NSC 54ABT646E-QML

54ABT646
Octal Transceivers and Registers with TRI-STATE ®
Outputs
General Description
Features
The ’ABT646 consists of bus transceiver circuits with
TRI-STATE, D-type flip-flops, and control circuitry arranged
for multiplexed transmission of data directly from the input
bus or from the internal registers. Data on the A or B bus will
be clocked into the registers as the appropriate clock pin
goes to a high logic level. Control OE and direction pins are
provided to control the transceiver function. In the transceiver mode, data present at the high impedance port may
be stored in either the A or the B register or in both. The select controls can multiplex stored and real-time (transparent
mode) data. The direction control determines which bus will
receive data when the enable control OE is Active LOW. In
the isolation mode (control OE HIGH), A data may be stored
in the B register and/or B data may be stored in the A register.
n Independent registers for A and B buses
n Multiplexed real-time and stored data
n A and B output sink capability of 48 mA, source
capability of 24 mA
n Guaranteed multiple output switching specifications
n Output switching specified for both 50 pF and 250 pF
loads
n Guaranteed simultaneous switching noise level and
dynamic threshold performance
n Guaranteed latchup protection
n High impedance glitch free bus loading during entire
power up and power down cycle
n Nondestructive hot insertion capability
n Standard Microcircuit Drawing (SMD) 5962-9457701
Ordering Code
Military
Package Number
Package Description
54ABT646J-QML
J24A
24-Lead Ceramic Dual-In-Line
54ABT646W-QML
W24C
24-Lead Cerpack
54ABT646E-QML
E28A
28-Lead Ceramic Leadless Chip Carrier, Type C
TRI-STATE ® is a registered trademark of National Semiconductor Corporation.
© 1998 National Semiconductor Corporation
DS100209
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54ABT646 Octal Transceivers and Registers with TRI-STATE Outputs
July 1998
Connection Diagrams
Pin Assignment for
DIP and Flatpak
Pin Assignment for LCC
DS100209-4
DS100209-3
Pin Descriptions
Pin
Description
Names
A0–A7
Data Register A Inputs/
TRI-STATE Outputs
B0–B7
Data Register B Inputs/
TRI-STATE Outputs
CPAB,
Clock Pulse Inputs
CPBA
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SAB, SBA
Select Inputs
OE
Output Enable Input
DIR
Direction Control Input
2
Connection Diagrams
(Continued)
Storage from
Bus to Register
Real Time Transfer
A-Bus to B-Bus
DS100209-7
FIGURE 3.
DS100209-5
FIGURE 1.
Transfer from
Register to Bus
Real Time Transfer
B-Bus to A-Bus
DS100209-8
FIGURE 4.
DS100209-6
FIGURE 2.
Inputs
Data I/O
(Note 1)
Function
OE
DIR
CPAB
CPBA SAB SBA A0–A7 B0–B7
H
X
H or L
H or L
X
X
H
X
N
X
X
X
H
X
X
N
X
X
Clock Bn Data into B Register
L
H
X
X
L
X
An to Bn — Real Time (Transparent Mode)
L
H
N
X
L
X
L
H
H or L
X
H
X
L
H
N
X
H
X
Clock An Data into A Register and Output to Bn
L
L
X
X
X
L
Bn to An — Real Time (Transparent Mode)
L
L
X
N
X
L
L
L
X
H or L
X
H
B Register to An (Stored Mode)
L
L
X
N
X
H
Clock Bn Data into B Register and Output to An
Isolation
Input
Input
Input Output
Clock An Data into A Register
Clock An Data into A Register
A Register to Bn (Stored Mode)
Output
Input
Clock Bn Data into B Register
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
N = LOW-to-HIGH Transition
Note 1: The data output functions may be enabled or disabled by various signals at the OE and DIR inputs. Data input functions are always enabled; i.e., data at
the bus pins will be stored on every LOW-to-HIGH transition of the appropriate clock inputs.
3
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Logic Diagram
DS100209-9
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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4
Absolute Maximum Ratings (Note 2)
Over Voltage Latchup (I/O)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Storage Temperature
Ambient Temperature under Bias
Junction Temperature under Bias
Ceramic
VCC Pin Potential to Ground Pin
Input Voltage (Note 3)
Input Current (Note 3)
Voltage Applied to Any Output
in the Disable or
Power-Off State
in the HIGH State
Current Applied to Output
in LOW State (Max)
DC Latchup Source Current
10V
Recommended Operating
Conditions
−65˚C to +150˚C
−55˚C to +125˚C
−55˚C to +175˚C
−0.5V to +7.0V
−0.5V to +7.0V
−30 mA to +5.0 mA
Free Air Ambient Temperature
Military
Supply Voltage
Military
Minimum Input Edge Rate
Data Input
Enable Input
Clock Input
−55˚C to +125˚C
+4.5V to +5.5V
(∆V/∆t)
50 mV/ns
20 mV/ns
100 mV/ns
Note 2: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under these
conditions is not implied.
