Si8410/20/21 L OW -P OWER S INGLE A N D D UAL - C HANNEL D IGITAL I SOLATORS Features High-speed operation DC Up to 2500 VRMS isolation to 150 Mbps 60-year life at rated working No start-up initialization required voltage Wide Operating Supply Voltage: Precise timing (typical) 2.70–5.5 V <10 ns worst case Ultra low power (typical) 1.5 ns pulse width distortion 5 V Operation: 0.5 ns channel-channel skew < < 2 2.1 mA per channel at 1 Mbps 6 mA per channel at 100 Mbps 2.70 V Operation: 6 ns propagation delay skew ns minimum pulse width Transient Immunity 25 kV/µs 1.8 mA per channel at 1 Mbps Wide temperature range < 4 mA per channel at 100 Mbps –40 to 125 °C at 150 Mbps < High electromagnetic immunity RoHS-compliant packages SOIC-8 narrow body Ordering Information: See page 25. Applications Industrial automation systems Hybrid electric vehicles Isolated switch mode supplies Isolated ADC, DAC Motor control Power inverters Communications systems Safety Regulatory Approvals UL 1577 recognized Up to 2500 VRMS for 1 minute CSA component notice 5A approval VDE certification conformity IEC 60747-5-2 (VDE0884 Part 2) IEC 60950-1, 61010-1 (reinforced insulation) Description Silicon Lab's family of ultra-low-power digital isolators are CMOS devices offering substantial data rate, propagation delay, power, size, reliability, and external BOM advantages when compared to legacy isolation technologies. The operating parameters of these products remain stable across wide temperature ranges throughout their service life. For ease of design, only VDD bypass capacitors are required. Data rates up to 150 Mbps are supported, and all devices achieve worstcase propagation delays of less than 10 ns. All products are safety certified by UL, CSA, and VDE and support withstand voltages of up to 2.5 kVrms. These devices are available in an 8-pin narrow-body SOIC package. Rev. 1.4 12/11 Copyright © 2011 by Silicon Laboratories Si8410/20/21 Si8410/20/21 2 Rev. 1.4 Si8410/20/21 TABLE O F C ONTENTS Section Page 1. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4 2. Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 2.1. Theory of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 2.2. Eye Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 2.3. Device Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 2.4. Layout Recommendations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 2.5. Typical Performance Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 3. Errata and Design Migration Guidelines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 3.1. Power Supply Bypass Capacitors (Revision C and Revision D) . . . . . . . . . . . . . . . . 23 3.2. Latch Up Immunity (Revision C Only) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 4. Pin Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 5. Ordering Guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 6. Package Outline: 8-Pin Narrow Body SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26 7. Land Pattern: 8-Pin Narrow Body SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 8. Top Marking: 8-Pin Narrow Body SOIC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28 8.1. 8-Pin Narrow Body SOIC Top Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28 8.2. Top Marking Explanation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .28 Document Change List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .29 Contact Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30 Rev. 1.4 3 Si8410/20/21 1. Electrical Specifications Table 1. Recommended Operating Conditions Parameter Ambient Operating Temperature* Supply Voltage Symbol Test Condition Min Typ Max Unit TA 150 Mbps, 15 pF, 5 V –40 25 125 C° VDD1 2.70 — 5.5 V VDD2 2.70 — 5.5 V *Note: The maximum ambient temperature is dependent upon data frequency, output loading, the number of operating channels, and supply voltage. Table 2. Absolute Maximum Ratings1 Parameter Symbol Min Typ Max Unit TSTG –65 — 150 C° TA –40 — 125 C° Supply Voltage (Revision C)3 VDD1, VDD2 –0.5 — 5.75 V 3 VDD1, VDD2 –0.5 — 6.0 V Input Voltage VI –0.5 — VDD + 0.5 V Output Voltage VO –0.5 — VDD + 0.5 V Output Current Drive Channel IO — — 10 mA Lead Solder Temperature (10 s) — — 260 C° Maximum Isolation Voltage (1 s) — — 3600 VRMS Storage Temperature 2 Operating Temperature Supply Voltage (Revision D) Notes: 1. Permanent device damage may occur if the absolute maximum ratings are exceeded. Functional operation should be restricted to conditions as specified in the operational sections of this data sheet. 2. VDE certifies storage temperature from –40 to 150 °C. 3. See "5. Ordering Guide" on page 25 for more information. 