ETC CY7C341-30RI

41
CY7C341
192-Macrocell MAX® EPLD
Features
•
•
•
•
•
•
Programmable Interconnect Array
192 macrocells in 12 logic array blocks (LABs)
Eight dedicated inputs, 64 bidirectional I/O pins
0.8-micron double-metal CMOS EPROM technology
Programmable interconnect array
384 expander product terms
Available in 84-pin HLCC, PLCC, and PGA packages
Functional Description
The CY7C341 is an Erasable Programmable Logic Device
(EPLD) in which CMOS EPROM cells are used to configure
logic functions within the device. The MAX® architecture is
100% user-configurable, allowing the devices to accommodate a variety of independent logic functions.
The 192 macrocells in the CY7C341 are divided into 12 LABs,
16 per LAB. There are 384 expander product terms, 32 per
LAB, to be used and shared by the macrocells within each
LAB. Each LAB is interconnected with a programmable interconnect array, allowing all signals to be routed throughout the
chip.
The speed and density of the CY7C341 allows them to be
used in a wide range of applications, from replacement of large
amounts of 7400-series TTL logic, to complex controllers and
multifunction chips. With greater than 37 times the functionality of 20-pin PLDs, the CY7C341 allows the replacement of
over 75 TTL devices. By replacing large amounts of logic, the
CY7C341 reduces board space and part count, and increases
system reliability.
Each LAB contains 16 macrocells. In LABs A, F, G, and L, eight
macrocells are connected to I/O pins and eight are buried,
while for LABs B, C, D, E, H, I, J, and K, four macrocells are
connected to I/O pins and 12 are buried. Moreover, in addition
to the I/O and buried macrocells, there are 32 single product
term logic expanders in each LAB. Their use greatly enhances
the capability of the macrocells without increasing the number
of product terms in each macrocell.
Logic Array Blocks
There are 12 logic array blocks in the CY7C341. Each LAB
consists of a macrocell array containing 16 macrocells, an
expander product term array containing 32 expanders, and an
I/O block. The LAB is fed by the programmable interconnect
array and the dedicated input bus. All macrocell feedbacks go
to the macrocell array, the expander array, and the programmable interconnect array. Expanders feed themselves and the
macrocell array. All I/O feedbacks go to the programmable
interconnect array so that they may be accessed by macrocells in other LABs as well as the macrocells in the LAB in
which they are situated.
Externally, the CY7C341 provides eight dedicated inputs, one
of which may be used as a system clock. There are 64 I/O pins
that may be individually configured for input, output, or bidirectional data flow.
Cypress Semiconductor Corporation
Document #: 38-03034 Rev. *A
•
The Programmable Interconnect Array (PIA) solves interconnect limitations by routing only the signals needed by each
logic array block. The inputs to the PIA are the outputs of every
macrocell within the device and the I/O pin feedback of every
pin on the device.
Unlike masked or programmable gate arrays, which induce
variable delay dependent on routing, the PIA has a fixed delay.
This eliminates undesired skews among logic signals, which
may cause glitches in internal or external logic. The fixed
delay, regardless of programmable interconnect array configuration, simplifies design by assuring that internal signal
skews or races are avoided. The result is ease of design implementation, often in a single pass, without the multiple internal
logic placement and routing iterations required for a programmable gate array to achieve design timing objectives.
Timing Delays
Timing delays within the CY7C341 may be easily determined
using Warp™, Warp Professional™, or Warp Enterprise™
software. The CY7C341 has fixed internal delays, allowing the
user to determine the worst case timing delays for any design.
Design Recommendations
For proper operation, input and output pins must be
constrained to the range GND < (VIN or VOUT) < VCC. Unused
inputs must always be tied to an appropriate logic level (either
VCC or GND). Each set of VCC and GND pins must be
connected together directly at the device. Power supply
decoupling capacitors of at least 0.2 µF must be connected
between VCC and GND. For the most effective decoupling,
each VCC pin should be separately decoupled to GND, directly
at the device. Decoupling capacitors should have good
frequency response, such as monolithic ceramic types.
