SSM9585GM P-channel Enhancement-mode Power MOSFET D Simple drive requirement Lower gate charge Fast switching characteristics G Pb-free; RoHS compliant. BVDSS -80V R DS(ON) 180mΩ ID -2.7A S DESCRIPTION D D Advanced Power MOSFETs from Silicon Standard provide the designer with the best combination of fast switching, ruggedized device design, low on-resistance and cost-effectiveness. D D G The SSM9585GM is in the SO-8 package, which is widely preferred for commercial and industrial surface mount applications. This device is suitable for low voltage applications such as DC/DC converters. SO-8 S S S ABSOLUTE MAXIMUM RATINGS Symbol Parameter VDS Drain-Source Voltage VGS Gate-Source Voltage ID @ TA=25°C ID @ TA=70°C Rating Units -80 V ±25 V 3 -2.7 A 3 -2.1 A Continuous Drain Current Continuous Drain Current 1 IDM Pulsed Drain Current -20 A PD @ TA=25°C Total Power Dissipation 2.5 W Linear Derating Factor 0.02 W/°C TSTG Storage Temperature Range -55 to 150 °C TJ Operating Junction Temperature Range -55 to 150 °C THERMAL DATA Symbol RΘj-a 3/21/2005 Rev.2.01 Parameter Maximum Thermal Resistance Junction-ambient www.SiliconStandard.com 3 Value Unit 50 °C/W 1 of 5 SSM9585GM ELECTRICAL CHARACTERISTICS (at Tj = 25°C, unless otherwise specified) Symbol Parameter Test Conditions Min. Typ. -80 - - V - -0.07 - V/°C VGS=-10V, ID=-2.7A - - 180 mΩ VGS=-4.5V, ID=-2.5A - - 200 mΩ Gate Threshold Voltage VDS=VGS, ID=-250uA -1 - -3 V gfs Forward Transconductance VDS=-10V, ID=-2.7A - 5 - S IDSS Drain-Source Leakage Current (Tj=25oC) VDS=-80V, VGS=0V - - -1 uA Drain-Source Leakage Current (Tj=70oC) VDS=-64V, VGS=0V - - -25 uA Gate-Source Leakage VGS=±25V - - ±100 nA ID=-2.7A - 18 28 nC BVDSS Drain-Source Breakdown Voltage ∆ BV DSS/∆ Tj Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=-1mA RDS(ON) VGS(th) IGSS Static Drain-Source On-Resistance 2 VGS=0V, ID=-250uA 2 Max. Units Qg Total Gate Charge Qgs Gate-Source Charge VDS=-64V - 5 - nC Qgd Gate-Drain ("Miller") Charge VGS=-4.5V - 7 - nC VDS=-40V - 10 - ns 2 td(on) Turn-on Delay Time tr Rise Time ID=-1A - 6 - ns td(off) Turn-off Delay Time RG=3.3Ω , VGS=-10V - 67 - ns tf Fall Time RD=40Ω 30 - ns Ciss Input Capacitance VGS=0V - 1790 2860 pF Coss Output Capacitance VDS=-25V - 140 - pF Crss Reverse Transfer Capacitance f=1.0MHz - 98 - pF Min. Typ. IS=-2A, VGS=0V - - -1.2 V SOURCE-DRAIN DIODE Symbol VSD Parameter 2 Forward On Voltage 2 Test Conditions Max. Units trr Reverse Recovery Time IS=-2.7A, VGS=0V, - 80 - ns Qrr Reverse Recovery Charge dI/dt=100A/µs - 320 - nC Notes: 1.Pulse width limited by maximum junction temperature. 2.Pulse width <300us, duty cycle <2%. 3.Surface-mounted on 1 in2 copper pad on FR4 board; 125°C/W when mounted on minimum copper pad. 3/21/2005 Rev.2.01 www.SiliconStandard.com 2 of 5 SSM9585GM 40 30 30 25 20 15 V G = -3.0 V 10 -10V -6.0V -5.0V -4.5V TA=150oC 25 -ID , Drain Current (A) 35 -ID , Drain Current (A) -10V -6.0V -5.0V -4.5V T A = 25 o C 20 15 10 V G = -3.0 V 5 5 0 0 0 4 8 12 16 20 0 2 -V DS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 6 8 10 12 14 Fig 2. Typical Output Characteristics 150 2.2 2.0 I D = -2.5 A T A =25°C I D = -2.7 A V G =-10V 1.8 Normalized R DS(ON) 145 RDS(ON) (mΩ ) 4 -V DS , Drain-to-Source Voltage (V) 140 135 1.6 1.4 1.2 1.0 0.8 130 0.6 0.4 125 3 4 5 6 7 8 9 10 -50 11 0 -V GS , Gate-to-Source Voltage (V) 50 100 150 o T j , Junction Temperature ( C) Fig 3. On-Resistance vs. Gate Voltage Fig 4. Normalized On-Resistance vs. Junction Temperature 3 6 2.5 2 T j =150 o C -VGS(th) (V) -IS(A) 4 T j =25 o C 2 1.5 1 0.5 0 0 0 3/21/2005 Rev.2.01 0.2 0.4 0.6 0.8 1 1.2 1.4 -50 0 50 100 150 o -V SD , Source-to-Drain Voltage (V) T j , Junction Temperature ( C) Fig 5. Forward Characteristic of Reverse Diode Fig 6. Gate Threshold Voltage vs. Junction Temperature www.SiliconStandard.com 3 of 5 SSM9585GM f=1.0MHz 10000 I D = -2.7A V DS = -64V 10 C iss 8 1000 C (pF) -VGS , Gate to Source Voltage (V) 12 6 4 C oss C rss 100 2 0 10 0 10 20 30 40 1 5 Q G , Total Gate Charge (nC) 9 13 17 21 25 29 -V DS , Drain-to-Source Voltage (V) Fig 7. Gate Charge Characteristics Fig 8. Typical Capacitance Characteristics 1 100 Normalized Thermal Response (Rthja) Duty factor=0.5 10 -ID (A) 1ms 1 10ms 100ms 0.1 T A =25 o C Single Pulse 1s DC 0.2 0.1 0.1 0.05 0.02 0.01 PDM 0.01 t Single Pulse T Duty factor = t/T Peak Tj = PDM x Rthja + Ta Rthja=125°C/W 0.001 0.01 0.1 1 10 100 1000 0.0001 0.001 0.01 -V DS , Drain-to-Source Voltage (V) Fig 9. Maximum Safe Operating Area 0.1 1 10 100 1000 t , Pulse Width (s) Fig 10. Effective Transient Thermal Impedance VG VDS 90% QG -4.5V QGS QGD 10% VGS td(on) tr td(off) tf Fig 11. Switching Time Waveform 3/21/2005 Rev.2.01 Charge Q Fig 12. Gate Charge Waveform www.SiliconStandard.com 4 of 5 SSM9585GM Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. 3/21/2005 Rev.2.01 www.SiliconStandard.com 5 of 5