MITSUBISHI LSIs 2001.March Rev.0.1 M5M5T5636UG – 25,22,20 Advanced Information Notice: This is not final specification. Some parametric limits are subject to change. 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM DESCRIPTION APPLICATION The M5M5T5636UG is a family of 18M bit synchronous SRAMs organized as 524288-words by 36-bit. It is designed to eliminate dead bus cycles when turning the bus around between reads and writes, or writes and reads. Mitsubishi's SRAMs are fabricated with high performance, low power CMOS technology, providing greater reliability. M5M5T5636UG operates on 2.5V power/ 1.8V I/O supply or a single 2.5V power supply and are 2.5V CMOS compatible. High-end networking products that require high bandwidth, such as switches and routers. FEATURES • Fully registered inputs and outputs for pipelined operation • Fast clock speed: 250, 225, and 200 MHz • Fast access time: 2.6, 2.8, 3.2 ns • Single 2.5V -5% and +5% power supply VDD • Separate VDDQ for 2.5V or 1.8V I/O • Individual byte write (BWa# - BWd#) controls may be tied LOW • Single Read/Write control pin (W#) • CKE# pin to enable clock and suspend operations • Internally self-timed, registers outputs eliminate the need to control G# • Snooze mode (ZZ) for power down • Linear or Interleaved Burst Modes • Three chip enables for simple depth expansion • JTAG boundary scan support FUNCTION Synchronous circuitry allows for precise cycle control triggered by a positive edge clock transition. Synchronous signals include : all Addresses, all Data Inputs, all Chip Enables (E1#, E2, E3#), Address Advance/Load (ADV), Clock Enable (CKE#), Byte Write Enables (BWa#, BWb#, BWc#, BWd#) and Read/Write (W#). Write operations are controlled by the four Byte Write Enables (BWa# - BWd#) and Read/Write(W#) inputs. All writes are conducted with on-chip synchronous selftimed write circuitry. Asynchronous inputs include Output Enable (G#), Clock (CLK) and Snooze Enable (ZZ). The HIGH input of ZZ pin puts the SRAM in the power-down state.The Linear Burst order (LBO#) is DC operated pin. LBO# pin will allow the choice of either an interleaved burst, or a linear burst. All read, write and deselect cycles are initiated by the ADV LOW input. Subsequent burst address can be internally generated as controlled by the ADV HIGH input. Package 165(11x15) bump BGA Body Size (13mm x 15mm) Bump Pitch 1.0mm PART NAME TABLE Part Name Frequency Access Cycle Active Current (max.) Standby Current (max.) M5M5T5636UG - 25 250MHz 2.6ns 4.0ns 400mA 20mA M5M5T5636UG - 22 225MHz 2.8ns 4.4ns 380mA 20mA M5M5T5636UG - 20 200MHz 3.2ns 5.0ns 360mA 20mA 1 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM BUMP LAYOUT(TOP VIEW) 165bump-BGA 1 2 3 4 5 6 7 8 9 10 11 A NC A7 E1# BWc# BWb# E3# CKE# ADV A17 A8 NC B NC A6 E2 BWd# BWa# CLK W# G# A18 A9 NC C DQPc NC VDDQ VSS VSS VSS VSS VSS VDDQ NC DQPb D DQc DQc VDDQ VDD VSS VSS VSS VDD VDDQ DQb DQb E DQc DQc VDDQ VDD VSS VSS VSS VDD VDDQ DQb DQb F DQc DQc VDDQ VDD VSS VSS VSS VDD VDDQ DQb DQb G DQc DQc VDDQ VDD VSS VSS VSS VDD VDDQ DQb DQb H MCH MCH NC VDD VSS VSS VSS VDD NC NC ZZ J DQd DQd VDDQ VDD VSS VSS VSS VDD VDDQ DQa DQa K DQd DQd VDDQ VDD VSS VSS VSS VDD VDDQ DQa DQa L DQd DQd VDDQ VDD VSS VSS VSS VDD VDDQ DQa DQa M DQd DQd VDDQ VDD VSS VSS VSS VDD VDDQ DQa DQa N DQPd NC VDDQ VSS NC NC MCH VSS VDDQ NC DQPa P NC NC A5 A3 TDI A1 TDO A15 A13 A11 NC R LBO# NC A4 A2 TMS A0 TCK A16 A14 A12 A10 Note1. MCH means "Must Connect High". MCH should be connected to HIGH. 2 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM BLOCK DIAGRAM VDD A0 A1 A2~18 VDDQ 19 19 17 ADDRESS REGISTER A1' A1 D1 LINEAR/ Q1 D0 INTERLEAVED BURST COUNTER Q0 A0 A0' LBO# CLK CKE# 19 WRITE ADDRESS REGISTER1 WRITE ADDRESS REGISTER2 19 ZZ ADV BYTE3 WRITE DRIVERS MEMORY ARRAY BYTE4 WRITE DRIVERS W# 36 G# 256Kx36 OUTPUT BUFFERS BYTE2 WRITE DRIVERS OUTPUT SELECT WRITE REGISTRY AND DATA COHERENCY CONTROL LOGIC OUTPUT REGISTERS BWa# BWb# BWc# BWd# BYTE1 WRITE DRIVERS INPUT REGISTER1 DQa DQPa DQb DQPb DQc DQPc DQd DQPd INPUT REGISTER0 READ LOGIC E1# E2 E3# VSS Note2. The BLOCK DIAGRAM does not include the Boundary Scan logic. See Boundary Scan chapter. Note3. The BLOCK DIAGRAM illustrates simplified device operation. See TRUTH TABLE, PIN FUNCTION and timing diagrams for detailed information. 