Design Security
The CY7C341 contains a programmable design security
feature that controls the access to the data programmed into
the device. If this programmable feature is used, a proprietary
design implemented in the device cannot be copied or
retrieved. This enables a high level of design control to be
obtained since programmed data within EPROM cells is
invisible. The bit that controls this function, along with all other
program data, may be reset simply by erasing the device. The
CY7C341 is fully functionally tested and guaranteed through
complete testing of each programmable EPROM bit and all internal
logic elements thus ensuring 100% programming yield.
The erasable nature of these devices allows test programs to
be used and erased during early stages of the production flow.
The devices also contain on-board logic test circuitry to allow
verification of function and AC specification once encapsulated in non-windowed packages.
3901 North First Street
•
San Jose
•
CA 95134 • 408-943-2600
Revised December 11, 2001
CY7C341
Selection Guide
Maximum Access Time
Maximum Operating Current
Maximum Standby Current
Commercial
Industrial
Military
Commercial
Industrial
Military
7C341-25
25
380
480
480
360
435
435
7C341-30
30
380
480
480
360
435
435
7C341-35
35
380
480
480
360
435
435
Unit
ns
mA
mA
Logic Block Diagram
1 (A6)
INPUT/CLK
INPUT
(C6) 84
2 (A5)
INPUT
INPUT
(C7) 83
41 (K6)
INPUT
INPUT
(L7) 44
42 (J6)
INPUT
INPUT
(J7) 43
SYSTEMCLOCK
4
5
6
7
8
9
10
11
(C5)
(A4)
(B4)
(A3)
(A2)
(B3)
(A1)
(B2)
LAB G
MACROCELL 97
MACROCELL 98
MACROCELL 99
MACROCELL 100
MACROCELL 101
MACROCELL 102
MACROCELL 103
MACROCELL 104
LAB A
MACROCELL 1
MACROCELL 2
MACROCELL 3
MACROCELL 4
MACROCELL 5
MACROCELL 6
MACROCELL 7
MACROCELL 8
MACROCELL 9–16
(C2)
(B1)
(C1)
(D2)
22 (G3)
23 (G1)
25 (F1)
26 (H1)
27 (H2)
28 (J1)
29 (K1)
30 (J2)
LAB C
MACROCELL 33
MACROCELL 34
MACROCELL 35
MACROCELL 36
(L1)
(K2)
(K3)
(L2)
(L3)
(K4)
(L4)
(J5)
P
I
A
Document #: 38-03034 Rev. *A
LAB I
MACROCELL 129
MACROCELL 130
MACROCELL 131
MACROCELL 132
MACROCELL 37–48
MACROCELL 133–144
LAB D
MACROCELL 49
MACROCELL 50
MACROCELL 51
MACROCELL 52
LAB J
MACROCELL 145
MACROCELL 146
MACROCELL 147
MACROCELL 148
MACROCELL 53–64
MACROCELL 149–160
LAB K
MACROCELL 161
MACROCELL 162
MACROCELL 163
MACROCELL 164
LAB E
MACROCELL 65
MACROCELL 66
MACROCELL 67
MACROCELL 68
58
59
62
63
(H11)
(F10)
(G9)
(F9)
64
65
67
68
(F11)
(E11)
(E9)
(D11)
69
70
71
72
(D10)
(C11)
(B11)
(C10)
73
74
75
76
77
78
79
80
(A11)
(B10)
(B9)
(A10)
(A9)
(B8)
(A8)
(B6)
MACROCELL 165–176
LAB F
MACROCELL 81
MACROCELL 82
MACROCELL 83
MACROCELL 84
MACROCELL 85
MACROCELL 86
MACROCELL 87
MACROCELL 88
LAB L
MACROCELL 177
MACROCELL 178
MACROCELL 179
