HCPL-1930, HCPL-1931, HCPL-193K, 5962-89572 Dual Channel Line Receiver Hermetically Sealed Optocoupler Data Sheet Description Features The HCPL-193X devices are dual channel, hermetically sealed, high CMR, line receiver optocouplers. The products are capable of operation and storage over the full military temperature range and can be purchased as either a standard product or with full MIL-PRF-38534 Class Level H or K testing, or from the DLA Standard Microcircuit Drawing (SMD) 5962-89572. This sixteen pin DIP may be purchased with a variety of lead bend and plating options. See selection guide table for details. Standard Microcircuit Drawing (SMD) parts are available for each lead style. •Dual marked with device part number and DLA standard microcircuit drawing • Manufactured and tested on a MIL-PRF-38534 certified line • QML-38534, Class H and Class K • Hermetically sealed 16-pin dual in-line package • Performance guaranteed over full military temperature range: -55° C to +125° C • High speed – 10 Mb/s • Accepts a broad range of drive conditions • Adaptive line termination included •Internal shield provides excellent common mode rejection • External base lead allows “LED Peaking” and LED current adjustment • 1500 Vdc withstand test voltage • High radiation immunity • HCPL-2602 function compatibility • Reliability data available Functional Diagram Applications Truth Table (Positive Logic) INPUT ENABLE OUTPUT ON H L OFF H H ON L H OFF L H • • • • • • • • • • • • Military and space High reliability systems Isolated line receiver Simplex/multiplex data transmission Computer-peripheral interface Microprocessor system interface Harsh environmental environments Digital isolation for A/D, D/A conversion Current sensing Instrument input/output isolation Ground loop elimination Pulse transformer replacement Note: The connection of a 0.1 µF bypass capacitor between pins 15 and 10 is recommended. CAUTION: It is advised that normal static precautions be taken in handling and assembly of this component to prevent damage and/or degradation which may be induced by ESD. All devices are manufactured and tested on a MILPRF-38534 certified line and are included in the DLA Qualified Manufac turers List QML-38534 for Hybrid Microcircuits. Each unit contains two independent channels, consisting of a GaAsP light emitting diode, an input current regulator, and an integrated high gain photon detector. The input regulator serves as a line termination for line receiver applications. It clamps the line voltage and regulates the LED current so line reflections do not interfere with circuit performance. The regulator allows a typical LED current of 12.5 mA before it starts to shunt excess current. The output of the detector IC is an open collector Schottky clamped transistor. An enable input gates the detector. The internal detector shield provides a guaranteed common mode transient immunity specification of +1000 V/µsec. DC specifications are compatible with TTL logic and are guaranteed from -55° C to +125° C allowing trouble-free interfacing with digital logic circuits. An input current of 10 mA will sink a six gate fan-out (TTL) at the output with a typical propagation delay from input to output of only 45 nsec. Selection Guide–Lead Configuration Options Avago Part # and Options Commercial HCPL-1930 MIL-PRF-38534 