AVAGO 5962-9800101KEC

6N134,* 81028, HCPL-563X, HCPL-663X,
HCPL-565X, 5962-98001, HCPL-268K,
HCPL-665X, 5962-90855, HCPL-560X
Hermetically Sealed, High Speed, High CMR, Logic Gate Optocouplers
Data Sheet
*See matrix for available extensions.
Description
Features
These units are single, dual and quad channel, hermetically sealed optocouplers. The products are capable of
operation and storage over the full military temperature
range and can be purchased as either standard product
or with full MIL-PRF-38534 Class Level H or K testing or
from the appropriate DLA Drawing. All devices are manufactured and tested on a MIL-PRF-38534 certified line
and are included in the DLA Qualified Manufacturers
List QML-38534 for Hybrid Microcircuits. Quad channel
devices are available by special order in the 16 pin DIP
through hole packages.
 Dual marked with device part number and DLA
drawing number
 Manufactured and tested on a MIL-PRF-38534
Certified Line
 QML-38534, Class H and K
 Five hermetically sealed package configurations
 Performance guaranteed over full military
temperature range: -55°C to +125°C
 High speed: 10 Mbd typical
 CMR: > 10,000 V/μs typical
 1500 Vdc withstand test voltage
 2500 Vdc withstand test voltage for HCPL-565X
 High radiation immunity
 6N137, HCPL-2601, HCPL-2630/31 function
compatibility
 Reliability data
 TTL circuit compatibility
Functional Diagram
VCC
VE
VOUT
GND
Applications
Multiple channel devices available
Truth Table (Positive Logic)
Multichannel Devices
Input
Output
On (H)
L
Off (L)
H
Single Channel DIP
Input
Enable
Output
On (H)
H
L
Off (L)
H
H
On (H)
L
H
Off (L)
L
H










Military and aerospace
High reliability systems
Transportation, medical, and life critical systems
Line receiver
Voltage level shifting
Isolated input line receiver
Isolated output line driver
Logic ground isolation
Harsh industrial environments
Isolation for computer, communication, and test
equipment systems
The connection of a 0.1 μF bypass capacitor between VCC and GND is recommended.
CAUTION: It is advised that normal static precautions be taken in handling and assembly
of this component to prevent damage and/or degradation which may be induced by ESD.
Each channel contains a GaAsP light emitting diode
which is optically coupled to an integrated high speed
photon detector. The output of the detector is an open
collector Schottky clamped transistor. Internal shields
provide a guaranteed common mode transient immunity specification of 1000 V/μs. For Isolation Voltage applications requiring up to 2500 Vdc, the HCPL-5650 family is
also available. Package styles for these parts are 8 and 16
pin DIP through hole (case outlines P and E respectively),
and 16 pin surface mount DIP flat pack (case outline F),
leadless ceramic chip carrier (case outline 2). Devices
may be purchased with a variety of lead bend and plating options. See Selection Guide Table for details. Standard Microcircuit Drawing (SMD) parts are available for
each package and lead style.
Because the same electrical die (emitters and detectors)
are used for each channel of each device listed in this
data sheet, absolute maximum ratings, recommended
operating conditions, electrical specifications, and performance characteristics shown in the figures are identical for all parts. Occasional exceptions exist due to
package variations and limitations, and are as noted.
Additionally, the same package assembly processes and
materials are used in all devices. These similarities give
justification for the use of data obtained from one part
to represent other parts’ performance for reliability and
certain limited radiation test results.
