ETC UPD4632312F9-BE95X-BT3

DATA SHEET
MOS INTEGRATED CIRCUIT
µPD4632312-X
32M-BIT CMOS MOBILE SPECIFIED RAM
2M-WORD BY 16-BIT
EXTENDED TEMPERATURE OPERATION
Description
The µPD4632312-X is a high speed, low power, 33,554,432 bits (2,097,152 words by 16 bits) CMOS mobile
specified RAM featuring low power static RAM compatible function and pin configuration.
The µPD4632312-X is fabricated with advanced CMOS technology using one-transistor memory cell.
The µPD4632312-X is packed in 77-pin TAPE FBGA.
Features
• 2,097,152 words by 16 bits organization
• Fast access time: 85, 95, 105 ns (MAX.)
• Fast page access time: 35, 40, 45 ns (MAX.)
• Byte data control: /LB (I/O0 - I/O7), /UB (I/O8 - I/O15)
• Low voltage operation
(B version: VCC = 2.6 to 3.1 V,
C version: VCC = 2.3 to 2.7 V,
BE version: VCC = 2.6 to 3.1 V (Chip), VCCQ = 1.65 to 1.95 V (I/O),
CE version: VCC = 2.3 to 2.7 V (Chip), VCCQ = 1.65 to 1.95 V (I/O))
• Operating ambient temperature: TA = –25 to +85 °C
• Output Enable input for easy application
• Chip Enable input: /CS pin
• Standby Mode input: MODE pin
• Standby Mode1: Normal standby (Memory cell data hold valid)
• Standby Mode2: Density of memory cell data hold is variable
Product name
µPD4632312-BxxX
Access
Operating
time
supply voltage
ns (MAX.)
V
80
Note
Operating
ambient
Supply current
At standby µA (MAX.)
At operating
temperature mA (MAX.)
Chip
I/O
°C
2.7 to 3.1
–
–25 to +85
85
2.6 to 3.1
µPD4632312-CxxX
95
2.3 to 2.7
µPD4632312-BExxX
95
2.6 to 3.1 1.65 to 1.95
µPD4632312-CExxX
105
2.3 to 2.7
Density of data hold
32M bits 16M bits 8M bits 4M bits
35
100
70
60
50
0M bit
10
Note Under Development
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. M15406EJ7V0DS00 (7th edition)
Date Published March 2002 NS CP (K)
Printed in Japan
The mark ★ shows major revised points.
©
2001
µPD4632312-X
Ordering Information
Part number
Package
Access time
Operating
Operating
ns (MAX.)
supply voltage
temperature
V
°C
Chip
I/O
85
2.6 to 3.1
–
µPD4632312F9-C95X-BT3
95
2.3 to 2.7
µPD4632312F9-BE95X-BT3
95
2.6 to 3.1
µPD4632312F9-CE10X-BT3
105
2.3 to 2.7
µPD4632312F9-B85X-BT3
2
77-pin TAPE FBGA (12 x 7)
Data Sheet M15406EJ7V0DS
–25 to +85
Remark
B version
C version
1.65 to 1.95
BE version
CE version
µPD4632312-X
Pin Configuration
/xxx indicates active low signal.
77-pin TAPE FBGA (12 x 7)
[µPD4632312F9-BxxX-BT3]
[µPD4632312F9-CxxX-BT3]
[µPD4632312F9-BExxX-BT3]
[µPD4632312F9-CExxX-BT3]
Top View
Bottom View
8
7
6
5
4
3
2
1
A B C D E F G H J K L M N P
P N M L K J H G F E D C B A
Top View
E
F
G
H
J
K
A15
NC
NC
A16
NC
GND
A11
A12
A13
A14
NC
I/O15
I/O7
I/O14
6
A8
A19
A9
A10
I/O6
I/O13
I/O12
I/O5
5
/WE
MODE
A20
I/O4
VCC
VCCQ
4
NC
NC
NC
I/O3
NC
I/O11
3
/LB
/UB
A18
A17
I/O1
I/O9
I/O10
I/O2
A7
A6
A5
A4
GND
/OE
I/O0
A3
A2
A1
A0
NC
/CS
8
A
B
C
NC
NC
NC
NC
NC
7
2
1
NC
NC
NC
NC
NC
D
L
M
N
P
NC
NC
NC
NC
NC
I/O8
NC
NC
NC
NC
NC
A0 - A20
: Address inputs
/LB, /UB
: Byte data select
I/O0 - I/O15
: Data inputs / outputs
VCC
: Power supply
/CS
: Chip Select
VCCQ
MODE
: Standby mode
GND
/WE
: Write enable
/OE
: Output enable
NC
Note1
Note2
NC
: Input / Output power supply
: Ground
: No Connection
Notes 1. B, C version : NC
2. Some signals can be applied because this pin is not internally connected.
Remark Refer to Package Drawing for the index mark.
Data Sheet M15406EJ7V0DS
3
µPD4632312-X
Block Diagram
Standby mode control
VCC
Refresh
control
VCCQ Note
GND
Memory cell array
33,554,432 bits
Refresh
counter
A0
A20
Row
decoder
Address
buffer
I/O0 - I/O7
I/O8 - I/O15
Input data
controller
Sense amplifier / Switching circuit
Column decoder
Address buffer
/CS
MODE
/LB
/UB
/WE
/OE
Note BE, CE versions only.
4
Data Sheet M15406EJ7V0DS
Output data
controller
µPD4632312-X
Truth Table
/CS
MODE
/OE
/WE
/LB
/UB
Mode
H
H
×
×
×
×
Not selected (Standby Mode 1)
H
L
×
×
×
×
L
H
H
H
×
×
L
H
L
L
H
L
Upper byte read
High impedance
DOUT
H
H
Output disable
High impedance
High impedance
×
L
Not selected (Standby Mode 2)
I/O
Note1
Supply
I/O0 - I/O7
I/O8 - I/O15
current
High impedance
High impedance
ISB1
High impedance
High impedance
ISB2
Output disable
High impedance
High impedance
ICCA
L
Word read
DOUT
DOUT
H
Lower byte read
DOUT
High impedance
L
L
Word write
DIN
DIN
L
H
Lower byte write
DIN
High impedance
H
L
Upper byte write
High impedance
DIN
H
H
Write-abort Note2
High impedance
High impedance
Caution MODE pin must be fixed to High except Standby Mode 2.
Notes 1. During normal operation, make /CS = VIH, MODE = VIL, the device enters the Standby Mode 2. However,
make /CS = VIH or VIL, and MODE = VIL at power application, the device enters the Standby Mode 2.
2. Write data can not be written to the memory cell.
Remark ×: VIH or VIL, H: VIH, L: VIL,
Data Sheet M15406EJ7V0DS
5
µPD4632312-X
CONTENTS
1. Initialization ..................................................................................................................................................................7
2. Partial Refresh ..............................................................................................................................................................8
2.1 Standby Mode..........................................................................................................................................................8
2.2 Density Switching.....................................................................................................................................................8
2.3 Standby Mode Status Transition..............................................................................................................................8
2.4 Addresses for Which Partial Refresh Is Supported ................................................................................................9
3. Page Read Operation ................................................................................................................................................10
3.1 Features of Page Read Operation ........................................................................................................................10
3.2 Page Length .........................................................................................................................................................10
3.3 Page-Corresponding Addresses............................................................................................................................10
3.4 Page Start Address...............................................................................................................................................10
3.5 Page Direction ......................................................................................................................................................10
3.6 Interrupt during Page Read Operation..................................................................................................................10
3.7 Eight-Word Start Page Read Operation Prohibition .............................................................................................10
3.8 Cautions for Eight-Word Page Read Operation....................................................................................................11
4. Mode Register Settings...............................................................................................................................................12
4.1 Mode Register Setting Method .............................................................................................................................12
4.2 Cautions for Setting Mode Register ......................................................................................................................13
5. Electrical Specifications .............................................................................................................................................14
6. Timing Charts.............................................................................................................................................................21
7. Package Drawing .......................................................................................................................................................42
8. Recommended Soldering Conditions ........................................................................................................................43
