TI CD74HC126M96

[ /Title
(CD74
HC126
,
CD74
HCT12
6)
/Subject
(High
Speed
CMOS
Logic
Quad
Buffer,
ThreeState)
CD54HC126, CD74HC126,
CD54HCT126, CD74HCT126
Data sheet acquired from Harris Semiconductor
SCHS144C
High-Speed CMOS Logic
Quad Buffer, Three-State
November 1997 - Revised September 2003
Features
Description
• Three-State Outputs
• Separate Output Enable Inputs
The ’HC126 and ’HCT126 contain four independent threestate buffers, each having its own output enable input, which
when “low” puts the output in the high-impedance state.
• Fanout (Over Temperature Range)
- Standard Outputs . . . . . . . . . . . . . . . 10 LSTTL Loads
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads
Ordering Information
• Wide Operating Temperature Range . . . -55oC to 125oC
PART NUMBER
• Balanced Propagation Delay and Transition Times
TEMP. RANGE
(oC)
PACKAGE
CD54HC126F3A
-55 to 125
14 Ld CERDIP
CD54HCT126F3A
-55 to 125
14 Ld CERDIP
• HC Types
- 2V to 6V Operation
- High Noise Immunity: NIL = 30%, NIH = 30% of VCC
at VCC = 5V
CD74HC126E
-55 to 125
14 Ld PDIP
CD74HC126M
-55 to 125
14 Ld SOIC
CD74HC126MT
-55 to 125
14 Ld SOIC
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
VIL= 0.8V (Max), VIH = 2V (Min)
- CMOS Input Compatibility, Il ≤ 1µA at VOL, VOH
CD74HC126M96
-55 to 125
14 Ld SOIC
CD74HCT126E
-55 to 125
14 Ld PDIP
CD74HCT126M
-55 to 125
14 Ld SOIC
CD74HCT126MT
-55 to 125
14 Ld SOIC
CD74HCT126M96
-55 to 125
14 Ld SOIC
• Significant Power Reduction Compared to LSTTL
Logic ICs
NOTE: When ordering, use the entire part number. The suffix 96
denotes tape and reel. The suffix T denotes a small-quantity reel of
250.
Pinout
CD54HC126, CD54HC126
(CERDIP)
CD74HC126, CD74HC126
(PDIP, SOIC)
TOP VIEW
1OE 1
14 VCC
1A 2
13 4OE
1Y 3
12 4A
2OE 4
11 4Y
2A 5
10 3OE
2Y 6
9 3A
GND 7
8 3Y
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
© 2003, Texas Instruments Incorporated
1
CD54HC126, CD74HC126, CD54HCT126, CD74HCT126
Functional Diagram
1OE
1A
2OE
1
3
2
1Y
4
6
5
2A
2Y
10
3OE
8
9
3Y
3A
13
4OE
11
12
4Y
GND = 7
VCC = 14
4A
TRUTH TABLE
INPUTS
OUTPUTS
nA
nOE
nY
H
H
H
L
H
L
X
L
Z
H= High Voltage Level
L= Low Voltage Level
X= Don’t Care
Z= High Impedance, OFF State
Logic Diagram
P
nA
nY
n
nOE
2
CD54HC126, CD74HC126, CD54HCT126, CD74HCT126
Absolute Maximum Ratings
Thermal Information
DC Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V
DC Input Diode Current, IIK
For VI < -0.5V or VI > VCC + 0.5V . . . . . . . . . . . . . . . . . . . . . .±20mA
DC Output Diode Current, IOK
For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±20mA
DC Drain Current, per Output, IO
For -0.5V < VO < VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . . . . . .±35mA
DC Output Source or Sink Current per Output Pin, IO
For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±25mA
DC VCC or Ground Current, ICC . . . . . . . . . . . . . . . . . . . . . . . . .±70mA
Thermal Resistance (Typical, Note 1)
θJA (oC/W)
E (PDIP) Package . . . . . . . . . . . . . . . . . . . . . . . . . .
80
M (SOIC) Package. . . . . . . . . . . . . . . . . . . . . . . . . .
