TI SN74AHC273

SN54AHC273, SN74AHC273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS376E – JUNE 1997 – REVISED JANUARY 2000
D
D
D
D
D
SN54AHC273 . . . J OR W PACKAGE
SN74AHC273 . . . DB, DGV, DW, N, OR PW PACKAGE
(TOP VIEW)
CLR
1Q
1D
2D
2Q
3Q
3D
4D
4Q
GND
1
20
2
19
3
18
4
17
5
16
6
15
7
14
8
13
9
12
10
11
VCC
8Q
8D
7D
7Q
6Q
6D
5D
5Q
CLK
SN54AHC273 . . . FK PACKAGE
(TOP VIEW)
2D
2Q
3Q
3D
4D
description
4
3 2 1 20 19
18
5
17
6
16
7
15
8
14
9 10 11 12 13
8D
7D
7Q
6Q
6D
4Q
GND
CLK
5Q
5D
These circuits are positive-edge-triggered D-type
flip-flops with a direct clear (CLR) input.
8Q
D
D
EPIC  (Enhanced-Performance Implanted
CMOS) Process
Operating Range 2-V to 5.5-V VCC
Contain Eight Flip-Flops With Single-Rail
Outputs
Direct Clear Input
Individual Data Input to Each Flip-Flop
Applications Include:
– Buffer/Storage Registers
– Shift Registers
– Pattern Generators
Latch-Up Performance Exceeds 250 mA Per
JESD 17
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), Thin
Shrink Small-Outline (PW), and Ceramic
Flat (W) Packages, Ceramic Chip Carriers
(FK), and Standard Plastic (N) and Ceramic
(J) DIPs
1D
1Q
CLR
VCC
D
Information at the data (D) inputs meeting the
setup time requirements is transferred to the
Q outputs on the positive-going edge of the clock
(CLK) pulse. Clock triggering occurs at a
particular voltage level and is not directly related
to the transition time of the positive-going pulse.
When CLK is at either the high or low level, the
D input has no effect at the output.
The SN54AHC273 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74AHC273 is characterized for operation from –40°C to 85 °C.
FUNCTION TABLE
(each flip-flop)
INPUTS
CLR
CLK
D
OUTPUT
Q
L
X
X
L
H
↑
H
H
H
↑
L
L
H
L
X
Q0
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
Copyright  2000, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
SN54AHC273, SN74AHC273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS376E – JUNE 1997 – REVISED JANUARY 2000
logic symbol†
CLR
CLK
1D
2D
3D
4D
5D
6D
7D
8D
1
R
11
C1
3
2
1D
4
5
7
6
8
9
13
12
14
15
17
16
18
19
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
† This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
logic diagram (positive logic)
CLK
1D
2D
3D
4D
3
4
7
8
6D
13
7D
14
8D
17
18
11
1D
1D
C1
1D
C1
R
CLR
5D
1D
C1
R
1D
C1
R
1D
C1
R
1D
C1
R
1D
C1
R
C1
R
R
1
2
5
6
1Q
2Q
3Q
9
12
4Q
15
5Q
6Q
16
19
7Q
8Q
logic diagram, each flip-flop (positive logic)
D
C
C
TG
TG
Q
C
C
C
C
TG
CLK(I)
TG
C
C
C
C
R
2
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• DALLAS, TEXAS 75265
SN54AHC273, SN74AHC273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS376E – JUNE 1997 – REVISED JANUARY 2000
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
Output voltage range, VO (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –20 mA
Output clamp current, IOK (VO < 0 or VO > VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA
Continuous output current, IO (VO = 0 to VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±25 mA
Continuous current through VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±75 mA
Package thermal impedance, θJA (see Note 2): DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70°C/W
