INTEGRAL IN74HCT244ADW

TECHNICAL DATA
IN74HCT244A
Octal 3-State Noninverting
Buffer/Line Driver/Line Receiver
High-Performance Silicon-Gate CMOS
The IN74HCT244A is identical in pinout to the LS/ALS244. The device may be used as a level converter for interfacing TTL or NMOS outputs to High-Speed CMOS inputs.
The IN74HCT244A is an octal noninverting buffer/line driver/line receiver designed to be used with 3-state memory address drivers, clock
drivers, and other bus-oriented systems. The device has non-inverted
outputs and two active-low output enables.
• TTL/NMOS-Compatible Input Levels
• Outputs Directly Interface to CMOS, NMOS, and TTL
• Operating Voltage Range: 4.5 to 5.5 V
• Low Input Current: 1.0 µA
ORDERING INFORMATION
IN74HCT244AN Plastic
IN74HCT244ADW SOIC
IN74HCT244AZ Chip
TA = -55° to 125° C for all packages
PIN ASSIGNMENT
LOGIC DIAGRAM
FUNCTION TABLE
Inputs
PIN 20=VCC
PIN 10 = GND
Outputs
Enable A,
Enable B
A,B
YA,YB
L
L
L
L
H
H
H
X
Z
X=don’t care;Z = high impedance
INTEGRAL
1
IN74HCT244A
MAXIMUM RATINGS *
Symbol
Parameter
Value
Unit
-0.5 to +7.0
V
VCC
DC Supply Voltage (Referenced to GND)
VIN
DC Input Voltage (Referenced to GND)
-1.5 to VCC +1.5
V
DC Output Voltage (Referenced to GND)
-0.5 to VCC +0.5
V
DC Input Current, per Pin
±20
mA
DC Output Current, per Pin
±35
mA
±75
mA
750
500
mW
-65 to +150
°C
260
°C
VOUT
IIN
IOUT
ICC
DC Supply Current, VCC and GND Pins
**
PD
Power Dissipation in Still Air, Plastic DIP
SOIC Package**
Tstg
Storage Temperature
TL
Lead Temperature, 1 mm from Case for 10 Seconds
(Plastic DIP or SOIC Package)
*
Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
**
Derating - Plastic DIP: - 10 mW/°C from 65° to 125°C
SOIC Package: : - 7 mW/°C from 65° to 125°C
RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
VIN, VOUT
Parameter
DC Supply Voltage (Referenced to GND)
DC Input Voltage, Output Voltage (Referenced to GND)
TA
Operating Temperature, All Package Types
tr, t f
Input Rise and Fall Time (Figure 1)
Min
Max
Unit
4.5
5.5
V
0
VCC
V
-55
+125
°C
0
500
ns
This device contains protection circuitry to guard against damage due to high static voltages or electric
fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages
to this high-impedance circuit. For proper operation, VIN and VOUT should be constrained to the range GND≤(VIN or
VOUT)≤VCC.
Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused
outputs must be left open.
INTEGRAL
2
IN74HCT244A
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Symbol
Parameter
Test Conditions
VCC
Guaranteed Limit
Unit
V
25 °C to
-55°C
≤85
°C
≤125
°C
VIH
Minimum High-Level
Input Voltage
VOUT= VCC-0.1 V
IOUT≤ 20 µA
4.5
5.5
2.0
2.0
2.0
2.0
2.0
2.0
V
VIL
Maximum Low -Level
Input Voltage
VOUT=0.1 V
IOUT ≤ 20 µA
4.5
5.5
0.8
0.8
0.8
0.8
0.8
0.8
V
VOH
Minimum High-Level
Output Voltage
VIN=VIH
IOUT ≤ 20 µA
4.5
5.5
4.4
5.4
4.4
5.4
4.4
5.4
V
VIN=VIH
IOUT ≤ 6.0 mA
4.5
3.98
3.84
3.7
VIN= VIL
IOUT ≤ 20 µA
4.5
5.5
0.1
0.1
0.1
0.1
0.1
0.1
IOUT ≤6.0 mA
4.5
0.26
0.33
0.4
VOL
Maximum Low-Level
Output Voltage
V
VIN= VIL
IIH
Minimum High-Level
Input Leakage Current
VIN=VCC
5.5
0.1
1.0
1.0
µA
IIL
Maximum Low-Level
Input Leakage Current
VIN=GND
5.5
-0.1
-1.0
-1.0
µA
IOZH
Minimum High-Level
Three-State Leakage
Current
VIN(01) =VIH
VIN(19) =VIH
VIN =VÑÑ (on other outputs)
VOUT=VCC
5.5
0.5
5.0
10.0
µA
IOZL
Maximum Low-Level
Three-State Leakage
Current
VIN(01) =VIH
VIN(19) =VIH
VIN =VÑÑ (on other outputs)
VOUT=GND
5.5
-0.5
-5.0
-10.0
µA
ICC
Maximum Quiescent
Supply Current
per Package)
VIL=GND
VIN=VCC
IOUT=0 µA
5.5
4.0
40
160
µA
∆ICC
Additional Quiescent
Supply Current
VIN=2.4 V, Any One Input
VIN=VCC or GND, Other
Inputs
IOUT=0µA
5.5
≥-55°C
25°C to 125°C
2.9
2.4
mA
NOTE: Total Supply Current = ICC + Σ∆ICC.
