ETC S-8261

Rev.4.4_00
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
The S-8261 series are lithium-ion / lithium polymer rechargeable
battery protection ICs incorporating high-accuracy voltage
detection circuit and delay circuit.
The S-8261 series are suitable for protection of single-cell lithium
ion/lithium polymer battery packs from overcharge, overdischarge
and overcurrent.
„ Features
(1)
Internal high accuracy voltage detection circuit
• Overcharge detection voltage
3.9 V to 4.4 V (applicable in 5 mV step)
Accuracy: ±25 mV (+25 °C) and
±30 mV (−5 to +55 °C)
• Overcharge hysteresis voltage
0.1 V to 0.4 V*1
Accuracy: ±25 mV
The overcharge hysteresis voltage can be selected from the range 0.1 V to 0.4 V in 50 mV step.
• Overdischarge detection voltage
2.0 V to 3.0 V (applicable in 10 mV step)
Accuracy: ±50 mV
• Overdischarge hysteresis voltage
0.0 V to 0.7 V*2
Accuracy: ±50 mV
The overdischarge hysteresis voltage can be selected from the range 0.0 V to 0.7 V in 100 mV step.
• Overcurrent 1 detection voltage
0.05 V to 0.3 V (applicable in 10 mV step) Accuracy: ±15 mV
• Overcurrent 2 detection voltage
0.5 V (fixed)
Accuracy: ±100 mV
(2) High voltage device is used for charger connection pins (VM and CO pins: absolute maximum rating = 28 V).
(3) Delay times (overcharge: tCU, overdischarge: tDL, overcurrent 1: tlOV1, overcurrent 2: tlOV2) are generated by an internal
circuit. No external capacitor is necessary.
Accuracy: ±20%
(4) Three-step overcurrent detection circuit is included (overcurrent 1, overcurrent 2 and load short-circuiting).
(5) 0 V battery charge function “Available” / “Unavailable” are selectable.
(6) Power-down function “Yes” / “No” are selectable.
(7) Charger detection function and abnormal charge current detection function
• The overdischarge hysteresis is released by detecting negative voltage at the VM pin (−0.7 V typ.) (Charger detection function).
• When the output voltage of the DO pin is high and the voltage at the VM pin is equal to or lower than the charger detection
voltage (−0.7 V typ.), the output voltage of the CO pin goes low (Abnormal charge current detection function).
(8) Low current consumption
• Operation mode
3.5 µA typ., 7.0 µA max.
• Power-down mode
0.1 µA max.
(9) Wide operating temperature range −40 to +85 °C
(10) Small package SOT-23-6
(11) Lead-free product
*1. Overcharge release voltage = Overcharge detection voltage − Overcharge hysteresis voltage (where overcharge
release voltage < 3.8 V is prohibited.)
*2. Overdischarge release voltage = Overdischarge detection voltage + Overdischarge hysteresis voltage (where
overdischarge release voltage > 3.4 V is prohibited.)
„ Applications
• Lithium-ion rechargeable battery packs
• Lithium polymer rechargeable battery packs
„ Package
Package name
SOT-23-6
Package
MP006-A
Drawing code
Tape
MP006-A
Seiko Instruments Inc.
Reel
MP006-A
1
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
„ Block Diagram
DP
Output control circuit
0 V battery charge circuit
or 0 V battery charge
inhibition circuit
DO
Divider control
circuit
Oscillator control
circuit
VDD
+
Charger detection circuit
CO
−
+
−
Overcharge
detection
comparator
Overcurrent 1
detection comparator
RVMD
+
VM
−
RVMS
Overcurrent 2
detection comparator
Load short-circuiting detection
comparator
Remark All the diodes shown in the figure are parasitic diodes.
Figure 1
2
−
Overdischarge
detection
comparator
+
−
+
Seiko Instruments Inc.
VSS
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
„ Product Name Structure
1. Product Name
S-8261A
xx
MD
-
xxx
T2
G
IC direction in tape specifications*1
T2: SOT-23-6
Product name (abbreviation)*2
Package name (abbreviation)
MD: SOT-23-6
Serial code
Assigned from AA to ZZ in alphabetical order
*1. Refer to the taping specifications.
*2. Refer to the Product Name List.
Seiko Instruments Inc.
3
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
2. Product Name List
Table 1
Model No.
Overcharge Overcharge Overdischarge Overdischarge Overcurrent 1
detection
hysteresis
detection
hysteresis
detection
voltage
voltage
voltage
voltage
voltage
VCU
VHC
VDL
VHD
VIOV1
0 V battery
charge
function
Delay
time
combi*1
nation
S-8261AAGMD-G2GT2G
S-8261AAHMD-G2HT2G
S-8261AAJMD-G2JT2G
S-8261AALMD-G2LT2G
S-8261AAMMD-G2MT2G
S-8261AANMD-G2NT2G
S-8261AAOMD-G2OT2G
S-8261AAPMD-G2PT2G
S-8261AARMD-G2RT2G
S-8261AASMD-G2ST2G
S-8261AATMD-G2TT2G
S-8261AAUMD-G2UT2G
4.280 V
4.280 V
4.325 V
4.300 V
4.300 V
4.275 V
4.280 V
4.325 V
4.280 V
4.280 V
4.300 V
4.275 V
0.20 V
0.20 V
0.25 V
0.10 V
0.10 V
0.10 V
0.20 V
0.25 V
0.20 V
0.20 V
0.10 V
0.10 V
2.30 V
2.30 V
2.50 V
2.30 V
2.30 V
2.30 V
2.30 V
2.50 V
2.30 V
2.30 V
2.30 V
2.30 V
0V
0V
0.4 V
0V
0V
0.1 V
0V
0.4 V
0V
0V
0V
0.1 V
0.16 V
0.08 V
0.15 V
0.08 V
0.20 V
0.10 V
0.13 V
0.10 V
0.10 V
0.15 V
0.08 V
0.10 V
Available
Available
Unavailable
Unavailable
Unavailable
Available
Unavailable
Unavailable
Available
Unavailable
Available
Available
(1)
(1)
(1)
(1)
(1)
(1)
(1)
(1)
(1)
(2)
(3)
(4)
S-8261AAXMD-G2XT2G
S-8261AAZMD-G2ZT2G
S-8261ABAMD-G3AT2G
S-8261ABBMD-G3BT2G
S-8261ABCMD-G3CT2G
S-8261ABIMD-G3IT2G
S-8261ABJMD-G3JT2G
S-8261ABKMD-G3KT2G
S-8261ABLMD-G3LT2G
S-8261ABMMD-G3MT2G
S-8261ABNMD-G3NT2G
S-8261ABPMD-G3PT2G
S-8261ABRMD-G3RT2G
S-8261ABSMD-G3ST2G
S-8261ABTMD-G3TT2G
S-8261ABYMD-G3YT2G
S-8261ABZMD-G3ZT2G
S-8261ACAMD-G4AT2G
S-8261ACBMD-G4BT2G
S-8261ACDMD-G4DT2G
S-8261ACEMD-G4ET2G
S-8261ACFMD-G4FT2G
S-8261ACHMD-G4HT2G
S-8261ACIMD-G4IT2G
S-8261ACMMD-G4MT2G
4.350 V
4.280 V
4.350 V
4.275 V
4.300 V
4.275 V
4.280 V
4.100 V
4.275 V
4.280 V
4.300 V
4.200 V
4.275 V
4.280 V
4.280 V
4.275 V
4.325 V
4.280 V
4.250 V
4.350 V
3.900 V
4.280 V
4.465 V
4.250 V
4.325 V
0.10 V
0.25 V
0.20 V
0.20 V
0.20 V
0.20 V
0.20 V
0.25 V
0.20 V
0.20 V
0.20 V
0.10 V
0.20 V
0.10 V
0.20 V
0.10 V
0.25 V
0.20 V
0.20 V
0.25 V
0.10 V
0.20 V
0.30 V
0.20 V
0.20 V
2.30 V
2.50 V
2.50 V
2.30 V
2.30 V
2.30 V
3.00 V
2.50 V
2.30 V
2.80 V
2.30 V
2.80 V
2.50 V
2.50 V
3.00 V
2.30 V
2.50 V
2.30 V
2.60 V
2.30 V
2.00 V
2.30 V
2.10 V
2.40 V
3.00 V
0.1 V
0.4 V
0V
0V
0V
0V
0V
0.4 V
0V
0V
0V
0.1 V
0.4 V
0.5 V
0.4 V
0.1 V
0.4 V
0V
0.3 V
0.7 V
0.3 V
0V
0V
0.5 V
0.4 V
0.10 V
0.10 V
0.20 V
0.13 V
0.13 V
0.20 V
0.08 V
0.15 V
0.05 V
0.10 V
0.06 V
0.15 V
0.15 V
0.18 V
0.08 V
0.10 V
0.15 V
0.13 V
0.12 V
0.25 V
0.10 V
0.10 V
0.15 V
0.10 V
0.06 V
Available
Unavailable
Available
Available
Available
Unavailable
Available
Unavailable
Unavailable
Available
Available
Unavailable
Unavailable
Unavailable
Available
Available
Unavailable
Unavailable
Unavailable
Available
Available
Available
Available
Available
Unavailable
(4)
(1)
(4)
(1)
(1)
(5)
(1)
(1)
(5)
(1)
(1)
(1)
(1)
(1)
(5)
(6)
(6)
(6)
(1)
(7)
(1)
(8)
(9)
(1)
(1)
Power down
function
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
No
Yes
Yes
Yes
Yes
No
Yes
*1. Refer to the Table 2 about the details of the delay time combinations (1) to (9).
Remark Please contact our sales office for the products with detection voltage value other than those specified above.
4
Seiko Instruments Inc.
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
Table 2
Delay time
combination
Overcharge
detection
delay time
tCU
Overdischarge
detection
delay time
tDL
(1)
1.2 s
144 ms
9 ms
2.24 ms
320 µs
(2)
1.2 s
144 ms
4.5 ms
2.24 ms
320 µs
(3)
4.6 s
36 ms
18 ms
9 ms
320 µs
(4)
4.6 s
144 ms
9 ms
2.24 ms
320 µs
(5)
1.2 s
36 ms
9 ms
2.24 ms
320 µs
(6)
1.2 s
144 ms
9 ms
1.12 ms
320 µs
(7)
1.2 s
290 ms
18 ms
2.24 ms
320 µs
(8)
1.2 s
144 ms
18 ms
2.24 ms
320 µs
(9)
0.3 s
36 ms
9 ms
1.12 ms
320 µs
Overcurrent 1
detection
delay time
tlOV1
Overcurrent 2
detection
delay time
tlOV2
Load short-circuiting
detection
delay time
tSHORT
Remark The delay times can be changed within the range listed Table 3. For details, please contact our sales office.
Table 3
Delay time
Symbol
Selection range
Overcharge detection delay time
tCU
0.15 s
1.2 s
4.6 s
Overdischarge detection delay time
tDL
36 ms
144 ms
290 ms
Overcurrent 1 detection delay time
tlOV1
4.5 ms
9 ms
18 ms
Overcurrent 2 detection delay time
tlOV1
1.12 ms
2.24 ms