9. Revision History .........................................................................................................................................................44
6
Data Sheet M15406EJ7V0DS
µPD4632312-X
1. Initialization
The µPD4632312-X is initialized in the power-on sequence according to the following.
(1) To stabilize internal circuits, before turning on the power, a 200 µs or longer wait time must precede any signal
toggling.
(2) After the wait time, read operation must be performed at least 3 times. After that, it can be normal operation.
Figure1-1. Initialization Timing Chart
VCC, VCCQ
VCC (MIN.)
VCCQ (MIN.)
Address (Input)
MODE (Input)
VIH (MIN.)
tRC
/CS (Input)
tCP
VIH (MIN.)
Power On Wait Time
Read Operation 3 times
200µ s
Normal
Operation
Cautions 1. Following power application, make MODE and /CS high level during the wait time interval.
2. Following power application, make MODE high level during the wait time and three read
operations.
3. The read operation must satisfy the specs described on page 17 (Read Cycle).
4. The address is don’t care (VIH or VIL) during read operation.
5. Read operation must be executed with toggled the /CS pin.
6. To prevent bus contention, it is recommended to set /OE to high level.
7. Do not input data to the I/O pins if /OE is low level during a read operation.
Data Sheet M15406EJ7V0DS
7
µPD4632312-X
2. Partial Refresh
2.1 Standby Mode
In addition to the regular standby mode (Standby Mode 1) with a 32M bits density, Standby Mode 2, which performs
partial refresh, is also provided.
2.2 Density Switching
In Standby Mode 2, the densities that can be selected for performing refresh are 16M bits, 8M bits, 4M bits, and 0M
bit.
The density for performing refresh can be set with the mode register. (For how to perform mode register settings,
refer to section 4. Mode Register Settings.)
2.3 Standby Mode Status Transition
In Standby Mode 1, both /CS and MODE are high level, and in Standby Mode 2, /CS is high level and MODE is low
level. In Standby Mode 2, if 0M bit is set as the density, it is necessary to perform initialization the same way as after
applying power, in order to return to normal operation from Standby Mode 2. When the density has been set to 16M
bits, 8M bits, or 4M bits in Standby Mode 2, it is not necessary to perform initialization to return to normal operation
from Standby Mode 2.
For the timing charts, refer to Figure 6-26. Standby Mode Timing Chart, Figure 6-27. Standby Mode 2 (Data
Invalid) Entry / Recovery Timing Chart.
8
Data Sheet M15406EJ7V0DS
µPD4632312-X
Figure 2-1. Standby Mode State Machine
Power On
/CS = VIH,
MODE = VIH
Wait time 200 µs
Dummy Read 3 times
Initial State
/CS = VIL
MODE = VIH
Active
/CS = VIH,
MODE = VIH
/CS = VIH,
MODE = VIL
/CS = VIL,
MODE = VIH
Standby Mode 1
/CS = VIH,
MODE = VIL
/CS = VIL,
MODE = VIH
/CS = VIH, MODE = VIL
Standby Mode 2
(16M bits / 8M bits
/ 4M bits)
/CS = VIH, MODE = VIL
Standby Mode 2
(Data Invalid)
2.4 Addresses for Which Partial Refresh Is Supported
Data hold density
Correspondence address
16M bits
000000H to 0FFFFFH
8M bits
000000H to 07FFFFH
4M bits
000000H to 03FFFFH
Data Sheet M15406EJ7V0DS
9
µPD4632312-X
3. Page Read Operation
3.1 Features of Page Read Operation
Features
4 Word Mode
8 Word Mode
Page length
4 words
8 words
Page read-corresponding addresses
A1, A0
A2, A1, A0
Page read start address
Don’t care
(A2, A1, A0) = (VIL, VIL, VIL)
Page direction
Don’t care
Sequential increment
Interrupt during page read operation
Enabled
Note
Prohibited
Note An interrupt is output when /CS = H or in case A2 or a higher address changes.
3.2 Page Length
Four words and eight words are supported as the page lengths. The page length is set with the Mode register. Once
the page length is set in the mode register, this setting is retained until it is set again.
(For how to perform mode register settings, refer to section 4. Mode Register Settings.)
3.3 Page-Corresponding Addresses
The four-word page read-enabled addresses are A1 and A0. Fix addresses other than A1 and A0 during four -word
page read. The eight-word page read-enabled addresses are A2, A1, and A0. Fix addresses other than A2, A1, and A0
during 8-word page read operation.
3.4 Page Start Address
Since random page read is supported for four-word pages, any address can be used as the page start address.
Random page read is not supported for eight-word pages. Since the page read start addresses are only (A2, A1, A0) =
(VIL, VIL, VIL), it is not possible to start page read from any address other than (A2, A1, A0) = (VIL, VIL, VIL).
3.5 Page Direction
Since random page read is possible for four-word pages, there is not restriction on the page direction.
Random page read is not supported for eight-word pages. The page direction in this case is sequential increment.
3.6 Interrupt during Page Read Operation
When generating an interrupt during four-word page read, either make /CS high level or change A2 and higher
addresses. Generating an interrupt during eight-word read is prohibited.
3.7 Eight-Word Start Page Read Operation Prohibition
When an eight-word page read has been started, starting a page read with write-modify-read is prohibited. To start
page read, do so from normal read.
Also, when an eight-word page read has been started, the /OE pin cannot be toggled.
For the timing chart, refer to Figure 6-9. 8 Words Page Read Start after Write Modify Read Cycle Timing Chart,
Figure 6-11. 8 Words 2 Continuous Read Cycles Timing Chart.
10
Data Sheet M15406EJ7V0DS
µPD4632312-X
3.8 Cautions for Eight-Word Page Read Operation
To perform normal read (A20 to A3: fixed) from normal read of (A2, A1, A0) = (VIL, VIL, VIL) to (A2, A1, A0) = (VIL, VIL,
VIH) with the eight-word page set with the mode register, be sure to toggle /OE for normal read (A2, A1, A0) = (VIL, VIL,
VIL). At this time, observe the /OE to address setup time (tOAS) and /OE pulse width (tOP) standard value.
When /OE is fixed to low level with normal read (A20 to A3: fixed) from normal read of (A2, A1, A0) = (VIL, VIL, VIL) to
(A2, A1, A0) = (VIL, VIL, VIH), eight-word page read starts.
Also, when performing a read operation to (A2, A1, A0) = (VIL, VIL, VIH) (A20 to A3 are fixed) from when (A2, A1, A0) =
(VIL, VIL, VIL) are in a write-abort state (/WE = L, however, write data cannot be written to the memory cell because /LB,
/UM = H), an 8-word page read operation is started.
For the timing chart, refer to Figure 6-6. 8 Words Page Read Cycle Timing Chart, Figure 6-12. 8 Words Normal
Read Cycle Timing Chart and Figure 6-13 8 Words Write-Abort to Read Cycle Timing Chart.
Data Sheet M15406EJ7V0DS
11
µPD4632312-X
4. Mode Register Settings
The page length and partial refresh density can be set using the mode register. Since the initial value of the mode
register at power application is undefined, be sure to set the mode register after initialization at power application.
When not using page read, set the mode register to random-accessible 4-word page read mode. When not using
partial refresh, set the mode register to any value. Partial refresh mode will not be entered unless /CS = H, MODE = L,
regardless of the register setting.
Once the page length and partial refresh density have been set in the mode register, these settings are retained until
they are set again, while applying the power supply. However, the mode register setting will become undefined if the
power is turned off, so set the mode register again after power application.
4.1 Mode Register Setting Method
The mode register setting mode can be entered by successively writing two specific data after two continuous reads
of the highest address (1FFFFFH). The mode register setting is a continuous four-cycle operation (two read cycles and
two write cycles).
Commands are written to the command register. The command register is used to latch the addresses and data
required for executing commands, and it does not have an exclusive memory area.
For the timing chart and flow chart, refer to Figure 6-24. Mode Register Setting Timing Chart, Figure 6-25. Mode
Register Setting Flow Chart.
Table 4-1. shows the commands and command sequences.
12
Data Sheet M15406EJ7V0DS
µPD4632312-X
Table 4-1. Command sequence
Command sequence
Partial refresh
1st bus cycle
2nd bus cycle
3rd bus cycle
4th bus cycle
(Read cycle)
(Read cycle)
(Write cycle)
(Write cycle)
Page length Address
Data
Address
Data
Address
Data
Address
Data
density
16M bits
8M bits
4M bits
0M bit
4 words
1FFFFFH

