LATTICE GAL16LV8ZD

GAL16LV8ZD
Low Voltage, Zero Power E2CMOS PLD
Generic Array Logic™
Features
Functional Block Diagram
• 3.3V LOW VOLTAGE, ZERO POWER OPERATION
— JEDEC Compatible 3.3V Interface Standard
— Interfaces with Standard 5V TTL Devices
— 50µA Typical Standby Current (100µA Max.)
— 45mA Typical Active Current (55mA Max.)
— Dedicated Power-down Pin
I/CLK
CLK
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
8
OLMC
I/O/Q
I
2
• HIGH PERFORMANCE E CMOS TECHNOLOGY
— TTL Compatible Balanced 8 mA Output Drive
— 15 ns Maximum Propagation Delay
— Fmax = 62.5 MHz
— 10 ns Maximum from Clock Input to Data Output
— UltraMOS® Advanced CMOS Technology
PROGRAMMABLE
AND-ARRAY
(64 X 32)
I
DPP
• E2 CELL TECHNOLOGY
— Reconfigurable Logic
— Reprogrammable Cells
— 100% Tested/100% Yields
— High Speed Electrical Erasure (<100ms)
— 20 Year Data Retention
I
I
• EIGHT OUTPUT LOGIC MACROCELLS
— Maximum Flexibility for Complex Logic Designs
— Programmable Output Polarity
I
• PRELOAD AND POWER-ON RESET OF ALL REGISTERS
— 100% Functional Testability
• APPLICATIONS INCLUDE:
— Glue Logic for 3.3V Systems
— Ideal for Mixed 3.3V and 5V Systems
I
• ELECTRONIC SIGNATURE FOR IDENTIFICATION
I
Description
OE
I/OE
Pin Configuration
The GAL16LV8ZD, at 100 µA standby current and 15ns propagation
delay provides the highest speed low-voltage PLD available in the
market. The GAL16LV8ZD is manufactured using Lattice
Semiconductor's advanced 3.3V E2CMOS process, which combines CMOS with Electrically Erasable (E2) floating gate technology.
PLCC
I
DPP
The GAL16LV8ZD utilizes a dedicated power-down pin (DPP) to
put the device into standby mode. It has 15 inputs available to the
AND array and is capable of interfacing with both 3.3V and standard 5V devices.
I
I/CLK Vcc
2
20
I/O/Q
18
4
I/O/Q
I
I
Unique test circuitry and reprogrammable cells allow complete AC,
DC, and functional testing during manufacture. As a result,
Lattice Semiconductor delivers 100% field programmability and
functionality of all GAL products. In addition, 100 erase/write cycles
and data retention in excess of 20 years are specified.
GAL16LV8ZD
Top View
6
16
I/O/Q
I/O/Q
I
I
I/O/Q
8
14
9
I
GND
11
13
I/OE I/O/Q
I/O/Q
I/O/Q
Copyright © 1997 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 268-8000; 1-800-LATTICE; FAX (503) 268-8556; http://www.latticesemi.com
16lv8zd_03
1
December 1997
Specifications GAL16LV8ZD
GAL16LV8ZD Ordering Information
Commercial Grade Specifications
Tpd (ns)
Tsu (ns)
Tco (ns)
Icc (mA)
Isb (µA)
Ordering #
Package
15
12
10
55
100
GAL16LV8ZD-15QJ
20-Lead PLCC
25
15
15
55
100
GAL16LV8ZD-25QJ
20-Lead PLCC
Part Number Description
XXXXXXXX _ XX
Device Name
GAL16LV8ZD (Zero Power DPP)
X X X
Grade
Blank = Commercial
Package
J = PLCC
Speed (ns)
Active Power
Q = Quarter Power
2
Specifications GAL16LV8ZD
Output Logic Macrocell (OLMC)
each macrocell controls the polarity of the output in any of the three
modes, while the AC1 bit of each of the macrocells controls the input/output configuration. These two global and 16 individual architecture bits define all possible configurations in a GAL16LV8ZD.
The information given on these architecture bits is only to give a
better understanding of the device. Compiler software will transparently set these architecture bits from the pin definitions, so the
user should not need to directly manipulate these architecture bits.
