TLP116 TOSHIBA PHOTOCOUPLER GaAℓAs LED & PHOTO-IC TLP116 PDP(Plasma Display Panel) High Speed Interface FA(Factory Automation) Unit in mm The Toshiba TLP116 consists of a GaAℓAs light-emitting diode and an integrated high-gain, high-speed photodetector. z Inverter logic (totempole output) z Package type : MFSOP6 z Guaranteed performance over temperature : -40~100°C z Power supply voltage : 4.5~5.5V z Input thresholds current : IFHL=5mA(Max.) z Propagation delay time (tpHL/tpLH) : 60ns(Max.) z Switching speed : 20MBd(TYP.) z Common mode transient immunity : 10kV/us z Isolation voltage : 3750Vrms z UL Recognized : UL1577,File No.E67349 TOSHIBA Weight: 0.09 g(Typ.) Truth Table Input H L 11-4C2 Pin Configuration (Top View) LED ON OFF Tr1 OFF ON Tr2 ON OFF Output L 1 VCC 6 H 1:ANODE 3:CATHODE 5 3 GND SHIELD 4:GND 5:VO 4 6:VCC ICC Schematic 6 IF VCC Tr1 1＋ IO VF 3－ Tr2 SHIELD VO 5 4 GND 0.1uF bypass capacitor must be connected between pins 6 and 4 1 2007-10-01 TLP116 Absolute Maximum Ratings (Ta=25°C) Characteristic Symbol DETECTOR LED Forward current Forward current derating (Ta≥85°C) Peak transient forward current Rating Unit IF 20 mA ΔIF/ΔTa -0.5 mA/°C IFPT 1 A (Note1) Reverse voltage VR 5 V Output current IO 10 mA Output voltage VO 6 V Supply voltage VCC 6 V PO 40 mW Operating temperature range Output power dissipation Topr -40~100 °C Storage temperature range Tstg -55~125 °C Lead solder temperature(10s) Tsol 260 °C BVs 3750 Vrms Isolation voltage (AC,1min.,R.H.≤60%,Ta=25°C) (Note2) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Recommended Operating Conditions Characteristic Input current , ON Input voltage , OFF Supply voltage (Note3) Operating temperature Symbol Min Typ. Max Unit IF(ON) 8 — 18 mA VF(OFF) 0 — 0.8 V VCC 4.5 5.0 5.5 V Topr -40 — 100 °C Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. Correlation between Input current , switching speed and drive circuit (reference information). Input current test Circuit Typical switching speed 12mA 1 (Page 4) 21 – 23 MBd 8mA 1 (Page 4) 18 – 20 MBd 8mA 2 (Page 4,With Speed up capacitor) 23 – 27 MBd (IF) Note1 : Pulse width PW≤1us,300pps. Note2 : This device is regarded as a two terminal device : pins 1 and 3 are shorted together, as are pins 4,5 and 6. Note3 : The detector of this product requires a power supply voltage (VCC) of 4.5 V or higher for stable operation. If the VCC is lower than this value, an ICC may increase, or an output may be unstable. Be sure to use the product after checking the supply current, and the operation of a power-on/-off. 2 2007-10-01 TLP116 Electrical Characteristics (Unless otherwise specified, Ta=-40 to 100°C,VCC=4.5~5.5V ) Symbol Test Circuit VF — ΔVF/ΔTa Input reverse current Input capacitance Characteristic Min. Typ. Max. Unit