Selection Guide–Package Styles and Lead Configuration Options
Package
16 Pin DIP
8 Pin DIP
8 Pin DIP
8 Pin DIP
16 Pin Flat Pack
20 Pad LCCC
Lead Style
Through Hole Through Hole Through Hole Through Hole Unformed Leads Surface Mount
Channels
2
1
2
2
4
2
Common Channel Wiring
VCC, GND
None
VCC, GND
VCC, GND
VCC, GND
None
Withstand Test Voltage
1500 Vdc
1500 Vdc
1500 Vdc
2500 Vdc
1500 Vdc
1500 Vdc
Commercial
6N134[1]
HCPL-5600
HCPL-5630
HCPL-5650
HCPL-6650
HCPL-6630
MIL-PRF-38534, Class H
6N134/883B
HCPL-5601
HCPL-5631
HCPL-5651
HCPL-6651
HCPL-6631
MIL-PRF-38534, Class K
HCPL-268K
HCPL-560K
HCPL-563K
HCPL-665K
HCPL-663K
Standard Lead Finish
Gold Plate
Gold Plate
Gold Plate
Gold Plate
Gold Plate
Solder Pads*
Solder Dipped*
Option #200
Option #200
Option #200
Option #200
Butt Cut/Gold Plate
Option #100
Option #100
Option #100
Gull Wing/Soldered*
Option #300
Option #300
Option #300
Prescript for all below
None
5962-
None
None
None
None
Gold Plate
8102801EC
9085501HPC
8102802PC
8102805PC
8102804FC
Solder Dipped*
8102801EA
9085501HPA
8102802PA
8102805PA
Butt Cut/Gold Plate
8102801UC
9085501HYC
8102802YC
Butt Cut/Soldered*
8102801UA
9085501HYA
8102802YA
Gull Wing/Soldered*
8102801TA
9085501HXA
8102802ZA
Prescript for all below
5962-
5962-
5962-
5962-
Gold Plate
9800101KEC
9085501KPC
9800102KPC
9800104KFC
Solder Dipped*
9800101KEA
9085501KPA
9800102KPA
Butt Cut/Gold Plate
9800101KUC
9085501KYC
9800102KYC
Butt Cut/Soldered*
9800101KUA
9085501KYA
9800102KYA
Gull Wing/Soldered*
9800101KTA
9085501KXA
9800102KZA
Avago Part # & Options
Class H SMD Part #
81028032A
Class K SMD Part #
*Solder contains lead.
Note:
1. JEDEC registered part.
2
59629800103K2A
Functional Diagrams
16 Pin DIP
8 Pin DIP
8 Pin DIP
16 Pin Flat Pack
20 Pad LCCC
Through Hole
Through Hole
Through Hole
Unformed Leads
Surface Mount
2 Channels
1 Channel
2 Channels
4 Channels
2 Channels
1
2
V CC
15
3
V O1
14
4
5
VE
2
13
V O2
11
GND
V OUT
3
12
6
7
V CC
1
4
10
GND
8
1
7
2
VCC
VO1
VO2
3
6
4
5
GND
7
6
5
2
V CC
15
3
V O1
14
4
V O2
13
5
V O3
12
6
V O4
11
7
GND
10
8
9
8
8
15
16
1
16
VCC2
19
VO2
20
2
GND 2
VO1
VCC1
3
GND 1
7
8
9
Note: All DIP and flat pack devices have common VCC and ground. Single channel DIP has an enable pin 7. LCCC (leadless ceramic chip carrier)
package has isolated channels with separate VCC and ground connections. All diagrams are “top view.”
Outline Drawings
;;;;;
16 Pin DIP Through Hole, 2 Channels
20.06 (0.790)
20.83 (0.820)
8.13 (0.320)
MAX.
0.89 (0.035)
1.65 (0.065)
0.51 (0.020)
MIN.
3.81 (0.150)
MIN.
2.29 (0.090)
2.79 (0.110)
0.51 (0.020)
MAX.
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).
Leaded Device Marking
Avago LOGO
Avago P/N
DLA SMD [1]
DLA SMD [1]
PIN ONE/
ESD IDENT
A QYYWWZ
XXXXXX
XXXXXXX
XXX XXX
* 50434
COMPLIANCE INDICATOR, [1]
DATE CODE, SUFFIX (IF NEEDED)
COUNTRY OF MFR.
Avago CAGE CODE [1]
* QUALIFIED PARTS ONLY
Leadless Device Marking
A QYYWWZ
XXXXXX
* XXXX
XXXXXX
XXX 50434
Avago LOGO
Avago P/N
PIN ONE/
ESD IDENT
COUNTRY OF MFR.
* QUALIFIED PARTS ONLY
Notes
1. Qualified parts only
3
4.45 (0.175)
MAX.
COMPLIANCE INDICATOR, [1]
DATE CODE, SUFFIX (IF NEEDED)
DLA SMD [1]
DLA SMD [1]
Avago CAGE CODE [1]
0.20 (0.008)
0.33 (0.013)
7.36 (0.290)
7.87 (0.310)
13
12
10
Outline Drawings (continued)
8 Pin DIP Through Hole, 1 and 2 Channels
8 Pin DIP Through Hole, 2 Channels
2500 Vdc Withstand Test Voltage
9.40 (0.370)
9.91 (0.390)
8.13 (0.320)
MAX.
9.40 (0.370)
9.91 (0.390)
8.13 (0.320)
MAX.
0.76 (0.030)
1.27 (0.050)
7.16 (0.282)
7.57 (0.298)
0.76 (0.030)
1.27 (0.050)
7.16 (0.282)
7.57 (0.298)
4.32 (0.170)
MAX.
3.81 (0.150)
MIN.
0.51 (0.020)
MIN.
0.51 (0.020)
MAX.
5.08 (0.200)
MAX.
0.20 (0.008)
0.33 (0.013)
0.51 (0.020)
MIN.
3.81 (0.150)
MIN.
0.20 (0.008)
0.33 (0.013)
7.36 (0.290)
7.87 (0.310)
2.29 (0.090)
2.79 (0.110)
2.29 (0.090)
2.79 (0.110)
7.36 (0.290)
7.87 (0.310)
0.51 (0.020)
MAX.
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).
16 Pin Flat Pack, 4 Channels
20 Terminal LCCC Surface Mount, 2 Channels
7.24 (0.285)
6.99 (0.275)
8.70 (0.342)
9.10 (0.358)
2.29 (0.090)
MAX.
4.95 (0.195)
5.21 (0.205)
1.78 (0.070)
2.03 (0.080)
1.02 (0.040) (3 PLCS)
1.14 (0.045)
1.40 (0.055)
8.70 (0.342)
9.10 (0.358)
4.95 (0.195)
5.21 (0.205)
11.13 (0.438)
10.72 (0.422)
1.27 (0.050)
REF.
0.46 (0.018)
0.36 (0.014)
8.13 (0.320)
MAX.
2.85 (0.112)
MAX.
0.31 (0.012)
0.23 (0.009)
0.89 (0.035)
0.69 (0.027)
5.23
(0.206)
MAX.
0.88 (0.0345)
MIN.
9.02 (0.355)
8.76 (0.345)
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).
4
TERMINAL 1 IDENTIFIER
2.16 (0.085)
METALLIZED
CASTILLATIONS (20 PLCS)
1.78 (0.070)
2.03 (0.080)
0.64
(0.025)
(20 PLCS)
0.51 (0.020)
1.52 (0.060)
2.03 (0.080)
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).
SOLDER THICKNESS 0.127 (0.005) MAX.
Hermetic Optocoupler Options
Option
Description
100
Surface mountable hermetic optocoupler with leads trimmed for butt joint assembly. This option is available
on commercial and hi-rel product in 8 and 16 pin DIP (see drawings below for details).
4.32 (0.170)
MAX.
0.51 (0.020)
MIN.
1.14 (0.045)
1.40 (0.055)
0.51 (0.020)
MAX.
2.29 (0.090)
2.79 (0.110)
4.32 (0.170)
MAX.
0.51 (0.020)
MIN.
2.29 (0.090)
2.79 (0.110)
1.14 (0.045)
1.40 (0.055)
0.20 (0.008)
0.33 (0.013)
0.51 (0.020)
MAX.
7.36 (0.290)
7.87 (0.310)
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).
200
Lead finish is solder dipped rather than gold plated. This option is available on commercial and hi-rel product in 8 and 16 pin DIP. DLA Drawing part numbers contain provisions for lead finish. All leadless chip carrier
devices are delivered with solder dipped terminals as a standard feature.
300
Surface mountable hermetic optocoupler with leads cut and bent for gull wing assembly. This option is available on commercial and hi-rel product in 8 and 16 pin DIP (see drawings below for details). This option has
solder dipped leads.
4.57 (0.180)
MAX.
0.51 (0.020)
MIN.
1.40 (0.055)
1.65 (0.065)
0.51 (0.020)
MAX.
2.29 (0.090)
2.79 (0.110)
4.57 (0.180)
MAX.
0.51 (0.020)
MIN.