3 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM PIN FUNCTION Pin Function Name A0~A18 Synchronous Address Inputs These inputs are registered and must meet the setup and hold times around the rising edge of CLK. A0 and A1 are the two least significant bits (LSB) of the address field and set the internal burst counter if burst is desired. BWa#, BWb#, BWc#, BWd# Synchronous Byte Write Enables These active LOW inputs allow individual bytes to be written when a WRITE cycle is active and must meet the setup and hold times around the rising edge of CLK. BYTE WRITEs need to be asserted on the same cycle as the address. BWs are associated with addresses and apply to subsequent data. BWa# controls DQa, DQPa pins; BWb# controls DQb, DQPb pins; BWc# controls DQc, DQPc pins; BWd# controls DQd, DQPd pins. CLK Clock Input This signal registers the address, data, chip enables, byte write enables and burst control inputs on its rising edge. All synchronous inputs must meet setup and hold times around the clock's rising edge. E1# Synchronous Chip Enable This active LOW input is used to enable the device and is sampled only when a new external address is loaded (ADV is LOW). E2 Synchronous Chip Enable This active High input is used to enable the device and is sampled only when a new external address is loaded (ADV is LOW). This input can be used for memory depth expansion. E3# Synchronous Chip Enable This active Low input is used to enable the device and is sampled only when a new external address is loaded (ADV is LOW). This input can be used for memory depth expansion. G# Output Enable This active LOW asynchronous input enable the data I/O output drivers. ADV Synchronous Address Advance/Load CKE# Synchronous Clock Enable When HIGH, this input is used to advance the internal burst counter, controlling burst access after the external address is loaded. When HIGH, W# is ignored. A LOW on this pin permits a new address to be loaded at CLK rising edge. This active LOW input permits CLK to propagate throughout the device. When HIGH, the device ignores the CLK input and effectively internally extends the previous CLK cycle. This input must meet setup and hold times around the rising edge of CLK. This active HIGH asynchronous input causes the device to enter a low-power standby mode in which all data in the memory array is retained. When active, all other inputs are ignored. When this pin is LOW or NC, the SRAM normally operates. ZZ Snooze Enable W# Synchronous Read/Write This active input determines the cycle type when ADV is LOW. This is the only means for determining READs and WRITEs. READ cycles may not be converted into WRITEs (and vice versa) other than by loading a new address. A LOW on the pin permits BYTE WRITE operations and must meet the setup and hold times around the rising edge of CLK. Full bus width WRITEs occur if all byte write enables are LOW. DQa,DQPa,DQb,DQPb DQc,DQPc,DQd,DQPd Synchronous Data I/O Byte “a” is DQa , DQPa pins; Byte “b” is DQb, DQPb pins; Byte “c” is DQc, DQPc pins; Byte “d” is DQd,DQPd pins. Input data must meet setup and hold times around CLK rising edge. Burst Mode Control This DC operated pin allows the choice of either an interleaved burst or a linear burst. If this pin is HIGH or NC, an interleaved burst occurs. When this pin is LOW, a linear burst occurs, and input leak current to this pin. VDD VDD Core Power Supply VSS VSS Ground VDDQ I/O buffer Power supply LBO# VDDQ TDI Test Data Input TDO Test Data Output TCK Test Clock These pins are used for Boundary Scan Test. TMS Test Mode Select MCH Must Connect High These pins should be connected to HIGH No Connect These pins are not internally connected and may be connected to ground. NC 4 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM DC OPERATED TRUTH TABLE Name Input Status LBO# HIGH or NC LOW Operation Interleaved Burst Sequence Linear Burst Sequence Note4. LBO# is DC operated pin. Note5. NC means No Connection. Note6. See BURST SEQUENCE TABLE about interleaved and Linear