ISSI IS64C1024AL

IS61C1024AL
IS64C1024AL
128K x 8 HIGH-SPEED CMOS STATIC RAM
FEATURES
• High-speed access time: 12, 15 ns
• Low active power: 160 mW (typical)
• Low standby power: 1000 µW (typical) CMOS
standby
• Output Enable (OE) and two Chip Enable
(CE1 and CE2) inputs for ease in applications
• Fully static operation: no clock or refresh required
• TTL compatible inputs and outputs
• Single 5V (±10%) power supply
• Commercial, industrial, and automotive temperature ranges available
• Lead free available
MAY 2012
DESCRIPTION
The ISSI IS61C1024AL/IS64C1024AL is a very high-
speed, low power, 131,072-word by 8-bit CMOS static
RAMs. They are fabricated using ISSI's high-performance
CMOS technology. This highly reliable process coupled
with innovative circuit design techniques, yields higher
performance and low power consumption devices.
When CE1 is HIGH or CE2 is LOW (deselected), the device
assumes a standby mode at which the power dissipation
can be reduced by using CMOS input levels.
Easy memory expansion is provided by using two Chip
Enable inputs, CE1 and CE2.The active LOW Write Enable
(WE) controls both writing and reading of the memory.
The IS61C1024AL/IS64C1024AL is available in 32-pin
300-mil SOJ, 32-pin 400-mil SOJ, 32-pin TSOP (Type I,
8x20), and 32-pin sTSOP (Type I, 8 x 13.4) packages.
FUNCTIONAL BLOCK DIAGRAM
A0-A16
DECODER
128K x 8
MEMORY ARRAY
I/O
DATA
CIRCUIT
COLUMN I/O
VDD
GND
I/O0-I/O7
CE1
CE2
OE
WE
CONTROL
CIRCUIT
Copyright © 2011 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without
notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest
version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. does not recommend the use of any of its products in life support applications where the failure or malfunction of the product can reasonably be expected to cause failure of the life support system or to significantly affect its safety or effectiveness. Products are not authorized for use in such applications
unless Integrated Silicon Solution, Inc. receives written assurance to its satisfaction, that:
a.) the risk of injury or damage has been minimized;
b.) the user assume all such risks; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. D
05/09/2012
1
IS61C1024AL, IS64C1024AL
PIN CONFIGURATION
PIN CONFIGURATION
32-Pin SOJ
32-Pin TSOP (Type 1) (T) and sTSOP (Type 1) (H)
NC
1
32
VDD
A16
2
31
A15
A14
3
30
CE2
A12
4
29
WE
A7
5
28
A13
A6
6
27
A8
A5
7
26
A9
A4
8
25
A11
A3
9
24
OE
A2
10
23
A10
A1
11
22
CE1
A0
12
21
I/O7
I/O0
13
20
I/O6
I/O1
14
19
I/O5
I/O2
15
18
I/O4
GND
16
17
I/O3
A11
A9
A8
A13
WE
CE2
A15
VDD
NC
A16
A14
A12
A7
A6
A5
A4
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
OE
A10
CE1
I/O7
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
I/O0
A0
A1
A2
A3
PIN DESCRIPTIONS
A0-A16 Address Inputs
CE1 Chip Enable 1 Input
CE2 Chip Enable 2 Input
OE Output Enable Input
WE Write Enable Input
I/O0-I/O7Input/Output
Vdd
Power
GND
Ground
OPERATING RANGE (IS61C1024AL)
Range
Ambient Temperature
Commercial 0°C to +70°C
Industrial
-40°C to +85°C
Vdd
5V ± 10%
5V ± 10%
OPERATING RANGE (IS64C1024AL)
Range
Automotive
Ambient Temperature
-40°C to +125°C
Vdd
5V ± 10%
TRUTH TABLE
2
Mode
WE
Not Selected
X
(Power-down)
X
Output Disabled H
Read
H
Write
L
CE1
H
X
L
L
L
CE2
X
L
H
H
H
OE
X
X
H
L
X
I/O OperationVdd Current
High-Z Isb1, Isb2
High-Z
Isb1, Isb2
High-Z
Icc1, Icc2
Dout
Icc1, Icc2
Din
Icc1, Icc2
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. D
05/09/2012
IS61C1024AL, IS64C1024AL
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Vterm
Tstg
Pt
Iout
Parameter
Terminal Voltage with Respect to GND
Storage Temperature
Power Dissipation
DC Output Current (LOW)
Value
–0.5 to +7.0
–65 to +150
1.5
20
Unit
V
°C
W
mA
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
CAPACITANCE(1,2)
Symbol
Cin
Cout
Parameter
Input Capacitance
Output Capacitance
Conditions
Vin = 0V
Vout = 0V
Max.
