TAS5715 www.ti.com SLOS645 – AUGUST 2010 25-W DIGITAL AUDIO POWER AMPLIFIER WITH EQ AND DRC Check for Samples: TAS5715 FEATURES 1 • • • Audio Input/Output – 25-W Into an 8-Ω Load From an 18-V Supply – 50-W Support in PBTL Mode With 4-Ω Load – Wide PVDD Range, From 8 V to 26 V – Efficient Class-D Operation Eliminates Need for Heatsinks – Requires Only 3.3 V and PVDD – One Serial Audio Input (Two Audio Channels) – I2C Address Selection via PIN (Chip Select) – Supports 8-kHz to 48-kHz Sample Rate (LJ/RJ/I2S) – Headphone PWM Outputs – Dedicated Pin for External Headphone-Amplifier Shutdown – Single-Filter PBTL Support Audio/PWM Processing – Independent Channel Volume Controls With 24-dB to Mute – Independent Headphone Volume – Programmable Two-Band Dynamic Range Control – Up to Eight User-Programmable Biquads per Channel – Programmable Coefficients for DRC Filters – DC Blocking Filters and PWM DC Detect – CRC Checksum to Detect Biquad Coefficient Corruption General Features – Serial Control Interface Operational Without MCLK – Factory-Trimmed Internal Oscillator for Automatic Rate Detection – Surface Mount, 48-Pin, 7-mm × 7-mm HTQFP Package – Thermal and Short-Circuit Protection • A Benefits – EQ: Speaker Equalization Improves Audio Performance – DRC: Automatic Gain Limiter. Can Be Used As Power Limiter. Enables Speaker Protection, Easy Listening – Two-Band DRC: Set Two Different Thresholds for Low- and High-Frequency Content – Autobank Switching: Preload Coefficients for Different Sample Rates. No Need to Write New Coefficients to the Part When Sample Rate Changes – Autodetect: Automatically Detects Sample-Rate Changes. No Need for External Microprocessor Intervention – Single-Filter PBTL Support Reduces BOM Cost – Thgermal Dissipation, Improving System Stability DESCRIPTION The TAS5715 is a 25-W, efficient, digital audio-power amplifier for driving stereo bridge-tied speakers. One serial data input allows processing of up to two discrete audio channels and seamless integration to most digital audio processors and MPEG decoders. The device accepts a wide range of input data and data rates. A fully programmable data path routes these channels to the internal speaker drivers. The TAS5715 is a slave-only device receiving all clocks from external sources. The TAS5715 operates with a PWM carrier between a 384-kHz switching rate and a 352-KHz switching rate, depending on the input sample rate. Oversampling combined with a fourth-order noise shaper provides a flat noise floor and excellent dynamic range from 20 Hz to 20 kHz. 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2010, Texas Instruments Incorporated TAS5715 SLOS645 – AUGUST 2010 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. SIMPLIFIED APPLICATION DIAGRAM 3.3 V 8 V–26 V AVDD/DVDD AVCC/PVCC OUT_A LRCLK Digital Audio Source SCLK BST_A LCBTL MCLK SDIN BST_B OUT_B 2 I C Control SDA OUT_C SCL BST_C RESET Control Inputs LCBTL BST_D PDN OUT_D PLL_FLTP TPA6110A2 (HP Amplifier) Loop Filter (1) PLL_FLTM HPR_PWM HPL_PWM RC Filter A_SEL/HP_SD B0264-12 (1) See the TAS5715 User's Guide for loop-filter values. 2 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 FUNCTIONAL VIEW OUT_A th SDIN Serial Audio Port Digital Audio Processor (DAP) S R C 4 Order Noise Shaper and PWM 2´ HB FET Out OUT_B OUT_C 2´ HB FET Out OUT_D Protection Logic MCLK SCLK LRCLK SDA SCL Click and Pop Control Sample Rate Autodetect and PLL Serial Control HPL Headphone Buffers HPR Microcontroller Based System Control Terminal Control B0262-09 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 3 TAS5715 SLOS645 – AUGUST 2010 www.ti.com FAULT Undervoltage Protection FAULT 4 4 Power On Reset Protection and I/O Logic AGND Temp. Sense GND VALID Overcurrent Protection Isense BST_D PVDD_D PWM Rcv Ctrl Timing PWM Controller PWM_D Gate Drive OUT_D Pulldown Resistor PGND_CD GVDD Regulator GVDD_OUT BST_C PVDD_C PWM_C PWM Rcv Ctrl Timing Gate Drive OUT_C Pulldown Resistor PGND_CD BST_B PVDD_B PWM_B PWM Rcv Ctrl Timing Gate Drive OUT_B Pulldown Resistor GVDD Regulator PGND_AB BST_A PVDD_A PWM_A PWM Rcv Ctrl Timing Gate Drive OUT_A Pulldown Resistor PGND_AB B0034-06 Figure 1. Power Stage Functional Block Diagram 4 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 R L 0x77 0x76 0x73 0x72 + + 0x30–0x36 7BQ 0x29–0x2F 7BQ + Auto-lp (0x46 Bit 5) 0 –1 + 2 1BQ 5D 1BQ 59 I C Subaddress in Red 0x74 0x70 Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 + + + + Volc config reg 0x0E Vol DRC Vol Vol2 DRC Vol1 0x52[0] 0x52[1] 0x51[0] 0x51[1] + + 2 I C:57 VDISTB 2 B0321-07 I C:56 VDISTA TAS5715 www.ti.com SLOS645 – AUGUST 2010 DAP Process Structure Submit Documentation Feedback 5 TAS5715 SLOS645 – AUGUST 2010 www.ti.com DEVICE INFORMATION PIN ASSIGNMENT PGND_CD PGND_CD PVDD_C OUT_C BST_C PVDD_C BST_B PVDD_B PVDD_B PGND_AB OUT_B PGND_AB PHP Package (Top View) 48 47 46 45 44 43 42 41 40 39 38 37 OUT_A 1 36 OUT_D PVDD_A 2 35 PVDD_D PVDD_A 3 34 PVDD_D BST_A 4 33 BST_D HPR 5 32 GVDD_OUT SSTIMER 6 31 VREG 30 AGND TAS5715 HPL 7 PBTL 8 29 GND AVSS 9 28 DVSS PLL_FLTM 10 27 DVDD PLL_FLTP 11 26 STEST VR_ANA 12 25 RESET SCL SDA SDIN SCLK LRCLK PDN VR_DIG DVSSO OSC_RES MCLK AVDD A_SEL 13 14 15 16 17 18 19 20 21 22 23 24 P0075-10 PIN FUNCTIONS PIN NAME NO. TYPE (1) 5-V TERMINATION (2) TOLERANT DESCRIPTION AGND 30 P A_SEL 14 DIO AVDD 13 P 3.3-V analog power supply AVSS 9 P Analog 3.3-V supply ground BST_A 4 P High-side bootstrap supply for half-bridge A BST_B 43 P High-side bootstrap supply for half-bridge B BST_C 42 P High-side bootstrap supply for half-bridge C BST_D 33 P High-side bootstrap supply for half-bridge D DVDD 27 P 3.3-V digital power supply DVSSO 17 P Oscillator ground DVSS 28 P Digital ground (1) (2) 6 Analog ground for power stage This pin is monitored on the rising edge of RESET. A value of 0 makes the I2C dev address 0x54 and a value of 1 makes it 0x56. This pin can be re-used after reset as external HP amplifer shutdown signal. TYPE: A = analog; D = 3.3-V digital; P = power/ground/decoupling; I = input; O = output All pullups are weak pullups and all pulldowns are weak pulldowns. The pullups and pulldowns are included to assure proper input logic levels if the pins are left unconnected (pullups → logic 1 input; pulldowns → logic 0 input). Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 PIN FUNCTIONS (continued) PIN NAME NO. TYPE (1) 5-V TERMINATION (2) TOLERANT DESCRIPTION GND 29 P Analog ground for power stage GVDD_OUT 32 P Gate drive internal regulator output HPL 7 AO HPR 5 AO LRCLK 20 DI 5-V Pulldown Input serial audio data left/right clock (sample rate clock) MCLK 15 DI 5-V Pulldown Master clock input OSC_RES 16 AO OUT_A 1 O Output, half-bridge A OUT_B 46 O Output, half-bridge B OUT_C 39 O Output, half-bridge C OUT_D 36 O Output, half-bridge D PBTL 8 DI Low means BTL or SE mode; high means PBTL mode. Information goes directly to power stage. PDN 19 DI PGND_AB 47, 48 P Power ground for half-bridges A and B PGND_CD 37, 38 P Power ground for half-bridges C and D PLL_FLTM 10 AO PLL negative loop filter terminal PLL_FLTP 11 AO PLL positive loop filter terminal PVDD_A 2, 3 P Power supply input for half-bridge output A PVDD_B 44, 45 P Power supply input for half-bridge output B PVDD_C 40, 41 P Power supply input for half-bridge output C PVDD_D Headphone PWM out (HPL) (leave floating if unused) Headphone PWM out (HPR) (leave floating if unused) Oscillator trim resistor. Connect an 18-kΩ 1% resistor to DVSSO. 5-V Pullup Power down, active-low. PDN prepares the device for loss of power supplies by shutting down the Noise Shaper and initiating PWM stop sequence. 34, 35 P RESET 25 DI 5-V Power supply input for half-bridge output D SCL 24 DI 5-V SCLK 21 DI 5-V SDA 23 DIO 5-V SDIN 22 DI 5-V SSTIMER 6 AI Controls ramp time of OUT_x to minimize pop. Leave this pin floating for BD mode. Requires capacitor of 2.2 nF to GND in AD mode. The capacitor determines the ramp time. STEST 26 DI Factory test pin. Connect directly to DVSS. VR_ANA 12 P Internally regulated 1.8-V analog supply voltage. This pin must not be used to power external devices. VR_DIG 18 P Internally regulated 1.8-V digital supply voltage. This pin must not be used to power external devices. VREG 31 P Digital regulator output. Not to be used for powering external circuitry. Pullup Reset, active-low. A system reset is generated by applying a logic low to this pin. RESET is an asynchronous control signal that restores the DAP to its default conditions, and places the PWM in the hard mute state (tristated). I2C serial control clock input Pulldown Serial audio data clock (shift clock). SCLK is the serial audio port input data bit clock. I2C serial control data interface input/output Pulldown Serial audio data input. SDIN supports three discrete (stereo) data formats. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 7 TAS5715 SLOS645 – AUGUST 2010 www.ti.com ABSOLUTE MAXIMUM RATINGS over operating free-air temperature range (unless otherwise noted) Supply voltage (1) VALUE UNIT DVDD, AVDD –0.3 to 3.6 V PVDD_x –0.3 to 30 V –0.5 to DVDD + 0.5 V –0.5 to DVDD + 2.5 (3) V (3) V 3.3-V digital input 5-V tolerant (2) digital input (except MCLK) Input voltage 5-V tolerant MCLK input –0.5 to AVDD + 2.5 OUT_x to PGND_x 32 (4) V BST_x to PGND_x 43 (4) V Input clamp current, IIK ±20 mA Output clamp current, IOK ±20 mA 0 to 85 °C 0 to 150 °C –40 to 125 °C Operating free-air temperature Operating junction temperature range Storage temperature range, Tstg (1) Stresses beyond those listed under absolute ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operation conditions are not implied. Exposure to absolute-maximum conditions for extended periods may affect device reliability. 5-V tolerant inputs are PDN, RESET, SCLK, LRCLK, MCLK, SDIN, SDA, and SCL. Maximum pin voltage should not exceed 6.0V DC voltage + peak ac waveform measured at the pin should be below the allowed limit for all conditions. (2) (3) (4) DISSIPATION RATINGS (1) PACKAGE DERATING FACTOR ABOVE TA = 25°C TA ≤ 25°C POWER RATING TA = 45°C POWER RATING TA = 70°C POWER RATING 7-mm × 7-mm HTQFP 20 mW/°C 2W 1.6 W 1.1 W (1) This data was taken using 1 oz trace and copper pad that is soldered directly to a JEDEC standard high-k PCB. The thermal pad must be soldered to a thermal land on the printed-circuit board. See TI Technical Briefs SLMA002 for more information about using the HTQFP thermal pad RECOMMENDED OPERATING CONDITIONS MIN NOM MAX Digital/analog supply voltage DVDD, AVDD 3 3.3 3.6 V Half-bridge supply voltage PVDD_x 8 26 V VIH High-level input voltage 5-V tolerant 2 VIL Low-level input voltage 5-V tolerant 0.8 V TA Operating ambient temperature range 0 85 °C Operating junction temperature range 0 125 °C TJ (1) RL (BTL) LO (BTL) (1) Load impedance Output filter: L = 15 mH, C = 680 nF. Output-filter inductance Minimum output inductance under short-circuit condition 4 UNIT V Ω 8 10 mH Continuous operation above the recommended junction temperature may result in reduced reliability and/or lifetime of the device. PWM OPERATION AT RECOMMENDED OPERATING CONDITIONS PARAMETER Output sample rate 8 TEST CONDITIONS VALUE UNIT 11.025/22.05/44.1-kHz data rate ±1% 352.8 kHz 48/24/12/8/16/32-kHz data rate ±1% 384 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 PLL INPUT PARAMETERS AND EXTERNAL FILTER COMPONENTS PARAMETER fMCLKI tr / tf(MCLK) TEST CONDITIONS MIN MCLK Frequency 2.8224 MCLK duty cycle 40% TYP 50% Rise/fall time for MCLK LRCLK allowable drift before LRCLK reset External PLL filter capacitor C1 SMD 0603 Y5V External PLL filter capacitor C2 External PLL filter resistor R MAX UNIT 12.288 MHz 60% 5 ns 4 MCLKs 47 nF SMD 0603 Y5V 4.7 nF SMD 0603, metal film 470 Ω ELECTRICAL CHARACTERISTICS DC Characteristics TA = 25°, PVCC_x = 18 V, DVDD = AVDD = 3.3 V, RL= 8 Ω, BTL AD Mode, fS = 48 KHz (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VOH High-level output voltage A_SEL and SDA IOH = –4 mA DVDD = 3 V VOL Low-level output voltage A_SEL and SDA IOL = 4 mA DVDD = 3 V 0.5 V IIL Low-level input current VI < VIL ; DVDD = AVDD = 3.6V 75 mA IIH High-level input current VI > VIH ; DVDD = AVDD = 3.6V 75 (1) mA IDD 3.3 V supply current 3.3 V supply voltage (DVDD, AVDD) IPVDD Supply current No load (PVDD_x) rDS(on) (2) 2.4 V Normal mode 56 85 Reset (RESET = low, PDN = high) 26 40 Normal mode 40 85 5 13 Reset (RESET = low, PDN = high) Drain-to-source resistance, LS TJ = 25°C, includes metallization resistance 110 Drain-to-source resistance, HS TJ = 25°C, includes metallization resistance 110 mA mA mΩ I/O Protection Vuvp Undervoltage protection limit PVDD falling 7.2 Vuvp,hyst Undervoltage protection limit PVDD rising 7.6 V OTE (3) Overtemperature error 150 °C 30 °C 0.63 ms 4.5 A 150 ns 3 kΩ OTEHYST (3) Extra temperature drop required to recover from error OLPC Overload protection counter IOC Overcurrent limit protection IOCT Overcurrent response time RPD Internal pulldown resistor at the output of each half-bridge (1) (2) (3) fPWM = 384 kHz Connected when drivers are tristated to provide bootstrap capacitor charge. V IIH for the PBTL pin has a maximum limit of 200 µA due to an internal pulldown on the pin. This does not include bond-wire or pin resistance. Specified by design Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 9 TAS5715 SLOS645 – AUGUST 2010 www.ti.com AC Characteristics (BTL, PBTL) PVDD_x = 18 V, BTL AD mode, fS = 48 KHz, RL = 8 Ω, ROCP = 22 KΩ, CBST = 33 nF, audio frequency = 1 kHz, AES17 filter, fPWM = 384 kHz, TA = 25°C (unless otherwise specified). All performance is in accordance with recommended operating conditions (unless otherwise specified). PARAMETER TEST CONDITIONS MIN 21.5 PVDD = 18 V, 7% THD, 1-kHz input signal 20.3 PVDD = 12 V, 10% THD, 1-kHz input signal 9.6 PVDD = 12 V, 7% THD, 1-kHz input signal 9.1 PVDD = 8 V, 10% THD, 1-kHz input signal 4.2 PVDD = 8 V, 7% THD, 1-kHz input signal PO Power output per channel THD+N Total harmonic distortion + noise Vn Output integrated noise (rms) Crosstalk SNR (1) 10 Signal-to-noise ratio (1) TYP PVDD = 18 V, 10% THD, 1-kHz input signal UNIT 4 PBTL mode, PVDD = 12 V, RL = 4 Ω, 10% THD, 1-kHz input signal 18.7 PBTL mode, PVDD = 12 V, RL = 4 Ω, 7% THD, 1-kHz input signal 17.7 PBTL mode, PVDD = 18 V, RL = 4 Ω, 10% THD, 1-kHz input signal 41.5 PBTL mode, PVDD = 18 V, RL = 4 Ω, 7% THD, 1-kHz input signal 39 PVDD = 18 V, PO = 1 W 0.07% PVDD = 12 V, PO = 1 W 0.03% PVDD = 8 V, PO = 1 W 0.1% A-weighted MAX W 56 mV PO = 0.25 W, f = 1 kHz (BD Mode) –82 dB PO = 0.25 W, f = 1 kHz (AD Mode) –69 dB A-weighted, f = 1 kHz, maximum power at THD < 1% 106 dB SNR is calculated relative to 0-dBFS input level. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 SERIAL AUDIO PORTS SLAVE MODE over recommended operating conditions (unless otherwise noted) TEST CONDITIONS PARAMETER MIN CL = 30 pF TYP 1.024 MAX UNIT 3.072 MHz fSCLKIN Frequency, SCLK 32 × fS, 48 × fS, 64 × fS tsu1 Setup time, LRCLK to SCLK rising edge 10 ns th1 Hold time, LRCLK from SCLK rising edge 10 ns tsu2 Setup time, SDIN to SCLK rising edge 10 ns th2 Hold time, SDIN from SCLK rising edge 10 LRCLK frequency ns 8 48 48 SCLK duty cycle 40% 50% 60% LRCLK duty cycle 40% 50% 60% SCLK rising edges between LRCLK rising edges t(edge) LRCLK clock edge with respect to the falling edge of SCLK tr/tf Rise/fall time for SCLK/LRCLK kHz 32 64 SCLK edges –1/4 1/4 SCLK period 8 tr ns tf SCLK (Input) t(edge) th1 tsu1 LRCLK (Input) th2 tsu2 SDIN T0026-04 Figure 2. Slave Mode Serial Data Interface Timing Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 11 TAS5715 SLOS645 – AUGUST 2010 www.ti.com I2C SERIAL CONTROL PORT OPERATION Timing characteristics for I2C Interface signals over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN fSCL Frequency, SCL tw(H) Pulse duration, SCL high No wait states 0.6 tw(L) Pulse duration, SCL low 1.3 tr Rise time, SCL and SDA tf Fall time, SCL and SDA tsu1 Setup time, SDA to SCL th1 Hold time, SCL to SDA t(buf) tsu2 MAX UNIT 400 kHz ms ms 300 ns 300 ns 100 ns 0 ns Bus free time between stop and start condition 1.3 ms Setup time, SCL to start condition 0.6 ms th2 Hold time, start condition to SCL 0.6 ms tsu3 Setup time, SCL to stop condition 0.6 CL Load capacitance for each bus line ms 400 tw(H) tw(L) pF tf tr SCL tsu1 th1 SDA T0027-01 Figure 3. SCL and SDA Timing SCL t(buf) th2 tsu2 tsu3 SDA Start Condition Stop Condition T0028-01 Figure 4. Start and Stop Conditions Timing 12 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 RESET TIMING (RESET) Control signal parameters over recommended operating conditions (unless otherwise noted). Please refer to Recommended Use Model section on usage of all terminals. PARAMETER tw(RESET) MIN Pulse duration, RESET active TYP 2 td(I2C_ready) MAX UNIT 100 Time to enable I C ms 12.0 ms RESET tw(RESET) 2 2 I C Active I C Active td(I2C_ready) System Initialization. 2 Enable via I C. T0421-01 NOTES: On power up, it is recommended that the TAS5715 RESET be held LOW for at least 100 ms after DVDD has reached 3 V. If RESET is asserted LOW while PDN is LOW, then the RESET must continue to be held LOW for at least 100 ms after PDN is deasserted (HIGH). Figure 5. Reset Timing Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 13 TAS5715 SLOS645 – AUGUST 2010 www.ti.com TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8 Ω TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY 10 10 PVDD = 8V RL = 8Ω T A = 25°C PVDD = 12V RL = 8Ω T A = 25°C 1 PO = 5W 1 PO = 2.5W THD+N (%) THD+N (%) PO = 2.5W 0.1 PO = 0.5W 0.1 PO = 1W PO = 1W 0.01 0.001 20 0.01 100 1k Frequency (Hz) 10k 0.001 20 20k 100 G001 TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY 10 PVDD = 24V RL = 8Ω T A = 25°C 1 1 PO = 5W PO = 5W THD+N (%) THD+N (%) 20k G002 Figure 7. PVDD = 18V RL = 8Ω T A = 25°C 0.1 PO = 1W PO = 1W 0.1 PO = 2.5W PO = 2.5W 0.01 0.01 100 1k Frequency (Hz) 10k 20k 0.001 20 G003 Figure 8. 14 10k Figure 6. 10 0.001 20 1k Frequency (Hz) 100 1k Frequency (Hz) 10k 20k G004 Figure 9. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8 Ω (continued) TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER 10 10 PVDD = 8V RL = 8Ω T A = 25°C PVDD = 12V RL = 8Ω T A = 25°C 1 1 THD+N (%) THD+N (%) f = 20Hz 0.1 f = 1kHz 0.1 f = 1kHz 0.01 f = 20Hz 0.01 f = 10kHz f = 10kHz 0.001 0.01 0.1 1 Output Power (W) 10 0.001 0.01 40 0.1 G005 1 Output Power (W) 40 G006 Figure 10. Figure 11. TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER 10 10 PVDD = 18V RL = 8Ω T A = 25°C PVDD = 24V RL = 8Ω T A = 25°C 1 1 f = 20Hz f = 1kHz f = 1kHz THD+N (%) THD+N (%) 10 0.1 0.01 f = 20Hz 0.1 0.01 f = 10kHz 0.001 0.01 0.1 1 Output Power (W) 10 f = 10kHz 40 0.001 0.01 G007 Figure 12. 0.1 1 Output Power (W) 10 40 G008 Figure 13. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 15 TAS5715 SLOS645 – AUGUST 2010 www.ti.com TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8 Ω (continued) OUTPUT POWER vs SUPPLY VOLTAGE EFFICIENCY vs TOTAL OUTPUT POWER 40 100 RL = 8Ω T A = 25°C 35 90 80 30 PVDD = 24V PVDD = 18V 25 Efficiency (%) Output Power (W) 70 THD+N = 10% 20 15 PVDD = 12V 50 PVDD = 8V 40 30 THD+N = 1% 10 60 20 5 RL = 8Ω T A = 25°C 10 0 0 8 10 12 14 16 18 20 Supply Voltage (V) 22 24 26 0 5 10 G009 NOTE: Dashed lines represent thermally limited region. Figure 14. 40 G010 0 PO = 1W PVDD = 8V RL = 8Ω T A = 25°C -10 -20 PO = 1W PVDD = 12V RL = 8Ω T A = 25°C -30 Crosstalk (dB) -30 Crosstalk (dB) 35 CROSSTALK vs FREQUENCY 0 -20 30 NOTE: Dashed lines represent thermally limited region. Figure 15. CROSSTALK vs FREQUENCY -10 15 20 25 Total Output Power (W) -40 -50 -60 Right to Left -70 -40 -50 -60 -70 Left to Right -80 -80 Left to Right -90 -90 -100 20 -100 20 Right to Left 100 1k Frequency (Hz) 10k 20k G011 Figure 16. 16 100 1k Frequency (Hz) 10k 20k G012 Figure 17. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 8 Ω (continued) CROSSTALK vs FREQUENCY CROSSTALK vs FREQUENCY 0 -10 -20 0 PO = 1W PVDD = 18V RL = 8Ω T A = 25°C -10 -20 -30 Crosstalk (dB) Crosstalk (dB) -30 PO = 1W PVDD = 24V RL = 8Ω T A = 25°C -40 -50 -60 -40 -50 -60 Right to Left -70 -70 Right to Left -80 -80 -90 -90 Left to Right Left to Right -100 20 100 1k Frequency (Hz) 10k 20k -100 20 G013 Figure 18. 100 1k Frequency (Hz) 10k 20k G014 Figure 19. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 17 TAS5715 SLOS645 – AUGUST 2010 www.ti.com TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 4 Ω TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY 10 10 PVDD = 12V RL = 4Ω T A = 25°C PVDD = 18V RL = 4Ω T A = 25°C PO = 5W 1 1 PO = 5W THD+N (%) THD+N (%) PO = 2.5W 0.1 PO = 1W PO = 1W 0.01 0.001 20 100 0.1 0.01 1k Frequency (Hz) 10k 0.001 20 20k 100 1k Frequency (Hz) G021 10k 20k G022 Figure 20. Figure 21. TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER 10 10 PVDD = 12V RL = 4Ω T A = 25°C PVDD = 18V RL = 4Ω T A = 25°C 1 1 f = 1kHz f = 1kHz THD+N (%) THD+N (%) PO = 2.5W 0.1 0.1 f = 20Hz 0.01 0.01 f = 10kHz f = 10kHz f = 20Hz 0.001 0.01 0.1 1 Output Power (W) 10 40 0.001 0.01 G026 Figure 22. 18 0.1 1 Output Power (W) 10 50 G027 Figure 23. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 TYPICAL CHARACTERISTICS, BTL CONFIGURATION, 4 Ω (continued) CROSSTALK vs FREQUENCY CROSSTALK vs FREQUENCY 0 -10 -10 -20 -30 -30 -40 -40 Crosstalk (dB) Crosstalk (dB) -20 0 PO = 1W PVDD = 12V RL = 4Ω T A = 25°C -50 -60 Right to Left -70 PO = 1W PVDD = 18V RL = 4Ω T A = 25°C -50 -60 Right to Left -70 -80 -80 Left to Right -90 -90 -100 -100 -110 20 100 1k Frequency (Hz) 10k 20k -110 20 G023 Figure 24. Left to Right 100 1k Frequency (Hz) 10k 20k G024 Figure 25. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 19 TAS5715 SLOS645 – AUGUST 2010 www.ti.com TYPICAL CHARACTERISTICS, PBTL CONFIGURATION, 4 Ω TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY TOTAL HARMONIC DISTORTION + NOISE vs FREQUENCY 10 10 PVDD = 12V RL = 4Ω T A = 25°C PVDD = 24V RL = 4Ω T A = 25°C 1 1 PO = 2.5W PO = 5W THD+N (%) THD+N (%) PO = 5W 0.1 PO = 1W 0.01 0.001 20 100 PO = 2.5W 0.1 0.01 1k Frequency (Hz) 10k PO = 1W 0.001 20 20k 100 1k Frequency (Hz) G015 20k G016 Figure 26. Figure 27. TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER TOTAL HARMONIC DISTORTION + NOISE vs OUTPUT POWER 10 10 PVDD = 12V RL = 4Ω T A = 25°C PVDD = 24V RL = 4Ω T A = 25°C 1 1 f = 1kHz f = 20Hz THD+N (%) THD+N (%) 10k f = 20Hz 0.1 0.1 f = 1kHz 0.01 0.01 f = 10kHz f = 10kHz 0.001 0.01 0.1 1 Output Power (W) 10 50 0.001 0.01 G017 Figure 28. 20 0.1 1 Output Power (W) 10 40 G018 Figure 29. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 TYPICAL CHARACTERISTICS, PBTL CONFIGURATION, 4 Ω (continued) OUTPUT POWER vs SUPPLY VOLTAGE EFFICIENCY vs TOTAL OUTPUT POWER 100 60 RL = 4Ω T A = 25°C 90 50 80 PVDD = 24V 70 40 PVDD = 12V Efficiency (%) Output Power (W) THD+N = 10% 30 THD+N = 1% 20 60 50 40 30 20 10 RL = 4Ω T A = 25°C 10 0 0 8 10 12 14 16 18 20 Supply Voltage (V) 22 24 26 0 G019 NOTE: Dashed lines represent thermally limited region. Figure 30. 10 20 30 40 Total Output Power (W) 50 60 G020 NOTE: Dashed line represents thermally limited region. Figure 31. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 21 TAS5715 SLOS645 – AUGUST 2010 www.ti.com DETAILED DESCRIPTION POWER SUPPLY To facilitate system design, the TAS5715 needs only a 3.3-V supply in addition to the (typical) 18-V power-stage supply. An internal voltage regulator provides suitable voltage levels for the gate drive circuitry. Additionally, all circuitry requiring a floating voltage supply, e.g., the high-side gate drive, is accommodated by built-in bootstrap circuitry requiring only a few external capacitors. In order to provide good electrical and acoustical characteristics, the PWM signal path for the output stage is designed as identical, independent half-bridges. For this reason, each half-bridge has separate bootstrap pins (BST_x) and power-stage supply pins (PVDD_x). The gate drive voltages (GVDD_AB and GVDD_CD) are derived from the PVDD voltage. Special attention should be paid to placing all decoupling capacitors as close to their associated pins as possible. In general, inductance between the power-supply pins and decoupling capacitors must be avoided. For a properly functioning bootstrap circuit, a small ceramic capacitor must be connected from each bootstrap pin (BST_x) to the power-stage output pin (OUT_x). When the power-stage output is low, the bootstrap capacitor is charged through an internal diode connected between the gate-drive regulator output pin (GVDD_x) and the bootstrap pin. When the power-stage output is high, the bootstrap capacitor potential is shifted above the output potential and thus provides a suitable voltage supply for the high-side gate driver. In an application with PWM switching frequencies in the range from 352 kHz to 384 kHz, it is recommended to use 33-nF ceramic capacitors, size 0603 or 0805, for the bootstrap supply. These 33-nF capacitors ensure sufficient energy storage, even during minimal PWM duty cycles, to keep the high-side power stage FET (LDMOS) fully turned on during the remaining part of the PWM cycle. Special attention should be paid to