SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 D D D D D D D D D D Members of the Texas Instruments (TI) SCOPE Family of Testability Products Members of the TI Widebus Family State-of-the-Art 3.3-V ABT Design Supports Mixed-Mode Signal Operation (5-V Input and Output Voltages With 3.3-V VCC) Support Unregulated Battery Operation Down to 2.7 V UBT (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode Bus Hold on Data Inputs Eliminates the Need for External Pullup/Pulldown Resistors B-Port Outputs of ’LVTH182514 Devices Have Equivalent 25-Ω Series Resistors, So No External Resistors Are Required Compatible With the IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE Instruction Set – IEEE Std 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes Package Options Include 64-Pin Plastic Thin Shrink Small-Outline (DGG) and 64-Pin Ceramic Dual Flat (HKC) Packages Using 0.5-mm Center-to-Center Spacings SN54LVTH18514, SN54LVTH182514 . . . HKC PACKAGE SN74LVTH18514, SN74LVTH182514 . . . DGG PACKAGE (TOP VIEW) LEBA OEBA A1 A2 A3 GND A4 A5 A6 VCC A7 A8 A9 GND A10 A11 A12 A13 GND A14 A15 A16 VCC A17 A18 A19 GND A20 CLKENAB CLKAB TDO TMS 1 64 2 63 3 62 4 61 5 60 6 59 7 58 8 57 9 56 10 55 11 54 12 53 13 52 14 51 15 50 16 49 17 48 18 47 19 46 20 45 21 44 22 43 23 42 24 41 25 40 26 39 27 38 28 37 29 36 30 35 31 34 32 33 CLKBA CLKENBA B1 B2 B3 GND B4 B5 B6 VCC B7 B8 B9 GND B10 B11 B12 B13 GND B14 B15 B16 VCC B17 B18 B19 GND B20 OEAB LEAB TDI TCK description The ’LVTH18514 and ’LVTH182514 scan test devices with 20-bit universal bus transceivers are members of the TI SCOPE testability integrated-circuit family. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. Additionally, these devices are designed specifically for low-voltage (3.3-V) VCC operation, but with the capability to provide a TTL interface to a 5-V system environment. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, UBT, and TI are trademarks of Texas Instruments Incorporated. Copyright 1998, Texas Instruments Incorporated UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 description (continued) In the normal mode, these devices are 20-bit universal bus transceivers that combine D-type latches and D-type flip-flops to allow data flow in transparent, latched, or clocked modes. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in the normal mode does not affect the functional operation of the SCOPE universal bus transceivers. Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA), clock-enable (CLKENAB and CLKENBA), and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A data is latched while CLKENAB is high and/or CLKAB is held at a static low or high logic level. Otherwise, if LEAB is low and CLKENAB is low, A data is stored on a low-to-high transition of CLKAB. When OEAB is low, the B outputs are active. When OEAB is high, the B outputs are in the high-impedance state. B-to-A data flow is similar to A-to-B data flow, but uses the OEBA, LEBA, CLKENBA, and CLKBA inputs. In the test mode, the normal operation of the SCOPE universal bus transceivers is inhibited, and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs boundary-scan test operations according to the protocol described in IEEE Std 1149.1-1990. Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions, such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface. Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level. The B-port outputs of ’LVTH182514, which are designed to source or sink up to 12 mA, include equivalent 25-Ω series resistors to reduce overshoot and undershoot. The SN54LVTH18514 and SN54LVTH182514 are characterized for operation over the full military temperature range of –55°C to 125°C. The SN74LVTH18514 and SN74LVTH182514 are characterized for operation from –40°C to 85°C. FUNCTION TABLE† (normal mode, each register) INPUTS OEAB LEAB CLKENAB L L L L L L L L L H X X L H X X H X X X X OUTPUT B CLKAB A L L X L ↑ L L ↑ H H H X X L B0‡ L H H B0‡ L Z † A-to-B data flow is shown. B-to-A data flow is similar, but uses OEBA, LEBA, CLKENBA, and CLKBA. ‡ Output level before the indicated steady-state input conditions were established 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 functional block diagram Boundary-Scan Register CLKENAB LEAB CLKAB OEAB CLKENBA LEBA CLKBA OEBA A1 29 35 30 VCC 36 63 1 64 VCC 2 C1 C1 1D 1D 3 62 C1 1D B1 C1 1D 1 of 20 Channels Bypass Register Boundary-Control Register Identification Register VCC TDI 31 Instruction Register 34 TDO VCC TMS TCK 32 33 TAP Controller POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 3 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 Terminal Functions TERMINAL NAME 4 DESCRIPTION A1–A20 Normal-function A-bus I/O ports. See function table for normal-mode logic. B1–B20 Normal-function B-bus I/O ports. See function table for normal-mode logic. CLKAB, CLKBA Normal-function clock inputs. See function table for normal-mode logic. CLKENAB, CLKENBA Normal-function clock enables. See function table for normal-mode logic. GND Ground LEAB, LEBA Normal-function latch enables. See function table for normal-mode logic. OEAB, OEBA Normal-function output enables. See function table for normal-mode logic. An internal pullup at each terminal forces the terminal to a high level if left unconnected. TCK Test clock. One of four terminals required by IEEE Std 1149.1-1990. Test operations of the device are synchronous to TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. TDI Test data input. One of four terminals required by IEEE Std 1149.1-1990. TDI is the serial input for shifting data through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected. TDO Test data output. One of four terminals required by IEEE Std 1149.1-1990. TDO is the serial output for shifting data through the instruction register or selected data register. TMS Test mode select. One of four terminals required by IEEE Std 1149.1-1990. TMS directs the device through its TAP controller states. An internal pullup forces TMS to a high level if left unconnected. VCC Supply voltage POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 test architecture Serial-test information is conveyed by means of a 4-wire test bus or TAP that conforms to IEEE Std 1149.1-1990. Test instructions, test data, and test control signals are passed along this serial-test bus. The TAP controller monitors two signals from the test bus: TCK and TMS. The TAP controller extracts the synchronization (TCK) and state control (TMS) signals from the test bus and generates the appropriate on-chip control signals for the test structures in