−0.5V to +5.5V
−0.5V to VCC
Note 3: Either voltage limit or current limit is sufficient to protect inputs.
twice the rated IOL (mA)
−500 mA
DC Electrical Characteristics
Symbol
Parameter
ABT646
Min Typ
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VCD
Input Clamp Diode Voltage
VOH
Output HIGH
Voltage
2.0
54ABT
2.5
54ABT
2.0
VOL
Output LOW
Voltage
VID
Input Leakage Test
IIH
Input HIGH Current
Units
54ABT
VCC
V
0.8
V
−1.2
V
Recognized HIGH Signal
Min
V
Min
0.55
Input HIGH Current
Breakdown Test
IBVIT
Input HIGH Current
Breakdown Test (I/O)
IIL
Input LOW Current
Recognized LOW Signal
IIN = −18 mA (Non I/O Pins)
IOH = −3 mA, (An, Bn)
IOH = −24 mA, (An, Bn)
IOL = 48 mA, (An, Bn)
V
Min
V
0.0
µA
Max
7
µA
Max
VIN = 7.0V (Non-I/O Pins)
100
µA
Max
VIN = 5.5V (An, Bn)
−5
µA
Max
VIN = 0.5V (Non-I/O Pins) (Note 5)
VIN = 0.0V (Non-I/O Pins)
VOUT = 2.7V (An, Bn); OE = 2.0V
VOUT = 0.5V (An, Bn); OE = 2.0V
4.75
5
5
IBVI
Conditions
Max
−5
IID = 1.9 µA, (Non-I/O Pins)
All Other Pins Grounded
VIN = 2.7V (Non-I/O Pins) (Note 5)
VIN = VCC (Non-I/O Pins)
IIH + IOZH
Output Leakage Current
50
µA
0V–5.5V
IIL + IOZL
Output Leakage Current
−50
µA
0V–5.5V
IOS
Output Short-Circuit Current
−275
mA
Max
ICEX
Output HIGH Leakage Current
50
µA
Max
IZZ
Bus Drainage Test
100
µA
0.0V
ICCH
Power Supply Current
250
µA
Max
All Outputs HIGH
ICCL
Power Supply Current
30
mA
Max
All Outputs LOW
ICCZ
Power Supply Current
50
µA
Max
Outputs TRI-STATE; All Others GND
ICCT
Additional ICC/Input
2.5
mA
Max
VI = VCC − 2.1V
All Other Outputs at VCC or GND
ICCD
Dynamic ICC
(Note 5)
0.18
mA/MHz
Max
Outputs Open
OE and DIR = GND,
Non-I/O = GND or VCC (Note 4)
One Bit toggling, 50% duty cycle
No Load
−100
5
VOUT = 0V (An, Bn)
VOUT = VCC (An, Bn)
VOUT = 5.5V (An, Bn);
All Others GND
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DC Electrical Characteristics
(Continued)
Note 4: For 8-bit toggling, ICCD < 1.4 mA/MHz.
Note 5: Guaranteed but not tested.
AC Electrical Characteristics
Symbol
Parameter
54ABT
TA = −55˚C to +125˚C
VCC = 4.5V–5.5V
Fig.
Units
No.
CL = 50 pF
Min
Max
fmax
Max Clock Frequency
125
tPLH
Propagation Delay
2.2
8.8
tPHL
Clock to Bus
1.7
8.8
tPLH
Propagation Delay
1.5
7.9
tPHL
Bus to Bus
1.5
7.9
tPLH
Propagation Delay
1.5
8.1
tPHL
SBA or SAB to An to Bn
1.5
8.9
tPZH
Enable Time
1.0
7.3
tPZL
OE to An or Bn
1.9
8.8
tPHZ
Disable Time
1.5
9.3
tPLZ
OE to An or Bn
1.5
9.3
tPZH
Enable Time
1.0
7.7
tPZL
DIR to An or Bn
2.2
9.5
tPHZ
Disable Time
1.5
8.7
tPLZ
DIR to An or Bn
1.5
9.2
MHz
ns
Figure 8
ns
Figure 8
ns
Figure 8
ns
Figure 10
ns
Figure 10
ns
Figure 10
ns
Figure 10
AC Operating Requirements
Symbol
54ABT
TA = −55˚C to +125˚C
VCC = 4.5V–5.5V
Fig.
Units
No.