Class H HCPL-1931 MIL-PRF-38534 Class K HCPL-193K Standard Lead Finish Gold Solder Dipped* Option #200 Butt Joint/Gold Plate Option #100 Gull Wing/Soldered* Option #300 Crew Cut/Gold Plate Option #600 Class H SMD Part # Prescript for all below 5962- Gold Plate 8957201EC Solder Dipped* 8957201EA Butt Joint/Gold Plate 8957201YC Butt Joint/Soldered* 8957201YA Gull Wing/Soldered* 8957201XA Crew Cut/Gold Plate Available Crew Cut/Soldered* Available Class K SMD Part # Prescript for all below 5962- Gold Plate 8957202KEC Solder Dipped* 8957202KEA Butt Joint/Gold Plate 8957202KYC Butt Joint/Soldered* 8957202KYA Gull Wing/Soldered* 8957202KXA *Solder contains lead. 2 Outline Drawings 16 Pin DIP Through Hole, 2 Channels 0.89 (0.035) 1.65 (0.065) 20.06 (0.790) 20.83 (0.820) 8.13 (0.320) MAX. 4.45 (0.175) MAX. 0.51 (0.020) MIN. 3.81 (0.150) MIN. 2.29 (0.090) 2.79 (0.110) 0.51 (0.020) MAX. Note: Dimensions in millimeters (inches). Device Marking Avago DESIGNATOR Avago P/N DLA SMD* DLA SMD* PIN ONE/ ESD IDENT A QYYWWZ XXXXXX XXXXXXX XXX XXX 50434 * QUALIFIED PARTS ONLY 3 COMPLIANCE INDICATOR,* DATE CODE, SUFFIX (IF NEEDED) COUNTRY OF MFR. Avago CAGE CODE* 0.20 (0.008) 0.33 (0.013) 7.36 (0.290) 7.87 (0.310) Hermetic Optocoupler Options Option Description 100 Surface mountable hermetic optocoupler with leads trimmed for butt joint assembly. This option is available on commercial and hi-rel product. 4.32 (0.170) MAX. 0.20 (0.008) 0.33 (0.013) 0.51 (0.020) MIN. 1.14 (0.045) 1.40 (0.055) 2.29 (0.090) 2.79 (0.110) 7.36 (0.290) 7.87 (0.310) 0.51 (0.020) MAX. 200 Lead finish is solder dipped rather than gold plated. This option is available on commercial and hi-rel product. DLA Drawing part numbers contain provisions for lead finish. 300 Surface mountable hermetic optocoupler with leads cut and bent for gull wing assembly. This option is available on commercial and hi-rel product. This option has solder dipped leads. 4.57 (0.180) MAX. 0.20 (0.008) 0.33 (0.013) 0.51 (0.020) MIN. 2.29 (0.090) 2.79 (0.110) 600 1.40 (0.055) 1.65 (0.065) 0.51 (0.020) MAX. 5° MAX. 9.65 (0.380) 9.91 (0.390) 1.07 (0.042) 1.32 (0.052) Surface mountable hermetic optocoupler with leads trimmed for butt joint assembly. This option is available on commercial and hi-rel product. Contact factory for the availability of this option on DLA part types. 3.81 (0.150) MIN. 0.51 (0.020) MIN. 0.20 (0.008) 0.33 (0.013) 2.29 (0.090) 2.79 (0.110) Notes: Dimensions in millimeters (inches). Solder contains lead. 4 4.57 (0.180) MAX. 1.14 (0.045) 1.25 (0.049) 7.36 (0.290) 7.87 (0.310) Absolute Maximum Ratings Parameter Symbol Min. Max. Units Storage Temperature TS -65 +150 °C Operating Temperature TA -55 +125 °C 260 for 10 sec °C Lead Solder Temperature Forward Input Current (each channel) II 60 mA Reverse Input Current IR 60 mA Supply Voltage (1 minute max) VCC 7.0 V Enable Input Voltage (each channel) VE 5.5* V Output Collector Current (each channel) IO 25 mA Output Collector Power Dissipation (each channel) PO 40 mW Output Collector Voltage (each channel) VO 7 V Total Package Power Dissipation 564 mW Input Power Dissipation (each channel) 168 mW * not to exceed VCC by more than 500 mV Schematic A 0.1 µF bypass capacitor must be connected between pins 10 and 15 (see note 1). ESD Classification (MIL-STD-883, Method 3015) ( ), Class 1 Recommended