FAIRCHILD FODB100

SINGLE CHANNEL MICROCOUPLER™
FODB100
FODB101
FODB102
DESCRIPTION
The FODB100, FODB101 and FODB102 single channel MICROCOUPLERS™ are all
Pb-free, low profile miniature surface mount optocouplers in a Ball Grid Array (BGA)
package. Each consists of an aluminum gallium arsenide (AlGaAs) infrared emitting diode
driving a silicon phototransistor.
FEATURES
• Low profile package
(1.20mm maximum mounted height)
• Land pattern allows for optimum board space savings
• High Current Transfer Ratio (CTR) at low IF
• Minimum isolation distance of 0.45mm
• High steady state isolation voltage of 2500Vrms
• Data rates up to 120Kbit/s (NRZ)
• Minimum creepage distance of 2mm
• Wide operating temperature range of -40°C to +125°C
• Available in tape and reel quantities of 3000 units
• Applicable to Pb-free Infrared Ray reflow (260°C max)
• UL, C-UL approved; VDE pending
SCHEMATIC
ANODE 1
CATHODE 2
4 COLLECTOR
3 EMITTER
APPLICATIONS
• Primarily suited for DC-DC converters
• For ground loop isolation, signal to noise isolation
Communications – chargers, adapters
Consumer – appliances, set top boxes
Industrial – power supplies, motor control
PACKAGE DIMENSIONS
3.50 ± 0.10
A
2.50
1
4
2
3
3.50 ± 0.10
2.50
BALL #1
INDICATOR
4
3
BOTTOM VIEW
0.98 MAX
Ø 0.80 MIN
0.65 MAX
B
(Ø2.30)
2
1
0.35 MAX
0.25 MIN
TOP VIEW
0.10 C B A
1.20 MAX
C
© 2004 Fairchild Semiconductor Corporation
0.85 MAX
0.68 MIN
SEATING
PLANE
Page 1 of 8
NOTES: UNLESS OTHERWISE SPECIFIED
A) ALL DIMENSIONS ARE IN MILLIMETERS.
B) NO JEDEC REGISTRATION REFERENCE AS
OF NOVEMBER 2002.
0.10 C
8/19/04
SINGLE CHANNEL MICROCOUPLER™
FODB100
FODB101
FODB102
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified)
Parameter
TOTAL PACKAGE
Symbol
Value
Units
Storage Temperature
TSTG
-55 to +150
°C
Operating Temperature
TOPR
-40 to +125
°C
Tj
130
°C
IF (avg)
30
mA
Junction Temperature
EMITTER
Continuous Forward Current
Reverse Input Voltage
Power Dissipation
Derate linearly (above 25°C)
DETECTOR
Continuous Collector Current
Power Dissipation
Derate linearly (above 25°C)
VR
6
V
PD
40
0.39
mW
mW/°C
50
150
1.42
mA
mW
mW/°C
PD
Collector-Emitter Voltage
VCEO
75
V
Emitter-Collector Voltage
VECO
7
V
ELECTRICAL CHARACTERISTICS (TA = 25°C)
INDIVIDUAL COMPONENT CHARACTERISTICS
Parameter
Test Conditions
Symbol
Min
1.0
Typ**
Max
Unit
1.5
V
10
µA
EMITTER
Forward Voltage
(IF = 2 mA)
VF
Reverse Current
(VR = 6 V)
IR
DETECTOR
Breakdown Voltage
Collector to Emitter
(IC = 100 µA, IF = 0)
BVCEO
75
Emitter to Collector
(IE = 100 µA, IF = 0)
BVECO
7
(VCE = 75 V, IF = 0)
ICEO
(VCE = 0 V, f = 1 MHz)
CCE
Collector Dark Current
Capacitance
© 2004 Fairchild Semiconductor Corporation
Page 2 of 8
V
100
8
nA
pF
8/19/04
SINGLE CHANNEL MICROCOUPLER™
FODB100
FODB101
FODB102
TRANSFER CHARACTERISTICS (TA = 25°C)
Characteristic