2.29 (0.090)
2.79 (0.110)
1.40 (0.055)
1.65 (0.065)
4.57 (0.180)
MAX.
5° MAX.
0.51 (0.020)
MAX.
NOTE: DIMENSIONS IN MILLIMETERS (INCHES).
Solder contains lead.
5
0.20 (0.008)
0.33 (0.013)
9.65 (0.380)
9.91 (0.390)
1.07 (0.042)
1.32 (0.052)
Absolute Maximum Ratings
No derating required up to +125°C.
Parameter
Symbol
Min.
Max.
Units
Storage Temperature
TS
-65
+150
°C
Operating Temperature
TA
-55
+125
°C
Case Temperature
TC
+170
°C
Junction Temperature
TJ
+175
°C
260 for 10 sec
°C
Lead Solder Temperature
Peak Forward Input Current
(each channel, ≤1 ms duration)
IF(PEAK)
40
mA
Average Input Forward Current (each channel)
IF(AVG)
20
mA
35
mW
Reverse Input Voltage (each channel
VR
5
V
Supply Voltage (1 minute maximum)
VCC
7.0
V
Output Current (each channel)
IO
25
mA
Output Voltage (each channel)
VO
7*
V
Output Power Dissipation (each channel)
PO
40
mW
Package Power Dissipation (each channel)
PD
200
mW
VE
5.5
V
Input Power Dissipation (each channel)
*Selection for higher output voltages up to 20 V is available
Single Channel Product Only
Enable Input Voltage
8 Pin Ceramic DIP Single Channel Schematic
Note enable pin 7. An external 0.01 μF to 0.1 μF bypass capacitor must
be connected between VCC and ground for each package type.
ESD Classification
(MIL-STD-883, Method 3015)
HCPL-5600/01/0K
(), Class 1
6N134, 6N134/883B, HCPL-5630/31/3K, HCPL-5650/51, HCPL-6630/31/3K and HCPL-6650/51/5K
(Dot), Class 3
Recommended Operating Conditions
Parameter
Symbol
Min.
Max.
Units
Input Current, Low Level, Each Channel
IFL
0
250
μA
Input Current, High Level, Each Channel*
IFH
10
20
mA
Supply Voltage, Output
VCC
4.5
5.5
V
Fan Out (TTL Load) Each Channel
N
*Meets or exceeds DLA SMD and JEDEC requirements.
6
6
Recommended Operating Conditions (cont’d.)
Single Channel Product Only[10]
Parameter
Symbol
Min.
Max.
Units
High Level Enable Voltage
VEH
2.0
VCC
V
Low Level Enable Voltage
VEL
0
0.8
V
Electrical Characteristics (TA = -55°C to +125°C, unless otherwise specified)
Parameter
Symbol
Test Conditions
High Level
Output Current
IOH*
VCC = 5.5 V, VO = 5.5 V,
IF = 250 μA
Low Level
Output Voltage
VOL*
Current Transfer
Ratio
Logic
High
Supply
Current
Logic
low
Supply
Current
Single
Channel
Group
A[13]
Subgroups
Limits
Min.
Typ.**
Max.
Units
Fig.
Note
1, 2, 3
20
250
μA
1
1
VCC = 5.5 V, IF = 10 mA,
IOL (Sinking) = 10 mA
1, 2, 3
0.3
0.6
V
2
1, 9
hF CTR
VO = 0.6 V, IF = 10 mA,
VCC = 5.5 V
1, 2, 3
ICCH*
VCC = 5.5 V, IF = 0 mA
1, 2, 3
100
1
9
14
mA
1
6
Dual
Channel
VCC = 5.5 V,
IF1 = IF2 = 0 mA
18
28
mA
Quad
Channel
VCC = 5.5 V, IF1 = IF2 =
IF3 = IF4 = 0 mA
25
42
mA
13
18
mA
1
6
Single
Channel
ICCL*
VCC = 5.5 V,
IF = 20 mA
1, 2, 3
Dual
Channel
VCC = 5.5 V,
IF1 = IF2 = 20 mA
26
36
mA
Quad
Channel
VCC = 5.5 V, IF1 = IF2 =
IF3 = IF4 = 20 mA
33
50
mA
1, 2, 3
1.5
1.9
V
3
1, 15
1, 2
1.55
1.75
V
3
1, 16
Input Forward
Voltage
VF*
IF = 20 mA
3
Input Reverse
Breakdown Voltage
BVR*
IR = 10 μA
Input-Output
Leakage Current
II-O*
RH ≤ 65%
TA = 25°C
t=5s
Capacitance Between
Input/ Output
CI-O
1, 2, 3
1.85
5
V
1
VI-O = 1500
Vdc
1
1.0
μA
2, 8, 17
VI-O = 2500
Vdc
1
1.0
μA
18
4.0
pF
1, 3,
14
f = 1 MHz, TC = 25°C
*Identified test parameters for JEDEC registered parts.
