FAIRCHILD 74F827

Revised February 2004
74F827 • 74F828
10-Bit Buffers/Line Drivers
General Description
Features
The 74F827 and 74F828 10-bit bus buffers provide high
performance bus interface buffering for wide data/address
paths or buses carrying parity. The 10-bit buffers have
NOR output enables for maximum control flexibility.
■ 3-STATE output
■ 74F828 is inverting
The 74F828 is an inverting version of the 74F827.
Ordering Code:
Order Number
74F827SC
(Note 1)
Package Number
Package Description
M24B
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide
74F827SPC
N24C
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
74F828SC
M24B
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide
74F828SPC
(Note 1)
N24C
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Note 1: Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagrams
74F827
© 2004 Fairchild Semiconductor Corporation
74F828
DS009598
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74F827 • 74F828 10-Bit Buffers/Line Drivers
April 1988
74F827 • 74F828
Logic Symbols
74F827
74F828
IEEE/IEC
74F827
IEEE/IEC
74F828
Unit Loading/Fan Out
Pin Names
Description
U.L.
Input IIH/IIL
HIGH/LOW
Output IOH/IOL
OE1, OE2
Output Enable Input
1.0/1.0
20 µA/−0.6 mA
D0–D7
Data Inputs
1.0/1.0
20 µA/−0.6 mA
O0–O7
Data Outputs, 3-STATE
600/106.6 (80)
−12 mA/64 mA (48 mA)
Functional Description
Function Table
The 74F827 and 74F828 are line drivers designed to be
employed as memory address drivers, clock drivers and
bus-oriented
transmitters/receivers
which
provide
improved PC board density. The devices have 3-STATE
outputs controlled by the Output Enable (OE) pins. The
outputs can sink 64 mA and source 15 mA. Input clamp
diodes limit high-speed termination effects.
Inputs
OE
Outputs
Dn
2
Function
74F828
L
H
H
L
Transparent
L
L
L
H
Transparent
H
X
Z
Z
High Z
H = HIGH Voltage level
L = LOW Voltage Level
Z = High Impedance
X = Immaterial
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On
74F827
74F827 • 74F828
Logic Diagrams
74F827
74F828
Please note that these diagrams are provided only for the understanding of logic operations and should not be used to estimate propagation delays.
3
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74F827 • 74F828
Absolute Maximum Ratings(Note 2)
Recommended Operating
Conditions
Storage Temperature
−65°C to +150 °C
Ambient Temperature under Bias
−55°C to +125 °C
Free Air Ambient Temperature
Junction Temperature under Bias
−55°C to +150 °C
Supply Voltage
0°C to +70°C
+4.5V to +5.5V
−0.5V to +7.0V
VCC Pin Potential to Ground Pin
Input Voltage (Note 3)
−0.5V to +7.0V
Input Current (Note 3)
−30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with VCC = 0V)
Standard Output
−0.5V to VCC
3-STATE Output
−0.5V to +5.5V
Note 2: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Current Applied to Output
in LOW State (Max)
Note 3: Either voltage limit or current limit is sufficient to protect inputs.
twice the rated IOL (mA)
DC Electrical Characteristics
Symbol
Parameter
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VCD
Input Clamp Diode Voltage
VOH
Min
Typ
Output HIGH
10% VCC
2.4
Voltage
10% VCC
2.0
5% VCC
2.7
VOL
Output LOW Voltage
10% VCC
IIH
Input HIGH
Input HIGH Current
Output HIGH
Input Leakage
Test
IOD
Circuit Current
Input LOW Current
IOZH
Output Leakage Current
IOZL
Output Leakage Current
IOS
Output Short-Circuit Current
IZZ
Bus Drainage Test
ICCH
Power Supply Current (74F827)
ICCL
ICCZ
0.8
V
−1.2
V
Min
IIN = −18 mA
V
Min
IOH = −15 mA
0.55
V
Min
IOL = 64 mA
5.0
µA
Max
VIN = 2.7V
7.0
µA
Max
VIN = 7.0V
50
µA
Max
VOUT = VCC
V
0.0
3.75
µA
0.0
−0.6
mA
Max
VIN = 0.5V
50
µA
Max
VOUT = 2.7V
4.75
Output Leakage
IIL
Conditions
Recognized as a HIGH Signal
Recognized as a LOW Signal
IOH = −3 mA
Leakage Current
VID
VCC
IOH = −3 mA
Breakdown Test
ICEX
Units
V
Current
IBVI
Max
2.0
IID = 1.9 µA
All Other Pins Grounded
VIOD = 150 mV
All Other Pins Grounded
−50
µA
Max
VOUT = 0.5V
−225
mA
Max
VOUT = 0V
500
µA
0.0V
VOUT = 5.25V
30
45
mA
Max
VO = HIGH
Power Supply Current (74F827)
60
90
mA
Max
VO = LOW
Power Supply Current (74F827)
40
60
mA
Max
VO = HIGH Z
ICCH
Power Supply Current (74F828)
14
20
mA
Max
VO = HIGH
ICCL
Power Supply Current (74F828)
56
85
mA
Max
VO = LOW
ICCZ
Power Supply Current (74F828)
35
50
mA
Max
VO = HIGH Z
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−100
4
Symbol
Parameter
TA = +25°C
TA = −55°C to +125°C
TA = 0°C to +70°C
VCC = +5.0V
VCC = +5.0V
VCC = +5.0V
CL = 50 pF
CL = 50 pF
CL = 50 pF
Min
Typ
Max
Min
Max
Min
tPLH
Propagation Delay
1.0
3.0
5.5
1.0
7.5
1.0
6.5
tPHL
Data to Output (74F827)
1.5
3.3
5.5
1.5
7.0
1.5
6.0
Max
tPLH
Propagation Delay
1.0
3.0
5.0
1.0
5.5
tPHL
Data to Output (74F828)
1.0
2.0
4.0
1.0
4.0
tPZH
Output Enable Time
3.0
5.7
9.0
2.5
10.0
2.5
9.5
tPZL
OE to On
3.5
6.8
11.5
3.0
12.5
3.0
12.0
tPHZ
Output Disable Time
1.5
3.3
8.0
1.5
9.0
1.5
8.5
tPLZ
OE to On
1.0
3.5
8.0
1.0
9.0
1.0
8.5
5
Units
ns
ns
ns
ns
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74F827 • 74F828
AC Electrical Characteristics
74F827 • 74F828
Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide
Package Number M24B
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6
74F827 • 74F828 10-Bit Buffers/Line Drivers
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Package Number N24C
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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