MACROCELL 180
MACROCELL 181
MACROCELL 182
MACROCELL 183
MACROCELL 184
MACROCELL 89–96
MACROCELL 185–192
3, 24, 45, 66 (B5, G2, K7, E10)
18, 19, 39, 40, 60, 61, 81, 82 (E1, E2, K5, L5, G10, G11, A7, B7)
(J10)
(K11)
(J11)
(H10)
MACROCELL 117–128
MACROCELL 69–80
31
32
33
34
35
36
37
38
54
55
56
57
LAB H
MACROCELL 113
MACROCELL 114
MACROCELL 115
MACROCELL 116
MACROCELL 17
MACROCELL 18
MACROCELL 19
MACROCELL 20
MACROCELL 21–32
16 (D1)
17 (E3)
20 (F2)
21 (F3)
(L6)
(L8)
(K8)
(L9)
(L10)
(K9)
(L11)
(K10)
MACROCELL 105–112
LAB B
12
13
14
15
46
47
48
49
50
51
52
53
VCC
GND
() – PERTAIN TO 84-PIN PGA PACKAGE
C341-1
Page 2 of 15
CY7C341
Pin Configurations
PGA
Bottom View
L
I/O
I/O
I/O
I/O
GND
I/O
INPUT
I/O
I/O
I/O
I/O
K
I/O
I/O
I/O
I/O
GND
INPUT
VCC
I/O
I/O
I/O
I/O
J
I/O
I/O
I/O
I/O
H
I/O
I/O
I/O
I/O
G
I/O
VCC
I/O
I/O
GND
GND
F
I/O
I/O
I/O
I/O
I/O
I/O
E
GND
GND
I/O
I/O
VCC
I/O
D
I/O
I/O
I/O
I/O
C
I/O
I/O
I/O
I/O
B
I/O
I/O
I/O
I/O
A
I/O
I/O
I/O
I/O
1
2
3
4
I/O
I/O
I/O
I/O
I/O
GND
I/O
GND
INPUT
INPUT/CLK
INPUT
INPUT
I/O
I/O
VCC
I/O
I/O
I/O
I/O
I/O
I/O
PLCC/HLCC
Top View
11 10 9 8 7 6 5 4 3 2 1 84 83 82 81 80 79 78 77 76 75
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
VCC
I/O
I/O
I/O
I/O
GND
GND
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
INPUT
INPUT
INPUT
INPUT
VCC
I/O
I/O
I/O
I/O
GND
GND
I/O
74
12
73
13
72
14
71
15
70
16
69
17
68
18
67
19
66
20
65
21
64
7C341
22
63
23
62
24
61
25
60
26
59
27
58
28
57
29
56
30
55
31
54
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53
I/O
I/O
I/O
I/O
I/O
I/O
I/O
GND
GND
I/O
I/O
I/O
I/O
VCC
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
C341-2
I/O
INPUT INPUT
7C341
I/O
VCC
INPUT INPUT
GND
I/O
I/O
I/O
I/O
INPUT/
INPUT CLK
GND
I/O
I/O
I/O
I/O
8
9
10
11
5
I/O
6
7
C341-3
EXPANDER
DELAY
tEXP
INPUT
INPUT
DELAY
tIN
LOGIC ARRAY
CONTROL DELAY
tLAC
LOGIC ARRAY
DELAY
tLAD
REGISTER
OUTPUT
DELAY
tCLR
tPRE
tRSU
tRH
tRD
tCOMB
tLATCH
INPUT/
OUTPUT
tOD
tXZ
tZX
SYSTEM CLOCK DELAY tICS
PIA
DELAY
tPIA
CLOCK
DELAY
tIC
LOGIC ARRAY
DELAY
tFD
I/O DELAY
tIO
C341-4
Figure 1. CY7C341 Internal Timing Model
Document #: 38-03034 Rev. *A
Page 3 of 15
CY7C341
DC Output Current, per Pin ........................ −25 mA to +25 mA
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature .......................................−65°C to +150°C
Ambient Temperature with
Power Applied.................................................... 0°C to +70°C
Maximum Junction Temperature
(Under Bias)................................................................. 150°C
DC Input Voltage[1]................................................−3.0V to +7.0V
DC Program Voltage .................................................... 13.0V