1FFFFFH

1FFFFFH
00H
1FFFFFH
00H
8 words
1FFFFFH

1FFFFFH

1FFFFFH
00H
1FFFFFH
04H
4 words
1FFFFFH

1FFFFFH

1FFFFFH
00H
1FFFFFH
01H
8 words
1FFFFFH

1FFFFFH

1FFFFFH
00H
1FFFFFH
05H
4 words
1FFFFFH

1FFFFFH

1FFFFFH
00H
1FFFFFH
02H
8 words
1FFFFFH

1FFFFFH

1FFFFFH
00H
1FFFFFH
06H
4 words
1FFFFFH

1FFFFFH

1FFFFFH
00H
1FFFFFH
03H
8 words
1FFFFFH

1FFFFFH

1FFFFFH
00H
1FFFFFH
07H
4th bus cycle (Write cycle)
I/O
15
14
13
12
11
10
9
8
7
6
5
4
3
2
Mode Register setting
0
0
0
0
0
0
0
0
0
0
0
0
0
PL
Page length
0
4 words
1
8 words
I/O1 I/O0
1
0
PD
Density
Partial refresh
0
0
16M bits
density
0
1
8M bits
1
0
4M bits
1
1
0M bit
4.2 Cautions for Setting Mode Register
Since, for the mode register setting, the internal counter status is judged by toggling /CS and /OE, toggle /CS at every
cycle during entry (read cycle twice, write cycle twice), and toggle /OE like /CS at the first and second read cycles.
If incorrect addresses or data are written, or if addresses or data are written in the incorrect order, the setting of the
mode register are not performed correctly.
When the highest address (1FFFFFH) is read consecutively three or more times, the mode register setting entries
are cancelled.
Once the page length and partial refresh density have been set in the mode register, these settings are retained until
they are set again.
For the timing chart and flow chart, refer to Figure 6-24. Mode Register Setting Timing Chart, Figure 6-25. Mode
Register Setting Flow Chart.
Data Sheet M15406EJ7V0DS
13
µPD4632312-X
5. Electrical Specifications
Absolute Maximum Ratings
Parameter
Symbol Condition
Supply voltage
Rating
µPD4632312-BxxX,
µPD4632312-BExxX,
µPD4632312-CxxX
µPD4632312-CExxX
–0.5 Note to +4.0
–0.5 Note to +4.0
VCC
Input / Output supply voltage
Unit
VCCQ
–
–0.5
Note
–0.5
to VCC + 0.4 (4.0 V MAX.) –0.5
Note
Note
V
to +4.0
V
to VCCQ + 0.4 (4.0 V MAX.)
V
Input / Output voltage
VT
Operating ambient temperature
TA
–25 to +85
–25 to +85
°C
Storage temperature
Tstg
–55 to +125
–55 to +125
°C
Note –1.0 V (MIN.) (Pulse width: 30 ns)
Caution Exposing the device to stress above those listed in Absolute Maximum Rating could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Recommended Operating Conditions
Parameter
µPD4632312
-BxxX
Symbol Condition
µPD4632312
-CxxX
µPD4632312
-BExxX
µPD4632312
-CExxX
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
Unit
Supply voltage
VCC
2.6
3.1
2.3
2.7
2.6
3.1
2.3
2.7
V
Input / Output
supply voltage
VCCQ
–
–
–
–
1.65
1.95
1.65
1.95
V
High level input voltage
VIH
0.8VCC
VCC+0.3
0.8VCC
Low level input voltage
VIL
–0.3 Note
0.2VCC
–0.3 Note
0.2VCC
Operating ambient
temperature
TA
–25
+85
–25
+85
VCC+0.3 0.8VCCQ VCCQ+0.3 0.8VCCQ VCCQ+0.3
V
–0.3 Note 0.2VCCQ –0.3 Note 0.2VCCQ
V
–25
+85
–25
+85
°C
Note –0.5 V (MIN.) (Pulse width: 30 ns)
Capacitance (TA = 25°°C, f = 1 MHz)
Parameter
Symbol
Test condition
MIN.
TYP.
MAX.
Unit
Input capacitance
CIN
VIN = 0 V
8
pF
Input / Output capacitance
CI/O
VI/O = 0 V
10
pF
Remarks 1. VIN: Input voltage
VI/O: Input / Output voltage
2. These parameters are not 100% tested.
14
Data Sheet M15406EJ7V0DS
µPD4632312-X
DC Characteristics (Recommended Operating Conditions Unless Otherwise Noted) (1/2)
Parameter
Symbol
Test condition
Density of
µPD4632312-BxxX,
data hold
µPD4632312-CxxX
MIN.
TYP.
Unit
MAX.
Input leakage current
ILI
VIN = 0 V to VCC
–1.0
+1.0
µA
I/O leakage current
ILO
VI/O = 0 V to VCC, /CS = VIH or
–1.0
+1.0
µA
35
mA
µA
/WE = VIL or /OE = VIH
Operating supply current
ICCA
/CS = VIL, Minimum cycle time,
II/O = 0 mA
Standby supply current
ISB1
/CS ≥ VCC − 0.2 V, MODE ≥ VCC − 0.2 V
32M bits
100
ISB2
/CS ≥ VCC − 0.2 V, MODE ≤ 0.2 V
16M bits
70
8M bits
60
4M bits
50
0M bit
10
High level output voltage
VOH
IOH = –0.5 mA
Low level output voltage
VOL
IOL = 1 mA
0.8VCC
V
0.2VCC
V
Remarks 1. VIN: Input voltage
VI/O: Input / Output voltage
2. These DC characteristics are in common regardless of product classifications.
DC Characteristics (Recommended Operating Conditions Unless Otherwise Noted) (2/2)
Parameter
Symbol
Test condition
Density of
µPD4632312-BExxX,
data hold
µPD4632312-CExxX
MIN.
TYP.
Unit
MAX.
Input leakage current
ILI
VIN = 0 V to VCCQ
–1.0
+1.0
µA
I/O leakage current
ILO
VI/O = 0 V to VCCQ, /CS = VIH or
–1.0
+1.0
µA
35
mA
µA
/WE = VIL or /OE = VIH
Operating supply current
ICCA
/CS = VIL, Minimum cycle time,
II/O = 0 mA
Standby supply current
ISB1
/CS ≥ VCC − 0.2 V, MODE ≥ VCC − 0.2 V
32M bits
100
ISB2
/CS ≥ VCC − 0.2 V, MODE ≤ 0.2 V
16M bits
70
8M bits
60
4M bits
50
0M bit
10
High level output voltage
VOH
IOH = –0.5 mA
Low level output voltage
VOL
IOL = 1 mA
0.8VCCQ
V
0.2VCCQ
V
Remarks 1. VIN: Input voltage
VI/O: Input / Output voltage
2. These DC characteristics are in common regardless of product classifications.
Data Sheet M15406EJ7V0DS
15
µPD4632312-X
AC Characteristics (Recommended Operating Conditions Unless Otherwise Noted)
AC Test Conditions
[ µPD4632312-B85X, µPD4632312-C95X ]
Input Waveform (Rise and Fall Time ≤ 5 ns)
Vcc
0.8Vcc
Vcc / 2
Test points
Vcc / 2
0.2Vcc
GND
5ns
Output Waveform
Vcc / 2
Test points
Vcc / 2
[ µPD4632312-BE95X, µPD4632312-CE10X ]
Input Waveform (Rise and Fall Time ≤ 5 ns)
VccQ
0.8VccQ
VccQ / 2
Test points
VccQ / 2
0.2VccQ
GND
5ns
Output Waveform
VccQ / 2
Test points
VccQ / 2
Output Load
AC characteristics directed with the note should be measured with the output load shown in Figure 5-1, Figure
5-2.
Figure 5-2. (BE, CE version)
Figure 5-1. (B, C version)
CL: 30 pF
CL: 30 pF
5 pF (tCLZ, tOLZ, tBLZ, tCHZ, tOHZ, tBHZ, tWHZ, tOW )
5 pF (tCLZ, tOLZ, tBLZ, tCHZ, tOHZ, tBHZ, tWHZ, tOW )
ZO = 50 Ω
ZO = 50 Ω
I/O (Output)
I/O (Output)
50 Ω
CL
VCC / 2
16
50 Ω
VCCQ / 2
Data Sheet M15406EJ7V0DS
CL
µPD4632312-X
Read Cycle
Parameter
Symbol
µPD4632312
µPD4632312
µPD4632312
µPD4632312
-B85X
-C95X
-BE95X
-CE10X
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
Unit
Note
Read cycle time
tRC
85
10,000
95
10,000
95
10,000
105
10,000
ns
1
Identical address read cycle time
tRC1
85
10,000
95
10,000
95
10,000
105
10,000
ns
2
15
ns
3
Address skew time
tSKEW
15
10
15
10
15
/CS pulse width
tCP
10
10
ns
Address access time
tAA
85
95
95
105
ns
/CS access time
tACS
85
95
95
105
ns
/OE to output valid
tOE
35
45
45
50
ns
/LB, /UB to output valid
tBA
35
45
45
50
ns
Output hold from address change
tOH
10
10
10
10
ns
/CS to output in low impedance
tCLZ
10
10
10
10
ns
/OE to output in low impedance