The following discussion pertains to configuring the output logic
macrocell. It should be noted that actual implementation is accomplished by development software/hardware and is completely transparent to the user.
There are three global OLMC configuration modes possible:
simple, complex, and registered. Details of each of these modes
is illustrated in the following pages. Two global bits, SYN and AC0,
control the mode configuration for all macrocells. The XOR bit of
Compiler Support for OLMC
Software compilers support the three different global OLMC modes
as different device types. Most compilers also have the ability to
automatically select the device type, generally based on the register
usage and output enable (OE) usage. Register usage on the device
forces the software to choose the registered mode. All combinatorial outputs with OE controlled by the product term will force the
software to choose the complex mode. The software will choose
the simple mode only when all outputs are dedicated combinatorial
without OE control. For further details, refer to the compiler software manuals.
In complex mode pin 1 and pin 11 become dedicated inputs and
use the feedback paths of pin 19 and pin 12 respectively. Because
of this feedback path usage, pin 19 and pin 12 do not have the
feedback option in this mode.
In simple mode all feedback paths of the output pins are routed
via the adjacent pins. In doing so, the two inner most pins ( pins
15 and 16) will not have the feedback option as these pins are
always configured as dedicated combinatorial output.
When using the standard GAL16V8 JEDEC fuse pattern generated
by the logic compilers for the GAL16LV8ZD, special attention must
be given to pin 4 (DPP) to make sure that it is not used as one of
the functional inputs.
When using compiler software to configure the device, the user
must pay special attention to the following restrictions in each mode.
In registered mode pin 1 and pin 11 are permanently configured
as clock and output enable, respectively. These pins cannot be configured as dedicated inputs in the registered mode.
3
Specifications GAL16LV8ZD
Registered Mode
In the Registered mode, macrocells are configured as dedicated
registered outputs or as I/O functions.
Registered outputs have eight product terms per output. I/Os have
seven product terms per output.
Architecture configurations available in this mode are similar to the
common 16R8 and 16RP4 devices with various permutations of
polarity, I/O and register placement.
Pin 4 is used as dedicated power-down pin on GAL16LV8ZD. It
cannot be used as functional input.
The JEDEC fuse numbers, including the User Electronic Signature
(UES) fuses and the Product Term Disable (PTD) fuses, are shown
on the logic diagram on the following page.
All registered macrocells share common clock and output enable
control pins. Any macrocell can be configured as registered or I/
O. Up to eight registers or up to eight I/Os are possible in this mode.
Dedicated input or output functions can be implemented as subsets of the I/O function.
CLK
Registered Configuration for Registered Mode
D
XOR
- SYN=0.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this output configuration.
- Pin 1 controls common CLK for the registered outputs.
- Pin 11 controls common OE for the registered outputs.
- Pin 1 & Pin 11 are permanently configured as CLK & OE
for registered output configuration.
Q
Q
OE
Combinatorial Configuration for Registered Mode
- SYN=0.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1 defines this output configuration.
- Pin 1 & Pin 11 are permanently configured as CLK & OE
for registered output configuration.
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
4
Specifications GAL16LV8ZD
Registered Mode Logic Diagram
PLCC Package Pinout
1
0
4
8
12
16
20
24
28
2128
PTD
0000
OLMC
0224
19
XOR-2048
AC1-2120
2
0256
OLMC
0480
18
XOR-2049
AC1-2121
3
0512
OLMC
0736
XOR-2050
AC1-2122
Power
Management
Control
4
17
0768
OLMC
0992
16
XOR-2051
AC1-2123
5
1024
OLMC
1248
15
XOR-2052
AC1-2124
6
1280
OLMC
1504
14
XOR-2053
AC1-2125
7
1536
OLMC
1760
13
XOR-2054
AC1-2126
8
1792
OLMC
2016
XOR-2055
AC1-2127
9
2191
64-USER ELECTRONIC SIGNATURE FUSES
2056, 2057, ....
.... 2118, 2119
Byte7 Byte6 ....
.... Byte1 Byte0
MSB
LSB
5
SYN-2192
AC0-2193
12
OE
11
Specifications GAL16LV8ZD
Complex Mode
In the Complex mode, macrocells are configured as output only or
I/O functions.
