TLP559 TOSHIBA Photocoupler GaAℓAs Ired & Photo IC TLP559 Unit in mm Digital Logic Ground Isolation Line Receiver Microprocessor System Interfaces Switching Power Supply Feedback Control Transistor Inverter The TOSHIBA TLP559 consists of a GaAℓAs high−output light emitting diode and a high speed detector of one chip photo diode−transistor. This unit is 8−lead DIP package. TLP559 has no internal base connection, and a faraday shield integrated on the photodetector chip provides an effective common mode noise transient immunity. So this is suitable for application in noisy environmental condition. • Isolation voltage: 2500Vrms (min.) • Switching speed: tpHL = 0.3μs (typ.) tpLH = 0.5μs (typ.) (RL = 1.9kΩ) • TTL compatible • UL recognized: UL1577, file No.E67349 TOSHIBA Weight: 0.54g Pin Configuration (top view) 8 1 2 7 3 6 4 5 Shield 11−10C4 Schematic ICC 1 : N.C. 2 : Anode 3 : Cathode 4 : N.C. 5 : Emitter 6 : Collector 7 : N.C. 8 : VCC IF 2 VF IO 3 6 Shield 1 VCC 8 5 VO GND 2007-10-01 TLP559 Absolute Maximum Ratings (Ta = 25°C) LED Characteristic Symbol Rating Unit Forward current (Note 1) IF 25 mA Pulse forward current (Note 2) IFP 50 mA Peak transient forward current (Note 3) IFPT 1 A Reverse voltage VR 5 V PD 45 mW Output current IO 8 mA Peak output current IOP 16 mA Output voltage VO −0.5~15 V Supply voltage VCC −0.5~15 V PO 100 mW Operating temperature range Topr −55~100 °C Storage temperature range Tstg −55~125 °C (Note 6) Tsol 260 °C (Note 7) BVS 2500 Vrms Detector Diode power dissipation (Note 4) Output power dissipation (Note 5) Lead solder temperature (10s) Isolation voltage (AC, 1 min., R.H. ≤ 60%) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) Derate 0.8mA above 70°C. (Note 2) 50% duty cycle,1ms pulse width. Derate 1.6mA / °C above 70°C. (Note 3) Pulse width ≤ 1μs, 300pps. (Note 4) Derate 0.9mW / °C above 70°C. (Note 5) Derate 2mW / °C above 70°C. (Note 6) Soldering portion of lead: up to 2mm from body of the devise. (Note 7) Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together and pins 5, 6, 7 and 8 shorted together. 2 2007-10-01 TLP559 Electrical Characteristics (Ta = 25°C) Characteristic Symbol Detector LED Forward voltage Forward voltage temperature coefficient Min. Typ. Max. Unit VF IF = 16mA ― 1.65 1.85 V ΔVF / ΔTa IF = 16mA ― −2 ― mV / °C Reverse current IR VR = 5V ― ― 10 μA Capacitance between terminal CT VF = 0, f = 1MHz ― 45 ― pF IOH (1) IF = 0mA, VCC = VO = 5.5V ― 3 500 nA IOH (2) IF = 0mA, VCC = VO = 15V ― ― 5 IOH IF = 0mA, VCC = 15V VO = 15V, Ta = 70°C ― ― 50 ICCH IF = 0mA, VCC = 15V ― 0.01 1 μA IO / IF IF = 16mA, VCC = 4.5V VO = 0.4V 20 40 ― % Low level output voltage VOL IF = 16mA, VCC = 4.5V IO = 2.4mA ― ― 0.4 V Resistance (input−output) RS ― Ω Capacotance (input−output) CS High level output