TOSHIBA TLP106

TLP106
TOSHIBA PHOTOCOUPLER GaAℓAs IRED & PHOTO-IC
TLP106
Unit in mm
Intelligent Power Module Signal Isolation
Industrial Inverters
Motor Drive
The Toshiba TLP106 consists of a GaAℓAs light-emitting diode and an
integrated high-gain, high-speed photo-detector. The TLP106 is suitable
for isolating input control signals isolation to intelligent power modules.
This unit is a 6-pin MFSOP.
The detector has a totem pole output stage to provide source drive and
sink drive and features a built-in Schmitt trigger.
The detector IC has an internal shield that provides a guaranteed
common-mode transient immunity of 10 kV/μs.
The TLP106 is of a buffer logic type. An inverter logic version, the
TLP102, is also available.
z
Buffer logic type (totem pole output)
z
Guaranteed performance over temperature : -40~85°C
z
Power supply voltage: -0.5~20 V
z
Input current: IFLH = 3 mA (Max.)
z
Switching Time (tpLH/tpHL): 400 ns (Max.)
z
Common-mode transient immunity : 10 kV/μs
z
Isolation voltage: 3750 Vrms
TOSHIBA
Truth Table
Input
H
L
11-4C2
Weight: 0.09 g(typ.)
Pin Configuration (Top View)
LED
ON
OFF
Tr1
ON
OFF
Tr2
OFF
ON
Output
H
L
VCC
1
GND
3
SHIELD
6
1:ANODE
5
4:GND
4
5:VO
6:VCC
3:CATHODE
Schematic
I CC
6
IF
1+
VCC
Tr1
IO
VF
VO
3-
Tr2
SHIELD
5
4
GND
0.1 μ F bypass capacitor must be
connected between pins 6 and 4
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2007-10-01
TLP106
Recommended Operating Conditions
SYMBOL
MIN.
TYP.
MAX.
UNIT
Input Current, ON
CHARACTERISTIC
IF (ON)
5
―
10
mA
Input Voltage, OFF
VF (OFF)
0
―
0.8
V
VCC
4.5
―
20
V
-40
―
85
°C
Supply Voltage
Operating Temperature
Topr
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this
product, please confirm specified characteristics shown in this document.
Absolute Maximum Ratings (Ta = 25°C)
CHARACTERISTIC
DETECTOR
LED
Forward Current
Peak Transient Forward Current (Note 1)
SYMBOL
RATING
UNIT
IF
20
mA
IFPT
1
A
Reverse Voltage
VR
5
V
Output Current 1 (Ta ≤ 25°C)
IO1
15/-15
mA
Output Current 2 (Ta = 85°C)
IO2
4.5/-4.5
mA
Peak Output Current
IOP
20/-20
mA
Output Voltage
VO
-0.5~20
V
Supply Voltage
VCC
-0.5~20
V
Operating Temperature Range
Topr
-40~85
°C
Storage Temperature Range
Tstg
-55~125
°C
Lead Solder Temperature (10 s)
Tsol
260
°C
BVs
3750
Vrms
Isolation Voltage
(AC, 1 min., R.H. ≤60%,Ta = 25°C) (Note2)
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Pulse width PW ≤ 10 us, 500 pps.
Note 2: Product considered a two-terminal device: pins 1 and 3 shorted together and pins 4, 5 and 6 shorted
together.
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2007-10-01
TLP106
Electrical Characteristics
(Unless otherwise specified, Ta = -40 to 85°C, VCC = 4.5~20 V.)
CHARACTERISTIC
SYMBOL
TEST
CONDITION
CIRCUIT
MIN.
TYP.
MAX.
UNIT
VF
―
IF = 5 mA ,T a = 25°C
―
1.5
1.7
V
ΔVF/ΔTa
―
IF = 5 mA
―
-2.0
―
mV/°C
IR
―
VR = 5 V, Ta = 25°C
―
―
10
μA
CT
―
V = 0, f = 1 MHz, Ta = 25°C
―
30
―
pF
Logic LOW Output Voltage
VOL
1
IOL = 3.5 mA, VF = 0.8 V
―
0.1
0.35
V
Logic HIGH Output Voltage
VOH
2
IOH =-3.5 mA, VCC = 5 V
2.4
3.1
―
IF = 5 mA
17.4
18.1
―
―
4.0
6.0
―
3.6
4.5
―
3.1
6.0
Input Forward Voltage
Temperature Coefficient
of Forward Voltage
Input Reverse Current
Input Capacitance
VCC = 20 V
VCC = 20 V,
Logic LOW Supply Current
ICCL
3
VF = 0 V
Ta = -40~85°C
VCC = 5 V,
Ta = 25°C
VCC = 20 V,
Logic HIGH Supply Current
ICCH
4
IF = 5 mA
Ta =-40~85°C
VCC = 5 V,
Ta = 25°C
Logic LOW Short Circuit
Output Current
Logic HIGH Short Circuit
Output Current
Input Current Logic HIGH
Output
Input Voltage Logic LOW
Output
Input Current Hysteresis
VF = 0 V
V
mA
mA
―
2.8
4.5
7
37
―
mA
-7
-40
―
mA
IOSL
5
IOSH
6
IFLH
―
IO = -3.5 mA, VO > 2.4 V
―
0.3
3
mA
VFHL
―
IO = 3.5 mA, VO < 0.4 V
0.8
―
―
V
IHYS
―
VCC = 5 V
―
0.05
―
mA
VCC = VO = 20 V
IF = 5 mA , VO = GND
VCC = 20 V
*All typical values are at Ta = 25°C.