the device. Figure 1 shows the TAP-controller state diagram. The TAP controller is fully synchronous to the TCK signal. Input data is captured on the rising edge of TCK and output data changes on the falling edge of TCK. This scheme ensures data to be captured is valid for fully one-half of the TCK cycle. The functional block diagram shows the IEEE Std 1149.1-1990 4-wire test bus and boundary-scan architecture and the relationships of the test bus, the TAP controller, and the test registers. As shown, the device contains an 8-bit instruction register and four test data registers: a 48-bit boundary-scan register, a 3-bit boundary-control register, a 1-bit bypass register, and a 32-bit device-identification register. Test-Logic-Reset TMS = H TMS = L TMS = H TMS = H Run-Test/Idle TMS = H Select-DR-Scan Select-IR-Scan TMS = L TMS = L TMS = L TMS = H TMS = H Capture-DR Capture-IR TMS = L TMS = L Shift-DR Shift-IR TMS = L TMS = L TMS = H TMS = H TMS = H TMS = H Exit1-DR Exit1-IR TMS = L TMS = L Pause-DR Pause-IR TMS = L TMS = L TMS = H TMS = H TMS = L Exit2-DR TMS = L Exit2-IR TMS = H Update-DR TMS = H TMS = L TMS = H Update-IR TMS = H TMS = L Figure 1. TAP-Controller State Diagram POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 5 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 state diagram description The TAP controller is a synchronous finite-state machine that provides test control signals throughout the device. The state diagram shown in Figure 1 is in accordance with IEEE Std 1149.1-1990. The TAP controller proceeds through its states, based on the level of TMS at the rising edge of TCK. As shown, the TAP controller consists of 16 states. There are six stable states (indicated by a looping arrow in the state diagram) and ten unstable states. A stable state is defined as a state the TAP controller can retain for consecutive TCK cycles. Any state that does not meet this criterion is an unstable state. There are two main paths through the state diagram: one to access and control the selected data register and one to access and control the instruction register. Only one register at a time can be accessed. Test-Logic-Reset The device powers up in the Test-Logic-Reset state. In the stable Test-Logic-Reset state, the test logic is reset and is disabled so that the normal logic function of the device is performed. The instruction register is reset to an opcode that selects the optional IDCODE instruction, if supported, or the BYPASS instruction. Certain data registers also can be reset to their power-up values. The state machine is constructed such that the TAP controller returns to the Test-Logic-Reset state in no more than five TCK cycles if TMS is left high. The TMS pin has an internal pullup resistor that forces it high if left unconnected or if a board defect causes it to be open circuited. For the ’LVTH18514 and ’LVTH182514, the instruction register is reset to the binary value 10000001, which selects the IDCODE instruction. Bits 47–46 in the boundary-scan register are reset to logic 1, ensuring that these cells, which control A-port and B-port outputs, are set to benign values (i.e., if test mode were invoked, the outputs would be at high-impedance state). Reset values of other bits in the boundary-scan register should be considered indeterminate. The boundary-control register is reset to the binary value 010, which selects the PSA test operation. Run-Test/Idle The TAP controller must pass through the Run-Test/Idle state (from Test-Logic-Reset) before executing any test operations. The Run-Test/Idle state also can be entered following data-register or instruction-register scans. Run-Test/Idle is a stable state in which the test logic can be actively running a test or can be idle. The test operations selected by the boundary-control register are performed while the TAP controller is in the Run-Test/Idle state. Select-DR-Scan, Select-lR-Scan No specific function is performed in the Select-DR-Scan and Select-lR-Scan states, and the TAP controller exits either of these states on the next TCK cycle. These states allow the selection of either data-register scan or instruction-register scan. Capture-DR When a data-register scan is selected, the TAP controller must pass through the Capture-DR state. In the Capture-DR state, the selected data register can capture a data value as specified by the current instruction. Such capture operations occur on the rising edge of TCK, upon which the TAP controller exits the Capture-DR state. 6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 Shift-DR Upon entry to the Shift-DR state, the data register is placed in the scan path between TDI and TDO. On the first falling edge of TCK, TDO goes from the high-impedance state to an active state. TDO enables to the logic level present in the least-significant bit of the selected data register. While in the stable Shift-DR state, data is serially shifted through the selected data register on each TCK cycle. The first shift occurs on the first rising edge of TCK after entry to the Shift-DR state (i.e., no shifting occurs during the TCK cycle, in which the TAP controller changes from Capture-DR to Shift-DR or from Exit2-DR to Shift-DR). The last shift occurs on the rising edge of TCK, upon which the TAP controller exits the Shift-DR state. Exit1-DR, Exit2-DR The Exit1-DR and Exit2-DR states are temporary states that end a data-register scan. It is possible to return to the Shift-DR state from either Exit1-DR or Exit2-DR without recapturing the data register. On the first falling edge of TCK after entry to Exit1-DR, TDO goes from the active state to the high-impedance state. Pause-DR No specific function is performed in the stable Pause-DR state, in which the TAP controller can remain indefinitely. The Pause-DR state suspends and resumes data-register scan operations without loss of data. Update-DR If the current instruction calls for the selected data register to be updated with current data, such updates occur on the falling edge of TCK, following entry to the Update-DR state. Capture-IR When an instruction-register scan is selected, the TAP controller must pass through the Capture-IR state. In the Capture-IR state, the instruction register captures its current status value. This capture operation occurs on the rising edge of TCK, upon which the TAP controller exits the Capture-IR state. For the ’LVTH18514 and ’LVTH182514, the status value loaded in the Capture-IR state is the fixed binary value 10000001. Shift-IR Upon entry to the Shift-IR state, the instruction register is placed in the