5
7
Unit
pF
pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: Ta = 25°C, f = 1 MHz, Vdd = 5.0V.
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
Symbol
Voh
Vol
Vih
Vil
Ili
Ilo
Parameter
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage(1)
Input Leakage
Output Leakage
Test Conditions
Vdd = Min., Ioh = –4.0 mA
Vdd = Min., Iol = 8.0 mA
GND ≤ Vin ≤ Vdd
GND ≤ Vout ≤ Vdd
Outputs Disabled
Com.
Ind.
Auto.
Com.
Ind.
Auto.
Min.
2.4
—
2.2
–0.3
–1
–2
–5
–1
–2
–5
Max.
—
0.4
Vdd + 0.5
0.8
1
2
5
1
2
5
Unit
V
V
V
V
µA
µA
Note:
1. Vil = –3.0V for pulse width less than 10 ns.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. D
05/09/2012
3
IS61C1024AL, IS64C1024AL
IS61C1024AL/IS64C1024AL POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
-12 ns Symbol Parameter
Test Conditions Min. Max.
Icc1
Vdd Operating
Vdd = Vdd max., CE1 = Vil
Com. —
35
Supply Current
Iout = 0 mA, f = 0
Ind. —
40
Auto. Icc2
Vdd Dynamic Operating
Vdd = Vdd max., CE1 = Vil
Com. —
45
Supply Current
Iout = 0 mA, f = fmax
Ind. —
50
Auto. typ.(2) —
32
Isb1
TTL Standby Current
Vdd = Vdd max., Com.
—
1
(TTL Inputs)
Vin = Vih or Vil
Ind.
—
1.5
CE1 ≥ Vih, f = 0 or
Auto.
CE2 ≤ Vil, f = 0
Isb2
CMOS Standby
Vdd = Vdd max., Com.
—
400
Current (CMOS Inputs)
CE1 ≥ Vdd – 0.2V,
Ind.
—
450
CE2 ≤ 0.2V
Auto.
Vin ≥ Vdd – 0.2V, or
typ.(2) —
200
Vin ≤ 0.2V, f = 0
-15 ns
Min. Max.
—
45
—
55
—
Unit
mA
mA
mA
2
—
500
µA
Note:
1. At f = fmax, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
2. Typical Values are measured at Vdd = 5V, Ta = 25oC and not 100% tested.
4
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. D
05/09/2012
IS61C1024AL, IS64C1024AL
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)
Symbol
Parameter
trc
Read Cycle Time
taa
Address Access Time toha
Output Hold Time
tace1
CE1 Access Time
tace2
CE2 Access Time
tdoe
OE Access Time
tlzoe(2)
OE to Low-Z Output
thzoe(2)
OE to High-Z Output (2)
tlzce1 CE1 to Low-Z Output (2)
tlzce2 CE2 to Low-Z Output thzce(2)
CE1 or CE2 to High-Z Output tpu(3)
CE1 or CE2 to Power-Up
(3)
tpd CE1 or CE2 to Power-Down -12
Min. Max.
