FAIRCHILD FDZ7064S

FDZ7064S
30V N-Channel PowerTrench SyncFETTM BGA MOSFET
General Description
Features
This MOSFET is designed to replace a single MOSFET
and parallel Schottky diode in synchronous DC:DC power
supplies. Combining Fairchild’s 30V PowerTrench
SyncFET process with state of the art BGA packaging, the
FDZ7064S minimizes both PCB space and RDS(ON). This
BGA SyncFET embodies a breakthrough in both packaging
and power MOSFET integration which enables the device
to combine excellent thermal transfer characteristics, high
current handling capability, ultra-low profile packaging, low
gate charge, ultra-low reverse recovery charge and low
RDS(ON).
• 13.5 A, 30 V. RDS(ON) = 7 mΩ @ VGS = 10 V
• Occupies only 14 mm2 of PCB area. Only 42% of the
area of SO-8
• Ultra-thin package: less than 0.8 mm height when
mounted to PCB
• 3.5 x 4 mm2 Footprint
Applications
• High power and current handling capability.
• DC/DC converters
D
D
D
D
D
D
D
S
S
S
S
D
D
S
S
S
S
D
D
S
S
S
S
D
D
G
S
S
S
D
Pin 1
G
S
Top
Bottom
Absolute Maximum Ratings
TA=25oC unless otherwise noted
Symbol
Parameter
VDSS
VGSS
ID
Drain-Source Voltage
Gate-Source Voltage
Drain Current – Continuous
(Note 1a)
– Pulsed
Power Dissipation (Steady State)
(Note 1a)
Operating and Storage Junction Temperature Range
PD
TJ, Tstg
D
F7064S
Pin 1
RDS(ON) = 9 mΩ @ VGS = 4.5 V
Ratings
Units
30
±16
13.5
60
2.2
–55 to +150
V
V
A
W
°C
Thermal Characteristics
R R R Thermal Resistance, Junction-to-Ambient
Thermal Resistance, Junction-to-Ball
Thermal Resistance, Junction-to-Case
(Note 1a)
(Note 1)
(Note 1)
56
4.5
0.6
°C/W
Package Marking and Ordering Information
Device Marking
7064S
2004 Fairchild Semiconductor Corporation
Device
FDZ7064S
Reel Size
13”
Tape width
12mm
Quantity
3000
FDZ7064S Rev. B2 (W)
FDZ7064S
May 2004
Symbol
TA = 25°C unless otherwise noted
Parameter
Test Conditions
Min
Typ
Max
Units
Off Characteristics
BVDSS
∆BVDSS
∆TJ
IDSS
Drain–Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
ID = 10mA, Referenced to 25°C
VGS = 0 V
500
uA
IGSS
Gate–Body Leakage
VGS = ±16 V, VDS = 0 V
±100
nA
3
V
On Characteristics
VGS(th)
∆VGS(th)
∆TJ
RDS(on)
gFS
VGS = 0 V,
VDS = 24 V,
ID = 1mA
30
V
26
mV/°C
(Note 2)
Gate Threshold Voltage
VDS = VGS,
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
Forward Transconductance
ID = 1mA
1
1.4
ID = 10mA, Referenced to 25°C
–0.5
VGS = 10 V, ID = 13.5 A
VGS = 4.5 V, ID = 12 A
VGS=10 V, ID=13.5A, TJ =125°C
mV/°C
VDS = 5 V,
ID = 13.5 A
6
7
9
66
7
9
11
VDS = 15 V,
f = 1.0 MHz
V GS = 0 V,
2840
pF
525
pF
190
pF
VGS = 15 mV, ID = 6 A
1.9
Ω
VDS = 15 V,
VGS = 10 V,
11
20
ns
12
22
ns
ns
mΩ
S
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
RG
Gate Resistance
Switching Characteristics
(Note 2)
td(on)
Turn–On Delay Time
tr
Turn–On Rise Time
td(off)
Turn–Off Delay Time
50
80
tf
Turn–Off Fall Time
18
32
ns
Qg
Total Gate Charge
25
35
nC
Qgs
Gate–Source Charge
Qgd
Gate–Drain Charge
VDS = 15 V,
VGS = 5 V
ID = 1 A,
RGEN = 6 ID = 13.5 A,
7
nC
6
nC
Drain–Source Diode Characteristics
VSD
trr
Drain–Source Diode Forward
Voltage
Diode Reverse Recovery Time
Qrr
Diode Reverse Recovery Charge
VGS = 0 V,
IS = 3.2 A
0.4
(Note 1)
IF = 13.5 A, diF/dt = 300 A/µs
See Diode Characteristic, page
5
0.7
V
22
ns
19
nC
Notes:
1. R is determined with the device mounted on a 1 in² 2 oz. copper pad on a 1.5 x 1.5 in. board of FR-4 material. The thermal resistance from the junction to
the circuit board side of the solder ball, R , is defined for reference. For R , the thermal reference point for the case is defined as the top surface of the
copper chip carrier. R and R are guaranteed by design while R is determined by the user'
s board design.
a)
56°C/W when
mounted on a 1in2 pad
of 2 oz copper
b)
119°C/W when mounted on
a minimum pad of 2 oz
copper
Scale 1 : 1 on letter size paper
2.
Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%
2004 Fairchild Semiconductor Corporation
FDZ7064S Rev. B2 (W)
FDZ7064S
Electrical Characteristics
FDZ7064S
Typical Characteristics
60.00
2.25
ID, DRAIN CURRENT (A)
50.00
3.0V
3.5V
6.0V
40.00
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
VGS=10.0
V
4.5V
2.5V
30.00
20.00
10.00
2.0V
0.00
0.00
VGS = 2.5V
2
1.75
3.0V
1.5
3.5V
1.25
4.5V
6.0V
10.0V
1
0.75
0.25
0.50
0.75
1.00
1.25
1.50
0
10
20
VDS, DRAIN-SOURCE VOLTAGE (V)
30
40
50
60
ID, DRAIN CURRENT (A)
Figure 1. On-Region Characteristics.
Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
1.60
40
RDS(ON), ON-RESISTANCE (MILLIOHM)
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
ID = 13.5A
VGS = 10V
1.40
1.20
1.00
0.80
ID =6.8A
30
20
TA = 125oC
10
TA = 25oC
0
0.60
-50
-25
0
25
50
75
100
125
0
150
2
4
6
8
10
VGS, GATE TO SOURCE VOLTAGE (V)
TJ, JUNCTION TEMPERATURE (oC)
Figure 3. On-Resistance Variation with
Temperature.
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
100
60
IS, REVERSE DRAIN CURRENT (A)
VDS = 5V
50
ID, DRAIN CURRENT (A)
4.0V
40
30
o
TA = 125 C
o
25 C
20
10
-55oC
0
VGS = 0V
10
TA = 125oC
1
25oC
0.1
-55oC
0.01
0.001
0.0001
1
1.5
2
2.5
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics.
3
0
0.2
0.4
0.6
0.8
VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 6. Body Diode Forward Voltage Variation
with Source Current and Temperature.
FDZ7064S Rev B2 (W)
FDZ7064S
Typical Characteristics
4000
ID = 13.5A
f = 1MHz
VGS = 0 V
8
VDS = 10V
6
CAPACITANCE (pF)
VGS, GATE-SOURCE VOLTAGE (V)
10
15V
4
20V
2
3000
Ciss
2000
Coss
1000
Crss
0
0
0
10
20
30
40
0
50
5
Figure 7. Gate Charge Characteristics.
20
50
100
P(pk), PEAK TRANSIENT POWER (W)
RDS(ON) LIMIT
ID, DRAIN CURRENT (A)
15
Figure 8. Capacitance Characteristics.
1000
1ms
10ms
10
100ms
1s
10s
1
VGS = 10V
SINGLE PULSE
RθJA = 119oC/W
0.1
DC
TA = 25oC
0.01
0.01
0.1
1
10
SINGLE PULSE
RθJA = 119°C/W
TA = 25°C
40
30
20
10
0
0.01
100
0.1
1
10
100
1000
t1, TIME (sec)
VDS, DRAIN-SOURCE VOLTAGE (V)
Figure 9. Maximum Safe Operating Area.
r(t), NORMALIZED EFFECTIVE TRANSIENT
THERMAL RESISTANCE
10
VDS, DRAIN TO SOURCE VOLTAGE (V)
Qg, GATE CHARGE (nC)
Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
RθJA(t) = r(t) * RθJA
RθJA = 119 °C/W
0.2
0.1
0.1
P(pk)
0.05
t1
0.02
0.01
0.01
SINGLE PULSE
0.001
0.001
0.01
t2
TJ - TA = P * RθJA(t)
Duty Cycle, D = t1 / t2
0.1
1
10
100
1000
t1, TIME (sec)
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1b.
Transient thermal response will change depending on the circuit board design.
FDZ7064S Rev B2 (W)
FDZ7064S
Typical Characteristics
SyncFET Diode Characteristics
Schottky barrier diodes exhibit significant leakage at
high temperature and high reverse voltage. This will
increase the power in the device.
IDSS, REVERSE LEAKAGE CURRENT (A)
CURRENT : 0.4A/div
Fairchild’s SyncFET process embeds a Schottky diode
in parallel with PowerTrench MOSFET. This diode
exhibits similar characteristics to a discrete external
Schottky diode in parallel with a MOSFET. Figure 12
FDZ7064S.
0.1
TA = 125oC
0.01
TA = 100oC
0.001
0.0001
TA = 25oC
0.00001
0
5
10
15
20
25
30
VDS, REVERSE VOLTAGE (V)
Figure 14. SyncFET diode reverse leakage
versus drain-source voltage and
temperature.
Figure 12. FDZ7064S SyncFET body diode
reverse recovery characteristic.
CURRENT : 0.4A/div
For comparison purposes, Figure 13 shows the reverse
recovery characteristics of the body diode of an
equivalent size MOSFET produced without SyncFET .
Figure 13. Non-SyncFET (FDZ7064N) body
diode reverse recovery characteristic.
FDZ7064S Rev B2 (W)
FDZ7064S
Dimensional Outline and Pad Layout
FDZ7064S Rev B2 (W)
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PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
2. A critical component is any component of a life
1. Life support devices or systems are devices or
support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
the body, or (b) support or sustain life, or (c) whose
support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I11