TLP716 TOSHIBA Photocoupler GaAℓAs IRED & Photo−IC TLP716 Plasma display panel. High Speed Interface. Factory Automation . Unit in mm 4.58±0.25 z Inverter Logic (totempole output) z Package Type : SDIP6 z Guaranteed Performance Over Temperature : −40~100°C z Power Supply Voltage : 4.5~5.5 V z Input Thresholds Current : IFHL=6.5 mA(max.) z Propagation delay Time (tpHL/ tpLH) : 75 ns(max.) z Switching speed : 15 MBd(typ.) (NRZ) z Common mode transient immunity : 10 kV/us(min.) z Isolation voltage : 5000 Vrms(min.) z UL Recognized :UL1577, File No.E67349 z Option (D4) TÜV Approved : EN60747−5−2 Maximum Operating Insulation Voltage : 890 VPK Highest Permissible Over Voltage : 8000 VPK (Note):When a EN60747−5−2 approved type is needed, Please designate “Option(D4)” z 1.27±0.2 +0.25 4.0 −0.20 7.62±0.25 1.25±0.25 0.4±0.1 9.7±0.3 11-5J1 TOSHIBA 11−5J1 Weight：0.26 g (t yp .) Pin Configuration (Top View) VCC 1 2 7.62 mm pitch standard type 10.16 mm pitch TLPXXXF type 7.0 mm (min) 7.0 mm (min) 0.4 mm (min) 8.0 mm (min) 8.0 mm (min) 0.4 mm (min) 6 5 GND 3 SHIELD Construction Mechanical Rating Creepage Distance Clearance Insulation Thickness −0.05 1 2 3 0.25± +0.10 The TOSHIBA TLP716 consists of a GaAℓAs light emitting diode and a high speed photodetector. This unit is 6-lead SDIP. TLP716 is 50% smaller than 8PIN DIP and has suited the safety standard reinforced insulation class. So, mounting area in safety standard required equipment can be reduced. 3.65 +0.15 −0.25 6.8±0.25 6 5 4 1:ANODE 2:N.C. 3:CATHODE 4:GND 4 5:Vo 6:Vcc Schematic ICC 6 IF Truth Table Input LED Tr1 Tr2 Output 1＋ H ON OFF ON L VF L OFF ON OFF H 3－ VCC Tr1 IO Tr2 5 4 SHIELD VO GND 0.1 μF bypass capacitor must be connected between pins 6 and 4. (Note 4) 1 2007-10-01 TLP716 Absolute Maximum Ratings (Ta=25°C） CHARACTERISTIC Forward Current SYMBOL (Ta ≤ 85°C) LED Forward Current Derating (Ta > 85°C) Peak Transient Forward Current (Note1) RATING UNIT IF 20 mA ΔIF/ΔTa −0.5 mA/°C IFPT 1 A Reverse Voltage VR 5 V Junction Temperature Tj 125 °C Output Current (Ta ≤ 85°C) IO 10 mA Δ IO /ΔTa −0.25 mA/°C Output Voltage(Vo ≤ Vcc) VO −0.5~6 V Supply Voltage VCC −0.5~6 V PD 40 mW ΔPo/ΔTa -1 mW/°C Tj 125 °C Operating Temperature Range Topr −40~100 °C Storage Temperature Range Tstg −55~125 °C Lead Solder Temperature(10s) Tsol 260 °C BVs 5000 Vrms DETECTOR Output Current Derating (Ta > 85°C) Power Dissipation (Ta ≤ 85°C) Power Dissipation Derating (Ta > 85°C) Junction Temperature Isolation Voltage (AC,1min.,R.H.≤60%,Ta=25°C) (Note2) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Recommended Operating Conditions CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT Input Current , ON IF(ON) 8 12 18 mA Input Voltage , OFF VF(OFF) 0 — 0.8 V VCC 4.5 5 5.5 V Supply Voltage (*) (Note3, Note4) Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. (*) This item denotes operating ranges, not meaning of recommended operating conditions. 2 2007-10-01 TLP716 The correlation between input current and switching speed and drive circuit (reference information). Input Current TEST CIRCUIT Typical Switching Speed 12mA 1 (Page 4) 14 – 16 MBd 8mA 1 (Page 4) 11 – 13 MBd 8mA 2 (Page 4,with Speed up capacitor) 16 – 20 MBd (IF) Note 1: Pulse width PW≤1us,300pps. Note 2: Device Considered a two terminal device : pins 1,2 and 3 shorted together and pins 4,5 and 6 shorted together. Note 3: The detector of this product requires a power supply voltage (VCC) of 4.5 V or higher for stable operation. If the VCC is lower than this value, an Icc may increase, or an output may be unstable. Be sure to use the