All macrocells have seven product terms per output. One product
term is used for programmable output enable control. Pins 1 and
11 are always available as data inputs into the AND array.
Architecture configurations available in this mode are similar to the
common 16L8 and 16P8 devices with programmable polarity in
each macrocell.
Pin 4 is used as dedicated power-down pin on GAL16LV8ZD. It
cannot be used as functional input.
Up to six I/Os are possible in this mode. Dedicated inputs or outputs
can be implemented as subsets of the I/O function. The two outer
most macrocells (pins 12 & 19) do not have input capability. Designs requiring eight I/Os can be implemented in the Registered
mode.
The JEDEC fuse numbers including the UES fuses and PTD fuses
are shown on the logic diagram on the following page.
Combinatorial I/O Configuration for Complex Mode
- SYN=1.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1 has no effect on this mode.
- Pin 13 through Pin 18 are configured to this function.
XOR
Combinatorial Output Configuration for Complex Mode
- SYN=1.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1 has no effect on this mode.
- Pin 12 and Pin 19 are configured to this
function.
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
6
Specifications GAL16LV8ZD
Complex Mode Logic Diagram
PLCC Package Pinout
1
2128
0
4
8
12
16
20
24
28
PTD
0000
OLMC
19
XOR-2048
AC1-2120
0224
2
0256
OLMC
18
XOR-2049
AC1-2121
0480
3
0512
OLMC
4
17
XOR-2050
AC1-2122
0736
Power
Management
Control
0768
OLMC
16
XOR-2051
AC1-2123
0992
5
1024
OLMC
15
XOR-2052
AC1-2124
1248
6
1280
OLMC
14
XOR-2053
AC1-2125
1504
7
1536
OLMC
13
XOR-2054
AC1-2126
1760
8
1792
OLMC
12
XOR-2055
AC1-2127
2016
9
11
2191
64-USER ELECTRONIC SIGNATURE FUSES
2056, 2057, ....
.... 2118, 2119
Byte7 Byte6 ....
.... Byte1 Byte0
MSB
LSB
7
SYN-2192
AC0-2193
Specifications GAL16LV8ZD
Simple Mode
In the Simple mode, macrocells are configured as dedicated inputs
or as dedicated, always active, combinatorial outputs.
Pins 1 and 11 are always available as data inputs into the AND
array. The center two macrocells (pins 15 & 16) cannot be used
in the input configuration.
Architecture configurations available in this mode are similar to the
common 10L8 and 12P6 devices with many permutations of generic output polarity or input choices.
Pin 4 is used as dedicated power-down pin on GAL16LV8ZD. It
cannot be used as a functional input.
All outputs in the simple mode have a maximum of eight product
terms that can control the logic. In addition, each output has programmable polarity.
The JEDEC fuse numbers including the UES fuses and PTD fuses
are shown on the logic diagram.
Combinatorial Output with Feedback Configuration
for Simple Mode
Vcc
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this configuration.
- All OLMC except pins 15 & 16 can be configured to
this function.
XOR
Combinatorial Output Configuration for Simple Mode
Vcc
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this configuration.
- Pins 15 & 16 are permanently configured to this
function.
XOR
Dedicated Input Configuration for Simple Mode
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1 defines this configuration.
- All OLMC except pins 15 & 16 can be configured to
this function.
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
8
Specifications GAL16LV8ZD
Simple Mode Logic Diagram
PLCC Package Pinout
1
2128
0
4
8
12
16
20
24
28
PTD
0000
OLMC
19
XOR-2048
AC1-2120
0224
2
0256
OLMC
18
XOR-2049
AC1-2121
0480
3
0512
OLMC
4
17
XOR-2050
AC1-2122
0736
Power
Management
Control
0768
OLMC
16
XOR-2051
AC1-2123
0992
5
1024
OLMC
15
XOR-2052
AC1-2124
1248
6
1280
OLMC
14
XOR-2053
AC1-2125
1504
7
1536
OLMC
13
XOR-2054
AC1-2126
1760
8
1792
OLMC
12
XOR-2055
AC1-2127
2016
9
11
2191
64-USER ELECTRONIC SIGNATURE FUSES
2056, 2057, ....