4 Rev. 1.4 Si8410/20/21 Table 3. Electrical Characteristics (VDD1 = 5 V ±10%, VDD2 = 5 V ±10%, TA = –40 to 125 ºC) Symbol Parameter Test Condition Min Typ Max Unit High Level Input Voltage VIH 2.0 — — V Low Level Input Voltage VIL — — 0.8 V High Level Output Voltage VOH loh = –4 mA VDD1,VDD2 – 0.4 4.8 — V Low Level Output Voltage VOL lol = 4 mA — 0.2 0.4 V Input Leakage Current IL — — ±10 µA Output Impedance1 ZO — 85 — DC Supply Current (All inputs 0 V or at Supply) Si8410Ax, Bx VDD1 VDD2 VDD1 VDD2 All inputs 0 DC All inputs 0 DC All inputs 1 DC All inputs 1 DC — — — — 0.8 0.8 1.8 0.8 1.2 1.2 2.7 1.2 Si8420Ax, Bx VDD1 VDD2 VDD1 VDD2 All inputs 0 DC All inputs 0 DC All inputs 1 DC All inputs 1 DC — — — — 1.0 1.3 3.0 1.4 1.5 2.0 4.5 2.1 Si8421Ax, Bx VDD1 VDD2 VDD1 VDD2 All inputs 0 DC All inputs 0 DC All inputs 1 DC All inputs 1 DC — — — — 1.3 1.3 2.3 2.3 2.0 2.0 3.5 3.5 mA mA mA 1 Mbps Supply Current (All inputs = 500 kHz square wave, CI = 15 pF on all outputs) Si8410Ax, Bx VDD1 VDD2 — — 1.3 0.9 2.0 1.4 mA Si8420Ax, Bx VDD1 VDD2 — — 2.0 1.6 3.0 2.4 mA Si8421Ax, Bx VDD1 VDD2 — — 1.9 1.9 2.9 2.9 mA Notes: 1. The nominal output impedance of an isolator driver channel is approximately 85 , ±40%, which is a combination of the value of the on-chip series termination resistor and channel resistance of the output driver FET. When driving loads where transmission line effects will be a factor, output pins should be appropriately terminated with controlled impedance PCB traces. 2. tPSK(P-P) is the magnitude of the difference in propagation delay times measured between different units operating at the same supply voltages, load, and ambient temperature. 3. Start-up time is the time period from the application of power to valid data at the output. Rev. 1.4 5 Si8410/20/21 Table 3. Electrical Characteristics (Continued) (VDD1 = 5 V ±10%, VDD2 = 5 V ±10%, TA = –40 to 125 ºC) Symbol Parameter Test Condition Min Typ Max Unit 10 Mbps Supply Current (All inputs = 5 MHz square wave, CI = 15 pF on all outputs) Si8410Bx VDD1 VDD2 — — 1.3 1.2 2.0 1.8 mA Si8420Bx VDD1 VDD2 — — 2.0 2.1 3.0 3.2 mA Si8421Bx VDD1 VDD2 — — 2.2 2.2 3.3 3.3 mA 100 Mbps Supply Current (All inputs = 50 MHz square wave, CI = 15 pF on all outputs) Si8410Bx VDD1 VDD2 — — 1.4 4.6 2.1 5.8 mA Si8420Bx VDD1 VDD2 — — 2.2 9.2 3.3 11.5 mA Si8421Bx VDD1 VDD2 — — 5.8 5.8 7.3 7.3 mA Maximum Data Rate 0 — 1.0 Mbps Minimum Pulse Width — — 250 ns Timing Characteristics Si8410Ax, Si8420Ax, Si8421Ax Propagation Delay Pulse Width Distortion |tPLH - tPHL| Propagation Delay Skew2 Channel-Channel Skew tPHL, tPLH See Figure 1 — — 35 ns PWD See Figure 1 — — 25 ns tPSK(P-P) — — 40 ns tPSK — — 35 ns Notes: 1. The nominal output impedance of an isolator driver channel is approximately 85 , ±40%, which is a combination of the value of the on-chip series termination resistor and channel resistance of the output driver FET. When driving loads where transmission line effects will be a factor, output pins should be appropriately terminated with controlled impedance PCB traces. 2. tPSK(P-P) is the magnitude of the difference in propagation delay times measured between different units operating at the same supply voltages, load, and ambient temperature. 3. Start-up time is the time period from the application of power to valid data at the output. 6 Rev. 1.4 Si8410/20/21 Table 3. Electrical Characteristics (Continued) (VDD1 = 5 V ±10%, VDD2 = 5 V ±10%, TA = –40 to 125 ºC) Symbol Min Typ Max Unit Maximum Data Rate 0 — 150 Mbps Minimum Pulse Width — — 6.0 ns Parameter Test Condition Si8410Bx, Si8420Bx, Si8421Bx Propagation Delay Pulse Width Distortion |tPLH - tPHL| Propagation Delay Skew2 Channel-Channel Skew tPHL, tPLH See Figure 1 3.0 6.0 9.5 ns PWD See Figure 1 — 1.5 2.5 ns tPSK(P-P) — 2.0 3.0 ns tPSK — 0.5 1.8 ns All Models Output Rise Time tr CL = 15 pF — 3.8 5.0 ns Output Fall Time tf CL = 15 pF — 2.8 3.7 ns CMTI VI = VDD or 0 V — 25 — kV/µs — 15 40 µs Common Mode Transient Immunity Start-up Time3 tSU Notes: 1. The nominal output impedance of an isolator driver channel is approximately 85 , ±40%, which is a combination of the value of the on-chip series termination resistor and channel resistance of the output driver FET. When driving loads where transmission line effects will be a factor, output pins should be appropriately terminated with controlled impedance PCB traces. 2. tPSK(P-P) is the magnitude of the difference in propagation delay times measured between different units operating at the same supply voltages, load, and ambient temperature. 3. Start-up time is the time period from the application of power to valid data at the output. 