scan path between TDI and TDO. On the first falling edge of TCK, TDO goes from the high-impedance state to the active state. TDO enables to the logic level present in the least-significant bit of the instruction register. While in the stable Shift-IR state, instruction data is serially shifted through the instruction register on each TCK cycle. The first shift occurs on the first rising edge of TCK after entry to the Shift-IR state (i.e., no shifting occurs during the TCK cycle in which the TAP controller changes from Capture-IR to Shift-IR or from Exit2-IR to Shift-IR). The last shift occurs on the rising edge of TCK, upon which the TAP controller exits the Shift-IR state. Exit1-IR, Exit2-IR The Exit1-IR and Exit2-IR states are temporary states that end an instruction-register scan. It is possible to return to the Shift-IR state from either Exit1-IR or Exit2-IR without recapturing the instruction register. On the first falling edge of TCK after entry to Exit1-IR, TDO goes from the active state to the high-impedance state. Pause-IR No specific function is performed in the stable Pause-IR state, in which the TAP controller can remain indefinitely. The Pause-IR state suspends and resumes instruction-register scan operations without loss of data. Update-IR The current instruction is updated and takes effect on the falling edge of TCK, following entry to the Update-IR state. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 7 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 register overview With the exception of the bypass and device-identification registers, any test register can be thought of as a serial-shift register with a shadow latch on each bit. The bypass and device-identification registers differ in that they contain only a shift register. During the appropriate capture state (Capture-IR for instruction register, Capture-DR for data registers), the shift register can be parallel loaded from a source specified by the current instruction. During the appropriate shift state (Shift-IR or Shift-DR), the contents of the shift register are shifted out from TDO while new contents are shifted in at TDI. During the appropriate update state (Update-IR or Update-DR), the shadow latches are updated from the shift register. instruction register description The instruction register (IR) is eight bits long and tells the device what instruction is to be executed. Information contained in the instruction includes the mode of operation (either normal mode, in which the device performs its normal logic function, or test mode, in which the normal logic function is inhibited or altered), the test operation to be performed, which of the four data registers is to be selected for inclusion in the scan path during data-register scans, and the source of data to be captured into the selected data register during Capture-DR. Table 3 lists the instructions supported by the ’LVTH18514 and ’LVTH182514. The even-parity feature specified for SCOPE devices is supported in this device. Bit 7 of the instruction opcode is the parity bit. Any instructions that are defined for SCOPE devices but are not supported by this device default to BYPASS. During Capture-IR, the IR captures the binary value 10000001. As an instruction is shifted in, this value is shifted out via TDO and can be inspected as verification that the IR is in the scan path. During Update-IR, the value that has been shifted into the IR is loaded into shadow latches. At this time, the current instruction is updated and any specified mode change takes effect. At power up or in the Test-Logic-Reset state, the IR is reset to the binary value 10000001, which selects the IDCODE instruction. The instruction register order of scan is shown in Figure 2. TDI Bit 7 Parity (MSB) Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Figure 2. Instruction Register Order of Scan 8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 Bit 1 Bit 0 (LSB) TDO SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 data register description boundary-scan register The boundary-scan register (BSR) is 48 bits long. It contains one boundary-scan cell (BSC) for each normal-function input pin and one BSC for each normal-function I/O pin (one single cell for both input data and output data). The BSR is used to store test data that is to be applied externally to the device output pins, and/or to capture data that appears internally at the outputs of the normal on-chip logic and/or externally at the device input pins. The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The contents of the BSR can change during Run-Test/Idle as determined by the current instruction. At power up or in Test-Logic-Reset, BSCs 47–46 are reset to logic 1, ensuring that these cells, which control A-port and B-port outputs, are set to benign values (i.e., if test mode were invoked, the outputs would be at high-impedance state). Reset values of other BSCs should be considered indeterminate. The BSR order of scan is from TDI through bits 47–0 to TDO. Table 1 shows the BSR bits and their associated device pin signals. Table 1. Boundary-Scan Register Configuration BSR BIT NUMBER DEVICE SIGNAL BSR BIT NUMBER DEVICE SIGNAL BSR BIT NUMBER DEVICE SIGNAL 47 OEAB 39 A20-I/O 19 B20-I/O 46 OEBA 38 A19-I/O 18 B19-I/O 45 CLKAB 37 A18-I/O 17 B18-I/O 44 CLKBA 36 A17-I/O 16 B17-I/O 43 CLKENAB 35 A16-I/O 15 B16-I/O 42 CLKENBA 34 A15-I/O 14 B15-I/O 41 LEAB 33 A14-I/O 13 B14-I/O 40 LEBA 32 A13-I/O 12 B13-I/O –– –– 31 A12-I/O 11 B12-I/O –– –– 30 A11-I/O 10 B11-I/O –– –– 29 A10-I/O 9 B10-I/O –– –– 28 A9-I/O 8 B9-I/O –– –– 27 A8-I/O 7 B8-I/O –– –– 26 A7-I/O 6 B7-I/O –– –– 25 A6-I/O 5 B6-I/O –– –– 24 A5-I/O 4 B5-I/O –– –– 23 A4-I/O 3 B4-I/O –– –– 22 A3-I/O 2 B3-I/O –– –– 21 A2-I/O 1 B2-I/O –– –– 20 A1-I/O 0 B1-I/O POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 9 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 boundary-control register The boundary-control register (BCR) is three bits long. The BCR is used in the context of the boundary-run (RUNT) instruction to implement additional test operations not included in the basic SCOPE instruction set. Such operations include PRPG, PSA, and binary count up (COUNT). Table 4 shows the test operations that are decoded by the BCR. During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is reset to the binary value 010, which selects the PSA test operation. The boundary-control register order of scan is shown in Figure 3. TDI Bit 2 (MSB) Bit 1 Bit 0 (LSB) TDO Figure 3. Boundary-Control Register Order of Scan bypass register