.... 2118, 2119
Byte7 Byte6 ....
.... Byte1 Byte0
MSB
LSB
9
SYN-2192
AC0-2193
Specifications GAL16LV8ZD
Absolute Maximum Ratings(1)
Recommended Operating Conditions
Supply voltage VCC .................................... -0.5 to +5.6V
Input voltage applied ................................. -0.5 to +5.6V
Off-state output voltage applied ................ -0.5 to +5.6V
Storage Temperature ................................. -65 to 150°C
Ambient Temperature with
Power Applied ......................................... -55 to 125°C
Commercial Devices:
Ambient Temperature (TA) ............................. 0 to +75°C
Supply voltage (VCC)
with Respect to Ground ......................... +3.0 to +3.6V
1. Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device
at these or at any other conditions above those indicated in
the operational sections of this specification is not implied
(while programming, follow the programming specifications).
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
SYMBOL
VIL
VIH
IIL
IIH
VOL
VOH
IOL
IOH
IOS1
MIN.
TYP.2
MAX.
UNITS
Input Low Voltage
Vss – 0.5
—
0.8
V
Input High Voltage
2.0
—
5.25
V
PARAMETER
CONDITION
Input or I/O Low Leakage Current
0V ≤ VIN ≤ VIL (MAX.)
—
—
-10
µA
Input or I/O High Leakage Current
(VCC-0.2)V ≤ VIN ≤ VCC
—
—
10
µA
VCC ≤ VIN ≤ 5.25V
—
—
1
mA
IOL = MAX. Vin = VIL or VIH
—
—
0.5
V
IOL = 0.5 mA Vin = VIL or VIH
—
—
0.2
V
IOH = MAX. Vin = VIL or VIH
2.4
—
—
V
IOH = -0.5 mA Vin = VIL or VIH
Vcc-0.45
—
—
V
IOH = -100 µA Vin = VIL or VIH
Vcc-0.2
—
—
V
Low Level Output Current
—
—
8
mA
High Level Output Current
—
—
-8
mA
-30
—
-130
mA
Output Low Voltage
Output High Voltage
Output Short Circuit Current
COMMERCIAL
ISB
Stand-by Power
VCC = 3.3V VOUT = GND TA = 25°C
VIL = GND VIH = Vcc Outputs Open
ZD -15/-25
—
50
100
µA
VIL = 0.5V VIH = 3.0V
ftoggle = 15 MHz Outputs Open
ZD -15/-25
—
45
55
mA
Supply Current
ICC
Operating Power
Supply Current
1) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems by tester ground
degradation. Characterized but not 100% tested.
2) Typical values are at Vcc = 3.3V and TA = 25 °C
10
Specifications GAL16LV8ZD
AC Switching Characteristics
Over Recommended Operating Conditions
PARAM
TEST
COND.1
tpd
tco
tcf2
tsu
th
fmax3
twh
twl
ten
tdis
COM
COM
-15
-25
DESCRIPTION
MIN. MAX. MIN. MAX.
UNITS
A
Input or I/O to Combinatorial Output
3
15
3
25
ns
A
Clock to Output Delay
2
10
2
15
ns
—
Clock to Feedback Delay
—
8
—
10
ns
—
Setup Time, Input or Fdbk before Clk↑
12
—
15
—
ns
—
Hold Time, Input or Fdbk after Clk↑
0
—
0
—
ns
A
Maximum Clock Frequency with
External Feedback, 1/(tsu + tco)
45.5
—
33.3
—
MHz
A
Maximum Clock Frequency with
Internal Feedback, 1/(tsu + tcf)
50
—
40
—
MHz
A
Maximum Clock Frequency with
No Feedback
62.5
—
41.6
—
MHz
—
Clock Pulse Duration, High
8
—
12
—
ns
—
Clock Pulse Duration, Low
8
—
12
—
ns
B
Input or I/O to Output Enabled
—
17
—
25
ns
B
OE↓ to Output Enabled
—
16
—
20
ns
C
Input or I/O to Output Disabled
—
18
—
25
ns
C
OE↑ to Output Disabled
—
17
—
20
ns
1) Refer to Switching Test Conditions section.