Burst Sequence. BURST SEQUENCE TABLE Interleaved Burst Sequence (when LBO# = HIGH or NC) Operation A18~A2 First access, latch external address Second access(first burst address) Third access(second burst address) Fourth access(third burst address) A1,A0 A18~A2 latched A18~A2 latched A18~A2 latched A18~A2 0,1 0,0 1,1 1,0 0,0 0,1 1,0 1,1 1,0 1,1 0,0 0,1 1,1 1,0 0,1 0,0 Linear Burst Sequence (when LBO# = LOW) Operation A18~A2 A1,A0 First access, latch external address A18~A2 0,0 0,1 1,0 1,1 Second access(first burst address) latched A18~A2 0,1 1,0 1,1 0,0 Third access(second burst address) latched A18~A2 1,0 1,1 0,0 0,1 Fourth access(third burst address) latched A18~A2 1,1 0,0 0,1 1,0 Note7. The burst sequence wraps around to its initial state upon completion. TRUTH TABLE Address E1# E2 E3# ZZ ADV W# BWx# G# CKE# CLK DQ H X X X L X X X H L L L L L L X X X X X X X X X L L L L->H High-Z None L->H High-Z None L->H High-Z None Deselect Cycle Deselect Cycle Deselect Cycle X X X L H X X X L L->H High-Z None Continue Deselect Cycle L X L X L X L X H X H X H X H X L X L X L X L X L L L L L L L L L H L H L H L H H X H X L X L X X X X X L L H H L L H H X X X X L L L L L L L L L->H Q External L->H Q Next L->H High-Z External L->H High-Z Next L->H D External L->H D Next L->H High-Z None L->H High-Z Next X X X L X X X X H L->H - Current used Operation Read Cycle, Begin Burst Read Cycle, Continue Burst NOP/Dummy Read, Begin Burst Dummy Read, Continue Burst Write Cycle, Begin Burst Write Cycle, Continue Burst NOP/Write Abort, Begin Burst Write Abort, Continue Burst Ignore Clock edge, Stall X X X H X X X X X X High-Z None Snooze Mode Note8. X means "don't care". H means logic HIGH. L means logic LOW. Note9. BWx#=H means all Synchronous Byte Write Enables (BWa#,BWb#,BWc#,BWd#) are HIGH. BWx#=L means one or more Synchronous Byte Write Enables are LOW. Note10. All inputs except G# and ZZ must meet setup and hold times around the rising edge (LOW to HIGH) of CLK. 5 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM STATE DIAGRAM F,L,X Deselect F,L,X T,L,H T,L,L X,H,X Read Begin Burst T,L,H X,H,X T,L,H Write Begin Burst T,L,L T,L,H X,H,X X,H,X Read Continue Burst T,L,L Key F,L,X T,L,H T,L,L T,L,L Write Continue Burst X,H,X Input Command Code f Current State Transition Next State Note11. The notation "x , x , x" controlling the state transitions above indicate the state of inputs E, ADV and W# respectively. Note12. If (E1# = L and E2 = H and E3# = L) then E="T" else E="F". Note13. "H" = input "high"; "L" = input "low"; "X" = input "don't care"; "T" = input "true"; "F" = input "false". 6 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM WRITE TRUTH TABLE W# BWa# BWb# BWc# BWd# H X X X X L L H H H L H L H H L H H L H L H H H L L L L L L Function Read Write Byte1 Write Byte2 Write Byte3 Write Byte4 Write All Bytes Write Abort/NOP L H H H H Note14.X means "don't care". H means logic HIGH. L means logic LOW. Note15. All inputs except G# and ZZ must meet setup and hold times around the rising edge (LOW to HIGH) of CLK. ABSOLUTE MAXIMUM RATINGS Symbol VDD VDDQ VI VO PD TOPR TSTG(bias) TSTG Parameter Conditions Power Supply Voltage I/O Buffer Power Supply Voltage Input Voltage With respect to VSS Output Voltage Maximum Power Dissipation (VDD) Operating Temperature Storage Temperature(bias) Ratings Unit -2.0*~3.6 -2.0*~3.6 -1.0~VDDQ+1.0* -1.0~VDDQ+1.0** 1050 0~70 -10~85 -65~150 V Storage Temperature Note16.* This is –1.0V~VDDQ+1.0V when pulse width≤2ns, and –0.5V in case of DC. ** This is –1.0V~VDDQ+1.0V when pulse width≤2ns, and –0.5V~VDDQ+0.5V in case of DC. V V V mW °C °C °C 7 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM DC ELECTRICAL CHARACTERISTICS (Ta=0~70°C, VDD=2.375~2.625V, unless otherwise noted) Limits Symbol Parameter VDD Power Supply Voltage VDDQ I/O Buffer Power Supply Voltage VIH Condition Unit Min Max 2.375 2.625 VDDQ = 2.5V 2.375 2.625 VDDQ = 1.8V 1.7 1.95 0.65*VDDQ VDDQ+0.3* V -0.3* 0.35*VDDQ V VDDQ = 2.375~2.625V High-level Input Voltage V V VDDQ = 1.7~1.95V VIL VDDQ = 2.375~2.625V Low-level Input Voltage VDDQ = 1.7~1.95V VOH High-level Output Voltage IOH = -2.0mA VOL Low-level Output