IF=10mA ,Ta=25°C — 1.3 1.5 V — IF=10mA — -2.0 — mV/°C IR — VR=5V,Ta=25°C — — 10 μA CT — V=0,f=1MHz,Ta=25°C — 70 — pF Logic low output voltage VOL 1 — — 0.4 V Logic high output voltage VOH 2 4.0 — — V Logic low supply current ICCL 3 IF=12mA — — 5.0 mA Logic high supply current ICCH 4 VF=0V — — 5.0 mA IFHL — IO=1.6mA,VO<0.4V — — 5 mA VFLH — IO=-0.02mA,VO>4.0V 0.8 — — V Input forward voltage Temperature coefficient of forward voltage Input current logic low output Input voltage logic high output Conditions IOL=1.6mA, IF=12mA,VCC=5V IOH=-0.02mA, VF=1.05V,VCC=5V *All typical values are at Ta=25°C,VCC=5V,IF(ON)=12mA unless otherwise specified Isolation Characteristics (Ta = 25°C) Characteristic Symbol Capacitance input to output CS Isolation resistance RS Test Conditions V = 0,f = 1MHz R.H. ≤ 60%,VS = 500V AC,1 minute Isolation voltage BVS (Note 2) (Note 2) Min. Typ. Max. Unit ― 0.8 ― pF ― Ω Vrms 1×10 12 10 14 3750 ― ― AC,1 second,in oil ― 10000 ― DC,1 minute,in oil ― 10000 ― Vdc Note 4:A ceramic capacitor(0.1 μF) should be connected from pin 6 to pin 4 to stabilize the operation of the high gain linear amplifier. Failure to provide the bypass may impair the switching property. The total lead length between capacitor and coupler should not exceed 1 cm. 3 2007-10-01 TLP116 Switching Characteristics (Unless otherwise specified, Ta=-40 to 100°C,VCC=4.5~5.5V) Characteristic Test Circuit Symbol Propagation delay time IF=12→0mA tpLH to logic low output Propagation delay time VIN=0→5V tpHL to logic high output 6 Propagation delay time tpLH to logic low output Typ. Max. Unit — — 60 ns (Note 5) — — 60 ns RIN=470Ω — — 60 ns — — 60 ns — — 30 ns — 15 — ns — 15 — ns 10000 — — V/us -10000 — — V/us CL=15pF 5 Propagation delay time Min. RIN=100Ω IF=0→12mA tpHL to logic high output Conditions (IF=0→8mA) CIN=27pF VIN=5→0V CL=15pF (Note 5) (IF=8→0mA) Switching time dispersion |tpHL- IF=12mA , RIN=100Ω, between ON and OFF tpLH| CL=15pF (Note 5) Output fall time(90-10%) 5 ｔｆ IF=0→12mA IF=12→0mA ｔｒ Output rise time(10-90%) Common mode transient immunity at high Level RIN=100Ω CL=15pF (Note 5) VCM=1000Vp-p,IF=0mA, CMH Vo(Min)=4V,Ta=25°C output 7 Common mode transient VCM=1000Vp-p,IF=12mA, CML immunity at low level Vo(Max)=0.4V,Ta=25°C output *All typical values are at Ta=25°C Note 5 : CL is approximately 15pF which includes probe and Jig/stray wiring capacitance. TEST CIRCUIT 1 : VOL IF → TEST CIRCUIT 2 : VOH 6 1 5 ↑ 3 GND 4 SHIELD 6 VCC VOL V 5 IOL VCC 3 ↑ 3 GND V VOH ↑ IOH VCC 0.1uF GND 4 SHIELD TEST CIRCUIT 4: ICCH ICCL 1 VCC A 5 ↑ VCC 0.1uF TEST CIRCUIT 3 : ICCL IF 1 → 6 1 VCC 6 A 5 VCC 3 4 GND ICCH VCC 4 SHIELD SHIELD 4 2007-10-01 TLP116 TEST CIRCUIT 5 : tpHL , tpLH IF=12mA(P.G) (f=5MHz , duty=50%) 50% VCC IF 0.1uF Vo