12
—
—
12
3
—
—
12
—
12
—
6
0
—
0
6
2
—
2
—
0
7
0
—
—
12
-15 Min. Max.
Unit
15
—
ns
—
15
ns
3
—
ns
—
15
ns
—
15
ns
—
7
ns
0
—
ns
0
6
ns
2
—
ns
2
—
ns
0
8
ns
0
—
ns
—
12
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels
of 0 to 3.0V and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. Not 100% tested.
AC TEST CONDITIONS
Parameter
Input Pulse Level
Input Rise and Fall Times
Input and Output Timing
and Reference Level
Output Load
Unit
0V to 3.0V
3 ns
1.5V
See Figures 1 and 2
AC TEST LOADS
480 Ω
480 Ω
5V
5V
OUTPUT
OUTPUT
30 pF
Including
jig and
scope
255 Ω
Figure 1
5 pF
Including
jig and
scope
Figure 2
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. D
05/09/2012
255 Ω
5
IS61C1024AL, IS64C1024AL
AC WAVEFORMS
READ CYCLE NO. 1(1,2)
t RC
ADDRESS
t OHA
DOUT
t AA
t OHA
DATA VALID
PREVIOUS DATA VALID
READ1.eps
READ CYCLE NO. 2(1,3)
t RC
ADDRESS
t AA
t OHA
OE
t HZOE
t DOE
t LZOE
CE1
CE2
t LZCE1
t LZCE2
DOUT
t ACE1
t ACE2
HIGH-Z
t HZCE1
t HZCE2
DATA VALID
CE2_RD2.eps
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CE1 = Vil, CE2 = Vih.
3. Address is valid prior to or coincident with CE1 LOW and CE2 HIGH transitions.
6
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. D
05/09/2012
IS61C1024AL, IS64C1024AL
WRITE CYCLE SWITCHING CHARACTERISTICS(1,2) (Over Operating Range, Standard and Low Power)
Symbol
Parameter
twc
Write Cycle Time
tsce1
CE1 to Write End
tsce2
CE2 to Write End
taw
Address Setup Time to Write End
tha
Address Hold from Write End tsa
Address Setup Time
tpwe(3)
WE Pulse Width
tsd
Data Setup to Write End thd
Data Hold from Write End
(4)
thzwe WE LOW to High-Z Output
tlzwe(4)
WE HIGH to Low-Z Output
-12 ns -15 ns
Min. Max.
Min. Max.
12
—
15
—
10
—
12
—
10
—
12
—
10
—
12
—
0
—
0
—
0
—
0
—
10
—
12
—
7
—
10
—­
0
—
0
—­
—
7
—­
7
2
—
2
—­
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and
output loading specified in Figure 1.
2. The internal write time is defined by the overlap of CE1 LOW, CE2 HIGH and WE LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the
rising or falling edge of the signal that terminates the Write.
3. Tested with OE HIGH.
4. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. D
05/09/2012
7
IS61C1024AL, IS64C1024AL
AC WAVEFORMS
WRITE CYCLE NO. 1 (CE1 Controlled, OE is HIGH or LOW) (1 )
t WC
VALID ADDRESS
ADDRESS
t SCE1
t SCE2
t SA
t HA
CE1
CE2
t AW
t PWE1
t PWE2
WE
t HZWE
DOUT
t LZWE
HIGH-Z
DATA UNDEFINED
t SD
t HD
DATAIN VALID
DIN
CE2_WR1.eps
WRITE CYCLE NO. 2 (OE is HIGH During Write Cycle) (1,2)
t WC
ADDRESS
VALID ADDRESS
t HA
OE
CE1
LOW
HIGH
CE2
t AW
t PWE1
WE
t HZWE
t SA
DOUT
DATA UNDEFINED
t LZWE
HIGH-Z
t SD
DIN
t HD
DATAIN VALID
CE2_WR2.eps
Notes:
1. The internal write time is defined by the overlap of CE1 LOW, CE2 HIGH and WE LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to
the rising or falling edge of the signal that terminates the Write.