Operating Conditions Parameter Symbol Min. Max. Units Input Current, Low Level IIL 0 250 μA Input Current, High Level* IIH 12.5 60 mA Supply Voltage, Output VCC 4.5 5.5 V High Level Enable Voltage VEH 2.0 VCC V Low Level Enable Voltage VEL 0 0.8 V Fan Out (@ RL = 4 kΩ) N 5 TTL Loads Operating Temperature TA 125 °C -55 *12.5 mA condition permits at least 20% guardband for optical coupling variation. Initial switching threshold is 10 mA or less. 5 Note 2 Electrical Specifications TA = -55° C to 125° C unless otherwise stated. See note 15. Group A Sub-groups Limits Parameter Symbol Test Conditions Typ.* Max. Units Fig. Note High Level Output Current IOH VCC = 5.5 V, VO = 5.5 V II = 250 μA, VE = 2.0 V 1, 2, 3 Min. 20 250 μA 3 3 Low Level Output Voltage VOL VCC = 5.5 V; II = 10 mA VE = 2.0 V, IOL (Sinking) = 10 mA 1, 2, 3 0.3 0.6 V 1 3 Input Voltage VI II = 10 mA 1, 2, 3 V 2 3 II = 60 mA 2.2 2.6 2.35 2.75 Input Reverse Voltage VR IR = 10 mA 1, 2, 3 0.8 1.10 V 3 Low Level Enable Current IEL VCC = 5.5 V, VE = 0.5 V 1, 2, 3 -1.45 -2.0 mA 3 High Level Enable Current IEH VCC = 5.5 V, VE = 1.7 V 1, 2, 3 -1.5 mA 3 High Level Enable Voltage VEH 1, 2, 3 V 3, 12 Low Level Enable Voltage VEL 1, 2, 3 0.8 V 3 High Level Supply Current ICCH VCC = 5.5 V; II = 0, VE = 0.5 V both channels 1, 2, 3 21 28 mA Low Level Supply Current ICCL VCC = 5.5 V; II = 60 mA, VE = 0.5 V both channels 1, 2, 3 27 36 mA Input-Output Insulation Leakage Current II-O Relative Humidity ≤ 65% t = 5 s, VI-O = 1500 Vdc 1 1 μA Propagation Delay Time to High Output Level tPLH RL = 510 Ω; CL = 50 pF, II = 13 mA,VCC = 5.0 V 9 100 ns 4, 5 3, 5 Propagation Delay Time to Low Output Level tPHL ns 4, 5 3, 6 Common Mode Transient Immunity at High Output Level |CMH| VCM = 50 V (peak), VO (min.) = 2 V, RL = 510 Ω; II = 0 mA, VCC = 5.0 V 9, 10, 11 1000 10,000 V/μs 8, 9 3, 9, 14 Common Mode Transient Immunity at Low Output Level |CML| VCM = 50 V (peak), VO (max.) = 0.8 V, RL = 510 Ω; II = 10 mA, VCC = 5.0 V 9, 10, 11 1000 10,000 V/μs 8, 9 3, 10, 14 RL = 510 Ω; CL = 50 pF, II = 13 mA,VCC = 5.0 V *All typical values are at VCC = 5 V, TA = 25° C. 6 2.0 55 10, 11 4 140 9 60 10, 11 100 120 Typical Specifications TA = 25° C, VCC = 5 V Parameter Symbol Typ. Units Test Conditions Resistance (Input-Output) RI-O 1012 Ω VI-O = 500 V dc Fig. Note 3, 13 Capacitance (Input-Output) CI-O 1.7 pF f = 1 MHz 3, 13 Input-Input Insulation Leakage Current II-I 0.5 nA ≤ 65% Relative Humidity, VI-I = 500 Vdc, t = 5 s 11 Resistance (Input-Input) RI-I 1012 Ω VI-I = 500 Vdc 11 Capacitance (Input-Input) CI-I 0.55 pF f = 1 MHz 11 Propagation Delay Time of Enable from VEH to VEL tELH 35 ns RL = 510 Ω, CL = 15 pF, II = 13 mA, VEH = 3 V, VEL = 0 V Propagation Delay Time of Enable from VEL to VEH tEHL 35 ns Output Rise Time (10-90%) tr 30 ns Output Fall Time (90-10%) tf 24 ns Input Capacitance CI 60 pF 6, 7 3, 7 6, 7 3, 8 RL = 510 Ω, CL = 15 pF, II = 13 mA 3 f = 1 MHz, VI = 0, PINS 1 to 2 or 5 to 6 3 3 Notes: 1. Bypassing of the power supply line is required, with a 0.1 µF ceramic disc capacitor adjacent to each isolator. The power supply bus for the isolators should be separate from the bus for any active loads, otherwise additional bypass capacitance may be needed to suppress regenerative feedback via the power supply. 2. Derate linearly at 1.2 mA/°C above TA = 100° C. 3. Each channel. 