWAN
CY62147CV33LL-70BVI
150C 1000
50
0
BV48HAALE MR051014
R1
G-TAIWAN
CY62147CV33LL-70BVI
150C 500
50
0
BV48BKALE MR053023
R1
RA-CML
CYK128K6C7BW-70BVI
150C 1000
50
0
BV48BKALE MR053023
R1
RA-CML
CYK128K6C7BW-70BVI
150C 500
50
0
BV48ASALE MR061056
R1
RA-CML
CY62147DV30LL-70BVI
150C 1000
50
0
BV48ASALE MR061056
R1
RA-CML
CY62147DV30LL-70BVI
150C 500
50
0
BV48ASALE MR062039
R1
RA-CML
CY62147DV18LL-70BVI
150C 1000
49
0
BV48ASALE MR062039
R1
RA-CML
CY62147DV18LL-70BVI
150C 500
50
0
1325
0
Summary for 'PkgFamily' = FVBGA (0.75-0.8, 0.3mm) (26 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 79 of 93
Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
SS Rejects FA
LCC
L04AA
052701
1
7C825701A
125C 1000
50
0
L04AA
052701
1
7C825701A
125C 500
50
0
100
0
Summary for 'PkgFamily' = LCC (2 detail records)
Sum
LCC (Windowed Plastic)
QY48AAALL 052003
1
IP-TAIWAN
7ISC305BF-IPQYC
150C 1000
50
0
QY48AAALL 052003
1
IP-TAIWAN
7ISC305BF-IPQYC
150C 500
50
0
QY48AAALL 060702
R1
IP-TAIWA
CAIMG20400-2
150C 1000
45
0
QY48AAALL 060702
R1
IP-TAIWA
CAIMG20400-2
150C 500
45
0
QY48AAALL 060702
R2
IP-TAIWA
CAIMG20400-2
150C 1000
45
0
QY48AAALL 060702
R2
IP-TAIWA
CAIMG20400-2
150C 500
45
0
QY48AAALL 060702
R3
IP-TAIWA
CAIMG20400-2
150C 1000
44
0
QY48AAALL 060702
R3
IP-TAIWA
CAIMG20400-2
150C 500
45
0
QY48AAALL 060702
R4
IP-TAIWA
CAIMG20400-2
150C 1000
45
0
QY48AAALL 060702
R4
IP-TAIWA
CAIMG20400-2
150C 500
45
0
459
0
Summary for 'PkgFamily' = LCC (Windowed Plastic) (10 detail records)
Sum
LK
LK32
061701
R1
RA-CML
CY8C21434-24LXI
150C 1000
50
0
LK32
061701
R1
RA-CML
CY8C21434-24LXI
150C 500
50
0
100
0
Summary for 'PkgFamily' = LK (2 detail records)
Sum
PBGA (1.27)
BG272AAGE MR052034
R1
G-TAIWAN
CY7C0430BV-100BGI
150C 1000
50
0
BG272AAGE MR052034
R1
G-TAIWAN
CY7C0430BV-100BGI
150C 500
50
0
BG119NALE MR053018
R1
G-TAIWAN
CY7C1354B-166GBC
150C 1000
50
0
BG119NALE MR053018
R1
G-TAIWAN
CY7C1354B-166GBC
150C 500
50
0
BG119JALE
MR061045
R1
G-TAIWAN
CY7C1062AV33-12BGI
150C 1000
50
0
BG119JALE
MR061045
R1
G-TAIWAN
CY7C1062AV33-12BGI
150C 500
50
0
2006 Q2 RELIABILITY REPORT
Page 80 of 93
Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
Summary for 'PkgFamily' = PBGA (1.27) (6 detail records)
Sum
SS Rejects FA
300
0
PBGA (Cavity/Heatsink)
BL304ABGE MR044043
R1
G-TAIWAN
CYNSE70129A-125BGC 150C 1000
45
0
BL304ABGE MR044043
R1
G-TAIWAN
CYNSE70129A-125BGC 150C 500
45
0
BL256L2GE
MR054018
R1
G-TAIWAN
CYP15G0401DXB-BGC
150C 1000
50
0
BL256L2GE
MR054018
R1
G-TAIWAN
CYP15G0401DXB-BGC
150C 500
50
0
190
0
Summary for 'PkgFamily' = PBGA (Cavity/Heatsink) (4 detail records)
Sum
PBGA (Cavity/Heatsink, Pb-Free)
BJ256L2GL
044507
R1
G-TAIWN
CY28323BPVC
150C 1000
50
0
BJ256L2GL
044507
R1
G-TAIWN
CY28323BPVC
150C 500
50
0
100
0
Summary for 'PkgFamily' = PBGA (Cavity/Heatsink, Pb-Free) (2 detail records)
