SSM4924GM Dual N-channel Enhancement-mode Power MOSFETs BVD2 Simple drive requirement D2 Lower gate charge D1 D1 Fast switching characteristics R I G2 S2 Pb-free; RoHS compliant. SO-8 S1 BVDSS 20V R DS(ON) 35mΩ ID 6A G1 DESCRIPTION Advanced Power MOSFETs from Silicon Standard provide the designer with the best combination of fast switching, ruggedized device design, low on-resistance and cost-effectiveness. D2 D1 G2 G1 The SSM4924GM is in an SO-8 package, which is widely preferred for commercial and industrial surface mount applications. This device is suitable for low voltage applications such as DC/DC converters. S1 S2 ABSOLUTE MAXIMUM RATINGS Symbol Parameter VDS Drain-Source Voltage VGS Gate-Source Voltage ID@TA=25°C Units 20 V ±8 V 3 6 A 3 4.8 A Continuous Drain Current ID@TA=70°C Rating Continuous Drain Current 1,4 IDM Pulsed Drain Current 35 A PD@TA=25°C Total Power Dissipation 2 W 0.016 W/°C Linear Derating Factor TSTG Storage Temperature Range -55 to 150 °C TJ Operating Junction Temperature Range -55 to 150 °C THERMAL DATA Symbol Rthj-amb 12/10/2004 Rev.2.01 Parameter Thermal Resistance Junction-ambient www.SiliconStandard.com Max. Value Unit 62.5 °C/W 1 of 6 SSM4924GM o ELECTRICAL CHARACTERISTICS @ Tj = 25 C (unless otherwise specified) Symbol Parameter Test Conditions BVDSS Drain-Source Breakdown Voltage ∆ BV DSS/∆ Tj RDS(ON) 20 - - V Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=1mA - 0.037 - V/°C Static Drain-Source On-Resistance VGS=4.5V, ID=6A - - 35 mΩ VGS=2.5V, ID=5.2A - - 50 mΩ VDS=VGS, ID=250uA 0.5 - 1.2 V VDS=10V, ID=6A - 18.5 - S Drain-Source Leakage Current (Tj=25 C) VDS=20V, VGS=0V - - 1 uA Drain-Source Leakage Current (Tj=70oC) VDS=16V, VGS=0V - - 25 uA Gate-Source Leakage VGS=±8V - - ID=6A - 9 - nC VGS(th) Gate Threshold Voltage gfs Forward Transconductance VGS=0V, ID=250uA o IDSS IGSS Min. Typ. Max. Units 2 ±100 nA Qg Total Gate Charge Qgs Gate-Source Charge VDS=10V - 1.8 - nC Qgd Gate-Drain ("Miller") Charge VGS=4.5V - 4.2 - nC VDS=10V - 6.5 - ns 2 td(on) Turn-on Delay Time tr Rise Time ID=1A - 14 - ns td(off) Turn-off Delay Time RG=6Ω ,VGS=4.5V - 20 - ns tf Fall Time RD=10Ω - 15 - ns Ciss Input Capacitance VGS=0V - 300 - pF Coss Output Capacitance VDS=8V - 255 - pF Crss Reverse Transfer Capacitance f=1.0MHz - 115 - pF SOURCE-DRAIN DIODE Symbol IS ISM VSD Parameter Test Conditions VD=VG=0V , VS=1.2V Continuous Source Current ( Body Diode ) Pulsed Source Current ( Body Diode ) 2 Forward On Voltage 1 Tj=25°C, IS=1.7A, VGS=0V Min. Typ. Max. Units - - 1.7 A - - 35 A - 0.75 1.2 V Notes: 1.Pulse width limited by maximum junction temperature. 2.Pulse width <300us, duty cycle <2%. 3.Surface-mounted on FR4 board, t<10sec. 4.Pulse width <10us, duty cycle <1%. 12/10/2004 Rev.2.01 www.SiliconStandard.com 2 of 6 SSM4924GM 25 25 o T C =25 C V G =4.5V V G =4.5V 20 V G =3.5V V G =3.0V ID , Drain Current (A) ID , Drain Current (A) 20 T C =150 o C 15 V G =2.5V 10 V G =3.5V V G =3.0V 15 V G =2.5V 10 V G =2.0V V G =2.0V 5 5 0 0 0 1 2 3 4 5 6 0 2 3 4 5 V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 6 1.8 45 Id=6A T c =25°C I D =6A V G =4.5V 1.6 Normalized RDS(ON) 40 35 RDSON (mΩ ) 1 V DS , Drain-to-Source Voltage (V) 30 1.4 1.2 1.0 25 0.8 0.6 20 2 3 4 5 -50 0 Fig 3. On-Resistance vs. Gate Voltage 12/10/2004 Rev.2.01 50 100 150 T j , Junction Temperature ( o C) V GS (V) Fig 4. Normalized On-Resistance vs. Junction Temperature www.SiliconStandard.com 3 of 6 SSM4924GM 3 8 7 6 ID , Drain Current (A) 2 PD (W) 5 4 3 1 2 1 0 0 25 50 75 100 125 0 150 50 100 150 T c ,Case Temperature ( o C) o T c , Case Temperature ( C) Fig 5. Maximum Drain Current vs. Case Temperature Fig 6. Typical Power Dissipation 100 1 Normalized Thermal Response (Rthja) DUTY=0.5 1ms 10 ID (A) 10ms 100ms 0.2 0.1 0.1 0.05 0.02 0.01 P DM 0.01 1 1s t T SINGLE PULSE Duty factor = t/T Peak Tj = PDM x Rthja + Ta T c =25 o C Single Pulse 0.001 0.1 0.1 1 10 100 0.0001 0.001 Fig 7. Maximum Safe Operating Area 12/10/2004 Rev.2.01 0.01 0.1 1 10 100 1000 t , Pulse Width (s) V DS (V) Fig 8. Effective Transient Thermal Impedance www.SiliconStandard.com 4 of 6 SSM4924GM I D =6A V DS =10V 5 Ciss 4 C (pF) VGS , Gate to Source Voltage (V) f=1.0MHz 1000 6 3 Coss 100 Crss 2 1 0 10 0 2 4 6 8 10 12 1 5 9 13 17 21 25 29 V DS (V) Q G , Total Gate Charge (nC) Fig 9. Gate Charge Characteristics Fig 10. Typical Capacitance Characteristics 1.5 100.00 10.00 1 T j =25 o C VGS(th) (V) IS(A) T j =150 o C 1.00 0.5 0.10 0.01 0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 0 -50 0 Fig 11. Forward Characteristic of Reverse Diode 12/10/2004 Rev.2.01 50 100 150 T j ,Junction Temperature ( o C) V SD (V) Fig 12. Gate Threshold Voltage vs. Junction Temperature www.SiliconStandard.com 5 of 6 SSM4924GM VDS 90% RD VDS D 0.5x RATED VDS G RG TO THE OSCILLOSCOPE 10% S + VGS VGS 4..5V - td(on) Fig 13. Switching Time Circuit td(off) tf tr Fig 14. Switching Time Waveform VG VDS 4.5V 0.5 x RATED VDS G S QG TO THE OSCILLOSCOPE D QGS QGD VGS + 1~ 3 mA I G I D Charge Fig 15. Gate Charge Circuit Q Fig 16. Gate Charge Waveform Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 12/10/2004 Rev.2.01 www.SiliconStandard.com 6 of 6