product after checking the supply current, and the operation of a power−on/−off. Note 4: A ceramic capacitor(0.1 μF) should be connected from pin 6 to pin 4 to stabilize the operation of the high gain linear amplifier. Failure to provide the bypassing may impair the switching property. The total lead length between capacitor and coupler should not exceed 1 cm. Electrical Characteristics (Unless otherwise specified, Ta=−40 to 100°C,VCC=4.5~5.5V) CHARACTERISTIC MIN. TYP. * MAX. UNIT IF=10mA ,Ta=25°C — 1.65 1.8 V IF=10mA — −2.0 — mV/°C IR VR=5V,Ta=25°C — — 10 μA Input Capacitance CT V=0V,f=1MHz,Ta=25°C — 45 — pF Logic Low Output Voltage VOL IOL=1.6mA, IF=12mA,VCC=5V — — 0.4 V Logic High Output Voltage VOH IOH=−0.02mA, VF=1.05V, VCC=5V 4.0 — — V Logic Low Supply Current ICCL IF=12mA — — 5.0 mA Logic High Supply Current ICCH VF=0V — — 5.0 mA IFHL IO=1.6mA,VO<0.4V — — 6.5 mA VFLH IO=−0.02mA,VO>4.0V 0.8 — — V Input Forward Voltage Temperature Coefficient of Forward Voltage Input Reverse Current Input Current Logic Low Output Input Voltage Logic High Output SYMBOL VF ΔVF/ΔTa CONDITION *All typical values are at Ta=25°C,VCC=5V , IF(ON)=12mA unless otherwise specified Isolation Characteristics (Ta = 25°C) CHARACTERISTIC SYMBOL Capacitance input to output CS Isolation resistance RS TEST CONDITION VS = 0V , f = 1MHz R.H. ≤ 60%,VS = 500V AC,1 minute Isolation voltage BVS (Note 2) (Note 2) MIN. TYP. MAX. UNIT ― 0.8 ― pF ― Ω Vrms 1×10 12 10 14 5000 ― ― AC,1 second,in oil ― 10000 ― DC,1 minute,in oil ― 10000 ― 3 Vdc 2007-10-01 TLP716 Switching Characteristics (Unless otherwise specified, Ta= −40 to 100°C, VCC=4.5~5.5V) CHARACTERISTIC SYMBOL propagation Delay Time TEST -CIRCUIT IF=0→12mA tpHL to Logic Low output CONDITION tpLH to Logic High output propagation Delay Time tpHL to Logic Low output ns VIN=0→5V RIN=430Ω — — 65 ns — — 65 ns — — 45 ns — 15 — ns — 15 — ns 10000 — — V/us −10000 — — V/us (IF=8→0mA) CIN=33pF CL=15pF (Note 5) tpHL | RIN=100Ω, CL=15pF (Note 5) 1 IF=0→12mA RIN=100Ω CL=15pF IF=12→0mA Common Mode transient Immunity at High Level ns 75 between ON and OFF tr 75 — IF=12mA Output Rise Time (10 ~ 90%) — — | tpLH- tf — RIN=100Ω Switching Time Dispersion Output Fall Time (90 ~ 10%) UNIT (Note 5) VIN=5→0V tpLH to Logic High output MAX. IF=12→0mA (IF=0→8mA) 2 propagation Delay Time TYP. CL=15pF 1 propagation Delay Time MIN. (Note 5) VCM=1000Vp-p,IF=0mA, CMH VO(Min)=4V,Ta=25°C Output 3 Common Mode transient Immunity at Low Level VCM=1000Vp-p,IF=12mA, CML VO(Max)=0.4V,Ta=25°C Output *All typical values are at Ta=25°C Note 5: CL is approximately 15pF which includes probe and Jig/stray wiring capacitance. TEST CIRCUIT 1 : tpLH , tpHL IF=12mA(P.G) VCC GND tp HL Vo tp LH VOH 90% 90% VCC SHIELD 50% IF VO MONITORING NODE INPUT MONITORING NODE CL=15pF 50% 0.1uF CL=15pF 1.5V 10% RIN=100Ω 1.5V 10% VOL tr tf TEST CIRCUIT 2 : tpLH , tpHL INPUT MONITORING NODE VIN=5V(P.G) 50% VI N VCC 0.1uF CL=15pF Vo MONITORING NODE SHIELD CIN=33pF GND CL=15pF Vo 50% tp HL VOH VCC 1.5V RIN=430Ω tp LH 1.5V VOL The PROBE and JIG capacitances are included in CL. (P.G) : Pulse Generatior 4 2007-10-01 TLP716 TEST CIRCUIT 3 : Common-Mode Transient Immunity Test Circuit IF → SW A B 90% 6 １ 5 3 GND 4 1000V VCM Vcc 2 90% 10% 0.1uF tr tf 10% Vo Vcc ・SW B :IF=0mA SHIELD 4V Vo VCM CMH 0.4V CML ・SW A : IF=12mA CMH= 800(V) tr(μs) CML=− 800(V) tf(μs) CML (CMH) is the maximum rate of fall (rise) of the common mode voltage that can be sustained with the output voltage in the low (high) state. 5 2007-10-01 TLP716 RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 6 2007-10-01