the power-stage power supply; this includes component selection, PCB placement, and routing. As indicated, each half-bridge has independent power-stage supply pins (PVDD_x). For optimal electrical performance, EMI compliance, and system reliability, it is important that each PVDD_x pin is decoupled with a 100-nF ceramic capacitor placed as close as possible to each supply pin. The TAS5715 is fully protected against erroneous power-stage turnon due to parasitic gate charging. I2C CHIP SELECT/HP_SHUTDOWN A_SEL/HP_SD is an input pin during power up. It can be pulled high or low. HIGH indicates an I2C subaddress of 0x56, and LOW a subaddress of 0x54. When used in headphone mode, this pin can be re-assigned as an output after reset during the initialization sequence. Then this pin functions as headphone shutdown (active-high shutdown). A device with a headphone should use an external pulldown, so the address is 0x54. SINGLE-FILTER PBTL MODE The TAS5715 supports parallel BTL (PBTL) mode with OUT_A/OUT_B (and OUT_C/OUT_D) connected before the LC filter. In order to put the part in PBTL configuration, drive PBTL (pin 8) HIGH. This synchronizes the turnoff of half-bridges A and B (and similarly C/D) if an overcurrent condition is detected in either half-bridge. There is a pulldown resistor on the PBTL pin that configures the part in BTL mode if the pin is left floating. PWM output multiplexers should be updated to set the device in PBTL mode. Output Mux Register (0x25) should be written with a value of 0x01 10 32 45. Also, the PWM shutdown register (0x19) should be written with a value of 0x3A. DEVICE PROTECTION SYSTEM Overcurrent (OC) Protection With Current Limiting The device has independent, fast-reacting current detectors on all high-side and low-side power-stage FETs. The detector outputs are closely monitored by two protection systems. The first protection system controls the power stage in order to prevent the output current further increasing, i.e., it performs a cycle-by-cycle current-limiting function, rather than prematurely shutting down during combinations of high-level music transients and extreme speaker load impedance drops. If the high-current condition situation persists, i.e., the power stage is being 22 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 overloaded, a second protection system triggers a latching shutdown, resulting in the power stage being set in the high-impedance (Hi-Z) state. The device returns to normal operation once the fault condition (i.e., a short circuit on the output) is removed. Current limiting and overcurrent protection are not independent for half-bridges. That is, if the bridge-tied load between half-bridges A and B causes an overcurrent fault, half-bridges A, B, C, and D are shut down. Overtemperature Protection The TAS5715 has an overtemperature-protection system. If the device junction temperature exceeds 150°C (nominal), the device is put into thermal shutdown, resulting in all half-bridge outputs being set in the high-impedance (Hi-Z) state and FAULT being asserted low. The TAS5715 recovers automatically once the temperature drops approximately 30°. Undervoltage Protection (UVP) and Power-On Reset (POR) The UVP and POR circuits of the TAS5715 fully protect the device in any power-up/down and brownout situation. While powering up, the POR circuit resets the overload circuit (OLP) and ensures that all circuits are fully operational when the PVDD and AVDD supply voltages reach 7.6 V and 2.7 V, respectively. Although PVDD and AVDD are independently monitored, a supply voltage drop below the UVP threshold on AVDD or on either PVDD pin results in all half-bridge outputs immediately being set in the high-impedance (Hi-Z) state and FAULT being asserted low. SSTIMER FUNCTIONALITY SSTIMER is used to reduced turnon pop. This is used only in AD mode. The SSTIMER pin uses a capacitor connected between this pin and ground to control the output duty cycle when exiting all-channel shutdown. The capacitor on the SSTIMER pin is slowly charged through an internal current source, and the charge time determines the rate at which the output transitions from a near-zero duty cycle to the desired duty cycle. This allows for a smooth transition that minimizes audible pops and clicks. When the part is shut down, the drivers are high-impedance and transition slowly down through a 3-kΩ resistor, similarly minimizing pops and clicks. The shutdown transition time is independent of the SSTIMER pin capacitance. Larger capacitors increase the start-up time, whereas capacitors smaller than 2.2 nF decrease the start-up time. The SSTIMER pin should be left floating for BD modulation. CLOCK, AUTO DETECTION, AND PLL The TAS5715 is a slave device. It accepts MCLK, SCLK, and LRCLK. The digital audio processor (DAP) supports all the sample rates and MCLK rates that are defined in the clock control register . The TAS5715 checks to verify that SCLK is a specific value of 32 fS, 48 fS, or 64 fS. The DAP only supports a 1 × fS LRCLK. The timing relationship of these clocks to SDIN is shown in subsequent sections. The clock section uses MCLK or the internal oscillator clock (when MCLK is unstable, out of range, or absent) to produce the internal clock (DCLK) running at 512 times the PWM switching frequency. The DAP can autodetect and set the internal clock-control logic to the appropriate settings for all supported clock rates as defined in the clock control register. TAS5715 has robust clock error handling that uses the bulit-in trimmed oscillator clock to quickly detect changes/errors. Once the system detects a clock change/error, it mutes the audio (through a single-step mute) and then forces PLL to limp using the internal oscillator as a reference clock. Once the clocks are stable, the system autodetects the new rate and reverts to normal operation. During this process, the default volume is restored in a single step (also called hard unmute). The ramp process can be programmed to ramp back slowly (also called soft unmute) as defined in volume register (0x0E). SERIAL DATA INTERFACE Serial data is input on SDIN. The PWM outputs are derived from SDIN. The TAS5715 DAP accepts serial data in 16-, 20-, or 24-bit left-justified, right-justified, or I2S serial data format. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 23 TAS5715 SLOS645 – AUGUST 2010 www.ti.com PWM Section The TAS5715 DAP device uses noise-shaping and sophisticated nonlinear correction algorithms to achieve high power efficiency and high-performance digital audio reproduction. The DAP uses a fourth-order noise shaper to increase dynamic range and SNR in the audio band. The PWM section accepts 24-bit PCM data from the DAP and outputs two BTL PWM audio output channels. The PWM section has individual-channel dc-blocking filters that can be enabled and disabled. The filter cutoff frequency is less than 1 Hz. Individual-channel de-emphasis filters for 44.1- and 48-kHz are included and can be enabled and disabled. Finally, the PWM section has an adjustable maximum modulation limit of 93.8% to 99.2%. For detailed description of using audio processing features like DRC, EQ, 3D, and bass boost, see the User's Guide and TAS570X GDE software development tool documentation. Also see the GDE software development tool for the device data path. I2C COMPATIBLE SERIAL CONTROL INTERFACE The TAS5715 DAP has an I2C serial control slave interface to receive commands from a system controller. The serial control interface supports both normal-speed (100-kHz) and high-speed (400-kHz) operations without wait states. As an added feature, this interface operates even if MCLK is absent. The serial control interface supports both single-byte and multiple-byte read and write operations for status registers and the general control registers associated with the PWM. SERIAL INTERFACE CONTROL AND TIMING I2S Timing I2S timing uses LRCLK to define when the data being transmitted is for the left channel and when it is for the right channel. LRCLK is low for the left channel and high for the right channel. A bit clock running at 32, 48, or 64 × fS is used to clock in the data. There is a delay of one bit clock from the time the LRCLK signal changes state to the first bit of data on the data lines. The data is written MSB-first and is valid on the rising edge of bit clock. The DAP masks unused trailing data-bit positions. 24 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 2 2-Channel I S (Philips Format) Stereo Input 32 Clks LRCLK (Note Reversed Phase) 32 Clks Right Channel Left Channel SCLK SCLK MSB 24-Bit Mode 23 22 MSB LSB 9 8 5 4 5 4 1 0 1 0 1 0 LSB 23 22 9 8 5 4 19 18 5 4 1 0 15 14 1 0 1 0 20-Bit Mode 19 18 16-Bit Mode 15 14 T0034-01 NOTE: All data presented in 2s-complement form with MSB first. Figure 32. I2S 64-fS Format 2 2-Channel I S (Philips Format) Stereo Input/Output (24-Bit Transfer Word Size) LRCLK 24 Clks 24 Clks Left Channel Right Channel SCLK SCLK MSB 24-Bit Mode 23 22 MSB LSB 17 16 9 8 5 4 13 12 5 4 1 0 9 1 0 3 2 1 0 LSB 23 22 17 16 9 8 5 4 19 18 13 12 5 4 1 0 15 14 9 1 0 3 2 1 20-Bit Mode 19 18 16-Bit Mode 15 14 8 8 T0092-01 NOTE: All data presented in 2s-complement form with MSB first. Figure 33. I2S 48-fS Format Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 25 TAS5715 SLOS645 – AUGUST 2010 www.ti.com 2 2-Channel I S (Philips Format) Stereo Input LRCLK 16 Clks 16 Clks Left Channel Right Channel SCLK SCLK MSB 16-Bit Mode MSB LSB 15 14 13 12 11 10 9 5 8 4 3 2 1 0 LSB 15 14 13 12 11 10 9 5 8 4 3 2 1 T0266-01 NOTE: All data presented in 2s-complement form with MSB first. Figure 34. I2S 32-fS Format Left-Justified Left-justified (LJ) timing uses LRCLK to define when the data being transmitted is for the left channel and when it is for the right channel. LRCLK is high for the left channel and low for the right channel. A bit clock running at 32, 48, or 64 × fS is used to clock in the data. The first bit of data appears on the data lines at the same time LRCLK toggles. The data is written MSB-first and is valid on the rising edge of the bit clock. The DAP masks unused trailing data-bit positions. 2-Channel Left-Justified Stereo Input 32 Clks 32 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 LSB 9 8 5 4 5 4 1 0 1 0 1 0 MSB LSB 23 22 9 8 5 4 19 18 5 4 1 0 15 14 1 0 1 0 20-Bit Mode 19 18 16-Bit Mode 15 14 T0034-02 NOTE: All data presented in 2s-complement form with MSB first. Figure 35. Left-Justified 64-fS Format 26 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 2-Channel Left-Justified Stereo Input (24-Bit Transfer Word Size) 24 Clks 24 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 21 LSB 17 16 9 8 5 4 13 12 5 4 1 0 9 1 0 1 0 MSB LSB 21 17 16 9 8 5 4 19 18 17 13 12 5 4 1 0 15 14 13 9 1 0 23 22 1 0 20-Bit Mode 19 18 17 16-Bit Mode 15 14 13 8 8 T0092-02 NOTE: All data presented in 2s-complement form with MSB first. Figure 36. Left-Justified 48-fS Format 2-Channel Left-Justified Stereo Input 16 Clks 16 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 16-Bit Mode 15 14 13 12 LSB 11 10 9 8 5 4 3 2 1 0 MSB 15 14 13 12 LSB 11 10 9 8 5 4 3 2 1 0 T0266-02 NOTE: All data presented in 2s-complement form with MSB first. Figure 37. Left-Justified 32-fS Format Right-Justified Right-justified (RJ) timing uses LRCLK to define when the data being transmitted is for the left channel and when Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 27 TAS5715 SLOS645 – AUGUST 2010 www.ti.com it is for the right channel. LRCLK is high for the left channel and low for the right channel. A bit clock running at 32, 48, or 64 × fS is used to clock in the data. The first bit of data appears on the data 8 bit-clock periods (for 24-bit data) after LRCLK toggles. In RJ mode the LSB of data is always clocked by the last bit clock before LRCLK transitions. The data is written MSB-first and is valid on the rising edge of bit clock. The DAP masks unused leading data-bit positions. 