Static Discharge Voltage..................................................>1100V
(per MIL-STD-883, method 3015)
Operating Range
Range
Supply Voltage to Ground Potential .................−2.0V to +7.0V
Commercial
Maximum Power Dissipation...................................2500 mW
Industrial
DC VCC or GND Current......................................................500 mA
Military
Ambient Temperature
VCC
0°C to +70°C
5V ± 5%
–40°C to +85°C
5V ± 10%
–55°C to +125°C (Case)
5V ± 10%
Electrical Characteristics Over the Operating Range[2]
Parameter
Description
Test Conditions
VOH
Output HIGH Voltage
VCC = Min., IOH = –4.0 mA
VOL
Output LOW Voltage
VCC = Min., IOL = 8 mA
VIH
Input HIGH Level
VIL
Input LOW Level
IIX
Input Current
IOZ
Output Leakage Current VO = VCC or GND
VCC = Max., VOUT = GND
ICC1
Power Supply Current
(Standby)
VI = VCC or GND (No Load)
Power Supply Current
ICC2
[5]
VI = VCC or GND (No Load)
f = 1.0 MHz[3, 5]
Unit
V
0.45
V
2.2
VCC + 0.3
V
−0.3
0.8
V
−10
+10
µA
−40
+40
µA
−30
−90
mA
Commercial
360
mA
Military/Industrial
435
mA
[3, 4]
Output Short
Circuit Current
Max.
2.4
GND ≤ VIN ≤ VCC
IOS
Min.
Commercial
380
mA
Military/Industrial
480
mA
tR (Recommended)
Input Rise Time
100
ns
tF (Recommended)
Input Fall Time
100
ns
Capacitance[6]
Parameter
Description
CIN
Input Capacitance
COUT
Output Capacitance
Test Conditions
Max.
Unit
TA = 25°C, f = 1 MHz, VCC = 5.0V
10
pF
20
pF
Notes:
1. Minimum DC input is –0.3V. During transitions, the inputs may undershoot to –2.0V for periods less than 20 ns.
2. Typical values are for TA = 25°C and VCC = 5V.
3. Guaranteed but not 100% tested.
4. No more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5V has been chosen to avoid
test problems caused by tester ground degradation.
5. This parameter is measured with device programmed as a 16-bit counter in each LAB and is tested periodically by sampling production material.
6. Part (a) in AC Test Load and Waveforms is used for all parameters except tER and tXZ, which is used for part (b) in AC Test Load and Waveforms. All external timing
parameters are measured referenced to external pins of the device.
Document #: 38-03034 Rev. *A
Page 4 of 15
CY7C341
AC Test Loads and Waveforms
R1 464Ω
5V
OUTPUT
R1 464Ω
5V
ALL INPUT PULSES
OUTPUT
R2
250Ω
50 pF
3.0V
5 pF
INCLUDING
JIG AND
SCOPE (a)
Equivalent to:
R2
250Ω
90%
10%
90%
10%
GND
< 6 ns
< 6 ns
tF
tR
(b)
C341-5
C341-6
THÉVENIN EQUIVALENT (commercial/military)
163Ω
OUTPUT
1.75V
External Synchronous Switching Characteristics Over the Operating Range[6]
7C341-25
Parameter
tPD1
tPD2
Description
Min.
Max
7C341-30
Min.
Max
7C341-35
Max
Unit
Dedicated Input to Combinatorial
Output Delay[7]
Com’l
25
30
Min.