Voltage IOL = 2.0mA 0.4 Input Current except ZZ and LBO# VI = 0V ~ VDDQ 10 Input Current of LBO# VI = 0V ~ VDDQ 10 Input Current of ZZ VI = 0V ~ VDDQ 10 Off-state Output Current VI (G#) ≥ VIH, VO = 0V ~ VDDQ 10 4.0ns cycle(250MHz) 400 Power Supply Current : Operating Device selected; Output Open VI≤VIL or VI≥VIH ZZ≤VIL 4.4ns cycle(225MHz) 380 5.0ns cycle(200MHz) 360 Device deselected VI≤VIL or VI≥VIH ZZ≤VIL 4.0ns cycle(250MHz) 140 4.4ns cycle(225MHz) 110 5.0ns cycle(200MHz) 100 ILI ILO ICC1 ICC2 Power Supply Current : Deselected VDDQ-0.4 Device deselected; Output Open VI≤VSS+0.2V or VI≥VDDQ-0.2V CLK frequency=0Hz, All inputs static Snooze mode ICC4 Snooze Mode Standby Current ZZ≥VDDQ-0.2V, LBO#≥VDD-0.2V Device selected; 4.0ns cycle(250MHz) Output Open ICC5 Stall Current CKE#≥VIH 4.4ns cycle(225MHz) VI≤VSS+0.2V or 5.0ns cycle(200MHz) VI≥VDDQ-0.2V Note17.*VILmin is –1.0V and VIH max is VDDQ+1.0V in case of AC(Pulse width≤2ns). Note18."Device Deselected" means device is in power-down mode as defined in the truth table. ICC3 CMOS Standby Current (CLK stopped standby mode) V V µA µA mA mA 20 mA 20 mA 70 60 mA 50 8 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM CAPACITANCE Symbol Parameter CI CO Limits Conditions Input Capacitance Min Typ Unit 6 8 VI=GND, VI=25mVrms, f=1MHz Input / Output(DQ) Capacitance Note19.This parameter is sampled. Max VO=GND, VO=25mVrms, f=1MHz pF pF THERMAL RESISTANCE Symbol Parameter θJA θJC Limits Conditions Thermal Resistance Junction Ambient TBD Thermal Resistance Junction to Case Note20.This parameter is sampled. TBD Min Typ Max TBD TBD Unit °C/W °C/W AC ELECTRICAL CHARACTERISTICS (Ta=0~70°C, VDD=2.375~2.625V, unless otherwise noted) (1)MEASUREMENT CONDITION Input pulse levels ········································ VIH=VDDQ, VIL=0V Input rise and fall times ······························· faster than or equal to 1V/ns Input timing reference levels ······················· VIH=VIL=0.5*VDDQ Output reference levels ·······························VIH=VIL=0.5*VDDQ Output load ·················································· Fig.1 30pF (Including wiring and JIG) Q ZO=50Ω 50Ω VT =0.5*VDDQ Fig.1 Output load Input Waveform VDDQ / 2 toff tplh Output Waveform Input Waveform VDDQ / 2 VDDQ / 2 tphl Vh Output Waveform (toff) Vl ton Vh-(0.2(Vh-Vz)) Vz+(0.2(Vh-Vz)) Vz 0.2(Vz-Vl) Vz-(0.2(Vz-Vl)) (ton) Fig.3 Tri-State measurement Fig.2 Tdly measurement Note21.Valid Delay Measurement is made from the VDDQ/2 on the input waveform to the VDDQ/2 on the output waveform. Input waveform should have a slew rate of faster than or equal to 1V/ns. Note22.Tri-state toff measurement is made from the VDDQ/2 on the input waveform to the output waveform moving 20% from its initial to final Value VDDQ/2. Note:the initial value is not VOL or VOH as specified in DC ELECTRICAL CHARACTERISTICS table. Note23. Tri-state ton measurement is made from the VDDQ/2 on the input waveform to the output waveform moving 20% from its initial Value VDDQ/2 to its final Value. Note:the final value is not VOL or VOH as specified in DC ELECTRICAL CHARACTERISTICS table. Note24.Clocks,Data,Address and control signals will be tested with a minimum input slew rate of faster than or equal to 1V/ns. 9 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM (2)TIMING CHARACTERISTICS Symbol Parameter Clock tKHKH Clock cycle time tKHKL Clock HIGH time tKLKH Clock LOW time Output times tKHQV Clock HIGH to output valid tKHQX Clock HIGH to output invalid tKHQX1 Clock HIGH to output in LOW-Z tKHQZ Clock HIGH to output in High-Z tGLQV G# to output valid tGLQX1 G# to output in Low-Z tGHQZ G# to output in High-Z Setup Times tAVKH Address valid to clock HIGH tckeVKH CKE# valid to clock HIGH tadvVKH ADV valid to clock HIGH tWVKH Write valid to clock HIGH tBVKH Byte write valid to clock HIGH (BWa#~BWd#) tEVKH Enable valid to clock HIGH (E1#,E2,E3#) tDVKH Data In valid clock HIGH Hold Times tKHAX Clock HIGH to Address don’t care tKHckeX Clock HIGH to CKE# don’t care tKHadvX Clock HIGH to ADV don’t care tKHWX Clock HIGH to Write don’t care tKHBX tKHEX tKHDX ZZ tZZS tZZREC Clock HIGH to Byte Write don’t care (BWa#~BWb#) Clock HIGH to