Load short-circuiting detection delay time
tSHORT

320 µs
600 µs
Remark The value surrounded by bold lines is the delay time of the standard products.
Seiko Instruments Inc.
Remarks
Choose from the left.
Choose from the left.
Choose from the left.
Choose from the left.
Choose from the left.
5
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
„ Pin Configuration
SOT-23-6
Top view
6 5 4
1
2
3
Figure 2
6
Table 4
Pin No.
Symbol
1
DO
2
VM
3
CO
4
5
6
DP
VDD
VSS
Description
FET gate control pin for discharge
(CMOS output)
Voltage detection pin between VM and VSS
(Overcurrent detection pin)
FET gate control pin for charge
(CMOS output)
Test pin for delay time measurement
Positive power input pin
Negative power input pin
Seiko Instruments Inc.
Rev.4.4_00
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
„ Absolute Maximum Ratings
Table 5
Item
Symbol

VSS −0.3 to VSS +12
VDD −28 to VDD +0.3
VVM −0.3 to VDD+0.3
VSS −0.3 to VDD +0.3
250 (When not mounted on board)
*1
650
−40 to +85
V
V
V
V
mW
mW
°C

−55 to +125
°C
Input voltage between VDD and VSS
Input pin voltage for VM
Output pin voltage for CO
Output pin voltage for DO
VDS
VVM
VCO
VDO
VDD
VM
CO
DO
Power dissipation
PD

Operating temperature range
Topr
Storage temperature
Tstg
*1. When mounted on board
[Mounted board]
(1) Board size : 114.3 mm × 76.2 mm × t1.6 mm
(2) Board name : JEDEC STANDARD51-7
Caution
The absolute maximum ratings are rated values exceeding which the product could suffer physical
damage. These values must therefore not be exceeded under any conditions.
(2) When not mounted on board
600
Power dissipation (PD) [mW]
(1) When mounted on board
700
Power dissipation (PD) [mW]
(Ta = 25 °C unless otherwise specified)
Absolute Maximum Ratings
Unit
Applied pin
600
500
400
300
200
100
0
0
500
400
300
200
100
100
150
50
Ambient temperature (Ta) [°C]
Figure 3
0
0
150
100
50
Ambient temperature (Ta) [°C]
Power Dissipation of Package
Seiko Instruments Inc.
7
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
„ Electrical Characteristics
1. Except Detection Delay Time (25 °C)
Table 6
Item
Symbol
Condition
Min.
(Ta = 25 °C unless otherwise specified)
Test
Test
Typ.
Max.
Unit
Condition Circuit
DETECTION VOLTAGE
Overcharge detection voltage
VCU = 3.9 V to 4.4 V, 5 mV Step

VCU
Ta = −5 to 55 °C*1
VCU
−0.025
VCU
−0.030
VHC
−0.025
VDL
−0.050
VHD
−0.050
VIOV1
−0.015
0.4
0.9
−1.0
VCU
VCU
VCU
+0.025
VCU
+0.030
VHC
+0.025
VDL
+0.050
VHD
+0.050
VIOV1
+0.015
0.6
1.5
−0.4
V
1
1
V
1
1
1
1
2
2
2
2
3
2
3
3
4
2
2
2




5
5
2
2
5
5
2
2
7
7
8
8
4
4
4
4
6
6
3
3
Overcharge hysteresis voltage
VHC
V
VHC

VHC = 0.1 V to 0.4 V, 50 mV Step
Overdischarge detection voltage
VDL
V
VDL

VDL = 2.0 V to 3.0 V, 10 mV Step
Overdischarge hysteresis voltage
VHD
V
VHD

VHD = 0.0 V to 0.7 V, 100 mV Step
Overcurrent 1 detection voltage
V
VIOV1
VIOV1

VIOV1 = 0.05 V to 0.3 V, 10 mV Step
Overcurrent 2 detection voltage
VIOV2

0.5
V
Load short-circuiting detection voltage
VSHORT

1.2
V
Charger detection voltage
VCHA

−0.7
V
INPUT VOLTAGE, OPERATION VOLTAGE
Operation voltage between VDD and VSS VDSOP1 Internal circuit operating voltage
1.5

8
V
Operation voltage between VDD and VM
VDSOP2 Internal circuit operating voltage
1.5

28
V
CURRENT CONSUMPTION (with power-down function)
Current consumption in normal operation
IOPE
VDD = 3.5 V, VVM = 0 V
1.0
3.5
7.0
µA
Current consumption at power down
IPDN
VDD = VVM = 1.5 V


0.1
µA
CURRENT CONSUMPTION (without power-down function)
Current consumption in normal operation
IOPE
VDD = 3.5 V, VVM = 0 V
1.0
3.5
7.0
µA
Overdischarge current consumption
IOPED
VDD = VVM = 1.5 V
1.0
3.0
5.5
µA
OUTPUT RESISTANCE
CO pin resistance “H”
RCOH
VCO = 3.0 V, VDD = 3.5 V, VVM = 0 V
2.5
5
10
kΩ
CO pin resistance “L”
RCOL
VCO = 0.5 V, VDD = 4.5 V, VVM = 0 V
2.5
5
10
kΩ
DO pin resistance “H”
RDOH
VDO = 3.0 V, VDD = 3.5 V, VVM = 0 V
2.5
5
10
kΩ
DO pin resistance “L”
RDOL
VDO = 0.5 V, VDD = VVM = 1.8 V
2.5
5
10
kΩ
VM INTERNAL RESISTANCE
Internal resistance between VM and VDD
RVMD
VDD = 1.8 V, VVM = 0 V
100
300
900
kΩ
Internal resistance between VM and VSS
RVMS
VDD = 3.5 V, VVM = 1.0 V
10
20
40
kΩ
0 V BATTERY CHARGING FUNCTION
0 V battery charge starting charger voltage V0CHA 0 V battery charging available
1.2