3.5
ns
Figure 11
1.0
ns
Figure 11
4.0
ns
Figure 9
Parameter
CL = 50 pF
Min
tS(H)
Setup Time, HIGH
tS(L)
or LOW Bus to Clock
tH(H)
Hold Time, HIGH
tH(L)
or LOW Bus to Clock
tW(H)
Pulse Width,
tW(L)
HIGH or LOW
Max
Capacitance
Symbol
Parameter
Typ
Units
CIN
Input Capacitance
5
pF
CI/O (Note 6)
Output Capacitance
11
pF
Note 6: CI/O is measured at frequency, f = 1 MHz, per MIL-STD-883B, Method 3012.
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6
Conditions
TA = 25˚C
VCC = 0V (non I/O pins)
VCC = 5.0V (An, Bn)
Capacitance
(Continued)
tPLH vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Clock to Bus
tPHL vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Clock to Bus
DS100209-18
tPLH vs Load Capacitance
1 Output Switching, TA = 25˚C
Clock to Bus
DS100209-19
tPHL vs Load Capacitance
1 Output Switching, TA = 25˚C
Clock to Bus
DS100209-20
tPLH vs Load Capacitance
8 Outputs Switching, TA = 25˚C
Clock to Bus
DS100209-21
tPHL vs Load Capacitance
8 Outputs Switching, TA = 25˚C
Clock to Bus
DS100209-22
DS100209-23
Dashed lines represent design characteristics; for specified guarantees, refer to AC Characteristics Tables.
7
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Capacitance
(Continued)
tPZL vs Temperature (TA)
CL = 50 pF, 1 Output Switching
OE to Bus
tPLZ vs Temperature (TA)
CL = 50 pF, 1 Output Switching
OE to Bus
DS100209-24
tPZH vs Temperature (TA)
CL = 50 pF, 1 Output Switching
DS100209-25
tPHZ vs Temperature (TA)
CL = 50 pF, 1 Output Switching
OE to Bus
DS100209-26
DS100209-27
tPZH vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
OE to Bus
tPHZ vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
OE to Bus
DS100209-28
DS100209-29
Dashed lines represent design characteristics; for specified guarantees, refer to AC Characteristics Tables.
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8
Capacitance
(Continued)
tPZL vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
OE to Bus
tPLZ vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
OE to Bus
DS100209-30
tPZL vs Load Capacitance
8 Outputs Switching, TA = 25˚C
OE to Bus
DS100209-31
tPZH vs Load Capacitance
8 Outputs Switching, TA = 25˚C
OE to Bus
DS100209-32
DS100209-33
tPLH and tPHL vs Number Output Switching
VCC = 5.0V, TA = 25˚C
CL = 50 pF, Clock to Bus
DS100209-34
Dashed lines represent design characteristics; for specified guarantees, refer to AC Characteristics Tables.
9
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Capacitance
(Continued)
ICC vs Frequency, Average,
TA = 25˚C, VCC = 5.5V
All Outputs Unloaded/Unterminated;
All Outputs Switching in phase @50% Duty Cycle
DS100209-35
tSET LOW vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Bus to Clock
tSET HIGH vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Bus to Clock
DS100209-36
tHOLD LOW vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Bus to Clock
DS100209-37
tHOLD HIGH vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Bus to Clock
DS100209-38
DS100209-39
Dashed lines represent design characteristics; for specified guarantees, refer to AC Characteristics Tables.
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10
AC Loading
DS100209-10
*Includes jig and probe capacitance
FIGURE 5. Standard AC Test Load
DS100209-11
FIGURE 9. Propagation Delay,
Pulse Width Waveforms
DS100209-12
FIGURE 6. Test Input Signal Levels
Input Pulse Requirements
DS100209-13
FIGURE 10. TRI-STATE Output HIGH
and LOW Enable and Disable Times
Amplitude
Rep. Rate
tW
tr
tf
3.0V
1 MHz
500 ns
2.5 ns
2.5 ns
FIGURE 7. Test Input Signal Requirements
DS100209-15
FIGURE 11. Setup Time, Hold Time
and Recovery Time Waveforms
DS100209-14
FIGURE 8. Propagation Delay Waveforms for Inverting
and Non-Inverting Functions
11
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12
Physical Dimensions
inches (millimeters) unless otherwise noted
28-Lead Ceramic Leadless Chip Carrier (L)
NS Package Number E28A
24-Lead Ceramic Dual-in-Line Package (D)
NS Package Number J24A
13
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54ABT646 Octal Transceivers and Registers with TRI-STATE Outputs
Physical Dimensions
inches (millimeters) unless otherwise noted (Continued)
24-Lead Ceramic Flatpak Package (F)
NS Package Number W24C
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