Enable don’t care (E1#,E2,E3#) Clock HIGH to Data In don’t care 250MHz -25 Min Max Limits 225MHz -22 Min Max 200MHz -20 Min Max 4.0 1.5 1.5 4.4 1.6 1.6 5.0 1.8 1.8 2.6 0.5 0.5 0.5 2.6 2.6 0.0 2.8 0.6 0.6 0.6 2.8 2.8 0.0 2.6 ns ns ns 3.2 0.7 0.7 0.7 3.2 3.2 0.0 2.8 Unit 3.2 ns ns ns ns ns ns ns 0.8 0.8 0.8 0.8 0.8 0.8 0.8 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.2 1.2 1.2 1.2 1.2 1.2 1.2 ns ns ns ns ns ns ns 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 ns ns ns ns 0.5 0.5 0.5 ns 0.5 0.5 0.5 0.5 0.5 0.5 ns ns ZZ standby 2*tKHKH 2*tKHKH ZZ recovery 2*tKHKH 2*tKHKH Note25.All parameter except tZZS, tZZREC in this table are measured on condition that ZZ=LOW fix. Note26.Test conditions is specified with the output loading shown in Fig.1 unless otherwise noted. Note27. tKHQX1, tKHQZ, tGLQX1, tGHQZ are sampled. Note28.LBO# is static and must not change during normal operation. 2*tKHKH 2*tKHKH ns ns 10 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM (3)READ TIMING tKHKH CLK tKHKL tKLKH tckeVKH tKHckeX CKE# tEVKH tKHEX E# tadvVKH tKHadvX ADV tWVKH tKHWX W# BWx# tAVKH ADD tKHAX A1 A2 A3 tKHQX1 DQ tGLQV Q(A1) tKHQV Q(A2) Q(A2+1) Q(A2+2) Q(A2+3) tGHQZ tKHQX Q(A2) Q(A3) Q(A3+1) tKQXZ tGLQX1 G# Read A1 Read A2 Burst Read A2+1 Stall Burst Read Burst Read Burst Read A2+2 A2+3 A2 Deselect Continue Deselect Read A3 Burst Read Burst Read Burst Read A3+1 A3+2 A3+3 DON'T CARE UNDEFINED Note29.Q(An) refers to output from address An. Q(An+1) refers to output from the next internal burst address following An. Note30. E# represents three signals. When E# is LOW, it represents E1# is LOW, E2 is HIGH and E3# is LOW. Note31.ZZ is fixed LOW . 11 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM (4)WRITE TIMING tKHKH CLK tKHKL tKLKH tckeVKH tKHckeX CKE# tEVKH tKHEX E# tadvVKH tKHadvX ADV tWVKH tKHWX W# tBVKH tKHBX BWx# tAVKH ADD tKHAX A1 A2 A3 A4 tDVKH tKHDX DQ D(A1) D(A2) D(A2+1) D(A2+3) D(A2) D(A3) D(A4) D(A4+1) G# Write A1 Write A2 Burst Write A2+1 NOP Burst Write A2+3 Write A2 Write A3 NOP Write A4 Burst Write A4+1 Stall Burst Write Burst Write A4+2 A4+3 DON'T CARE UNDEFINED Note32.Q(An) refers to output from address An. Q(An+1) refers to output from the next internal burst address following An. Note33. E# represents three signals. When E# is LOW, it represents E1# is LOW, E2 is HIGH and E3# is LOW. Note34.ZZ is fixed LOW. 12 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM (5)READ/WRITE TIMING tKHKH CLK tKHKL tKLKH tckeVKH tKHckeX CKE# tEVKH tKHEX E# tadvVKH tKHadvX ADV tWVKH tKHWX W# tBVKH tKHBX BWx# tAVKH ADD tKHAX A1 A2 A2 A3 A3 A4 A5 tDVKH tKHQX1 tKHDX DQ Q(A1) tKHQV D(A2) Q(A2) D(A3) D(A3+1) Q(A3) Q(A3+1) D(A4) Q(A5) tKHQV G# Read A1 Write A2 Read A2 Write A3 Burst Write A3+1 Read A3 Burst Read A3+1 Deselect Write A4 Stall Read A5 DON'T CARE Burst Read Burst Read A5+1 A5+2 UNDEFINED Note35.Q(An) refers to output from address An. Q(An+1) refers to output from the next internal burst address following An. Note36. E# represents three signals. When E# is LOW, it represents E1# is LOW, E2 is HIGH and E3# is LOW. Note37.ZZ is fixed LOW. 13 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM (6)SNOOZE MODE TIMING CLK tZZS tZZREC ZZ All Inputs (except ZZ) DESELECT or READ only Q Snooze Mode 14 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM JTAG PORT OPERATION Overview The JTAG Port on this SRAM operates in a manner consistent with IEEE Standard 1149.1-1990, a serial boundary scan interface standard (commonly referred to as JTAG), but dose not implement all of the function required for 1149.1 compliance. The JTAG Port interfaces with conventional CMOS logic level signaling. Disabling the JTAG port It is possible to use this device without utilizing the JTAG port. The port is reset at power-up and will remain inactive unless clocked. To assure normal operation of the SRAM with the JTAG Port unused, the TCK, TDI and TMS pins may be left floating or tied to High. The TDO pin should be left unconnected. JTAG Pin Description Test Clock (TCK) The TCK input is clock for all TAP events. All inputs are captured on the rising edge of TCK and the Test Data Out (TDO) propagates from