Edge749 Octal Pin Electronics Driver/Receiver TEST AND MEASUREMENT PRODUCTS Description Features The Edge749 is an octal pin electronics driver and receiver combination fabricated in a high-performance CMOS process. It is designed for automatic test equipment and instrumentation where cost, functional density, and power are all at a premium. • • • • • • • • The Edge749 incorporates eight channels of programmable drivers and receivers into one package. Each channel has per pin driver levels, receiver threshold, and tristate control. The 18V driver output and receiver input range allows the Edge749 to interface directly between TTL, ECL, CMOS (3V, 5V, and 8V), very high voltage, and custom level circuitry. 20 MHz Operation 18 V DUT I/O Range Programmable Output Levels Programmable Input Thresholds Per Pin Flexibility High Integration Levels Low Power Dissipation Edge 648 and 649 Compatible Applications • • • • • • • The Edge749 is pin and functionally compatible with the Edge648 and Edge649. Burn-In ATE Functional Board Testers In-Circuit Board Testers Combinational Board Testers Low Cost Chip Testers ASIC Verifiers VXI-Based Test Equipment Functional Block Diagram VHIGH VLOW 8 8 8 DATA IN 8 8 DUT DVR EN* 8 + DATA OUT – Revision 3 / October 21, 2002 8 THRESHOLD 1 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS PIN Description Pin Name Pin Number DATA IN (0:7) 64, 65, 66, 67, 3, 4, 5, 6 TTL compatible inputs that determine the high/low status of the DUT drivers. DATA OUT (0:7) 56, 57, 58, 59, 11, 12, 13, 14 CMOS level outputs that indicate the status of the DUT receivers. DUT (0:7) 46, 43, 40, 37, 33, 30, 27, 24 Pin electronic inputs/outputs that receive/drive the device under test. DVR EN (0:7) 60, 61, 62, 63, 7, 8, 9, 10 TTl compatible inputs that control the high impedance state of the DUT drivers. VHIGH (0:7) 45, 44, 39, 38, 32, 31, 26, 25 Unbuffered analog inputs that set the voltage level of a logical 1 of the DUT drivers. VLOW (0:7) 47, 42, 41, 36, 34, 29, 28, 23 Unbuffered analog inputs that set the voltage level of a logical 0 of the DUT drivers. THRESHOLD (0:7) 50, 51, 52, 53, 17, 18, 19, 20 Buffered analog input voltage that sets the threshold for the DUT comparators. VCC 21, 49 Analog positive power supply. VEE 22, 48 Analog negative power supply. VDD 1, 15, 55 GND 2, 16, 54, 68 Device ground. N/C 35 No connection. Revision 3 / October 21, 2002 Description Digital power supply. 2 www .semtech.com Edge749 DVR EN*0 DATA OUT3 DATA OUT2 DATA OUT1 DATA OUT0 VDD GND THRESHOLD3 THRESHOLD2 THRESHOLD1 THRESHOLD0 VCC VEE VLOW0 DUT0 VHIGH0 VHIGH1 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 TEST AND MEASUREMENT PRODUCTS PIN Description (continued) DVR EN*1 61 43 DUT1 DVR EN*2 62 42 VLOW1 DVR EN*3 63 41 VLOW2 DATA IN0 64 40 DUT2 DATA IN1 65 39 VHIGH2 DATA IN2 66 38 VHIGH3 DATA IN3 67 37 DUT3 GND 68 36 VLOW3 VDD 1 35 NC Revision 3 / October 21, 2002 3 22 23 24 25 26 VEE VLOW7 DUT7 VHIGH7 VHIGH6 21 VCC DUT6 20 VLOW6 27 THRESHOLD7 28 9 THRESHOLD6 8 DVR EN*6 19 DVR EN*5 18 VLOW5 THRESHOLD5 29 17 7 GND DVR EN*4 THRESHOLD4 DUT5 16 VHIGH5 30 15 31 6 VDD 5 DATA IN7 14 DATA IN6 DATA OUT7 VHIGH4 DATA OUT6 32 13 4 12 DATA IN5 DATA OUT5 DUT4 11 VLOW4 33 DATA OUT4 34 3 10 2 DVR EN*7 GND DATA IN4 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS Circuit Description VHIGH and VLOW Driver Description VHIGH VLOW VHIGH and VLOW define the logical “1” and “0” levels of the DUT driver and can be adjusted anywhere over the range determined by VCC and VEE. Table 1 documents the relationship between the analog power to supplies (VCC and VEE), the driver range (VHIGH and VLOW), and the comparator threshold range (VTHRESHOLD). DATA IN DUT The VHIGH and VLOW inputs are unbuffered in that they also provide the driver output current (see Figure 3), so the source of VHIGH and VLOW must have ample current drive capability. DVR EN* Figure 1. Driver Diagram As shown in Figure 1, Edge749 supports programmable high and low levels and tristate per channel. There are no shared lines between any drivers. The DVR EN* and DATA IN signals are TTL compatible inputs that control the driver (see Figure 2). VHIGH With DVR EN* high, the DUT driver goes into a high impedance state. With DVR EN* low, DATA IN high forces the driver into a high state (DUT = VHIGH), and DATA IN low forces the driver low (DUT = VLOW). DUT DVR EN* VLOW DATA IN Figure 3. Simplified Model of the Unbuffered Output Stage VHIGH DUT VLOW Figure 2. Driver Functionality Drive Common Mode Range Receive Common Mode Range Threshold Range VEE <= DUT <= VCC VEE <= DUT <= VCC VEE + 3V <= THRESHOLD <= VOC - 3V Table 1. Headroom vs. Power Supplies Revision 3 / October 21, 2002 4 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Driver Output Protection In a functional testing environment, where a resistor is added in series with the driver output (to create a 50Ω output impedance), the Edge749 can withstand a short to any legal DUT voltage for an indefinite amount of time. In a low impedance application with no additional output series resistance, care must be exercised and systems should be designed to check for this condition and tristate the driver if a short is detected. Receiver Functionality Edge749 supports programmable thresholds per channel. There are no shared lines between comparators. THRESHOLD is a high input impedance analog input which defines a logical “1” and “0” at the DUT (see Figure 4). If the DUT voltage is more positive than THRESHOLD, DATA OUT will be high. With DUT lower than THRESHOLD, DATA OUT will be low. DATA OUT + DUT – THRESHOLD THRESHOLD DUT DATA OUT Tpd Figure 4. Receiver Functionality Revision 3 / October 21, 2002 5 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS Application Information Power Supplies The Edge749 uses three power supplies: VDD, VCC and VEE. VDD is the digital supply for all of the data inputs and outputs. VCC and VEE are the analog power supplies for the Edge749 drivers and comparators. In order to protect the Edge749 and avoid damaging it, the following power supply requirements must be satisifed at all times: VEE ≤ GND ≤ VDD ≤ VCC VEE ≤ All Inputs ≤ VCC at all times Also, The three-Schottky diode configuration shown in Figure 5, used on a once-per-board basis, insures power supply sequence and fault tolerance. capacitor in parallel with a .001 µF chip capacitor. A VCC and VEE plane, or at least a solid power bus, is recommended for optimal performance. VHIGH and VLOW Decoupling As the VHIGH and VLOW inputs are unbuffered and must supply the driver output current, decoupling capacitors for these inputs are recommended in proportion to the amount of output current the application requires. Expanding the Common Mode Range VCC Although the Edge749 can drive and receive 18 V swings, these 18 V signals can be adjusted over an 21 V range. By using programmable regulators V1 and V2 for the VCC and VEE supplies (feasible because these two analog power supplies do not supply driver output current), the Edge749 I/O range can be optimized for a variety of applications (see Figure 6). VDD 1N5820 or Equivalent V1 VEE VCC Figure 5. Power Supply Protection Scheme Power-On Sequencing 1. VCC (substrate) 2. VEE 3. VDD 4. Inputs