**All typical values are at VCC = 5 V, TA = 25°C.
7
%
4
1.0
Electrical Characteristics, (cont’d) TA = -55°C to +125°C unless otherwise specified
Limits
Group A[13]
Subgroups
Parameter
Symbol
Test Conditions
Propagation Delay
Time to High Output
Level
tPLH*
VCC = 5 V, RL = 510 Ω,
CL = 50 pF,
IF = 13 mA
Propagation Delay
Time to Low Output
Level
tPHL*
Min.
9
Typ.**
Max.
Units
Fig.
Note
60
100
ns
4, 5, 6
1, 5
10, 11
140
9
55
10, 11
100
ns
120
RL = 510 Ω, CL = 50
pF, IF = 13 mA
9, 10, 11
|CMH|
VCM = 50 V (PEAK),
VCC = 5 V,
VO (min.) = 2 V,
RL = 510 Ω,
IF = 0 mA
9, 10, 11
1000
>10000
V/μs
7
1, 7,
14
|CML|
VCM = 50 V (PEAK),
VCC = 5 V, VO (max.) =
0.8 V, RL = 510 Ω, IF =
10 mA
9, 10, 11
1000
>10000
V/μs
7
1, 7,
14
1, 2, 3
-2.0
-1.45
mA
2.0
Output Rise Time
tLH
Output Fall Time
tHL
Common Mode
Transient
Immunity at
High Output
Level
Common Mode
Transient
Immunity at Low
Output Level
35
90
35
40
ns
1
Single Channel Product Only
Low Level
Enable Current
IEL
VCC = 5.5 V,
VE = 0.5 V
High Level
Enable Voltage
VEH
1, 2, 3
Low Level
Enable Voltage
VEL
1, 2, 3
V
0.8
10
V
*Identified test parameters for JEDEC registered part.
**All typical values are at VCC = 5 V, TA = 25°C.
Typical Characteristics, TA = 25°C, VCC = 5 V
Parameter
Sym.
Typ.
Units
Test Conditions
Fig.
Note
Input Capacitance
CIN
60
pF
VF = 0 V, f = 1 MHz
1
Input Diode Temperature
Coefficient
ΔVF
ΔTA
-1.5
mV/°C
IF = 20 mA
1
Resistance (Input-Output)
RI-O
1012
Ω
VI-O = 500 V
2
Propagation Delay Time of
Enable from VEH to VEL
tELH
35
ns
Propagation Delay Time of
Enable from VEL to VEH
tEHL
35
ns
RL = 510 Ω, CL = 50 pF
IF = 13 mA, VEH = 3 V,
VEL = 0V
Input-Input
Leakage Current
II-I
0.5
nA
Relative Humidity ≤ 65%
VI-I = 500 V, t = 5 s
4
Resistance (Input-Input)
RI-I
1012
Ω
VI-I = 500 V
4
Capacitance (Input-Input)
CI-I
0.55
pF
f = 1 MHz
4
Single Channel Product Only
8, 9
1, 11
1, 12
Dual and Quad Channel Product Only
8
Notes:
1. Each channel.
2. All devices are considered two-terminal devices; II-O is measured between all input leads or terminals shorted together and all output
leads or terminals shorted together.
3. Measured between each input pair shorted together and all output connections for that channel shorted together.
4. Measured between adjacent input pairs shorted together for each multichannel device.
5. tPHL propagation delay is measured from the 50% point on the leading edge of the input pulse to the 1.5 V point on the leading edge of
the output pulse. The tPLH propagation delay is measured from the 50% point on the trailing edge of the input pulse to the 1.5 V point
on the trailing edge of the output pulse.