the falling edge of TCK. Test Mode Select (TMS) The TMS input is sampled on the rising edge of TCK. This is the command input for the TAP Controller state machine. An undriven TMS input will produce the same result as a logic one input level. Test Data In (TDI) The TDI input is sampled on the rising edge of TCK. This is the input side of the serial registers placed between the TDI and TDO pins. the register placed between the TDI and TDO pins is determined by the state of the TAP Controller state machine and the instruction that is currently loaded in the TAP Instruction Resister (refer to the TAP Controller State Diagram). An undriven TDI Input will produce the same result as a logic one input level. Test Data Out (TDO) The TDO output is active depending on the state of the TAP Controller state machine. Output changes in response to the falling edge of TCK. This is the output side of the serial registers placed between the TDI and TDO pins. Note: This device dose not have a TRST (TAP Reset) pin. TRST is optional in IEEE 1149.1. The Test-Logic-Reset state is entered while TMS is held high for five rising edges of TCK. The TAP Controller is also reset automatically at power-up. JTAG Port Registers Overview The various JTAG registers, referred to as Test Access Port or TAP Registers, are selected (one at a time) via the sequence of 1s and 0s applied to TMS as TCK is strobed. Each of TAP Registers are serial shift registers that capture serial input data on the rising edge of TCK and push serial data out on the next falling edge of TCK. When a register is selected, it is placed between the TDI and TDO pins. Instruction Register The Instruction Register holds the instructions that are executed by the TAP Controller when it is moved into the Run-Test/Idle, or the various data register states. Instructions are 3 bits long. The Instruction Resister can be loaded when it is placed between the TDI and TDO pins. The Instruction Resister is automatically preloaded with the IDCODE instruction at power-up or whenever the controller is placed in Test-Logic-Reset state. 15 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM Bypass Register The Bypass resister is a single-bit register that can be placed between the TDI and TDO pins. It allows serial test data to be passed through the SRAM's JTAG Port to another device in the scan chain with as little delay as possible. Boundary Scan Register The Boundary Scan Register is a collection of flip flops that can be preset by the logic level found on the SRAM's input or I/O pins. The flip flops are then daisy chained together so the levels found can be shifted serially out of the JTAG Port's TDO pins. The relationship between the device pins and the bits in the Boundary Scan Register is described in the Scan Order Table following. The Boundary Scan Register, under the control of the TAP Controller, is loaded with the contents of the SRAM's I/O ring when the controller is in the Capture-RD state and then is placed between the TDI and TDO pins when the controller is moved to the Shift-DR state. SAMPLE-Z, SAMPLE/PRELOAD and EXTEST instruction can be used to activate the Boundary Scan Register. Identification (ID) Register The ID register is a 32-bit register that is loaded with a device and vender specific 32-bit code when the controllers put in the Capture-DR state with the IDCODE Instruction loaded in the Instruction Register. The code is loaded from 32-bit on-chip ROM. It describes various attributes of the SRAM (see page 20). The register is then placed between the TDI and TDO pins when the controller is moved into Shift-DR state. Bit 0 in the register is the LSB and the first to reach the TDO pin when shifting begins. TAP Controller Instruction Set Overview There are two classes of instructions defined in the Standard 1149.1-1990; standard (Public) instructions, and device specific (Private) instructions. Some public instructions are mandatory for 1149.1 compliance. Optional Public instructions must be implemented in prescribed ways. The TAP Controller in this device is not fully 1194.1-compliant because some of the mandatory 1149.1 instructions are not fully