V
0 V battery charge inhibition battery voltage V0INH
0 V battery charging unavailable


0.5
V
*1. Since products are not screened at high and low temperatures, the specification for this temperature range
by design, not tested in production.
8
Seiko Instruments Inc.
11
2
12
2
is guaranteed
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
2. Except Detection Delay Time (−40 to +85 °C*1)
Table 7
(Ta = −40 to +85 °C*1 unless otherwise specified)
Item
Symbol
Condition
DETECTION VOLTAGE
Overcharge detection voltage
VCU

VCU = 3.9 V to 4.4 V, 5 mV Step
Overcharge hysteresis voltage
VHC

VHC = 0.1 V to 0.4 V, 50 mV Step
Overdischarge detection voltage
VDL

VDL = 2.0 V to 3.0 V, 10 mV Step
Overdischarge hysteresis voltage
VHD

VHD = 0.0 V to 0.7 V, 100 mV Step
Overcurrent 1 detection voltage
VIOV1

VIOV1 = 0.05 V to 0.3 V, 10 mV Step
Overcurrent 2 detection voltage
VIOV2

Load short-circuiting detection voltage
VSHORT

Charger detection voltage
VCHA

INPUT VOLTAGE, OPERATION VOLTAGE
Operation voltage between VDD and VSS
VDSOP1 Internal circuit operating voltage
Operation voltage between VDD and VM
VDSOP2 Internal circuit operating voltage
[CURRENT CONSUMPTION] with power-down function
Current consumption in normal operation
IOPE
VDD = 3.5 V, VVM = 0 V
Current consumption at power down
IPDN
VDD = VVM = 1.5 V
[CURRENT CONSUMPTION] without power-down function
Current consumption in normal operation
IOPE
VDD = 3.5 V, VVM = 0 V
Overdischarge current consumption
IOPED
VDD = VVM = 1.5 V
OUTPUT RESISTANCE
CO pin resistance “H”
RCOH
VCO = 3.0 V, VDD = 3.5 V, VVM = 0 V
CO pin resistance “L”
RCOL
DO pin resistance “H”
RDOH
DO pin resistance “L”
RDOL
VM INTERNAL RESISTANCE
Internal resistance between VM and VDD
RVMD
Internal resistance between VM and VSS
RVMS
0 V BATTERY CHARGING FUNCTION
0 V battery charge starting charger voltage V0CHA
0 V battery charge inhibition battery voltage V0INH
*1. Since products are not screened at high
by design, not tested in production.
Min.
VCU
−0.055
VHC
−0.025
VDL
−0.080
VHD
−0.050
VIOV1
−0.021
0.37
0.7
−1.2
Typ.
Max.
0.5
1.2
−0.7
VCU
+0.040
VHC
+0.025
VDL
+0.080
VHD
+0.050
VIOV1
+0.021
0.63
1.7
−0.2
1.5
1.5


0.7

VCU
Unit
Test
Test
Condition Circuit
V
1
1
V
1
1
V
2
2
V
2
2
V
3
2
V
V
V
3
3
4
2
2
2
8
28
V
V




3.5

8.0
0.1
µA
µA
5
5
2
2
0.7
0.7
3.5
3.0
8.0
6.0
µA
µA
5
5
2
2
1.2
5
15
kΩ
7
4
VCO = 0.5 V, VDD = 4.5 V, VVM = 0 V
1.2
5
15
kΩ
7
4
VDO = 3.0 V, VDD = 3.5 V, VVM = 0 V
VDO = 0.5 V, VDD = VVM = 1.8 V
1.2
1.2
5
5
15
15
kΩ
kΩ
8
8
4
4
VDD = 1.8 V, VVM = 0 V
VDD = 3.5 V, VVM = 1.0 V
78
7.2
300
20
1310
44
kΩ
kΩ
6
6
3
3
VHC
VDL
VHD
VIOV1
0 V battery charging available
1.7


V
11
2
0 V battery charging unavailable


0.3
V
12
2
and low temperatures, the specification for this temperature range is guaranteed
Seiko Instruments Inc.
9
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
3. Detection Delay Time
(1)
S-8261AAG, S-8261AAH, S-8261AAJ, S-8261AAL, S-8261AAM, S-8261AAN, S-8261AAO, S-8261AAP,
S-8261AAR, S-8261AAZ, S-8261ABB, S-8261ABC, S-8261ABJ, S-8261ABK, S-8261ABM, S-8261ABN,
S-8261ABP, S-8261ABR, S-8261ABS, S-8261ACB, S-8261ACE, S-8261ACI, S-8261ACM
Table 8
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Test
Condition Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
tCU

0.96
1.2
1.4
s
9
5
Overdischarge detection delay time
tDL

115
144
173
ms
9
5
Overcurrent 1 detection delay time
tlOV1

7.2
9
11
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.8
2.24
2.7
ms
10
5
Load short-circuiting detection delay time tSHORT

220
320
380
µs
10
5
DELAY TIME (Ta = −40 to +85°C) *1
Overcharge detection delay time
tCU

0.7
1.2
2.0
s
9
5
Overdischarge detection delay time
tDL

80
144
245
ms
9
5
Overcurrent 1 detection delay time
tlOV1

5
9
15
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.2
2.24
3.8
ms
10
5
Load short-circuiting detection delay time tSHORT

150
320
540
µs
10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
(2)
S-8261AAS
Table 9
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Test
Condition Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
tCU

0.96
1.2
1.4
s
9
5
Overdischarge detection delay time
tDL

115
144
173
ms
9
5
Overcurrent 1 detection delay time
tlOV1

3.6
4.5
5.4
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.8
2.24
2.7
ms
10
5
Load short-circuiting detection delay time tSHORT

220
320
380
µs
10
5
DELAY TIME (Ta = −40 to +85°C) *1
Overcharge detection delay time
tCU

0.7
1.2
2.0
s
9
5
Overdischarge detection delay time
tDL

80
144
245
ms
9
5
Overcurrent 1 detection delay time
tlOV1

2.5
4.5
7.7
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.2
2.24
3.8
ms
10
5
Load short-circuiting detection delay time tSHORT

150
320
540
µs
10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
10
Seiko Instruments Inc.
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
(3)
S-8261AAT
Table 10
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Test
Condition Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
tCU

3.7
4.6
5.5
s
9
5
Overdischarge detection delay time
tDL

29
36
43
ms
9
5
Overcurrent 1 detection delay time
tlOV1

14
18
22
ms
10
5
Overcurrent 2 detection delay time
tlOV2

7.2
9
11
ms
10
5
Load short-circuiting detection delay time tSHORT

220
320
380
µs
10
5
*1
DELAY TIME (Ta = −40 to +85°C)
Overcharge detection delay time
tCU

2.5
4.6
7.8
s
9
5
Overdischarge detection delay time
tDL

20
36
61
ms
9
5
Overcurrent 1 detection delay time
tlOV1

10
18
31
ms
10
5
Overcurrent 2 detection delay time
tlOV2

5
9
15
ms
10
5
Load short-circuiting detection delay time tSHORT

150
320
540
µs
10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
(4)
S-8261AAU, S-8261AAX, S-8261ABA
Table 11
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Test
Condition Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
tCU

3.7
4.6
5.5
s
9
5
Overdischarge detection delay time
tDL

115
144
173
ms
9
5
Overcurrent 1 detection delay time
tlOV1

7.2
9
11
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.8
2.24
2.7
ms
10
5
Load short-circuiting detection delay time tSHORT

220
320
380
µs
10
5
DELAY TIME (Ta = −40 to +85°C) *1
Overcharge detection delay time
tCU