Sum
PDIP
P203CGAGB MR053013
R1
O-INDNS
CY7C168A-35PC
150C 1000
45
0
P203CGAGB MR053013
R1
O-INDNS
CY7C168A-35PC
150C 500
45
0
P286EGAGB MR054044
R1
O-INDNS
CY62256LL-70PC
150C 1000
50
0
P286EGAGB MR054044
R1
O-INDNS
CY62256LL-70PC
150C 500
50
0
P4865GAGE MR061057
R1
G-TAIWAN
CY7C130-55PC
150C 1000
50
0
P4865GAGE MR061057
R1
G-TAIWAN
CY7C130-55PC
150C 500
50
0
P4865GAGE MR062010
R1
X-THAI
CY7C130-55PC
150C 1000
50
0
P4865GAGE MR062010
R1
X-THAI
CY7C130-55PC
150C 500
50
0
390
0
Summary for 'PkgFamily' = PDIP (8 detail records)
Sum
PDIP (Pb-Free)
PZ243AAGN 051206
R1
X-THAI
CY7C63743-PXC
150C 1000
50
0
PZ243AAGN 051206
R1
X-THAI
CY7C63743-PXC
150C 500
50
0
PZ2831GAN MR053014
R1
O-INDNS
CY7C64013A-PXC
150C 1000
45
0
PZ2831GAN MR053014
R1
O-INDNS
CY7C64013A-PXC
150C 500
45
0
PZ183AXGN MR054048
R1
O-INDNS
CY7C63723-PXC
150C 1000
50
0
2006 Q2 RELIABILITY REPORT
Page 81 of 93
Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
SS Rejects FA
PZ183AXGN MR054048
R1
O-INDNS
CY7C63723-PXC
150C 500
50
0
PZ183AXGN MR061013
R1
O-INDNS
CP6238BM
150C 1000
45
0
PZ183AXGN MR061013
R1
O-INDNS
CP6238BM
150C 500
45
0
380
0
Summary for 'PkgFamily' = PDIP (Pb-Free) (8 detail records)
Sum
PLCC
J32RNGAGE MR053031
R1
M-PHIL
CY7C4271V-25JC
150C 1000
50
0
J32RNGAGE MR053031
R1
M-PHIL
CY7C4271V-25JC
150C 500
50
0
J28SEGAGB MR054019
R1
M-PHIL
CY7B923-JC
150C 1000
50
0
J28SEGAGB MR054019
R1
M-PHIL
CY7B923-JC
150C 500
50
0
J32RBGAGB MR054059
R1
X-THAI
CY7B9911-5JC
150C 1000
50
0
J32RBGAGB MR054059
R1
X-THAI
CY7B9911-5JC
150C 500
50
0
J68SCGAGB MR054061
R1
X-THAI
CY7C144-55JCT
150C 1000
50
0
J68SCGAGB MR054061
R1
X-THAI
CY7C144-55JCT
150C 500
50
0
J52SFGAGB MR061020
R1
M-PHIL
CY7C136-55JI
150C 1000
50
0
J52SFGAGB MR061020
R1
M-PHIL
CY7C136-55JI
150C 500
50
0
J32RBGAGB MR061051
R1
X-THAI
CY7B991-7JC
150C 1000
50
0
J32RBGAGB MR061051
R1
X-THAI
CY7B991-7JC
150C 500
50
0
600
0
Summary for 'PkgFamily' = PLCC (12 detail records)
Sum
PLCC (Pb-Free)
JZ32RBGAN MR053028
R1
M-PHIL
CY7C419-15JXC
150C 1000
50
0
JZ32RBGAN MR053028
R1
M-PHIL
CY7C419-15JXC
150C 500
50
0
JZ52SFGAN MR061061
R1
M-PHIL
CYC131-25JXC
150C 1000
50
0
JZ52SFGAN MR061061
R1
M-PHIL
CYC131-25JXC
150C 500
50
0
JZ52SFGAN MR062017
R1
M-PHIL
CY7C136-25JXC
150C 1000
50
0
JZ52SFGAN MR062017
R1
M-PHIL
CY7C136-25JXC
150C 500
50
0
300
0
Summary for 'PkgFamily' = PLCC (Pb-Free) (6 detail records)
Sum
2006 Q2 RELIABILITY REPORT
Page 82 of 93
Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
SS Rejects FA
PQFP
N52DXGAGB MR054060
R1
G-TAIWAN
CY7C131-55NC
150C 1000
50
0
N52DXGAGB MR054060
R1
G-TAIWAN
CY7C131-55NC
150C 500
50
0
100
0
Summary for 'PkgFamily' = PQFP (2 detail records)
Sum
PQFP (Pb-Free)
NZ52DXGAN MR061044
R1
G-TAIWAN
CY7C131GT-GNZC
150C 1000
50
0
NZ52DXGAN MR061044
R1
G-TAIWAN
CY7C131GT-GNZC
150C 500
50
0
NZ52DXGAN MR061062