The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path, reducing the number of bits per test pattern that must be applied to complete a test operation. During Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in Figure 4. TDI Bit 0 TDO Figure 4. Bypass Register Order of Scan 10 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 device-identification register The device-identification register (IDR) is 32 bits long. It can be selected and read to identify the manufacturer, part number, and version of this device. For the ’LVTH18514, the binary value 00000000000000111101000000101111 (0003D02F, hex) is captured (during Capture-DR state) in the IDR to identify this device as TI SN54/74LVTH18514. For the ’LVTH182514, the binary value 00000000000000111110000000101111 (0003E02F, hex) is captured (during Capture-DR state) in the IDR to identify this device as TI SN54/74LVTH182514. The IDR order of scan is from TDI through bits 31–0 to TDO. Table 2 shows the IDR bits and their significance. Table 2. Device-Identification Register Configuration IDR BIT NUMBER IDENTIFICATION SIGNIFICANCE IDR BIT NUMBER IDENTIFICATION SIGNIFICANCE IDR BIT NUMBER IDENTIFICATION SIGNIFICANCE† 31 VERSION3 27 PARTNUMBER15 11 30 VERSION2 26 PARTNUMBER14 10 MANUFACTURER10† MANUFACTURER09† 29 VERSION1 25 PARTNUMBER13 9 28 VERSION0 24 PARTNUMBER12 8 –– –– 23 PARTNUMBER11 7 –– –– 22 PARTNUMBER10 6 –– –– 21 PARTNUMBER09 5 –– –– 20 PARTNUMBER08 4 –– –– 19 PARTNUMBER07 3 –– –– 18 PARTNUMBER06 2 –– –– 17 PARTNUMBER05 1 –– –– 16 PARTNUMBER04 0 MANUFACTURER00† LOGIC1† –– –– 15 PARTNUMBER03 –– –– –– –– 14 PARTNUMBER02 –– –– –– –– 13 PARTNUMBER01 –– –– MANUFACTURER08† MANUFACTURER07† MANUFACTURER06† MANUFACTURER05† MANUFACTURER04† MANUFACTURER03† MANUFACTURER02† MANUFACTURER01† –– –– 12 PARTNUMBER00 –– –– † Note that for TI products, bits 11–0 of the device-identification register always contain the binary value 000000101111 (02F, hex). POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 11 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 instruction-register opcode description The instruction-register opcodes are shown in Table 3. The following descriptions detail the operation of each instruction. Table 3. Instruction-Register Opcodes BINARY CODE† BIT 7 → BIT 0 MSB → LSB SCOPE OPCODE DESCRIPTION SELECTED DATA REGISTER MODE 00000000 EXTEST Boundary scan Boundary scan Test 10000001 IDCODE Identification read Device identification Normal 10000010 SAMPLE/PRELOAD BYPASS‡ Sample boundary Boundary scan Normal Bypass scan Bypass Normal Bypass scan Bypass Normal 00000101 BYPASS‡ BYPASS‡ Bypass scan Bypass Normal 00000110 HIGHZ Control boundary to high impedance Bypass Modified test 10000111 CLAMP BYPASS‡ Control boundary to 1/0 Bypass Test 10001000 Bypass scan Bypass Normal 00001001 RUNT Boundary-run test Bypass Test 00001010 READBN Boundary read Boundary scan Normal 10001011 READBT Boundary read Boundary scan Test 00001100 CELLTST Boundary self test Boundary scan Normal 10001101 TOPHIP Boundary toggle outputs Bypass Test 10001110 SCANCN Boundary-control-register scan Boundary control Normal 00001111 SCANCT Boundary-control-register scan Boundary control Test All others BYPASS Bypass scan Bypass Normal 00000011 10000100 † Bit 7 is used to maintain even parity in the 8-bit instruction. ‡ The BYPASS instruction is executed in lieu of a SCOPE instruction that is not supported in the ’LVTH18514 or ’LVTH182514. boundary scan This instruction conforms to the IEEE Std 1149.1-1990 EXTEST instruction. The BSR is selected in the scan path. Data appearing at the device input and I/O pins is captured in the associated BSCs. Data that has been scanned into the I/O BSCs for pins in the output mode is applied to the device I/O pins. Data present at the device pins, except for output-enables, is passed through the BSCs to the normal on-chip logic. For I/O pins, the operation of a pin as input or output is determined by the contents of the output-enable BSCs (bits 47–46 of the BSR). When a given output enable is active (logic 0), the associated I/O pins operate in the output mode. Otherwise, the I/O pins operate in the input mode. The device operates in the test mode. identification read This instruction conforms to the IEEE Std 1149.1-1990 IDCODE instruction. The IDR is selected in the scan path. The device operates in the normal mode. sample boundary This instruction conforms to the IEEE Std 1149.1-1990 SAMPLE/PRELOAD instruction. The BSR is selected in the scan path. Data appearing at the device input pins and I/O pins in the input mode is captured in the associated BSCs, while data appearing at the outputs of the normal on-chip logic is captured in the BSCs associated with I/O pins in the output mode. The device operates in the normal mode. 12 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 bypass scan This instruction conforms to the IEEE Std 1149.1-1990 BYPASS instruction. The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device operates in the normal mode. control boundary to high impedance This instruction conforms to the IEEE Std 1149.1a-1993 HIGHZ instruction. The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device operates in a modified test mode in which all device I/O pins are placed in the high-impedance state, the device input pins remain operational, and the normal on-chip logic function is performed. control boundary to 1/0 This instruction conforms to the IEEE Std 1149.1a-1993 CLAMP instruction. The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. Data in the I/O BSCs for pins in the output mode is applied to the device I/O pins. The device operates in the test mode. boundary-run test The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. The device operates in the test mode. The test operation specified in the BCR is executed during Run-Test/Idle. The five test operations decoded by the BCR are: sample inputs/toggle outputs (TOPSIP), PRPG, PSA, simultaneous PSA and PRPG (PSA/PRPG), and simultaneous PSA and binary count up (PSA/COUNT). boundary read The BSR is selected in the scan path. The value in the BSR remains unchanged during Capture-DR. This instruction is useful for inspecting data after a PSA operation. boundary self test The BSR is selected in the scan path. All BSCs capture the inverse of their current values during Capture-DR. In this way, the contents of the shadow latches can be read out to verify the integrity of both shift register and shadow latch elements of the BSR. The device operates in the normal mode. boundary toggle outputs The bypass register is selected in the scan path. A logic 0 value is captured in the bypass register during Capture-DR. Data in the shift-register elements of the selected output-mode BSCs is toggled on each rising edge of TCK in Run-Test/Idle and is then updated in the shadow latches and applied to the associated device I/O pins on each falling edge of TCK in Run-Test/Idle. Data in the input-mode BSCs remains constant. Data appearing at the device input or I/O pins is not captured in the input-mode BSCs. The device operates in the test mode. boundary-control-register scan The BCR is selected in the scan path. The value in the BCR remains unchanged during Capture-DR. This operation must be performed before a boundary-run test operation to specify which test operation is to be executed. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 13 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 boundary-control register opcode description The BCR opcodes are decoded from BCR bits 2–0 as shown in Table 4. The selected test operation is performed while the RUNT instruction is executed in the Run-Test/Idle state. The following descriptions detail the operation of each BCR instruction and illustrate the associated PSA and PRPG algorithms. Table 4. Boundary-Control Register Opcodes BINARY CODE BIT 2 → BIT 0 MSB → LSB DESCRIPTION X00 Sample inputs/toggle outputs (TOPSIP) X01 Pseudo-random pattern generation/40-bit mode (PRPG) X10 Parallel-signature analysis/40-bit mode (PSA) 011 Simultaneous PSA and PRPG/20-bit mode (PSA/PRPG) 111 Simultaneous PSA and binary count up/20-bit mode (PSA/COUNT) While the control input BSCs (bits 47–36) are not included in the toggle, PSA, PRPG, or COUNT algorithms, the output-enable BSCs (bits 47–46 of the BSR) control the drive state (active or high impedance) of the selected device output pins. These BCR instructions are only valid when the device is operating in one direction of data flow (that is, OEAB ≠ OEBA). Otherwise, the bypass instruction is operated. sample inputs/toggle outputs (TOPSIP) Data appearing at the selected device input-mode I/O pins is captured in the shift-register elements of the associated BSCs on each rising edge of TCK. Data in the shift-register elements of the selected output-mode BSCs is toggled on each rising edge of TCK, updated in the shadow latches, and applied to the associated device I/O pins on each falling edge of TCK. 14 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 pseudo-random pattern generation (PRPG) A pseudo-random pattern is generated in the shift-register elements of the selected BSCs on each rising edge of TCK, updated in the shadow latches, and applied to the associated device output-mode I/O pins on each falling edge of TCK. Figures 5 and 6 illustrate the 40-bit linear-feedback shift-register algorithms through which the patterns are generated. An initial seed value should be scanned into the BSR before performing this operation. A seed value of all zeroes does not produce additional patterns. A20-I/O A19-I/O A18-I/O A17-I/O A16-I/O A15-I/O A14-I/O A13-I/O A12-I/O A11-I/O A10-I/O A9-I/O A8-I/O A7-I/O A6-I/O A5-I/O A4-I/O A3-I/O A2-I/O A1-I/O B20-I/O B19-I/O B18-I/O B17-I/O B16-I/O B15-I/O B14-I/O B13-I/O B12-I/O B11-I/O B10-I/O B9-I/O B8-I/O B7-I/O B6-I/O B5-I/O B4-I/O B3-I/O B2-I/O B1-I/O = Figure 5. 40-Bit PRPG Configuration (OEAB = 0, OEBA = 1) POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 15 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 B20-I/O B19-I/O B18-I/O B17-I/O B16-I/O B15-I/O B14-I/O B13-I/O B12-I/O B11-I/O B10-I/O B9-I/O B8-I/O B7-I/O B6-I/O B5-I/O B4-I/O B3-I/O B2-I/O B1-I/O A20-I/O A19-I/O A18-I/O A17-I/O A16-I/O A15-I/O A14-I/O A13-I/O A12-I/O A11-I/O A10-I/O A9-I/O A8-I/O A7-I/O A6-I/O A5-I/O A4-I/O A3-I/O A2-I/O A1-I/O = Figure 6. 40-Bit PRPG Configuration (OEAB = 1, OEBA = 0) 16 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 parallel-signature analysis (PSA) Data appearing at the selected device input-mode I/O pins is compressed into a 40-bit parallel signature in the shift-register elements of the selected BSCs on each rising edge of TCK. Data in the shadow latches of the selected output-mode BSCs remains constant and is applied to the associated device I/O pins. Figures 7 and 8 illustrate the 40-bit linear-feedback shift-register algorithms through which the signature is generated. An initial seed value should be scanned into the BSR before performing this operation. = A20-I/O A19-I/O A18-I/O A17-I/O A16-I/O A15-I/O A14-I/O A13-I/O A12-I/O A11-I/O A10-I/O A9-I/O A8-I/O A7-I/O A6-I/O A5-I/O A4-I/O A3-I/O A2-I/O A1-I/O B20-I/O B19-I/O B18-I/O B17-I/O B16-I/O B15-I/O B14-I/O B13-I/O B12-I/O B11-I/O B10-I/O B9-I/O B8-I/O B7-I/O B6-I/O B5-I/O B4-I/O B3-I/O B2-I/O B1-I/O = Figure 7. 40-Bit PSA Configuration (OEAB = 0, OEBA = 1) POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 17 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 = B20-I/O B19-I/O B18-I/O B17-I/O B16-I/O B15-I/O B14-I/O B13-I/O B12-I/O B11-I/O B10-I/O B9-I/O B8-I/O B7-I/O B6-I/O B5-I/O B4-I/O B3-I/O B2-I/O B1-I/O A20-I/O A19-I/O A18-I/O A17-I/O A16-I/O A15-I/O A14-I/O A13-I/O A12-I/O A11-I/O A10-I/O A9-I/O A8-I/O A7-I/O A6-I/O A5-I/O A4-I/O A3-I/O A2-I/O A1-I/O = Figure 8. 40-Bit PSA Configuration (OEAB = 1, OEBA = 0) 18 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 simultaneous PSA and PRPG (PSA/PRPG) Data appearing at the selected device input-mode I/O pins is compressed into a 20-bit parallel signature in the shift-register elements of the selected input-mode BSCs on each rising edge of TCK. At the same time, a 20-bit pseudo-random pattern is generated in the shift-register elements of the selected output-mode BSCs on each rising edge of TCK, updated in the shadow latches, and applied to the associated device I/O pins on each falling edge of TCK. Figures 9 and 10 illustrate the 20-bit linear-feedback shift-register algorithms through which the signature and patterns are generated. An initial seed value should be scanned into the BSR before performing this operation. A seed value of all zeroes does not produce additional patterns. A20-I/O A19-I/O A18-I/O A17-I/O A16-I/O A15-I/O A14-I/O A13-I/O A12-I/O A11-I/O A10-I/O A9-I/O A8-I/O A7-I/O A6-I/O A5-I/O A4-I/O A3-I/O A2-I/O A1-I/O B20-I/O B19-I/O B18-I/O B17-I/O B16-I/O B15-I/O B14-I/O B13-I/O B12-I/O B11-I/O B10-I/O B9-I/O B8-I/O B7-I/O B6-I/O B5-I/O B4-I/O B3-I/O B2-I/O B1-I/O = = Figure 9. 