54ABT244 Octal Buffer/Line Driver with TRI-STATE ® Outputs General Description The ’ABT244 is an octal buffer and line driver with TRI-STATE outputs designed to be employed as a memory and address driver, clock driver, or bus-oriented transmitter/ receiver. Features n Non-inverting buffers n Output sink capability of 48 mA, source capability of 24 mA n Output switching specified for both 50 pF and 250 pF loads n Guaranteed simultaneous switching, noise level and dynamic threshold performance n Guaranteed latchup protection n High impedance glitch free bus loading during entire power up and power down cycle n Nondestructive hot insertion capability n Disable time less than enable time to avoid bus contention n Standard Microcircuit Drawing (SMD) 5962-9214701 Ordering Code Military Package Package Description Number 54ABT244J-QML J20A 20-Lead Ceramic Dual-In-Line 54ABT244W-QML W20A 20-Lead Cerpack 54ABT244E-QML E20A 20-Lead Ceramic Leadless Chip Carrier, Type C Connection Diagrams Pin Assignment for DIP and Flatpak Pin Assignment for LCC DS100203-2 DS100203-1 Pin Names OE1, OE2 Description Output Enable Input (Active Low) I0–I7 Inputs O0–O7 Outputs Truth Table OE1 I0–3 O0–3 OE2 I4–7 H X Z H X O4–7 Z L H H L H H L L L L L L H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance TRI-STATE ® is a registered trademark of National Semiconductor Corporation. © 1998 National Semiconductor Corporation DS100203 www.national.com 54ABT244 Octal Buffer/Line Driver with TRI-STATE Outputs July 1998 Absolute Maximum Ratings (Note 1) Current Applied to Output in LOW State (Max) DC Latchup Source Current Over Voltage Latchup (I/O) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias Ceramic VCC Pin Potential to Ground Pin Input Voltage (Note 2) Input Current (Note 2) Voltage Applied to Any Output in the Disabled or Power-Off State in the HIGH State −65˚C to +150˚C −55˚C to +125˚C twice the rated IOL (mA) −500 mA 10V Recommended Operating Conditions −55˚C to +175˚C −0.5V to +7.0V −0.5V to +7.0V −30 mA to +5.0 mA Free Air Ambient Temperature Military Supply Voltage Military Minimum Input Edge Rate Data Input Enable Input −0.5V to 5.5V −0.5V to VCC −55˚C to +125˚C +4.5V to +5.5V (∆V/∆t) 50 mV/ns 20 mV/ns DC Electrical Characteristics Symbol Parameter ABT244 Min Typ VIH Input HIGH Voltage VIL Input LOW Voltage VCD Input Clamp Diode Voltage VOH Output HIGH Voltage VOL Output LOW Voltage IIH Input HIGH Current Units VCC 2.0 V Recognized HIGH Signal 0.8 V −1.2 V Recognized LOW Signal IIN = −18 mA Min 54ABT 2.5 V Min 54ABT 2.0 V Min 54ABT 0.55 V Min 5 µA Max 5 IBVI Input HIGH Current Breakdown Test 7 µA Max IIL Input LOW Current −5 µA Max V 0.0 −5 VID Input Leakage Test Conditions Max 4.75 IOH = −3 mA IOH = −24 mA IOL = 48 mA VIN = 2.7V (Note 4) VIN = VCC VIN = 7.0V VIN = 0.5V (Note 4) VIN = 0.0V IID = 1.9 µA All Other Pins Grounded VOUT = 2.7V; OEn = 2.0V IOZH Output Leakage Current 50 µA 0 − 5.5V IOZL Output Leakage Current −50 µA 0 − 5.5V IOS Output Short-Circuit Current −275 mA Max ICEX Output High Leakage Current 50 µA Max IZZ Bus Drainage Test 100 µA 0.0 ICCH Power Supply Current 50 µA Max All Outputs HIGH ICCL Power Supply Current 30 mA Max ICCZ Power Supply Current 50 µA Max All Outputs LOW OEn = VCC; ICCT Additional ICC/Input Outputs Enabled 2.5 mA Max All Others at VCC or Ground VI = VCC − 2.1V Outputs TRI-STATE 2.5 mA Outputs TRI-STATE 50 µA −100 VOUT = 0.5V; OEn = 2.0V VOUT = 0.0V VOUT = VCC VOUT = 5.5V; All Others GND Enable Input VI = VCC − 2.1V Data Input VI = VCC − 2.1V All Others at VCC or Ground ICCD Dynamic ICC No Load mA/ (Note 4) 0.1 MHz Max Outputs Open OEn = GND, (Note 