CD74AC02, CD74ACT02 Data sheet acquired from Harris Semiconductor SCHS224 Quad 2-Input NOR Gate September 1998 Features Description • Typical Propagation Delay - 6ns at VCC = 5V, TA = 25oC, CL = 50pF The CD74AC02 and CD74ACT02 are quad 2-input NOR gates that utilize the Harris Advanced CMOS Logic technology. • Exceeds 2kV ESD Protection MIL-STD-883, Method 3015 Ordering Information • SCR-Latchup-Resistant CMOS Process and Circuit Design [ /Title (CD74 AC02, CD74 ACT02 ) /Subject (Quad 2-Input NOR Gate) /Autho r () /Keywords (Harris Semiconductor, Advan ced CMOS , Harris Semiconductor, Advan ced TTL) /Creator () PART NUMBER TEMP. RANGE (oC) PKG. NO. PACKAGE • Speed of Bipolar FAST™/AS/S with Significantly Reduced Power Consumption CD74AC02E -55 to 125 14 Ld PDIP E14.3 CD74ACT02E -55 to 125 14 Ld PDIP E14.3 • Balanced Propagation Delays CD74AC02M -55 to 125 14 Ld SOIC M14.15 • AC Types Feature 1.5V to 5.5V Operation and Balanced Noise Immunity at 30% of the Supply CD74ACT02M -55 to 125 14 Ld SOIC M14.15 NOTES: • ±24mA Output Drive Current - Fanout to 15 FAST™ ICs - Drives 50Ω Transmission Lines 12. When ordering, use the entire part number. Add the suffix 96 to obtain the variant in the tape and reel. Pinout Functional Diagram 13. Wafer and die for this part number is available which meets all electrical specifications. Please contact your local sales office or Harris customer service for ordering information. CD74AC02, CD74ACT02 (PDIP, SOIC) TOP VIEW 1Y 1 1A 1B 2A 2B 14 VCC 1A 2 13 4Y 1B 3 12 4B 2Y 4 11 4A 2A 5 10 3Y 2B 6 9 3B GND 7 8 3A 3A 3B 4A 4B 2 3 1 5 6 4 8 10 1Y 2Y 3Y 9 11 13 12 4Y GND = 7 VCC = 14 TRUTH TABLE INPUTS A B Y L L H H L L L H L H H L CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures. FAST™ is a Trademark of Fairchild Semiconductor. Copyright © Harris Corporation 1998 1 OUTPUTS File Number 1978.1 CD74AC02, CD74ACT02 Absolute Maximum Ratings Thermal Information DC Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 6V DC Input Diode Current, IIK For VI < -0.5V or VI > VCC + 0.5V . . . . . . . . . . . . . . . . . . . . . .±20mA DC Output Diode Current, IOK For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±50mA DC Output Source or Sink Current per Output Pin, IO For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±50mA DC VCC or Ground Current, ICC or IGND (Note 3) . . . . . . . . .±100mA Thermal Resistance (Typical, Note 5) θJA (oC/W) PDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90 SOIC Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175 Maximum Junction Temperature (Plastic Package) . . . . . . . . . . 150oC Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC Operating Conditions Temperature Range, TA . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC Supply Voltage Range, VCC (Note 4) AC Types. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1.5V to 5.5V ACT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to VCC Input Rise and Fall Slew Rate, dt/dv AC Types, 1.5V to 3V . . . . . . . . . . . . . . . . . . . . . . . . . 50ns (Max) AC Types, 3.6V to 5.5V . . . . . . . . . . . . . . . . . . . . . . . . 20ns (Max) ACT Types, 4.5V to 5.5V. . . . . . . . . . . . . . . . . . . . . . . 10ns (Max) CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTES: 14. For up to 4 outputs per device, add ±25mA for each additional output. 15. Unless otherwise specified, all voltages are referenced to ground. 