CENTRAL CP302

PROCESS
CP302
Small Signal Transistor
NPN - Silicon RF Transistor Chip
PROCESS DETAILS
Process
EPITAXIAL PLANAR
Die Size
14.5 x 14.5 MILS
Die Thickness
9.0 MILS
Base Bonding Pad Area
2.3 x 2.3 MILS
Emitter Bonding Pad Area
2.5 x 2.3 MILS
Top Side Metalization
Al - 30,000Å
Back Side Metalization
Au - 18,000Å
GEOMETRY
GROSS DIE PER 4 INCH WAFER
53,730
PRINCIPAL DEVICE TYPES
MPSH10
MPSH11
CMPTH10
CMPTH11
R3 (22-March 2010)
w w w. c e n t r a l s e m i . c o m
PROCESS
CP302
Typical Electrical Characteristics
R3 (22-March 2010)
w w w. c e n t r a l s e m i . c o m