NTD5865N N-Channel Power MOSFET 60 V, 38 A, 18 mW Features Low Gate Charge Fast Switching High Current Capability 100% Avalanche Tested These Devices are Pb−Free, Halogen Free and are RoHS Compliant MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Symbol Value Unit Drain−to−Source Voltage VDSS 60 V Gate−to−Source Voltage − Continuous VGS "20 V Gate−to−Source Voltage − Non−Repetitive (tp < 10 ms) VGS "30 V ID 38 A Parameter Power Dissipation (RqJC) Steady State TC = 100°C TC = 25°C tp = 10 ms Operating Junction and Storage Temperature Source Current (Body Diode) Single Pulse Drain−to−Source Avalanche Energy RDS(on) MAX ID MAX 60 V 18 mW @ 10 V 38 A D G TC = 25°C Pulsed Drain Current V(BR)DSS L = 0.1 mH Lead Temperature for Soldering Purposes (1/8″ from case for 10 s) 24 PD 52 W IDM 137 A TJ, Tstg −55 to 150 °C IS 38 A EAS 36 mJ IAS 27 A TL 260 °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. THERMAL RESISTANCE MAXIMUM RATINGS Parameter Symbol Value Unit Junction−to−Case (Drain) RqJC 2.4 °C/W Junction−to−Ambient − Steady State (Note 1) RqJA 42 1. Surface−mounted on FR4 board using 1 in sq pad size (Cu area = 1.127 in sq [2 oz] including traces. S N−CHANNEL MOSFET 4 4 1 2 1 3 DPAK CASE 369C (Surface Mount) STYLE 2 2 3 IPAK CASE 369D (Straight Lead) STYLE 2 MARKING DIAGRAMS & PIN ASSIGNMENT 4 Drain 4 Drain YWW 58 65NG Continuous Drain Current (RqJC) http://onsemi.com YWW 58 65NG • • • • • 2 1 Drain 3 Gate Source Y WW 5865N G 1 2 3 Gate Drain Source = Year = Work Week = Device Code = Pb−Free Package ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 2 of this data sheet. © Semiconductor Components Industries, LLC, 2010 May, 2010 − Rev. 0 1 Publication Order Number: NTD5865N/D NTD5865N ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted) Symbol Test Condition Min Drain−to−Source Breakdown Voltage V(BR)DSS VGS = 0 V, ID = 250 mA 60 Drain−to−Source Breakdown Voltage Temperature Coefficient V(BR)DSS/TJ Parameter Typ Max Unit OFF CHARACTERISTICS Zero Gate Voltage Drain Current 59.2 IDSS Gate−to−Source Leakage Current V VGS = 0 V, VDS = 60 V mV/°C TJ = 25°C 1.0 TJ = 150°C 100 IGSS VDS = 0 V, VGS = ±20 V VGS(TH) VGS = VDS, ID = 250 mA mA ±100 nA 4.0 V ON CHARACTERISTICS (Note 2) Gate Threshold Voltage 2.0 Negative Threshold Temperature Coefficient VGS(TH)/TJ Drain−to−Source On Resistance RDS(on) VGS = 10 V, ID = 20 A 14 gFS VDS = 15 V, ID = 20 A 6.9 S 1261 pF Forward Transconductance 8.6 mV/°C 18 mW CHARGES, CAPACITANCES AND GATE RESISTANCES Input Capacitance Ciss Output Capacitance Coss Reverse Transfer Capacitance