6. The HCPL-6630, HCPL-6631, and HCPL-663K dual channel parts function as two independent single channel units. Use the single channel
parameter limits for each channel.
7. CML is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state
(VO < 0.8 V). CMH is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic
high state (VO > 2.0 V).
8. This is a momentary withstand test, not an operating condition.
9. It is essential that a bypass capacitor (0.01 to 0.1 μF, ceramic) be connected from VCC to ground. Total lead length between both ends of
this external capacitor and the isolator connections should not exceed 20 mm.
10. No external pull up is required for a high logic state on the enable input.
11. The tELH enable propagation delay is measured from the 1.5 V point on the trailing edge of the enable input pulse to the 1.5 V point on
the trailing edge of the output pulse.
12. The tEHL enable propagation delay is measured from the 1.5 V point on the leading edge of the enable input pulse to the 1.5 V point on
the leading edge of the output pulse.
13. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and 883B parts receive 100% testing at 25, 125, and -55°C (Subgroups 1 and 9, 2 and 10, 3 and 11, respectively).
14. Parameters are tested as part of device initial characterization and after design and process changes. Parameters are guaranteed to limits
specified for all lots not specifically tested.
15. Not required for 6N134, 6N134/883B, 8102801, HCPL-268K and 5962-9800101 types.
16. Required for 6N134, 6N134/883B, 8102801, HCPL-268K and 5962-9800101 types.
17. Not required for HCPL-5650, HCPL-5651 and 8102805 types.
18. Required for HCPL-5650, HCPL-5651 and 8102805 types only.
Figure 1. High Level Output Current vs. Temperature.
9
Figure 2. Input-Output Characteristics.
Figure 3. Input Diode Forward Characteristics.
D.U.T.
PULSE
GENERATOR
ZO = 50Ω
tH = 5 ns
INPUT
MONITORING
NODE
5V
VCC
RL
IF
VO
0.01 μF
BYPASS
VO
CL*
GND
Rm
* CLINCLUDES PROBE AND STRAY WIRING CAPACITANCE.
Figure 5. Propagation Delay, tPHL and tPLH vs. Pulse Input
Current, IFH.
Figure 4. Test Circuit for tPHL and tPLH.*
D.U.T.
B
II
VCC
A
+5 V
510 Ω
OUTPUT VO
MONITORING
0.01 μF NODE
BYPASS
GND
VFF
VCM
+
PULSE GEN.
Figure 6. Propagation Delay vs. Temperature.
10
Figure 7. Test Circuit for Common Mode Transient Immunity and Typical
Waveforms.
PULSE
GENERATOR
ZO = 50 Ω
tr = 5 ns
OUTPUT VE
MONITORING
NODE
+5 V
D.U.T.
VCC
VE
IF = 13 mA
RL
VOUT
0.01 μF
BYPASS
OUTPUT VO
MONITORING
CL* NODE
GND
* CL INCLUDES PROBE AND
STRAY WIRING CAPACITANCE.
Figure 9. Enable Propagation Delay vs. Temperature.
Figure 8. Test Circuit for tEHL and tELH.
VCC
+5.5 V
VOC
+5.5 V
D.U.T.*
VCC
(EACH INPUT)
+
VIN
0.01 μF
200 Ω
5.3 V
(EACH OUTPUT)
GND
200 Ω
(EACH OUTPUT)
CONDITIONS: IF = 20 mA
IO = 25 mA
TA = +125 oC
* ALL CHANNELS TESTED SIMULTANEOUSLY.
Figure 10. Operating Circuit for Burn-In and Steady State Life Tests.
11
MIL-PRF-38534 Class H, Class K, and
DLA SMD Test Program
Avago’s Hi-Rel Optocouplers are in compliance with MILPRF-38534 Classes H and K. Class H and Class K devices
are also in compliance with DLA drawings 81028, 596290855 and 5962-98001.
Testing consists of 100% screening and quality conformance inspection to MIL-PRF-38534.
For product information and a complete list of distributors, please go to our website:
www.avagotech.com
Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies Limited in the United States and other countries.
Data subject to change. Copyright © 2005-2012 Avago Technologies Limited. All rights reserved. Obsoletes 5968-9407E
AV02-1336EN - October 2, 2012