2) Calculated from fmax with internal feedback. Refer to fmax Description section.
3) Refer to fmax Description section.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOL
PARAMETER
TYPICAL
UNITS
TEST CONDITIONS
CI
Input Capacitance
8
pF
VCC = 3.3V, VI = 0V
CI/O
I/O Capacitance
8
pF
VCC = 3.3V, VI/O = 0V
11
Specifications GAL16LV8ZD
Dedicated Power-Down Pin Specifications
Over Recommended Operating Conditions
PARAMETER
twhd
twld
TEST
COND1.
COM
COM
-15
-25
MIN. MAX.
MIN. MAX.
DESCRIPTION
UNITS
—
DPP Pulse Duration High
40
—
40
—
ns
—
DPP Pulse Duration Low
30
—
40
—
ns
ACTIVE TO STANDBY
tivdh
tgvdh
tcvdh
—
Valid Input before DPP High
0
—
0
—
ns
—
Valid OE before DPP High
0
—
0
—
ns
—
Valid Clock before DPP High
0
—
0
—
ns
tdhix
tdhgx
tdhcx
—
Input Don't Care after DPP High
—
15
—
25
ns
—
OE Don't Care after DPP High
—
15
—
25
ns
—
Clock Don't Care after DPP High
—
15
—
25
ns
—
Input Don't Care before DPP Low
—
0
—
0
ns
—
OE Don't Care before DPP Low
—
0
—
0
ns
—
Clock Don't Care before DPP Low
—
0
—
0
ns
—
DPP Low to Valid Input
20
—
25
—
ns
—
DPP Low to Valid OE
20
—
25
—
ns
—
DPP Low to Valid Clock
30
—
35
—
ns
A
DPP Low to Valid Output
5
45
5
45
ns
STANDBY TO ACTIVE
tixdl
tgxdl
tcxdl
tdliv
tdlgv
tdlcv
tdlov
1) Refer to Switching Test Conditions section.
Dedicated Power-Down Pin Timing Waveforms
DPP
t ivdh
t dhix
t ixdl
t dliv
t gvdh
t dhgx t gxdl
t dlgv
INPUT or
I/O FEEDBACK
OE
t cvdh
t dhcx
t cxdl
t dlcv
CLK
tc o
t p d ,t e n ,t di s
OUTPUT
12
t dlov
Specifications GAL16LV8ZD
Switching Waveforms
INPUT or
I/O FEEDBACK
INPUT or
I/O FEEDBACK
VALID INPUT
VALID INPUT
tsu
tpd
th
CLK
COMBINATIONAL
OUTPUT
tco
REGISTERED
OUTPUT
1/fmax
(external fdbk)
Combinatorial Output
INPUT or
I/O FEEDBACK
Registered Output
tdis
ten
COMBINATIONAL
OUTPUT
OE
tdis
Input or I/O to Output Enable/Disable
ten
REGISTERED
OUTPUT
OE to Output Enable/Disable
twh
twl
CLK
CLK
1/ fmax
(w/o fb)
1/ fmax (internal fdbk)
tcf
REGISTERED
FEEDBACK
Clock Width
fmax with Feedback
13
tsu
Specifications GAL16LV8ZD
fmax Descriptions
CLK
LOGIC
ARRAY
REGISTER
CLK
tsu
LOGIC
ARRAY
tco
REGISTER
fmax with External Feedback 1/(tsu+tco)
Note: fmax with external feedback is calculated from
measured tsu and tco.
t cf
t pd
CLK
fmax with Internal Feedback 1/(tsu+tcf)
LOGIC
ARRAY
Note: tcf is a calculated value, derived by subtracting
tsu from the period of fmax w/internal feedback (tcf
= 1/fmax - tsu). The value of tcf is used primarily
when calculating the delay from clocking a register
to a combinatorial output (through registered feedback), as shown above. For example, the timing
from clock to a combinatorial output is equal to tcf
+ tpd.