1.4 V Typical Input tPLH tPHL 90% 90% 10% 10% 1.4 V Typical Output tr tf Figure 1. Propagation Delay Timing Rev. 1.4 7 Si8410/20/21 Table 4. Electrical Characteristics (VDD1 = 3.3 V ±10%, VDD2 = 3.3 V ±10%, TA = –40 to 125 °C) Parameter Symbol Test Condition Min Typ Max Unit High Level Input Voltage VIH 2.0 — — V Low Level Input Voltage VIL — — 0.8 V High Level Output Voltage VOH loh = –4 mA VDD1,VDD2 – 0.4 3.1 — V Low Level Output Voltage VOL lol = 4 mA — 0.2 0.4 V IL — — ±10 µA ZO — 85 — Input Leakage Current Output Impedance1 DC Supply Current (All inputs 0 V or at supply) Si8410Ax, Bx VDD1 VDD2 VDD1 VDD2 All inputs 0 DC All inputs 0 DC All inputs 1 DC All inputs 1 DC — — — — 0.8 0.8 1.8 0.8 1.2 1.2 2.7 1.2 Si8420Ax, Bx VDD1 VDD2 VDD1 VDD2 All inputs 0 DC All inputs 0 DC All inputs 1 DC All inputs 1 DC — — — — 1.0 1.3 3.0 1.4 1.5 2.0 4.5 2.1 Si8421Ax, Bx VDD1 VDD2 VDD1 VDD2 All inputs 0 DC All inputs 0 DC All inputs 1 DC All inputs 1 DC — — — — 1.3 1.3 2.3 2.3 2.0 2.0 3.5 3.5 mA mA mA 1 Mbps Supply Current (All inputs = 500 kHz square wave, CI = 15 pF on all outputs) Si8410Ax, Bx VDD1 VDD2 — — 1.3 0.9 2.0 1.4 mA Si8420Ax, Bx VDD1 VDD2 — — 2.0 1.6 3.0 2.4 mA Si8421Ax, Bx VDD1 VDD2 — — 1.9 1.9 2.9 2.9 mA Notes: 1. The nominal output impedance of an isolator driver channel is approximately 85 , ±40%, which is a combination of the value of the on-chip series termination resistor and channel resistance of the output driver FET. When driving loads where transmission line effects will be a factor, output pins should be appropriately terminated with controlled impedance PCB traces. 2. tPSK(P-P) is the magnitude of the difference in propagation delay times measured between different units operating at the same supply voltages, load, and ambient temperature. 3. Start-up time is the time period from the application of power to valid data at the output. 8 Rev. 1.4 Si8410/20/21 Table 4. Electrical Characteristics (Continued) (VDD1 = 3.3 V ±10%, VDD2 = 3.3 V ±10%, TA = –40 to 125 °C) Parameter Symbol Test Condition Min Typ Max Unit 10 Mbps Supply Current (All inputs = 5 MHz square wave, CI = 15 pF on all outputs) Si8410Bx VDD1 VDD2 — — 1.3 1.2 2.0 1.8 mA Si8420Bx VDD1 VDD2 — — 2.0 2.1 3.0 3.2 mA Si8421Bx VDD1 VDD2 — — 2.2 2.2 3.3 3.3 mA 100 Mbps Supply Current (All inputs = 50 MHz square wave, CI = 15 pF on all outputs) Si8410Bx VDD1 VDD2 — — 1.3 3.3 2.0 4.9 mA Si8420Bx VDD1 VDD2 — — 2.0 6.5 3.0 8.1 mA Si8421Bx VDD1 VDD2 — — 4.4 4.4 5.5 5.5 mA Maximum Data Rate 0 — 1.0 Mbps Minimum Pulse Width — — 250 ns Timing Characteristics Si8410Ax, Si8420Ax, Si8421Ax Propagation Delay Pulse Width Distortion |tPLH – tPHL| Propagation Delay Skew2 Channel-Channel Skew tPHL, tPLH See Figure 1 — — 35 ns PWD See Figure 1 — — 25 ns tPSK(P-P) — — 40 ns tPSK — — 35 ns Notes: 1. The nominal output impedance of an isolator driver channel is approximately 85 , ±40%, which is a combination of the value of the on-chip series termination resistor and channel resistance of the output driver FET. When driving loads where transmission line effects will be a factor, output pins should be appropriately terminated with controlled impedance PCB traces. 2. tPSK(P-P) is the magnitude of the difference in propagation delay times measured between different units operating at the same supply voltages, load, and ambient temperature. 3. Start-up time is the time period from the application of power to valid data at the output. Rev. 1.4 9 Si8410/20/21 Table 4. Electrical Characteristics (Continued) (VDD1 = 3.3 V ±10%, VDD2 = 3.3 V ±10%, TA = –40 to 125 °C) Parameter Symbol Test Condition Min Typ Max Unit Maximum Data Rate 0 — 150 Mbps Minimum Pulse Width — — 6.0 ns Si8410Bx, Si8420Bx, Si8421Bx Propagation Delay Pulse Width Distortion |tPLH – tPHL| Propagation Delay Skew2 Channel-Channel Skew tPHL, tPLH See Figure 1 3.0 6.0 9.5 ns PWD See Figure 1 — 1.5 2.5 ns tPSK(P-P) — 2.0 3.0 ns tPSK — 0.5 1.8 ns All Models Output Rise Time tr CL = 15 pF — 4.3 6.1 ns Output Fall Time tf CL = 15 pF — 3.0 4.3 ns CMTI VI = VDD or 0 V — 25 — kV/µs — 15 40 µs Common Mode Transient Immunity Start-up Time3 tSU Notes: 1. The nominal output impedance of an isolator driver channel is approximately 85 , ±40%, which is a combination of the value of the on-chip series termination resistor and channel resistance of the output driver FET. When driving loads where transmission line effects will be a factor, output pins should be appropriately terminated with controlled impedance PCB traces. 2. tPSK(P-P) is the magnitude of the difference in propagation delay times measured between different units operating at the same supply voltages, load, and ambient temperature. 3. Start-up time is the time period from the application of power to valid data at the output. 10 Rev. 1.4 Si8410/20/21 Table 5. Electrical Characteristics1 (VDD1 = 2.70 V, VDD2 = 2.70 V, TA = –40 to 125 °C) Parameter Symbol Test Condition Min Typ Max Unit High Level Input Voltage VIH 2.0 — — V Low Level Input Voltage VIL — — 0.8 V High Level Output Voltage VOH loh = –4 mA VDD1,VDD2 – 0.4 2.3 — V Low Level Output Voltage VOL lol = 4 mA — 0.2 0.4 V IL — — ±10 µA ZO — 85 — Input Leakage Current Output Impedance 2 DC Supply Current (All inputs 0 V or at supply) Si8410Ax, Bx VDD1 VDD2 VDD1 VDD2 All inputs 0 DC All inputs 0 DC All inputs 1 DC All inputs 1 DC — — — — 0.8 0.8 1.8 0.8 1.2 1.2 2.7 1.2 mA Si8420Ax, Bx VDD1 VDD2 VDD1 VDD2 All inputs 0 DC All inputs 0 DC All inputs 1 DC All inputs 1 DC — — — — 1.0 1.3 3.0 1.4 1.5 2.0 4.5 2.1 mA Si8421Ax, Bx VDD1 VDD2 VDD1 VDD2 All inputs 0 DC All inputs 0 DC All inputs 1 DC All inputs 1 DC — — — — 1.3 1.3 2.3 2.3 2.0 2.0 3.5 3.5 mA 1 Mbps Supply Current (All inputs = 500 kHz square wave, CI = 15 pF on all outputs) Si8410Ax, Bx VDD1 VDD2 — — 1.3 0.9 2.0 1.4 mA Si8420Ax, Bx VDD1 VDD2 — — 2.0 1.6 3.0 2.4 mA Si8421Ax, Bx VDD1 VDD2 — — 1.9 1.9 2.9 2.9 mA Notes: 1. Specifications in this table are also valid at VDD1 = 2.6 V and VDD2 = 2.6 V when the operating temperature range is constrained to TA = 0 to 85 °C. 2. The nominal output impedance of an isolator driver channel is approximately 85 , ±40%, which is a combination of the value of the on-chip series termination resistor and channel resistance of the output driver FET. When driving loads where transmission line effects will be a factor, output pins should be appropriately terminated with controlled impedance PCB traces. 