TOSHIBA TLP558

TLP558
TOSHIBA Photocoupler
GaAℓAs IRed & Photo IC
TLP558
Isolated Bus Driver
High Speed Line Receiver
Microprocessor System Interfaces
MOS FET Gate Driver
Transistor Inverter
Unit in mm
The TOSHIBA TLP558 consists of a GaAℓAs light emitting diode and
integrated high gain, high speed photodetector.
This unit is 8−lead DIP package.
The detector has a three state output stage that provides source drive
and sink drive, and built−in schmitt trigger. The detector IC has an
internal shield that provides a guaranteed common mode transient
immunity of 1000V / μs. TLP558 is inverter logic type. For buffer logic
type, TLP555 is in line−up.
z Input current: IF=1.6mA(max.)
TOSHIBA
Weight: 0.54 g
z Power supply voltage: VCC=4.5~20V
z Switching speed: tpHL, tpLH=400ns(max.)
11−10C4
z Common mode transient immunity: ±1000V /
μs(min.)
Pin Configuration(top view)
z Guaranteed performance over temperature:
−25~85°C
1
z Isolation voltage: 2500Vrms(min.)
2
z UL recognized: UL1577, file No. E67349
VCC
3
Truth Table (positive logic)
4
GND
Shield
8 1 : NC
2 : Anode
7 3 : Cathode
4 : NC
6 5 : GND
6 : VO(Output)
5 7 : VE(Enable)
8 : VCC
Input
Enable
Output
H
H
L
L
H
H
H
L
Z
ICC 7
L
L
Z
8
Schematic
IE
A 0.1μF bypass capacitor must be connected
between pins 8 and 5 (see Note 9).
IF
+
VF
−
VCC
IO
2
6
VO
3
Shield
1
VE
GND
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2007-10-01
TLP558
Absolute Maximum Ratings
(no derating required up to 85°C unless otherwise noted)
Charactersitic
LED
Forward current
Peak transient forward current
(Note 1)
Reverse voltage
Rating
Unit
IF
10
mA
IFPT
1
A
VR
5
V
IO
40 / −25
mA
IOP
80 / −50
mA
Output voltage
VO
−0.5~20
V
Supply voltage
VCC
−0.5~20
V
VE
−0.5~20
V
Output current
Peak output current
Detector
Symbol
(Note 2)
Three state enabel voltage
Output power dissipation
(Note 3)
PO
100
mW
Total package power dissipation
(Note 4)
PT
200
mW
Operating temperature range
Topr
−40~85
°C
Storage temperature range
Tstg
−55~125
°C
Lead solder temperature(10s)**
Tsol
260
°C
BVS
2500
Vrms
Isolation voltage(AC, 1min., R.H.≤ 60%, Ta=25°C)
(Note 5)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(Note 1) Pulse width ≤ 1μs, 300pps.
(Note 2) Pulse width ≤ 5μs, duty ratio ≤ 0.025.
(Note 3) Derate 1.8mW / °C above 70°C ambient temperature.
(Note 4) Derate 3.6mW / °C above 70°C ambient temperature.
(Note 5) Device considered a two terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted
together.
**1.6mm below seating plane.
Recommended Operating Conditions
Characteristic
Symbol
Min.
Input current, on
IF(ON)
2*
Input voltage, off
VF(OFF)
0
Supply voltage
VCC
4.5
Enable voltage high
VEH
Enable voltage low
Fan out(TTL load)
Operating temperature
Typ.
Max.
Unit
―
5
mA
―
0.8
V
―
20
V
2.0
―
20
V
VEL
0
―
0.8
V
N
―
―
4
―
Topr
−25
―
85
°C
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this
product, please confirm specified characteristics shown in this document.
*
2mA condition permits at least 20% CTR degradation guardband.
Initial switching threshold is 1.6mA or less.
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TLP558
Electrical Characteristics(unless otherwise specified, Ta = −25~85°C, VCC = 4.5~20V)
Characteristic
Symbol
Input forward voltage
VF
Temperature coefficient of
forward voltage
ΔVF / ΔTa
Test Condition
Min.
Typ.*
Max.
Unit
IF=5mA, Ta=25°C
―
1.55
1.7
V
IF=5mA
―
−2.0
―
mV / °C
Input reverse current
IR
VR=5V, Ta=25°C
―
―
10
μA
Input capacitance
CT
VF=0, f=1MHz, Ta=25°C
―
45
―
pF
VO=VE=5.5V
―
―
100
VO=VE=20V
―
0.01
500
Output leakage current
(VO > VCC)
IOHH
VF=0,
VCC=4.5V
Logic low output voltage
VOL
IOL=6.4mA, IF=1.6mA
VE=2V
―
0.4
0.5
V
Logic high output voltage
VOH
IOH=−2.6mA, VF=0.8V
VE=2V
2.4
3.3
―
V
Logic low enable current
IEL
VE=0.4V
―
−0.13
−0.32
mA
VE=2.7V
―
―
20
VE=5.5V
―
―
100
VE=20V
―
0.01
250
Logic high enable current
IEH
μA
μA
Logic low enable voltage
VEL
―
―
―
0.8
V
Logic high enable voltage
VEH
―
2.0
―
―
V
Logic low supply current
ICCL
IF=5mA
VCC=VE=5.5V
―
4.0
6.0
VCC=VE=20V
―
4.6
7.5
Logic high supply current
ICCH
VF=0V
VCC=VE=5.5V
―
4.2
6.0
VCC=VE=20V
―
4.7
7.5
IOZL
VF=0V
VE=0.8V
VO=0.4V
―
―
−20
VO=2.4V
―
―
20
IOZH
IF=5mA
VE=0.8V
VO=5.5V
―
―
100
VO=20V
―
1
500
VO=VCC=5.5V
25
55
―
VO=VCC=20V
40
80
―
VCC=5.5V
−10
−25
―
VCC=20V
−25
−60
―
High impedance state
output current
mA
mA
μA
Logic low short circuit
output current
(Note 6)
IOSL
IF=5mA
VE=2V
Logic high short circuit
output current
(Note 6)
IOSH
VF=0V, VO=GND
VE=2V
Input current logic low
output
IFL
VE=2V, IO=6.4mA
VO < 0.4V
―
0.4
1.6
mA
Input voltage logic high
output
VFH
VE=2V, IO=−2.6mA
VO > 2.4V
0.8
―
―
V
3
mA
mA
2007-10-01
TLP558
Electrical Characteristics(unless otherwise specified, Ta = −25~85°C, VCC = 4.5~20V)
Characteristic
Symbol
Input current hysteresis
Test Condition
IHYS
Resistance (input−output)
RS
Capacitance(input−output)
CS
Min.