R1
G-TAIWAN
CY7C136-55NXC
150C 1000
47
0
NZ52DXGAN MR061062
R1
G-TAIWAN
CY7C136-55NXC
150C 500
47
0
NZ52DXGAN MR062067
R1
G-TAIWAN
7C136GT-GNZC
150C 1000
50
0
NZ52DXGAN MR062067
R1
G-TAIWAN
7C136GT-GNZC
150C 500
50
0
294
0
Summary for 'PkgFamily' = PQFP (Pb-Free) (6 detail records)
Sum
QFN (Punch Type)
LF56AGAGE MR051075
R1
L-SEOL
CY7C65640A-LFC
150C 1000
50
0
LF56AGAGE MR051075
R1
L-SEOL
CY7C65640A-LFC
150C 500
50
0
LF56AGAGE MR052016
R1
L-SEOL
CY7C65640A-LFC
150C 1000
49
0
LF56AGAGE MR052016
R1
L-SEOL
CY7C65640A-LFC
150C 500
50
0
LF56AGAGE MR061018
R1
L-SEOL
CY7C68300A-56LFC
150C 1000
50
0
LF56AGAGE MR061018
R1
L-SEOL
CY7C68300A-56LFC
150C 500
50
0
LF56AGAGE MR062007
R1
L-SEOL
CY7C68001EC-56LFC
150C 1000
50
0
LF56AGAGE MR062007
R1
L-SEOL
CY7C68001EC-56LFC
150C 500
50
0
399
0
Summary for 'PkgFamily' = QFN (Punch Type) (8 detail records)
Sum
QFN (Punch Type, Pb-Free)
LY72AGAGL 054206
R2
L-SEOL
CY28447LF-XC
150C 1000
50
0
LY72AGAGL 054206
R2
L-SEOL
CY28447LF-XC
150C 500
50
0
LY56DGAGL MR054024
R1
L-SEOL
CY7C68300B-56LFXC
150C 1000
50
0
LY56DGAGL MR054024
R1
L-SEOL
CY7C68300B-56LFXC
150C 500
50
0
LY56DGAGL MR061040
R1
L-SEOL
CY7C68013A-56LFXC
150C 1000
50
0
2006 Q2 RELIABILITY REPORT
Page 83 of 93
Results
Product Reliability
BldKit
LY56DGAGL
Eval Num
TV AssyLoc
Device
Temp Readout
SS Rejects FA
MR061040
R1
L-SEOL
CY7C68013A-56LFXC
150C 500
50
0
LY56AGAGL MR062031
R1
L-SEOL
CY7C65640A-LFXC
150C 1000
50
0
LY56AGAGL MR062031
R1
L-SEOL
CY7C65640A-LFXC
150C 500
50
0
400
0
Summary for 'PkgFamily' = QFN (Punch Type, Pb-Free) (8 detail records)
Sum
QSOP (Pb-Free)
SQ2414AGN MR054062
R1
R-CML
CY7C63101A-QXC
150C 1000
50
0
SQ2414AGN MR054062
R1
R-CML
CY7C63101A-QXC
150C 500
50
0
SQ2414AGN MR061071
R1
R-CML
CY7C63101A-QXC
150C 1000
50
0
SQ2414AGN MR061071
R1
R-CML
CY7C63101A-QXC
150C 500
50
0
SQ2414AGN MR062008
R1
R-CML
CY7C637433-QXC
150C 1000
50
0
SQ2414AGN MR062008
R1
R-CML
CY7C637433-QXC
150C 500
50
0
300
0
Summary for 'PkgFamily' = QSOP (Pb-Free) (6 detail records)
Sum
SOIC (GullWing)
S283HGAGB MR052073
R1
O-INDNS
CY7B933-SC
150C 1000
50
0
S283HGAGB MR052073
R1
O-INDNS
CY7B933-SC
150C 500
50
0
S1615EAGB MR053002
R1
M-PHIL
CY2309SC-1H
150C 1000
50
0
S1615EAGB MR053002
R1
M-PHIL
CY2309SC-1H
150C 500
50
0
S324513GN
MR053003
R1
R-CML
CY6525AM
150C 1000
50
0
S324513GN
MR053003
R1
R-CML
CY6525AM
150C 500
50
0
S183AGAGB MR054034
R1
M-PHIL
CY7C63231A-SC
150C 1000
50
0
S183AGAGB MR054034
R1
M-PHIL
CY7C63231A-SC
150C 500
50
0
S1615AAGB MR054041
R1
O-INDNS
CY2308SC-1H
150C 1000
46
0
S1615AAGB MR054041
R1
O-INDNS
CY2308SC-1H
150C 500
50
0
S1615KAGN MR061011
R1
R-CML
CY2308SC-1H
150C 1000
50
0
S1615KAGN MR061011
R1
R-CML
CY2308SC-1H
150C 500
50
0
S1615AAGB MR061012
R1
O-INDNS
CY2308SI-1T
150C 1000
45
0
S1615AAGB MR061012
R1
O-INDNS
CY2308SI-1T
150C 500
45
0
S1615EAGB MR061024