3. tPSK(P-P) is the magnitude of the difference in propagation delay times measured between different units operating at the same supply voltages, load, and ambient temperature. 4. Start-up time is the time period from the application of power to valid data at the output. Rev. 1.4 11 Si8410/20/21 Table 5. Electrical Characteristics1 (Continued) (VDD1 = 2.70 V, VDD2 = 2.70 V, TA = –40 to 125 °C) Parameter Symbol Test Condition Min Typ Max Unit 10 Mbps Supply Current (All inputs = 5 MHz square wave, CI = 15 pF on all outputs) Si8410Bx VDD1 VDD2 — — 1.3 1.2 2.0 1.8 mA Si8420Bx VDD1 VDD2 — — 2.0 2.1 3.0 3.2 mA Si8421Bx VDD1 VDD2 — — 2.2 2.2 3.3 3.3 mA 100 Mbps Supply Current (All inputs = 50 MHz square wave, CI = 15 pF on all outputs) Si8410Bx VDD1 VDD2 — — 1.3 2.7 2.0 4.0 mA Si8420Bx VDD1 VDD2 — — 2.0 5.2 3.0 6.5 mA Si8421Bx VDD1 VDD2 — — 3.7 3.7 4.6 4.6 mA Maximum Data Rate 0 — 1.0 Mbps Minimum Pulse Width — — 250 ns Timing Characteristics Si8410Ax, Si8420Ax, Si8421Ax Propagation Delay Pulse Width Distortion |tPLH - tPHL| Propagation Delay Skew3 Channel-Channel Skew tPHL, tPLH See Figure 1 — — 35 ns PWD See Figure 1 — — 25 ns tPSK(P-P) — — 40 ns tPSK — — 35 ns Notes: 1. Specifications in this table are also valid at VDD1 = 2.6 V and VDD2 = 2.6 V when the operating temperature range is constrained to TA = 0 to 85 °C. 2. The nominal output impedance of an isolator driver channel is approximately 85 , ±40%, which is a combination of the value of the on-chip series termination resistor and channel resistance of the output driver FET. When driving loads where transmission line effects will be a factor, output pins should be appropriately terminated with controlled impedance PCB traces. 3. tPSK(P-P) is the magnitude of the difference in propagation delay times measured between different units operating at the same supply voltages, load, and ambient temperature. 4. Start-up time is the time period from the application of power to valid data at the output. 12 Rev. 1.4 Si8410/20/21 Table 5. Electrical Characteristics1 (Continued) (VDD1 = 2.70 V, VDD2 = 2.70 V, TA = –40 to 125 °C) Parameter Symbol Test Condition Min Typ Max Unit Maximum Data Rate 0 — 150 Mbps Minimum Pulse Width — — 6.0 ns Si8410Bx, Si8420Bx, Si8421Bx Propagation Delay tPHL, tPLH See Figure 1 3.0 6.0 9.5 ns PWD See Figure 1 — 1.5 2.5 ns tPSK(P-P) — 2.0 3.0 ns tPSK — 0.5 1.8 ns Pulse Width Distortion |tPLH - tPHL| Propagation Delay Skew3 Channel-Channel Skew All Models Output Rise Time tr CL = 15 pF — 4.8 6.5 ns Output Fall Time tf CL = 15 pF — 3.2 4.6 ns CMTI VI = VDD or 0 V — 25 — kV/µs — 15 40 µs Common Mode Transient Immunity Start-up Time4 tSU Notes: 1. Specifications in this table are also valid at VDD1 = 2.6 V and VDD2 = 2.6 V when the operating temperature range is constrained to TA = 0 to 85 °C. 2. The nominal output impedance of an isolator driver channel is approximately 85 , ±40%, which is a combination of the value of the on-chip series termination resistor and channel resistance of the output driver FET. When driving loads where transmission line effects will be a factor, output pins should be appropriately terminated with controlled impedance PCB traces. 3. tPSK(P-P) is the magnitude of the difference in propagation delay times measured between different units operating at the same supply voltages, load, and ambient temperature. 4. Start-up time is the time period from the application of power to valid data at the output. Table 6. Regulatory Information* CSA The Si84xx is certified under CSA Component Acceptance Notice 5A. For more details, see File 232873. 61010-1: Up to 300 VRMS reinforced insulation working voltage; up to 600 VRMS basic insulation working voltage. 60950-1: Up to 130 VRMS reinforced insulation working voltage; up to 600 VRMS basic insulation working voltage. VDE The Si84xx is certified according to IEC 60747-5-2. For more details, see File 5006301-4880-0001. 