REGISTER
tsu + th
fmax with No Feedback
Note: fmax with no feedback may be less than 1/(twh
+ twl). This is to allow for a clock duty cycle of other
than 50%.
Switching Test Conditions
Input Pulse Levels
Input Rise and Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
+3.3V
GND to 3.0V
2ns 10% – 90%
1.5V
1.5V
Output Load
R1
See Figure
3-state levels are measured 0.5V from steady-state active
level. 3-state to active transitions are measured at (Voh - 0.5)
V and (Vol + 0.5) V.
FROM OUTPUT (O/Q)
UNDER TEST
Output Load Conditions (see figure)
Test Condition
B
C
R2
R1
R2
CL
270Ω
220Ω
35pF
Active High
270Ω
220Ω
35pF
Active Low
270Ω
220Ω
35pF
Active High
270Ω
220Ω
5pF
Active Low
270Ω
220Ω
5pF
A
TEST POINT
C L*
*C L INCLUDES TEST FIXTURE AND PROBE CAPACITANCE
14
Specifications GAL16LV8ZD
Electronic Signature
An electronic signature word is provided in every GAL16LV8ZD
device. It contains 64 bits of reprogrammable memory that can
contain user defined data. Some uses include user ID codes,
revision numbers, or inventory control. The signature data is always available to the user independent of the state of the security
cell.
NOTE: The electronic signature is included in checksum calculations. Changing the electronic signature will alter checksum.
Security Cell
A security cell is provided in the GAL16LV8ZD devices to prevent
unauthorized copying of the array patterns. Once programmed,
this cell prevents further read access to the functional bits in the
device. This cell can only be erased by re-programming the device, so the original configuration can never be examined once this
cell is programmed. The electronic signature data is always available regardless of the security cell state.
Device Programming
GAL devices are programmed using a Lattice Semiconductor-approved Logic Programmer, available from a number of manufacturers. Complete programming of the device takes only a few seconds. Erasing of the device is transparent to the user, and is done
automatically as part of the programming cycle.
Output Register Preload
When testing state machine designs, all possible states and state
transitions must be verified in the design, not just those required
in the normal machine operations. This is because, in system
operation, certain events occur that may throw the logic into an
illegal state (power-up, line voltage glitches, brown-outs, etc.). To
test a design for proper treatment of these conditions, a way must
be provided to break the feedback paths, and force any desired (i.e.,
illegal) state into the registers. Then the machine can be sequenced
and the outputs tested for correct next state conditions.
The GAL16LV8ZD devices includes circuitry that allows each registered output to be synchronously set either high or low. Thus, any
present state condition can be forced for test sequencing. If necessary, approved GAL programmers capable of executing test
vectors perform output register preload automatically.
Input Buffers
GAL16LV8ZD devices are designed with TTL level compatible input
buffers. These buffers have a characteristically high impedance,
and present a much lighter load to the driving logic than bipolar TTL
devices.
Dedicated Power-Down Pin
The GAL16LV8ZD uses pin 4 as the dedicated power-down signal to put the device in to the power-down state. DPP is an active
high signal where a logic high driven on this signal puts the device
into power-down state. Input pin 4 cannot be used as a logic function input on this device.
15
Specifications GAL16LV8ZD
Power-Up Reset
Vcc
Vcc (min.)
t su
t wl
CLK
t pr
INTERNAL REGISTER
Q - OUTPUT
Internal Register
Reset to Logic "0"
FEEDBACK/EXTERNAL
OUTPUT REGISTER
Device Pin
Reset to Logic "1"
Circuitry within the GAL16LV8ZD provides a reset signal to all registers during power-up. All internal registers will have their Q outputs set low after a specified time (tpr, 10µs MAX). As a result,
the state on the registered output pins (if they are enabled) will
always be high on power-up, regardless of the programmed
polarity of the output pins. This feature can greatly simplify state
machine design by providing a known state on power-up. The
timing diagram for power-up is shown below. Because of the
asynchronous nature of system power-up, some conditions must
be met to provide a valid power-up reset of the GAL16LV8ZD.
First, the VCC rise must be monotonic. Second, the clock input
must be at static TTL level as shown in the diagram during power
up. The registers will reset within a maximum of tpr time. As in
normal system operation, avoid clocking the device until all input
and feedback path setup times have been met. The clock must
also meet the minimum pulse width requirements.