R1
M-PHIL
CY2308SC-3
150C 1000
48
0
S1615EAGB MR061024
R1
M-PHIL
CY2308SC-3
150C 500
48
2006 Q2 RELIABILITY REPORT
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Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
S324513GB
MR061065
R1
S324513GB
MR062004
S324513GN
S324513GN
R-CML
CS5761AT
150C 1000
50
0
R1
R-CML
CS5761AT
150C 1000
50
0
MR062022
R1
R-CML
CY62128DV30LL-70SI
150C 1000
50
0
MR062022
R1
R-CML
CY62128DV30LL-70SI
150C 500
50
0
982
0
Summary for 'PkgFamily' = SOIC (GullWing) (20 detail records)
Sum
SS Rejects FA
SOIC (GullWing, 450 footprint)
SN2831AHN MR053037
R1
R-CML
CY22313
150C 1000
50
0
SN2831AHN MR053037
R1
R-CML
CY22313
150C 500
50
0
SN2831AHB MR061036
R1
R-CML
CS5756AT
150C 1000
45
0
SN2831AHB MR061036
R1
R-CML
CS5756AT
150C 500
45
0
190
0
Summary for 'PkgFamily' = SOIC (GullWing, 450 footprint) (4 detail records)
Sum
SOIC (GullWing, 450 footprint, Pb-Free)
SY2831AHN 053407
R1
R-CML
CY62256LL
150C 1000
50
0
SY2831AHN MR062047
R1
R-CML
CY62256LL-70SNXI
150C 1000
50
0
SY2831AHN MR062047
R1
R-CML
CY62256LL-70SNXI
150C 500
50
0
150
0
Summary for 'PkgFamily' = SOIC (GullWing, 450 footprint, Pb-Free) (3 detail records)
Sum
SOIC (GullWing, Pb-Free)
SZ28327GL
054604
R1
R-CML
CY7C64013C-SXC
150C 1000
50
0
SZ28327GL
054604
R1
R-CML
CY7C64013C-SXC
150C 500
50
0
SZ18
060304
R4
OP-PHIL
CY7C65113
150C 1000
50
0
SZ18
060304
R4
OP-PHIL
CY7C65113
150C 500
50
0
SZ1615EGN MR052046
R1
M-PHIL
CY2309SXC-1H
150C 1000
50
0
SZ1615EGN MR052046
R1
M-PHIL
CY2309SXC-1H
150C 500
50
0
SZ24315GN
MR053032
R1
RA-CML
CY7C63743-SXC
150C 1000
50
0
SZ24315GN
MR053032
R1
RA-CML
CY7C63743-SXC
150C 500
50
0
SZ183CGAN MR054016
R1
RA-CML
CY7C63723-SXC
150C 1000
50
0
SZ183CGAN MR054016
R1
RA-CML
CY7C63723-SXC
150C 500
50
0
SZ1615EGN MR054025
R1
M-PHIL
CY2308SXC-3
150C 1000
29
0
2006 Q2 RELIABILITY REPORT
Page 85 of 93
Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
SS Rejects FA
SZ1615EGN MR054025
R1
M-PHIL
CY2308SXC-3
150C 500
29
0
SZ1615EGN MR054025
R1A
M-PHIL
CY2308SXC-3
150C 1000
21
0
SZ1615EGN MR054025
R1A
M-PHIL
CY2308SXC-3
150C 500
21
0
SZ24312GN
MR061009
R1
R-CML
CY7B951-SXC
150C 1000
50
0
SZ24312GN
MR061009
R1
R-CML
CY7B951-SXC
150C 500
50
0
SZ1615FAL
MR061034
R1
T-TAIWAN
CY23EP09SXC-1H
150C 1000
50
0
SZ1615FAL
MR061034
R1
T-TAIWAN
CY23EP09SXC-1H
150C 500
50
0
SZ183AGAN MR061037
R1
M-PHIL
CY7C63723-SXC
150C 1000
50
0
SZ183AGAN MR061037
R1
M-PHIL
CY7C63723-SXC
150C 500
50
0
SZ1615KGN MR062005
R1
RA-CML
7C80727AT-RASZI
150C 1000
50
0
SZ1615KGN MR062005
R1
RA-CML
7C80727AT-RASZI
150C 500
50
0
SZ1813AGAN MR062011
R1
M-PHIL
CY7C63723-SXC
150C 1000
50
0
SZ1813AGAN MR062011
R1
M-PHIL
CY7C63723-SXC
150C 500
50
0
SZ1615FAL
MR062060
R1
T-TAIWAN
CY23EP09SXC-1H
150C 1000
50
0
SZ1615FAL
MR062060
R1
T-TAIWAN
CY23EP09SXC-1H
150C 500
50
0
1200
0