2-Channel Right-Justified (Sony Format) Stereo Input 32 Clks 32 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode LSB 23 22 19 18 15 14 1 0 19 18 15 14 1 0 15 14 1 0 MSB LSB 23 22 19 18 15 14 1 0 19 18 15 14 1 0 15 14 1 0 20-Bit Mode 16-Bit Mode T0034-03 Figure 38. Right-Justified 64-fS Format 28 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 2-Channel Right-Justified Stereo Input (24-Bit Transfer Word Size) 24 Clks 24 Clks Left Channel Right Channel LRCLK SCLK SCLK MSB 24-Bit Mode 23 22 LSB 19 18 15 14 6 5 2 1 0 19 18 15 14 6 5 2 1 0 15 14 6 5 2 1 0 LSB MSB 23 22 19 18 15 14 6 5 2 1 0 19 18 15 14 6 5 2 1 0 15 14 6 5 2 1 0 20-Bit Mode 16-Bit Mode T0092-03 Figure 39. Right-Justified 48-fS Format Figure 40. Right-Justified 32-fS Format Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 29 TAS5715 SLOS645 – AUGUST 2010 www.ti.com I2C SERIAL CONTROL INTERFACE The TAS5715 DAP has a bidirectional I2C interface that is compatible with the Inter IC (I2C) bus protocol and supports both 100-kHz and 400-kHz data transfer rates for single- and multiple-yte write and read operations. This is a slave-only device that does not support a multimaster bus environment or wait-state insertion. The control interface is used to program the registers of the device and to read device status. The DAP supports the standard-mode I2C bus operation (100 kHz maximum) and the fast I2C bus operation (400 kHz maximum). The DAP performs all I2C operations without I2C wait cycles. General I2C Operation The I2C bus employs two signals; SDA (data) and SCL (clock), to communicate between integrated circuits in a system. Data is transferred on the bus serially, one bit at a time. The address and data can be transferred in byte (8-bit) format, with the most significant bit (MSB) transferred first. In addition, each byte transferred on the bus is acknowledged by the receiving device with an acknowledge bit. Each transfer operation begins with the master device driving a start condition on the bus and ends with the master device driving a stop condition on the bus. The bus uses transitions on the data pin (SDA) while the clock is high to indicate start and stop conditions. A high-to-low transition on SDA indicates a start and a low-to-high transition indicates a stop. Normal data-bit transitions must occur within the low time of the clock period. These conditions are shown in Figure 41. The master generates the 7-bit slave address and the read/write (R/W) bit to open communication with another device and then waits for an acknowledge condition. The TAS5715 holds SDA low during the acknowledge clock period to indicate an acknowledgment. When this occurs, the master transmits the next byte of the sequence. Each device is addressed by a unique 7-bit slave address plus R/W bit (1 byte). All compatible devices share the same signals via a bidirectional bus using a wired-AND connection. An external pullup resistor must be used for the SDA and SCL signals to set the high level for the bus. SDA R/ A W 7-Bit Slave Address 7 6 5 4 3 2 1 0 8-Bit Register Address (N) 7 6 5 4 3 2 1 0 8-Bit Register Data For Address (N) A 7 6 5 4 3 2 1 8-Bit Register Data For Address (N) A 0 7 6 5 4 3 2 1 A 0 SCL Start Stop T0035-01 Figure 41. Typical I2C Sequence There is no limit on the number of bytes that can be transmitted between start and stop conditions. When the last word transfers, the master generates a stop condition to release the bus. A generic data transfer sequence is shown in Figure 41. The 7-bit address for TAS5715 is 0101 010 (0x54) or 0101 011 (0x56) defined by A_SEL (external pulldown for 0x54 and pullup for 0x56).Stero device with Headphone should use 0x54 as its device address. Single- and Multiple-Byte Transfers The serial control interface supports both single-byte and multiple-byte read/write operations for subaddresses 0x00 to 0x1F. However, for the subaddresses 0x20 to 0xFF, the serial control interface supports only multiple-byte read/write operations (in multiples of 4 bytes). During multiple-byte read operations, the DAP responds with data, a byte at a time, starting at the subaddress assigned, as long as the master device continues to respond with acknowledges. If a particular subaddress does not contain 32 bits, the unused bits are read as logic 0. During multiple-byte write operations, the DAP compares the number of bytes transmitted to the number of bytes that are required for each specific subaddress. For example, if a write command is received for a biquad subaddress, the DAP expects to receive five 32-bit words. If fewer than five 32-bit data words have been received when a stop command (or another start command) is received, the data received is discarded. 30 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 Supplying a subaddress for each subaddress transaction is referred to as random I2C addressing. The TAS5715 also supports sequential I2C addressing. For write transactions, if a subaddress is issued followed by data for that subaddress and the 15 subaddresses that follow, a sequential I2C write transaction has taken place, and the data for all 16 subaddresses is successfully received by the TAS5715. For I2C sequential write transactions, the subaddress then serves as the start address, and the amount of data subsequently transmitted, before a stop or start is transmitted, determines how many subaddresses are written. As was true for random addressing, sequential addressing requires that a complete set of data be transmitted. If only a partial set of data is written to the last subaddress, the data for the last subaddress is discarded. However, all other data written is accepted; only the incomplete data is discarded. Single-Byte Write As shown in Figure 42, a single-byte data-write transfer begins with the master device transmitting a start condition followed by the I2C device address and the read/write bit. The read/write bit determines the direction of the data transfer. For a data-write transfer, the read/write bit is 0. After receiving the correct I2C device address and the read/write bit, the DAP responds with an acknowledge bit. Next, the master transmits the address byte or bytes corresponding to the TAS5715 internal memory address being accessed. After receiving the address byte, the TAS5715 again responds with an acknowledge bit. Next, the master device transmits the data byte to be written to the memory address being accessed. After receiving the data byte, the TAS5715 again responds with an acknowledge bit. Finally, the master device transmits a stop condition to complete the single-byte data-write transfer. Start Condition Acknowledge A6 A5 A4 A3 A2 A1 A0 Acknowledge R/W ACK A7 A6 A5 2 A4 A3 A2 A1 Acknowledge A0 ACK D7 D6 Subaddress I C Device Address and Read/Write Bit D5 D4 D3 D2 D1 D0 ACK Stop Condition Data Byte T0036-01 Figure 42. Single-Byte Write Transfer Multiple-Byte Write A multiple-byte data-write transfer is identical to a single-byte data write transfer except that multiple data bytes are transmitted by the master device to the DAP as shown in Figure 43. After receiving each data byte, the TAS5715 responds with an acknowledge bit. Start Condition Acknowledge A6 A5 A1 A0 R/W ACK A7 2 I C Device Address and Read/Write Bit A6 A5 A4 A3 Subaddress A1 Acknowledge Acknowledge Acknowledge Acknowledge A0 ACK D7 D0 ACK D7 D0 ACK D7 D0 ACK First Data Byte Other Data Bytes Last Data Byte Stop Condition T0036-02 Figure 43. Multiple-Byte Write Transfer Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 31 TAS5715 SLOS645 – AUGUST 2010 www.ti.com Single-Byte Read As shown in Figure 44, a single-byte data-read transfer begins with the master device transmitting a start condition followed by the I2C device address and the read/write bit. For the data-read transfer, both a write followed by a read are actually done. Initially, a write is done to transfer the address byte or bytes of the internal memory address to be read. As a result, the read/write bit becomes a 0. After receiving the TAS5715 address and the read/write bit, TAS5715 responds with an acknowledge bit. In addition, after sending the internal memory address byte or bytes, the master device transmits another start condition followed by the TAS5715 address and the read/write bit again. This time the read/write bit becomes a 1, indicating a read transfer. After receiving the address and the read/write bit, the TAS5715 again responds with an acknowledge bit. Next, the TAS5715 transmits the data byte from the memory address being read. After receiving the data byte, the master device transmits a not-acknowledge followed by a stop condition to complete the single-byte data-read transfer. Repeat Start Condition Start Condition Acknowledge A6 A5 A1 A0 R/W ACK A7 Acknowledge A6 2 A5 A4 A0 ACK A6 A5 A1 A0 R/W ACK D7 D6 2 I C Device Address and Read/Write Bit Subaddress I C Device Address and Read/Write Bit Not Acknowledge Acknowledge D1 D0 ACK Stop Condition Data Byte T0036-03 Figure 44. Single-Byte Read Transfer Multiple-Byte Read A multiple-byte data-read transfer is identical to a single-byte data-read transfer except that multiple data bytes are transmitted by the TAS5715 to the master device as shown in Figure 45. Except for the last data byte, the master device responds with an acknowledge bit after receiving each data byte. Repeat Start Condition Start Condition Acknowledge A6 2 A0 R/W ACK A7 I C Device Address and Read/Write Bit Acknowledge A6 A6 A0 ACK A5 Subaddress Acknowledge Acknowledge Acknowledge Not Acknowledge A0 R/W ACK D7 D0 ACK D7 D0 ACK D7 D0 ACK 2 I C Device Address and Read/Write Bit First Data Byte Other Data Bytes Last Data Byte Stop Condition T0036-04 Figure 45. Multiple-Byte Read Transfer Headphone Support in the TAS5715 The TAS5715 provides headphone PWM out that can drive a headphone amplifier. This feature cannot be used in lineout mode, because once the headphone is selected, the speaker is muted. See the headphone use model diagrams on how to use the headphone feature and quite turn on and off. The headphone volume register is 0x0C. Headphone control bits are in the system control2 register (0x05). Register 0x05 bit 4: This is headphone/speaker mode-select bit. Bit 3: This bit selects the headphone volume to be same as speaker channel volume or headphone volume register (0x0C). Bit 1: This bit is used to drive pin A_SEL_HP_SDZ as an output. This must be set to 1 if that pin is used. This pin is a multi-function pin. On reset, it is an input used for I2C address select. After coming out of reset, this pin can be programmed to be an output. It drives HP_SDZ when coming out of shutdown in headphone mode. The internal control state machine takes care of the timing on PWM switching and HP_SDZ going low to high to avoid start/stop clicks. 32 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 Bit 0: This is bit should be 1 if the headphone function is used in the TAS5715. If the headphone is not used, this bit can be cleared to 0. Then if bit 1 is also set to 1, the TAS5715 drives the FAULTZ signal out on the A_SEL pin. FAULTZ is the internal power-stage fault signal asserted low during errors like overcurrent, overtemperature, and UVP. Figure 46 shows the connection of A_SEL_HP_SDZ pin to headphone shutdown. 2 I S Audio Left TAS5715 Right (HP Amplifier) HPL HPR Addr = 0x54 RC Filter A_sel_HP_SDZ 15 kΩ B0424-01 Figure 46. Headphone Shutdown (HP_SD) Digital THD Manager The THD manager can be used to achieve digitally the {specified ?} THD levels without voltage clipping. This allows the customer to achieve the same THD (for example, 10% THD) for different power levels (15 W/10 W/5 W) with same PVCC level. The waveform of Figure 47 shows digital clipping using the THD manager. Figure 47. Digital Clipping Using the THD Manager Register 0x57 is used to achieve the clipping. Register 0x56 is used to scale the clipped waveform to get the desired power out. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 33 TAS5715 SLOS645 – AUGUST 2010 www.ti.com PWM DC Detection The TAS5715 supports a PWM dc-detect function. This is to detect dc present in the input source and generated by another means in the blocks prior to PCM-to-PWM conversion. If enabled (0x46, bit 10), the detection block checks for PWM duty cycle. If it is above the programmed threshold (0x0F, bits 7–4]) for more than the programmed duration of time (0x0F, bits 3–0), the PWM dc error flag is set on error register 0x02, bit 0. This bit is set as long as the dc condition remains. Once the dc condition is gone, the bit is cleared automatically. The bit is cleared if detection is disabled. Biquad Corruption Control The TAS5715 supports this function to prevent issues when a biquad value is corrupted due an error in the I2C line while updating biquads. The system controller writes a checksum for the biquads into the checksum register. Once the EQ CRC detect function is enabled (0x46, bit 25), the TAS5715 periodically calculates a checksum for biquads in DAP memory and compare it with the expected checksum. If an error occurs, then the crc error flag is set in register 0x02, bit 3. 