2.5
4.6
7.8
s
9
5
Overdischarge detection delay time
tDL

80
144
245
ms
9
5
Overcurrent 1 detection delay time
tlOV1

5
9
15
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.2
2.24
3.8
ms
10
5
Load short-circuiting detection delay time tSHORT

150
320
540
µs
10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
Seiko Instruments Inc.
11
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
(5)
Rev.4.4_00
S-8261ABI, S-8261ABL, S-8261ABT
Table 12
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
condition
Test
circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
tCU

0.96
1.2
1.4
s
9
5
Overdischarge detection delay time
tDL

29
36
43
ms
9
5
Overcurrent 1 detection delay time
tlOV1

7.2
9
11
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.8
2.24
2.7
ms
10
5
Load short-circuiting detection delay time tSHORT

220
320
380
µs
10
5
*1
DELAY TIME (Ta = −40 to +85°C)
Overcharge detection delay time
tCU

0.7
1.2
2.0
s
9
5
Overdischarge detection delay time
tDL

20
36
61
ms
9
5
Overcurrent 1 detection delay time
tlOV1

5
9
15
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.2
2.24
3.8
ms
10
5
Load short-circuiting detection delay time tSHORT

150
320
540
µs
10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
(6)
S-8261ABY, S-8261ABZ, S-8261ACA
Table 13
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Test
Condition Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
tCU

0.96
1.2
1.4
s
9
5
Overdischarge detection delay time
tDL

115
144
173
ms
9
5
Overcurrent 1 detection delay time
tlOV1

7.2
9
11
ms
10
5
Overcurrent 2 detection delay time
tlOV2

0.89
1.12
1.35 ms
10
5
Load short-circuiting detection delay time tSHORT

220
320
380
µs
10
5
DELAY TIME (Ta = −40 to +85°C) *1
Overcharge detection delay time
tCU

0.7
1.2
2
s
9
5
Overdischarge detection delay time
tDL

80
144
245
ms
9
5
Overcurrent 1 detection delay time
tlOV1

5
9
15
ms
10
5
Overcurrent 2 detection delay time
tlOV2

0.61
1.12
1.91 ms
10
5
Load short-circuiting detection delay time tSHORT

150
320
540
µs
10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
12
Seiko Instruments Inc.
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
(7)
S-8261ACD
Table 14
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Test
Condition Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
tCU

0.96
1.2
1.4
s
9
5
Overdischarge detection delay time
tDL

232
290
348
ms
9
5
Overcurrent 1 detection delay time
tlOV1

14
18
22
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.8
2.24
2.7
ms
10
5
Load short-circuiting detection delay time tSHORT

220
320
380
µs
10
5
*1
DELAY TIME (Ta = −40 to +85°C)
Overcharge detection delay time
tCU

0.7
1.2
2
s
9
5
Overdischarge detection delay time
tDL

160
290
493
ms
9
5
Overcurrent 1 detection delay time
tlOV1

10
18
31
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.2
2.24
3.8
ms
10
5
Load short-circuiting detection delay time tSHORT

150
320
540
µs
10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
(8)
S-8261ACF
Table 15
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Test
Condition Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
tCU

0.96
1.2
1.4
s
9
5
Overdischarge detection delay time
tDL

115
144
173
ms
9
5
Overcurrent 1 detection delay time
tlOV1

14
18
22
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.8
2.24
2.7
ms
10
5
Load short-circuiting detection delay time tSHORT

220
320
380
µs
10
5
DELAY TIME (Ta = −40 to +85°C) *1
Overcharge detection delay time
tCU

0.7
1.2
2
s
9
5
Overdischarge detection delay time
tDL

80
144
245
ms
9
5
Overcurrent 1 detection delay time
tlOV1

10
18
31
ms
10
5
Overcurrent 2 detection delay time
tlOV2

1.2
2.24
3.8
ms
10
5
Load short-circuiting detection delay time tSHORT

150
320
540
µs
10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
Seiko Instruments Inc.
13
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
(9)
Rev.4.4_00
S-8261ACH
Table 16
Item
Symbol
Condition
Min.
Typ.
Max.
Unit
Test
Test
Condition Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
tCU

0.24
0.3
0.36
s
9
5
Overdischarge detection delay time
tDL

29
36
43
ms
9
5
Overcurrent 1 detection delay time
tlOV1

7.2
9
11
ms
10
5
Overcurrent 2 detection delay time
tlOV2

0.89
1.12
1.35
ms
10
5
Load short-circuiting detection delay time tSHORT

220
320
380
µs
10
5
*1
DELAY TIME (Ta = −40 to +85°C)
Overcharge detection delay time
tCU