86
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC
(SOIC - Lead Tips Only)
Operating Conditions
Temperature Range (TA) . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, VCC
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to VCC
Input Rise and Fall Time
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. The package thermal impedance is calculated in accordance with JESD 51-7.
DC Electrical Specifications
TEST
CONDITIONS
PARAMETER
SYMBOL
VI (V)
VIH
-
25oC
IO (mA) VCC (V)
-40oC TO 85oC
-55oC TO 125oC
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
2
1.5
-
-
1.5
-
1.5
-
V
4.5
3.15
-
-
3.15
-
3.15
-
V
6
4.2
-
-
4.2
-
4.2
-
V
2
-
-
0.5
-
0.5
-
0.5
V
4.5
-
-
1.35
-
1.35
-
1.35
V
6
-
-
1.8
-
1.8
-
1.8
V
-0.02
2
1.9
-
-
1.9
-
1.9
-
V
-0.02
4.5
4.4
-
-
4.4
-
4.4
-
V
-0.02
6
5.9
-
-
5.9
-
5.9
-
V
-6
4.5
3.98
-
-
3.84
-
3.7
-
V
-7.8
6
5.48
-
-
5.34
-
5.2
-
V
0.02
2
-
-
0.1
-
0.1
-
0.1
V
0.02
4.5
-
-
0.1
-
0.1
-
0.1
V
0.02
6
-
-
0.1
-
0.1
-
0.1
V
6
4.5
-
-
0.26
-
0.33
-
0.4
V
7.8
6
-
-
0.26
-
0.33
-
0.4
V
-
6
-
-
±0.1
-
±1
-
±1
µA
HC TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
VIL
VOH
-
VIH or
VIL
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
VOL
VIH or
VIL
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
II
VCC or
GND
-
-
3
CD54HC126, CD74HC126, CD54HCT126, CD74HCT126
DC Electrical Specifications
(Continued)
TEST
CONDITIONS
SYMBOL
VI (V)
Quiescent Device
Current
ICC
VCC or
GND
0
Three-State Leakage
Current
IOZ
VIL or
VIH
High Level Input
Voltage
VIH
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
PARAMETER
25oC
IO (mA) VCC (V)
-40oC TO 85oC
-55oC TO 125oC
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNITS
6
-
-
8
-
80
-
160
µA
-
6
-
-
±0.5
-
±5
-
±10
µA
-
-
4.5 to
5.5
2
-
-
2
-
2
-
V
VIL
-
-
4.5 to
5.5
-
-
0.8
-
0.8
-
0.8
V
VOH
VIH or
VIL
-0.02
4.5
4.4
-
-
4.4
-
4.4
-
V
-6
4.5
3.98
-
-
3.84
-
3.7
-
V
0.02
4.5
-
-
0.1
-
0.1
-
0.1
V
6
4.5
-
-
0.26
-
0.33
-
0.4
V
HCT TYPES
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
VOL
VIH or
VIL
Low Level Output
Voltage
TTL Loads
II
VCC to
GND
0
5.5
-
-
±0.1
-
±1
-
±1
µA
ICC
VCC or
GND
0
5.5
-
-
8
-
80
-
160
µA
Additional Quiescent
Device Current Per
Input Pin: 1 Unit Load
∆ICC
(Note 2)
VCC
-2.1
-
4.5 to
5.5
-
100
360
-
450
-
490
µA
Three-State Leakage
Current
IOZ
VIL or
VIH
-
5.5
-
-
±0.5
-
±5
-
±10
µA
Input Leakage
Current
Quiescent Device
Current
NOTE:
2. For dual-supply systems theoretical worst case (VI = 2.4V, VCC = 5.5V) specification is 1.8mA.
HCT Input Loading Table
INPUT
UNIT LOADS
nA, nOE
1
NOTE: Unit Load is ∆ICC limit specified in DC Electrical
Specifications table, e.g., 360µA max at 25oC.