Isolation Characteristics (Ta = 25°C)
CHARACTERISTIC
SYMBOL
Capacitance Input to Output
CS
Isolation Resistance
RS
TEST CIRCUIT
V = 0, f = 1 MHz
R.H. ≤ 60%, VS = 500 V
AC, 1 minute
Isolation Voltage
BVS
(Note 2)
(Note 2)
MIN.
TYP.
MAX.
UNIT
―
0.8
―
pF
―
Ω
Vrms
1×10
12
10
14
3750
―
―
AC, 1 second, in oil
―
10000
―
DC, 1 minute, in oil
―
10000
―
3
Vdc
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TLP106
Switching Characteristics
(Unless otherwise specified, Ta = -40 to 85°C, VCC = 4.5~20 V.)
CHARACTERISTIC
SYMBOL
Propagation Delay Time
TEST
CIRCUIT
Propagation Delay Time
TYP.
MAX.
UNIT
50
250
400
ns
50
260
400
ns
CL = 100 PF
―
―
350
ns
VCC = 20 V
IF = 5→0 mA、CL = 100 pF
tpHL
to Logic LOW Output
MIN.
IF = 0→5mA、CL = 100 pF
tpLH
to Logic HIGH Output
CONDITION
Switching Time Dispersion
|tpHL-
between ON and OFF
tpLH|
VCC = 20 V
7
Output Rise Time
tr
IF = 0→5 mA, VCC = 20 V
―
175
―
ns
Output Fall Time
tf
IF = 5→0 mA, VCC = 20 V
―
95
―
ns
IF = 0→5 mA
50
―
400
ns
IF = 5→0 mA
50
―
400
ns
-10000
―
―
V/us
10000
―
―
V/us
Propagation Delay Time
tpLH
to Logic HIGH Output
8
Propagation Delay Time
tpHL
to Logic LOW Output
Common-Mode Transient
VCM = 1000 Vp-p, IF = 5 mA,
CMH
Immunity at HIGH Level
VCC = 20 V,Ta = 25°C
Output
9
Common-Mode Transient
Immunity at LOW Level
VCM = 1000 Vp-p, IF = 0 mA,
CML
VCC = 20 V,Ta = 25°C
Output
*All typical values are at Ta = 25°C.
TEST CIRCUIT 1 : VOL
TEST CIRCUIT 2 : VOH
6
1
VCC
5
3
SHIELD
GND 4
IF 1
→
0.1uF
V
VCC
I OL
VOL
6
VCC
5
↑
↑
6
1
VCC
3
IF 1
A
→
5
6
VCC
VCC
SHIELD
GND
4
3
SHIELD
TEST CIRCUIT 5 : IOSL
IF
VCC
→
5
3
GND 4
SHIELD
I CCH
A
VCC
4
GND
TEST CIRCUIT 6 : IOSH
6
1
IOH
VCC
5
↑
3
↑
GND 4
TEST CIRCUIT 4 : ICCH
I CCL
VOH
0.1uF
SHIELD
TEST CIRCUIT 3 : ICCL
V
1
6
VCC
0.1uF
A
5
↑
IOSL
A
VCC
3
SHIELD
VO
4
0.1uF
GND
4
IOSH
VO
VCC
2007-10-01
TLP106
TEST CIRCUIT 7: Switching Time Test Circuit
IF
IF
50%
VCC
0.1uF
tpLH
VO
SHIELD
VOH
VCC
GND
tpHL
CL
90%
VO
1.3V
10%
VOL
tr
tf
TEST CIRCUIT 8: Switching Time Test Circuit
VCC
VO
5V
IF
IF
VCC
50%
620Ω
0.1uF
tpLH
tpHL
VOH
SHIELD
GND
CL
90%
VO
5kΩ
1.3V
VOL
10%
tr
tf
CL: stray capacitance of probe and wiring (to 15 pF)
TEST CIRCUIT 9: Common-Mode Transient Immunity Test Circuit
SW
→
B
5
3
1000V
VCM
VCC
IF
A
90%
6
1
0.1uF
10%
VO
tf
tr
VCC
GND 4
CMH
・SW A : IF=5mA
SHIELD
17V
VO
VCM
1V
CML
・SW B : IF=0mA
CM
5
L
=
800(V )
t r (μs)
CM
H
=
800(V )
t f (μs)
2007-10-01
TLP106
RESTRICTIONS ON PRODUCT USE
20070701-EN
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break,
cut, crush or dissolve chemically.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
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