3) One Bit Toggling, 50% Duty Cycle Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Note 3: For 8 bits toggling, ICCD < 0.8 mA/MHz. Note 4: Guaranteed, but not tested. www.national.com 2 AC Electrical Characteristics Symbol Parameter 54ABT TA = −55˚C to +125˚C VCC = 4.5V–5.5V Units Fig. No. ns Figure 5 ns Figure 4 ns Figure 4 CL = 50 pF Min Max tPLH Propagation Delay 1.0 5.3 tPHL Data to Outputs 1.0 5.0 tPZH Output Enable 0.8 6.5 tPZL Time 1.2 7.9 tPHZ Output Disable 1.2 7.6 tPLZ Time 1.0 7.9 Capacitance Symbol Parameter Typ Units CIN Input Capacitance 5.0 pF COUT (Note 5) Output Capacitance 9.0 pF Conditions TA = 25˚C VCC = 0V VCC = 5.0V Note 5: COUT is measured at frequency f = 1 MHz, per MIL-STD-883B, Method 3012. tPLH vs Temperature (TA) CL = 50 pF, 1 Output Switching tPHL vs Temperature (TA) CL = 50 pF, 1 Output Switching DS100203-11 DS100203-12 Dashed lines represent design characteristics; for specified guarantees refer to AC Characteristics Table. 3 www.national.com Capacitance (Continued) tPLH vs Load Capacitance 1 Output Switching, TA = 25˚C tPHL vs Load Capacitance 1 Output Switching, TA = 25˚C DS100203-13 DS100203-14 tPLH vs Load Capacitance 8 Outputs Switching, TA = 25˚C tPHL vs Load Capacitance 8 Outputs Switching, TA = 25˚C DS100203-15 DS100203-16 tPZL vs Temperature (TA) CL = 50 pF, 1 Output Switching tPLZ vs Temperature (TA) CL = 50 pF, 1 Output Switching DS100203-17 DS100203-18 Dashed lines represent design characteristics; for specified guarantees refer to AC Characteristics Table. www.national.com 4 Capacitance (Continued) tPZH vs Temperature (TA) CL = 50 pF, 1 Output Switching tPHZ vs Temperature (TA) CL = 50 pF, 1 Output Switching DS100203-19 DS100203-20 tPZH vs Temperature (TA) CL = 50 pF, 8 Outputs Switching tPHZ vs Temperature (TA) CL = 50 pF, 8 Outputs Switching DS100203-21 DS100203-22 tPZL vs Temperature (TA) CL = 50 pF, 8 Outputs Switching tPLZ vs Temperature (TA) CL = 50 pF, 8 Outputs Switching DS100203-23 DS100203-24 Dashed lines represent design characteristics; for specified guarantees refer to AC Characteristics Table. 5 www.national.com Capacitance (Continued) tPZL vs Load Capacitance 8 Outputs Switching TA = 25˚C tPZH vs Load Capacitance 8 Outputs Switching TA = 25˚C DS100203-25 DS100203-26 tPLH and tPHL vs Number Outputs Switching VCC = 5.0V, TA = 25˚C, CL = 50 pF ICC vs Frequency, Average, TA = 25˚C, All Outputs Unloaded/Unterminated DS100203-27 DS100203-28 Dashed lines represent design characteristics; for specified guarantees refer to AC Characteristics Table. www.national.com 6 AC Loading AC Waveforms DS100203-6 FIGURE 4. TRI-STATE Output HIGH and LOW Enable and Disable Times DS100203-3 *Includes jig and probe capacitance FIGURE 1. Standard AC Test Load DS100203-7 FIGURE 5. Propagation Delay Waveforms for Inverting and Non-Inverting Functions DS100203-5 FIGURE 2. Test Input Signal Levels Amplitude Rep. Rate tW tr tf 3.0V 1 MHz 500 ns 2.5 ns 2.5 ns FIGURE 3. Test Input Signal Requirements 7 www.national.com 8 Physical Dimensions inches (millimeters) unless otherwise noted 20-Terminal Ceramic Chip Carrier (L) NS Package Number E20A 20-Lead Ceramic Dual-In-Line (D) NS Package Number J20A 9 www.national.com 54ABT244 Octal Buffer/Line Driver with TRI-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Ceramic Flatpak (F) NS Package Number W20A LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into sonably expected to cause the failure of the life support the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness. ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 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