NSC 54ABT373

54ABT373
Octal Transparent Latch with TRI-STATE ® Outputs
General Description
The ’ABT373 consists of eight latches with TRI-STATE outputs for bus organized system applications. The flip-flops appear transparent to the data when Latch Enable (LE) is
HIGH. When LE is LOW, the data that meets the setup times
is latched. Data appears on the bus when the Output Enable
(OE) is LOW. When OE is HIGH the bus output is in the high
impedance state.
Features
n Guaranteed multiple output switching specifications
n Output switching specified for both 50 pF and 250 pF
loads
n Guaranteed simultaneous switching, noise level and
dynamic threshold performance
n Guaranteed latchup protection
n High impedance glitch free bus loading during entire
power up and power down
n Nondestructive hot insertion capability
n Standard Microcircuit Drawing (SMD) 5962-9321801
n TRI-STATE outputs for bus interfacing
n Output sink capability of 48 mA, source capability of
24 mA
Ordering Code
Military
Package Number
Package Description
54ABT373J-QML
J20A
20-Lead Ceramic Dual-In-Line
54ABT373W-QML
W20A
20-Lead Cerpack
54ABT373E-QML
E20A
20-Lead Ceramic Leadless Chip Carrier, Type C
Connection Diagrams
Pin Assignment
for DIP and Flatpak
Pin Assignment
for LCC
DS100206-2
DS100206-1
Pin Names
Description
D0–D7
Data Inputs
LE
Latch Enable Input
OE
Output Enable Input
O0–O7
TRI-STATE Latch
(Active HIGH)
(Active LOW)
Outputs
TRI-STATE ® is a registered trademark of National Semiconductor Corporation.
© 1998 National Semiconductor Corporation
DS100206
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54ABT373 Octal Transparent Latch with TRI-STATE Outputs
July 1998
Functional Description
Truth Table
The ’ABT373 contains eight D-type latches with TRI-STATE
output buffers. When the Latch Enable (LE) input is HIGH,
data on the Dn inputs enters the latches. In this condition the
latches are transparent, i.e., a latch output will change state
each time its D input changes. When LE is LOW, the latches
store the information that was present on the D inputs a
setup time preceding the HIGH-to-LOW transition of LE. The
TRI-STATE buffers are controlled by the Output Enable (OE)
input. When OE is LOW, the buffers are in the bi-state mode.
When OE is HIGH the buffers are in the high impedance
mode but this does not interfere with entering new data into
the latches.
Inputs
Output
LE
OE
Dn
On
H
L
H
H
H
L
L
L
L
L
X
On (no change)
X
H
X
Z
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Z = High Impedance State
Logic Diagram
DS100206-3
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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2
Absolute Maximum Ratings (Note 1)
Over Voltage Latchup (I/O)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Storage Temperature
Ambient Temperature under Bias
Junction Temperature under Bias
Ceramic
VCC Pin Potential to
Ground Pin
Input Voltage (Note 2)
Input Current (Note 2)
Voltage Applied to Any Output
in the Disabled or
Power-Off State
in the HIGH State
Current Applied to Output
in LOW State (Max)
10V
Recommended Operating
Conditions
−65˚C to +150˚C
−55˚C to +125˚C
Free Air Ambient Temperature
Military
Supply Voltage
Military
Minimum Input Edge Rate
Data Input
Enable Input
−55˚C to +175˚C
−0.5V to +7.0V
−0.5V to +7.0V
−30 mA to +5.0 mA
−55˚C to +125˚C
+4.5V to +5.5V
(∆V/∆t)
50 mV/ns
20 mV/ns
Note 1: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under these
conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
−0.5V to +5.5V
−0.5V to VCC
twice the rated IOL (mA)
DC Electrical Characteristics
Symbol
Parameter
ABT373
Min
Typ
Units
VCC
Conditions
Max
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
0.8
V
VCD
Input Clamp Diode Voltage
−1.2
V
Min
IIN = −18 mA
VOH
Output HIGH Voltage
V
Min
IOH = −24 mA
VOL
Output LOW Voltage
IIH
Input HIGH Current
2.0
54ABT
2.5
54ABT
2.0
V
Recognized HIGH Signal
Recognized LOW Signal
IOH = −3 mA
54ABT
0.55
V
Min
IOL = 48 mA
5
µA
Max
VIN = 2.7V (Note 4)
7
µA
Max
VIN = 7.0V
−5
µA
Max
VIN = 0.5V (Note 4)
V
0.0
VIN = VCC
5
IBVI
Input HIGH Current Breakdown Test
IIL
Input LOW Current
VIN = 0.0V
−5
VID
Input Leakage Test
4.75
IID = 1.9 µA
All Other Pins Grounded
VOUT = 2.7V; OE = 2.0V
IOZH
Output Leakage Current
50
µA
0 − 5.5V
IOZL
Output Leakage Current
−50
µA
0 − 5.5V
IOS
Output Short-Circuit Current
−275
mA
Max
VOUT = 0.0V
ICEX
Output High Leakage Current
50
µA
Max
VOUT = VCC
IZZ
Bus Drainage Test
100
µA
0.0
VOUT = 5.5V; All Others GND
ICCH
Power Supply Current
50
µA
Max
All Outputs HIGH
ICCL
Power Supply Current
30
mA
Max
All Outputs LOW
ICCZ
Power Supply Current
50
µA
Max
−100
VOUT = 0.5V; OE = 2.0V
OE = VCC
All Others at VCC or GND
ICCT
Additional ICC/Input
Outputs Enabled
2.5
mA
Outputs TRI-STATE
2.5
mA
Outputs TRI-STATE
2.5
mA
VI = VCC − 2.1V
Max
Enable Input VI = VCC − 2.1V
Data Input VI = VCC − 2.1V
All Others at VCC or GND
ICCD
Dynamic ICC
No Load
mA/
(Note 4)
0.12
MHz
Max
Outputs Open, LE = VCC
OE = GND, (Note 3)
One Bit Toggling, 50% Duty Cycle
Note 3: For 8 bits toggling, ICCD < 0.8 mA/MHz.
Note 4: Guaranteed, but not tested.
3
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AC Electrical Characteristics
Symbol
Parameter
54ABT
TA = −55˚C to +125˚C
VCC = 4.5V to 5.5V
Units
CL = 50 pF
Min
Max
tPLH
Propagation Delay
1.0
6.8
tPHL
Dn to On
1.0
7.0
tPLH
Propagation Delay
1.0
7.7
tPHL
LE to On
1.5
7.7
tPZH
Output Enable Time
tPZL
tPHZ
Output Disable Time
tPLZ
1.0
6.7
1.5
7.2
1.7
8.0
1.0
7.0
ns
ns
ns
ns
AC Operating Requirements
Symbol
Parameter
54ABT
TA = −55˚C to +125˚C
VCC = 4.5V to 5.5V
Units
CL = 50 pF
Min
ts(H)
Setup Time, HIGH
2.5
ts(L)
or LOW Dn to LE
2.5
th(H)
Hold Time, HIGH
2.5
th(L)
or LOW Dn to LE
2.5
Pulse Width,
3.3
tw(H)
Max
ns
ns
ns
LE HIGH
Capacitance
Symbol
Parameter
Typ
Units
CIN
Input Capacitance
5
pF
Conditions
(TA = 25˚C)
VCC = 0V
COUT (Note 5)
Output Capacitance
9
pF
VCC = 5.0V
Note 5: COUT is measured at frequency f = 1 MHz, per MIL-STD-883B, Method 3012.
tPLH vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Data to Output
tPHL vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Data to Output
DS100206-11
DS100206-12
Dashed lines represent design characteristics; for specified guarantees, refer to AC Characteristics Tables.
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4
Capacitance
(Continued)
tPZH vs Temperature (TA)
CL = 50 pF, 1 Output Switching
OE to Output
tPZL vs Temperature (TA)
CL = 50 pF, 1 Output Switching
OE to Output
DS100206-13
DS100206-14
tPHZ vs Temperature (TA)
CL = 50 pF, 1 Output Switching
OE to Output
tPLZ vs Temperature (TA)
CL = 50 pF, 1 Output Switching
OE to Output
DS100206-15
DS100206-16
tSET LOW vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Data to LE
tSET HIGH vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Data to LE
DS100206-17
DS100206-18
Dashed lines represent design characteristics; for specified guarantees, refer to AC Characteristics Tables.