tOLZ
5
5
5
5
ns
/LB, /UB to output in low impedance
tBLZ
5
5
5
5
ns
/CS to output in high impedance
tCHZ
25
25
25
25
ns
/OE to output in high impedance
tOHZ
25
25
25
25
ns
/LB, /UB to output in high impedance
tBHZ
25
25
25
25
ns
4
5
Notes 1. One read cycle (tRC) must satisfy the minimum value (tRC(MIN.)) and maximum value (tRC(MAX.) = 10 µs). tRC
indicates the time from the /CS low level input point or address change start point, whichever is later, to the
/CS high level input point or the next address change start point, whichever is earlier. As a result, there are
the following four conditions for tRC.
1) Time from address change start point to /CS high level input point
(address access)
2) Time from address change start point to next address change start point
(address access)
3) Time from /CS low level input point to next address change start point
(/CS access)
4) Time from /CS low level input point to /CS high level input point
(/CS access)
2. The identical address read cycle time (tRC1) is the cycle time of one read operation when performing
continuous read operations toggling /OE , /LB, and /UB with the address fixed and /CS low level. Perform
settings so that the sum (tRC) of the identical address read cycle times (tRC1) is 10 µs or less.
3. tSKEW indicates the following three types of time depending on the condition.
1) When switching /CS from high level to low level, tSKEW is the time from the /CS low level input point until
the next address is determined.
2) When switching /CS from low level to high level, tSKEW is the time from the address change start point to
the /CS high level input point.
3) When /CS is fixed to low level, tSKEW is the time from the address change start point until the next address
is determined.
Since specs are defined for tSKEW only when /CS is active, tSKEW is not subject to limitations when /CS is
switched from high level to low level following address determination, or when the address is changed after
/CS is switched from low level to high level.
4. Regarding tAA and tACS, only tAA is satisfied during address access (refer to 1) and 2) of Note 1), and only tACS
is satisfied during /CS access (refer to 3) of Note 1).
5. Regarding tBA and tOE, only tBA is satisfied if /OE becomes active later than /UB and /LB, and only tOE is
satisfied if /UB and /LB become active before /OE.
Data Sheet M15406EJ7V0DS
17
µPD4632312-X
Page Read Cycle
Parameter
Symbol
µPD4632312
µPD4632312
µPD4632312
µPD4632312
-B85X
-C95X
-BE95X
-CE10X
MIN.
MAX.
40
MIN.
MAX.
45
MIN.
MAX.
MIN.
40
Unit
Note
MAX.
Page read cycle time
tPRC
45
ns
Page access time
tPAA
35
40
40
45
ns
Normal to page read cycle time
tNPRC
10,000
10,000
10,000
10,000
ns
1
/OE to address setup time
tOAS
–5
–5
–5
–5
ns
2
/OE pulse width
tOP
10
10
10
10
ns
Notes 1. Normal to page read cycle time (tNPRC) is the total cycle time for one 4 word page read and one 8 word page
read. Perform settings to that (tNPRC) is 10 µs or less.
2. /OE to address setup time (tOAS) and /OE pulse width (tOP) are effective only when 8 word page read is set.
(Refer to section 3.8. Cautions for Eight-Word Page Read Operation.)
Standby Mode Entry / Exit
Parameter
Symbol
MIN.
MAX.
/CS High to MODE Low
tCM
0
ns
MODE High to /CS Low
tMC
30
ns
Cautions 1. Make MODE and /CS high level during the wait time interval.
2. Make MODE high level during the wait time and three read operations.
3. The read operation must satisfy the specs described on page 17 (Read Cycle).
4. The address is don’t care (VIH or VIL) during read operation.
5. Read operation must be executed with toggled the /CS pin.
6. To prevent bus contention, it is recommended to set /OE to high level.
7. Do not input data to the I/O pins if /OE is low level during a read operation.
18
Data Sheet M15406EJ7V0DS
Unit
Note
µPD4632312-X
Write Cycle
Parameter
Symbol
µPD4632312
µPD4632312
µPD4632312
µPD4632312
-B85X
-C95X
-BE95X
-CE10X
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
MIN.
MAX.
Unit
Note
Write cycle time
tWC
85
10,000
95
10,000
95
10,000
105
10,000
ns
1
Identical address write cycle time
tWC1
85
10,000
95
10,000
95
10,000
105
10,000
ns
2
Address skew time
tSKEW
15
ns
3
/CS to end of write
tCW
40
50
50
55
ns
4
/LB, /UB to end of write
tBW
30
35
35
40
ns
Address valid to end of write
tAW
35
40
40
45
ns
Write pulse width
tWP
30
35
35
40
ns
Write recovery time
tWR
20
20
20
20
ns
/CS pulse width
tCP
10
10
10
10
ns
Address setup time
tAS
0
0
0
0
ns
Byte write hold time
tBWH
20
20
20
20
ns
Data valid to end of write
tDW
20
30
30
40
ns
Data hold time
tDH
0
0
0
0
ns
/OE to output in low impedance
tOLZ
5
5
5
5
ns
/WE to output in high impedance
tWHZ
25
25
25
25
ns
/OE to output in high impedance
tOHZ
25
25
25
25
ns
Output active from end of write
tOW
15
5
15
5
15
5
5
5
ns
Notes 1. One write cycle (tWC) must satisfy the minimum value (tWC(MIN.)) and the maximum value (tWC(MAX.) = 10 µs).
tWC indicates the time from the /CS low level input point or address change start point, whichever is after, to
the /CS high level input point or the next address change start point, whichever is earlier. As a result, there
are the following four conditions for tWC.
1) Time from address change start point to /CS high level input point
2) Time from address change start point to next address change start point
3) Time from /CS low level input point to next address change start point
4) Time from /CS low level input point to /CS high level input point
2. The identical address read cycle time (tWC1) is the cycle time of one write cycle when performing continuous
write operations with the address fixed and /CS low level, changing /LB and /UB at the same time, and
toggling /WE, as well as when performing a continuous write toggling /LB and /UB. Make settings so that the
sum (tWC) of the identical address write cycle times (tWC1) is 10 µs or less.
3. tSKEW indicates the following three types of time depending on the condition.
1) When switching /CS from high level to low level, tSKEW is the time from the /CS low level input point until
the next address is determined.
2) When switching /CS from low level to high level, tSKEW is the time from the address change start point to
the /CS high level input point.
3) When /CS is fixed to low level, tSKEW is the time from the address change start point until the next address
is determined.