35
ns
Mil
25
30
35
I/O Input to Combinatorial
Output Delay[8]
Com’l
40
45
55
Mil
40
45
55
44
55
tPD3
Dedicated Input to Combinatorial
Com’l
Output Delay with Expander Delay[9]
Mil
37
37
44
55
tPD4
I/O Input to Combinatorial Output
Delay with Expander Delay[3, 10]
Com’l
52
59
75
Mil
52
59
75
[3, 7]
Com’l
25
30
35
Mil
25
30
35
25
30
35
tEA
Input to Output Enable Delay
tER
Input to Output Disable Delay[6]
Com’l
Mil
25
30
35
tCO1
Synchronous Clock Input to
Output Delay
Com’l
14
16
20
Mil
14
16
20
Synchronous Clock to Local
Feedback to Combinatorial
Output[3, 11]
Com’l
30
35
42
Mil
30
35
42
tCO2
tS1
tS2
Dedicated Input or Feedback Set-up Com’l
Time to Synchronous Clock
Mil
Output[6, 12]
15
20
25
15
20
25
I/O Input Set-up Time to
Synchronous Clock Input[8]
Com’l
30
39
45
Mil
30
39
45
ns
ns
ns
ns
ns
ns
ns
ns
ns
Notes:
7. This specification is a measure of the delay from input signal applied to a dedicated input to combinatorial output on any output pin. This delay assumes that
no expander terms are used to form the logic function. When this note is applied to any parameter specification it indicates that the signal (data, asynchronous
clock, asynchronous clear, and/or asynchronous preset) is applied to a dedicated input only and no signal path (either clock or data) employs expander logic.
If an input signal is applied to an I/O pin an additional delay equal to tPIA should be added to the comparable delay for a dedicated input. If expanders are used, add the
maximum expander delay tEXP to the overall delay for the comparable delay without expanders.
8. This specification is a measure of the delay from input signal applied to an I/O macrocell pin to any output. This delay assumes no expander terms are used
to form the logic function.
9. This specification is a measure of the delay from an input signal applied to a dedicated input to combinatorial output on any output pin. This delay assumes
expander terms are used to form the logic functions and includes the worst-case expander logic delay for one pass through the expander logic.
10. This specification is a measure of the delay from an input signal applied to an I/O macrocell pin to any output. This delay assumes expander terms are used
to form the logic function and includes the worst-case expander logic delay for one pass through the expander logic. This parameter is tested periodically by
sampling production material.
11. This specification is a measure of the delay from synchronous register clock to internal feedback of the register output signal to the input of the LAB logic array
and then to a combinatorial output. This delay assumes no expanders are used, register is synchronously clocked and all feedback is within the same LAB.
This parameter is tested periodically by sampling production material.
12. If data is applied to an I/O input for capture by a macrocell register, the I/O pin set-up time minimums should be observed. These parameters are tS2 for
synchronous operation and tAS2 for asynchronous operation.
Document #: 38-03034 Rev. *A
Page 5 of 15
CY7C341
External Synchronous Switching Characteristics Over the Operating Range[6] (continued)
7C341-25
Parameter
Description
Min.
Max
0
7C341-30
Min.
Max
0
7C341-35
Min.
