54AC00 • 54ACT00 Quad 2-Input NAND Gate General Description The ’AC/’ACT00 contains four 2-input NAND gates. Features n Outputs source/sink 24 mA n ’ACT00 has TTL-compatible inputs n Standard Microcircuit Drawing (SMD) — ’AC00: 5962-87549 — ’ACT00: 5962-87699 n ICC reduced by 50% Logic Symbol Connection Diagrams IEEE/IEC Pin Assignment for DIP and Flatpak DS100257-3 DS100257-1 Pin Names Pin Assignment for LCC Description An, Bn Inputs On Outputs DS100257-2 FACT ® is a registered trademark of Fairchild Semiconductor Corporation. © 1998 National Semiconductor Corporation DS100257 www.national.com 54AC00 • 54ACT00 Quad 2-Input NAND Gate August 1998 Absolute Maximum Ratings (Note 1) Recommended Operating Conditions If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Supply Voltage (VCC) DC Input Diode Current (IIK) VI = −0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = −0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) Junction Temperature (TJ) CDIP Supply Voltage (VCC) ’AC ’ACT Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) 54AC/ACT Minimum Input Edge Rate (∆V/∆t) ’AC Devices VIN from 30% to 70% of VCC VCC @ 3.3V, 4.5V, 5.5V Minimum Input Edge Rate (∆V/∆t) ’ACT Devices VIN from 0.8V to 2.0V VCC @ 4.5V, 5.5V −0.5V to +7.0V −20 mA +20 mA −0.5V to VCC + 0.5V −20 mA +20 mA −0.5V to VCC + 0.5V ± 50 mA ± 50 mA −65˚C to +150˚C 2.0V to 6.0V 4.5V to 5.5V 0V to VCC 0V to VCC −55˚C to +125˚C 125 mV/ns 125 mV/ns Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recommend operation of FACT ® circuits outside databook specifications. 175˚C DC Characteristics for ’AC Family Devices Symbol Parameter VCC 54AC TA = (V) −55˚C to +125˚C Units Conditions Guaranteed Limits VIH VIL VOH Minimum High Level 3.0 2.1 Input Voltage 4.5 3.15 5.5 3.85 Maximum Low Level 3.0 0.9 Input Voltage 4.5 1.35 5.5 1.65 Minimum High Level 3.0 2.9 Output Voltage 4.5 4.4 5.5 5.4 VOUT = 0.1V V or VCC − 0.1V V or VCC − 0.1V VOUT = 0.1V IOUT = −50 µA V (Note 2) VIN = VIL or VIH VOL 3.0 2.4 4.5 3.7 5.5 4.7 Maximum Low Level 3.0 0.1 Output Voltage 4.5 0.1 5.5 0.1 IOH = −12 mA V IOH = −24 mA IOH = −24 mA IOUT = 50 µA V (Note 2) VIN = VIL or VIH IIN Maximum Input 3.0 0.5 4.5 0.5 IOL = 12 mA V IOL = 24 mA IOL = 24 mA VI = VCC, GND 5.5 0.5 5.5 ± 1.0 µA Leakage Current Minimum Dynamic Output Current (Note 4) 5.5 50 mA IOHD 5.5 −50 mA VOLD = 1.65V Max VOHD = 3.85V Min ICC Maximum Quiescent 5.5 40.0 µA VIN = VCC IOLD www.national.com 2 DC Characteristics for ’AC Family Devices Symbol Parameter (Continued) VCC 54AC TA = (V) −55˚C to +125˚C Units Conditions Guaranteed Limits Supply Current or GND Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C. DC Characteristics for ’ACT Family Devices Symbol Parameter VCC 54ACT TA = (V) −55˚C to +125˚C Units Conditions Guaranteed Limits VIH VIL VOH Minimum High Level 4.5 2.0 Input Voltage 5.5 2.0 Maximum Low Level 4.5 0.8 Input Voltage 5.5 0.8 Minimum High Level 4.5 4.4 Output Voltage 5.5 5.4 V VOUT = 0.1V V or VCC − 0.1V VOUT = 0.1V V or VCC − 0.1V IOUT = −50 µA (Note 6) VIN = VIL or VIH VOL 4.5 3.70 5.5 4.70 Maximum Low Level 4.5 0.1 Output Voltage 5.5 0.1 V IOH = −24 mA V IOH = −24 mA IOUT = 50 µA (Note 6) VIN = VIL or VIH IIN Maximum Input 4.5 0.50 5.5 0.50 V IOL = 24 mA ± 1.0 µA IOL = 24 mA VI = VCC, GND 5.5 5.5 1.6 mA VI = VCC − 2.1V Leakage Current ICCT Maximum ICC/Input Minimum Dynamic Output Current (Note 7) 5.5 50 mA IOHD 5.5 −50 mA VOLD = 1.65V Max VOHD = 3.85V Min ICC Maximum Quiescent 5.5 40.0 µA VIN = VCC IOLD Supply Current or GND Note 6: All outputs loaded; thresholds on input associated with output under test. Note 7: Maximum test duration 2.0 ms, one output loaded at a time. Note 8: ICC for 54ACT @ 25˚C is identical to 74ACT @ 25˚C. 3 www.national.com AC Electrical Characteristics 54AC TA = −55˚C VCC Symbol Parameter (V) (Note 9) tPLH Propagation Delay tPHL Propagation Delay Fig. to +125˚C CL = 50 pF Units Min Max 3.3 1.0 11.0 5.0 1.5 8.5 3.3 1.0 9.0 5.0 1.5 7.0 No. ns ns Note 9: Voltage Range 3.3 is 3.3V ± 0.3V Voltage Range 5.0 is 5.0V ± 0.5V AC Electrical Characteristics 54ACT TA = −55˚C VCC Symbol Parameter (V) Fig. to +125˚C CL = 50 pF (Note 10) Units Min Max tPLH Propagation Delay 5.0 1.5 9.5 ns tPHL Propagation Delay 5.0 1.5 8.0 ns Note 10: Voltage Range 5.0 is 5.0V ± 0.5V Capacitance Symbol CIN CPD Parameter Typ Units Input Capacitance 4.5 pF Power Dissipation 30.0 pF Conditions VCC = Open VCC = 5.0V Capacitance www.national.com 4 No. Physical Dimensions inches (millimeters) unless otherwise noted 20 Terminal Ceramic Leadless Chip Carrier (L) NS Package Number E20A 14 Lead Ceramic Dual-In-Line Package (D) NS Package Number J14A 5 www.national.com 54AC00 • 54ACT00 Quad 2-Input NAND Gate Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14 Lead Ceramic Flatpak (F) NS Package Number W14B LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. 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