CENTRAL CP317_10

PROCESS
CP317
Small Signal Transistor
NPN - RF Transistor Chip
PROCESS DETAILS
Process
EPITAXIAL PLANAR
Die Size
14.5 x 14.5 MILS
Die Thickness
9.0 MILS
Base Bonding Pad Area
2.4 x 2.2 MILS
Emitter Bonding Pad Area
2.4 x 2.2 MILS
Top Side Metalization
Al - 30,000Å
Back Side Metalization
Au - 18,000Å
GEOMETRY
GROSS DIE PER 4 INCH WAFER
53,788
PRINCIPAL DEVICE TYPES
CMPT918
2N918
2N2857
2N5179
2N5770
BFY90
PN3563
PN3564
BACKSIDE COLLECTOR
R3 (22-March 2010)
w w w. c e n t r a l s e m i . c o m
PROCESS
CP317
Typical Electrical Characteristics
R3 (22-March 2010)
w w w. c e n t r a l s e m i . c o m