20-Bit PSA/PRPG Configuration (OEAB = 0, OEBA = 1) POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 19 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 B20-I/O B19-I/O B18-I/O B17-I/O B16-I/O B15-I/O B14-I/O B13-I/O B12-I/O B11-I/O B10-I/O B9-I/O B8-I/O B7-I/O B6-I/O B5-I/O B4-I/O B3-I/O B2-I/O B1-I/O A20-I/O A19-I/O A18-I/O A17-I/O A16-I/O A15-I/O A14-I/O A13-I/O A12-I/O A11-I/O A10-I/O A9-I/O A8-I/O A7-I/O A6-I/O A5-I/O A4-I/O A3-I/O A2-I/O A1-I/O = = Figure 10. 20-Bit PSA/PRPG Configuration (OEAB = 1, OEBA = 0) 20 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 simultaneous PSA and binary count up (PSA/COUNT) Data appearing at the selected device input-mode I/O pins is compressed into a 20-bit parallel signature in the shift-register elements of the selected input-mode BSCs on each rising edge of TCK. At the same time, a 20-bit binary count-up pattern is generated in the shift-register elements of the selected output-mode BSCs on each rising edge of TCK, updated in the shadow latches, and applied to the associated device I/O pins on each falling edge of TCK. Figures 11 and 12 illustrate the 20-bit linear-feedback shift-register algorithms through which the signature is generated. An initial seed value should be scanned into the BSR before performing this operation. A20-I/O A19-I/O A18-I/O A17-I/O A16-I/O A15-I/O A14-I/O A13-I/O A12-I/O A11-I/O A10-I/O A9-I/O A8-I/O A7-I/O A6-I/O A5-I/O A4-I/O A3-I/O A2-I/O A1-I/O B19-I/O B18-I/O B17-I/O B16-I/O B15-I/O B14-I/O B13-I/O B12-I/O B11-I/O MSB B20-I/O LSB = = B10-I/O B9-I/O B8-I/O B7-I/O B6-I/O B5-I/O B4-I/O B3-I/O B2-I/O B1-I/O Figure 11. 20-Bit PSA/COUNT Configuration (OEAB = 0, OEBA = 1) POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 21 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 B20-I/O B19-I/O B18-I/O B17-I/O B16-I/O B15-I/O B14-I/O B13-I/O B12-I/O B11-I/O B10-I/O B9-I/O B8-I/O B7-I/O B6-I/O B5-I/O B4-I/O B3-I/O B2-I/O B1-I/O A19-I/O A18-I/O A17-I/O A16-I/O A15-I/O A14-I/O A13-I/O A12-I/O A11-I/O MSB A20-I/O LSB = = A10-I/O A9-I/O A8-I/O A7-I/O A6-I/O A5-I/O A4-I/O A3-I/O Figure 12. 20-Bit PSA/COUNT Configuration (OEAB = 1, OEBA = 0) 22 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 A2-I/O A1-I/O SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 timing description All test operations of the ’LVTH18514 and ’LVTH182514 are synchronous to the TCK signal. Data on the TDI, TMS, and normal-function inputs is captured on the rising edge of TCK. Data appears on the TDO and normal-function output pins on the falling edge of TCK. The TAP controller is advanced through its states (as shown in Figure 1) by changing the value of TMS on the falling edge of TCK and then applying a rising edge to TCK. A simple timing example is shown in Figure 13. In this example, the TAP controller begins in the Test-Logic-Reset state and is advanced through its states, as necessary, to perform one instruction-register scan and one data-register scan. While in the Shift-IR and Shift-DR states, TDI is used to input serial data, and TDO is used to output serial data. The TAP controller is then returned to the Test-Logic-Reset state. Table 5 describes the operation of the test circuitry during each TCK cycle. Table 5. Explanation of Timing Example TCK CYCLE(S) TAP STATE AFTER TCK DESCRIPTION 1 Test-Logic-Reset TMS is changed to a logic 0 value on the falling edge of TCK to begin advancing the TAP controller toward the desired state. 2 Run-Test/Idle 3 Select-DR-Scan 4 Select-IR-Scan 5 Capture-IR The IR captures the 8-bit binary value 10000001 on the rising edge of TCK as the TAP controller exits the Capture-IR state. 6 Shift-IR TDO becomes active and TDI is made valid on the falling edge of TCK. The first bit is shifted into the TAP on the rising edge of TCK as the TAP controller advances to the next state. Shift-IR One bit is shifted into the IR on each TCK rising edge. With TDI held at a logic 1 value, the 8-bit binary value 11111111 is serially scanned into the IR. At the same time, the 8-bit binary value 10000001 is serially scanned out of the IR via TDO. In TCK cycle 13, TMS is changed to a logic 1 value to end the instruction register scan on the next TCK cycle. The last bit of the instruction is shifted as the TAP controller advances from Shift-IR to Exit1-IR. 14 Exit1-IR TDO becomes inactive (goes to the high-impedance state) on the falling edge of TCK. 15 Update-IR 16 Select-DR-Scan 17 Capture-DR The bypass register captures a logic 0 value on the rising edge of TCK as the TAP controller exits the Capture-DR state. 18 Shift-DR TDO becomes active and TDI is made valid on the falling edge of TCK. The first bit is shifted into the TAP on the rising edge of TCK as the TAP controller advances to the next state. 19–20 Shift-DR The binary value 101 is shifted in via TDI, while the binary value 010 is shifted out via TDO. 21 Exit1-DR TDO becomes inactive (goes to the high-impedance state) on the falling edge of TCK. 7–13 22 Update-DR 23 Select-DR-Scan 24 Select-IR-Scan 25 Test-Logic-Reset The IR is updated with the new instruction (BYPASS) on the falling edge of TCK. In general, the selected data register is updated with the new data on the falling edge of TCK. Test operation completed. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 23 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 Test-Logic-Reset Select-IR-Scan Update-DR Exit1-DR Capture-DR ÎÎÎÎÎÎ ÎÎÎÎÎÎ ÎÎÎÎÎÎ ÎÎÎÎÎÎ Select-DR-Scan ÎÎ ÎÎ Select-DR-Scan Shift-IR Capture-IR Select-IR-Scan Select-DR-Scan Run-Test/Idle TAP Controller State Test-Logic-Reset TDO ÎÎÎÎÎÎ ÎÎÎÎÎÎ ÎÎÎÎÎÎ ÎÎÎÎÎÎ Update-IR ÎÎÎÎÎÎÎÎÎ ÎÎÎÎÎÎÎÎÎ ÎÎÎÎÎÎÎÎÎ ÎÎÎÎÎÎÎÎÎ TDI Exit1-IR TMS Shift-DR TCK 3-State (TDO) or Don’t Care (TDI) Figure 13. Timing Example absolute maximum ratings over operating free-air temperature range (unless otherwise noted)† Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 4.6 V Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V Voltage range applied to any output in the high or power-off state, VO (see Note 1) . . . . . . . . . –0.5 V to 7 V Current into any output in the low state, IO: SN54LVTH18514 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96 mA SN54LVTH182514 (A port or TDO) . . . . . . . . . . . . . . . . . . 96 mA SN54LVTH182514 (B port) . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA SN74LVTH18514 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128 mA SN74LVTH182514 (A port or TDO) . . . . . . . . . . . . . . . . . 128 mA SN74LVTH182514 (B port) . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA Current into any output in the high state, IO (see Note 2): SN54LVTH18514 . . . . . . . . . . . . . . . . . . . . . 48 mA SN54LVTH182514 (A port or TDO) . . . . . . 48 mA SN54LVTH182514 (B port) . . . . . . . . . . . . . 