Power-Off Sequencing 1. Inputs 2. VDD 3. VEE 4. VCC Edge 749 VDD V2 Figure 6. Power Supplies Decoupling VDD, which provides the digital power, should be decoupled to GND with a .1 µF chip capacitor in parallel with a .001 µF chip capacitor. The bypass capacitors should be as close to the device as possible. Power and ground planes are recommended to provide a low inductance return path. There are three rules which govern the supplies V1 and V2: 1) +10V < V1 < +18V 2) –3V < V2 < 0V 3) (V1 – V2) < +18V. VCC and VEE, which power the DUT drivers and receivers, should also be decoupled to GND with a .1 µF chip Revision 3 / October 21, 2002 6 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS Application Information (continued) Window Comparator Trinary Driver Certain applications require a dual threshold window comparator to distinguish between the DUT being high, low, or floating. To support this application, two Edge749 channels can be combined to create one channel with a window comparator (see Figure 7). Notice that connecting two DUT pins ties together the positive inputs of both receivers. The result is a difference in polarity between the digital outputs reporting the high and low status of the DUT. At times, there is a need for a three-level driver. Typically, two levels are required for the standard digital “1” and “0” pattern generation. The third level provides a higher voltage to place the device under test (DUT) into a programming or test mode. By controlling the DATA IN and DVR EN* inputs, a trinary driver with tristate is realizable (see Figure 8). Driver with Pull Up/Pull Down – DUT HIGH High Threshold + DUT + DUT LOW* – Low Threshold Figure 7. Edge749 as a Window Comparator Once two receivers are connected as window comparators, the two drivers also get connected in parallel. This dual driver configuration supports a multitude of applications that have traditionally been difficult to accommodate. VHIGH A As the drivers are unbuffered, paralleling two drivers for one DUT node provides a means for adding pull up or pull down capability. By connecting the VHIGH and VLOW inputs of one driver through a resistor to a voltage, additional functionality that would normally require an external relay on the DUT transmission line to engage and disengage these functions is realizable. One common application for the pull up feature is testing open collector devices. The pull down satisfies open emitter DUTs (typically ECL). Either the pull up or down could be used to establish a default high impedance voltage on a bidirectional bus. Notice that in all applications, the resistors can be switched dynamically or statically. VLOW A DATA IN A DVR EN*A VHIGH B DUT VHIGH B VHIGH A VLOW A DATA IN B DVR EN*B Figure 8. Trinary Driver Revision 3 / October 21, 2002 7 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS Application Information (continued) Also, either the pull up or pull down resistor could be used to terminate the transmission from the DUT to the pin electronics in an effort to minimize any reflections. VHIGH A VLOW A DATA IN A Two Logic Family Driver Many test systems support exactly two families of driver and receiver levels and select between family A and family B settings on a per-pin basis, typically using an analog multiplexer (See Figure 11). Common examples of these families are: DUT Family A = TTL Family B = CMOS or Family A = TTL Family B = ECL DVR EN*A VHIGH B VPULL UP DATA IN B VPULL DOWN DVR EN*B VLOW B The Edge749 supports this system architecture with minimal hardware and the elimination of the per-pin analog multiplexer. The drive