0.17
0.3
0.51
s
9
5
Overdischarge detection delay time
tDL

20
36
61
ms
9
5
Overcurrent 1 detection delay time
tlOV1

5
9
15
ms
10
5
Overcurrent 2 detection delay time
tlOV2

0.61
1.12
1.91
ms
10
5
Load short-circuiting detection delay time tSHORT

150
320
540
µs
10
5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
14
Seiko Instruments Inc.
Rev.4.4_00
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
„ Test Circuits
Caution
Unless otherwise specified, the output voltage levels “H” and “L” at CO pin (VCO) and DO pin (VDO) are
judged by the threshold voltage (1.0 V) of the N-channel FET. Judge the CO pin level with respect to
VVM and the DO pin level with respect to VSS.
(1) Test Condition 1, Test Circuit 1
(Overcharge Detection Voltage, Overcharge Hysteresis Voltage)
The overcharge detection voltage (VCU) is defined as the voltage between VDD and VSS at which VCO goes from “H”
to “L” when the voltage V1 is gradually increased from the starting condition of V1 = 3.5 V. The overcharge
hysteresis voltage (VHC) is then defined as the difference between the overcharge detection voltage (VCU) and the
voltage between VDD and VSS at which VCO goes from “L” to “H” when the voltage V1 is gradually decreased.
(2) Test Condition 2, Test Circuit 2
(Overdischarge Detection Voltage, Overdischarge Hysteresis Voltage)
The overdischarge detection voltage (VDL) is defined as the voltage between VDD and VSS at which VDO goes from
“H” to “L” when the voltage V1 is gradually decreased from the starting condition of V1 = 3.5 V and V2 = 0 V. The
overdischarge hysteresis voltage (VHD) is then defined as the difference between the overdischarge detection voltage
(VDL) and the voltage between VDD and VSS at which VDO goes from “L” to “H” when the voltage V1 is gradually
increased.
(3) Test Condition 3, Test Circuit 2
(Overcurrent 1 Detection Voltage, Overcurrent 2 Detection Voltage, Load Short-Circuiting Detection Voltage)
The overcurrent 1 detection voltage (VIOV1) is defined as the voltage between VM and VSS whose delay time for
changing VDO from “H” to “L” lies between the minimum and the maximum value of the overcurrent 1 detection delay
time when the voltage V2 is increased rapidly (within 10 µs) from the starting condition V1 = 3.5 V and V2 = 0 V.
The overcurrent 2 detection voltage (VIOV2) is defined as the voltage between VM and VSS whose delay time for
changing VDO from “H” to “L” lies between the minimum and the maximum value of the overcurrent 2 detection delay
time when the voltage V2 is increased rapidly (within 10 µs) from the starting condition V1 = 3.5 V and V2 = 0 V.
The load short-circuiting detection voltage (VSHORT) is defined as the voltage between VM and VSS whose delay time
for changing VDO from “H” to “L” lies between the minimum and the maximum value of the load short-circuiting
detection delay time when the voltage V2 is increased rapidly (within 10 µs) from the starting condition V1 = 3.5 V and
V2 = 0 V.
(4) Test Condition 4, Test Circuit 2
(Charger Detection Voltage, Abnormal Charge Current Detection Voltage)
The charger detection voltage (VCHA) is defined as the voltage between VM and VSS at which VDO goes from “L” to “H”
when the voltage V2 is gradually decreased from 0 V after the voltage V1 is gradually increased from the starting
condition of V1 = 1.8 V and V2 = 0 V until the voltage V1 becomes V1 = VDL + (VHD / 2).
The charger detection voltage can be measured only in the product whose overdischarge hysteresis VHD ≠ 0.
Set V1 = 3.5 V and V2 = 0 V. Decrease V2 from 0 V gradually. The voltage between VM and VSS when VCO goes
from “H” to “L” is the abnormal charge current detection voltage. The abnormal charge current detection voltage has
the same value as the charger detection voltage (VCHA).
(5) Test Condition 5, Test Circuit 2
(Normal Operation Current Consumption, Power-Down Current Consumption, Overdischarge Current Consumption)
For products with power-down function
The operating current consumption (IOPE) is the current that flows through the VDD pin (IDD) under the set conditions of
V1 = 3.5 V and V2 = 0 V (Normal condition).
The power-down current consumption (IPDN) is the current that flows through the VDD pin (IDD) under the set conditions
of V1 = V2 = 1.5 V (Overdischarge condition).
For products without power-down function
The operating current consumption (IOPE) is the current that flows through the VDD pin (IDD) under the set conditions of
V1 = 3.5 V and V2 = 0 V (Normal condition).
The Overdischarge current consumption (IOPED) is the current that flows through the VDD pin (IDD) under the set
conditions of V1 = V2 = 1.5 V (Overdischarge condition).
Seiko Instruments Inc.
15
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
(6) Test Condition 6, Test Circuit 3
(Internal Resistance between VM and VDD, Internal Resistance between VM and VSS)
The resistance between VM and VDD (RVMD) is the internal resistance between VM and VDD under the set conditions
of V1 = 1.8 V and V2 = 0 V.
The resistance between VM and VSS (RVMS) is the internal resistance between VM and VSS under the set conditions
of V1 = 3.5 V and V2 = 1.0 V.
(7) Test Condition 7, Test Circuit 4
(CO Pin Resistance “H”, CO Pin Resistance “L”)
The CO pin resistance “H” (RCOH) is the resistance the CO pin under the set condition of V1 = 3.5 V, V2 = 0 V and V3
= 3.0 V.
The CO pin resistance “L” (RCOL) is the resistance the CO pin under the set condition of V1 = 4.5 V, V2 = 0 V and V3 =
0.5 V.
(8) Test Condition 8, Test Circuit 4
(DO Pin Resistance “H”, DO Pin Resistance “L”)
The DO pin resistance “H” (RDOH) is the resistance the DO pin under the set condition of V1 = 3.5 V, V2 = 0 V and V4
= 3.0 V.
The DO pin resistance “L” (RDOL) is the resistance the DO pin under the set condition of V1 = 1.8 V, V2 = 0 V and V4 =
0.5 V.
(9) Test Condition 9, Test Circuit 5
(Overcharge Detection Delay Time, Overdischarge Detection Delay Time)
The overcharge detection delay time (tCU) is the time needed for VCO to change from “H” to “L” just after the voltage V1
momentarily increases (within 10 µs) from the overcharge detection voltage (VCU) − 0.2 V to the overcharge detection
voltage (VCU) + 0.2 V under the set condition of V2 = 0 V.
The overdischarge detection delay time (tDL) is the time needed for VDO to change from “H” to “L” just after the voltage
V1 momentarily decreases (within 10 µs) from the overdischarge detection voltage (VDL) +0.2 V to the overdischarge
detection voltage (VDL) − 0.2 V under the set condition of V2 = 0 V.
(10) Test Condition 10, Test Circuit 5
(Overcurrent 1 Detection Delay Time, Overcurrent 2 Detection Delay Time, Load Short-circuiting Detection
Delay Time, Abnormal Charge Current Detection Delay Time)
The overcurrent 1 detection delay time (tIOV1) is the time needed for VDO to go “L” after the voltage V2 momentarily
increases (within 10 µs) from 0 V to 0.35 V under the set condition of V1 = 3.5 V and V2=0 V.
The overcurrent 2 detection delay time (tIOV2) is the time needed for VDO to go “L” after the voltage V2 momentarily
increases (within 10 µs) from 0 V to 0.7 V under the set condition of V1 = 3.5 V and V2 = 0 V.
The load short-circuiting detection delay time (tSHORT) is the time needed for VDO to go “L” after the voltage V2
momentarily increases (within 10 µs) from 0 V to 1.6 V under the set condition of V1 = 3.5 V and V2 = 0 V.
The abnormal charge current detection delay time is the time needed for VCO to go from “H” to “L” after the voltage V2
momentarily decreases (within 10 µs) from 0 V to −1.1 V under the set condition of V1 = 3.5 V and V2 = 0 V. The
abnormal charge current detection delay time has the same value as the overcharge detection delay time.
(11) Test Condition 11, Test Circuit 2 (Product with 0 V battery charge function)
(0 V Battery Charge Starting Charger Voltage)
The 0 V battery charge starting charger voltage (V0CHA) is defined as the voltage between VDD and VM at which VCO
goes “H” (VVM + 0.1 V or higher) when the voltage V2 is gradually decreased from the starting condition of V1 = V2 = 0