2. I/O will assume the High-Z state if OE = Vih.
8
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. D
05/09/2012
IS61C1024AL, IS64C1024AL
WRITE CYCLE NO. 3 (OE is LOW During Write Cycle) (1)
t WC
ADDRESS
VALID ADDRESS
OE
LOW
CE1
LOW
t HA
HIGH
CE2
t AW
t PWE2
WE
t SA
DOUT
DATA UNDEFINED
t HZWE
t LZWE
HIGH-Z
t SD
DIN
t HD
DATAIN VALID
CE2_WR3.eps
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. D
05/09/2012
9
IS61C1024AL, IS64C1024AL
DATA RETENTION SWITCHING CHARACTERISTICS
Symbol
Vdr
Idr
tsdr
trdr
Note:
Parameter
Vdd for Data Retention
Data Retention Current
Data Retention Setup Time
Recovery Time
Test Condition
See Data Retention Waveform
Vdd = 2.0V, CE1 ≥ Vdd – 0.2V
Com.
or CE2 ≤ 0.2V
Ind.
Vin ≥ Vdd – 0.2V, or Vin ≤ Vss + 0.2V
Auto.
See Data Retention Waveform
See Data Retention Waveform
Min. Typ.(1)
2.0
—
200
—
—
—
—
0
trc
Max. Unit
5.5
V
400 µA
450
500
—
ns
—
ns
1. Typical Values are measured at Vdd = 5V, Ta = 25oC and not 100% tested.
DATA RETENTION WAVEFORM (CE1 Controlled)
Data Retention Mode
tSDR
tRDR
VDD
4.5V
2.2V
VDR
CE1 ≥ VDD - 0.2V
CE1
GND
DATA RETENTION WAVEFORM (CE2 Controlled)
Data Retention Mode
4.5V
VDD
CE2
2.2V
tSDR
tRDR
VDR
0.4V
CE2 ≤ 0.2V
GND
10
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. D
05/09/2012
IS61C1024AL, IS64C1024AL
ORDERING INFORMATION: IS61C1024AL
Commercial Range: 0°C to +70°C
Speed (ns)
12
Order Part No.
IS61C1024AL-12T
Package
TSOP (Type I)
ORDERING INFORMATION: IS61C1024AL
Industrial Range: –40°C to +85°C
Speed (ns)
12
Order Part No.
IS61C1024AL-12JLI
IS61C1024AL-12KI
IS61C1024AL-12KLI
IS61C1024AL-12HI
IS61C1024AL-12HLI
IS61C1024AL-12TI
IS61C1024AL-12TLI
Package
300-mil Plastic SOJ, Lead-free
400-mil Plastic SOJ 400-mil Plastic SOJ, Lead-free
sTSOP (Type I)
sTSOP (Type I), Lead-free
TSOP (Type I)
TSOP (Type I), Lead-free
ORDERING INFORMATION: IS64C1024AL
Automotive Range: –40°C to +125°C
Speed (ns)
15
Order Part No.
IS64C1024AL-15KA3
IS64C1024AL-15TA3
Package
400-mil Plastic SOJ
TSOP (Type I)
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. D
05/09/2012
11
IS61C1024AL, IS64C1024AL
12
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. D
05/09/2012
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. D
05/09/2012
SEATING PLANE
3. Dimension b2 does not include dambar protrusion/intrusion.
4. Formed leads shall be planar with respect to one another within 0.1mm
at the seating plane after final test.
5. Reference document : JEDEC SPEC MS-027.
2. Dimension D and E1 do not include mold protrusion .
1. Controlling dimension : mm
NOTE :
12/19/2007
IS61C1024AL, IS64C1024AL
13
IS61C1024AL, IS64C1024AL
14
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. D
05/09/2012
IS61C1024AL, IS64C1024AL
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774 Rev. D
05/09/2012
15