16. θJA is measured with the component mounted on an evaluation PC board in free air. DC Electrical Specifications TEST CONDITIONS PARAMETER -40oC TO 85oC 25oC -55oC TO 125oC SYMBOL VI (V) IO (mA) VCC (V) MIN MAX MIN MAX MIN MAX UNITS VIH - - 1.5 1.2 - 1.2 - 1.2 - V 3 2.1 - 2.1 - 2.1 - V AC TYPES High Level Input Voltage Low Level Input Voltage High Level Output Voltage VIL VOH - VIH or VIL - -0.05 5.5 3.85 - 3.85 - 3.85 - V 1.5 - 0.3 - 0.3 - 0.3 V 3 - 0.9 - 0.9 - 0.9 V 5.5 - 1.65 - 1.65 - 1.65 V 1.5 1.4 - 1.4 - 1.4 - V -0.05 3 2.9 - 2.9 - 2.9 - V -0.05 4.5 4.4 - 4.4 - 4.4 - V -4 3 2.58 - 2.48 - 2.4 - V -24 4.5 3.94 - 3.8 - 3.7 - V -75 (Note 6, 7) 5.5 - - 3.85 - - - V -50 (Note 6, 7) 5.5 - - - - 3.85 - V 2 CD74AC02, CD74ACT02 DC Electrical Specifications (Continued) TEST CONDITIONS PARAMETER Low Level Output Voltage -40oC TO 85oC 25oC -55oC TO 125oC SYMBOL VI (V) IO (mA) VCC (V) MIN MAX MIN MAX MIN MAX UNITS VOL VIH or VIL 0.05 1.5 - 0.1 - 0.1 - 0.1 V 0.05 3 - 0.1 - 0.1 - 0.1 V 0.05 4.5 - 0.1 - 0.1 - 0.1 V 12 3 - 0.36 - 0.44 - 0.5 V 24 4.5 - 0.36 - 0.44 - 0.5 V 75 (Note 6, 7) 5.5 - - - 1.65 - - V 50 (Note 6, 7) 5.5 - - - - - 1.65 V II VCC or GND - 5.5 - ±0.1 - ±1 - ±1 µA ICC VCC or GND 0 5.5 - 4 - 40 - 80 µA High Level Input Voltage VIH - - 4.5 to 5.5 2 - 2 - 2 - V Low Level Input Voltage VIL - - 4.5 to 5.5 - 0.8 - 0.8 - 0.8 V High Level Output Voltage VOH VIH or VIL -0.05 4.5 4.4 - 4.4 - 4.4 - V -24 4.5 3.94 - 3.8 - 3.7 - V -75 (Note 6, 7) 5.5 - - 3.85 - - - V -50 (Note 6, 7) 5.5 - - - - 3.85 - V Input Leakage Current Quiescent Supply Current SSI ACT TYPES Low Level Output Voltage Input Leakage Current Quiescent Supply Current SSI Additional Supply Current per Input Pin TTL Inputs High 1 Unit Load VOL VIH or VIL 0.05 4.5 - 0.1 - 0.1 - 0.1 V 24 4.5 - 0.36 - 0.44 - 0.5 V 75 (Note 6, 7) 5.5 - - - 1.65 - - V 50 (Note 6, 7) 5.5 - - - - - 1.65 V II VCC or GND - 5.5 - ±0.1 - ±1 - ±1 µA ICC VCC or GND 0 5.5 - 4 - 40 - 80 µA ∆ICC VCC -2.1 - 4.5 to 5.5 - 2.4 - 2.8 - 3 mA NOTES: 17. Test one output at a time for a 1-second maximum duration. Measurement is made by forcing current and measuring voltage to minimize power dissipation. 18. Test verifies a minimum 50Ω transmission-line-drive capability at 85oC, 75Ω at 125oC. ACT Input Load Table INPUT UNIT LOAD All 0.32 NOTE: Unit load is ∆ICC limit specified in DC Electrical Specifications Table, e.g., 2.4mA max at 25oC. 3 CD74AC02, CD74ACT02 Switching Specifications Input tr, tf = 3ns, CL = 50pF (Worst Case) -40oC TO 85oC PARAMETER -55oC TO 125oC SYMBOL VCC (V) MIN TYP MAX MIN TYP MAX UNITS tPLH, tPHL 1.5 - - 131 - - 144 ns 3.3 (Note 9) 4.1 - 14.6 4 - 16.1 ns 5 (Note 10) 3 - 10.4 2.9 - 11.5 ns CI - - - 10 - - 10 pF CPD (Note 11) - - 55 - - 55 - pF tPLH, tPHL 5 (Note 10) 3.1 - 11.1 3.1 - 12.2 ns CI - - - 10 - - 10 pF CPD (Note 11) - - 55 - - 55 - pF AC TYPES Propagation Delay, Input to Output Input Capacitance Power Dissipation Capacitance ACT TYPES Propagation Delay, Input to Output Input Capacitance Power Dissipation Capacitance NOTES: 19. Limits tested at 100%. 20. 3.3V Min at 3.6V, Max at 3V. 21. 5V Min at 5.5V, Max at 4.5V. 22. CPD is used to determine the dynamic power consumption per gate. AC: PD = VCC2 fi (CPD + CL) ACT: PD = VCC2 fi (CPD + CL) + VCC ∆ICC where fi = input frequency, CL = output load capacitance, VCC = supply voltage. INPUT LEVEL RL (NOTE) 500Ω 90% VS VI DUT OUTPUT LOAD tf = 3ns tr = 3ns OUTPUT 10% VO CL 50pF VS NOTE: For AC Series Only: When VCC = 1.5V, RL = 1kΩ. tPHL CD74AC CD74ACT VCC 3V Input Switching Voltage, VS 0.5 VCC 1.5V Output Switching Voltage, VS 0.5 VCC 0.5 VCC Input Level tPLH FIGURE 3. PROPAGATION DELAY TIMES FIGURE 2. PROPAGATION DELAY TIMES 4 GND IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER’S RISK. In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof. Copyright 1999, Texas Instruments Incorporated