CEL NE32500M

NEC's C TO KA BAND
SUPER LOW NOISE AMPLIFIER
N-CHANNEL HJ FET CHIP
FEATURES
NE32500
OUTLINE DIMENSIONS (Units in µm)
• SUPER LOW NOISE FIGURE:
0.45 dB TYP at 12 GHz
CHIP
• HIGH ASSOCIATED GAIN:
12.5 dB TYP at 12 GHz
58
5.5
36.5
13
66
25
13
µm
• GATE LENGTH: LG = 0.20 µ
38
• GATE WIDTH: WG = 200 µm
Drain
89
DESCRIPTION
25
68
350
NEC's NE32500 is a Hetero-Junction FET chip that uses the
junction between Si-doped AlGaAs and undoped InGaAs to
create very high mobility electrons. Its excellent low noise figure
and high associated gain make it suitable for commercial
systems and industrial applications.
Source
Source
76.5
100.5
60
Gate
21
NEC's stringent quality assurance and test procedures assure
the highest reliability and performance.
46.5
25
25
66
43
49.5
13
350
Thickness = 140 µm
Bonding Area
ELECTRICAL CHARACTERISTICS
(TA = 25°C)
PART NUMBER
NE32500
PACKAGE OUTLINE
SYMBOLS
PARAMETERS AND CONDITIONS
00 (Chip)
UNITS
MIN
TYP
MAX
0.45
0.55
NF
Noise Figure, VDS = 2 V, IDS = 10 mA, f = 12 GHz
dB
GA
Associated Gain, VDS = 2 V, IDS = 10 mA, f = 12 GHz
dB
11.0
12.5
IDSS
Saturated Drain Current, VDS = 2 V,VGS = 0 V
mA
20
60
Transconductance, VDS = 2 V, ID = 10 mA
mS
45
60
Gate to Source Leakage Current, VGS = -3 V
µA
gm
IGSO
VGS(off)
RTH (CH-C)
Gate to Source Cutoff Voltage, VDS = 2 V, ID = 100 µA
Thermal Resistance1 (Channel to Case)
V
-0.2
°C/W
90
0.5
10.0
-0.7
-2.0
260
Note:
1. RF performance is determined by packaging and testing 10 chips per wafer.
Wafer rejection criteria for standard devices is 2 rejects per 10 samples.
California Eastern Laboratories
NE32500
ABSOLUTE MAXIMUM RATINGS1 (TA = 25°C)
PARAMETERS
UNITS
RATINGS
VDS
Drain to Source Voltage
V
4.0
VGS
Gate to Source Voltage
V
-3.0
IDS
Drain Current
mA
IDSS
PT
Total Power Dissipation2
mW
200
TCH
Channel Temperature
°C
175
TSTG
Storage Temperature
°C
-65 to +175
VDS = 2 V
Note:
1. Operation in excess of any one of these parameters may result in
permanent damage.
2. Chip mounted on Alumina heatsink (size: 3 x 3 x 0.6t)
Drain Current, ID (mA)
SYMBOLS
DRAIN CURRENT vs.
GATE TO SOURCE VOLTAGE
60
40
20
0
-2.0
-1.0
0
Gate to Source Voltage, VGS (V)
TYPICAL PERFORMANCE CURVES
(TA = 25°C)
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
250
100
200
80
Drain Current, ID (mA)
150
100
50
VGS = 0 V
60
-0.2 V
40
-0.4 V
20
-0.6 V
-0.8 V
0
0
50
100
150
200
250
0
Drain to Source Voltage, VDS (V)
Ambient Temperature, TA (°C)
NOISE FIGURE AND ASSOCIATED GAIN
vs. DRAIN CURRENT
NOISE FIGURE AND ASSOCIATED GAIN
vs. FREQUENCY
24
VDS = 2 V
f = 12 GHz
16
1.0
12
0.5
8
Noise Figure, NF (dB)
20
GA
Associated Gain, GA (dB)
VDS = 2 V
ID = 10 mA
Noise Figure, NF (dB)
3.0
1.5
14
GA
13
12
2.0
11
1.5
10
1.0
0.5
NF
NF
0
4
1
2
4
6
8 10
Frequency, f (GHz)
14
20
30
0
10
20
Drain Current, ID (mA)
30
Associated Gain, GA (dB)
Total Power Dissipation, PT (mW)
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
NE32500
TYPICAL SCATTERING PARAMETERS (TA = 25°C)
NE32500
VDS = 2 V, IDS = 10 mA
FREQUENCY
S11
S21
(GHz)
MAG
ANG
0.5
1.0
2.0
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
11.0
12.0
13.0
14.0
15.0
16.0
17.0
18.0
19.0
20.0
0.999
0.998
0.996
0.992
0.976
0.962
0.962
0.943
0.928
0.920
0.900
0.881
0.869
0.856
0.839
0.831
0.818
0.804
0.796
0.784
0.782
-4
-7
-14
-20
-28
-36
-42
-48
-55
-60
-67
-72
-77
-82
-86
-91
-96
-99
-103
-106
-111
MAG
4.34
4.33
4.28
4.24
4.169
4.11
4.06
3.95
3.83
3.73
3.58
3.46
3.334
3.23
3.11
3.01
2.88
2.78
2.68
2.59
2.49
S12
ANG
177
174
168
163
158
152
148
143
139
134
129
126
122
118
115
112
108
105
103
100
96
MAG
S22
ANG
MAG
ANG
82
84
81
76
71
66
62
58
55
51
47
43
40
37
34
32
29
27
24
22
20
0.564
0.562
0.559
0.557
0.551
0.546
0.539
0.533
0.526
0.519
0.508
0.503
0.494
0.488
0.483
0.476
0.472
0.468
0.464
0.460
0.456
-3
-6
-11
-17
-23
-29
-34
-40
-44
-49
-54
-58
-62
-66
-69
-72
-76
-79
-81
-84
-88
0.006
0.012
0.025
0.037
0.048
0.060
0.070
0.079
0.087
0.095
0.104
0.109
0.114
0.120
0.123
0.127
0.131
0.134
0.137
0.0141
0.142
Note:
1. Gain Calculation:
2
2
2
|S21|
|S21| (K ± K 2 - 1 ). When K ≤ 1, MAG is undefined and MSG values are used.
MSG =
, K = 1 + | ∆ | - |S11| - |S22| , ∆ = S11 S22 - S21 S12
|S12|
|S12|
2 |S12 S21|
MAG = Maximum Available Gain
MSG = Maximum Stable Gain
MAG =
ORDERING INFORMATION
PART
IDSS SELECTION (mA)
NE32500
20 to 90 (Standard)
NE32500N
0 to 60
NE32500M
50 to 90
Life Support Applications
These NEC products are not intended for use in life support devices, appliances, or systems where the malfunction of these products can reasonably
be expected to result in personal injury. The customers of CEL using or selling these products for use in such applications do so at their own risk and
agree to fully indemnify CEL for all damages resulting from such improper use or sale.
EXCLUSIVE NORTH AMERICAN AGENT FOR
RF, MICROWAVE & OPTOELECTRONIC SEMICONDUCTORS
CALIFORNIA EASTERN LABORATORIES • Headquarters • 4590 Patrick Henry Drive • Santa Clara, CA 95054-1817 • (408) 988-3500 • Telex 34-6393 • FAX (408) 988-0279
24-Hour Fax-On-Demand: 800-390-3232 (U.S. and Canada only) • Internet: http://WWW.CEL.COM
6/21/2000
DATA SUBJECT TO CHANGE WITHOUT NOTICE
1-32