60747-5-2: Up to 560 Vpeak for basic insulation working voltage. UL The Si84xx is certified under UL1577 component recognition program. For more details, see File E257455. Rated up to 2500 VRMS isolation voltage for basic insulation. *Note: Regulatory Certifications apply to 2.5 kVRMS rated devices which are production tested to 3.0 kVRMS for 1 sec. For more information, see "5. Ordering Guide" on page 25. Rev. 1.4 13 Si8410/20/21 Table 7. Insulation and Safety-Related Specifications Parameter Symbol Nominal Air Gap (Clearance)1 Nominal External Tracking (Creepage)1 Test Condition Value Unit L(IO1) 4.9 mm L(IO2) 4.01 mm 0.008 mm 600 VRMS Minimum Internal Gap (Internal Clearance) Tracking Resistance (Proof Tracking Index) PTI Erosion Depth ED 0.040 mm Resistance (Input-Output)2 RIO 1012 1.0 pF 4.0 pF Capacitance (Input-Output)2 Input Capacitance3 IEC60112 CIO f = 1 MHz CI Notes: 1. The values in this table correspond to the nominal creepage and clearance values as detailed in "6. Package Outline: 8-Pin Narrow Body SOIC" on page 26. VDE certifies the clearance and creepage limits as 4.7 mm minimum for the NB SOIC-8 package. UL does not impose a clearance and creepage minimum for component level certifications. CSA certifies the clearance and creepage limits as 3.9 mm minimum for the NB SOIC-8 package. 2. To determine resistance and capacitance, the Si84xx is converted into a 2-terminal device. Pins 1–4 are shorted together to form the first terminal and pins 5–8 are shorted together to form the second terminal. The parameters are then measured between these two terminals. 3. Measured from input pin to ground. Table 8. IEC 60664-1 (VDE 0844 Part 2) Ratings Parameter Basic Isolation Group Installation Classification 14 Test Conditions Material Group Specification I Rated Mains Voltages < 150 VRMS I-IV Rated Mains Voltages < 300 VRMS I-III Rated Mains Voltages < 400 VRMS I-II Rated Mains Voltages < 600 VRMS I-II Rev. 1.4 Si8410/20/21 Table 9. IEC 60747-5-2 Insulation Characteristics for Si84xxxB* Parameter Maximum Working Insulation Voltage Symbol Test Condition Unit 560 V peak VIORM Input to Output Test Voltage Transient Overvoltage Characteristic V peak VPR Method b1 (VIORM x 1.875 = VPR, 100% Production Test, tm = 1 sec, Partial Discharge < 5 pC) 1050 VIOTM t = 60 sec 4000 2 Pollution Degree (DIN VDE 0110, Table 1) Insulation Resistance at TS, VIO = 500 V V peak >109 RS *Note: Maintenance of the safety data is ensured by protective circuits. The Si84xx provides a climate classification of 40/125/21. Table 10. IEC Safety Limiting Values1 Parameter Case Temperature Symbol Test Condition TS Safety input, output, or supply current IS Device Power Dissipation2 PD JA = 140 °C/W, VI = 5.5 V, TJ = 150 °C, TA = 25 °C Min Typ Max Unit — — 150 °C — — 160 mA — — 150 mW Notes: 1. Maximum value allowed in the event of a failure; also see the thermal derating curve in Figure 2. 2. The Si841x/2x is tested with VDD1 = VDD2 = 5.5 V, TJ = 150 °C, CL = 15 pF, input a 150 Mbps 50% duty cycle square wave. Rev. 1.4 15 Si8410/20/21 Table 11. Thermal Characteristics Parameter Symbol Safety-Limiting Values (mA) IC Junction-to-Air Thermal Resistance Test Condition JA Min Typ Max Unit — 140 — °C/W 400 320 VDD1, VDD2 = 2.70 V 300 270 200 VDD1, VDD2 = 3.3 V 160 VDD1, VDD2 = 5.5 V 100 0 0 50 100 150 Case Temperature (ºC) 200 Figure 2. (NB SOIC-8) Thermal Derating Curve, Dependence of Safety Limiting Values with Case Temperature per DIN EN 60747-5-2 16 Rev. 1.4 Si8410/20/21 2. Functional Description 2.1. Theory of Operation The operation of an Si84xx channel is analogous to that of an opto coupler, except an RF carrier is modulated instead of light. This simple architecture provides a robust isolated data path and requires no special considerations or initialization at start-up. A simplified block diagram for a single Si84xx channel is shown in Figure 3. Transmitter Receiver RF OSCILLATOR A MODULATOR SemiconductorBased Isolation Barrier DEMODULATOR B Figure 3. Simplified Channel Diagram A channel consists of an RF Transmitter and RF Receiver separated by a semiconductor-based isolation barrier. Referring to the Transmitter, input A modulates the carrier provided by an RF oscillator using on/off keying. The Receiver contains a demodulator that decodes the input state according to its RF energy content and applies the result to output B via the output driver. This RF on/off keying scheme is superior to pulse code schemes as it provides best-in-class noise immunity, low power consumption, and better immunity to magnetic fields. See Figure 4 for more details. Input Signal Modulation Signal Output Signal Figure 4. Modulation Scheme Rev. 1.4 17 Si8410/20/21 2.2. Eye Diagram Figure 5 illustrates an eye-diagram taken on an Si8410. For the data source, the test used an Anritsu (MP1763C) Pulse Pattern Generator set to 1000 ns/div. The output of the generator's clock and data from an Si8410 were captured on an oscilloscope. The results illustrate that data integrity was maintained even at the high data rate of 150 Mbps. The results also show that 2 ns pulse width distortion and 250 ps peak jitter were exhibited. Figure 5. Eye Diagram 18 Rev. 1.4 Si8410/20/21 2.3. Device Operation Device behavior during start-up, normal operation, and shutdown is shown in Table 12. Table 12. Si84xx Logic Operation Table VI Input1,4 VDDI State1,2,3 VDDO State1,2,3 VO Output1,4 H P P H L P P L X5 UP P L X5 P UP Comments Normal operation. Upon transition of VDDI from unpowered to powered, VO returns to the same state as VI in less than 1 µs. Upon transition of VDDO from unpowered to powUndetermined ered, VO returns to the same state as VI within 1 µs. Notes: 1. VDDI and VDDO are the input and output power supplies. VI and VO are the respective input and output terminals. 