and receive levels need to be generated once per system, then distributed and buffered suitably. Figure 9. Driver with Pull Up/Pull Down Trinary Driver with Termination Other combinations are also possible. For example, two parallel drivers can be configured to implement one trinary driver with a pull down (or pull up) dynamic termination (see Figure 10). VHIGH A VLOW A Parametric Functions Two drivers in parallel also offer the possibility of connecting force and sense parametric circuitry to the DUT without adding additional circuitry to the controlled impedance DUT line. For example, Figure 12 shows the second driver being utilized to force a current and measure a voltage. DATA IN A DVR EN*A DUT VHIGH B VTERMINATION Notice that the VHIGH and VLOW pins are used from different drivers to allow the force and sense functions to be active simultaneously. DATA IN B DVR EN*B Figure 10. Trinary Driver with Termination Revision 3 / October 21, 2002 8 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS Application Information (continued) CHANNEL 1 CHANNEL n VHIGH A VHIGH B DVR EN*A DVR EN*A DVR DATA DVR DATA DUT0 DUT0 DVR EN*B DVR EN*B VLOW B VLOW A Figure 11. Family A/B Using Two Drivers Per Pin Edge749 Ron vs. Vout - VCC=+16.5V, VEE=-1.5V Driver Output Impedance 9.5 9 Ron [Ohms] 8.5 8 R_VLO 7.5 R_VHI 7 6.5 14.5 15.5 16.5 12.5 13.5 9.5 10.5 11.1 6.5 7.5 8.5 4.5 5.5 0.5 1.5 2.5 3.5 6 -1.5 -0.5 Ideally, a driver would have a constant output impedance over all ouptut conditions. However, the Edge749 ouptut impedance does vary slightly over the common mode drive level and whether it is driving high or low. Figure 12 shows the variation in Rout. Vout [V] Figure 12. ROUT vs. DOUT Edge749 Leakage in HIZ - VCC=+16.5V, VEE=-1.5V 10 High Impedance Leakage 8 The Edge749 is designed to be extremely low leakage (see Figure 13.) In a low performance application, where the output capacitance is not a concern, the low leakage may allow the elimination of an isolation relay. Leakage Current [nA] 6 4 2 0 VLO=0, VHI=+8 - 2 - 4 - 6 - 8 17 16 15 14 13 12 11 9 10 8 7 6 5 4 3 2 1 0 - 1 - 2 - 3 -10 Dout [Volts] Figure 13. High Impedance Leakage Revision 3 / October 21, 2002 9 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS Package Information 68 Pin PLCC Package θJA = 42 to 48˚C / W PIN Descriptions 0.990 SQ [25.146] 0.048 [1.219] See Detail A 0.953 SQ [24.206] 0.045 SQ [1.143] 0.800 REF [20.32] 0.175 [4.445] 0.016 [0.406] 0.029 [0.736] 0.016 [0.406] 0.910 [23.114] 0.113 [2.87] 0.029 [0.736] ;; ; 0.020 [0.508] MIN 0.065 [1.651] 0.030 [0.762] Notes: (unless otherwise specified) 1. Dimensions are in inches [millimeters]. 2. Tolerances are: .XXX ± 0.005 [0.127]. 3. PLCC packages are intended for surface mounting on solder lands on 0.050 [1.27] centers. Revision 3 / October 21, 2002 10 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS Recommended Operating Conditions Parameter Symbol Min Typ Max Units Digital Power Supply VDD 4.5 5 5. 5 V Analog Positive Power Supply VCC 10 15 18 V Analog Negative Power Supply VEE -3 -2 0 V Total Analog Power Supply VCC - VEE 10 18 V Driver High Output Voltage VHIGH VEE VCC V Driver Low Output Voltage VLOW VEE VCC V Total Driver Output Swing VHIGH - VLOW -18 18 V Receiver Threshold Voltage THRESHOLD VEE + 3 VCC - 3 V TA TJ 0 0 +70 +125 oC oC Symbol Min Max Units 19 V Ambient Operating Temperature Absolute Maximum Ratings Parameter Total Analog Power Supply VCC - VEE Typ Positive Analog Power Supply VCC -.5 19 V Negative Analog Power Supply VEE -5 0.5 V Driver High Output Voltage VHIGH VEE - .5 VCC + .5 V Driver Low Output Voltage VLOW