STMICROELECTRONICS STW12NA60

STH12NA60/FI
STW12NA60
N - CHANNEL ENHANCEMENT MODE
FAST POWER MOS TRANSISTOR
TYPE
STH12NA60
STH12NA60FI
STW12NA60
■
■
■
■
■
■
■
V DSS
R DS( on)
ID
600 V
600 V
600 V
< 0.6 Ω
< 0.6 Ω
< 0.6 Ω
12 A
7A
12 A
TO-247
TYPICAL RDS(on) = 0.44 Ω
± 30V GATE TO SOURCE VOLTAGE RATING
100% AVALANCHE TESTED
REPETITIVE AVALANCHE DATA AT 100oC
LOW INTRINSIC CAPACITANCES
GATE GHARGE MINIMIZED
REDUCED THRESHOLD VOLTAGE SPREAD
3
2
1
3
3
DESCRIPTION
This series of POWER MOSFETS represents the
most advanced high voltage technology. The optimized cell layout coupled with a new proprietary
edge termination concur to give the device low
RDS(on) and gate charge, unequalled ruggedness
and superior switching performance.
2
2
1
TO-218
ISOWATT218
1
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
HIGH CURRENT, HIGH SPEED SWITCHING
■
SWITCH MODE POWER SUPPLIES (SMPS)
■
DC-AC CONVERTERS FOR WELDING
EQUIPMENT AND UNINTERRUPTIBLE
POWER SUPPLIES AND MOTOR DRIVE
■
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
STH/STW12NA60
VD S
V DG R
V GS
Unit
STH12NA60FI
Drain-source Voltage (V GS = 0)
600
V
Drain- gate Voltage (R GS = 20 kΩ)
600
V
± 30
V
Gate-source Voltage
o
ID
Drain Current (continuous) at T c = 25 C
12
7
A
ID
Drain Current (continuous) at T c = 100 oC
7.6
4.4
A
Drain Current (pulsed)
48
48
A
Total Dissipation at Tc = 25 C
190
80
W
Derating Factor
1.52
0.64
W/o C

4000
ID M(•)
P tot
V ISO
T stg
Tj
o
Insulation Withstand Voltage (DC)
Storage Temperature
Max. Operating Junction Temperature
V
-65 to 150
o
C
150
o
C
(•) Pulse width limited by safe operating area
November 1996
1/11
STH12NA60/FI - STW12NA60
THERMAL DATA
TO-218/TO-247 ISOWATT218
R thj-cas e
Rthj- amb
Rt hc- sin k
Tl
Thermal Resistance Junction-case
Max
o
C/W
30
0.1
300
o
C/W
C/W
o
C
Max Value
Unit
0.66
1.56
Thermal Resistance Junction-ambient
Max
Thermal Resistance Case-sink
Typ
Maximum Lead Temperature For Soldering Purpose
o
AVALANCHE CHARACTERISTICS
Symbol
Parameter
IA R
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by T j max, δ < 1%)
12
A
E AS
Single Pulse Avalanche Energy
(starting T j = 25 o C, ID = I AR, VD D = 50 V)
700
mJ
E AR
Repetitive Avalanche Energy
(pulse width limited by T j max, δ < 1%)
28
mJ
IA R
Avalanche Current, Repetitive or Not-Repetitive
(T c = 100 o C, pulse width limited by T j max, δ < 1%)
7.6
A
o
ELECTRICAL CHARACTERISTICS (Tcase = 25 C unless otherwise specified)
OFF
Symbol
V( BR)DSS
Parameter
Drain-source
Breakdown Voltage
Test Conditions
I D = 250 µA
VG S = 0
I DS S
Zero Gate Voltage
V DS = Max Rating
Drain Current (V GS = 0) V DS = Max Rating x 0.8
IG SS
Gate-body Leakage
Current (V D S = 0)
Min.
Typ.
Max.
600
Unit
V
T c = 125 oC
V GS = ± 30 V
25
250
µA
µA
± 100
nA
ON (∗)
Symbol
Parameter
Test Conditions
V G S(th)
Gate Threshold Voltage V DS = V GS
ID = 250 µA
R DS( on)
Static Drain-source On
Resistance
V GS = 10V
ID = 6 A
I D( on)
On State Drain Current
V DS > ID( on) x RD S(on) max
V GS = 10 V
Min.
Typ.
Max.
Unit
2.25
3
3.75
V
0.44
0.6
Ω
12
A
DYNAMIC
Symbol
gfs (∗)
C iss
C oss
C rss
2/11
Parameter
Test Conditions
Forward
Transconductance
V DS > ID( on) x RD S(on) max
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V DS = 25 V
f = 1 MHz
ID = 6 A
VG S = 0
Min.
Typ.
8
12
2500
310
85
Max.
Unit
S
3250
410
110
pF
pF
pF
STH12NA60/FI - STW12NA60
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol
t d(on)
tr
(di/dt) on
Qg
Q gs
Q gd
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
35
50
ns
ns
Turn-on Time
Rise Time
V DD = 300 V I D = 6 A
V GS = 10 V
R G = 4.7 Ω
(see test circuit, figure 3)
25
35
Turn-on Current Slope
V DD = 480 V I D = 12 A
VGS = 10 V
R G = 47 Ω
(see test circuit, figure 5)
190
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
V DD = 480 V
ID = 12 A
VG S = 10 V
A/µs
110
15
47
150
nC
nC
nC
Typ.
