STL55NH3LL N-channel 30 V, 0.0079 Ω, 15 A, PowerFLAT™ (6x5) ultra low gate charge STripFET™ Power MOSFET Features Type VDSS RDS(on) max ID STL55NH3LL 30 V < 0.0088 Ω 15 A ■ Improved die-to-footprint ratio ■ Very low profile package (1mm max) ■ Very low thermal resistance ■ Very low gate charge ■ Low threshold device PowerFLAT™(6x5) Application ■ Switching applications Figure 1. Internal schematic diagram Description This application specific Power MOSFET is the latest generation of STMicroelectronics unique “STripFET™” technology. The resulting transistor is optimized for low on-resistance and minimal gate charge. The chip-scaled PowerFLAT™ package allows a significant board space saving, still boosting the performance. Table 1. Device summary Order code Marking Package Packaging STL55NH3LL L55NH3LL PowerFLAT™ (6x5) Tape and reel May 2008 Rev 3 1/14 www.st.com 14 Contents STL55NH3LL Contents 1 Electrical ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 2 Electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 2.1 Electrical characteristics (curves) ............................. 6 3 Test circuits 4 Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 5 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 2/14 .............................................. 9 STL55NH3LL 1 Electrical ratings Electrical ratings Table 2. Absolute maximum ratings Symbol VDS Parameter Drain-source voltage (VGS = 0) Value Unit 30 V VGS(1) Gate-source voltage ± 16 V VGS(2) Gate-source voltage ± 18 V ID(3) Drain current (continuous) at TC = 25 °C 55 A ID(3) Drain current (continuous) at TC=100 °C 36 A (4) Drain current (pulsed) 60 A (5) Drain current (continuous) at TC = 25 °C 15 A ID (5) Drain current (continuous) at TC=100 °C 9.4 A IDM ID PTOT (5) Total dissipation at TC = 25 °C 4 W PTOT (3) Total dissipation at TC = 25 °C 60 W 0.03 W/°C -55 to 150 °C Value Unit Thermal resistance junction-case (drain) 2.08 °C/W Thermal resistance junction-ambient 31.3 °C/W Value Unit Derating factor TJ Operating junction temperature Storage temperature Tstg 1. Continuous mode 2. Guaranteed for test time ≤ 15 ms 3. The value is rated according Rthj-c 4. Pulse width limited by safe operating area 5. The value is rated according Rthj-pcb Table 3. Thermal resistance Symbol Rthj-case Rthj-pcb (1) Parameter 1. When mounted on FR-4 board of 1inch², 2oz Cu, t < 10 sec Table 4. Symbol Avalanche data Parameter IAV Not-repetitive avalanche current (pulse width limited by Tj Max) 7.5 A EAS Single pulse avalanche energy (starting Tj = 25 °C, ID=IAV, VDD = 24 V, L=6 mH) 150 mJ 3/14 Electrical characteristics 2 STL55NH3LL Electrical characteristics (TCASE=25°C unless otherwise specified) Table 5. Symbol V(BR)DSS On/off states Parameter Drain-source breakdown voltage Test conditions ID = 250 µA, VGS= 0 Min. IDSS IGSS Gate body leakage current (VDS = 0) VGS = ±16 V VGS(th) Gate threshold voltage VDS= VGS, ID = 250 µA RDS(on) Static drain-source on resistance Ciss Coss Crss Qg Qgs Qgd Qgs1 Qgs2 RG 4/14 1 10 µA µA ±100 nA 2.5 V 0.0079 0.0079 0.009 0.0088 0.0088 0.0115 Ω Ω Ω Typ. Max. Unit 1 VGS= 10 V, ID= 7.5 A VGS= 8 V, ID= 7.5 A Unit V VDS = max rating @125 °C VGS= 4.5 V, ID= 7.5 A Symbol Max. 30 VDS = max rating, Zero gate voltage drain current (VGS = 0) Table 6. Typ. Dynamic Parameter Test conditions Input capacitance Output capacitance Reverse transfer capacitance VDS = 25 V, f=1 MHz, VGS=0 Total gate charge Gate-source charge Gate-drain charge Pre Vth gate-to-source charge Post Vth gate-to-source charge Gate input resistance Min. 965 285 38 VDD=15 V, ID = 15 A 9 3.7 3 VGS =4.5 V (see Figure 16) VDD=15 V, ID = 15 A VGS =4.5 V f=1 MHz Gate DC Bias = 0 Test signal level = 20 mV open drain 0.5 pF