implemented. The TAP on this device may be used to monitor all input and I/O pads. This device will not perform INTEST or PRELOAD portion of the SAMPLE/PRELOAD command. When the TAP controller is placed in the Shift-IR state, the Instruction Register is placed between the TDI and TDO pins. In this state the desired instruction is serially loaded through the TDI input (while the previous contents are shifted out at the TDO output). For all instructions, the TAP executes newly loaded instructions only when the controller is moved to the Update-IR state. The TAP Instruction Set for this device is listed in the following table. Instruction Descriptions BYPASS When the BYPASS instruction is loaded in the Instruction Register, the Bypass Register is placed between the TDI and TDO pins. This occurs when the TAP Controller is moved to the Shift-DR state. This allows the board level scan path to be shortened to facilitate testing of other devices in the scan path. SAMPLE/PRELOAD SAMPLE/PRELOAD is a Standard1149.1 mandatory public instruction. When the SAMPLE/PRELOAD instruction is loaded in the Instruction Register, moving the TAP Controller into the Capture-DR state loads the data in the SRAM's input and I/O buffers into the Boundary Scan Register. Because the SRAM clock is independent from the TAP Clock (TCK) it is possible for the TAP to attempt to capture the I/O ring contents while the input buffers are in transition (i.e. in a metastable state). Although allowing the TAP to sample metastable inputs will not harm the device, repeatable results cannot be expected. SRAM input signals must be stabilized for long enough to meet the TAP's input data capture set-up plus hold time (tTS plus tTH). The SRAM's clock inputs need not be paused for any other TAP operation except capturing the I/O ring contents into the Boundary Scan Register. Moving the controller to the Shift-DR state then places the Boundary Scan Register between the TDI and TDO pins. Because the PRELOAD portion of the command is not implemented in this device, moving the controller to the Update-DR state with the SAMPLE/PRELOAD instruction loaded in the Instruction Register has the same effect as the Pause-DR command. This functionality is not Standard 1149.1 compliant. 16 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM EXTEST EXTEST is an IEEE 1149.1 mandatory public instruction. It is to be executed whenever the Instruction Register is loaded with all logic 0s. EXTEST is not implemented in the TAP Controller, and therefore this device is not compliant to the 1149.1 Standard. When the EXTEST instruction is loaded into the Instruction Register, the device responds as if the SAMPLE/PRELOAD instruction has been loaded. There is one difference between the two instructions. Unlike the SAMPLE/PRELOAD instruction, EXTEST place the SRAM outputs in a High-Z state. IDCODE The IDCODE instruction cause the ID ROM to be loaded into the ID register when the controller is in the Capture-DR state and places the ID Register between the TDI and TDO pins in the Shift-DR state. The IDCODE instruction is the default instruction loaded in at power-up and any time the controller is placed in the Test-Logic-Reset state. SAMPLE-Z If the SAMPLE-Z instruction is loaded in the Instruction Register, all SRAM outputs are forced to an inactive drive state (High-Z) and the Boundary Scan Register is placed between the TDI and TDO pins when the TAP Controller is moved to the Shift-DR state. RFU These instructions are reserved for future use. Do not use these instructions. JTAG TAP BLOCK DIAGRAM Bypass Register 0 Instruction Register 2 1 0 TDI Identification Register TDO 31 30 29 . . . . . . . . 2 1 0 Boundary Scan Register .. .............. .. 