Typ.*
Max.
Unit
―
0.05
―
mA
―
Ω
―
pF
VCC=VE=5V
VS=500V, R.H. ≤60%
Ta=25°C
VS=0, f=1MHz, Ta=25°C
10
(Note 5)
5×10
―
(Note 5)
14
10
1.0
*All typical values are at Ta=25°C, VCC=5V, IF(ON)=3mA unless otherwise specified.
Switching Characteristics(unless otherwise specified, VCC = 4.5~20V, Ta = 25°C)
Characteristic
Symbol
Propagation delay time to
logic high output
(Note 7)
tpLH
Propagation delay time to
logic low output
(Note 7)
tpHL
Test
Cir−
cuit
1
Test Condition
Min.
Typ.*
Max.
Unit
IF=3→ 0mA
―
250
400
ns
IF=0→ 3mA
―
270
400
ns
Output rise time (10−90%)
tr
IF=3→ 0mA, VCC=5V
―
35
75
ns
Output fall time (90−10%)
tf
IF=0→ 3mA, VCC=5V
―
20
75
ns
Output enable time to logic
high
tpZH
VE=0→ 3V
―
―
―
ns
Output enable time to logic
low
tpZL
VE=0→ 3V
―
―
―
ns
Output disable time from
logic high
tpHZ
VE=3→ 0V
―
―
―
ns
Output disable time from
logic low
tpLZ
VE=3→ 0V
―
―
―
ns
Common mode transient
immunity at logic high
output
IF=0mA, VCM=50V
VO(Min.)=2V
1000
―
―
V / μs
(Note 8)
CMH
Common mode transient
immunity at logic low
output
IF=1.6mA, VCM=50V
VO(Max.)=0.8V
−1000
―
―
V / μs
(Note 8)
2
3
CML
* All typical values are at Ta=25°C, VCC=5V
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TLP558
(Note 6) Duration of output short circuit time should not exceed 10ms.
(Note 7) The tpLH propagation delay is measured from the 50% point on the trailing edge of the input pulse to the
1.3V point on the leading edge of the output pulse. The tpHL propagation delay is measured from the 50%
point on the leading edge of the input pulse to the 1.3V point on the trailing edge of the output pulse.
(Note 8) CML is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage
in the logic low state (VO > 0.8V).
CMH is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage
in the logic state (VO > 2.0).
(Note 9) A ceramic capacitor (0.1μF) should be connected from pin 8 to pin 5 to stabilize the operation of the high
gain linear amplifier. Failure to provide the bypassing may impair the switching property. The total lead length
between capacitor and coupler should not exceed 1cm.
Test Circuit 1: tpLH, tpHL, tr And tf
IF(ON)
50%
90%
10%
tf
IF
VOH
1.3V
IF Monitor
tr
VOL
1
VCC 8
2
7
3
6
4
GND
5
620Ω
tpLH
100Ω
Output VO
5V
0mA
CL
D1
5kΩ
tpHL
VO Monitor
0.1μF
Input IF
VCC
Pulse generation
tr = tf = 5ns
VO = 5V
D1～D4
: 1S1588
D2
D3
D4
CL is approximately 15pF which includes
probe and stray wiring capacitance.
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TLP558
Test Circuit 2: tpHZ, tpZH, tpLZ And tpZL
Output VO
IF = 0mA
IF
0.5V
tpHZ
VOH
～1.5V
1
VCC 8
2
7
3
6
GND
4
5
S1 and S2
Closed
S1
620Ω
S1 and S2
Closed
tpZH
S1 Open
S2 Closed
VCC
VO
VOL
1.3V
0V
5V
D1
0.1μF
0.5V
1.3V
S1 Closed
S2 Open
Monitor
0V
tpLZ
tpZL
VE
D1～D4
: 1S1588
D2
D3
D4
5kΩ
3V
1.3V
Input VE
Output
VO
IF = IF (ON)
Pulse
generator
ZO=50Ω
tr = tf = 5ns
CL
S2
CL is approximately 15pF which includes
probe and stray wiring capacitance.
Test Circuit 3: Common Mode Transient Immunity
0V
tf
tr
IF
B
VOH
Output
VO (MIN.)*
VOH
Switch at A : IF=0mA
VOL
CMH=
45(V)
tf(μs)
VFF
VCC 8
2
7
3
6
GND
4
VO(MAX.)*
VO
Monitor
5
VCM
+
Switch at B : IF=1.6mA
* Note 8
A
1
0.1μF
VCM 10%
VCC
50V
90%
−
Pulse generator
ZO =50Ω
, CML=
45(V)
tf(μs)
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TLP558
RESTRICTIONS ON PRODUCT USE
20070701-EN
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break,
cut, crush or dissolve chemically.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
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