DGV package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92°C/W
DW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58°C/W
N package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69°C/W
PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83°C/W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
recommended operating conditions (see Note 3)
SN54AHC273
VCC
VIH
Supply voltage
VCC = 2 V
VCC = 3 V
High-level input voltage
VCC = 5.5 V
VCC = 2 V
VIL
VI
VO
IOH
Low-level input voltage
∆t/∆v
MAX
2
5.5
Input voltage
Output voltage
VCC = 2 V
VCC = 3.3 V ± 0.3 V
High-level output current
VCC = 3.3 V ± 0.3 V
VCC = 5 V ± 0.5 V
VCC = 3.3 V ± 0.3 V
Low-level output current
Input transition rise or fall rate
VCC = 5 V ± 0.5 V
SN74AHC273
MIN
MAX
2
5.5
1.5
1.5
2.1
2.1
3.85
UNIT
V
V
3.85
0.5
VCC = 3 V
VCC = 5.5 V
VCC = 5 V ± 0.5 V
VCC = 2 V
IOL
MIN
0.5
0.9
0.9
1.65
1.65
V
0
5.5
0
5.5
V
0
VCC
–50
0
VCC
–50
mA
–4
–4
–8
–8
50
50
4
4
8
8
100
100
20
20
V
mA
mA
mA
ns/V
TA
Operating free-air temperature
–55
125
–40
85
°C
NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
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• DALLAS, TEXAS 75265
3
SN54AHC273, SN74AHC273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS376E – JUNE 1997 – REVISED JANUARY 2000
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
IOH = –50 mA
VOH
IOH = –4 mA
IOH = –8 mA
IOL = 50 mA
MIN
TA = 25°C
TYP
MAX
SN54AHC273
MIN
MAX
SN74AHC273
MIN
2V
1.9
1.9
1.9
3V
2.9
2.9
2.9
4.5 V
4.4
4.4
4.4
3V
2.58
2.48
2.48
4.5 V
3.94
3.8
MAX
UNIT
V
3.8
2V
0.1
0.1
0.1
0.1
3V
0.1
0.1
4.5 V
0.1
0.1
0.1
3V
0.36
0.5
0.44
4.5 V
0.36
0.5
0.44
0 V to 5.5 V
±0.1
±1*
±1
mA
IO = 0
5.5 V
4
VI = VCC or GND
5V
2.5
10
* On products compliant to MIL-PRF-38535, this parameter is not production tested at VCC = 0 V.
40
40
mA
10
pF
VOL
IOL = 4 mA
IOL = 8 mA
II
ICC
VI = VCC or GND
VI = VCC or GND,
Ci
V
timing requirements over recommended operating free-air temperature range, VCC = 3.3 V ± 0.3 V
(unless otherwise noted) (see Figure 1)
SN54AHC273
TA = 25°C
MIN
MAX
tw
Pulse duration
tsu
Setup time
th
Hold time, data after CLK↑
MIN
SN74AHC273
MAX
TA = 25°C
MIN
MAX
MIN
CLR low
5
6
5
6
CLK high or low
5
6.5
5
6.5
Data before CLK↑
5.5
6.5
5.5
6.5
CLR before CLK↑
2.5
2.5
2.5
2.5
1.5
2
1
1
MAX
UNIT
ns
ns
ns
timing requirements over recommended operating free-air temperature range, VCC = 5 V ± 0.5 V
(unless otherwise noted) (see Figure 1)
SN54AHC273
TA = 25°C
MIN
MAX
4
tw
Pulse duration
tsu
Setup time
th
Hold time, data after CLK↑
MIN
SN74AHC273
MAX
TA = 25°C
MIN
MAX
MIN
CLR low
5
5
5
5
CLK high or low
5
5
5
5
Data before CLK↑
4.5
4.5
4.5
4.5
CLR before CLK↑
2
2
2
2
1.5
2
1
1
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MAX
UNIT
ns
ns
ns
SN54AHC273, SN74AHC273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS376E – JUNE 1997 – REVISED JANUARY 2000
switching characteristics over recommended operating free-air temperature range,
VCC = 3.3 V ± 0.3 V (unless otherwise noted) (see Figure 1)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
75*
120*
65*
65
CL = 50 pF
50
75
45
45
CLR
Q
CL = 15 pF
tPLH
tPHL
CLK
Q
CL = 15 pF
CLR
Q
CL = 50 pF
CLK
SN74AHC273
CL = 15 pF
tPHL
tPHL
tsk(o)