VEE - .5 VCC + .5 V Driver Output Swing VHIGH - VLOW -18.5 18.5 V Receiver Threshold Voltage THRESHOLD VEE - .5 VCC + .5 V DATA IN DVR EN* GND - .5 VDD + .5 V VDD 0 6.5 V Ambient Operating Temperature TA -55 +125 oC Storage Temperature TS -65 +150 oC Junction Temperature TJ +150 oC Soldering Temperature TSOL 260 oC Digital Inputs Digital Power Supply Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these, or any other conditions beyond those listed, is not implied. Exposure to absolute maximum conditions for extended periods may affect device reliability. Revision 3 / October 21, 2002 11 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS DC Characteristics Parameter Symbol Min V H I G H - VL O W DC Driver Output Current (Note 1) Typ Max Units -18 18 V IO U T -125 +125 mA Output Impedance (Note 2) RO U T 4 12 Ω DUT Pin Capacitance CO U T Driver/Receiver Characteristics Output Voltage Swing DUT Output voltage Receiver Threshold Level 8 20 pF DUT<0:7> VEE VCC V VT H R E S H O L D VEE + 3 VCC - 3 V 0 1.0 µA .001 1.0 µA 200 mV 80 15 mA mA mA Threshold Bias Current DUT Leakage Input Current IB I A S Receiver Offset Voltage (Note 3) VOS -200 Quiescent Power Supply Current Positive Power Supply Negative Power Supply Digital Power Supply ICC IEE IDD -60 Input High Voltage VIHM IN 2.0 VDD V Input Low Voltage VILM A X 0 0.8 V 1.0 µA 60 -40 5 Digital Inputs DATA IN (0:7), DVR EN* (0:7) Input Current IIN Input Capacitance CIN 5 pF Digital Outputs DATA OUT (0:7) Output Voltage High (Note 4) VOH VDD - .4 Output Voltage Low (Note 5) VOL -0.4 DC Output current IOUT Note 1 : Note 2 : Note 3 : Note 4: Note 5: 0 VDD + .4 V 0. 4 V 4 mA Output current specification is per individual driver. Tested for driving a high state and low state at +18V, +6V, and 0V. Measured at THRESHOLD = +1.5V. Output current of –4 mA. Output current of 4 mA. Revision 3 / October 21, 2002 12 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS AC Characteristics Parameter Propagation Delay DATA IN <0:7> to DUT <0:7> DUT <0:7> to DATA OUT <0:7> Active to HiZ HiZ to Active Symbol Min Typ Max Units T1 T2 T3 T4 20 10 20 20 29 21 32 28 38 30 40 35 ns ns ns ns DUT Output Rise/Fall Times (Note 1) 1V Swing (20% - 80%) 3V Swing (10% - 90%) 5V Swing (10% - 90%) 8V Swing (10% - 90%) 10V Swing (10% - 90%) Digital Outputs (DATA OUT <0:7>) DATA OUT Rise Time (10% - 90%) DATA OUT Fall Time (10% - 90%) Note 1: ns ns ns ns ns 2.5 2.5 ns ns 25 20 20 15 ns ns 15 20 MHz TR TF Minimum Pulse Width Driver Output Comparator Output Maximum Operating Frequency 1.0 1.5 1.5 1.5 1.5 Fmax Into 18 inches of 50Ω transmission line terminated with 1KΩ and 5 pF with the proper series termination resistor. T1 T2 DATA IN DUT DATA OUT DVR EN* HiZ DUT T3 Revision 3 / October 21, 2002 T4 13 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS Ordering Information Model Number Package E749BPJ 68-Pin PLCC EVM749EVM Edge749 Evaluation Module Contact Infor mation Semtech Corporation Test and Measurement Division 10021 Willow Creek Rd., San Diego, CA 92131 Phone: (858)695-1808 FAX (858)695-2633 Revision 3 / October 21, 2002 14 www .semtech.com Edge749 TEST AND MEASUREMENT PRODUCTS Revision History Current Revision Date: October 21, 2002 Previous Revision Date: June 11, 2002 Page # Section Name 6 Power Supplies Previous Revision Current Revision Para 1 rewritten Para 2 deleted Power On and Off Sequencing added Current Revision Date: June 11, 2002 Previous Revision Date: June 23, 1998 Page # Section Name Previous Revision Current Revision 2 Pin Descriptions VLOW Change Pin #44 to Pin #47 Revision 3 / October 21, 2002 15 www .semtech.com