V.
(12) Test Condition 12, Test Circuit 2 (Product with 0 V battery charge inhibition function)
(0 V Battery Charge Inhibition Battery Voltage)
The 0 V battery charge inhibition battery voltage (V0INH) is defined as the voltage between VDD and VSS at which VCO
goes “H” (VVM + 0.1 V or higher) when the voltage V1 is gradually increased from the starting condition of V1 = 0 V and
V2 = −4 V.
16
Seiko Instruments Inc.
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
IDD
A
R1 = 470 Ω
VDD
DP
DP
S-8261 Series
V1
S-8261 Series
V1
VDD
VM
VM
VSS
DO
VSS
DO
CO
V VDO
V VDO
V VCO
V VCO
V2
COM
COM
Test Circuit 1
IDD
A
CO
Test Circuit 2
VDD
VDD
DP
S-8261 Series
V1
S-8261 Series
V1
VM
VM
VSS
DO
DP
VSS
DO
A IVM
CO
CO
A IDO
V2
V4
A ICO
V2
V3
COM
COM
Test Circuit 3
Test Circuit 4
DP
VDD
S-8261 Series
V1
VM
VSS
DO
Oscilloscope
CO
Oscilloscope
V2
COM
Test Circuit 5
Figure 4
Seiko Instruments Inc.
17
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
„ Operation
Remark Refer to the “„ Battery Protection IC Connection Example”.
1. Normal Condition
The S-8261 Series monitors the voltage of the battery connected between VDD pin and VSS pin and the voltage
difference between VM pin and VSS pin to control charging and discharging. When the battery voltage is in the range
from the overdischarge detection voltage (VDL) to the overcharge detection voltage (VCU), and the VM pin voltage is in
the range from the charger detection voltage (VCHA) to the overcurrent 1 detection voltage (VIOV1), the IC turns both the
charging and discharging control FETs on. This condition is called the normal condition, and in this condition charging
and discharging can be carried out freely.
Caution
When a battery is connected to the IC for the first time, discharging may not be enabled.
case, short the VM pin and VSS pin or connect the charger to restore the normal condition.
In this
2. Overcurrent Condition (Detection of Overcurrent 1, Overcurrent 2 and Load Short-circuiting)
When a battery in the normal status is in the status where the voltage of the VM pin is equal to or higher than the
overcurrent detection voltage because the discharge current is higher than the specified value and the status lasts for
the overcurrent detection delay time, the discharge control FET is turned off and discharging is stopped. This status is
called the overcurrent status.
In the overcurrent status, the VM and VSS pins are shorted by the resistor between VM and VSS (RVMS) in the IC.
However, the voltage of the VM pin is at the VDD potential due to the load as long as the load is connected. When the
load is disconnected, the VM pin returns to the VSS potential.
This IC detects the status when the impedance between the EB+ pin and EB− pin (Refer to Figure 10) increases and is
equal to the impedance that enables automatic restoration and the voltage at the VM pin returns to overcurrent 1
detection voltage (VIOV1) or lower and the overcurrent status is restored to the normal status.
Caution
The impedance that enables automatic restoration varies depending on the battery voltage and the
set value of overcurrent 1 detection voltage.
3. Overcharge Condition
When the battery voltage becomes higher than the overcharge detection voltage (VCU) during charging under the
normal condition and the detection continues for the overcharge detection delay time (tCU) or longer, the S-8261 Series
turns the charging control FET off to stop charging. This condition is called the overcharge condition.
The overcharge condition is released by the following two cases ((1) and (2)):
(1) When the battery voltage falls below the overcharge release voltage (VCU) − overcharge detection hysteresis
voltage (VHC), the S-8261 Series turns the charging control FET on and turns to the normal condition.
(2) When a load is connected and discharging starts, the S-8261 Series turns the charging control FET on and returns
to the normal condition. Just after the load is connected and discharging starts, the discharging current flows
through the parasitic diode in the charging control FET. At this moment the VM pin potential becomes Vf, the
voltage for the parasitic diode, higher than VSS level. When the battery voltage goes under the overcharge
detection voltage (VCU) and provided that the VM pin voltage is higher than the overcurrent 1 detection voltage, the
S-8261 Series releases the overcharge condition.
Caution 1. If the battery is charged to a voltage higher than the overcharge detection voltage (VCU) and the
battery voltage does not fall below the overcharge detection voltage (VCU) even when a heavy load
is connected, the detection of overcurrent 1, overcurrent 2 and load short-circuiting do not
function until the battery voltage falls below overcharge detection voltage (VCU). Since an actual
battery has an internal impedance of several dozens of mΩ, the battery voltage drops immediately
after a heavy load that causes overcurrent is connected, and the detection of overcurrent 1,
overcurrent 2 and load short-circuiting function.
2. When a charger is connected after the overcharge detection, the overcharge condition is not
released even if the battery voltage is below the overcharge release voltage (VCL). The overcharge
condition is released when the VM pin voltage goes over the charger detection voltage (VCHA) by
removing the charger.
18
Seiko Instruments Inc.
Rev.4.4_00
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
4. Overdischarge Condition
For products with power-down function
When the battery voltage falls below the overdischarge detection voltage (VDL) during discharging under the normal
condition and the detection continues for the overdischarge detection delay time (tDL) or longer, the S-8261 Series turns
the discharging control FET off to stop discharging. This condition is called the overdischarge condition. When the
discharging control FET is turned off, the VM pin voltage is pulled up by the resistor between VM and VDD in the IC
(RVMD). When the voltage difference between the VM and VDD then is 1.3 V (typ.) or lower, the current consumption
is reduced to the power-down current consumption (IPDN). This condition is called the power-down condition.
The power-down condition is released when a charger is connected and the voltage difference between the VM and
VDD becomes 1.3 V (typ.) or higher. Moreover when the battery voltage becomes the overdischarge detection
voltage (VDL) or higher, the S-8261 Series turns the discharging FET on and returns to the normal condition.
For products without power-down function
When the battery voltage falls below the overdischarge detection voltage (VDL) during discharging under the normal
condition and the detection continues for the overdischarge detection delay time (tDL) or longer, the S-8261 Series turns
the discharging control FET off to stop discharging. This condition is called the overdischarge condition. When the
discharging control FET is turned off, the VM pin voltage is pulled up by the resistor between VM and VDD in the IC
(RVMD).
When the battery voltage becomes the overdischarge detection voltage (VDL) or higher, the S-8261 Series turns the
discharging FET on and returns to the normal condition.
5. Charger Detection
When a battery in the overdischarge condition is connected to a charger and provided that the VM pin voltage is lower
than the charger detection voltage (VCHA), the S-8261 Series releases the overdischarge condition and turns the
discharging control FET on when the battery voltage becomes equal to or higher than the overdischarge detection
voltage (VDL) since the charger detection function works. This action is called charger detection.
When a battery in the overdischarge condition is connected to a charger and provided that the VM pin voltage is not
lower than the charger detection voltage (VCHA), the S-8261 Series releases the overdischarge condition when the
battery voltage reaches the overdischarge detection voltage (VDL) + overdischarge hysteresis (VHD) or higher.
6. Abnormal Charge Current Detection