34 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 Automatic Gain Limit (DRC) The DRC scheme has a single programmable threshold. There is one ganged DRC for the high-band left/right channels and one DRC for the low-band left/right channels. Output Level (dB) The DRC input/output diagram is shown in Figure 48. 1:1 Transfer Function Implemented Transfer Function T Input Level (dB) M0176-01 Professional-quality dynamic range compression automatically adjusts volume to flatten volume level. • Each DRC has adjustable threshold levels. • Programmable attack, release, and softening-filter constants • Transparent compression: compressors can attack fast enough to avoid apparent clipping before engaging, and decay times can be set slow enough to avoid pumping. Figure 48. Automatic Gain Limit Attack/Release Softening Filter Threshold DRC1 0x3C 0x3B 0x40 DRC2 0x3F 0x3E 0x43 Alpha Filter Structure S a w –1 Z B0265-05 T = 9.23 format, all other DRC coefficients are 3.23 format Figure 49. DRC Filter Structure DRC acts more like a gain limiter (automatic gain limiter, AGL). The block works to reduce the peak of energy if it goes beyond the programmable threshold level. DRC starts an attack event (reduces gain) if energy goes above the threshold. Similarly, it starts a release event if the level goes below the threshold (increases gain back to the original value). Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 35 TAS5715 SLOS645 – AUGUST 2010 www.ti.com Attack and release events occur only when level remains above or below the threshold continuously during the time-constant time. And the constant time is controlled by the attack/release rate. If the attack/release rate is short, DRC operates frequently. Attack time defines how fast to cut the signal to bring it under the threshold. Similarly, release time defines how fast to release the cut back to normal. Attack and release are shown in Figure 50. Threshold INPUT Threshold OUTPUT Attack Rate Release Rate W0003-01 Figure 50. Attack/Release The device should be in all-channel shutdown when DRC parameters are changed. The TAS57X GDE (GUI) takes care of this when changing DRC parameters. TAS5715 supports two-band and one-band DRC. Two-band DRC helps to get the maximum sound levels out of small, thin, low-cost speakers. It protects speakers from being overdriven/damaged and stops cabinet rattle without sacrificing loudness. In the two-band DRC mode, audio is split into to high-band and low-band. The bands have separate thresholds and attack/decay filters. Configuration is as shown in Figure 51. DRC1 (upper band) and DRC2 (lower band) can be programmed using GDE. Default values for attack and decay filters cover most of the cases. Only thresholds require updating, depending on the power levels for the upper and lower bands. 36 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 HPF L_IN DRC-1 Speaker EQ L_OUT LPF DRC-2 B0425-01 Figure 51. Two-Band DRC A crossover biquad should be used only for two-band DRC. It should be all-pass for the one-band DRC mode. Only DRC1 (upper band) is used in the one-band DRC mode. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 37 TAS5715 SLOS645 – AUGUST 2010 www.ti.com BANK SWITCHING The TAS5715 uses an approach called bank switching together with automatic sample-rate detection. All processing features that must be changed for different sample rates are stored internally in three banks. The user can program which sample rates map to each bank. By default, bank 1 is used in 32-kHz mode, bank 2 is used in 44.1/48-kHz mode, and bank 3 is used for all other rates. Combined with the clock-rate autodetection feature, bank switching allows the TAS5715 to detect automatically a change in the input sample rate and switch to the appropriate bank without any MCU intervention. An external controller configures bankable locations (0x29–0x36, 0x3A–0x3F, and 0x59,0x5D) for all three banks during the initialization sequence. If automatic bank switching is enabled (register 0x50, bits 2:0) , then the TAS5715 automatically swaps the coefficients for subsequent sample rate changes, avoiding the need for any external controller intervention for a sample-rate change. By default, bits 2:0 have the value 000; indicating that bank switching is disabled. In that state, updates to bankable locations take immediate effect. A write to register 0x50 with bits 2:0 being 001, 010, or 011 brings the system into the coefficient-bank-update state update bank1, update bank2, or update bank3, respectively. Any subsequent write to bankable locations updates the coefficient banks stored outside the DAP. After updating all the three banks, the system controller should issue a write to register 0x50 with bits 2:0 being 100; this changes the system state to automatic bank-switching mode. In automatic bank-switching mode, the TAS5715 automatically swaps banks based on the sample rate. Command sequences for updating DAP coefficients can be summarized as follows: 1. Bank switching disabled (default): DAP coefficient writes take immediate effect and are not influenced by subsequent sample rate changes. OR Bank switching enabled: (a) Update bank-1 mode: Write 001 to bits 2:0 of reg 0x50. Load the 32-kHz coefficients. (b) Update bank-2 mode: Write 010 to bits 2:0 of reg 0x50. Load the 48-kHz coefficients. (c) Update bank-3 mode: Write 011 to bits 2:0 of reg 0x50. Load the other coefficients. (d) Enable automatic bank switching by writing 100 to bits 2:0 of reg 0x50. 26-Bit 3.23 Number Format All mixer gain coefficients are 26-bit coefficients using a 3.23 number format. Numbers formatted as 3.23 numbers means that there are 3 bits to the left of the binary point and 23 bits to the right of the binary point. This is shown in Figure 52 . 2 –23 2 2 –5 –1 Bit Bit Bit 0 2 Bit 1 2 Bit Sign Bit S_xx.xxxx_xxxx_xxxx_xxxx_xxxx_xxx M0125-01 Figure 52. 3.23 Format 38 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 The decimal value of a 3.23 format number can be found by following the weighting shown in Figure 52. If the most significant bit is logic 0, the number is a positive number, and the weighting shown yields the correct number. If the most significant bit is a logic 1, then the number is a negative number. In this case every bit must be inverted, a 1 added to the result, and then the weighting shown in Figure 53 applied to obtain the magnitude of the negative number. 1 0 2 Bit 2 Bit 1 2 –1 Bit 0 2 (1 or 0) ´ 2 + (1 or 0) ´ 2 + (1 or 0) ´ 2 –1 –4 Bit 2 + ....... (1 or 0) ´ 2 –4 –23 Bit + ....... (1 or 0) ´ 2 –23 M0126-01 Figure 53. Conversion Weighting Factors—3.23 Format to Floating Point Gain coefficients, entered via the I2C bus, must be entered as 32-bit binary numbers. The format of the 32-bit number (4-byte or 8-digit hexadecimal number) is shown in Figure 54 Fraction Digit 6 Sign Bit Fraction Digit 1 Integer Digit 1 Fraction Digit 2 Fraction Digit 3 Fraction Digit 4 Fraction Digit 5 u u u u u u S x x. x x x x x x x x x x x x x x x x x x x x x x x 0 Coefficient Digit 8 Coefficient Digit 7 Coefficient Digit 6 Coefficient Digit 5 Coefficient Digit 4 Coefficient Digit 3 Coefficient Digit 2 Coefficient Digit 1 u = unused or don’t care bits Digit = hexadecimal digit M0127-01 2 Figure 54. Alignment of 3.23 Coefficient in 32-Bit I C Word Table 1. Sample Calculation for 3.23 Format db Linear Decimal 0 1 8,388,608 Hex (3.23 Format) 80 0000 5 1.77 14,917,288 00E3 9EA8 –5 0.56 4,717,260 0047 FACC X L = 10(X/20) D = 8388608 × L H = dec2hex (D, 8) Table 2. Sample Calculation for 9.17 Format db Linear Decimal Hex (9.17 Format) 0 1 131,072 20 000 38 A3D 5 1.77 231,997 –5 0.56 73,400 11 EB8 X L = 10(X/20) D = 131,072 × L H = dec2hex (D, 8) Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 39 40 2 Submit Documentation Feedback Product Folder Link(s): TAS5715 PVDD RESET SCL SDA 0 ns 0 ns 100 ms 100 μs 3V 10 ms 8V 6V 13.5 ms Trim 50 ms DAP Config Other Config tPLL (1) tPLL has to be greater than 240 ms + 1.3 tstart. This constraint only applies to the first trim command following AVDD/DVDD power-up. It does not apply to trim commands following subsequent resets. (2) tstart/tstop = PWM start/stop time as defined in register 0X1A I C PDN AVDD/DVDD Initialization (1) Exit SD (1) tPLL (2) 1 ms + 1.3 tstart Volume and Mute Commands Normal Operation Enter SD 50 ms 1 ms + 1.3 tstop Shutdown (2) 2 ms 2 ms 2 ms 8V 6V 0 ns Powerdown T0419-03 3V TAS5715 SLOS645 – AUGUST 2010 www.ti.com Recommended Use Model Figure 55. Recommended Command Sequence Copyright © 2010, Texas Instruments Incorporated TAS5715 www.ti.com SLOS645 – AUGUST 2010 3V AVDD/DVDD 0 ns 2 ms PDN 0 ns 2 I C 2 ms RESET 2 ms 0 ns 8V PVDD 6V T0420-05 Figure 56. Power Loss Sequence Initialization Sequence Use the following sequence to power-up and initialize the device: 1. Hold all digital inputs low and ramp up AVDD/DVDD to at least 3V. 2. Initialize digital inputs and PVDD supply as follows: • Drive RESET = 0, PDN = 1, and other digital inputs to their desired state while ensuring that all are never more than 2.5V above AVDD/DVDD. Wait at least 100µs, drive RESET = 1, and wait at least another 13.5ms. • Ramp up PVDD to at least 8V while ensuring that it remains below 6V for at least 100µs after AVDD/DVDD reaches 3V. Then wait at least another 10µs. 3. Trim oscillator (write 0x00 to register 0x1B) and wait at least 50ms. 4. Configure the DAP via I2C (see Users's Guide for typical values). 5. Configure remaining registers. 6. Exit shutdown (sequence defined below). Normal Operation The following are the only events supported during normal operation: 1. Writes to master/channel volume registers. 2. Writes to soft mute register. 3. Enter and exit shutdown (sequence defined below). 4. Clock errors and rate changes. Note: Events 3 and 4 are not supported for 240ms+1.3*Tstart after trim following AVDD/DVDD powerup ramp (where Tstart is specified by register 0x1A). Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 41 TAS5715 SLOS645 – AUGUST 2010 www.ti.com Shutdown Sequence Enter: 1. Ensure I2S clocks have been stable and valid for at least 50ms. 2. Write 0x40 to register 0x05. 3. Wait at least 1ms+1.3*Tstop (where Tstop is specified by register 0x1A). 4. Once in shutdown, stable clocks are not required while device remains idle. 5. If desired, reconfigure by ensuring that clocks have been stable and valid for at least 50ms before returning to step 4 of initialization sequence. 1. Ensure I2S clocks have been stable and valid for at least 50ms. 2. Write 0x00 to register 0x05 (exit shutdown command may not be serviced for as much as 240ms after trim following AVDD/DVDD powerup ramp). 3. Wait at least 1ms+1.3*Tstart (where Tstart is specified by register 0x1A). 4. Proceed with normal operation. Exit: Powerdown Sequence Use the following sequence to powerdown the device and its supplies: 1. If time permits, enter shutdown (sequence defined above); else, in case of sudden power loss, assert PDN = 0 and wait at least 2ms. 2. Assert RESET = 0. 3. Drive digital inputs low and ramp down PVDD supply as follows: 4. 42 • Drive all digital inputs low after RESET has been low for at least 2µs. • Ramp down PVDD while ensuring that it remains above 8V until RESET has been low for at least 2µs. Ramp down AVDD/DVDD while ensuring that it remains above 3V until PVDD is below 6V and that it is never more than 2.5V below the digital inputs. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 Headphone Usage HP/SPKR (SE/BTL) VALID PWM_A(L+) PWM_C(R+) SpkrL+/R+ 50% t(exitSDHP) t(mute) PWM_B(L–) PWM_D(R–) SpkrL+/R+ HPL/R t(enterSDHPamp) t(mute) t(exitSDHPamp) SpkrL–/R– SpkrL–/R– 50% t(enterSD) t(exitSD) FAULT = 1 Output HPSD (A0/FAULT) Hi-Z (Ext. Pulldown) I2C: SCL SDA Mute Enter ACSD HP Config Exit ACSD Enable FAULT Unmute Mute Disable FAULT Enter ACSD Spkr Config Exit ACSD Unmute (if not done in Spkr Config) PDN T0452-01 Headphone/Speaker Configuration PARAMETE R t(mute) t(exitSD) t(enterSD) t(exitSDHP) t(exitSDHPamp) t(enterSDHPamp) DESCRIPTION Mute volume ramp wait time (t(volramp) given by register 0x0E <2:0>) Exit shutdown wait time before issuing further commands to device (t(start) given by regioster 0x1A<4:0>) Enter shutdown wait time before issuing further commands to device (t(stop) given by regioster 0x1A<4:0>) Exit shutdown wait time before enabling external headphone amp (t(HPchg) given by register 0x1A<6:5>) Headphone amp exit shutdown wait time before unmuting (t(HPamp) given by register 0x1C<7:4>) Headphone amp enter shutdown wait time before entering ACSD (t(HPamp) given by register 0x1C<7:4>) MIN TYP MAX UNIT 5 + 1.3 × t(volramp) ms 1 + 1.3 × t(start) ms 1 + 1.3 × t(stop) ms 1 + 1.3 × t(HPchg) ms 1 + 1.3 × t(HPamp) ms 1 + 1.3 × t(HPamp) ms Figure 57. Headphone Control Use Model Speaker Configuration • Registers 0x07–0x0B Master/channel speaker volume • Register 0x19 SDG = 0x30 or 0x00 (no channels in SDG) • Registers 0x11–0x12 ICD1/2 = {0xB8, 0x60} • Register 0x1A<7> Clear bit for speaker mode (HP/SPKR = 0) • Register 0x1A<4:0> Set to 0 1000 for 16.5-ms start/stop period • Register 0x20<23> Set bit for Ch1 BD mode • Register 0x20<19> Set bit for Ch2 BD mode • Register 0x46<1:0> Set both bits to enable DRC1 and DRC2 • Register 0x50<7> Clear bit to enable EQ Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 43 TAS5715 SLOS645 – AUGUST 2010 www.ti.com Headphone Configuration • Registers 0x07–0x0B Master/channel headphone volume • Register 0x19 SDG = 0x30 or 0x00 (PWM3/4 in SDG) • Registers 0x11–0x12 ICD1/2 = {0xAC, 0x54} • Register 0x1A<7> Clear bit for headphone mode (HP/SPKR = 0) • Register 0x1A<4:0> Set to 0 0000 for 0-ms start/stop period • Register 0x20<23> Clear bit for Ch1 AD mode • Register 0x20<19> Clear bit for Ch2 AD mode • Register 0x46<1:0> Clear both bits to disable DRC1 and DRC2 • Register 0x50<7> Set bit to disable EQ Headphone Mode Power Down HP/SPKR (SE/BTL) VALID PWM_A(L+) PWM_C(R+) HPL/R HPL/R t(exitSDHP) t(HPamp) t(exitSDHPamp) PWM_B(L–) PWM_D(R–) FAULT = 1 Output HPSD (A0/FAULT) Hi-Z (Ext. Pulldown) I2C: SCL SDA Enable FAULT t(PDN-HPSD) PDN T0453-01 PARAMETE R t(PDN-HPSD) t(exitSDHP) t(exitSDHPamp) t(HPamp) DESCRIPTION Delay from power-down event to headphone amplifier shutdown assertion Exit shutdown wait time before enabling external headphone amp (t(HPchg) given by register 0x1A<6:5>) Headphone amp exit shutdown wait time before unmuting (t(HPamp) given by register 0x1C<7:4>) Headphone amp enable/disable wait time (given by register 0x1C<7:4>) MIN TYP MAX 2 UNIT ms 1 + 1.3 × t(HPchg) ms 1 + 1.3 × t(HPamp) ms t(HPamp) ms Figure 58. Headphone Control Power Down 44 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 Headphone-Mode All-Channel Shutdown HP/SPKR (SE/BTL) VALID PWM_A(L+) PWM_C(R+) HPL/R HPL/R t(exitSDHP) t(mute) t(enterSDHPamp) t(exitSDHPamp) PWM_B(L–) PWM_D(R–) FAULT = 1 Output HPSD (A0/FAULT) Hi-Z (Ext. Pulldown) I2C: SCL SDA Mute Disable FAULT Enter ACSD HP Config Exit ACSD Enable FAULT Unmute PDN T0454-01 PARAMETE R t(mute) t(exitSDHP) t(exitSDHPamp) t(enterSDHPamp) DESCRIPTION MIN MAX UNIT 5 + 1.3 × t(volramp) ms 1 + 1.3 × t(HPchg) ms Mute volume ramp wait time (t(volramp) given by register 0x0E <2:0>) Exit shutdown wait time before enabling external headphone amp (t(HPchg) given by register 0x1A<6:5>) Headphone amp exit shutdown wait time before unmuting (t(HPamp) given by register 0x1C<7:4>) Headphone amp enter shutdown wait time before entering ACSD (t(HPamp) given by register 0x1C<7:4>) TYP 1 + 1.3 × t(HPamp) 1 + 1.3 × t(HPamp) ms ms Figure 59. Headphone Control ACSD Applying Soft Reset To soft-reset the device, write 0x01 to register 0xC8. Once soft reset is applied, I2C commands should not be sent for a duration of 2 × (1 ms + 1.3 × t(start/stop)) + 13.5 ms. Restrictions in Using 432-kHz Output Switching • • • • Only 48-kHz LRCLK is supported. The maximum allowed variance on LRCLK is 1%. The maxmimum allowed MCLK frequency is 12.288 MHz + 1%. Only 64-fS SCLK is supported. PWM headphone output is not supported. I2C Commands to enable 423-kHz Switching All I2C write operations should be at 100 kHz when used in this higher switching mode. No 400-kHz I2C is supported when used in this mode. To switch into 432-kHz switching mode, send the following commands before sending the exit shutdown command to register 0x05. • Write to register 0xF8 with a value of 0xA5A5A5A5. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 45 TAS5715 SLOS645 – AUGUST 2010 • • • • • • • 46 www.ti.com Write to register 0xC9 with a value of 0x000600EA. Write to register 0xCA with a value of 0x0000000000000098. Note that register 0xCA is a write-only register. Reads from this register are prohibited. Write to register 0x03 with a value of 0x88. Write to register 0x00 with a value of 0x6D. Write to register 0x00 with a value of 0x6C. Write to register 0x03 with a value of 0x80. Write to register 0x05 with a value of 0x00. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 Table 3. Serial Control Interface Register Summary SUBADDRESS REGISTER NAME NO. OF BYTES INITIALIZATION VALUE CONTENTS A u indicates unused bits. 0x00 Clock control register 1 Description shown in subsequent section 0x6C 0x01 Device ID register 1 Description shown in subsequent section 0x42 0x02 Error status register 1 Description shown in subsequent section 0x00 0x03 System control register 1 1 Description shown in subsequent section 0xA0 0x04 Serial data interface register 1 Description shown in subsequent section 0x05 0x05 System control register 2 1 Description shown in subsequent section 0x40 0x06 Soft mute register 1 Description shown in subsequent section 0x00 0x07 Master volume 1 Description shown in subsequent section 0xFF (mute) 0x08 Channel 1 vol 1 Description shown in subsequent section 0x30 (0 dB) 0x09 Channel 2 vol 1 Description shown in subsequent section 0x30 (0 dB) 0x0A Channel 3 vol 1 Description shown in subsequent section 0x30 (0 dB) 1 Reserved (1) 0x0B–0x0D 0x0E Volume configuration register 1 Description shown in subsequent section 0x90 0x0F Max duty cycle register 1 Description shown in subsequent section 0x97 0x10 Modulation limit register 1 Description shown in subsequent section 0x01 0x11 IC delay channel 1 1 Description shown in subsequent section 0xAC 0x12 IC delay channel 2 1 Description shown in subsequent section 0x54 0x13 IC delay channel 3 1 Description shown in subsequent section 0xAC 0x14 IC delay channel 4 1 Description shown in subsequent section 0x54 1 Reserved (1) 0x15–0x19 0x1A Start/stop period register 1 0x68 0x1B Oscillator trim register 1 0x82 0x1C BKND_ERR register 1 0x1D–0x1F 0x20 Input MUX register Reserved (1) 4 Description shown in subsequent section (1) 0x21 4 Reserved 0x22–0x24 4 Reserved (1) 4 Description shown in subsequent section 0x25 PWM MUX register 0x26–0x28 0x29 0x2A (1) 0x57 1 ch1_bq[0] ch1_bq[1] 0x0001 7772 0x0000 4303 0x0102 1345 (1) 4 Reserved 20 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 20 Reserved registers should not be accessed. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 47 TAS5715 SLOS645 – AUGUST 2010 www.ti.com Table 3. Serial Control Interface Register Summary (continued) SUBADDRESS 0x2B 0x2C 0x2D 0x2E 0x2F 0x30 0x31 0x32 0x33 48 REGISTER NAME ch1_bq[2] ch1_bq[3] ch1_bq[4] ch1_bq[5] ch1_bq[6] ch2_bq[0] ch2_bq[1] ch2_bq[2] ch2_bq[3] NO. OF BYTES 20 20 20 20 20 20 20 20 20 CONTENTS INITIALIZATION VALUE u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 Table 3. Serial Control Interface Register Summary (continued) SUBADDRESS 0x34 0x35 0x36 REGISTER NAME ch2_bq[4] ch2_bq[5] ch2_bq[6] NO. OF BYTES 20 20 20 INITIALIZATION VALUE CONTENTS u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 0x37 EQ CRC 4 u[31:16], EQ CRC [15:0] 0x0000 A14C 0x38 DRC CRC 4 u[31:16], DRC CRC [15:0] 0x0000 5395 Reserved (2) 0x0000 0000 8 Reserved (2) 0x0080 0000 8 u[31:26], ae[25:0] 0x0008 0000 u[31:26], oe[25:0] 0x0078 0000 0x39 0x3A 0x3B DRC1 softening filter alpha DRC1 softening filter omega 0x3C DRC1 attack rate 8 0x0000 0100 DRC1 release rate 0x3D 0x3E DRC2 softening filter alpha 0xFFFF FF00 8 Reserved (2) 8 u[31:26], ae[25:0] 0x0008 0000 u[31:26], oe[25:0] 0xFFF8 0000 DRC2 softening filter omega 0x3F DRC2 attack rate 8 DRC2 release rate 0x40 DRC1 attack threshold 8 0x43 DRC2 attack threshold 0x46 DRC and DC DETECT control 0x47–0x4F 0x0008 0000 u[31:26], rt[25:0] 0xFFF8 0000 0x0800 0000 T1'[31:0] 0x07FF FFFF 4 Reserved (2) 0x0000 0000 8 T2[31:0] (9.23 format) 0x0074 0000 T2'[31:0] 0x0073 FFFF 4 Reserved (2) 0x0000 0000 4 Description shown in subsequent section 0x0002 0020 4 Reserved (2) DRC2 release threshold 0x45 u[31:26], at[25:0] T1[31:0] (9.23 format) DRC1 release threshold 0x42 0x0080 0000 0x50 Bank switch control 4 Description shown in subsequent section 0x0F70 8000 0x51 Ch 1 output mixer 8 Ch 1 output mix1[1] 0x0080 0000 0x52 Ch 2 output mixer 8 Ch 1 output mix1[0] 0x0000 0000 Ch 2 output mix2[1] 0x0080 0000 Ch 2 output mix2[0] 0x53 (2) Ch 1 input mixers 16 0x0000 0000 2 Channel-1 input mixers can be accessed using I C subaddresses 0x70–0x73 using 4-byte access Reserved registers should not be accessed. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 49 TAS5715 SLOS645 – AUGUST 2010 www.ti.com Table 3. Serial Control Interface Register Summary (continued) SUBADDRESS REGISTER NAME NO. OF BYTES CONTENTS 0x54 Ch 2 input mixers 16 Channel-2 input mixers can be accessed using I2C subaddresses 0x74–0x77 using 4-byte access 0x56 Output post-scale 4 u[31:26], post[25:0] 0x0080 0000 0x57 Output pre-scale 4 u[31:26], pre[25:0] (9.17 format) 0x0002 0000 0x59 ch1 BQ[7] (DRC1 BQ) 20 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 u[31:26], b0[25:0] 0x0080 0000 u[31:26], b1[25:0] 0x0000 0000 u[31:26], b2[25:0] 0x0000 0000 u[31:26], a1[25:0] 0x0000 0000 u[31:26], a2[25:0] 0x0000 0000 0x5D 0x62 ch2 BQ[8] (DRC2 BQ) IDF post scale 20 4 0x0000 0080 Reserved (3) 0x0000 0000 4 Ch 1 Input mixer[3] 0x0080 0000 0x71 4 Reserved (3) 0x0000 0000 0x72 4 Ch 1 Input mixer[1]; THIS NODE is RESERVED as ZERO 0x0000 0000 0x63–0x6F 0x70 ch1 DRC cross-over_mixer_1 0x73 ch1 Input Sclaer 4 Ch 1 Input mixer[0] 0x0080 0000 0x74 ch2 DRC cross-over_mixer_1 4 Ch 2 Input mixer[3] 0x0080 0000 0x75 4 Reserved (3) 0x0000 0000 0x76 4 Ch 2 Input mixer[1]; THIS NODE is RESERVED as ZERO 0x0000 0000 4 Ch 2 Input mixer[0] 0x0080 0000 Reserved (3) 0x0000 0000 Soft Reset Reg (bit [0] = 1 assert soft reset to the device) 0x0000 0000 Reserved (3) 0x0000 0000 4 Reserved (3) 0x0000 0000 0x0000 0036 0x77 ch2 Input Scaler 0x78–0xC7 0xC8 Soft Reset Register [bit 0] 4 0xC9–0xF7 0xF8 0xF9 Update Dev Address Reg 4 u[31:8],New Dev Id[7:0] (New Dev Id = 0x38 for TAS5715) 0xFE Repeat Sub Address 4 Append the write to previous write 4 Reserved (3) 0xFA–0xFF (3) INITIALIZATION VALUE 0x0000 0000 Reserved registers should not be accessed. All DAP coefficients are 3.23 format unless specified otherwise. Registers 0x3B through 0x46 should be altered only during the initialization phase. 50 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 CLOCK CONTROL REGISTER (0x00) The clocks and data rates are automatically determined by the TAS5715. The clock control register contains the auto-detected clock status. Bits D7–D5 reflect the sample rate. Bits D4–D2 reflect the MCLK frequency. Table 4. Clock Control Register (0x00) D7 D6 D5 D4 D3 D2 D1 D0 0 0 0 – – – – – fS = 32-kHz sample rate 0 0 1 – – – – – Reserved (1) 0 1 0 – – – – – Reserved (1) 0 1 1 – – – – – fS = 44.1/48-kHz sample rate 1 0 0 – – – – – fS = 16-kHz sample rate 1 0 1 – – – – – fS = 22.05/24 -kHz sample rate 1 1 0 – – – – – fS = 8-kHz sample rate 1 1 1 – – – – – fS = 11.025/12-kHz sample rate – – – 0 0 0 – – MCLK frequency = 64 × fS – – – 0 0 1 – – MCLK frequency = 128 × fS (3) – – – 0 1 0 – – MCLK frequency = 192 × fS (4) – – – 0 1 1 – – MCLK frequency = 256 × fS – – – 1 0 0 – – MCLK frequency = 384 × fS – – – 1 0 1 – – MCLK frequency = 512 × fS – – – 1 1 0 – – Reserved (1) – – – 1 1 1 – – Reserved (1) – – – – – – 0 – Reserved (1) – – – – – – – 0 Reserved (1) (2) (3) (4) (5) FUNCTION (2) (3) (2) (5) (1) Reserved registers should not be accessed. Default values are in bold. Only available for 44.1-kHz and 48-kHz rates Rate only available for 32/44.1/48-KHz sample rates Not available at 8 kHz DEVICE ID REGISTER (0x01) The device ID register contains the ID code for the firmware revision. Table 5. General Status Register (0x01) D7 D6 D5 D4 D3 D2 D1 D0 0 1 0 0 0 0 1 0 FUNCTION Identification code Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 51 TAS5715 SLOS645 – AUGUST 2010 www.ti.com ERROR STATUS REGISTER (0x02) The error bits are sticky and are not cleared by the hardware. This means that the software must clear the register (write zeroes) and then read them to determine if they are persistent errors. Error definitions: • MCLK error : MCLK frequency is changing. The number of MCLKs per LRCLK is changing. • SCLK error: The number of SCLKs per LRCLK is changing. • LRCLK error: LRCLK frequency is changing. • Frame slip: LRCLK phase is