Current Transfer Ratio1
Saturated Current Transfer
Ratio (Collector to Emitter)
Saturation Voltage
Test Conditions
(IF = 1 mA, VCE = 5 V)
(IF = 1.6 mA, VCE = 0.4 V)
(IF = 1.0 mA, VCE = 0.4 V)
(IF = 3.0 mA, IC = 1.8 mA)
(IF = 1.6 mA, IC = 1.6 mA)
Symbol
Min
CTR
100
CTRCE(SAT)
(IC = 2 mA, VCE = 5 V)
(RL = 1KΩ)
tr
Fall Time (Non-Saturated)
(IC = 2 mA, VCE = 5 V)
(RL = 1KΩ)
tf
Propagation Delay
High to Low
Propagation Delay
Low to High
IF = 1.6 mA, VCC = 5.0 V
RL = 4.7KΩ
IF = 1.6 mA, VCC = 5.0 V
RL = 750Ω
IF = 1.6 mA, VCC = 5.0 V
RL = 4.7KΩ
Max
Unit
%
100
%
75
VCE (SAT)
Rise Time (Non-Saturated)
IF = 1.6 mA, VCC = 5.0 V
RL = 750Ω
Typ**
0.4
V
1
µs
5
3
TPHL
µs
12
5
TPLH
µs
19
ISOLATION CHARACTERISTICS
Characteristic
Steady State Isolation Voltage2
Test Conditions
Symbol
Min
(RH ≤ 50%,
TA = 25°C, t = 1 sec)
VISO
2500
V(rms)
(VI-O = 500VDC)
RISO
1012
Ω
f = 1MHz
CISO
Resistance (input to output)2
Capacitance (input to output)2
Typ**
0.3
Max
0.5
Unit
pF
Notes:
1. CTR bin (FODB100 only)
FODB101: 100% – 200%
FODB102: 150% – 300%
2. Pin 1 and Pin 2 are shorted as input and Pin 3 and Pin 4 are shorted as output.
© 2004 Fairchild Semiconductor Corporation
Page 3 of 8
8/19/04
SINGLE CHANNEL MICROCOUPLER™
FODB100
FODB101
FODB102
TYPICAL PERFORMANCE CURVES
Fig. 2 Normalized CTR vs. Temperature (VCE = 5V)
Normalized CTR @ 25°C
Normalized CTR @ 25°C
Fig. 1 Normalized CTR vs. Temperature (VCE = 2V)
1.2
IF = 2mA @ VCE = 2V
1
IF = 1mA @ VCE = 2V
0.8
0.6
IF = 500µA @ VCE = 2V
0.4
0.2
0
25
40
60
80
100
Temperature (°C)
120
1.2
IF = 2mA @ VCE = 5V
1
IF = 1mA @ VCE = 5V
0.8
IF = 500µA @ VCE = 5V
0.6
0.4
0.2
0
25
140
40
Fig. 3 Current Transfer Ratio vs.
Collector to Emitter Voltage
350
2mA
140
1mA
300
400
1mA
500µA
250
CTR (%)
300
120
Fig. 4 Current Transfer Ratio vs.
Collector Saturation Voltage
500
CTR (%)
60
80
100
Temperature (°C)
500µA
200
2mA
200
150
100
100
50
0
0
0
2
4
6
8
10
0
VCE (V)
0.8
0.2
0.4
0.6
Collector Saturation Voltage (V)
1.0
Fig. 5 Baud Rate vs. Load Resistor
Baud Rate – Kbit/s
200
IF = 1.47 mA
Ta = 23C, PRSG = (28-1)
BER < 10-6
150
100
Vcc = 12V
50
Vcc = 5V
0
200
© 2004 Fairchild Semiconductor Corporation
400
600
800 1000 1200 1400
RL - Load Resistor - Ohms
Page 4 of 8
1600
8/19/04
SINGLE CHANNEL MICROCOUPLER™
FODB100
FODB101
FODB102
TAPE AND REEL SPECIFICATIONS
Embossed Carrier Tape Configuration
D0
P0
T
E1
F
K0
Wc
W
E2
B0
Tc
D1
P1
A0
User Direction of Feed
Dimensions are in millimeter
Pkg type
Optocoupler
(12mm)
A0
B0
W
D0
D1
E1
E2
3.80
±0.10
3.80
±0.10
12.0
+0.3/
–0.1
1.50
+0.25/
–0.00
1.50
+0.25/
–0.00
1.75
±0.10
10.25
min
F
5.50
±0.05
P1
P0
K0
8.0
±0.1
4.0
±0.1
1.40
±0.10
Notes: A0, B0, and K0 dimensions are determined with respect to the EIA/Jedec RS-481
rotational and lateral movement requirements (see sketches A, B, and C).