Summary for 'PkgFamily' = SOIC (GullWing, Pb-Free) (26 detail records)
Sum
SOIC (J lead)
V324218LL
061401
R4
R-CML
CY7C109
150C 500
45
0
V324EGAGB MR052014
R1
O-INDNS
CY7C1019B-10VC
150C 1000
45
0
V324EGAGB MR052014
R1
O-INDNS
CY7C1019B-10VC
150C 500
45
0
V444ZGALL
MR053004
R1
R-CML
CY7C1021CV33
150C 1000
50
0
V444ZGALL
MR053004
R1
R-CML
CY7C1021CV33
150C 500
50
0
V324FGAGB MR053015
R1
O-INDNS
CY7C109B-20VC
150C 1000
45
0
V324FGAGB MR053015
R1
O-INDNS
CY7C109B-20VC
150C 500
45
0
V444ZGALL
MR054001
R1
R-CML
CY7C1021CV33-15VC
150C 1000
44
0
V444ZGALL
MR054001
R1
R-CML
CY7C1021CV33-15VC
150C 500
48
0
V2439GAGB MR054004
R1
O-INDNS
CY7C128A-15VC
150C 1000
50
0
V2439GAGB MR054004
R1
O-INDNS
CY7C128A-15VC
150C 500
50
0
V444ZGALL
R1
R-CML
CY7C1021CV33-12VC
150C 1000
50
0
V444ZGALL MR061006
R1
2006 Q2 RELIABILITY REPORT
R-CML
CY7C1021CV33-12VC
150C 500
50
MR061006
0
Page 86 of 93
Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
SS Rejects FA
V243GGBLE MR061083
R1
O-INDNS
CY7C197B-15VC
150C 1000
45
0
V243GGBLE MR061083
R1
O-INDNS
CY7C197B-15VC
150C 500
45
0
V444ZGALL
MR062026
R1
R-CML
CY7C1021CV33-12VC
150C 1000
47
0
V444ZGALL
MR062026
R1
R-CML
CY7C1021CV33-12VC
150C 500
49
0
803
0
Summary for 'PkgFamily' = SOIC (J lead) (17 detail records)
Sum
SOIC (J lead, Pb-Free)
VZ243GGBLL 052801
R1
O-INDNS
CY7C197
150C 1000
50
0
VZ243GGBLL 052801
R1
O-INDNS
CY7C197
150C 500
50
0
VZ32418
054502
R4
R-CML
CY7C109
150C 1000
45
0
VZ32418
054502
R4
R-CML
CY7C109
150C 500
45
0
VZ444ZALL
MR053005
R1
R-CML
CY7C1021CV33-8VXC
150C 1000
50
0
VZ444ZALL
MR053005
R1
R-CML
CY7C1021CV33-8VXC
150C 500
50
0
VZ3644GALL MR053038
R1
R-CML
CY7C1049B-20VXI
150C 1000
48
0
VZ3644GALL MR053038
R1
R-CML
CY7C1049B-20VXI
150C 500
50
0
VZ444ZALL
MR054002
R1
R-CML
CY7C1021CV33-12VXC
150C 1000
50
0
VZ444ZALL
MR054002
R1
R-CML
CY7C1021CV33-12VXC
150C 500
50
0
VZ444YALL
MR062001
R1
R-CML
CY7C1041CV33-12VXC
150C 1000
44
0
VZ444YALL
MR062001
R1
R-CML
CY7C1041CV33-12VXC
150C 500
44
0
VZ28311GL
NR061004
R1
R-CML
CY7C199C-15VXC
150C 1000
50
0
VZ28311GL
NR061004
R1
R-CML
CY7C199C-15VXC
150C 500
50
0
VZ28311GL
NR061004
R2
R-CML
CY7C199C-15VXI
150C 1000
50
0
VZ28311GL
NR061004
R2
R-CML
CY7C199C-15VXI
150C 500
50
0
VZ32311ALL NR061004
R3
R-CML
CY7C1009B-15VXC
150C 1000
50
0
VZ32311ALL NR061004
R3
R-CML
CY7C1009B-15VXC
150C 500
50
0
876
0
Summary for 'PkgFamily' = SOIC (J lead, Pb-Free) (18 detail records)
Sum
SSOP
O2026XAGB 053205
R1
T-TAIWAN
IMISM530AYB
150C 1000
45
0
O2026XAGB 053205
R1
T-TAIWAN
IMISM530AYB
150C 500
45
0
O2824GAGB 053205
R2
T-TAIWAN
CY28506OC
150C 1000
45
2006 Q2 RELIABILITY REPORT
0
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Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
SS Rejects FA
O2824GAGB 053205
R2
T-TAIWAN
CY28506OC
150C 500
45
0
O4816XAGB 053205
R3
T-TAIWAN
CY28342OC
150C 1000
45
0