SN54AHC273
MIN
fmax
tPHL
tPLH
TA = 25°C
TYP
MAX
LOAD
CAPACITANCE
CL = 50 pF
Q
MIN
MAX
MIN
MAX
MHz
8.9*
13.6*
1*
16*
1
16
8.7*
13.6*
1*
16*
1
16
8.7*
13.6*
1*
16*
1
16
11.4
17.1
1
19.5
1
19.5
11.2
17.1
1
19.5
1
19.5
11.2
17.1
1
19.5
1
19.5
CL = 50 pF
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
** On products compliant to MIL-PRF-38535, this parameter does not apply.
UNIT
1.5**
1.5
ns
ns
ns
ns
ns
switching characteristics over recommended operating free-air temperature range,
VCC = 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
tPHL
tPHL
tPLH
tPHL
SN74AHC273
CL = 15 pF
120*
165*
100*
100
CL = 50 pF
80
110
70
70
CLR
Q
CL = 15 pF
CLK
Q
CL = 15 pF
CLR
Q
CL = 50 pF
CLK
SN54AHC273
MIN
fmax
tPHL
tPLH
TA = 25°C
TYP
MAX
LOAD
CAPACITANCE
CL = 50 pF
Q
MIN
MAX
MIN
MAX
MHz
5.2*
8.5*
1*
10*
1
10
5.8*
9*
1*
10.5*
1
10.5
5.8*
9*
1*
10.5*
1
10.5
6.7
10.5
1
12
1
12
7.3
11
1
12.5
1
12.5
7.3
11
1
12.5
1
12.5
tsk(o)
CL = 50 pF
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
** On products compliant to MIL-PRF-38535, this parameter does not apply.
UNIT
1**
1
ns
ns
ns
ns
ns
noise characteristics, VCC = 5 V, CL = 50 pF, TA = 25°C (see Note 4)
SN74AHC273
PARAMETER
MIN
TYP
MAX
UNIT
VOL(P)
VOL(V)
Quiet output, maximum dynamic VOL
0.7
V
Quiet output, minimum dynamic VOL
–0.7
V
VOH(V)
VIH(D)
Quiet output, minimum dynamic VOH
4.7
V
High-level dynamic input voltage
3.5
VIL(D)
Low-level dynamic input voltage
NOTE 4: Characteristics are for surface-mount packages only.
V
1.5
V
TYP
UNIT
operating characteristics, TA = 25°C
PARAMETER
Cpd
TEST CONDITIONS
Power dissipation capacitance
No load,
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f = 1 MHz
31
pF
5
SN54AHC273, SN74AHC273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS376E – JUNE 1997 – REVISED JANUARY 2000
PARAMETER MEASUREMENT INFORMATION
RL = 1 kΩ
From Output
Under Test
Test
Point
From Output
Under Test
VCC
Open
S1
TEST
GND
CL
(see Note A)
CL
(see Note A)
S1
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
Open Drain
Open
VCC
GND
VCC
LOAD CIRCUIT FOR
3-STATE AND OPEN-DRAIN OUTPUTS
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
VCC
50% VCC
Timing Input
tw
tsu
VCC
Input
50% VCC
50% VCC
0V
th
VCC
50% VCC
Data Input
50% VCC
0V
0V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PULSE DURATION
VCC
50% VCC
Input
50% VCC
0V
tPLH
In-Phase
Output
tPHL
50% VCC
tPHL
Out-of-Phase
Output
VOH
50% VCC
VOL
VCC
Output
Control
Output
Waveform 1
S1 at VCC
(see Note B)
50% VCC
0V
tPZL
VOH
50% VCC
VOL
tPLZ
≈VCC
50% VCC
tPZH
tPLH
50% VCC
50% VCC
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
VOL + 0.3 V
VOL
tPHZ
50% VCC
VOH – 0.3 V
VOH
≈0 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns.
D. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
6
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any product or service without notice, and advise customers to obtain the latest version of relevant information
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subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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Copyright  2000, Texas Instruments Incorporated