tH
Input Hold Time from
Synchronous Clock Input[6]
Com’l
Mil
0
0
0
tWH
Synchronous Clock Input
High Time
Com’l
8
10
12.5
Mil
8
10
12.5
tWL
Synchronous Clock Input
Low Time
Com’l
8
10
12.5
Mil
8
10
12.5
tRW
Asynchronous Clear Width[3, 6]
Com’l
25
30
35
Mil
25
30
35
Max
0
ns
ns
ns
ns
Asynchronous Clear to
Registered Output Delay[5]
Com’l
25
30
35
Mil
25
30
35
tRR
Asynchronous Clear Recovery[3, 7]
Com’l
Mil
25
30
35
tPW
Asynchronous Preset Width[3, 6]
Com’l
25
30
35
Mil
25
30
35
Asynchronous Preset Recovery
Time[3, 6]
Com’l
25
30
35
Mil
25
30
35
tPO
Asynchronous Preset to
Registered Output Delay[6]
Com’l
25
30
35
Mil
25
30
35
tCF
Synchronous Clock to Local
Feedback Input[3, 13]
Com’l
3
3
5
Mil
3
3
5
External Synchronous Clock Period
(1/fMAX3)[3]
Com’l
16
20
25
Mil
16
20
25
fMAX1
External Feedback Maximum
Frequency (1/(tCO1 + tS1))[3, 14]
Com’l
34.5
27.7
22.2
Mil
34.5
27.7
22.2
fMAX2
Internal Local Feedback Maximum
Frequency, lesser of (1/(tS1 + tCF))
or (1/tCO1)[3, 15]
Com’l
55.5
43
33
Mil
55.5
43
33
Data Path Maximum Frequency, least Com’l
of 1/(tWL + tWH), 1/(tS1 + tH),
Mil
or (1/tCO1)[3, 16]
62.5
50
40.0
62.5
50
40.0
Maximum Register Toggle Frequency Com’l
(1/(tWL + tWH))[3, 17]
Mil
62.5
50
40.0
62.5
50
40.0
Com’l
3
3
3
Mil
3
3
3
tRO
tPR
tP
fMAX3
fMAX4
tOH
Output Data Stable Time from Synchronous Clock Input[3, 18]
25
30
Unit
35
ns
ns
ns
ns
ns
ns
ns
MHz
MHz
MHz
MHz
ns
Notes:
13. This specification is a measure of the delay associated with the internal register feedback path. This is the delay from synchronous clock to LAB logic array
input. This delay plus the register set-up time, tS1, is the minimum internal period for an internal synchronous state machine configuration. This delay is for feedback within
the same LAB. This parameter is tested periodically by sampling production material.
14. This specification indicates the guaranteed maximum frequency, in synchronous mode, at which a state machine configuration with external feedback can
operate. It is assumed that all data inputs and feedback signals are applied to dedicated inputs. All feedback is assumed to be local originating within the same
LAB.
15. This specification indicates the guaranteed maximum frequency at which a state machine, with internal-only feedback, can operate. If register output states
must also control external points, this frequency can still be observed as long as this frequency is less than 1/tCO1.
16. This frequency indicates the maximum frequency at which the device may operate in data path mode (dedicated input pin to output pin). This assumes data
input signals are applied to dedicated input pins and no expander logic is used. If any of the data inputs are I/O pins, tS2 is the appropriate tS for calculation.
17. This specification indicates the guaranteed maximum frequency, in synchronous mode, at which an individual output or buried register can be cycle by a clock
signal applied to the dedicated clock input pin.
18. This parameter indicates the minimum time after a synchronous register clock input that the previous register output data is maintained on the output pin.
Document #: 38-03034 Rev. *A
Page 6 of 15
CY7C341
External Synchronous Switching Characteristics Over the Operating Range[6] (continued)
7C341-25
Parameter
Description
Min.
Max
7C341-30
Min.
Max
7C341-35
Min.