O4816XAGB 053205
R3
T-TAIWAN
CY28342OC
150C 500
45
0
O2026XAGB 053205
R4
T-TAIWAN
IMISM530AYB
150C 1000
45
0
O2026XAGB 053205
R4
T-TAIWAN
IMISM530AYB
150C 500
45
0
O2028GAGE 053205
R5
T-TAIWAN
CY2CC810OI
150C 1000
50
0
O2028GAGE 053205
R5
T-TAIWAN
CY2CC810OI
150C 500
50
0
O2824GAGB 053205
R6
T-TAIWAN
CY28508OC
150C 1000
50
0
O2824GAGB 053205
R6
T-TAIWAN
CY28508OC
150C 500
50
0
O2024GAGE MR053001
R1
M-PHIL
CY2DP3140I
150C 1000
50
0
O2024GAGE MR053001
R1
M-PHIL
CY2DP3140I
150C 500
50
0
O563AXAGB MR053029
R1
R-CML
CY28346OC
150C 1000
50
0
O563AXAGB MR053029
R1
R-CML
CY28346OC
150C 500
50
0
O563BXAGL MR054037
R1
R-CML
CY7C68300A-56PVC
150C 1000
50
0
O563BXAGL MR054037
R1
R-CML
CY7C68300A-56PVC
150C 500
50
0
O5615GAGB MR054039
R1
T-TAIWAN
CY283410C-2
150C 1000
50
0
O5615GAGB MR054039
R1
T-TAIWAN
CY283410C-2
150C 500
50
0
O56
MR061007
R1
R-CML
CY284690CT
150C 1000
50
0
O56
MR061007
R1
R-CML
CY284690CT
150C 500
50
0
1060
0
Summary for 'PkgFamily' = SSOP (22 detail records)
Sum
SSOP (Pb-Free)
SP563AAGN MR062030
R1
R-CML
CY284100XC
150C 1000
49
0
SP563AAGN MR062030
R1
R-CML
CY284100XC
150C 500
50
0
SP28214GL
MR062059
R1
T-TAIWAN
CY8C24423A-24PVXI
150C 1000
50
0
SP28214GL
MR062059
R1
T-TAIWAN
CY8C24423A-24PVXI
150C 500
50
0
199
0
0
Summary for 'PkgFamily' = SSOP (Pb-Free) (4 detail records)
Sum
TQFP
A100
054904
1
7CL8Q01AC
150C 1000
50
A100
054904
1
7CL8Q01AC
150C 500
50
2006 Q2 RELIABILITY REPORT
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Results
Product Reliability
BldKit
A52AEGAGE
Eval Num
TV AssyLoc
Device
Temp Readout
SS Rejects FA
MR052004
R1
Q-KOREA
CY29972AI
150C 1000
50
0
A52AEGAGE MR052004
R1
Q-KOREA
CY29972AI
150C 500
50
0
A100SEGAGL MR053027
R1
R-CML
CY7C9689A-AC
150C 1000
49
0
A100SEGAGL MR053027
R1
R-CML
CY7C9689A-AC
150C 500
50
0
A64FXGAGE MR054058
R1
G-TAIWAN
CY7C144AV-25AC
150C 1000
45
0
A64FXGAGE MR054058
R1
G-TAIWAN
CY7C144AV-25AC
150C 500
45
0
A100SGAGL MR061002
R1
R-CML
CY7C027V-25AC
150C 1000
50
0
A100SGAGL MR061002
R1
R-CML
CY7C027V-25AC
150C 500
50
0
489
0
Summary for 'PkgFamily' = TQFP (10 detail records)
Sum
TQFP (10x10)
AS64CGAGB MR053050
R1
Q-KOREA
CY7C4275V-15ASC
150C 1000
50
0
AS64CGAGB MR053050
R1
Q-KOREA
CY7C4275V-15ASC
150C 500
50
0
AS64BGAGB MR062080
R1
G-TAIWAN
CY7C1012AV33-BBGC
150C 1000
50
0
AS64BGAGB MR062080
R1
G-TAIWAN
CY7C1012AV33-BBGC
150C 500
50
0
200
0
Summary for 'PkgFamily' = TQFP (10x10) (4 detail records)
Sum
TQFP (Pb-Free)
AZ100RSLL
052607
R1
R-CML
CY7C1339G
150C 1000
50
0
AZ100SEGL 052805
R1
R-CML
CY7C67300-100AXI
150C 1000
50
0
AZ144GGAL MR052074
R1
G-TAIWAN
CY7C056V-12AXC
150C 1000
47
0
AZ144GGAL MR052074
R1
G-TAIWAN
CY7C056V-12AXC
150C 500
47
0
AZ128BGAL MR054010
R1
G-TAIWAN
CY7C68013A-128AXC
150C 1000
49
0
AZ128BGAL MR054010
R1
G-TAIWAN
CY7C68013A-128AXC
150C 500
50
0
AZ100SFAL
MR061003
R1
R-CML
7C024CT-RAZC