Since specs are defined for tSKEW only when /CS is active, tSKEW is not subject to limitations when /CS is
switched from high level to low level following address determination, or when the address is changed after
/CS is switched from low level to high level.
Data Sheet M15406EJ7V0DS
19
µPD4632312-X
4. Definition of write start and write end
Write start pattern 1
/CS
/WE
/LB, /UB
Status
H to L
L
L
If /WE, /LB, /UB are low level, time when /CS
changes from high level to low level
Write start pattern 2
L
H to L
L
Write start pattern 3
L
L
H to L
If /CS, /LB, /UB are low level, time when /WE
changes from high level to low level
If /CS, /WE are low level, time when /LB or
/UB changes from high level to low level
Write end pattern 1
L
L to H
L
If /CS, /WE, /LB, /UB are low level, time when
/WE changes from low level to high level
Write end pattern 2
L
L
L to H
When /CS, /WE, /LB, /UB are low level, time
when /LB or /UB changes from low level to
high level
5. Definition of write end recovery time (tWR)
1) Time from write end to address change start point, or from write end to /CS high level input point
2) When /CS, /LB, /UB are low level and continuously written to the identical address, time from /WE high
level input point to /WE low level input point
3) When /CS, /WE are low level and continuously written to the identical address, time from /LB or /UB
high level input point, whichever is later, to /LB or /UB low level input point, whichever is earlier.
4) When /CS is low level and continuously written to the identical address, time from write end to point at
which /WE , /LB, or /UB starts to change from high level to low level, whichever is earliest.
Read Write Cycle
Parameter
Symbol
MIN.
MAX.
Unit
Note
10,000
ns
1, 2
Read write cycle time
tRWC
Byte write setup time
tBWS
20
ns
Byte read setup time
tBRS
20
ns
Notes 1. Make settings so that the sum (tRWC) of the identical address read cycle time (tRC1) and the identical address
write cycle time (tWC1) is 10 µs or less when a write is performed at the identical address using /UB following a
read using /LB with /CS low level, or when a write is performed using /LB following a read using /UB.
2. Make settings so that the sum (tRWC) of the identical address read cycle time (tRC1) and the identical address
write cycle time (tWC1) is 10 µs or less when a read is performed at the identical address using /UB following
a write using /LB with /CS low level, or when a read is performed using /LB following a write using /UB.
20
Data Sheet M15406EJ7V0DS
µPD4632312-X
6. Timing Charts
Figure 6-1. Read Cycle Timing Chart 1
tSKEW
tSKEW
Address (Input)
tCP
tRC
tCP
/CS (Input)
tACS
tCHZ
tCLZ
/OE (Input)
tOE
tOHZ
tOLZ
/LB, /UB (Input)
tBA
tBHZ
tBLZ
High impedance
I/O (Output)
tOH
Data out
tRC
tSKEW
tSKEW
Address (Input)
tCP
tCP
tACS
/CS (Input)
tCHZ
tCLZ
/OE (Input)
tOE
tOHZ
tOLZ
/LB, /UB (Input)
tBA
tBHZ
tBLZ
High impedance
Data out
I/O (Output)
Caution If the address is changed using a value that is either lower than the minimum value or higher than the
maximum value for the read cycle time (tRC), none of the data can be guaranteed.
Remark In read cycle, /WE should be fixed to High.
Data Sheet M15406EJ7V0DS
21
22
Figure 6-2. Read Cycle Timing Chart 2
tRC
tRC
tSKEW
tSKEW
tSKEW
tSKEW
Address (Input)
tCP
tACS
tRC
tRC
tCP
tRC
tAA
Data Sheet M15406EJ7V0DS
tAA
/CS (Input)
tCLZ
tCHZ
tACS
tCHZ
tCLZ
/OE (Input)
tACS
tCHZ
tCLZ
tOE
tOLZ
tOHZ
/LB, /UB (Input)
tBA
tBHZ
tOH
tBLZ
tBA
tBHZ
tBLZ
I/O (Output)
High impedance
Data out
Data out
tBA
tBHZ
tOH
tOH
tBLZ
Data out
Data out
Data out
time (tRC), none of the data can be guaranteed.
Remark In read cycle, /WE should be fixed to High.
µPD4632312-X
Caution If the address is changed using a value that is either lower than the minimum value or higher than the maximum value for the read cycle
Figure 6-3. Read Cycle Timing Chart 3
tRC
tRC
tSKEW
tRC
tSKEW
tRC
tSKEW
tSKEW
tRC
tSKEW
Address (Input)
tACS
tAA
tAA
/CS (Input)
tCLZ
Data Sheet M15406EJ7V0DS
tOE
tOE
tOE
/OE (Input)
tOHZ
tOHZ
tOHZ
tOLZ
tOLZ
tOLZ
tBA
tBA
/LB (Input)
tBHZ
tBLZ
I/O0~7 (Output)
Hi-Z
Data out
tOH
Data out
tBA
/UB (Input)
tBA
tBHZ
tBLZ
High impedance
tOH
Data out
tBHZ
tBLZ
tOH
Data out
Caution If the address is changed using a value that is either lower than the minimum value or higher than the maximum value for
the read cycle time (tRC), none of the data can be guaranteed.
23
Remark In read cycle, /WE should be fixed to High.
µPD4632312-X
I/O8~15 (Output)
tOH
tBHZ
tBLZ
µPD4632312-X
Figure 6-4. Read Cycle Timing Chart 4
tRC
tSKEW
tSKEW
Address (Input)
tRC1
Note
tRC1
Note
tACS
/CS (Input)
tOE
tOE
tOLZ
tOLZ
/OE (Input)
tOHZ
tBA
tBA
tOHZ
tBLZ
tBLZ
/LB, /UB (Input)
I/O (Output)
High impedance
tBHZ
tBHZ
Data out
Data out
High impedance
Caution If the address is changed using a value that is either lower than the minimum value or higher than the
maximum value for the read cycle time (tRC), none of the data can be guaranteed.
Note To perform a continuous read toggling /OE, /UB, and /LB with /CS low level at an identical address, make
settings so that the sum (tRC) of the identical address read cycle times (tRC1) is 10 µs or less.
Remark In read cycle, /WE should be fixed to High.
24
Data Sheet M15406EJ7V0DS
µPD4632312-X
Figure 6-5. 4 Words Page Read Cycle Timing Chart
tNPRC
tRC
tPRC
tPRC
tPRC
AN+1
AN+2
AN+3
tSKEW
Address
(A2 - A20) (Input)
AN
tSKEW
Page Address
(A0, A1) (Input)
/CS (Input)
tACS
I/O (Output)
tPAA
tPAA
tOH
tOH
QN
tCHZ
tPAA
tOH
tOH
QN+1
QN+2
QN+3
tOHZ
tOE
tBA
tBHZ
/OE,
/LB, /UB (Input)
Figure 6-6. 8 Words Page Read Cycle Timing Chart
tNPRC
tRC
tSKEW
Address
(A3 - A20) (Input)
AN
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
AN+1
AN+2
AN+3
AN+4
AN+5
AN+6
AN+7
tSKEW
Page Address
(A0 - A2) (Input)
/CS (Input)
tACS
I/O (Output)
tPAA
tPAA
tPAA
tPAA
tPAA
tPAA
tPAA
tOH
tOH
tOH
tOH
tOH
tOH
tOH
QN
QN+1
QN+2
QN+3
tQE
tBA
QN+4
QN+5
QN+6
tCHZ
tOH
QN+7
tOHZ
tBHZ
/OE,
/LB, /UB (Input)
Data Sheet M15406EJ7V0DS
25
26
Figure 6-7. 4 / 8 Words Continuous Page Read Cycle Timing Chart
4 word page read continuous operation
tNPRC
Address (Input)
tNPRC
tNPRC
tRC
tPRC
tPRC
tPRC
tRC
tPRC
tPRC
tPRC
tRC
tPRC
tPRC
tPRC
AM
AM+1
AM+2
AM+3
AN
AN+1
AN+2
AN+3
AP
AP+1
AP+2
AP+3
/CS (Input)
Data Sheet M15406EJ7V0DS
/OE (Input)
tOE
tOLZ
tPAA
tAA, tACS, tOE
tOH
tCLZ
tOLZ
QM
I/O (Output)
tPAA
tPAA
tOH
QM+1
tOH
QM+2
tOE
tOLZ
tOHZ
tPAA
tOH
tPAA
tOH
QM+3
tPAA
tOH
QN
tOHZ
tOH
QN+1