4
CD54HC126, CD74HC126, CD54HCT126, CD74HCT126
Switching Specifications
PARAMETER
Input tr, tf = 6ns
SYMBOL
TEST
CONDITIONS
tPLH, tPHL
CL = 50pF
25oC
-40oC TO 85oC -55oC TO 125oC
VCC (V)
TYP
MAX
MAX
MAX
UNITS
2
-
100
125
150
ns
4.5
-
20
25
30
ns
CL = 15pF
5
8
-
-
-
ns
CL = 50pF
6
-
17
21
36
ns
CL = 50pF
2
-
125
155
190
ns
4.5
-
25
31
38
ns
CL = 15pF
5
10
-
-
-
ns
CL = 50pF
6
-
21
26
32
ns
CL = 50pF
2
-
125
155
190
ns
CL = 50pF
4.5
-
25
31
38
ns
CL = 15pF
5
10
-
-
-
ns
CL = 50pF
6
-
21
26
32
ns
CL = 50pF
2
-
60
75
90
ns
4.5
-
12
15
18
ns
6
-
10
13
15
ns
HC TYPES
Propagation Delay Data
to Outputs
Enable Delay Time
Disabling Delay Time
Output Transition Times
tPZL, tPZH
tPLZ, tPHZ
tTLH, tTHL
Input Capacitance
CI
-
-
-
10
10
10
pF
Three-State Output
Capacitance
CO
-
-
-
20
20
20
pF
Power Dissipation
Capacitance
(Notes 3, 4)
CPD
-
5
30
-
-
-
pF
CL = 50pF
4.5
-
24
30
36
ns
CL = 15pF
5
9
-
-
-
ns
CL = 50pF
4.5
-
25
31
38
ns
CL = 15pF
5
10
-
-
-
ns
CL = 50pF
4.5
-
28
35
42
ns
CL = 15pF
5
11
-
-
-
ns
CL = 50pF
4.5
-
12
15
18
ns
HCT TYPES
Propagation Delay Time
to Outputs
tPLH, tPHL
Output Enable Time
tPZL, tPZH
Output Disabling Time
Output Transition Times
tPLZ, tPHZ
tTLH, tTHL
Input Capacitance
CI
-
-
-
10
10
10
pF
Three-State Output
Capacitance
CO
-
-
-
20
20
20
pF
Power Dissipation
Capacitance
(Notes 3, 4)
CPD
-
5
36
-
-
-
pF
NOTES:
3. CPD is used to determine the dynamic power consumption, per multiplexer.
4. PD = VCC2 fi (CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
5
CD54HC126, CD74HC126, CD54HCT126, CD74HCT126
Test Circuits and Waveforms
tr = 6ns
tf = 6ns
90%
50%
10%
INPUT
GND
tTLH
tPHL
6ns
10%
2.7
1.3
OUTPUT LOW
TO OFF
90%
OUTPUT HIGH
TO OFF
50%
OUTPUTS
DISABLED
FIGURE 8. HC THREE-STATE PROPAGATION DELAY
WAVEFORM
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
IC WITH
THREESTATE
OUTPUT
GND
1.3V
tPZH
90%
OUTPUTS
ENABLED
OUTPUTS
ENABLED
0.3
10%
tPHZ
tPZH
3V
tPZL
tPLZ
50%
OUTPUTS
ENABLED
6ns
GND
10%
tPHZ
tf
OUTPUT
DISABLE
tPZL
tPLZ
OUTPUT HIGH
TO OFF
6ns
tr
VCC
90%
tPLH
FIGURE 7. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
6ns
OUTPUT LOW
TO OFF
1.3V
10%
INVERTING
OUTPUT
FIGURE 6. HC TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
50%
tTLH
90%
tPLH
tPHL
GND
tTHL
90%
50%
10%
INVERTING
OUTPUT
3V
2.7V
1.3V
0.3V
INPUT
tTHL
OUTPUT
DISABLE
tf = 6ns
tr = 6ns
VCC
1.3V
OUTPUTS
DISABLED
OUTPUTS
ENABLED
FIGURE 9. HCT THREE-STATE PROPAGATION DELAY
WAVEFORM
OUTPUT
RL = 1kΩ
CL
50pF
VCC FOR tPLZ AND tPZL
GND FOR tPHZ AND tPZH
NOTE: Open drain waveforms tPLZ and tPZL are the same as those for three-state shown on the left. The test circuit is Output RL = 1kΩ to
VCC, CL = 50pF.
FIGURE 10. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
6
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