150C 1000
50
0
AZ100SFAL
MR061003
R1
R-CML
7C024CT-RAZC
150C 500
50
0
AZ64FXGAL MR061046
R1
G-TAIWAN
CY7C144-55AXC
150C 1000
50
0
AZ64FXGAL MR061046
R1
G-TAIWAN
CY7C144-55AXC
150C 500
50
0
AZ64FXGAL MR062057
R1
G-TAIWAN
7C0063NFC-GAZC
150C 1000
50
0
AZ64FXGAL MR062057
R1
G-TAIWAN
7C0063NFC-GAZC
150C 500
50
0
2006 Q2 RELIABILITY REPORT
Page 89 of 93
Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
Summary for 'PkgFamily' = TQFP (Pb-Free) (12 detail records)
Sum
SS Rejects FA
593
0
TSOP (Pb-Free)
ZT32RYAGL MR051079
R1
T-TAIWAN
CY2308SC-1
150C 1000
49
0
ZT32RYAGL MR051079
R1
T-TAIWAN
CY2308SC-1
150C 500
50
0
ZT28R4AGL MR052011
R1
R-CML
CY7C1399B-15ZXC
150C 1000
50
0
ZT28R4AGL MR052011
R1
R-CML
CY7C1399B-15ZXC
150C 500
50
0
ZT32RKGGL MR052044
R1
T-TAIWAN
CY7C109B-15ZXC
150C 1000
50
0
ZT32RKGGL MR052044
R1
T-TAIWAN
CY7C109B-15ZXC
150C 500
50
0
ZT28R2AGN MR061010
R1
R-CML
CY7C199-15ZXC
150C 1000
50
0
ZT28R2AGN MR061010
R1
R-CML
CY7C199-15ZXC
150C 500
50
0
399
0
Summary for 'PkgFamily' = TSOP (Pb-Free) (8 detail records)
Sum
TSOP (Reverse)
ZR28R2AGN MR051013
R1
R-CML
CY62256LL-70ZRI
150C 1000
50
0
ZR28R2AGN MR051013
R1
R-CML
CY62256LL-70ZRI
150C 500
50
0
ZR28R2AGN MR053049
R1
R-CML
CY62256LL-70ZRI
150C 1000
45
0
ZR28R2AGN MR053049
R1
R-CML
CY62256LL-70ZRI
150C 500
45
0
190
0
Summary for 'PkgFamily' = TSOP (Reverse) (4 detail records)
Sum
TSOP (Reverse, Pb-Free)
ZY28R2AGN MR053057
R1
R-CML
CY62256LL-70ZRXI
150C 1000
50
0
ZY28R2AGN MR053057
R1
R-CML
CY62256LL-70ZRXI
150C 500
50
0
100
0
Summary for 'PkgFamily' = TSOP (Reverse, Pb-Free) (2 detail records)
Sum
TSOP I
ZA32RHAALB MR052020
R1
R-CML
CY62128DV30LL-55ZAI
150C 1000
50
0
ZA32RHAALB MR052020
R1
R-CML
CY62128DV30LL-55ZAI
150C 500
50
0
ZA32RHAALB MR053056
R1
R-CML
CY62128DV30LL-55ZAI
150C 1000
50
0
ZA32RHAALB MR053056
R1
R-CML
CY62128DV30LL-55ZAI
150C 500
50
0
ZA32RHAALN MR062027
R1
R-CML
CY62128DV30LL-70ZAI
150C 1000
50
0
2006 Q2 RELIABILITY REPORT
Page 90 of 93
Results
Product Reliability
BldKit
Eval Num
ZA32RHAALN MR062027
TV AssyLoc
R1
R-CML
Device
Temp Readout
CY62128DV30LL-70ZAI
150C 500
Summary for 'PkgFamily' = TSOP I (6 detail records)
Sum
SS Rejects FA
50
0
300
0
TSOP I (Pb-Free)
ZB32RHALL MR061069
R1
R-CML
CS6368AM
150C 1000
45
0
ZB32RHALL MR061069
R1
R-CML
CS6368AM
150C 500
45
0
ZB32RHALL MR062019
R1
R-CML
CY62128DV30LL-70ZAXI 150C 1000
50
0
ZB32RHALL MR062019
R1
R-CML
CY62128DV30LL-70ZAXI 150C 500
50
0
190
0
Summary for 'PkgFamily' = TSOP I (Pb-Free) (4 detail records)
Sum
TSOP II
ZS324FAGE MR052009
R1
T-TAIWAN
CY7C1019CV33-12ZC
150C 1000
50
0
ZS324FAGE MR052009
R1
T-TAIWAN
CY7C1019CV33-12ZC
150C 500
50
0
ZS544AALE
MR052030
R1
G-TAIWAN
CY7C1069AV33-12ZC
150C 1000
45
0
ZS544AALE
MR052030
R1
G-TAIWAN
CY7C1069AV33-12ZC
150C 500
45
0
ZS324FAGE MR053055
R1
T-TAIWAN
CY7C1019CV33-12ZC
150C 1000