2. Powered (P) state is defined as 2.70 V < VDD < 5.5 V. 3. Unpowered (UP) state is defined as VDD = 0 V. 4. X = not applicable; H = Logic High; L = Logic Low. 5. Note that an I/O can power the die for a given side through an internal diode if its source has adequate current. Rev. 1.4 19 Si8410/20/21 2.4. Layout Recommendations To ensure safety in the end user application, high voltage circuits (i.e., circuits with >30 VAC) must be physically separated from the safety extra-low voltage circuits (SELV is a circuit with <30 VAC) by a certain distance (creepage/clearance). If a component, such as a digital isolator, straddles this isolation barrier, it must meet those creepage/clearance requirements and also provide a sufficiently large high-voltage breakdown protection rating (commonly referred to as working voltage protection). Table 6 on page 13 and Table 7 on page 14 detail the working voltage and creepage/clearance capabilities of the Si84xx. These tables also detail the component standards (UL1577, IEC60747, CSA 5A), which are readily accepted by certification bodies to provide proof for end-system specifications requirements. Refer to the end-system specification (61010-1, 60950-1, etc.) requirements before starting any design that uses a digital isolator. The following sections detail the recommended bypass and decoupling components necessary to ensure robust overall performance and reliability for systems using the Si84xx digital isolators. 2.4.1. Supply Bypass Digital integrated circuit components typically require 0.1 µF (100 nF) bypass capacitors when used in electrically quiet environments. However, digital isolators are commonly used in hazardous environments with excessively noisy power supplies. To counteract these harsh conditions, it is recommended that an additional 1 µF bypass capacitor be added between VDD and GND on both sides of the package. The capacitors should be placed as close as possible to the package to minimize stray inductance. If the system is excessively noisy, it is recommended that the designer add 50 to 100 resistors in series with the VDD supply voltage source and 50 to 300 resistors in series with the digital inputs/outputs (see Figure 6). For more details, see "3. Errata and Design Migration Guidelines" on page 23. All components upstream or downstream of the isolator should be properly decoupled as well. If these components are not properly decoupled, their supply noise can couple to the isolator inputs and outputs, potentially causing damage if spikes exceed the maximum ratings of the isolator (6 V). In this case, the 50 to 300 resistors protect the isolator's inputs/outputs (note that permanent device damage may occur if the absolute maximum ratings are exceeded). Functional operation should be restricted to the conditions specified in Table 1, “Recommended Operating Conditions,” on page 4. 2.4.2. Pin Connections No connect pins are not internally connected. They can be left floating, tied to VDD, or tied to GND. 2.4.3. Output Pin Termination The nominal output impedance of an isolator driver channel is approximately 85 , ±40%, which is a combination of the value of the on-chip series termination resistor and channel resistance of the output driver FET. When driving loads where transmission line effects will be a factor, output pins should be appropriately terminated with controlled impedance PCB traces. The series termination resistor values should be scaled appropriately while keeping in mind the recommendations described in “2.4.1. Supply Bypass” above. V Source 2 V Source 1 R1 (50 – 100 ) R2 (50 – 100 ) VDD1 C1 VDD2 50 – 300 0.1 F A1 0.1 F B1 C2 1 F C4 50 – 300 C3 Input/Output Input/Output 1 F Bx Ax 50 – 300 50 – 300 GND1 GND2 Figure 6. Recommended Bypass Components for the Si84xx Digital Isolator Family 20 Rev. 1.4 Si8410/20/21 2.5. Typical Performance Characteristics 30 30 25 25 Current (mA) Current (mA) The typical performance characteristics depicted in the following diagrams are for information purposes only. Refer to Tables 3, 4, and 5 for actual specification limits. 