INTEGRAL
3
IN74HCT244A
AC ELECTRICAL CHARACTERISTICS (VCC =5.0 V ± 10%, CL=50pF,Input t r=t f=6.0 ns)
Symbol
Parameter
Test Conditions
VCC
Guaranteed Limit
Unit
Â
25 °C
to
-55°C
≤85°C
≤125°
C
tPLH, t PHL
Maximum Propagation Delay,
A to YA or B to YB (Figures
1 and 2)
VCC=5 V±10%
VIL=0 V
VIH=3 V
tLH=t HL=6 ns
CL=50 pF
5.0
20
25
30
ns
tPLZ, t PHZ
Maximum Propagation Delay
, Output Enable to YA or YB
(Figures 1 and 2)
VCC=5 V±10%
VIL=0 V
VIH=3 V
tLH=t HL=6 ns
CL=50 pF
5.0
26
33
39
ns
tPZL, t PZH
Maximum Propagation Delay
, Output Enable to YA or YB
(Figures 1 and 2)
VCC=5 V±10%
VIL=0 V
VIH=3 V
tLH=t HL=6 ns
CL=50 pF
5.0
22
28
33
ns
tTLH, t THL
Maximum Output Transition
Time, Any Output (Figures 1
and 2)
VCC=5 V±10%
VIL=0 V
VIH=3 V
tLH=t HL=6 ns
CL=50 pF
5.0
12
15
18
ns
CIN
Maximum Input Capacitance
VCC=5 V±10%
5.0
10
10
10
pF
COUT
Maximum Three-State Output Capacitance (Output in
High-Impedance State)
VCC=5 V±10%
5.0
15
15
15
pF
Power Dissipation Capacitance (Per Enabled Output)
CPD
Typical @25°C,VCC=5.0 V
Used to determine the no-load dynamic power consumption:
PD=CPDVCC2f+ICCVCC
Figure 1. Switching Waveforms
INTEGRAL
55
pF
Figure 2. Switching Waveforms
4
IN74HCT244A
Figure 3. Test Circuit
Figure 4. Test Circuit
EXPANDED LOGIC DIAGRAM
(1/8 of the Device)
INTEGRAL
5
IN74HCT244A
CHIP PAD DIAGRAM IZ74HCT244A
Pad size 0.106 x 0.106 mm (Pad size is given as per passivation layer)
Thickness of chip 0,46±0,02 mm
PAD LOCATION
Pad No
01
02
03
04
05
06
07
08
09
10
11
12
13
14
15
16
17
18
19
20
INTEGRAL
Symbol
ENABLE A
A1
YB4
A2
YB3
A3
YB2
A4
YB1
GND
B1
YA4
B2
YA3
B3
YA2
B4
YA1
ENABLE B
Vcc
X
0.152
0.152
0.300
0.470
0.868
1.068
1.330
1.709
1.729
1.729
1.699
1.729
1.719
1.301
1.062
0.758
0.468
0.142
0.152
0.152
Y
0.636
0.396
0.142
0.152
0.132
0.152
0.132
0.142
0.578
0.812
1.149
1.438
1.804
1.824
1.804
1.824
1.804
1.662
1.489
1.005
6