QN+2
tPAA
tOH
tOH
QN+3
tPAA
tOH
QP
tPAA
tOH
QP+1
QP+2
tCHZ
tOHZ
tOH
High impedance
QP+3
High impedance
High impedance
High impedance
8 word page read continuous operation
tNPRC
Address (Input)
tNPRC
tRC
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
tRC
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
AM
AM+1
AM+2
AM+3
AM+4
AM+5
AM+6
AM+7
AN
AN+1
AN+2
AN+3
AN+4
AN+5
AN+6
AN+7
/CS (Input)
tOE
tAA, tACS, tOE
tCLZ
tOLZ
I/O (Output)
High impedance
tPAA
tOH
QM
tPAA
tPAA
tPAA
tPAA
tOH
tOH
tOH
tOH
QM+1
QM+2
QM+3
QM+4
tPAA
tOH
QM+5
tPAA
tOHZ
tOH
tOH
QM+6
QM+7
tOLZ
High impedance
tPAA
tOH
QN
tPAA
tPAA
tPAA
tPAA
tPAA
tPAA
tOH
tOH
tOH
tOH
tOH
tOH
QN+1
QN+2
QN+3
QN+4
QN+5
QN+6
tCHZ
tOHZ
tOH
QN+7
µPD4632312-X
/OE(Input)
µPD4632312-X
Figure 6-8. Prohibition of 8 Words Page Read Start after Write Modify Read Cycle Timing Chart
tNPRC
tWC
tRC
AN
Address (Input)
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
AN+1
AN+2
AN+3
AN+4
AN+5
AN+6
AN+7
/CS (Input)
tAS
tWP
/WE(Input)
tWR
/OE (Input)
Caution 8 words page read cannot be started with write modify read.
8 words page read can be started by unselecting /CS after writing to AN and then reading AN again.
Figure 6-9. 8 Words Page Read Start after Write Modify Read Timing Chart
tNPRC
tWC
tRC
AN
Address (Input)
tPRC
tPRC
tPRC
tPRC
tPRC
AN+1
AN+2
AN+3
AN+4
AN+5
tPRC
AN+6
tPRC
AN+7
tCP
/CS (Input)
tAS
tWP
/WE (Input)
tWR
/OE (Input)
tDW
I/O (Input/Output)
High
impedance
tDH
Data in
tACS
tOE
tPAA
tPAA
tPAA
tOH
tOH
tOH
tOH
QN+1
QN+2
QN+3
QN
Data Sheet M15406EJ7V0DS
tPAA
tPAA
tCHZ
tOHZ
tPAA
tPAA
tOH
tOH
tOH
tOH
QN+4
QN+5
QN+6
QN+7
27
µPD4632312-X
Figure 6-10. Prohibition of 8 Words 2 Continuous Read Cycles Timing Chart
tNPRC
tRC
tRC
AN
Address (Input)
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
AN+1
AN+2
AN+3
AN+4
AN+5
AN+6
AN+7
/CS (Input)
/OE (Input)
Figure 6-11. 8 Words 2 Continuous Read Cycles Timing Chart
tNPRC
tWC
tRC
Address (Input)
AN
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
tPRC
AN+1
AN+2
AN+3
AN+4
AN+5
AN+6
AN+7
tCP
/CS (Input)
tCLZ
tCHZ
/OE (Input)
tAA
tACS
tOE
tOHZ
tOLZ
tOLZ
High
impedance
tPAA
tOH
QN
QN
I/O (Output)
28
tACS
tOE
tPAA
tOH
QN+1
tPAA
tOH
QN+2
tPAA
tPAA
tOH
tOH
QN+3
QN+4
High
impedance
Data Sheet M15406EJ7V0DS
tPAA
tOH
QN+5
tPAA
tOH
QN+6
tCHZ
tOHZ
tOH
QN+7
µPD4632312-X
Figure 6-12. 8 Words Normal Read Cycle Timing Chart
tRC
tRC
tSKEW
tSKEW
tSKEW
Note
Note
Address (Input)
(A2, A1, A0) = (VIL, VIL, VIL)
tACS
(A2, A1, A0) = (VIL, VIL, VIH)
tAA
tOAS
/CS (Input)
tCLZ
tOP
tOE
tOE
/OE (Input)
tOLZ
tOHZ
tOLZ
tBA
tOHZ
tBA
/LB,/UB (Input)
tBLZ
tBHZ
I/O (Output)
tBLZ
Data out
tBHZ
Data out
Caution Always toggle /OE. If /OE is fixed to low level, page read starts.
Note A3 and higher address do not change. (A20 to A3) addresses are constant.
Figure 6-13. 8 Words Write-Abort to Read Cycle Timing Chart
tWC
tRC
tSKEW
Address (Input)
tSKEW
(A2, A1, A0) = (VIL, VIL, VIL)
Note
tSKEW
(A2, A1, A0) =
Note
(VIL, VIL, VIH)
tAA
/CS (Input)
tAS
tWP
tCHZ
tWR
/WE (Input)
tOE
/OE (Input)
tOLZ
tOHZ
tBA
/LB, /UB (Input)
tDW
I/O (Output)
tDH
tBLZ
Data in
tBHZ
Data out
Caution When performing a read operation to (A2, A1, A0) = (VIL, VIL, VIH) from when (A2, A1, A0) = (VIL, VIL, VIL)
are in a write-abort state, it is recognized as a page read.
Note A3 and higher address do not change. (A20 toA3) addresses are constant.
Data Sheet M15406EJ7V0DS
29
µPD4632312-X
Figure 6-14. Write Cycle Timing Chart 1
tWC
tWC
tSKEW
tSKEW
Address (Input)
tCW
tCP
tCW
/CS (Input)
tWP
tWR
tAS
tWP
tWR
/WE (Input)
tAS
tBW
tBW
/LB, /UB (Input)
tDW
tDH
tDW
High impedance
tDH
High impedance
I/O (Input)
Data in
tSKEW
Data in
tWC
tSKEW
tWC
tSKEW
Address (Input)
tCW
tCP
tCW
/CS (Input)
tWP
tWR
tWP
tWR
/WE (Input)
tBW
tBW
/LB, /UB (Input)
tDW
High impedance
I/O (Input)
tDH
tDW
tDH
High impedance
Data in
Data in
Cautions 1. During address transition, at least one of pins /CS, /WE should be inactivated.
2. Do not input data to the I/O pins while they are in the output state.
3. If the address is changed using a value that is either lower than the minimum value or higher
than the maximum value for the write cycle time (tWC), none of the data can be guaranteed.
Remark
30
Write operation is done during the overlap time of a Low /CS, /WE, /LB and/or /UB.
Data Sheet M15406EJ7V0DS
µPD4632312-X
Figure 6-15. Write Cycle Timing Chart 2 (/WE Controlled)
tWC
tWC
tSKEW
tWC
tSKEW
tSKEW
tSKEW
tSKEW
Address (Input)
tCW
tAW
tCP
tAW
/CS (Input)
tAS
tAS
/WE (Input)
tWP
tAS
tWR
tAW
tWP
tOW
tWR
tWP
tWR
tWHZ
/OE (Input)
tDW
tDH
tOLZ
tOHZ
Indefinite
data out
Data in
I/O (Input/Output)
High impedance
High
impedance
tDW
tDH
Data in
High
impedance
tWC
tDW
tDH
Data in
High impedance
High impedance
tSKEW
tSKEW
Address (Input)
Note
Note
tWC1
tWC1
/CS (Input)
tAS
tWP
tWR
tWP
tWR
/WE (Input)
tBW
/LB, /UB (Input)
tDW
I/O (Input)
High impedance
tDH
Data in
tDW
High impedance
tDH
Data in
High impedance
Cautions 1. During address transition, at least one of pins /CS, /WE should be inactivated.
2. Do not input data to the I/O pins while they are in the output state.
3. If the address is changed using a value that is either lower than the minimum value or higher
than the maximum value for the write cycle time (tWC), none of the data can be guaranteed.
Note If /LB and /UB are changed at the same time with /CS low level and a continuous write operation toggling /WE
is performed, make settings so that the sum (tWC) of the identical address write cycle time (tWC1) is 10 µs or
less.
Remarks 1. Write operation is done during the overlap time of a Low /CS, /WE, /LB and/or /UB.
2. When /WE is at Low, the I/O pins are always high impedance. When /WE is at High, read operation is
executed. Therefore /OE should be at High to make the I/O pins high impedance.
Data Sheet M15406EJ7V0DS
31
µPD4632312-X
Figure 6-16. Write Cycle Timing Chart 3 (/CS Controlled)
Address (Input)
tWC
tWC
/CS (Input)
tAS
tCW
tWR
tAS
tCW
tWR
/WE (Input)
/LB, /UB (Input)
tDW
tDH
tDW
Data in
I/O (Input)
High impedance
tDH
Data in
High impedance
High impedance
Address (Input)
tWC
tWC
/CS (Input)
tAS
tCW
tWR
tAS
tCW
tWR
/WE (Input)
/LB, /UB (Input)
tDW
tDH
tDW
Data in
I/O (Input)
High impedance
tDH
Data in
High impedance
High impedance
Cautions 1. During address transition, at least one of pins /CS, /WE should be inactivated.
2. Do not input data to the I/O pins while they are in the output state.