Input/Output Equivalent Schematics
PIN
PIN
Feedback
Vcc
Vcc
Tri-State
Control
Vcc
Vcc
ESD
Protection
Circuit
Data
Output
PIN
ESD
Protection
Circuit
PIN
Feedback
(To Input Buffer)
Typical Input
Typical Output
16
Specifications GAL16LV8ZD
Typical AC and DC Characteristics
Normalized Tpd vs Vcc
1.2
1.2
PT L->H
1
0.9
0.8
3.00
3.15
3.30
3.45
1.1
FALL
1
0.9
0.8
3.00
3.60
3.15
3.30
3.45
PT L->H
1
0.9
0.8
3.00
3.60
3.15
3.30
3.45
3.60
Supply Voltage (V)
Supply Voltage (V)
Supply Voltage (V)
Normalized Tpd vs Temp
Normalized Tco vs Temp
Normalized Tsu vs Temp
1.3
1
0.9
0.8
Delta Tpd vs # of Outputs
Switching
PT L->H
1.1
1
0.9
0.8
Temperature (deg. C)
Delta Tco (ns)
0
-0.25
-0.5
RISE
-0.75
FALL
-1
-0.1
-0.2
-0.3
RISE
-0.4
FALL
-0.5
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
Number of Outputs Switching
Number of Outputs Switching
Delta Tpd vs Output Loading
Delta Tco vs Output Loading
12
12
10
8
Delta Tco (ns)
RISE
10
FALL
6
4
2
0
RISE
8
FALL
6
4
2
0
-2
-4
-2
0
50
100
150
200
250
0
300
50
100
150
200
250
Output Loading (pF)
Output Loading (pF)
17
100
-55
125
0.7
Delta Tco vs # of Outputs
Switching
0
Delta Tpd (ns)
PT H->L
1.2
Temperature (deg. C)
Temperature (deg. C)
Delta Tpd (ns)
100
75
50
25
-25
-55
125
100
75
50
25
0
-25
0
0.7
0.7
1.3
75
0.8
FALL
50
1
0.9
1.1
25
PT L->H
RISE
0
1.1
1.4
1.2
-25
PT H->L
Normalized Tsu
1.2
Normalized Tco
1.3
-55
PT H->L
1.1
300
125
1.1
RISE
Normalized Tsu
PT H->L
Normalized Tco
Normalized Tpd
1.2
Normalized Tpd
Normalized Tsu vs Vcc
Normalized Tco vs Vcc
Specifications GAL16LV8ZD
Typical AC and DC Characteristics
Voh vs Ioh
3
3
2.5
2.975
1
2
2.95
0.75
0.5
1.5
1
0.25
0.5
0
0
20.00
40.00
60.00
Voh (V)
1.5
0.00
10.00
20.00
30.00
40.00
50.00
1.10
1.00
0.90
0.80
1.1
1.05
1
0.95
3.60
Supply Voltage (V)
-25
0
25
50
75
100
125
Temperature (deg. C)
Delta Icc vs Vin (1 input)
0
20
30
Iik (mA)
Delta Icc (mA)
10
2
40
50
60
70
1
80
90
0
0.00
0.50
1.00
1.50
2.00
Vin (V)
2.50
3.00
3.50
1.75
1.50
1.25
1.00
100
-1.50
-1.20
-0.90
-0.60
Vik (V)
18
-0.30
0
25
50
75
Frequency (MHz)
Input Clamp (Vik)
3
4.00
0.75
-55
4
3.00
2.00
0.9
3.45
2.00
Normalized Icc vs Freq.
Normalized Icc
1.15
Normalized Icc
1.2
1.20
3.30
1.00
Ioh(mA)
Normalized Icc vs Temp
1.30
3.15
0.00
Ioh(mA)
Normalized Icc vs Vcc
0.70
3.00
2.9
2.85
0.00
80.00
2.925
2.875
Iol (mA)
Normalized Icc
Voh vs Ioh
1.25
Voh (V)
Vol (V)
Vol vs Iol
0.00
100