50
0
ZS324FAGE MR053055
R1
T-TAIWAN
CY7C1019CV33-12ZC
150C 500
50
0
ZS444ABALE MR053058
R1
R-CML
CS6125AT
150C 1000
50
0
ZS444ABALE MR053058
R1
R-CML
CS6125AT
150C 500
50
0
ZS444AJALN MR054008
R1
R-CML
CY7C1021CV33-15ZC
150C 1000
49
0
ZS444AJALN MR054008
R1
R-CML
CY7C1021CV33-15ZC
150C 500
49
0
ZS444ABALE MR061067
R1
R-CML
CS6334AS
150C 1000
50
0
538
0
Summary for 'PkgFamily' = TSOP II (11 detail records)
Sum
TSOP II (Pb-Free)
ZW444VAGL 052207
R1
R-CML
CY7C1041DV33
150C 1000
50
0
ZW444VAGL 052207
R1
R-CML
CY7C1041DV33
150C 500
50
0
ZW444RAGN 053102
R1
R-CML
CY62137VLL-ZSXE
150C 1000
50
0
ZW324FAGL MR052021
R1
T-TAIWAN
CY7C1019CV33-12ZXC
150C 1000
50
0
ZW324FAGL MR052021
R1
T-TAIWAN
CY7C1019CV33-12ZXC
150C 500
50
0
ZW444ABLL MR061066
R1
R-CML
CY7C1021CV26-15ZSXE 150C 1000
50
0
2006 Q2 RELIABILITY REPORT
Page 91 of 93
Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
Device
Temp Readout
Summary for 'PkgFamily' = TSOP II (Pb-Free) (6 detail records)
Sum
SS Rejects FA
300
0
TSOP/ TSSOP
Z5624BAGN MR053046
r1
R-CML
CY28409ZC
150C 1000
50
0
Z5624BAGN MR053046
r1
R-CML
CY28409ZC
150C 500
50
0
Z5624BAGN MR061005
R1
R-CML
CY28409ZC
150C 1000
50
0
Z5624BAGN MR061005
R1
R-CML
CY28409ZC
150C 500
50
0
200
0
Summary for 'PkgFamily' = TSOP/ TSSOP (4 detail records)
Sum
TSSOP (Pb-Free)
ZZ6421GAGL 060306
R2
M-PHIL
CY28505ZXC-2
150C 1000
50
0
ZZ6421GAGL 060306
R2
M-PHIL
CY28505ZXC-2
150C 500
50
0
ZZ1613GAN MR052077
R1
T-TAIWAN
CY2309ZXI-1H
150C 1000
50
0
ZZ1613GAN MR052077
R1
T-TAIWAN
CY2309ZXI-1H
150C 500
50
0
ZZ5624BGN MR061008
R1
R-CML
CY28441ZXC
150C 1000
50
0
ZZ5624BGN MR061008
R1
R-CML
CY28441ZXC
150C 500
50
0
ZZ1619GAN MR061021
R1
RA-CML
CY22393FXC
150C 1000
49
0
ZZ1619GAN MR061021
R1
RA-CML
CY22393FXC
150C 500
49
0
ZZ5624BGN MR062006
R1
R-CML
7C828411DC-RZZC
150C 1000
50
0
ZZ5624BGN MR062006
R1
R-CML
7C828411DC-RZZC
150C 500
50
0
ZZ2813AAGL MR062032
R1
T-TAIWAN
CY28517ZXC
150C 1000
50
0
ZZ2813AAGL MR062032
R1
T-TAIWAN
CY28517ZXC
150C 500
50
0
598
0
Summary for 'PkgFamily' = TSSOP (Pb-Free) (12 detail records)
Sum
VFBGA (0.75-0.8, Pb-Free)
BZ52BGAGL 043004
1A
G-TAIWAN
7C87740A
150C 1000
46
0
BZ52BGAGL 043004
1A
G-TAIWAN
7C87740A
150C 500
47
0
BZ52BGAGL 043004
2C
G-TAIWAN
7C87742A
150C 500
46
0
BZ52BGAGL 043004
3B
G-TAIWAN
7C87741A
150C 500
46
0
BZ48BTALN 054302
R1A
RA-CML
CY62147EV30*
150C 1000
45
0
2006 Q2 RELIABILITY REPORT
Page 92 of 93
Results
Product Reliability
BldKit
Eval Num
TV AssyLoc
BZ48BTALN 054302
R1A
RA-CML
BZ48BKALE MR052088
R1
RA-CML
Device
Temp Readout
CY62147EV30*
150C 500
CYK128K16SCBU-55BV 150C 1000
XI
BZ48BKALE MR052088
R1
RA-CML
CYK128K16SCBU-55BV 150C 500
XI
Summary for 'PkgFamily' = VFBGA (0.75-0.8, Pb-Free) (8 detail records)
Sum
Grand Total
2006 Q2 RELIABILITY REPORT
SS Rejects FA
45
0
47
0
50
0
372
0
16506
0
Page 93 of 93
Results