30
Max
Unit
35
ns
tACO1
Dedicated Asynchronous Clock Input Com’l
to Output Delay[6]
Mil
25
25
30
35
tACO2
Asynchronous Clock Input to Local
Com’l
Feedback to Combinatorial Output[19]
Mil
40
46
55
40
46
55
tAS1
Dedicated Input or Feedback Set-up Com’l
Time to Asynchronous Clock Input[6]
Mil
5
5
6
8
tAS2
I/O Input Set-Up Time to
Asynchronous Clock Input[6]
Com’l
20
27
30
Mil
20
27
30
Input Hold Time from
Asynchronous Clock Input[6]
Com’l
6
8
10
Mil
6
8
10
tAWH
Asynchronous Clock Input
HIGH Time[6]
Com’l
11
14
16
Mil
11
14
16
tAWL
Asynchronous Clock Input
LOW Time[6, 20]
Com’l
9
11
14
Mil
9
11
14
Asynchronous Clock to
Local Feedback Input[21]
Com’l
15
18
22
Mil
15
18
22
tAP
External Asynchronous
Clock Period (1/fMAX4)
Com’l
20
25
30
fMAXA1
External Feedback Maximum Frequency in Asynchronous Mode
1/(tACO1 + tAS1)[22]
Com’l
33.3
27
23
Mil
33.3
27
23
fMAXA2
Maximum Internal
Asynchronous Frequency[23]
Com’l
50
40
33.3
Mil
50
40
33.3
fMAXA3
Data Path Maximum Frequency in
Asynchronous Mode[24]
Com’l
40
33.3
28.5
Mil
40
33.3
28.5
Maximum Asynchronous Register
Com’l
Toggle Frequency 1/(tAWH + tAWL)[25]
Mil
50
40
33.3
50
40
33.3
Output Data Stable Time from Asyn- Com’l
chronous Clock Input[26]
Mil
15
15
15
15
15
15
tAH
tACF
fMAXA4
tAOH
Mil
20
6
25
8
30
ns
ns
ns
ns
ns
ns
ns
ns
MHz
MHz
MHz
MHz
ns
Notes:
19. This specification is a measure of the delay from an asynchronous register clock input to internal feedback of the register output signal to the input of the LAB
logic array and then to a combinatorial output. This delay assumes no expanders are used in the logic of combinatorial output or the asynchronous clock input.
The clock signal is applied to the dedicated clock input pin and all feedback is within a single LAB. This parameter is tested periodically by sampling production
material.
20. This parameter is measured with a positive-edge-triggered clock at the register. For negative-edge triggering, the tAWH and tAWL parameters must be swapped. If
a given input is used to clock multiple registers with both positive and negative polarity, tAWH should be used for both tAWH and tAWL.
21. This specification is a measure of the delay associated with the internal register feedback path for an asynchronous clock to LAB logic array input. This delay
plus the asynchronous register set-up time, tAS1, is the minimum internal period for an internal asynchronously clocked state machine configuration. This delay is for
feedback within the same LAB, and assumes there is no expander logic in the clock path and the clock input signal is applied to a dedicated input pin. This parameter is tested
periodically by sampling production material.
22. This specification indicates the guaranteed maximum frequency at which an asynchronously clocked state machine configuration with external feedback can
operate. It is assumed that all data inputs, clock inputs, and feedback signals are applied to dedicated inputs, and that no expander logic is employed in the
clock signal path or data path.
23. This specification indicates the guaranteed maximum frequency at which an asynchronously clocked state machine with internal-only feedback can operate.
This parameter is determined by the lesser of (1/tACF + tAS1)) or (1/(tAWH +tAWL)). If register output states must also control external points, this frequency can still be
observed as long as this frequency is less than 1/tACO1.
24. This frequency is the maximum frequency at which the device may operate in the asynchronously clocked data path mode. This specification is determined
by the least of 1/(tAWH + tAWL), 1/(tAS1 + tAH) or 1/tACO1. It assumes data and clock input signals are applied to dedicated input pins and no expander logic is used.
25. This specification indicates the guaranteed maximum frequency at which an individual output or buried register can be cycled in asynchronously clocked mode
by a clock signal applied to an external dedicated input pin.
26. This parameter indicates the minimum time that the previous register output data is maintained on the output after an asynchronous register clock input applied
to an external dedicated input pin.
Document #: 38-03034 Rev. *A
Page 7 of 15
CY7C341
Internal Switching Characteristics Over the Operating Range[2]
7C341-25
Parameter
Description
Min.
Max
7C341-30
Min.
Min.