3. If the address is changed using a value that is either lower than the minimum value or higher
than the maximum value for the write cycle time (tWC), none of the data can be guaranteed.
Remark Write operation is done during the overlap time of a Low /CS, /WE, /LB and/or /UB.
32
Data Sheet M15406EJ7V0DS
µPD4632312-X
Figure 6-17. Write Cycle Timing Chart 4 (/LB, /UB Controlled 1)
tWC
tWC
tSKEW
tSKEW
Address (Input)
tCW
tAW
/CS (Input)
tWP
/WE (Input)
tAS
tBW
tWR
tAS
tBW
tWR
/LB, /UB (Input)
tDW
High impedance
I/O (Input)
tDH
tDW
High impedance
Data in
tDH
Data in
tWC
tSKEW
tWC
tSKEW
Address (Input)
tCW
tAW
/CS (Input)
tWP
/WE (Input)
tAS
tBW
tWR
tAS
tBW
tWR
/LB, /UB (Input)
tDW
I/O (Input)
High impedance
tDW
tDH
Data in
High impedance
tDH
Data in
Cautions 1. During address transition, at least one of pins /CS, /WE should be inactivated.
2. Do not input data to the I/O pins while they are in the output state.
3. If the address is changed using a value that is either lower than the minimum value or higher
than the maximum value for the write cycle time (tWC), none of the data can be guaranteed.
Remark Write operation is done during the overlap time of a Low /CS, /WE, /LB and/or /UB.
Data Sheet M15406EJ7V0DS
33
µPD4632312-X
Figure 6-18. Write Cycle Timing Chart 5 (/LB, /UB Controlled 2)
tWC
tSKEW
tSKEW
Address (Input)
Note
Note
tWC1
tWC1
/CS (Input)
tWP
/WE (Input)
tAS
tBW
tWR
tBW
tWR
/LB, /UB (Input)
tDW
I/O (Input)
High impedance
tDH
Data in
tDW
High impedance
tDH
Data in
High impedance
Cautions 1. During address transition, at least one of pins /CS, /WE should be inactivated.
2. Do not input data to the I/O pins while they are in the output state.
3. If the address is changed using a value that is either lower than the minimum value or higher
than the maximum value for the write cycle time (tWC), none of the data can be guaranteed.
Note If /LB and /UB are changed at the same time with /CS low level and a continuous write operation toggling /WE
is performed, make settings so that the sum (tWC) of the identical address write cycle time (tWC1) is 10 µs or
less.
Remark Write operation is done during the overlap time of a Low /CS, /WE, /LB and/or /UB.
34
Data Sheet M15406EJ7V0DS
µPD4632312-X
Figure 6-19. Write Cycle Timing Chart 6 (/LB, /UB Independent Controlled 1)
tWC
Address (Input)
Note
Note
tWC1
tWC1
/CS (Input)
tCW
tWP
/WE (Input)
/LB (Input)
tAS
tBW
tWR
tBW
tWR
/UB (Input)
tDW
tDH
Data in
I/O0~7 (Input)
High impedance
High impedance
tDW
tDH
Data in
I/O8~15 (Input)
High impedance
High impedance
Cautions 1. During address transition, at least one of pins /CS, /WE should be inactivated.
2. Do not input data to the I/O pins while they are in the output state.
3. If the address is changed using a value that is either lower than the minimum value or higher
than the maximum value for the write cycle time (tWC), none of the data can be guaranteed.
Note If /LB and /UB are changed at the same time with /CS low level and a continuous write operation toggling /WE
is performed, make settings so that the sum (tWC) of the identical address write cycle time (tWC1) is 10 µs or
less.
Remark Write operation is done during the overlap time of a Low /CS, /WE, /LB and/or /UB.
Data Sheet M15406EJ7V0DS
35
µPD4632312-X
Figure 6-20. Write Cycle Timing Chart 7 (/LB, /UB Independent Controlled 2)
Address (Input)
tWC
/CS (Input)
tCW
tCW
tWP
tWP
/WE (Input)
tBW
tWR
/LB (Input)
tAS
tBWH
tBW
tWR
/UB (Input)
tAS
tDW
I/O0~7 (Input)
tDH
Data in
High impedance
High impedance
tDW
tDH
Data in
I/O8~15 (Input)
High impedance
High impedance
Cautions 1. During address transition, at least one of pins /CS, /WE should be inactivated.
2. Do not input data to the I/O pins while they are in the output state.
3. If the address is changed using a value that is either lower than the minimum value or higher
than the maximum value for the write cycle time (tWC), none of the data can be guaranteed.
Remark Write operation is done during the overlap time of a Low /CS, /WE, /LB and/or /UB.
36
Data Sheet M15406EJ7V0DS
µPD4632312-X
Figure 6-21. Read Write Cycle Timing Chart 1 (/LB, /UB Independent Controlled 1)
tRWC
Address (Input)
Note
Note
tRC1
tWC1
tAA
/CS (Input)
tACS
tWP
/WE (Input)
tBWS
/LB (Input)
tWR
tBW
/UB (Input)
tCLZ
tBLZ
tBHZ
Data out
I/O0~7 (Output)
High impedance
High impedance
tDW
I/O8~15 (Input)
tDH
Data in
High impedance
High impedance
Cautions 1. During address transition, at least one of pins /CS, /WE should be inactivated.
2. Do not input data to the I/O pins while they are in the output state.
3. If the address is changed using a value that is either lower than the minimum value or higher
than the maximum value for the identical address read cycle time (tRC1) and the identical address
write cycle time (tWC1), none of the data can be guaranteed.
Note Make settings so that the sum (tRWC) of the identical address read cycle time (tRC1) and the identical address
write cycle time (tWC1) is 10 µs or less when a write is performed at the identical address using /UB following a
read using /LB with /CS low level, or when a write is performed using /LB following a read using /UB.
Remark Write operation is done during the overlap time of a Low /CS, /WE, /LB and/or /UB.
Data Sheet M15406EJ7V0DS
37
µPD4632312-X
Figure 6-22. Read Write Cycle Timing Chart 2 (/LB, /UB Independent Controlled 2)
tRWC
Address (Input)
Note
Note
tWC1
tRC1
tCW
/CS (Input)
tWR
tWP
/WE (Input)
tBW
/LB (Input)
tAS
tBRS
/UB (Input)
tDW
I/O0~7 (Input)
tDH
Data in
High impedance
High impedance
tBA
tBHZ
tBLZ
I/O8~15 (Output)
Data out
High impedance
High impedance
Cautions 1. During address transition, at least one of pins /CS, /WE should be inactivated.
2. Do not input data to the I/O pins while they are in the output state.
3. If the address is changed using a value that is either lower than the minimum value or higher
than the maximum value for the identical address read cycle time (tRC1) and the identical address
write cycle time (tWC1), none of the data can be guaranteed.
Note Make settings so that the sum (tRWC) of the identical address read cycle time (tRC1) and the identical address
write cycle time (tWC1) is 10 µs or less when a write is performed at the identical address using /UB following a
read using /LB with /CS low level, or when a write is performed using /LB following a read using /UB.