drifting with respect to internal frame sync. • DC detect: This flag is set if PWM dc detect is enabled and dc is detected in the PWM block. Table 6. Error Status Register (0x02) D7 D6 D5 D4 D3 D2 D1 D0 1 – – – – – – – MCLK error – 1 – – – – – – PLL autolock error – – 1 – – – – – SCLK error – – – 1 – – – – LRCLK error – – – – 1 – – – EQ flag – – – – – 1 – – DRC flag – – – – – – 1 – Overcurrent, overtemperature, overvoltage, or undervoltage errors – – – – – – – 1 PWM DC-detect flag 0 0 0 0 0 0 0 0 No errors (1) FUNCTION (1) Default values are in bold. SYSTEM CONTROL REGISTER 1 (0x03) The system control register 1 has several functions: Bit D7: If 0, the dc-blocking filter for each channel is disabled. If 1, the dc-blocking filter (–3 dB cutoff <1 Hz) for each channel is enabled (default). Bit D5: If 0, use soft unmute on recovery from clock error. This is a slow recovery. Unmute takes the same time as the volume ramp defined in register 0x0E. If 1, use hard unmute on recovery from clock error (default). This is a fast recovery, a single-step volume ramp. Bits D1–D0: Select de-emphasis 52 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 Table 7. System Control Register 1 (0x03) D7 D6 D5 D4 D3 D2 D1 D0 0 – – – – – – – PWM high-pass (dc blocking) disabled FUNCTION 1 – – – – – – – PWM high-pass (dc blocking) enabled (1) (1) – 0 – – – – – – Reserved – – 0 – – – – – Soft unmute on recovery from clock error – – 1 – – – – – Hard unmute on recovery from clock error – – – 1 – – – – Reserved (1) – – – – 0 – – – Reserved (1) – – – – – 0 – – Reserved (1) – – – – – – 0 0 No de-emphasis – – – – – – 0 1 De-emphasis for fS = 32 kHz – – – – – – 1 0 De-emphasis for fS = 44.1 kHz – – – – – – 1 1 De-emphasis for fS = 48 kHz (1) (1) (1) Default values are in bold. SERIAL DATA INTERFACE REGISTER (0x04) As shown in Table 8, the TAS5715 supports nine serial data modes. The default is 24-bit, I2S mode. Table 8. Serial Data Interface Control Register (0x04) Format RECEIVE SERIAL DATA INTERFACE FORMAT WORD LENGTH D7–D4 D3 D2 D1 D0 Right-justified 16 0000 0 0 0 0 Right-justified 20 0000 0 0 0 1 Right-justified 24 0000 0 0 1 0 2 I S 16 000 0 0 1 1 I2S 20 0000 0 1 0 0 24 0000 0 1 0 1 Left-justified 16 0000 0 1 1 0 Left-justified 20 0000 0 1 1 1 Left-justified 24 0000 1 0 0 0 Reserved 0000 1 0 0 1 Reserved 0000 1 0 1 0 Reserved 0000 1 0 1 1 Reserved 0000 1 1 0 0 Reserved 0000 1 1 0 1 Reserved 0000 1 1 1 0 Reserved 0000 1 1 1 1 I2S (1) (1) Default values are in bold. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 53 TAS5715 SLOS645 – AUGUST 2010 www.ti.com SYSTEM CONTROL REGISTER 2 (0x05) When bit D6 is set low, the system exits all-channel shutdown and starts playing audio; otherwise, the outputs are shut down (hard mute). Table 9. System Control Register 2 (0x05) D7 D6 D5 D4 D3 D2 D1 D0 0 – – – – – – – Reserved (1) FUNCTION – 0 – – – – – – Exit all-channel shutdown (normal operation) (2) – 1 – – – – – – Enter all-channel shutdown (hard mute) (1) – – 0 - - – – – Reserved – – – 1 – – – – Headphone Mode – – – 0 – – – – Speaker Mode – – – – 1 – – – Channel Volume in Headphone Mode = 0x08/0x09 (same as speaker channel volume reg) – – – – 0 – – – Channel VOlume in Headphone Mode = 0x0C (headphone volume reg) (1) (1) (1) – – – – – 0 – – Reserved – – – – – – 0 – A_SEL/HP_SD configured as input – – – – – – 1 – A_SEL/HP_SD configured configured as output to use as external HP amplifier shutdown signal – – – – – – – 0 Internal power stage FAULT signal is the source of A_SEL/HP_SD pin – – – – – – – 1 HPSDZ is the source of A_SEL/HP_SD pin (set this before switching to headphone mode) (1) (2) Default values are in bold. When exiting all-channel shutdown, soft unmute is might not occur unless register 0x03, bit 5 is set to 1. SOFT MUTE REGISTER (0x06) Writing a 1 to any of the following bits sets the output of the respective channel to 50% duty cycle (soft mute). Table 10. Soft Mute Register (0x06) D7 D6 D5 D4 D3 D2 D1 D0 0 0 0 0 0 – – – Reserved (1) – – – – – 1 – – Soft mute channel 3 – – – – – 0 – – Soft unmute channel 3 – – – – – – 1 – Soft mute channel 2 – – – – – – 0 – Soft unmute channel 2 – – – – – – – 1 Soft mute channel 1 – – – – – – – 0 Soft unmute channel 1 (1) 54 FUNCTION Default values are in bold. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 VOLUME REGISTERS (0x07, 0x08, 0x09, 0x0C) Step size is 0.5 dB. Master volume – 0x07 (default is mute) Channel-1 volume – 0x08 (default is 0 dB) Channel-2 volume – 0x09 (default is 0 dB) Headphone volume – 0x0C (default is 0 dB) Volume in the TAS5715 is not intended for dynamic changes. Channel volumes are set during initialization. Master volume is written with a value 0xFF to MUTE and with a value of 0x30 to UNMUTE during normal mode. When DRC functionality is used, the maximum allowed volume (sum of channel and master volume ) is 15.5 dB. When DRC is enabled, a MUTE command does not completely mute the system. The actual mute level depends on the volume settings and modulation index. FINE VOLUME SETTING: TAS5715 has input mixers (0x73 , 0x77) that can be fine-tuned with a 3.23 format number to achieve the fine volume setting. To achieve 12.125 db of master volume, set the mixer to 0.125 db and set 0x07 (maser volume) to 12 db. The advantage is 0x73 and 0x77 can be set to a much finer setting using 3.23 format numbers, providing the flexibility to adjust output power precisely. Table 11. Volume Registers (0x07, 0x08, 0x09, 0x0C) D 7 D 6 D 5 D 4 D 3 D 2 D 1 D 0 0 0 0 0 0 0 0 0 24 dB 0 0 1 1 0 0 0 0 0 dB (default for individual channel volume) 1 1 1 1 1 1 1 0 –103 dB 1 1 1 1 1 1 1 1 Soft mute (1) FUNCTION (1) Default values are in bold. Table 12. Master Volume Table HEX dB HEX dB HEX dB HEX dB HEX dB HEX dB 00 24 30 0 60 –24 90 –48 C0 –72 F0 –96 01 23.5 31 –0.5 61 –24.5 91 –48.5 C1 –72.5 F1 –96.5 02 23 32 –1 62 –25 92 –49 C2 –73 F2 –97 03 22.5 33 –1.5 63 –25.5 93 –49.5 C3 –73.5 F3 –97.5 04 22 34 –2 64 –26 94 –50 C4 –74 F4 –98 05 21.5 35 –2.5 65 –26.5 95 –50.5 C5 –74.5 F5 –98.5 06 21 36 –3 66 –27 96 –51 C6 –75 F6 –99 07 20.5 37 –3.5 67 –27.5 97 –51.5 C7 –75.5 F7 –99.5 08 20 38 –4 68 –28 98 –52 C8 –76 F8 –100 09 19.5 39 –4.5 69 –28.5 99 –52.5 C9 –76.5 F8 0A 19 3A –5 6A –29 9A –53 CA –77 FA 0B 18.5 3B –5.5 6B –29.5 9B –53.5 CB –77.5 FB 0C 18 3C –6 6C –30 9C –54 CC –78 FC 0D 17.5 3D –6.5 6D –30.5 9D –54.5 CD –78.5 FD 0E 17 3E –7 6E –31 9E –55 CE –79 FE 0F 16.5 3F –7.5 6F –31.5 9F –55.5 CF –79.5 FF 10 16 40 –8 70 –32 A0 –56 D0 –80 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 55 TAS5715 SLOS645 – AUGUST 2010 www.ti.com Table 12. Master Volume Table (continued) 56 HEX dB HEX dB HEX dB HEX dB HEX dB 11 15.5 41 –8.5 71 –32.5 A1 –56.5 D1 –80.5 12 15 42 –9 72 –33 A2 –57 D2 –81 13 14.5 43 –9.5 73 –33.5 A3 –57.5 D3 –81.5 14 14 44 –10 74 –34 A4 –58 D4 –82 15 13.5 45 –10.5 75 –34.5 A5 –58.5 D5 –82.5 16 13 46 –11 76 –35 A6 –59 D6 –83 17 12.5 37 –11.5 77 –35.5 A7 –59.5 D7 –83.5 18 12 38 –12 78 –36 A8 –60 D8 –84 19 11.5 39 –12.5 79 –36.5 A9 –60.5 D9 –84.5 1A 11 4A –13 7A –37 AA –61 DA –85 1B 10.5 4B –13.5 7B –37.5 AB –61.5 DB –85.5 1C 10 4C –14 7C –38 AC –62 DC –86 1D 9.5 4D –14.5 7D –38.5 AD –62.5 DD –86.5 1E 9 4E –15 7E –39 AE –63 DE –87 1F 8.5 4F –15.5 7F –39.5 AF –63.5 DF –87.5 20 8 50 –16 80 –40 B0 –64 E0 –88 21 7.5 51 –16.5 81 –40.5 B1 –64.5 E1 –88.5 22 7 52 –17 82 –41 B2 –65 E2 –89 23 6.5 53 –17.5 83 –41.5 B3 –65.5 E3 –89.5 24 6 54 –18 84 –42 B4 –66 E4 –90 25 5.5 55 –18.5 85 –42.5 B5 –66.5 E5 –90.5 26 5 56 –19 86 –43 B6 –67 E6 –91 27 4.5 547 –19.5 87 –43.5 B7 –67.5 E7 –91.5 28 4 58 –20 88 –44 B8 –68 E8 –92 –92.5 29 3.5 59 –20.5 89 –44.5 B9 –68.5 E9 2A 3 5A –21 8A –45 BA –69 EA –93 2B 2.5 5B –21.5 8B –45.5 BB –69.5 EB –93.5 2C 2 5C –22 8C –46 BC –70 EC –94 2D 1.5 5D –22.5 8D –46.5 BD –70.5 ED –94.5 2E 1 5E –23 8E –47 BE –71 EE –95 2F 0.5 5F –23.5 8F –47.5 BF –71.5 EF –95.5 Submit Documentation Feedback HEX dB Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 VOLUME CONFIGURATION REGISTER (0x0E) Bits D2–D0: Volume slew rate (Used to control volume change and MUTE ramp rates). These bits control the number of steps in a volume ramp. Volume steps occur at a rate that depends on the sample rate of the I2S data as follows: Sample rate (KHz) Approximate ramp rate 8/16/32 125 ms/step 11.025/22.05/44.1 90.7 ms/step 12/24/48 83.3 ms/step Table 13. Volume Control Register (0x0E) D7 D6 D5 D4 D3 D2 D1 D0 1 0 0 1 0 – – – Reserved – – – – – 0 0 0 Volume slew 512 steps (43 ms volume ramp time at 48 kHz) (1) – – – – – 0 0 1 Volume slew 1024 steps (85 ms volume ramp time at 48 kHz) – – – – – 0 1 0 Volume slew 2048 steps (171 ms volume ramp time at 48 kHz) – – – – – 0 1 1 Volume slew 256 steps (21 ms volume ramp time at 48 kHz) – – – – – 1 X X Reserved (1) FUNCTION (1) Default values are in bold. DC DETECT CONTROL REGISTER (0x0F) Table 14. DC Detect Control Register (0x0F) (1) D7 D6 D5 D4 D3 D2 D1 D0 Magnitude MAX + MAX – 0 0 0 0 – – – – 7 52.73% 47.27% 0 0 0 1 – – – – 15 55.86% 44.14% 0 0 1 0 – – – – 23 58.98% 41.02% 0 0 1 1 – – – – 31 62.11% 37.89% 0 1 0 0 – – – – 39 65.23% 34.77% 0 1 0 1 – – – – 47 68.36% 31.64% 0 1 1 0 – – – – 55 71.48% 28.52% 0 1 1 1 – – – – 63 74.61% 25.39% 1 0 0 0 – – – – 71 77.73% 22.27% 1 0 0 1 – – – – 79 80.86% 19.14% 1 0 1 0 – – – – 87 83.98% 16.02% 1 0 1 1 – – – – 95 87.11% 12.89% 1 1 0 0 – – – – 103 90.23% 9.77% 1 1 0 1 – – – – 111 93.36% 6.64% 1 1 1 0 – – – – 119 96.48% 3.52% 1 1 1 1 – – – – 127 99.61% 0.39% Time, ms (1) – – – – 0 0 0 0 157.1 – – – – 0 0 0 1 314.2 – – – – 0 0 1 0 471.3 – – – – 0 0 1 1 628.4 – – – – 0 1 0 0 785.5 – – – – 0 1 0 1 942.6 – – – – 0 1 1 0 1099.7 See register 0x46, bit D10 for enable/disable control of this feature. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 57 TAS5715 SLOS645 – AUGUST 2010 www.ti.com Table 14. DC Detect Control Register (0x0F)(1) (continued) 58 D7 D6 D5 D4 D3 D2 D1 D0 – – – – 0 1 1 1 1256.8 – – – – 1 0 0 0 1413.9 – – – – 1 0 0 1 1571 – – – – 1 0 1 0 1728.1 – – – – 1 0 1 1 1885.2 – – – – 1 1 0 0 2042.3 – – – – 1 1 0 1 2199.4 – – – – 1 1 1 0 2356.5 – – – – 1 1 1 1 2513.6 Submit Documentation Feedback Magnitude MAX + MAX – Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 MODULATION LIMIT REGISTER (0x10) Table 15. Modulation Limit Register (0x10) (1) D7 D6 D5 D4 D3 D2 D1 D0 MODULATION LIMIT 0 0 0 0 0 – – – Reserved – – – – – 0 0 0 99.2% – – – – – 0 0 1 – – – – – 0 1 0 97.7% – – – – – 0 1 1 96.9% – – – – – 1 0 0 96.1% – – – – – 1 0 1 95.3% – – – – – 1 1 0 94.5% – – – – – 1 1 1 93.8% 98.4% (1) Default values are in bold. INTERCHANNEL DELAY REGISTERS (0x11, 0x12, 0x13, and 0x14) Internal PWM Channels 1, 2, 1, and 2 are mapped into registers 0x11, 0x12, 0x13, and 0x14. Table 16. Channel Interchannel Delay Register Format BIT DEFINITION (1) D7 D6 D5 D4 D3 D2 D1 D0 0 0 0 0 0 0 – – Minimum absolute delay, 0 DCLK cycles FUNCTION 0 1 1 1 1 1 – – Maximum positive delay, 31 × 4 DCLK cycles 1 0 0 0 0 0 – – Maximum negative delay, –32 × 4 DCLK cycles 0 0 Reserved SUBADDRESS D7 D6 D5 D4 D3 D2 D1 D0 Delay = (value) × 4 DCLKs 0x11 1 0 1 0 1 1 – – Default value for channel 1 (1) 0x12 0 1 0 1 0 1 – – Default value for channel 2 (1) 0x13 1 0 1 0 1 1 – – Default value for channel 1 (1) 0x14 0 1 0 1 0 1 – – Default value for channel 2 (1) Default values are in bold. ICD settings have high impact on audio performance (e.g.: dynamic range, THD, crosstalk, etc.) Therefore, appropriate ICD settings must be used. By default, the device has ICD settings for AD mode. If used in BD mode, then update these registers before coming out of all-channel shutdown. MODE AD MODE BD MODE 0x11 AC B8 0x12 54 60 0x13 AC A0 0x14 54 48 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 59 TAS5715 SLOS645 – AUGUST 2010 www.ti.com PWM SHUTDOWN GROUP REGISTER (0x19) Settings of this register determine which PWM channels are active. The value should be 0x30 for BTL mode and 0x3A for PBTL mode. The default value of this register is 0x30. The functionality of this register is tied to the state of bit D5 in the system control register. This register defines which channels belong to the shutdown group (SDG). If a 1 is set in the shutdown group register, that particular channel is not started following an exit out of all-channel shutdown command (if bit D5 is set to 0 in system control register 2, 0x05). Table 17. Shutdown Group Register D7 D6 D5 D4 D3 D2 D1 D0 0 – – – – – – – Reserved (1) – 0 – – – – – – Reserved (1) – – 1 – – – – – Reserved (1) – – – 1 – – – – Reserved (1) – – – – 0 – – – PWM channel 4 does not belong to shutdown group. – – – – 1 – – – PWM channel 4 belongs to shutdown group. – – – – – 0 – – PWM channel 3 does not belong to shutdown group. – – – – – 1 – – PWM channel 3 belongs to shutdown group. – – – – – – 0 – PWM channel 2 does not belong to shutdown group. – – – – – – 1 – PWM channel 2 belongs to shutdown group. – – – – – – – 0 PWM channel 1 does not belong to shutdown group. – – – – – – – 1 PWM channel 1 belongs to shutdown group. (1) 60 FUNCTION (1) (1) (1) (1) Default values are in bold. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 START/STOP PERIOD REGISTER (0x1A) This register is used to control the soft-start and soft-stop period following an enter/exit all-channel shutdown command or change in the PDN state. This helps reduce pops and clicks at start-up and shutdown.The times are only approximate and vary depending on device activity level and I2S clock stability. Table 18. Start/Stop Period Register (0x1A) D7 D6 D5 D4 D3 D2 D1 D0 0 1 0 – – – – – PWM headphone start/stop time = 94.2 ms – – – 0 0 X X X No 50% duty cycle start/stop period – – – 0 1 0 0 0 16.5-ms 50% duty cycle start/stop period (1) – – – 0 1 0 0 1 23.9-ms 50% duty cycle start/stop period – – – 0 1 0 1 0 31.4-ms 50% duty cycle start/stop period – – – 0 1 0 1 1 40.4-ms 50% duty cycle start/stop period – – – 0 1 1 0 0 53.9-ms 50% duty cycle start/stop period – – – 0 1 1 0 1 70.3-ms 50% duty cycle start/stop period – – – 0 1 1 1 0 94.2-ms 50% duty cycle start/stop period – – – 0 1 1 1 1 125.7-ms 50% duty cycle start/stop period – – – 1 0 0 0 0 164.6-ms 50% duty cycle start/stop period – – – 1 0 0 0 1 239.4-ms 50% duty cycle start/stop period – – – 1 0 0 1 0 314.2-ms 50% duty cycle start/stop period – – – 1 0 0 1 1 403.9-ms 50% duty cycle start/stop period – – – 1 0 1 0 0 538.6-ms 50% duty cycle start/stop period – – – 1 0 1 0 1 703.1-ms 50% duty cycle start/stop period – – – 1 0 1 1 0 942.5-ms 50% duty cycle start/stop period – – – 1 0 1 1 1 1256.6-ms 50% duty cycle start/stop period – – – 1 1 0 0 0 1728.1-ms 50% duty cycle start/stop period – – – 1 1 0 0 1 2513.6-ms 50% duty cycle start/stop period – – – 1 1 0 1 0 3299.1-ms 50% duty cycle start/stop period – – – 1 1 0 1 1 4241.7-ms 50% duty cycle start/stop period – – – 1 1 1 0 0 5655.6-ms 50% duty cycle start/stop period – – – 1 1 1 0 1 7383.7-ms 50% duty cycle start/stop period – – – 1 1 1 1 0 9897.3-ms 50% duty cycle start/stop period – – – 1 1 1 1 1 13,196.4-ms 50% duty cycle start/stop period (1) FUNCTION (1) Default values are in bold. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 61 TAS5715 SLOS645 – AUGUST 2010 www.ti.com OSCILLATOR TRIM REGISTER (0x1B) The TAS5715 PWM processor contains an internal oscillator to support autodetect of I2S clock rates. This reduces system cost because an external reference is not required. Currently, TI recommends a reference resistor value of 18.2 kΩ (1%). This should be connected between OSC_RES and DVSSO. Writing 0x00 to reg 0x1B enables the trim that was programmed at the factory. Note that trim must always be run following reset of the device. Table 19. Oscillator Trim Register (0x1B) D7 D6 D5 D4 D3 D2 D1 D0 1 – – – – – – – Reserved – 0 – – – – – – Oscillator trim not done (read-only) – 1 – – – – – – Oscillator trim done (read-only) – – 0 0 0 0 – – Reserved – – – – – – 0 – Select factory trim (write a 0 to select factory trim; default is 1.) – – – – – – 1 – Factory trim disabled – (1) – – – – – – 0 FUNCTION Reserved (1) (1) (1) (1) (1) Default values are in bold. BKND_ERR REGISTER (0x1C) When a back-end error signal is received from the internal power stage, the power stage is reset stopping all PWM activity. Subsequently, the modulator waits approximately for the time listed in Table 20 before attempting to re-start the power stage. Table 20. BKND_ERR Register (0x1C) (1) D7 D6 D5 D4 D3 D2 D1 D0 0 0 1 1 – – – – Headphone start/stop time = 4 ms (2) – – – – 0 0 1 0 Set back-end reset period to 299 ms – – – – 0 0 1 1 Set back-end reset period to 449 ms – – – – 0 1 0 0 Set back-end reset period to 598 ms – – – – 0 1 0 1 Set back-end reset period to 748 ms – – – – 0 1 1 0 Set back-end reset period to 898 ms – – – – 0 1 1 1 Set back-end reset period to 1047 ms (2) – – – – 1 0 0 0 Set back-end reset period to 1197 ms – – – – 1 0 0 1 Set back-end reset period to 1346 ms – – – – 1 0 1 X Set back-end reset period to 1496 ms – – – – 1 1 X X Set back-end reset period to 1496 ms (1) (2) 62 FUNCTION This register can be written only with a non-reserved value. Also, this register can be written once after a reset. Default values are in bold. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 INPUT MULTIPLEXER REGISTER (0x20) This register controls the modulation scheme (AD or BD mode) as well as the routing of I2S audio to the internal channels. Table 21. Input Multiplexer Register (0x20) D31 D30 D29 D28 D27 D26 D25 D24 0 0 0 0 0 0 0 0 D23 D22 D21 D20 D19 D18 D17 D16 (1) FUNCTION (1) 0 – – – – – – – Channel-1 AD mode 1 – – – – – – – Channel-1 BD mode – 0 0 0 – – – – SDIN-L to channel 1 – 0 0 1 – – – – SDIN-R to channel 1 – 0 1 0 – – – – Reserved – 0 1 1 – – – – Reserved – 1 0 0 – – – – Reserved – 1 0 1 – – – – Reserved – 1 1 0 – – – – Ground (0) to channel 1 – 1 1 1 – – – – Reserved – – – – 0 – – – Channel 2 AD mode – – – – 1 – – – Channel 2 BD mode – – – – – 0 0 0 SDIN-L to channel 2 – – – – – 0 0 1 SDIN-R to channel 2 – – – – – 0 1 0 Reserved – – – – – 0 1 1 Reserved – – – – – 1 0 0 Reserved – – – – – 1 0 1 Reserved – – – – – 1 1 0 Ground (0) to channel 2 – – – – – 1 1 1 Reserved D15 D14 D13 D12 D11 D10 D9 D8 0 1 1 1 0 1 1 1 D7 D6 D5 D4 D3 D2 D1 D0 0 (1) FUNCTION Reserved 1 1 1 0 0 1 0 (1) (1) FUNCTION Reserved (1) Reserved (1) FUNCTION Default values are in bold. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 63 TAS5715 SLOS645 – AUGUST 2010 www.ti.com RESERVED (0x21–0x24) PWM OUTPUT MUX REGISTER (0x25) This DAP output mux selects which internal PWM channel is output to the external pins. Any channel can be output to any external output pin. Bits D21–D20: Selects which PWM channel is output to OUT_A Bits D17–D16: Selects which PWM channel is output to OUT_B Bits D13–D12: Selects which PWM channel is output to OUT_C Bits D09–D08: Selects which PWM channel is output to OUT_D Note that channels are encoded so that channel 1 = 0x00, channel 2 = 0x01, …, channel 4 = 0x03. Table 22. PWM Output Mux Register (0x25) D31 D30 D29 D28 D27 D26 D25 D24 FUNCTION 0 0 0 0 0 0 0 1 D23 D22 D21 D20 D19 D18 D17 D16 0 0 – – – – – – Reserved (1) – – 0 0 – – – – Multiplex channel 1 to OUT_A – – 0 1 – – – – Multiplex channel 2 to OUT_A – – 1 0 – – – – Multiplex channel 1 to OUT_A – – 1 1 – – – – Multiplex channel 2 to OUT_A – – – – 0 0 – – Reserved – – – – – – 0 0 Multiplex channel 1 to OUT_B – – – – – – 0 1 Multiplex channel 2 to OUT_B – – – – – – 1 0 Multiplex channel 1 to OUT_B – – – – – – 1 1 Multiplex channel 2 to OUT_B D15 D14 D13 D12 D11 D10 D9 D8 FUNCTION (1) (1) (1) FUNCTION (1) 0 0 – – – – – – Reserved – – 0 0 – – – – Multiplex channel 1 to OUT_C – – 0 1 – – – – Multiplex channel 2 to OUT_C (1) – – 1 0 – – – – Multiplex channel 1 to OUT_C – – 1 1 – – – – Multiplex channel 2 to OUT_C – – – – 0 0 – – Reserved – – – – – – 0 0 Multiplex channel 1 to OUT_D – – – – – – 0 1 Multiplex channel 2 to OUT_D – – – – – – 1 0 Multiplex channel 1 to OUT_D – – – – – – 1 1 Multiplex channel 2 to OUT_D D7 D6 D5 D4 D3 D2 D1 D0 0 1 0 0 0 1 0 1 (1) 64 Reserved (1) (1) (1) FUNCTION Reserved (1) Default values are in bold. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 DRC AND DC DETECT CONTROL (0x46) Table 23. DRC AND DC DETECT CONTROL D31 D30 D29 D28 D27 D26 D25 D24 0 0 0 0 0 0 0 0 D23 D22 D21 D20 D19 D18 D17 D16 FUNCTION Reserved (1) Reserved (1) (1) FUNCTION 0 0 0 0 0 0 0 0 D15 D14 D13 D12 D11 D10 D9 D8 0 0 0 0 0 – – – Reserved – – – – – 0 – – PWM DC detect disabled – – – – – 1 – – PWM DC detect enabled – – – – – – 0 – EQ CRC detect disabled – – – – – – 1 – EQ CRC detect enabled – – – – – – – 0 DRC CRC detect disabled – – – – – – – 1 DRC CRC detect enabled D7 D6 D5 D4 D3 D2 D1 D0 (1) (2) (3) FUNCTION FUNCTION (1) 0 0 – – 0 0 – – Reserved – – 0 – – – – – Disable (1-H) complementary low-pass filter generation – – 1 – – – – – Enable (1-H) complementary low-pass filter generation – – – – – – 0 – DRC2 turned OFF – – – – – – 1 – DRC2 turned ON – – – – – – – 0 DRC1 turned OFF – – – – – – – 1 DRC1 turned ON (2) (3) (2) (2) Default values are in bold. Default values are in bold. If enabled, low-pass filter is generated by (1 – high-pass filter output). Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 65 TAS5715 SLOS645 – AUGUST 2010 www.ti.com BANK SWITCH AND EQ CONTROL (0x50) Table 24. Bank Switching Command D31 D30 D29 D28 D27 D26 D25 D24 0 – – – – – – – 32 kHz, does not use bank 3 1 – – – – – – – 32 kHz, uses bank 3 – 0 – – – – – – Reserved – – 0 – – – – – Reserved – – – 0 – – – – 44.1/48 kHz, does not use bank 3 – – – 1 – – – – 44.1/48 kHz, uses bank 3 – – – – 0 – – – 16 kHz, does not use bank 3 – – – – 1 – – – 16 kHz, uses bank 3 – – – – – 0 – – 22.025/24 kHz, does not use bank 3 – – – – – 1 – – 22.025/24 kHz, uses bank 3 – – – – – – 0 – 8 kHz, does not use bank 3 – – – – – – 1 – 8 kHz, uses bank 3 – – – – – – – 0 11.025 kHz/12, does not use bank 3 – – – – – – – 1 11.025/12 kHz, uses bank 3 D23 D22 D21 D20 D19 D18 D17 D16 0 – – – – – – – 32 kHz, does not use bank 2 1 – – – – – – – 32 kHz, uses bank 2 – 1 – – – – – – Reserved (1) – – 1 – – – – – Reserved (1) – – – 0 – – – – 44.1/48 kHz, does not use bank 2 – – – 1 – – – – 44.1/48 kHz, uses bank 2 – – – – 0 – – – 16 kHz, does not use bank 2 – – – – 1 – – – 16 kHz, uses bank 2 – – – – – 0 – – 22.025/24 kHz, does not use bank 2 – – – – – 1 – – 22.025/24 kHz, uses bank 2 – – – – – – 0 – 8 kHz, does not use bank 2 – – – – – – 1 – 8 kHz, uses bank 2 – – – – – – – 0 11.025/12 kHz, does not use bank 2 – – – – – – – 1 11.025/12 kHz, uses bank 2 D15 D14 D13 D12 D11 D10 D9 D8 0 – – – – – – – 32 kHz, does not use bank 1 1 – – – – – – – 32 kHz, uses bank 1 – 0 – – – – – – Reserved – – 0 – – – – – Reserved – – – 0 – – – – 44.1/48 kHz, does not use bank 1 – – – 1 – – – – 44.1/48 kHz, uses bank 1 – – – – 0 – – – 16 kHz, does not use bank 1 – – – – 1 – – – 16 kHz, uses bank 1 – – – – – 0 – – 22.025/24 kHz, does not use bank 1 – – – – – 1 – – 22.025/24 kHz, uses bank 1 – – – – – – 0 – 8 kHz, does not use bank 1 – – – – – – 1 – 8 kHz, uses bank 1 – – – – – – – 0 11.025/12 kHz, does not use bank 1 – – – – – – – 1 11.025/12 kHz, uses bank 1 (1) 66 FUNCTION (1) (1) (1) (1) (1) (1) FUNCTION (1) (1) (1) (1) (1) (1) FUNCTION (1) (1) (1) (1) (1) (1) Default values are in bold. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 TAS5715 www.ti.com SLOS645 – AUGUST 2010 Table 24. Bank Switching Command (continued) D7 D6 D5 D4 D3 D2 D1 D0 1 – – – – – – – EQ OFF (bypass BQ 0–7 of channels 1 and 2) – 0 – – – – – – Reserved – – 0 – – – – – Ignore bank-mapping in bits D31–D8.Use default mapping. – – – 0 – – – – L and R can be written independently. – – – 1 – – – – L and R are ganged for EQ biquads; a write to the left-channel biquad is also written to the right-channel biquad. (0x29–0x2F is ganged to 0x30–0x36. Also, 0x58–0x5B is ganged to 0x5C–0x5F. – – – – 0 – – – Enable DRC time constant filter banking – – – – 1 – – – Disable DRC time constantfilter banking – – – – – 0 0 0 No bank switching. All updates to DAP – – – – – 0 0 1 Configure bank 1 (32 kHz by default) – – – – – 0 1 0 Configure bank 2 (44.1/48 kHz by default) – – – – – 0 1 1 Configure bank 3 (other sample rates by default) – – – – – 1 0 0 Automatic bank selection – – – – – 1 0 1 Reserved – – – – – 1 1 X Reserved 0 EQ ON 1 (2) (3) FUNCTION (2) (2) Use bank-mapping in bits D31–D8. (2) (3) (2) Default values are in bold. Biquad ganging reduces the number of I2C transactions. This is very useful if the left and right PEQ biquads have the same coefficients. If ganging is ON (D4 = 1), then any write to left biquad is automatically copied to the corresponding right biquad. Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): TAS5715 67 PACKAGE OPTION ADDENDUM www.ti.com 20-Aug-2010 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Qty Eco Plan (2) Lead/ Ball Finish MSL Peak Temp (3) Samples (Requires Login) TAS5715PHP ACTIVE HTQFP PHP 48 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-260C-168 HR Purchase Samples TAS5715PHPR ACTIVE HTQFP PHP 48 1000 Green (RoHS & no Sb/Br) CU NIPDAU Level-3-260C-168 HR Purchase Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. 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