SSM9916H,J N-CHANNEL ENHANCEMENT-MODE POWER MOSFET Low on-resistance D Capable of 2.5V gate drive Low drive current 18V RDS(ON) 25mΩ 35A ID G Simple drive requirement BV DSS S Description Power MOSFETs from Silicon Standard provide the designer with the best combination of fast switching, ruggedized device design, ultra low on-resistance and cost-effectiveness. G G D D S TO-252(H) S TO-251(J) Rating Units Absolute Maximum Ratings Parameter Symbol VDS Drain-Source Voltage 18 V VGS Gate-Source Voltage ± 12 V ID @ TC=25°C Continuous Drain Current, VGS @ 4.5V 35 A ID @ TC=125°C Continuous Drain Current, VGS @ 4.5V 16 A 1 IDM Pulsed Drain Current 90 A PD @ TC=25°C Total Power Dissipation 50 W Linear Derating Factor 0.4 W/°C TSTG Storage Temperature Range -55 to 150 °C TJ Operating Junction Temperature Range -55 to 150 °C Thermal Data Symbol Parameter Value Unit Rthj-c Thermal Resistance Junction-case Max. 2.5 °C/W Rthj-a Thermal Resistance Junction-ambient Max. 110 °C/W Rev.2.02 1/29/2004 www.SiliconStandard.com 1 of 6 SSM9916H,J Electrical Characteristics @ T j=25oC (unless otherwise specified) Symbol BVDSS ∆ BV DSS/∆ Tj RDS(ON) Parameter Test Conditions Min. Typ. 18 - - V Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=1mA - 0.03 - V/°C Static Drain-Source On-Resistance VGS=4.5V, ID=6A - - 25 mΩ VGS=2.5V, ID=5.2A - - 40 mΩ VDS=VGS, ID=250uA 0.5 - 1 V VDS=10V, ID=6A - 18 - S VDS=18V, VGS=0V - - 1 uA Drain-Source Leakage Current (Tj=125 C) VDS=18V ,VGS=0V - - 25 uA Gate-Source Leakage VGS= ± 12V - - ±100 nA ID=18A - 17.5 - nC Drain-Source Breakdown Voltage VGS(th) Gate Threshold Voltage gfs Forward Transconductance VGS=0V, ID=250uA o IDSS Drain-Source Leakage Current (Tj=25 C) o IGSS 2 Max. Units Qg Total Gate Charge Qgs Gate-Source Charge VDS=18V - 1.2 - nC Qgd Gate-Drain ("Miller") Charge VGS=5V - 7.9 - nC VDS=10V - 7.3 - ns 2 td(on) Turn-on Delay Time tr Rise Time ID=18A - 98 - ns td(off) Turn-off Delay Time RG=3.3 Ω ,VGS=5V - 25.6 - ns tf Fall Time RD=0.56Ω - 98 - ns Ciss Input Capacitance VGS=0V - 527 - pF Coss Output Capacitance VDS=18V - 258 - pF Crss Reverse Transfer Capacitance f=1.0MHz - 112 - pF Min. Typ. - - 35 A - - 90 A - - 1.3 V Source-Drain Diode Symbol IS ISM VSD Parameter Test Conditions VD=VG=0V , VS=1.3V Continuous Source Current ( Body Diode ) Pulsed Source Current ( Body Diode ) 2 Forward On Voltage 1 Tj=25°C, IS=35A, VGS=0V Max. Units Notes: 1.Pulse width limited by safe operating area. 2.Pulse width <300us , duty cycle <2%. Rev.2.02 1/29/2004 www.SiliconStandard.com 2 of 6 SSM9916H,J 80 100 T C =25 o C V G =4.5V T C =150 o C 70 V G =4.5V 80 ID , Drain Current (A) ID , Drain Current (A) 60 V G =3.5V 60 V G =2.5V 40 V G =3.5V 50 40 V G =2.5V 30 20 20 V G =1.5V V G =1.5V 10 0 0 0 1 2 3 4 5 6 0 7 1 Fig 1. Typical Output Characteristics 3 4 5 6 7 8 Fig 2. Typical Output Characteristics 1.8 30 I D= 6 A I D =6A 1.6 o 28 T C =25 C Normalized R DS(ON) 26 RDSON (mΩ ) 2 V DS , Drain-to-Source Voltage (V) V DS , Drain-to-Source Voltage (V) 24 22 20 V G =4.5V 1.4 1.2 1.0 0.8 18 0.6 1 2 3 4 5 6 -50 0 Fig 3. On-Resistance vs. Gate Voltage Rev.2.02 1/29/2004 50 100 150 T j , Junction Temperature ( o C) V GS (V) Fig 4. Normalized On-Resistance vs. Junction Temperature www.SiliconStandard.com 3 of 6 SSM9916H,J 60 40 35 50 40 25 PD (W) ID , Drain Current (A) 30 20 30 15 20 10 10 5 0 0 25 50 75 100 125 150 0 50 100 150 T c , Case Temperature ( o C) o T c , Case Temperature ( C) Fig 5. Maximum Drain Current vs. Case Temperature Fig 6. Typical Power Dissipation 1000 1 Normalized Thermal Response (R thjc) DUTY=0.5 100 ID (A) 10us 100us 1ms 10 10ms 100ms 1 0.2 0.1 0.05 0.1 0.02 PDM SINGLE PULSE 0.01 t T Duty factor = t/T Peak Tj = P DM x Rthjc + TC T c =25 o C Single Pulse 0.1 0.01 0.1 1 10 100 0.00001 0.0001 V DS (V) Fig 7. Maximum Safe Operating Area Rev.2.02 1/29/2004 0.001 0.01 0.1 1 t , Pulse Width (s) Fig 8. Effective Transient Thermal Impedance www.SiliconStandard.com 4 of 6 SSM9916H,J f=1.0MHz 16 1000 I D =18A VGS , Gate to Source Voltage (V) 14 Ciss V DS =10V 12 Coss V DS =15V 10 C (pF) V DS =18V 8 Crss 100 6 4 2 0 0 5 10 15 20 25 30 35 40 45 10 1 Q G , Total Gate Charge (nC) 5 Fig 9. Gate Charge Characteristics 9 13 V DS (V) 17 21 25 Fig 10. Typical Capacitance Characteristics 100 1.2 10 0.95 T j =150 o C VGS(th) (V) IS (A) T j =25 o C 1 0.7 0.45 0.1 0.2 0.01 0 0.4 0.8 1.2 1.6 -50 0 Fig 11. Forward Characteristic of Reverse Diode Rev.2.02 1/29/2004 50 100 T j , Junction Temperature ( o C ) V SD (V) 150 Fig 12. Gate Threshold Voltage vs. Junction Temperature www.SiliconStandard.com 5 of 6 SSM9916H,J VDS 90% RD VDS D 0.5x RATED VDS G RG TO THE OSCILLOSCOPE + 10% VGS S 5v VGS - td(on) tr Fig 13. Switching Time Circuit td(off) tf Fig 14. Switching Time Waveform VG VDS 5V RATED VDS G S QG TO THE OSCILLOSCOPE D QGS QGD VGS + 1~ 3 mA IG ID Charge Fig 15. Gate Charge Circuit Q Fig 16. Gate Charge Waveform Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of Silicon Standard Corporation or any third parties. Rev.2.02 1/29/2004 www.SiliconStandard.com 6 of 6