Remark Write operation is done during the overlap time of a Low /CS, /WE, /LB and/or /UB.
38
Data Sheet M15406EJ7V0DS
µPD4632312-X
Figure 6-23. Read Write Cycle Timing Chart 3 (/LB, /UB Independent Controlled 3)
tRWC
Address (Input)
Note
Note
tWC1
tRC1
tCW
/CS (Input)
tWP
tWR
/WE (Input)
tAS
tBW
/LB (Input)
/UB (Input)
tDW
I/O0~7 (Input)
tDH
Data in
High impedance
High impedance
tBHZ
tBA
tBLZ
I/O8~15 (Output)
Data out
High impedance
High impedance
Cautions 1. During address transition, at least one of pins /CS, /WE should be inactivated.
2. Do not input data to the I/O pins while they are in the output state.
3. If the address is changed using a value that is either lower than the minimum value or higher
than the maximum value for the identical address read cycle time (tRC1) and the identical address
write cycle time (tWC1), none of the data can be guaranteed.
Note Make settings so that the sum (tRWC) of the identical address read cycle time (tRC1) and the identical address
write cycle time (tWC1) is 10 µs or less when a write is performed at the identical address using /UB following a
read using /LB with /CS low level, or when a write is performed using /LB following a read using /UB.
Remark Write operation is done during the overlap time of a Low /CS, /WE, /LB and/or /UB.
Data Sheet M15406EJ7V0DS
39
µPD4632312-X
Figure 6-24. Mode Register Setting Timing Chart
Mode register setting
Address (Input)
tRC
tRC
tWC
tWC
1FFFFFH
1FFFFFH
1FFFFFH
1FFFFFH
/CS (Input)
/OE (Input)
tWP
tWR
tWP
tWR
/WE (Input)
tDW
tDH
xxxxH
I/O (Input)
tDW
tDH
xxxxH
/LB, /UB (Input)
Figure 6-25. Mode Register Setting Flow Chart
Start
No
Address= 1FFFFFH
Read with toggled the /CS, /OE
No
Address= 1FFFFFH
Read with toggled the /CS, /OE
No
Address = 1FFFFFH
Write
No
Data = 00H?
No
Mode register setting exit
Address = 1FFFFFH
Write
Data = xxH?
Note
End
Note xxH = 00H, 01H, 02H, 03H, 04H, 05H, 06H, 07H
40
Data Sheet M15406EJ7V0DS
Fail
No
µPD4632312-X
Figure 6-26. Standby Mode Timing Chart
MODE (Input)
tCM
tMC
/CS (Input)
Standby
mode 1
Standby mode 2
(Data hold 16M bits / 8M bits / 4M bits)
Figure 6-27. Standby Mode 2 (Data Invalid) Entry / Recovery Timing Chart
Address (Input)
MODE (Input)
tRC
/CS (Input)
tCP
tCM
Standby
Mode 2
(Data invalid)
Wait Time 200 µs
Data Sheet M15406EJ7V0DS
Read Operation 3 times
Normal
Operation
41
µPD4632312-X
7. Package Drawing
77-PIN TAPE FBGA (12x7)
E
w
S B
ZD
ZE
B
8
7
6
5
4
3
2
1
A
D
P N M L K J H G F E D C B A
INDEX MARK
w
S A
A
A2
y1 S
S
y
e
S
φb
A1
φ x M S AB
ITEM
D
MILLIMETERS
7.0±0.1
E
12.0±0.1
w
A
0.2
1.1±0.1
A1
A2
e
0.26±0.05
0.84
b
0.45±0.05
x
y
0.08
0.1
y1
0.1
ZD
ZE
0.7
0.8
0.8
P77F9-80-BT3
42
Data Sheet M15406EJ7V0DS
µPD4632312-X
8. Recommended Soldering Conditions
Please consult with our sales offices for soldering conditions of the µPD4632312-X.
Types of Surface Mount Device
µPD4632312F9-BxxX-BT3: 77-pin TAPE FBGA (12 x 7)
µPD4632312F9-CxxX-BT3: 77-pin TAPE FBGA (12 x 7)
µPD4632312F9-BExxX-BT3: 77-pin TAPE FBGA (12 x 7)
µPD4632312F9-CExxX-BT3: 77-pin TAPE FBGA (12 x 7)
Data Sheet M15406EJ7V0DS
43
µPD4632312-X
9. Revision History
Edition/
Date
Page
This
edition
6th edition/
Throughout
Jan.2002
p.9
Previous
edition
Type of
revision
Location
Preliminary Data Sheet → Data Sheet
Modification
p.9
Modification
Description
(Previous edition → This edition)
2.4 Addresses for Which
5cross beam → 6cross beam
Partial Refresh Is Supported
7th edition/
p.4
p.4
Addition
Block Diagram
Note
Mar. 2002
p.5
p.5
Modification
Truth Table
Standby Mode 2 : /CS = ×→H
Notes 1 revision
44
Data Sheet M15406EJ7V0DS
µPD4632312-X
[ MEMO ]
Data Sheet M15406EJ7V0DS
45
µPD4632312-X
[ MEMO ]
46
Data Sheet M15406EJ7V0DS
µPD4632312-X
NOTES FOR CMOS DEVICES
1
PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note:
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using
insulators that easily build static electricity. Semiconductor devices must be stored and transported
in an anti-static container, static shielding bag or conductive material. All test and measurement
tools including work bench and floor should be grounded. The operator should be grounded using
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need
to be taken for PW boards with semiconductor devices on it.
2
HANDLING OF UNUSED INPUT PINS FOR CMOS
Note:
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
pin should be connected to V DD or GND with a resistor, if it is considered to have a possibility of
being an output pin. All handling related to the unused pins must be judged device by device and
related specifications governing the devices.
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note:
Power-on does not necessarily define initial status of MOS device. Production process of MOS
does not define the initial operation status of the device. Immediately after the power source is
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after power-on for devices
having reset function.
Data Sheet M15406EJ7V0DS
47
µPD4632312-X
• The information in this document is current as of March, 2002. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products
and/or types are available in every country. Please check with an NEC sales representative for
availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
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• NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
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patents, copyrights or other intellectual property rights of NEC or others.
• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
circuits, software and information in the design of customer's equipment shall be done under the full
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
• While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
risks of damage to property or injury (including death) to persons arising from defects in NEC
semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
• NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
application.
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio
and visual equipment, home electronic appliances, machine tools, personal electronic equipment
and industrial robots
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems and medical equipment for life support, etc.
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness
to support a given application.
(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4