Crss VGS = 0 V, f = 1.0 MHz, VDS = 25 V 136 85 nC Total Gate Charge QG(TOT) Threshold Gate Charge QG(TH) Gate−to−Source Charge QGS Gate−to−Drain Charge QGD 7.7 RG 1.5 W td(on) 10 ns Gate Resistance 23 VGS = 10 V, VDS = 48 V, ID = 38 A 1.5 6.7 SWITCHING CHARACTERISTICS (Note 3) Turn−On Delay Time Rise Time tr Turn−Off Delay Time Fall Time td(off) VGS = 10 V, VDD = 48 V, ID = 38 A, RG = 2.5 W tf 17 20 3.5 DRAIN−SOURCE DIODE CHARACTERISTICS Forward Diode Voltage Reverse Recovery Time Charge Time Discharge Time Reverse Recovery Charge VSD VGS = 0 V, IS = 38 A TJ = 25°C 0.94 TJ = 125°C 0.85 tRR ta tb 1.2 23 VGS = 0 V, dIs/dt = 100 A/ms, IS = 38 A QRR V ns 17 6 20 nC 2. Pulse Test: Pulse Width ≤ 300 ms, Duty Cycle ≤ 2%. 3. Switching characteristics are independent of operating junction temperatures. ORDERING INFORMATION Package Shipping† NTD5865N−1G DPAK (Straight Lead) (Pb−Free) 75 Units / Rail NTD5865NT4G DPAK (Pb−Free) 2500 / Tape & Reel Order Number †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. http://onsemi.com 2 NTD5865N 70 5.5 V 40 30 5.0 V 20 10 RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) ID, DRAIN CURRENT (A) 50 1 2 3 4 40 TJ = 25°C 30 20 TJ = 125°C 2 6 7 Figure 2. Transfer Characteristics ID = 38 A TJ = 25°C 0.020 0.015 5 6 7 8 9 10 VGS, GATE−TO−SOURCE VOLTAGE (V) 0.018 VGS = 10 V TJ = 25°C 0.016 0.014 0.012 0.010 5 10 15 20 25 30 35 40 ID, DRAIN CURRENT (A) Figure 3. On−Resistance vs. Gate Voltage Figure 4. On−Resistance vs. Drain Current 10000 2.2 VGS = 0 V ID = 38 A VGS = 10 V IDSS, LEAKAGE (mA) RDS(on), DRAIN−TO−SOURCE RESISTANCE (NORMALIZED) 5 Figure 1. On−Region Characteristics 0.025 1.8 4 VGS, GATE−TO−SOURCE VOLTAGE (V) 0.030 2.0 3 TJ = −55°C VDS, DRAIN−TO−SOURCE VOLTAGE (V) 0.035 4 50 0 5 0.040 0.010 60 10 4.5 V 0 VDS ≥ 10 V 70 6V 60 0 80 TJ = 25°C VGS = 10 V RDS(on), DRAIN−TO−SOURCE RESISTANCE (W) ID, DRAIN CURRENT (A) 80 1.6 1.4 1.2 1.0 TJ = 150°C 1000 TJ = 125°C 0.8 0.6 −50 −25 0 25 50 75 100 125 150 100 10 20 30 40 50 TJ, JUNCTION TEMPERATURE (°C) VDS, DRAIN−TO−SOURCE VOLTAGE (V) Figure 5. On−Resistance Variation with Temperature Figure 6. Drain−to−Source Leakage Current vs. Voltage http://onsemi.com 3 60 NTD5865N 10 VGS = 0 V C, CAPACITANCE (pF) 1400 Ciss TJ = 25°C 1200 1000 800 600 400 Coss 200 Crss 0 0 10 20 30 40 50 VDS, DRAIN−TO−SOURCE VOLTAGE (V) 60 VGS, GATE−TO−SOURCE VOLTAGE (V) 1600 QT 8 6 Qgs 4 2 VDS = 48 V ID = 38 A TJ = 25°C 0 0 5 10 15 20 Qg, TOTAL GATE CHARGE (nC) Figure 7. Capacitance Variation 40 VDD = 48 V ID = 38 A VGS = 10 V IS, SOURCE CURRENT (A) t, TIME (ns) td(off) tr 10 