4. Device considered a two terminal device: pins 1 through 8 are shorted together, and pins 9 through 16 are shorted together. 5. The tPLH propagation delay is measured form the 6.5 mA point on the trailing edge of the input pulse to the 1.5 V point on the trailing edge of the output pulse. 6. The tPHL propagation delay is measured from the 6.5 mA point on the leading edge of the input pulse to the 1.5 V point on the leading edge of the output pulse. 7. The tELH enable propagation delay is measured from the 1.5 V point on the trailing edge of the enable input pulse to the 1.5 V point on the trailing edge of the output pulse. 8. The tEHL enable propagation delay is measured from the 1.5 V point on the leading edge of the enable input pulse to the 1.5 V point on the leading edge of the output pulse. 9. CMH is the maximum tolerable rate of rise of the common mode voltage to assure that the output will remain in a high logic state, i.e. VOUT > 2.0 V. 10.CML is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in a low logic state, i.e. VOUT < 0.8 V. 11.Measured between adjacent input leads shorted together, i.e. between 1, 2 and 4 shorted together and pins 5, 6 and 8 shorted together. 12.No external pull up is required for a high logic state on the enable input. 13.Measured between pins 1 and 2 or 5 and 6 shorted together, and pins 10 through 15 shorted together. 14. Parameters shall be tested as part of device initial characterization and after process changes. Parameters shall be guaranteed to the limits specified for all lots not specifically tested. 15.Standard parts receive 100% testing at 25° C (Subgroups 1 and 9). Hi-Rel and SMD parts receive 100% testing at 25, 125, and -55° C (Subgroups 1 and 9, 2 and 10, 3 and 11, respectively). 7 Figure 1. Input-Output Characteristics. Figure 2. Input Characteristics. Figure 3. High Level Output Current vs. Temperature. Figure 4. Propagation Delay vs. Temperature. Figure 5. Enable Propagation Delay vs. Temperature. 8 Figure 6. Test Circuit for tPHL and tPLH. Figure 7. Test Circuit for tEHL and tELH. 9 Figure 8. Typical Common Mode Transient Immunity. IIN VIN 1 16 A 2 15 B 3 VCC 14 4 13 5 12 6 11 7 GND 10 8 5V 510 Ω OUTPUT VO MONITORING 0.01 µF NODE BYPASS 9 VCM + – PULSE GEN. Figure 9. Test Circuit for Common Mode Transient Immunity and Typical Waveforms. VOUT +2.6 V VCC +5.5 V 100 Ω 100 Ω VIN – +5.0 V + 1 16 2 15 3 14 4 13 5 12 6 11 7 10 8 9 CONDITIONS: II = 30 mA IO = 10 mA VCC = 5.5 V Figure 10. Burn In Circuit. 10 200 Ω 200 Ω 0.01 µF TA = +125 °C Application Circuits* Figure A1. Polarity Non-Reversing. Figure A2. Polarity Reversing, Split Phase. 11 Figure A3. Flop-Flop Configurations. MIL-PRF-38534 Class H, Class K, and DLA SMD Test Program Avago Technologies’ Hi-Rel Optocouplers are in compliance with MIL-PRF-38534 Class H and K. Class H and Class K devices are also in compliance with DLA drawing 5962-89572. Testing consists of 100% screening and quality conformance inspection to MIL-PRF-38534. For product information and a complete list of distributors, please go to our web site: www.avagotech.com Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies in the United States and other countries. Data subject to change. Copyright © 2005-2012 Avago Technologies. All rights reserved. Obsoletes 5968-9401E AV02-3843EN - October 17, 2012