If the VM pin voltage falls below the charger detection voltage (VCHA) during charging under normal condition and it
continues for the overcharge detection delay time (tCU) or longer, the charging control FET turns off and charging stops.
This action is called the abnormal charge current detection.
Abnormal charge current detection works when the DO pin voltage is “H” and the VM pin voltage falls below the
charger detection voltage (VCHA). Consequently, if an abnormal charge current flows to an over-discharged battery,
the S-8261 Series turns the charging control FET off and stops charging after the battery voltage becomes higher than
the overdischarge detection voltage which make the DO pin voltage “H”, and still after the overcharge detection delay
time (tCU) elapses.
Abnormal charge current detection is released when the voltage difference between VM pin and VSS pin becomes less
than charger detection voltage (VCHA).
Seiko Instruments Inc.
19
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
7. Delay Circuits
The detection delay times are determined by dividing a clock of the approximately 3.5 kHz with the counter.
Remark 1. The detection delay time for overcurrent 2 (tIOV2) and load short-circuiting (tSHORT) start when the
overcurrent 1 (VIOV1) is detected. When the overcurrent 2 (VIOV2) or load short-circuiting (VSHORT) is
detected over the detection delay time for each of them (= tIOV2 or tSHORT) after the detection of overcurrent
1 (VIOV1), the S-8261 Series turns the FET off within tIOV2 or tSHORT of each detection.
VDD
DO pin
tD
VSS
Overcurrent 2 detection delay time (tIOV2)
0 ≤ tD ≤ tIOV2
Time
VDD
VIOV2
VM pin
VIOV1
VSS
Time
Figure 5
2. For products with power-down function
When the overcurrent is detected and continues for longer than the overdischarge detection delay time
(tDL) without releasing the load, the condition changes to the power-down condition when the battery
voltage falls below the overdischarge detection voltage (VDL). When the battery voltage falls below the
overdischarge detection voltage (VDL) due to the overcurrent, the S-8261 Series turns the discharging
control FET off by the overcurrent detection. In this case if the recovery of the battery voltage is so slow
that the battery voltage after the overdischarge detection delay time (tDL) is still lower than the
overdischarge detection voltage (VDL), the S-8261 Series shifts to the power-down condition.
For products without power-down function
When the overcurrent is detected and continues for longer than the overdischarge detection delay time
(tDL) without released the load, the condition changes to the overdischarge condition when the battery
voltage falls below overdischarge detection voltage (VDL).When the battery voltage falls below
overdischarge detection voltage (VDL) due to the overcurrent, the S-8261 Series turns the discharging
control FET off by the overcurrent detection. In this case, if the recovery of the battery voltage is so slow
that the battery voltage after the overdischarge detection delay time (tDL) is still lower than the
overdischarge detection voltage (VDL), S-8261 Series shifts to the overdischarge condition.
20
Seiko Instruments Inc.
Rev.4.4_00
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
8. DP Pin
The DP pin is a test pin for delay time measurement and it should be open in the actual application. If a capacitor
whose capacitance is larger than 1000 pF or a resistor whose resistance is less than 1 MΩ is connected to this pin,
error may occur in the delay times or in the detection voltages.
9. 0 V Battery Charging Function “Available”
This function is used to recharge the connected battery whose voltage is 0 V due to the self-discharge. When the 0 V
battery charge starting charger voltage (V0CHA) or higher is applied between EB+ pin and EB− pin by connecting a
charger, the charging control FET gate is fixed to VDD pin voltage. When the voltage between the gate and source of
the charging control FET becomes equal to or higher than the turn-on voltage due to the charger voltage, the charging
control FET is turned on to start charging. At this time, the discharging control FET is off and the charging current
flows through the internal parasitic diode in the discharging control FET. When the battery voltage becomes equal to
or higher than the overdischarge detection voltage (VDL) and the overdischarge hysteresis voltage (VHD), the S-8261
Series enters the normal condition.
Caution
Some battery providers do not recommend charging for completely self-discharged battery. Please
ask battery providers before determine whether to enable or inhibit the 0 V battery charging
function.
Remark
The 0 V battery charge function has higher priority than the abnormal charge current detection function.
Consequently, a product with the 0 V battery charging function is enabled charges a battery forcibly and
abnormal charge current cannot be detected when the battery voltage is low.
10. 0 V Battery Charging Function “Unavailable”
This function inhibits the recharging when a battery that is short-circuited (0 V battery) internally is connected. When
the battery voltage is the 0 V battery charge inhibition battery voltage (V0INH) or lower, the charging control FET gate is
fixed to EB− pin voltage to inhibit charging. When the battery voltage is the 0 V battery charge inhibition battery
voltage (V0INH) or higher, charging can be performed.
Caution
Some battery providers do not recommend charging for completely self-discharged battery.
ask battery providers before determining the 0 V battery charging function.
Seiko Instruments Inc.
Please
21
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
„ Timing Chart
(1) Overcharge and Overdischarge Detection
VCU
VCU–VHC
Battery
voltage
VDL+VHD
VDL
VDD
DO pin
VSS
VDD
CO pin
VSS
VDD
VM pin
VIOV1
VSS
VCHA
Charger connection
Load connection
Overcharge detection delay time (tCU)
Mode
(1)
(2)
Overdischarge detection delay time (tDL)
(1)
(3)
(1)
Remark (1) Normal condition, (2) Overcharge condition, (3) Overdischarge condition, (4) Overcurrent condition
The charger is supposed to charge with constant current.
Figure 6
(2) Overcurrent Detection
Battery
voltage
VCU
VCU−VHC
VDL+VHD
VDL
VDD
DO pin
VSS
VDD
CO pin
VSS
VM pin
VDD
VSHORT
VIOV2
VIOV1
VSS
Charger connection
Load connection
Overcurrent 1 detection delay time (tIOV1)
Mode
(1)
(4)
Overcurrent 2 detection delay time (tIOV2)
(1)
(4)
(1)
Load short-circuiting detection delay time (tSHORT)
(4)
Remark (1) Normal condition, (2) Overcharge condition, (3) Overdischarge condition, (4) Overcurrent condition
The charger is supposed to charge with constant current.
Figure 7
22
Seiko Instruments Inc.
(1)
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
(3) Charger Detection
Battery
voltage
VCU
VCU−VHC
VDL+VHD
VDL
DO pin
VDD
VSS
CO pin
VDD
VSS
VM pin
VDD
VSS
VCHA
Charger connection
Load connection
In case VM pin voltage < VCHA
Overdischarge is released at the overdischarge
detection voltage (VDL)
Overdischarge detection delay time (tDL)
Mode
(1)
(1)
(3)
Remark (1) Normal condition, (2) Overcharge condition, (3) Overdischarge condition, (4) Overcurrent condition
The charger is supposed to charge with constant current.
Figure 8
(4) Abnormal Charge Current Detection
Battery
voltage
VCU
VCU−VHC
VDL+VHD
VDL
VDD
DO pin
VSS
CO pin
VDD
VSS
VM pin
VDD
VSS
VCHA
Charger connection
Load connection
Abnormal charging current detection delay time
( = Overcharge detection delay time (tCU))
Overdischarge detection delay time (tDL)
Mode
(1)
(3)
(1)
(2)
(1)
Remark (1) Normal condition, (2) Overcharge condition, (3) Overdischarge condition, (4) Overcurrent condition
The charger is supposed to charge with constant current.
Figure 9
Seiko Instruments Inc.
23
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
„ Battery Protection IC Connection Example
EB+
R1 : 470 Ω
VDD
DP
Battery C1 :
0.1 µF
S-8261 Series
VSS
DO
CO
VM
R2 : 2 kΩ
FET1
FET2
EB−
Figure 10
Table 17
Symbol
Part
Purpose
Constant for External Components
Typ.
Min.
Max.
*1
FET1
N-channel
MOS FET
Discharge control