td(on) tf 1 1 10 100 TJ = 25°C 30 25 20 15 10 5 0 0.50 0.55 0.60 0.65 0.70 0.75 0.80 0.85 0.90 0.95 RG, GATE RESISTANCE (W) VSD, SOURCE−TO−DRAIN VOLTAGE (V) Figure 9. Resistive Switching Time Variation vs. Gate Resistance Figure 10. Diode Forward Voltage vs. Current 1000 40 VGS = 10 V SINGLE PULSE TC = 25°C 10 ms 10 ms 1 ms 100 ms 10 1 dc RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 ID = 27 A 35 AVALANCHE ENERGY (mJ) ID, DRAIN CURRENT (A) VGS = 0 V 35 100 0.1 25 Figure 8. Gate−to−Source vs. Total Charge 1000 100 Qgd 1 10 100 VDS, DRAIN−TO−SOURCE VOLTAGE (V) 30 25 20 15 10 5 0 25 50 75 100 125 TJ, STARTING JUNCTION TEMPERATURE Figure 11. Maximum Rated Forward Biased Safe Operating Area 150 Figure 12. Maximum Avalanche Energy versus Starting Junction Temperature http://onsemi.com 4 NTD5865N RqJC(t) (°C/W) EFFECTIVE TRANSIENT THERMAL RESISTANCE 10 Duty Cycle = 0.5 1 0.1 0.2 0.1 0.05 0.02 0.01 SINGLE PULSE 0.01 0.000001 0.00001 0.0001 0.001 t, PULSE TIME (s) Figure 13. Thermal Response http://onsemi.com 5 0.01 0.1 1 NTD5865N PACKAGE DIMENSIONS DPAK (SINGLE GUAGE) CASE 369AA−01 ISSUE A −T− C B V NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. SEATING PLANE E R 4 Z A S 1 2 DIM A B C D E F H J L R S U V Z H 3 U F J L D STYLE 2: PIN 1. GATE 2. DRAIN 3. SOURCE 4. DRAIN 2 PL 0.13 (0.005) M T SOLDERING FOOTPRINT* 6.20 0.244 2.58 0.101 5.80 0.228 3.0 0.118 1.6 0.063 6.172 0.243 SCALE 3:1 mm Ǔ ǒinches *For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. http://onsemi.com 6 INCHES MIN MAX 0.235 0.245 0.250 0.265 0.086 0.094 0.025 0.035 0.018 0.024 0.030 0.045 0.386 0.410 0.018 0.023 0.090 BSC 0.180 0.215 0.024 0.040 0.020 −−− 0.035 0.050 0.155 −−− MILLIMETERS MIN MAX 5.97 6.22 6.35 6.73 2.19 2.38 0.63 0.89 0.46 0.61 0.77 1.14 9.80 10.40 0.46 0.58 2.29 BSC 4.57 5.45 0.60 1.01 0.51 −−− 0.89 1.27 3.93 −−− NTD5865N PACKAGE DIMENSIONS IPAK−3 (SINGLE GAUGE) CASE 369D−01 ISSUE B C B V NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. E R 4 Z A S 1 2 3 −T− SEATING PLANE K J F D G H 3 PL 0.13 (0.005) M DIM A B C D E F G H J K R S V Z INCHES MIN MAX 0.235 0.245 0.250 0.265 0.086 0.094 0.027 0.035 0.018 0.023 0.037 0.045 0.090 BSC 0.034 0.040 0.018 0.023 0.350 0.380 0.180 0.215 0.025 0.040 0.035 0.050 0.155 −−− MILLIMETERS MIN MAX 5.97 6.35 6.35 6.73 2.19 2.38 0.69 0.88 0.46 0.58 0.94 1.14 2.29 BSC 0.87 1.01 0.46 0.58 8.89 9.65 4.45 5.45 0.63 1.01 0.89 1.27 3.93 −−− STYLE 2: PIN 1. GATE 2. DRAIN 3. SOURCE 4. DRAIN T ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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