MONITORING NODE INPUT MONITORING NODE GND VCC tf VO tr V 90% OH CL=15pF SHIELD CL=15pF RIN=100Ω 1.5V 10% VOL tpLH tpHL CL is capacitance of the probe and JIG. (P.G) : Pulse Generator TEST CIRCUIT 6 : tpHL , tpLH VIN=5V(P.G) INPUT MONITORING NODE (f=5MHz , duty=50%) VCC 50% 0.1uF CL=15pF Vo MONITORING NODE GND CL=15pF IF VCC tf VO tr V 90% OH SHIELD CIN=27pF RIN=470Ω 1.5V 10% CL is capacitance of the probe and JIG. (P.G) : Pulse Generator VOL tpLH tpHL TEST CIRCUIT 7 : Common-Mode Transient Immunity Test Circuit 90% IF → SW A 1000Ｖ 6 １ VCC B 10% 5 GND tf VO VCC 3 tr 0.1uF 4 ・SW B : IF=0mA CMH 4V SHIELD 0.4V ・SW A : IF=5mA VCＭ CM 5 H = 800(V ) t r (μs) CML CM L = 800(V ) t f ( μs) 2007-10-01 TLP116 IF-VF ∆ V F / ∆ Ta - I F 100 -3 C o e f f i c i e n t ∆VF/∆Ta(mV/°C) F o r w a r d C u r r e n t I F (mA) 25°C -40°C 100°C 10 1 0.1 0.8 1 1.2 1.4 1.6 -2.5 -2 -1.5 -1 -0.5 0 0.1 1.8 1 F o r w a r d Vo l t a g e VF(V) V O L - Ta V O H - Ta IOL=1.6mA , IF=12mA, VCC=5V 0.8 0.6 0.4 0.2 0 -40 -20 0 20 40 60 80 100 5 4 3 2 1 IOH=-0.02mA , VF=1.05V 0 -40 -20 Ambient Temperature Ta(℃) VCC=5V 0 (mA) IF=12mA VCC=5.5V 4 2 -20 60 80 100 80 100 I C C H - Ta 6 0 -40 40 10 Logic High Supply Current ICCH (mA) ICCL Logic low supply current 8 20 Ambient Temperature Ta(℃) I C C L - Ta 10 100 6 Logic High Output Voltage VOH(V) Logic Low Output Voltage V O L ( V ) 1 10 F o r w a r d C u r r e n t I F (mA) 0 20 40 60 80 100 Ambient Temperature Ta(℃) VF=0V 8 VCC=5.5V 6 4 2 0 -40 -20 0 20 40 60 Ambient Temperature Ta(℃) *: The above graphs show typical characteristics. 6 2007-10-01 TLP116 t p H L , t p L H - Ta t p H L , t p L H - Ta (ns) 60 50 tpHL Propagation delay time tPLH, tPHL Propagation delay time tPLH, tPHL (ns) 60 40 tpLH 30 20 Test Circuit 5 10 IF=12mA,RIN=100Ω, 0 -40 -20 CL=15pF,VCC=5.5V 0 20 40 60 80 100 50 tpHL 40 30 tpLH 20 Test Circuit 6 10 VIN=5V,RIN=470Ω CIN=27pF,CL=15pF,VCC=5.5V 0 -40 -20 Ambient Temperature Ta(℃) 0 tpHL,tpLH-IF (ns) Propagation delay time tPLH, tPHL (ns) Propagation delay time tPLH, tPHL 40 30 tpLH 20 Test Circuit 5 10 RIN=100Ω , CL=15pF VCC=5.5V 5 10 15 20 50 40 tpLH 30 20 Test Circuit 5 10 IF=12mA , RIN=100Ω CL=15pF , Ta=25°C 0 4.5 5 5.5 Supply Voltage VCC (V) | t p H L - t p L H | - Ta I F L H - Ta 5 (mA) Test Circuit 5 IO=1.6mA 4 VO<0.4V IFLH Test Circuit 6 20 Threshold input current Switching Time Dispersion between ON and OFF(ns) 100 tpHL F o r w a r d C u r r e n t I F (mA) 15 10 5 0 -40 -20 80 tpHL,tpLH-VCC tpHL 50 25 60 60 60 30 40 Ambient Temperature Ta(℃) 70 0 20 0 20 40 60 80 3 2 1 0 -40 -20 100 Ambient Temperature Ta(℃) 0 20 40 60 80 100 Ambient Temperature Ta(℃) *: The above graphs show typical characteristics. 7 2007-10-01 TLP116 RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 8 2007-10-01