SEME-LAB IRFE9130

IRFE9130
MECHANICAL DATA
Dimensions in mm (inches)
P–CHANNEL
POWER MOSFET
9.14 (0.360)
8.64 (0.340)
1.27 (0.050)
1.07 (0.040)
≈ 2.16 (0.085)
12 13 14 15 16
1.39 (0.055)
1.02 (0.040)
7.62 (0.300)
7.12 (0.280)
11
17
10
18
9
1
8
2
7
6
5
1.39 (0.055)
1.15 (0.045)
4
VDSS
ID(cont)
RDS(on)
0.76 (0.030)
0.51 (0.020)
0.33 (0.013)
Rad.
0.08 (0.003)
3
1.65 (0.065)
1.40 (0.055)
0.43 (0.017)
0.18 (0.007 Rad.
-100V
-6.1A
Ω
0.345Ω
FEATURES
• SURFACE MOUNT
• SMALL FOOTPRINT
LCC4
• HERMETICALLY SEALED
MOSFET
TRANSISTOR
PINS
GATE
DRAIN
SOURCE
BASE
COLLECTOR
EMITTER
4,5
1,2,15,16,17,18
6,7,8,9,10,11,12,13
• DYNAMIC dv/dt RATING
• AVALANCHE ENERGY RATING
• SIMPLE DRIVE REQUIREMENTS
• LIGHT WEIGHT
ABSOLUTE MAXIMUM RATINGS (Tcase = 25°C unless otherwise stated)
VGS
Gate – Source Voltage
±20V
ID
Continuous Drain Current @ Tcase = 25°C
– 6.1A
ID
Continuous Drain Current @ Tcase = 100°C
– 3.8A
IDM
Pulsed Drain Current
– 24A
PD
Power Dissipation @ Tcase = 25°C
22W
Linear Derating Factor
EAS
Single Pulse Avalanche Energy 2
dv/dt
Peak Diode Recovery 3
TJ , Tstg
Operating and Storage Temperature Range
0.17W/°C
92mJ
– 5.5V/ns
– 55 to +150°C
Surface Temperature ( for 5 sec).
Semelab plc.
Telephone +44(0)1455 556565. Fax +44(0)1455 552612. e-mail [email protected]
Website http://www.semelab.co.uk
300°C
10/98
IRFE9130
ELECTRICAL CHARACTERISTICS (Tcase = 25°C unless otherwise stated)
Parameter
STATIC ELECTRICAL RATINGS
BVDSS Drain – Source Breakdown Voltage
∆BVDSS Temperature Coefficient of
∆TJ
Breakdown Voltage
Static Drain – Source On–State
RDS(on)
Resistance 1
VGS(th) Gate Threshold Voltage
gfs
Forward Transconductance 1
IDSS
Zero Gate Voltage Drain Current
IGSS
IGSS
Forward Gate – Source Leakage
Reverse Gate – Source Leakage
Ciss
Coss
Crss
Qg
Qgs
Qgd
td(on)
tr
td(off)
tf
DYNAMIC CHARACTERISTICS
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
Gate – Source Charge
Gate – Drain (“Miller”) Charge
Turn–On Delay Time
Rise Time
Turn–Off Delay Time
Fall Time
Test Conditions
VGS = 0
ID = –1mA
Reference to 25°C
ID = –1mA
VGS = –10V
ID = –3.8A
VGS = –10V
ID = –6.1A
VDS = VGS
ID = –250mA
VDS ≥ –15V
IDS = –3.8A
VGS = 0
VDS = 0.8BVDSS
TJ = 125°C
VGS = –20V
VGS = 20V
VGS = 0
VDS = –25V
f = 1MHz
VGS = –10V
ID = –6.1A
VDS = 0.5BVDSS
Min.
Typ.
V / °C
– 0.10
0.30
0.345
–4
–2
2.5
– 25
– 250
– 100
100
800
350
125
14.7
1.0
2.0
VDD = –50V
ID = –6.1A
RG = 7.5Ω
Negligible
LD
LS
PACKAGE CHARACTERISTICS
Internal Drain Inductance (measured from 6mm down drain lead to centre of die)
Internal Source Inductance (from 6mm down source lead to source bond pad)
1.8
4.3
RθJC
RθJPC
THERMAL CHARACTERISTICS
Thermal Resistance Junction – Case
Thermal Resistance Junction – PC Board
Ω
V
S (É)
µA
nA
pF
38.4
7.1
21
60
140
140
140
trr
Qrr
ton
VSD
Unit
V
–100
SOURCE – DRAIN DIODE CHARACTERISTICS
Continuous Source Current
Pulse Source Current 2
IS = –1.6A
TJ = 25°C
Diode Forward Voltage 1
VGS = 0
Reverse Recovery Time
IF = –6.1A
TJ = 25°C
1
Reverse Recovery Charge
di / dt ≤ –100A/µs VDD ≤ –50V
Forward Turn–On Time
IS
ISM
Max.
nC
ns
–1.6
–24
A
–4.7
V
250
3.0
ns
µC
nH
5.8
19
°C/W
Notes
1) Pulse Test: Pulse Width ≤ 300ms, δ ≤ 2%
2) Repetitive Rating – Pulse width limited by maximum junction temperature.
Semelab plc.
Telephone +44(0)1455 556565. Fax +44(0)1455 552612. e-mail [email protected]
Website http://www.semelab.co.uk
10/98