SEMICONDUCTOR KDS166E MARKING SPECIFICATION TESV PACKAGE 1. Marking method Laser Marking SC 1 0 1 2. Marking 2 3 No. Item Marking Description Device Mark SC KDS166E hFE Grade - - ② * Lot No. 01 2006. 1st Week [0:1st Character, 1:2nd Character] ③ Dot ● Pin 1 Index ① Note) * Lot No. marking method Character arrangement 1 st Character 1 (A) 2 (B) 3 (C) 4 (D) 5 (E) 6 (F) 7 (G) 8 (H) 9 (I) 0 (J) 2nd Character A (1) B (2) C (3) D (4) E (5) F (6) G (7) H (8) I (9) J (0) Year Marking (Week) Periode (Year) 1 st Year (2006) 01 02 … 51 52 2006-2010-2014... 2 nd Year (2007) 0A 0B … 5A 5B 2007-2011-2015... 3 rd Year (2008) J1 J2 … E1 E2 2008-2012-2016... 4 th Year (2009) JA JB … EA EB 2009-2013-2017... 2008. 9. 10 Revision No : 1 Remark Rotation for 4 years 1/1