20 5V 15 3.3V 10 5 20 5V 15 3.3V 10 5 2.70V 2.70V 0 0 0 0 10 20 30 40 50 60 70 80 90 100 110 120 130 140 150 10 20 30 40 50 60 70 80 90 100 110 120 130 140 150 Data Rate (Mbps) Data Rate (Mbps) Figure 10. Si8410 Typical VDD2 Supply Current vs. Data Rate 5, 3.3, and 2.70 V Operation (15 pF Load) 30 30 25 25 20 Current (mA) Current (mA) Figure 7. Si8410 Typical VDD1 Supply Current vs. Data Rate 5, 3.3, and 2.70 V Operation 5V 15 3.3V 10 2.70V 5 20 5V 15 3.3V 10 2.70V 5 0 0 0 10 20 30 40 50 60 70 80 90 100 110 120 130 140 150 0 10 20 30 40 50 60 70 80 90 100 110 120 130 140 150 Data Rate (Mbps) Data Rate (Mbps) Figure 8. Si8420 Typical VDD1 Supply Current vs. Data Rate 5, 3.3, and 2.70 V Operation Figure 11. Si8420 Typical VDD2 Supply Current vs. Data Rate 5, 3.3, and 2.70 V Operation (15 pF Load) 30 10 15 3.3V 10 5 Falling Edge 9 5V 20 Delay (ns) Current (mA) 25 8 7 Rising Edge 6 2.70V 0 5 0 10 20 30 40 50 60 70 80 90 100 110 120 130 140 150 Data Rate (Mbps) -40 -20 0 20 40 60 80 100 120 Temperature (Degrees C) Figure 9. Si8421 Typical VDD1 or VDD2 Supply Current vs. Data Rate 5, 3.3, and 2.70 V Operation (15 pF Load) Rev. 1.4 Figure 12. Propagation Delay vs. Temperature 21 Si8410/20/21 Figure 13. Si84xx Time-Dependent Dielectric Breakdown 22 Rev. 1.4 Si8410/20/21 3. Errata and Design Migration Guidelines The following errata apply to Revision C devices only. See "5. Ordering Guide" on page 25 for more details. No errata exist for Revision D devices. 3.1. Power Supply Bypass Capacitors (Revision C and Revision D) When using the Si84xx isolators with power supplies > 4.5 V, sufficient VDD bypass capacitors must be present on both the VDD1 and VDD2 pins to ensure the VDD rise time is less than 0.5 V/µs (which is > 9 µs for a > 4.5 V supply). Although rise time is power supply dependent, > 1 µF capacitors are required on both power supply pins (VDD1, VDD2) of the isolator device. 3.1.1. Resolution For recommendations on resolving this issue, see "2.4.1. Supply Bypass" on page 20. Additionally, refer to "5. Ordering Guide" on page 25 for current ordering information. 3.2. Latch Up Immunity (Revision C Only) Si84xx latch up immunity generally exceeds ± 200 mA per pin. Exceptions: Certain pins provide < 100 mA of latchup immunity. To increase latch-up immunity on these pins, 100 of equivalent resistance must be included in series with all of the pins listed in Table 13. The 100 equivalent resistance can be comprised of the source driver's output resistance and a series termination resistor. The Si8410 is not affected by the latch up immunity issue described above. 3.2.1. Resolution This issue has been corrected with Revision D of the device. Refer to “5. Ordering Guide” for current ordering information. Table 13. Affected Ordering Part Numbers (Revision C Only) Affected Ordering Part Numbers* SI8420SV-C-IS, SI8421SV-C-IS Device Revision C Pin# Name Pin Type 3 A2 Input or Output 7 B1 Output *Note: SV = Speed Grade/Isolation Rating (AA, AB, BA, BB). Rev. 1.4 23 Si8410/20/21 4. Pin Descriptions VDD1 RF XMITR A1 VDD1/NC I s o l a t i o n VDD2 RF RCVR GND2/NC A1 RF XMITR B1 A2 RF XMITR GND2 GND1 VDD1 I s o l a t i o n VDD2 RF RCVR B1 A1 RF XMITR RF RCVR B2 A2 RF XMITR GND2 GND1 Si8410 NB SOIC-8 VDD1 Si8420 NB SOIC-8 I s o l a t i o n VDD2 RF RCVR B1 RF RCVR B2 GND2 GND1 Si8421 NB SOIC-8 Name SOIC-8 Pin# Si8410 SOIC-8 Pin# Si8420/21 Type Description VDD1/NC* 1,3 1 Supply Side 1 power supply. GND1 4 4 Ground Side 1 ground. A1 2 2 Digital I/O Side 1 digital input or output. A2 NA 3 Digital I/O Side 1 digital input or output. B1 6 7 Digital I/O Side 2 digital input or output. B2 NA 6 Digital I/O Side 2 digital input or output. VDD2 8 8 Supply Side 2 power supply. GND2/NC* 5,7 5 Ground Side 2 ground. *Note: No Connect. These pins are not internally connected. They can be left floating, tied to VDD or tied to GND. 24 Rev. 1.4 Si8410/20/21 5. Ordering Guide Revision D devices are recommended for all new designs. Table 14. Ordering Guide for Valid OPNs1 Ordering Part Number (OPN) Number of Number of Inputs VDD1 Inputs VDD2 Side Side Maximum Data Rate (Mbps) Isolation Rating Temp Range Package Type 2.5 kVrms –40 to 125 °C NB SOIC-8 2.5 kVrms –40 to 125 °C NB SOIC-8 Revision D Devices2 Si8410AB-D-IS 1 0 1 Si8410BB-D-IS 1 0 150 Si8420AB-D-IS 2 0 1 Si8420BB-D-IS 2 0 150 Si8421AB-D-IS 1 1 1 Si8421BB-D-IS 1 1 150 Si8410AB-C-IS 1 0 1 Si8410BB-C-IS 1 0 150 Si8420AB-C-IS 2 0 1 Si8420BB-C-IS 2 0 150 Si8421AB-C-IS 1 1 1 Si8421BB-C-IS 1 1 150 Revision C Devices2 Notes: 1. All packages are RoHS-compliant. Moisture sensitivity level is MSL2A with peak reflow temperature of 260 °C according to the JEDEC industry standard classifications and peak solder temperature. 2. Revision C devices are supported for existing designs, but Revision D is recommended for all new designs. Rev. 1.4 25 Si8410/20/21 6. Package Outline: 8-Pin Narrow Body SOIC Figure 14 illustrates the package details for the Si841x. Table 15 lists the values for the dimensions shown in the illustration. Figure 14. 