pF pF 12 nC nC nC 2.5 nC 1.2 nC 1.5 2.5 Ω STL55NH3LL Electrical characteristics Table 7. Symbol td(on) tr td(off) tf Table 8. Symbol Switching times Parameter Turn-on delay time Rise time Turn-off delay time Fall time Test conditions Min. Typ. Max. 15 32 18 8.5 VDD=15 V, ID= 7.5 A, RG=4.7 Ω, VGS=4.5 V (see Figure 18) Unit ns ns ns ns Source drain diode Max Unit Source-drain current 15 A ISDM(1) Source-drain current (pulsed) 60 A VSD(2) Forward on voltage 1.3 V ISD trr Qrr IRRM Parameter Reverse recovery time Reverse recovery charge Reverse recovery current Test conditions Min Typ. ISD=15 A, VGS=0 ISD=15 A, di/dt = 100 A/µs, VDD=20 V, Tj=150 °C (see Figure 17) 24 17.4 1.45 ns nC A 1. Pulse width limited by safe operating area 2. Pulsed: pulse duration=300 µs, duty cycle 1.5% 5/14 Electrical characteristics STL55NH3LL 2.1 Electrical characteristics (curves) Figure 2. Safe operating area Figure 3. Thermal impedance Figure 4. Output characteristics Figure 5. Transfer characteristics Figure 6. Normalized BVDSS vs temperature Figure 7. Static drain-source on resistance 6/14 STL55NH3LL Figure 8. Electrical characteristics Gate charge vs gate-source voltage Figure 9. Capacitance variations Figure 10. Normalized gate threshold voltage vs temperature Figure 11. Normalized on resistance vs temperature Figure 12. Source-drain diode forward characteristics Figure 13. Avalanche energy vs starting tj 7/14 Electrical characteristics STL55NH3LL Figure 14. Allowable Iav vs time in avalanche The previous curve gives the single pulse safe operating area for unclamped inductive loads, under the following conditions: PD(AVE) =0.5*(1.3*BVDSS *IAV) EAS(AR) =PD(AVE) *tAV Where: IAV is the allowable current in avalanche PD(AVE) is the average power dissipation in avalanche (single pulse) tAV is the time in avalanche 8/14 STL55NH3LL 3 Test circuits Test circuits Figure 15. Switching times test circuit for resistive load Figure 16. Gate charge test circuit Figure 17. Test circuit for inductive load Figure 18. Unclamped inductive load test switching and diode recovery times circuit Figure 19. Unclamped inductive waveform Figure 20. Switching time waveform 9/14 Test circuits STL55NH3LL Figure 21. Gate charge waveform Id Vds Vgs Vgs(th) Qgs1 Qgs2 10/14 Qgd STL55NH3LL 4 Package mechanical data Package mechanical data In order to meet environmental requirements, ST offers these devices in ECOPACK® packages. These packages have a lead-free second level interconnect. The category of second level interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com 11/14 Package mechanical data STL55NH3LL PowerFLAT™ (6x5) MECHANICAL DATA mm. inch DIM. MIN. TYP MAX. MIN. TYP. MAX. 0.80 0.83 0.93 0.031 0.032 0.036 A1 0.02 0.05 0.0007 0.0019 A3 0.20 A b 0.35 0.47 0.013 0.015 D 5.00 0.196 D1 4.75 0.187 D2 4.15 E 4.20 4.25 5.75 3.48 3.53 E4 2.58 2.63 2.68 0.135 1.27 0.70 0.80 0.167 0.226 3.43 e 0.165 0.018 0.236 E2 L 0.163 6.00 E1 12/14 0.40 0.007 0.137 0.139 0.103 0.105 0.050 0.90 0.027 0.031 0.035 STL55NH3LL 5 Revision history Revision history Table 9. Document revision history Date Revision Changes 18-Mar-2008 1 First release. 05-May-2008 2 Corrected Table 1: Device summary 07-May-2008 3 Update Figure 6: Normalized BVDSS vs temperature 13/14 STL55NH3LL Please Read Carefully: Information in this document is provided solely in connection with ST products. STMicroelectronics NV and its subsidiaries (“ST”) reserve the right to make changes, corrections, modifications or improvements, to this document, and the products and services described herein at any time, without notice. All ST products are sold pursuant to ST’s terms and conditions of sale. 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