2 1 0 TMS TCK Test Access Port (TAP) Controller BOUNDARY SCAN ORDER TBD 17 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM JTAG TAP CONTROLLER STATE DIAGRAM Test-Logic-Reset 1 0 Run-Test/Idle 1 Select-DR-Scan 0 1 Select-IR-Scan 0 1 0 1 Capture-DR 0 Capture-IR 0 Shift-DR Shift-IR 0 1 1 0 1 1 Exit1-DR Exit1-IR 0 0 Pause-DR Pause-IR 0 1 Exit2-DR 0 0 1 Exit2-IR 1 0 1 Update-DR 1 1 Update-IR 0 1 0 TAP CONTROLLER DC ELECTRICAL CHARACTERISTICS (Ta=0~70°C, VDD=2.375~2.625V, unless otherwise noted) Limits Min Max VIHT Test Port Input High Voltage 0.65*VDDQ VDDQ+0.3 ** VILT Test Port Input Low Voltage -0.3 ** 0.35*VDDQ VOHT Test Port Output High Voltage IOH=-100µA VDDQ-0.1 VOLT Test Port Output Low Voltage IOL=+100µA 0.1 IINT TMS, TCK and TDI Input Leakage Current -10 10 IOLT TDO Output Leakage Current Output Disable, VOUT=0V~VDDQ -10 10 Note38. **Input Undershoot/Overshoot voltage must be -1V<Vi<VDDQ+1V with a pulse width not to exceed 20% tTCK. Symbol Parameter Condition Unit V V V V µA µA 18 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM TAP CONTROLLER AC ELECTRICAL CHARACTERISTICS (Ta=0~70°C, VDD=2.375~2.625V, unless otherwise noted) (1)MEASUREMENT CONDITION Input pulse levels ········································ VIH=VDDQ, VIL=0V Input rise and fall times ······························· faster than or equal to 1V/ns Input timing reference levels ······················· VIH=VIL=0.5*VDDQ Output reference levels ·······························VIH=VIL=0.5*VDDQ Output load ·················································· Fig.4 30pF (Including wiring and JIG) Q ZO=50Ω 50Ω VT =0.5*VDDQ Fig.4 Output load (2)TIMING CHARACTERISTICS Symbol Limits Min Max 20 50 20 20 10 10 20 Parameter tTF tTKC tTKH tTKL tTS tTH tTKQ TCK Frequency TCK Cycle Time TCK High Pulse Width TCK Low Pulse Width TDI, TMS setup time TDI, TMS hold time TCK Low to TDO valid Unit MHz ns ns ns ns ns ns (3) TIMING tTKC tTKH tTKL TCK tTS tTH TMS tTS tTH TDI tTKQ TDO 19 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM JTAG TAP INSTRUCTION SET SUMMARY Instruction Code EXTEST 000 IDCODE 001 SAMPLE-Z 010 RFU 011 SAMPLE/PRELOAD 100 RFU RFU BYPASS 101 110 111 Description Captures I/O ring contents. Places the Boundary Scan Register between TDI and TDO. Forces all SRAM outputs to High-Z state. This instruction is not 1149.1-compliant. Preloads ID Register and places it between TDI and TDO Captures I/O ring contents. Places the Boundary Scan Register between TDI and TDO. Forces all Data output drivers to High-Z Do not use this instruction; Reserved for Future Use. Captures I/O ring contents. Places the Boundary Scan Register between TDI and TDO. This instruction dose not implement 1149.1 preload function and is therefore not 1149.1-compliant. Do not use this instruction; Reserved for Future Use. Do not use this instruction; Reserved for Future Use. Places the BYPASS Register between TDI and TDO. STRUCTURE OF IDENTIFICATION REGISTER Revision Bit No. 31 M5M5T5636 30 0 0 29 Device Information Capacity Function VDD 28 27 26 25 24 0 0 0 0 1 0 23 22 21 20 19 18 1 0 1 0 1 0 17 Width 16 15 Gen. 14 13 12 0 0 1 1 0 0 MSB JEDEC Vendor Code of MITSUBISHI 11 10 9 8 7 6 0 0 0 0 0 0 5 4 3 2 1 0 1 1 1 0 0 1 LSB Note39. Bit of Device Information “Gen.(Generation)” means Bit No. 1st Generation 2nd Generation 3rd Generation 13 0 0 1 12 0 1 0 Note40. Bit of Device Information ”Width” means Bit No. X16 X18 X32 X36 X64 X72 16 0 0 0 0 1 1 15 0 0 1 1 0 0 14 0 1 0 1 0 1 Note41. Bit of Device Information ”Function” means Bit No. Network SRAM PB 20 0 0 19 1 0 18 0 0 17 0 1 Note42. Bit of Device Information ”Capacity” means Bit No. 1M or 1.15M 2M or 2.3M 4M or 4.5M 8M or 9M 16M or 18M 32M or 36M 24 0 0 0 0 0 0 23 0 0 0 1 1 1 22 0 1 1 0 0 1 21 1 0 1 0 1 0 Note43. Bit of Device Information ”VDD” means Bit No. 3.3V 2.5V 1.8V 1.5V 27 0 0 0 0 26 0 0 1 1 25 0 1 0 1 20 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM PACKAGE OUTLINE 165(11x15) bump Ball Grid Array(BGA) Pin Pitch 1.00mm Refer to JEDEC Standard MO-216, Variation CAB-1, which can be seen at: http://www.jedec.org/download/search/MO-216c.pdf 21 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 MITSUBISHI LSIs M5M5T5636UG – 25,22,20 18874368-BIT(524288-WORD BY 36-BIT) NETWORK SRAM REVISION HISTORY • Mar/16/2001 REV.0.0 First revision • Mar/30/2001 Changed VDD to VDDQ about specification associated with VI/VO in electrical characteristics. REV.0.1 22 MITSUBISHI ELECTRIC Advanced Information M5M5T5636UG REV.0.1 Keep safety first in your circuit designs! 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