30 mA SN74LVTH18514 . . . . . . . . . . . . . . . . . . . . . 64 mA SN74LVTH182514 (A port or TDO) . . . . . . 64 mA SN74LVTH182514 (B port) . . . . . . . . . . . . . 30 mA Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA Output clamp current, IOK (VO < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA Package thermal impedance, qJA (see Note 3): DGG package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73°C/W Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed. 2. This current only flows when the output is in the high state and VO > VCC. 3. The package thermal impedance is calculated in accordance with JESD 51. 24 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 recommended operating conditions (see Note 4) SN54LVTH18514 SN74LVTH18514 MIN MAX MIN MAX 2.7 3.6 2.7 3.6 UNIT VCC VIH Supply voltage VIL VI Low-level input voltage 0.8 0.8 Input voltage 5.5 5.5 V IOH IOL IOL† High-level output current –24 –32 mA Low-level output current 24 32 mA Low-level output current 48 64 mA ∆t/∆v Input transition rise or fall rate 10 10 ns/V High-level input voltage 2 Outputs enabled 2 V V V TA Operating free-air temperature –55 125 –40 85 °C † Current duty cycle ≤ 50%, f ≥ 1 kHz NOTE 4: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 25 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER VIK VCC = 2.7 V, VCC = 2.7 V to 3.6 V, II = –18 mA IOH = –100 µA VCC = 2.7 V, IOH = –3 mA IOH = –8 mA VCC = 3 V IOH = –24 mA IOH = –32 mA VOH VCC = 2 2.7 7V VOL VCC = 3 V VCC = 3.6 V, VCC = 0 or 3.6 V, II VCC = 3 3.6 6V VCC = 0, MIN SN74LVTH18514 TYP† MAX MIN –1.2 –1.2 VCC–0.2 2.4 VCC–0.2 2.4 2.4 2.4 V V 2 0.2 0.2 0.5 0.5 IOL = 16 mA IOL = 32 mA 0.4 0.4 0.5 0.5 IOL = 48 mA IOL = 64 mA 0.55 V 0.55 VI = VCC or GND VI = 5.5 V CLK, CLKEN, LE, TCK VI = 5.5 V VI = VCC OE, TDI, TMS VI = 0 VI = 5.5 V ±1 ±1 10 10 5 5 1 –25 –100 1 –25 –100 20 A or B ports‡ VI or VO = 0 to 4.5 V VI = 0.8 V A or B ports VI = 2 V µA 20 1 1 –5 –5 ±100 75 500 75 150 500 –75 –500 –75 –150 –500 µA µA II(hold)§ VCC = 3 V IOZH IOZL VCC = 3.6 V, VCC = 3.6 V, VO = 3 V VO = 0.5 V TDO 1 1 µA TDO –1 –1 µA IOZPU IOZPD VCC = 0 to 1.5 V, VCC = 1.5 V to 0, VO = 0.5 V or 3 V VO = 0.5 V or 3 V TDO ±50 ±50 µA TDO ±50 ±50 µA ICC VCC = 3.6 V, IO = 0, VI = VCC or GND Outputs high 0.6 2 0.6 2 Outputs low 19.5 27 19.5 27 0.6 2 0.6 2 Outputs disabled ∆ICC¶ VCC = 3 V to 3.6 V, One input at VCC – 0.6 V, Other inputs at VCC or GND Ci VI = 3 V or 0 VO = 3 V or 0 Cio 0.5 Co PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 0.5 mA mA 4 4 pF 10 10 pF 8 pF VO = 3 V or 0 8 † All typical values are at VCC = 3.3 V, TA = 25°C. ‡ Unused pins at VCC or GND § The parameter II(hold) includes the off-state output leakage current. ¶ This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND. 26 UNIT 2 IOL = 100 µA IOL = 24 mA VI = VCC VI = 0 Ioff SN54LVTH18514 TYP† MAX TEST CONDITIONS SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 timing requirements over recommended operating free-air temperature range (unless otherwise noted) (normal mode) (see Figure 14) SN54LVTH18514 VCC = 3.3 V ± 0.3 V fclock tw Clock frequency Pulse duration CLKAB or CLKBA CLKAB or CLKBA high or low Setup time Hold time 0 100 MIN MAX 0 80 MIN MAX 0 100 VCC = 2.7 V MIN MAX 0 80 5.6 4.4 5.6 3 3 3 3 2.4 2.8 2.4 2.8 CLK high 1.5 0.7 1.5 0.7 CLK low 1.6 1.6 1.6 1.6 2.8 3.4 2.8 3.4 A after CLKAB↑ 1 0.8 1 0.8 B after CLKBA↑ 1.4 1.1 1.4 1.1 A after LEAB↓ or B after LEBA↓ 3.1 3.5 3.1 3.5 CLKEN after CLK↑ 0.7 0.2 0.7 0.2 LEAB or LEBA high A before LEAB↓ or B before LEBA↓ CLKEN before CLK↑ th MAX VCC = 2.7 V 4.4 A before CLKAB↑ or B before CLKBA↑ tsu MIN SN74LVTH18514 VCC = 3.3 V ± 0.3 V UNIT MHz ns ns ns timing requirements over recommended operating free-air temperature range (unless otherwise noted) (test mode) (see Figure 14) SN54LVTH18514 VCC = 3.3 V ± 0.3 V fclock tw tsu MIN MAX 0 50 SN74LVTH18514 VCC = 2.7 V MIN MAX 0 40 VCC = 3.3 V ± 0.3 V MIN MAX 0 50 VCC = 2.7 V MIN MAX 0 40 Clock frequency TCK Pulse duration TCK high or low 9.5 10.5 9.5 10.5 A, B, CLK, CLKEN, LE, or OE before TCK↑ 6.5 7 6.5 7 TDI before TCK↑ 2.5 3.5 2.5 3.5 TMS before TCK↑ 2.5 3.5 2.5 3.5 A, B, CLK, CLKEN, LE, or OE after TCK↑ 1.7 1 1.7 1 TDI after TCK↑ 1.5 1 1.5 1 S t time Setup ti UNIT MHz ns ns th H ld time Hold ti ns TMS after TCK↑ 1.5 1 1.5 1 td tr Delay time Power up to TCK↑ 50 50 50 50 ns Rise time VCC power up 1 1 1 1 µs PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 27 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 switching characteristics over recommended operating free-air temperature range (unless otherwise noted) (normal mode) (see Figure 14) SN54LVTH18514 PARAMETER FROM (INPUT) TO (OUTPUT) VCC = 3.3 V ± 0.3 V MIN fmax tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ CLKAB or CLKBA MAX 100 A or B B or A CLKAB B CLKBA A LEAB or LEBA B or A OEAB or OEBA B or A OEAB or OEBA B or A SN74LVTH18514 VCC = 2.7 V MIN MAX 80 VCC = 3.3 V ± 0.3 V MIN MAX 100 VCC = 2.7 V MIN UNIT MAX 80 MHz 1.5 5.4 5.8 1.5 5.1 5.6 1.5 5.4 5.8 1.5 5.1 5.6 1.5 6.9 7.8 1.5 5.8 6.8 1.5 6.9 7.8 1.5 5.8 6.8 1.5 6.9 7.8 1.5 6.4 7.4 1.5 6.9 7.8 1.5 6.4 7.4 2 8.7 9.5 2 8.1 8.8 2 7.1 7.4 2 6.7 7.1 2 9.5 10.5 2 9.1 10 2 10 10.8 2 9.6 10.4 2.5 12 12.7 2.5 10.4 11.2 2.5 9.6 9.9 2.5 9.1 9.5 ns ns ns ns ns ns switching characteristics over recommended operating free-air temperature range (unless otherwise noted) (test mode) (see Figure 14) SN54LVTH18514 PARAMETER FROM (INPUT) TO (OUTPUT) VCC = 3.3 V ± 0.3 V MIN fmax tPLH tPHL tPLH tPHL tPZH tPZL tPZH tPZL tPHZ tPLZ tPHZ tPLZ TCK MAX 50 TCK↓ A or B TCK↓ TDO TCK↓ A or B TCK↓ TDO TCK↓ A or B TCK↓ TDO VCC = 2.7 V MIN MAX 40 MIN MAX 50 VCC = 2.7 V MIN MHz 15 18 2.5 14 17 2.5 15 18 2.5 14 17 1 6 7 1 5.5 6.5 1.5 7 8 1.5 6.5 7.5 4 18 21 4 17 20 4 18 21 4 17 20 1 6 7 1 5.5 6.5 1.5 6 7 1.5 5.5 6.5 4 19 21 4 18 20 4 18 19.5 4 17 18.5 1.5 7.5 9 1.5 7 8.5 1.5 7.5 8.5 1.5 7 8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 UNIT MAX 40 2.5 PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. 