STGD3NB60SD ® N-CHANNEL 3A - 600V DPAK Power MESH IGBT PRELIMINARY DATA TYPE VCES V CE(sat) IC STGD3NB60SD 600 V < 1.5 V 3A ■ ■ ■ ■ ■ ■ HIGH INPUT IMPEDANCE (VOLTAGE DRIVEN) VERY LOW ON-VOLTAGE DROP (Vcesat) HIGH CURRENT CAPABILITY OFF LOSSES INCLUDE TAIL CURRENT INTEGRATED FREEWHEELING DIODE SURFACE-MOUNTING DPAK (TO-252) POWER PACKAGE IN TAPE & REEL (SUFFIX "T4") 3 1 DPAK TO-252 (Suffix "T4") DESCRIPTION Using the latest high voltage technology based on a patented strip layout, STMicroelectronics has designed an advanced family of IGBTs, the PowerMESH IGBTs, with outstanding perfomances. The suffix "S" identifies a family optimized to achieve minimum on-voltage drop for low frequency applications (<1kHz). INTERNAL SCHEMATIC DIAGRAM APPLICATIONS GAS DISCHARGE LAMP ■ STATIC RELAYS ■ MOTOR CONTROL ■ ABSOLUTE MAXIMUM RATINGS Symbol Parameter V CES Collector-Emitter Voltage (V GS = 0) V GE Gate-Emitter Voltage o IC Collector Current (continuous) at T c = 25 C IC o ICM (•) P tot Collector Current (continuous) at T c = 100 C Tj Unit 600 V ± 20 V 6 A 3 A Collector Current (pulsed) 25 A Total Dissipation at T c = 25 o C 48 W 0.32 W/ o C Derating Factor T stg Value Storage Temperature Max. Operating Junction Temperature -65 to 175 o C 175 o C (•) Pulse width limited by safe operating area March 2000 1/8 STGD3NB60SD THERMAL DATA R thj-case R thj-amb R thc-sink Thermal Resistance Junction-case Thermal Resistance Junction-ambient Thermal Resistance Case-sink o 3.125 100 1.5 Max Max Typ C/W C/W o C/W o ELECTRICAL CHARACTERISTICS (Tj = 25 oC unless otherwise specified) OFF Symbol Parameter Test Conditions Collector-Emitter Breakdown Voltage I C = 250 µA I CES Collector cut-off (V GE = 0) V CE = Max Rating V CE = Max Rating IGES Gate-Emitter Leakage Current (V CE = 0) V GE = ± 20 V V BR(CES) V GE = 0 Min. Typ. Max. 600 Unit V 10 100 µA µA ± 100 nA Max. Unit 5 V 1 1.2 1.1 1.5 V V V Min. Typ. Max. Unit 1.7 2.5 T j = 25 o C T j = 125 o C V CE = 0 ON (∗) Symbol V GE(th) V CE(SAT) Parameter Test Conditions I C = 250 µA Gate Threshold Voltage V CE = V GE Collector-Emitter Saturation Voltage V GE = 15 V V GE = 15 V V GE = 15 V Min. Typ. 2.5 I C = 1.5 A IC = 3 A IC = 3 A T j = 125 o C DYNAMIC Symbol gf s Parameter Test Conditions Forward Transconductance V CE =25 V IC = 3 A C ies C oes C res Input Capacitance Output Capacitance Reverse Transfer Capacitance V CE = 25 V f = 1 MHz QG Q GE Q GC Total Gate Charge Gate-Emitter Charge Gate-Collector Charge V CE = 480 V Latching Current V clamp = 480 V T j = 150 o C I CL IC = 3 A V GE = 0 255 30 5.6 V GE = 15 V 18 5.4 5.5 R G =1kΩ S 330 40 7 pF pF pF nC nC nC 12 A SWITCHING ON Symbol t d(on) tr (di/dt) on E on 2/8 Parameter Test Conditions Delay Time Rise Time V CC = 480 V V GE = 15 V IC = 3 A R G = 1kΩ Turn-on Current Slope V CC = 480 V R G = 1kΩ T j = 125 o C IC = 3 A V GE = 15 V Turn-on Switching Losses Min. Typ. Max. Unit 125 150 ns ns 50 A/µs 1100 µJ STGD3NB60SD ELECTRICAL CHARACTERISTICS (continued) SWITCHING OFF Symbol Parameter Test Conditions tc t r (v off ) td (of f ) tf E off (**) V CC = 480 V Cross-Over Time Off Voltage Rise Time R GE = 1 kΩ Delay Time Fall Time Turn-off Switching Loss tc t r (v off ) td (of f ) tf E off (**) V CC = 480 V Cross-Over Time Off Voltage Rise Time R GE = 1kΩ Delay Time T j = 125 o C Fall Time Turn-off Switching Loss Min. IC = 3 A V GE = 15 V IC = 3 A V GE = 15 V Typ. Max. Unit 1.8 1.0 3.4 0.72 1.15 µs µs µs µs mJ 2.8 1.45 3.6 1.2 1.8 µs µs µs µs mJ COLLECTOR-EMITTER DIODE Symbol Parameter Test Conditions If I fm Forward Current Forward Current pulsed Vf Forward On-Voltage If = 3 A If = 1 A Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current If = 3 A dI/dt = 100 A/µS t rr Q rr I rrm Min. Typ. 1.55 1.15 V R =200 V T j = 125 o C 1700 4500 9.5 Max. Unit 3 25 A A 1.9 V V ns nC A (•) Pulse width limited by max. junction temperature (∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 % (**)Losses Include Also The Tail (Jedec Standardization) Thermal Impedance 3/8 STGD3NB60SD Output Characteristics Transfer Characteristics Transconductance Collector-Emitter On Voltage vs Temperature Collector-Emitter On Voltage vs Collector Current Gate Threshold vs Temperature 4/8 STGD3NB60SD Normalized Breakdown Voltage vs Temperature Capacitance Variations Gate Charge vs Gate-Emitter Voltage Off Switching Losses vs Ic Off Switching Losses vs Tj Switching Off Safe Operatin Area 5/8 STGD3NB60SD Diode Forward vs Tj Diode Forward Voltage Fig. 1: Gate Charge test Circuit Fig. 2: Test Circuit For Inductive Load Switching Fig. 3: Switching Waveforms 6/8 STGD3NB60SD TO-252 (DPAK) MECHANICAL DATA mm DIM. MIN. inch TYP. MAX. MIN. TYP. MAX. A 2.2 2.4 0.086 0.094 A1 0.9 1.1 0.035 0.043 A2 0.03 0.23 0.001 0.009 B 0.64 0.9 0.025 0.035 B2 5.2 5.4 0.204 0.212 C 0.45 0.6 0.017 0.023 C2 0.48 0.6 0.019 0.023 D 6 6.2 0.236 0.244 E 6.4 6.6 0.252 0.260 G 4.4 4.6 0.173 0.181 H 9.35 10.1 0.368 0.397 L2 0.8 L4 0.031 0.6 1 0.023 0.039 A1 C2 A H A2 C DETAIL "A" L2 D = 1 = G 2 = = = E = B2 3 B DETAIL "A" L4 0068772-B 7/8 STGD3NB60SD Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. 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