FET2
N-channel
MOS FET
Charge control



R1
C1
R2
*1.
**2.
*3.
*4.
*5.
Remarks
Threshold voltage ≤ Overdischarge detection voltage
*2
Gate to source withstanding voltage ≥ Charger voltage
*1
Threshold voltage ≤ Overdischarge detection voltage
*2
Gate to source withstanding voltage ≥ Charger voltage
Resistance should be as small as possible to avoid lowering of
*3
the overcharge detection accuracy caused by VDD pin current.
*4
Install a capacitor of 0.022 µF or higher between VDD and VSS.
Select a resistance as large as possible to prevent large current
*5
when a charger is connected in reverse.
ESD protection,
470 Ω
300 Ω
1 kΩ
For power fluctuation
Capacitor For power fluctuation
0.1 µF
0.022 µF 1.0 µF
Protection for reverse
Resistor
2 kΩ
300 Ω
4 kΩ
connection of a charger
If the threshold voltage of an FET is low, the FET may not cut the charging current.
If an FET with a threshold voltage equal to or higher than the overdischarge detection voltage is used, discharging
may be stopped before overdischarge is detected.
If the withstanding voltage between the gate and source is lower than the charger voltage, the FET may be destroyed.
If R1 has a high resistance, the voltage between VDD and VSS may exceed the absolute maximum rating when a
charger is connected in reverse since the current flows from the charger to the IC. Insert a resistor of 300 Ω or higher
to R1 for ESD protection.
If a capacitor of less than 0.022 µF is connected to C1, DO may oscillate when load short-circuiting is detected. Be
sure to connect a capacitor of 0.022 µF or higher to C1.
If R2 has a resistance higher than 4 kΩ, the charging current may not be cut when a high-voltage charger is
connected.
Resistor
Caution 1. The above constants may be changed without notice.
2. The DP pin should be open.
3. It has not been confirmed whether the operation is normal or not in circuits other than the above
example of connection. In addition, the example of connection shown above and the constant do not
guarantee proper operation. Perform through evaluation using the actual application to set the
constant.
24
Seiko Instruments Inc.
Rev.4.4_00
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
„ Precautions
•
The application conditions for the input voltage, output voltage, and load current should not exceed the package power
dissipation.
•
Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in electrostatic
protection circuit.
•
SII claims no responsibility for any and all disputes arising out of or in connection with any infringement by products
including this IC of patents owned by a third party.
Seiko Instruments Inc.
25
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
„ Characteristics (Typical Data)
1. Detection / Release Voltage Temperature Characteristics
Overcharge detection voltage vs. temperature
Overcharge release voltage vs. temperature
4.02
4.42
4.00
4.40
3.98
VCL [V]
VCU [V]
4.44
4.38
4.36
4.34
−50
3.94
−25
0
25
50
Ta [°C]
75
3.92
−50
100
Overdischarge detection voltage vs. temperature
VDU [V]
VDL [V]
2.98
2.96
−25
0
25
50
Ta [°C]
75
75
100
75
100
3.38
−25
0
25
50
Ta [°C]
Overcurrent 2 detection voltage vs. temperature
0.65
0.40
0.60
0.35
VIOV2 [V]
VIOV1 [V]
100
3.40
3.34
−50
100
0.45
0.30
0.25
0.55
0.50
0.45
0.20
−25
0
25
50
Ta [°C]
75
100
75
100
0.40
−50
Load short-circuiting detection voltage vs.temperature
1.5
1.4
VSHORT [V]
75
3.36
Overcurrent 1 detection voltage vs. temperature
1.3
1.2
1.1
26
25
50
Ta [°C]
3.42
3.00
1.0
−50
0
3.44
3.02
0.15
−50
−25
Overdischarge release voltage vs. temperature
3.04
2.94
−50
3.96
−25
0
25
50
Ta [°C]
Seiko Instruments Inc.
−25
0
25
Ta [°C]
50
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
2. Current Consumption Temperature Characteristics
Current consumption vs. temperature in normal mode
Current consumption vs. temperature in power-down mode
0.10
5
0.08
IPDN [µA]
IOPE [µA]
4
3
2
1
0
−50
0.06
0.04
0.02
−25
0
25
50
Ta [°C]
75
0
−50
100
−25
0
25
50
Ta [°C]
75
100
75
100
3. Current Consumption Power Voltage Characteristics (Ta = 25°C)
Current consumption power supply voltage dependency
6
IOPE [µA]
5
4
3
2
1
0
0
2
4
6
VDD [V]
8
10
12
4. Detection / Release Delay Time Temperature Characteristics
Overcharge detection delay time vs. temperature
Overcharge release delay time vs. temperature
60
1.50
50
tCL [ms]
tCU [s]
1.25
1.00
0.75
0.50
−50
40
30
20
−25
0
25
50
Ta [°C]
75
100
10
−50
−25
0
25
50
Ta [°C]
Overdischarge detection delay time vs. temperature
200
tDL [ms]
180
160
140
120
100
−50
−25
0
25
50
Ta [°C]
75
100
Seiko Instruments Inc.
27
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Overcurrent 1 detection delay time vs. temperature
Overcurrent 2 detection delay time vs. temperature
3.4
15
3.0
tIOV2 [ms]
tIOV1 [ms]
13
11
9
2.6
2.2
1.8
7
5
−50
Rev.4.4_00
−25
0
25
50
Ta [°C]
75
100
75
100
1.4
−50
−25
0
25
50
Ta [°C]
75
100
Load short-circuiting delay time vs. temperature
0.40
tSHORT [ms]
0.36
0.32
0.28
0.24
0.20
0.16
−50
−25
0
25
50
Ta [°C]
5. Delay Time Power-Voltage Characteristics (Ta = 25°C)
Overcurrent 1 detection delay time vs. power supply voltage dependency
15
Overcurrent 2 detection delay time vs. power supply voltage dependency
3.4
3.0
tIOV2 [ms]
tIOV1 [V]
13
11
9
7
5
2
2.6
2.2
1.8
2.5
3
3.5
VDD [V]
4
4.5
1.4
2
Load short-circuiting delay time vs. power supply voltage dependency
tSHORT [ms]
0.32
0.28
0.24
0.2
0.16
2.5
28
3
3.5
VDD [V]
4
4.5
Seiko Instruments Inc.
2.5
3
3.5
VDD [V]
4
4.5
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.4_00
6. CO Pin / DO Pin Output Current Characteristics (Ta = 25°C)
VDD = 3.5 V, VM = VSS = 0 V
CO pin source current characteristics
−0.5
CO pin sink current characteristics
0.5
0.4
ICO [mA]
ICO [mA]
−0.4
−0.3
−0.2
−0.1
0
0
0.3
0.2
0.1
1
2
3
0
0
4
1
2
3
VCO [V]
VCO [V]
VDD = 3.5 V, VM = VSS = 0 V
DO pin source current characteristics
−0.5
DO pin sink current characteristics
0.5
4
5
VDD = 1.8 V, VM = VSS = 0 V
0.4
IDO [mA]
IDO [mA]
−0.4
−0.3
−0.2
−0.1
0
0
VDD = 4.5 V, VM = VSS = 0 V
0.3
0.2
0.1
1
2
3
4
0
0
VDO [V]
Seiko Instruments Inc.
0.5
1
VDO [V]
1.5
2
29
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Overcurrent 1 detection delay time vs. temperature
Overcurrent 2 detection delay time vs. temperature
3.4
15
3.0
tIOV2 [ms]
tIOV1 [ms]
13
11
9
2.6
2.2
1.8
7
5
−50
Rev.4.3_00
−25
0
25
50
Ta [°C]
75
100
75
100
1.4
−50
−25
0
25
50
Ta [°C]
75
100
Load short-circuiting delay time vs. temperature
0.40
tSHORT [ms]
0.36
0.32
0.28
0.24
0.20
0.16
−50
−25
0
25
50
Ta [°C]
5. Delay Time Power-Voltage Characteristics (Ta = 25°C)
Overcurrent 1 detection delay time vs. power supply voltage dependency
15
Overcurrent 2 detection delay time vs. power supply voltage dependency
3.4
3.0
tIOV2 [ms]
tIOV1 [V]
13
11
9
7
5
2
2.6
2.2
1.8
2.5
3
3.5
VDD [V]
4
4.5
1.4
2
Load short-circuiting delay time vs. power supply voltage dependency
tSHORT [ms]
0.32
0.28
0.24
0.2
0.16
2.5
30
3
3.5
VDD [V]
4
4.5
Seiko Instruments Inc.
2.5
3
3.5
VDD [V]
4
4.5
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.3_00
6. CO Pin / DO Pin Output Current Characteristics (Ta = 25°C)
VDD = 3.5 V, VM = VSS = 0 V
CO pin source current characteristics
−0.5
CO pin sink current characteristics
0.5
0.4
ICO [mA]
ICO [mA]
−0.4
−0.3
−0.2
−0.1
0
0
0.3
0.2
0.1
1
2
3
0
0
4
1
2
3
VCO [V]
VCO [V]
VDD = 3.5 V, VM = VSS = 0 V
DO pin source current characteristics
−0.5
DO pin sink current characteristics
0.5
4
5
VDD = 1.8 V, VM = VSS = 0 V
0.4
IDO [mA]
IDO [mA]
−0.4
−0.3
−0.2
−0.1
0
0
VDD = 4.5 V, VM = VSS = 0 V
0.3
0.2
0.1
1
2
3
4
0
0
VDO [V]
Seiko Instruments Inc.
0.5
1
VDO [V]
1.5
2
31
2.9±0.2
1.9±0.2
6
0.95
5
1
4
2
3
+0.1
0.15 -0.05
0.95
0.35±0.15
No. MP006-A-P-SD-1.1
TITLE
SOT236-A-PKG Dimensions
No.
MP006-A-P-SD-1.1
SCALE
UNIT
mm
Seiko Instruments Inc.
4.0±0.1(10 pitches:40.0±0.2)
+0.1
ø1.5 -0
2.0±0.05
+0.2
ø1.0 -0
0.25±0.1
4.0±0.1
1.4±0.2
3.2±0.2
3 2 1
4 5 6
Feed direction
No. MP006-A-C-SD-3.1
TITLE
SOT236-A-Carrier Tape
No.
MP006-A-C-SD-3.1
SCALE
UNIT
mm
Seiko Instruments Inc.
12.5max.
9.0±0.3
Enlarged drawing in the central part
ø13±0.2
(60°)
(60°)
No. MP006-A-R-SD-2.1
SOT236-A-Reel
TITLE
MP006-A-R-SD-2.1
No.
SCALE
UNIT
QTY
mm
Seiko Instruments Inc.
3,000
R(0.075)
6
5
4
1
2
3
(0.125)
0.14±0.05
0.2±0.08
0.2±0.08
1.8±0.15
0.5±0.1
0.8±0.05
0.5±0.1
The heatsink of back side has different electric
potential depending on the product.
Confirm specifications of each product.
Do not use it as the function of electrode.
No. BD006-A-P-SD-3.0
TITLE
SNB6B-A-PKG Dimensions
No.
BD006-A-P-SD-3.0
SCALE
UNIT
mm
Seiko Instruments Inc.
ø1.5±0.1
4.0±0.1
2.0±0.05
ø1.1±0.1
0.25±0.05
1.1±0.1
4.0±0.1
2.2±0.1
3 2 1
4 5 6
Feed direction
No. BD006-A-C-SD-2.1
TITLE
SNB6B-A-Carrier Tape
BD006-A-C-SD-2.1
No.
SCALE
UNIT
mm
Seiko Instruments Inc.
12.5max.
9.0±0.3
Enlarged drawing in the central part
ø13±0.2
No. BD006-A-R-SD-1.1
TITLE
SNB6B-A-Reel
No.
BD006-A-R-SD-1.1
SCALE
UNIT
QTY.
mm
Seiko Instruments Inc.
3,000
•
•
•
•
•
•
The information described herein is subject to change without notice.
Seiko Instruments Inc. is not responsible for any problems caused by circuits or diagrams described herein
whose related industrial properties, patents, or other rights belong to third parties. The application circuit
examples explain typical applications of the products, and do not guarantee the success of any specific
mass-production design.
When the products described herein are regulated products subject to the Wassenaar Arrangement or other
agreements, they may not be exported without authorization from the appropriate governmental authority.
Use of the information described herein for other purposes and/or reproduction or copying without the
express permission of Seiko Instruments Inc. is strictly prohibited.
The products described herein cannot be used as part of any device or equipment affecting the human
body, such as exercise equipment, medical equipment, security systems, gas equipment, or any apparatus
installed in airplanes and other vehicles, without prior written permission of Seiko Instruments Inc.
Although Seiko Instruments Inc. exerts the greatest possible effort to ensure high quality and reliability, the
failure or malfunction of semiconductor products may occur. The user of these products should therefore
give thorough consideration to safety design, including redundancy, fire-prevention measures, and
malfunction prevention, to prevent any accidents, fires, or community damage that may ensue.