5
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Capacitance
(Continued)
tHOLD HIGH vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Data to LE
tHOLD LOW vs Temperature (TA)
CL = 50 pF, 1 Output Switching
Data to LE
DS100206-19
DS100206-20
tPLH vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
Data to Output
tPHL vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
Data to Output
DS100206-21
DS100206-22
tPZH vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
OE to Output
tPZL vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
OE to Output
DS100206-23
DS100206-24
Dashed lines represent design characteristics; for specified guarantees, refer to AC Characteristics Tables.
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6
Capacitance
(Continued)
tPHZ vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
OE to Output
tPLZ vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
OE to Output
DS100206-25
DS100206-26
tPLH vs Load Capacitance
TA = 25˚C, 1 Output Switching
Data to Output
tPHL vs Load Capacitance
TA = 25˚C, 1 Output Switching
Data to Output
DS100206-27
DS100206-28
tPLH vs Load Capacitance
TA = 25˚C, 8 Outputs Switching
Data to Output
tPHL vs Load Capacitance
TA = 25˚C, 8 Outputs Switching
Data to Output
DS100206-29
DS100206-30
Dashed lines represent design characteristics; for specified guarantees, refer to AC Characteristics Tables.
7
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Capacitance
(Continued)
tPZH vs Load Capacitance
TA = 25˚C, 8 Outputs Switching
OE to Output
tPZL vs Load Capacitance
TA = 25˚C, 8 Outputs Switching
OE to Output
DS100206-31
DS100206-32
tPLH vs Temperature (TA)
CL = 50 pF, 1 Output Switching
LE to Output
tPHL vs Temperature (TA)
CL = 50 pF, 1 Output Switching
LE to Output
DS100206-35
DS100206-36
tPLH vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
LE to Output
tPHL vs Temperature (TA)
CL = 50 pF, 8 Outputs Switching
LE to Output
DS100206-37
DS100206-38
Dashed lines represent design characteristics; for specified guarantees, refer to AC Characteristics Tables.
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8
Capacitance
(Continued)
Typical ICC vs Output Switching Frequency
CL = 0 pF, VCC = VIH = 5.5V, LE = GND,
1 Output Switching at 50% Duty Cycle
Data to Output, Transparent Mode with
Unused Data Inputs = VIH
tPLH and tPHL vs Number Outputs Switching
CL = 50 pF, TA = 25˚C, VCC = 5.0V,
Outputs In Phase Data to Output
DS100206-33
DS100206-34
Dashed lines represent design characteristics; for specified guarantees, refer to AC Characteristics Tables.
9
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AC Loading
DS100206-5
DS100206-4
FIGURE 5. Propagation Delay,
Pulse Width Waveforms
*Includes jig and probe capacitance
FIGURE 1. Standard AC Test Load
DS100206-7
FIGURE 6. TRI-STATE Output HIGH
and LOW Enable and Disable Times
DS100206-6
FIGURE 2. Test Input Signal Levels
Amplitude
Rep. Rate
tw
tr
tf
3.0V
1 MHz
500 ns
2.5 ns
2.5 ns
FIGURE 3. Test Input Signal Requirements
DS100206-9
FIGURE 7. Setup Time, Hold Time
and Recovery Time Waveforms
DS100206-8
FIGURE 4. Propagation Delay Waveforms for
Inverting and Non-Inverting Functions
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10
11
Physical Dimensions
inches (millimeters) unless otherwise noted
20-Terminal Ceramic Chip Carrier (L)
NS Package Number E20A
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12
Physical Dimensions
inches (millimeters) unless otherwise noted (Continued)
20-Lead Ceramic Dual-In-Line (D)
NS Package Number J20A
20-Lead Ceramic Flatpak (F)
NS Package Number W20A
13
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54ABT373 Octal Transparent Latch with TRI-STATE Outputs
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ure to perform when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
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