28 SN74LVTH18514 VCC = 3.3 V ± 0.3 V ns ns ns ns ns ns SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 recommended operating conditions (see Note 4) SN54LVTH182514 SN74LVTH182514 MIN MAX MIN MAX 2.7 3.6 2.7 3.6 UNIT VCC VIH Supply voltage VIL VI Low-level input voltage 0.8 0.8 V Input voltage 5.5 5.5 V A port, TDO –24 –32 B port –12 –12 A port, TDO 24 32 B port 12 12 High-level input voltage 2 2 V V IOH High level output current High-level mA IOL Low level output current Low-level IOL† ∆t/∆v Low-level output current A port, TDO 48 64 mA Input transition rise or fall rate Outputs enabled 10 10 ns/V mA TA Operating free-air temperature –55 125 –40 85 °C † Current duty cycle ≤ 50%, f ≥ 1 kHz NOTE 4: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 29 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER VIK VCC = 2.7 V, VCC = 2.7 V to 3.6 V, II = –18 mA IOH = –100 µA VCC = 2.7 V, IOH = –3 mA IOH = –8 mA VOH VCC = 3 V 7V VCC = 2 2.7 VOL VCC = 3 V VCC = 3.6 V, VCC = 0 or 3.6 V, IOH = –24 mA IOH = –32 mA IOH = –12 mA IOL = 100 µA IOL = 32 mA IOL = 48 mA VCC = 3 3.6 6V II(hold)§ VCC = 3 V IOZH IOZL VCC = 3.6 V, VCC = 3.6 V, IOZPU IOZPD VCC = 0 to 1.5 V, VCC = 1.5 V to 0, ICC A port, port TDO VCC–0.2 2.4 2.4 2.4 V 2 B port 2 2 A, B, TDO A port, TDO 0.2 0.2 0.5 0.5 0.4 0.4 0.5 0.5 V 0.55 B port 0.8 0.55 VI = VCC or GND VI = 5.5 V CLK, CLKEN, LE, TCK ±1 ±1 10 10 5 5 OE, TDI, TMS VI = 0 VI = 5.5 V 0.8 1 –25 –100 1 –25 –100 20 A or B ports‡ VI or VO = 0 to 4.5 V VI = 0.8 V A or B ports VI = 2 V VO = 3 V TDO µA 20 1 1 –5 –5 ±100 75 500 75 150 500 –75 –500 –75 –150 –500 µA µA 1 1 µA VO = 0.5 V VO = 0.5 V or 3 V TDO –1 –1 µA TDO ±50 ±50 µA VO = 0.5 V or 3 V TDO ±50 µA VCC = 3.6 V, IO = 0, VI = VCC or GND ±50 Outputs high 0.6 2 0.6 2 Outputs low 19.5 27 19.5 27 0.6 2 0.6 2 ∆ICC¶ VCC = 3 V to 3.6 V, One input at VCC – 0.6 V, Other inputs at VCC or GND Ci VI = 3 V or 0 VO = 3 V or 0 0.5 Co PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 0.5 mA mA 4 4 pF 10 10 pF 8 pF VO = 3 V or 0 8 † All typical values are at VCC = 3.3 V, TA = 25°C. ‡ Unused pins at VCC or GND § The parameter II(hold) includes the off-state output leakage current. ¶ This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND. 30 UNIT V 2 Outputs disabled Cio –1.2 VCC–0.2 2.4 IOL = 64 mA IOL = 12 mA VI = VCC VI = 0 VCC = 0, SN74LVTH182514 MIN TYP† MAX –1.2 A, B, TDO IOL = 24 mA IOL = 16 mA VI = 5.5 V VI = VCC II Ioff SN54LVTH182514 MIN TYP† MAX TEST CONDITIONS SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 timing requirements over recommended operating free-air temperature range (unless otherwise noted) (normal mode) (see Figure 14) SN54LVTH182514 VCC = 3.3 V ± 0.3 V fclock tw Clock frequency Pulse duration CLKAB or CLKBA CLKAB or CLKBA high or low th Setup time H ld time ti Hold MAX 0 100 VCC = 2.7 V MIN MAX 0 80 MIN MAX 0 100 VCC = 2.7 V MIN MAX 0 80 4.4 5.6 4.4 5.6 3 3 3 3 2.8 3 2.8 3 CLK high 1.5 0.7 1.5 0.7 CLK low 1.6 1.6 1.6 1.6 CLKEN before CLK↑ 2.8 3.4 2.8 3.4 A after CLKAB↑ or B after CLKBA↑ 1.4 1.1 1.4 1.1 A after LEAB↓ or B after LEBA↓ 3.1 3.5 3.1 3.5 CLKEN after CLK↑ 0.7 0.2 0.7 0.2 LEAB or LEBA high A before CLKAB↑ or B before CLKBA↑ tsu MIN SN74LVTH182514 VCC = 3.3 V ± 0.3 V A before LEAB↓ or B before LEBA↓ UNIT MHz ns ns ns timing requirements over recommended operating free-air temperature range (unless otherwise noted) (test mode) (see Figure 14) SN54LVTH182514 VCC = 3.3 V ± 0.3 V fclock tw tsu SN74LVTH182514 VCC = 2.7 V VCC = 3.3 V ± 0.3 V VCC = 2.7 V MIN MAX MIN MAX MIN MAX MIN MAX 0 50 0 40 0 50 0 40 Clock frequency TCK Pulse duration TCK high or low 9.5 10.5 9.5 10.5 A, B, CLK, CLKEN, LE, or OE before TCK↑ 6.5 7 6.5 7 TDI before TCK↑ 2.5 3.5 2.5 3.5 TMS before TCK↑ 2.5 3.5 2.5 3.5 A, B, CLK, CLKEN, LE, or OE after TCK↑ 1.7 1 1.7 1 TDI after TCK↑ 1.5 1 1.5 1 S t time Setup ti UNIT MHz ns ns th H ld time Hold ti ns TMS after TCK↑ 1.5 1 1.5 1 td tr Delay time Power up to TCK↑ 50 50 50 50 ns Rise time VCC power up 1 1 1 1 µs PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 31 SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 switching characteristics over recommended operating free-air temperature range (unless otherwise noted) (normal mode) (see Figure 14) SN54LVTH182514 PARAMETER FROM (INPUT) TO (OUTPUT) VCC = 3.3 V ± 0.3 V MIN fmax tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ CLKAB or CLKBA MAX 100 A B B A CLKAB B CLKBA A LEAB B LEBA A OEAB or OEBA B or A OEAB or OEBA B or A SN74LVTH182514 VCC = 2.7 V MIN MAX 80 VCC = 3.3 V ± 0.3 V MIN MAX 100 VCC = 2.7 V MIN UNIT MAX 80 MHz 1.5 6.4 6.9 1.5 5.9 6.6 1.5 6.4 6.9 1.5 5.9 6.6 1.5 5.4 5.8 1.5 5.1 5.6 1.5 5.4 5.8 1.5 5.1 5.6 1.5 6.9 7.8 1.5 6.7 7.7 1.5 6.9 7.8 1.5 6.7 7.7 1.5 6.9 7.8 1.5 6.4 7.4 1.5 6.9 7.8 1.5 6.4 7.4 2 8.7 9.5 2 8.2 9.2 2 7.1 7.4 2 6.7 7.1 2 8.7 9.5 2 8.1 8.8 2 7.1 7.4 2 6.7 7.1 2 9.9 11.1 2 9.5 10.6 2 10.2 11 2 9.7 10.5 2.5 12 12.7 2.5 11.1 11.8 2.5 11 11.2 2.5 9.8 10 ns ns ns ns ns ns ns ns switching characteristics over recommended operating free-air temperature range (unless otherwise noted) (test mode) (see Figure 14) SN54LVTH182514 PARAMETER FROM (INPUT) TO (OUTPUT) VCC = 3.3 V ± 0.3 V MIN fmax tPLH tPHL tPLH tPHL tPZH tPZL tPZH tPZL tPHZ tPLZ tPHZ tPLZ TCK MAX 50 TCK↓ A or B TCK↓ TDO TCK↓ A or B TCK↓ TDO TCK↓ A or B TCK↓ TDO VCC = 2.7 V MIN MAX MIN 40 MAX 50 VCC = 2.7 V MIN 40 MHz 15 18 2.5 14 17 2.5 15 18 2.5 14 17 1 6 7 1 5.5 6.5 1.5 7 8 1.5 6.5 7.5 4 18 21 4 17 20 4 18 21 4 17 20 1 6 7 1 5.5 6.5 1.5 6 7 1.5 5.5 6.5 4 19 21 4 18 20 4 18 19.5 4 17 18.5 1.5 7.5 9 1.5 7 8.5 1.5 7.5 8.5 1.5 7 8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 UNIT MAX 2.5 PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. 32 SN74LVTH182514 VCC = 3.3 V ± 0.3 V ns ns ns ns ns ns SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS670C – AUGUST 1996 – REVISED MARCH 1998 PARAMETER MEASUREMENT INFORMATION 6V S1 500 Ω From Output Under Test Open GND CL = 50 pF (see Note A) 500 Ω TEST S1 tPLH/tPHL tPLZ/tPZL tPHZ/tPZH Open 6V GND LOAD CIRCUIT 2.7 V 1.5 V Timing Input 0V tw tsu 2.7 V Input 1.5 V 2.7 V 1.5 V Data Input 1.5 V 0V VOLTAGE WAVEFORMS SETUP AND HOLD TIMES 2.7 V 1.5 V 0V tPHL 1.5 V 1.5 V tPLH VOH Output 1.5 V 1.5 V VOL 1.5 V 0V tPLZ Output Waveform 1 S1 at 6 V (see Note B) VOL tPHL 1.5 V tPZL VOH Output 2.7 V Output Control 1.5 V tPLH 1.5 V 0V VOLTAGE WAVEFORMS PULSE DURATION Input th Output Waveform 2 S1 at GND (see Note B) VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES INVERTING AND NONINVERTING OUTPUTS 1.5 V tPZH 3V VOL + 0.3 V VOL tPHZ 1.5 V VOH – 0.3 V VOH ≈0V VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES LOW- AND HIGH-LEVEL ENABLING NOTES: A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns. D. The outputs are measured one at a time with one transition per measurement. Figure 14. Load Circuit and Voltage Waveforms POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 33 IMPORTANT NOTICE Texas Instruments (TI) reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest version of relevant information to verify, before placing orders, that the information being relied on is current and complete. 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