current High level supply voltage Current transfer ratio Coupled Test Condition R.H. ≤ 60%, VS = 500VDC VS = 0, f = 1MHz (Note 7) (Note 7) 5×10 10 10 14 μA ― 0.8 ― pF Min. Typ. Max. Unit ― 0.2 0.8 μs ― 0.3 0.8 μs 2000 10000 ― V / μs −2000 −10000 ― V / μs Switching Characteristics (Ta = 25°C、VCC = 5V) Characteristic Symbol Propagation delay time (H→ L) tpHL (L→ H) tpLH Propagation delay time Common mode transient immunity at logic high output Common mode transient immunity at logic high output (Note 8) (Note 8) Test Cir− cuit 1 IF = 16mA, RL = 1.9kΩ IF = 0mA, VCM = 400Vp−p CMH 2 CML Test Condition RL = 4.1kΩ IF =16mA, VCM = 400Vp−p RL = 4.1kΩ (Note 8) CML is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic low state (VO < 0.8V). CMH is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic high state (VO < 2.0V). (Note 9) Maximum electrostatic discharge voltage for any pins: 100V (C = 200pF, R = 0) 3 2007-10-01 TLP559 Test Circuit 1: Switching Time Test Circuit IF Pulse input 51Ω PW=100μs Duty ratio=1 / 10 IF monitor VCC = 5V 1 8 2 7 3 6 VO 4 5 Output monitor IF 0 RL VO 5V 1.5V VOL 1.5V tpHL tpLH Test Circuit 2: Common Mode Noise Immunity Test Circuit IF 1 8 2 7 VCC=5V 90% VCM RL 3 6 VO 4 5 Output monitor 10% tr VO (IF=0mA) VCM VO (IF=16mA) Pulse generator ZO=50Ω 400V 0V tf 5V 2V 0.8V VOL 320(V) 320(V) CMH = , CML = t r (μs) t f (μs) 4 2007-10-01 TLP559 IF – VF (mA) 10 Forward current IF 50 30 3 5 1 0.5 0.3 0.1 0.05 0.03 0.01 1.0 ΔVF / ΔTa – IF −2.6 Ta = 25°C Forward voltage temperature coefficient ΔVF / ΔTa (mV / ℃) 100 1.4 1.2 1.6 Forward voltage VF −2.2 −2.0 −1.8 −1.6 −1.4 0.1 2.0 1.8 −2.4 0.3 0.5 1 3 lO – IF IOH (1) – Ta 10 300 (mA) 100 50 IO 30 Output current High level output current IOH (μA) 30 (mA) Forward current IF (V) 10 5 10 5 3 VCC = 5V 5 VO = 0.4V 3 Ta = 25°C 1 0.5 0.3 0.1 0.05 0.03 1 0.6 0 40 80 120 Ambient temperature 0.01 0.1 160 0.3 0.5 1 10 30 50 100 300 (mA) IO / IF – Ta IO / IF – IF 1.2 VCC = 5V VO = 0.4V 50 1.0 30 Ta = –25°C 25°C 10 Normalized IO / IF Current transfer ratio IO / IF (%) 5 Forward current IF Ta (℃) 100 3 100°C 5 0.8 0.6 Normalized To : 0.4 IF = 16mA VCC = 4.5V 3 VO = 0.4V 0.2 Ta = 25°C 1 0.3 0.5 1 3 5 Forward current IF 10 30 0 −40 50 −20 0 20 40 Ambient temperature (mA) 5 60 80 100 Ta (℃) 2007-10-01 TLP559 IO – VO VO – IF 5 30mA VCC = 5V Ta = 25°C 10 4 15mA 4 10mA IF=5mA 2 0 0 1 2 3 4 5 Output voltage VO RL (V) 20mA Output voltage VO Output current IO (mA) 25mA 8 6 VCC =5V IF 6 VO 3 Ta=25℃ 2 RL=2kΩ 3.9kΩ 10kΩ 1 0 7 0 (V) 4 8 12 16 Forward current IF 20 24 (mA) tpHL, tpLH – RL 5 Propagation delay time tpLH, tpHL (μs) 3 IF = 16mA VCC = 5V Ta = 25°C tpLH 1 0.5 0.3 tpHL 0.1 1 3 5 10 30 50 100 Load resistance RL (kΩ) 6 2007-10-01 TLP559 RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 7 2007-10-01