8-pin Small Outline Integrated Circuit (SOIC) Package Table 15. Package Diagram Dimensions Symbol Millimeters Min Max A 1.35 1.75 A1 0.10 0.25 A2 1.40 REF 1.55 REF B 0.33 0.51 C 0.19 0.25 D 4.80 5.00 E 3.80 4.00 e 26 1.27 BSC H 5.80 6.20 h 0.25 0.50 L 0.40 1.27 0 8 Rev. 1.4 Si8410/20/21 7. Land Pattern: 8-Pin Narrow Body SOIC Figure 15 illustrates the recommended land pattern details for the Si841x in an 8-pin narrow-body SOIC. Table 16 lists the values for the dimensions shown in the illustration. Figure 15. PCB Land Pattern: 8-Pin Narrow Body SOIC Table 16. PCM Land Pattern Dimensions (8-Pin Narrow Body SOIC) Dimension Feature (mm) C1 Pad Column Spacing 5.40 E Pad Row Pitch 1.27 X1 Pad Width 0.60 Y1 Pad Length 1.55 Notes: 1. This Land Pattern Design is based on IPC-7351 pattern SOIC127P600X173-8N for Density Level B (Median Land Protrusion). 2. All feature sizes shown are at Maximum Material Condition (MMC) and a card fabrication tolerance of 0.05 mm is assumed. Rev. 1.4 27 Si8410/20/21 8. Top Marking: 8-Pin Narrow Body SOIC 8.1. 8-Pin Narrow Body SOIC Top Marking Si84XYSV YYWWRF e3 AIXX 8.2. Top Marking Explanation Table 17. Top Marking Explanations Line 1 Marking: Line 2 Marking: Base Part Number Ordering Options (See Ordering Guide for more information). Si84 = Isolator product series XY = Channel Configuration X = # of data channels (2, 1) Y = # of reverse channels (1, 0) S = Speed Grade A = 1 Mbps; B = 150 Mbps V = Insulation rating A = 1 kV; B = 2.5 kV YY = Year WW = Workweek Assigned by Assembly Contractor. Corresponds to the year and workweek of the mold date. R = Product (OPN) Revision F = Wafer Fab Line 3 Marking: 28 Circle = 1.1 mm Diameter Left-Justified “e3” Pb-Free Symbol First Two Characters of the Manufacturing Code A = Assembly Site I = Internal Code XX = Serial Lot Number Last Four Characters of the Manufacturing Code Rev. 1.4 Si8410/20/21 DOCUMENT CHANGE LIST Revision 1.2 to Revision 1.3 Revision 0.11 to Revision 0.21 Rev 0.21 is the first revision of this document that applies to the new series of ultra low power isolators featuring pinout and functional compatibility with previous isolator products. Updated “1. Electrical Specifications”. Updated “5. Ordering Guide”. Added “8. Top Marking: 8-Pin Narrow Body SOIC”. Revision 1.3 to Revision 1.4 Updated "2.4.1. Supply Bypass" on page 20. Added Figure 6, “Recommended Bypass Components for the Si84xx Digital Isolator Family,” on page 20. Updated "3.1. Power Supply Bypass Capacitors (Revision C and Revision D)" on page 23. Revision 0.21 to Revision 0.22 Updated " Features" on page 1. Moved Tables 1 and 2 to page 4. Updated Tables 6, 7, 8, and 9. Updated Table 12 footnotes. Added Figure 13, “Si84xx Time-Dependent Dielectric Breakdown,” on page 22. Updated all specs to reflect latest silicon. Revision 0.22 to Revision 0.23 Updated all specs to reflect latest silicon. Added "3. Errata and Design Migration Guidelines" on page 23. Revision 0.23 to Revision 1.0 Updated document to reflect availability of Revision D silicon. Updated Tables 3,4, and 5. Updated Updated all supply currents and channel-channel skew. Updated Table 2. absolute maximum supply voltage. Updated Table 7. Updated clearance and creepage dimensions. Updated "3. Errata and Design Migration Guidelines" on page 23. Updated "5. Ordering Guide" on page 25. Revision 1.0 to Revision 1.1 Updated Tables 3, 4, and 5. Updated notes in tables to reflect output impedance of 85 . Updated rise and fall time specifications. Updated CMTI value. Revision 1.1 to Revision 1.2 Updated document throughout to include MSL improvements to MSL2A. Updated "5. Ordering Guide" on page 25. Updated Note 1 in ordering guide table to reflect improvement and compliance to MSL2A moisture sensitivity level. Rev. 1.4 29 Si8410/20/21 CONTACT INFORMATION Silicon Laboratories Inc. 400 West Cesar Chavez Austin, TX 78701 Tel: 1+(512) 416-8500 Fax: 1+(512) 416-9669 Toll Free: 1+(877) 444-3032 Please visit the Silicon Labs Technical Support web page: https://www.silabs.com/support/pages/contacttechnicalsupport.aspx and register to submit a technical support request. The information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice. Silicon Laboratories assumes no responsibility for errors and omissions, and disclaims responsibility for any consequences resulting from the use of information included herein. Additionally, Silicon Laboratories assumes no responsibility for the functioning of undescribed features or parameters. Silicon Laboratories reserves the right to make changes without further notice. Silicon Laboratories makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Silicon Laboratories assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. Silicon Laboratories products are not designed, intended, or authorized for use in applications intended to support or sustain life, or for any other application in which the failure of the Silicon Laboratories product could create a situation where personal injury or death may occur. Should Buyer purchase or use Silicon Laboratories products for any such unintended or unauthorized application, Buyer shall indemnify and hold Silicon Laboratories harmless against all claims and damages. Silicon Laboratories and Silicon Labs are trademarks of Silicon Laboratories Inc. Other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders. 30 Rev. 1.4