Max.
Unit
35
20
57
50
30
80
ns
ns
ns
Typ.
Max.
Unit
12
48
A
A
1.6
V
SWITCHING OFF
Symbol
t r(Vof f)
tf
tc
Parameter
Off-voltage Rise Time
Fall Time
Cross-over Time
Test Conditions
Min.
V DD = 480 V
ID = 12 A
V GS = 10 V
R G = 4.7 Ω
(see test circuit, figure 5)
SOURCE DRAIN DIODE
Symbol
Parameter
Test Conditions
IS D
I SDM(•)
Source-drain Current
Source-drain Current
(pulsed)
V S D (∗)
Forward On Voltage
I SD = 12 A
Reverse Recovery
Time
Reverse Recovery
Charge
Reverse Recovery
Current
I SD = 12 A
di/dt = 100 A/µs
V DD = 100 V
T j = 150 o C
(see test circuit, figure 5)
t rr
Q rr
I RRM
Min.
VG S = 0
670
ns
12.7
µC
38
A
(∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safe operating area
Safe Operating Areas For TO-218 and TO-247
Safe Operating Areas For ISOWATT218
3/11
STH12NA60/FI - STW12NA60
Thermal Impedeance For TO-218 and TO-247
Thermal Impedance For ISOWATT218
Derating Curve For TO-218 and TO-247
Derating Curve For ISOWATT218
Output Characteristics
Transfer Characteristics
4/11
STH12NA60/FI - STW12NA60
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
Normalized Gate Threshold Voltage vs
Temperature
Normalized On Resistance vs Temperature
5/11
STH12NA60/FI - STW12NA60
Turn-on Current Slope
Turn-off Drain-source Voltage Slope
Cross-over Time
Switching Safe Operating Area
Accidental Overload Area
Source-drain Diode Forward Characteristics
6/11
STH12NA60/FI - STW12NA60
Fig. 1: Unclamped Inductive Load Test Circuits
Fig. 2: Unclamped Inductive Waveforms
Fig. 3: Switching Times Test Circuits For
Resistive Load
Fig. 4: Gate Charge Test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Reverse Recovery Time
7/11
STH12NA60/FI - STW12NA60
TO-247 MECHANICAL DATA
mm
DIM.
MIN.
A
TYP.
4.7
A1
inch
MAX.
MIN.
5.3
0.185
TYP.
MAX.
0.208
2.87
0.113
A2
1.5
2.5
0.059
0.098
b
1
1.4
0.039
0.055
b1
2.25
0.088
b2
3.05
3.43
0.120
0.135
C
0.4
0.8
0.015
0.031
D
20.4
21.18
0.803
0.833
e
5.43
5.47
0.213
0.215
E
15.3
15.95
0.602
0.628
L
15.57
L1
3.7
4.3
0.145
0.169
Q
5.3
5.84
0.208
0.230
ØP
3.5
3.71
0.137
0.146
A2
A1
A
C
0.613
D
b
L1
b1
Q
L
b2
E
e
ø
8/11
STH12NA60/FI - STW12NA60
TO-218 (SOT-93) MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
MAX.
A
4.7
4.9
0.185
0.193
C
1.17
1.37
0.046
0.054
D
2.5
0.098
E
0.5
0.78
0.019
0.030
F
1.1
1.3
0.043
0.051
G
10.8
11.1
0.425
0.437
H
14.7
15.2
0.578
0.598
L2
–
16.2
–
0.637
L3
18
L5
0.708
3.95
4.15
L6
0.155
0.163
31
1.220
–
12.2
–
0.480
Ø
4
4.1
0.157
0.161
D
C
A
E
R
L6
L5
H
G
L3
L2
F
Ø
R
1
2
3
P025A
9/11
STH12NA60/FI - STW12NA60
ISOWATT218 MECHANICAL DATA
mm
DIM.
MIN.
inch
MAX.
MIN.
A
5.35
TYP.
5.65
0.210
TYP.
0.222
MAX.
C
3.3
3.8
0.130
0.149
D
2.9
3.1
0.114
0.122
D1
1.88
2.08
0.074
0.081
E
0.45
1
0.017
0.039
F
1.05
1.25
0.041
0.049
G
10.8
11.2
0.425
0.441
H
15.8
16.2
0.622
0.637
L1
20.8
21.2
0.818
0.834
L2
19.1
19.9
0.752
0.783
L3
22.8
23.6
0.897
0.929
L4
40.5
42.5
1.594
1.673
L5
4.85
5.25
0.190
0.206
L6
20.25
20.75
0.797
0.817
M
3.5
3.7
0.137
0.145
N
2.1
2.3
0.082
0.090
U
4.6
0.181
L3
C
D1
D
A
E
N
L2
L6
F
L5
H
G
U
M
1
2
3
L1
L4
10/11
P025C
STH12NA60/FI - STW12NA60
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No
license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.
SGS-THOMSON Microelectronics products are not authorized for use as critical components in life support devices or systems without express
written approval of SGS-THOMSON Microelectonics.
 1996 SGS-THOMSON Microelectronics - Printed in Italy - All Rights Reserved
SGS-THOMSON Microelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - France - Germany - Hong Kong - Italy - Japan - Korea - Malaysia - Malta - Morocco - The Netherlands Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A
.
11/11