T
0.279
±0.02
Tc
9.2
±0.3
0.06
±0.02
0.5mm
maximum
20 deg maximum
Typical
component
cavity
center line
B0
Wc
0.5mm
maximum
20 deg maximum component rotation
Typical
component
center line
Sketch A (Side or Front Sectional View)
Sketch C (Top View)
A0
Component Rotation
Component lateral movement
Sketch B (Top View)
Component Rotation
Optocoupler Reel Configuration
W1 Measured at Hub
B Min
Dim C
Dim D
min
Dim A
max
Dim N
DETAIL AA
See detail AA
W3
13" Diameter Reel
W2 max Measured at Hub
Dimension are in inches and millimeters
Tape Size
12mm
Reel
Option
13" Dia
Dim A
13.00
330
© 2004 Fairchild Semiconductor Corporation
Dim B
0.059
1.5
Dim C
Dim D
512 +0.020/–0.008
13 +0.5/–0.2
0.795
20.2
Dim N
7.00
178
Page 5 of 8
Dim W1
0.488 +0.078/–0.000
12.4 +2/–0
Dim W2
0.724
18.4
Dim W3 (LSL–USL)
0.469 – 0.606
11.9 – 15.4
8/19/04
SINGLE CHANNEL MICROCOUPLER™
FODB100
FODB101
FODB102
MARKING INFORMATION
4
3
4
3
Definitions
5
1
X Y TT
B100 C
V
1
2
7
6
2
Ball #1
Indicator
1
Fairchild logo
2
Device number (FODB100)
3
One digit year code e.g. “4” for 2004
4
6-week date code character
5
Die Run Code
6
Assembly package code
7
VDE 0884 approved (Optional)
Note: The device number prefix of “FOD” will be ommitted in the part number
RECOMMENDED FOOTPRINT DRAWING FOR PCB LAYOUT
Ø0.65
4
3
2.50
1
2.50
2
Note:
1. All dimensions in millimeters (mm)
2. It is recommended to use 6 mils of stencil thickness on PCB
© 2004 Fairchild Semiconductor Corporation
Page 6 of 8
8/19/04
SINGLE CHANNEL MICROCOUPLER™
FODB100
FODB101
FODB102
RECOMMENDED INFRARED REFLOW SOLDERING PROFILE
Entrance
Zone 1
Zone 2
Zone 3
Zone 4
Zone 5
Cooling
270.00
Temperature (°C)
236.25
202.50
168.75
135.00
101.25
67.50
33.75
0.00
0.66
1.31
1.97
2.63
3.28
3.94
4.60
5.26
5.91
6.57
7.23
7.88
Time (min.)
Reflow Profile for Pb Free
Convection Reflow
Average ramp-up rate (183°C to peak)
Preheat Temperature 125(±25)°C to 200°C
3°C/sec max
60-180°C
Temperature maintained above 220°C
60-150 sec
Time within 5°C of actual peak temperature
20-40 sec
Peak temperature range
Ramp down rate
260 ±5°C
6°C/sec max
8min max
Time 25°C to peak temperature
Note: Surface Mount Adhesives (SMA) isn’t recommended to be used on the dome area (white dome).
© 2004 Fairchild Semiconductor Corporation
Page 7 of 8
8/19/04
SINGLE CHANNEL MICROCOUPLER™
FODB100
FODB101
FODB102
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO
ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME
ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES
OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR
CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body, or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
© 2004 Fairchild Semiconductor Corporation
2. A critical component in any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
Page 8 of 8
8/19/04