Unit
9
ns
Dedicated Input Pad and
Buffer Delay
Com’l
Mil
5
7
9
tIO
I/O Input Pad and Buffer Delay
Com’l
6
6
9
Mil
6
6
9
Com’l
12
14
20
Mil
12
14
20
Com’l
12
14
16
Mil
12
14
16
Expander Array Delay
tLAD
Logic Array Data Delay
7
Max
tIN
tEXP
5
Max
7C341-35
ns
tLAC
Logic Array Control Delay
Com’l
10
12
13
Mil
10
12
13
tOD
Output Buffer and Pad Delay
Com’l
5
5
6
Mil
5
5
6
Com’l
10
11
13
[27]
tZX
Output Buffer Enable Delay
tXZ
Output Buffer Disable Delay
10
11
13
Com’l
10
11
13
Mil
10
11
13
Register Set-Up Time Relative to
Clock Signal at Register
Com’l
Mil
6
8
10
tRH
Register Hold Time Relative to
Clock Signal at Register
Com’l
6
8
10
Mil
6
8
10
tLATCH
Flow-Through Latch Delay
Com’l
3
4
4
Mil
3
4
4
tRD
Register Delay
Com’l
1
2
2
Mil
1
2
2
3
4
4
[28]
6
8
10
tCOMB
Transparent Mode Delay
Com’l
tCH
Clock High Time
Com’l
8
10
12.5
Mil
8
10
12.5
Com’l
8
10
12.5
Mil
8
Mil
tCL
Clock Low Time
tIC
Asynchronous Clock Logic Delay Com’l
tICS
Synchronous Clock Delay
tFD
Feedback Delay
tPRE
Asynchronous Register Preset
Time
Document #: 38-03034 Rev. *A
3
4
10
ns
ns
ns
Mil
tRSU
ns
ns
ns
ns
ns
ns
ns
ns
4
ns
ns
12.5
14
16
18
Mil
14
16
18
Com’l
2
2
3
Mil
2
2
3
Com’l
1
1
2
Mil
1
1
2
Com’l
5
6
7
Mil
5
6
7
ns
ns
ns
ns
Page 8 of 15
CY7C341
Internal Switching Characteristics Over the Operating Range[2] (continued)
7C341-25
Parameter
Max
Unit
Com’l
5
6
7
ns
Mil
5
6
7
tPCW
Asynchronous Preset and Clear
Pulse Width
Com’l
Mil
5
6
7
tPCR
Asynchronous Preset and Clear
Recovery Time
Com’l
5
6
7
Mil
5
6
7
Programmable Interconnect
Array Delay
Com’l
tPIA
Min.
Max
Min.
5
Max
7C341-35
Asynchronous Register Clear
Time
tCLR
Description
7C341-30
6
Min.
7
14
Mil
ns
ns
16
20
16
20
ns
Notes:
27. Sample tested only for an output change of 500 mV.
28. This specification guarantees the maximum combinatorial delay associated with the macrocell register bypass when the macrocell is configured for combinatorial operation.
Switching Waveforms
External Combinatorial
DEDICATED INPUT/
I/O INPUT
tPD1/tPD2
COMBINATORIAL
OUTPUT
tER
COMBINATORIAL
REGISTERED OUTPUT
HIGH-IMPEDANCE
3-ST ATE
tEA
HIGH IMPEDANCE
3-STATE
VALID OUTPUT
C341-7
External Synchronous
DEDICATED INPUT/
I/O INPUT [7]
tS1
tH
tWH
tWL
SYNCHRONOUS
CLOCK
tCO1
ASYNCHRONOUS
CLEAR/PRESET [7]
tRW/tPW
tRR/tPR
tOH
tRO/tPO
REGISTERED
OUTPUTS
tCO2
COMBINATORIAL OUTPUT FROM
REGISTERED FEEDBACK[10]
C341-8
Document #: 38-03034 Rev. *A
Page 9 of 15
CY7C341
Switching Waveforms (continued)
External Asynchronous
DEDICATEDINPUT/
I/OINPUT[7]
tAH
tAS1
tAWH
tAWL
ASYNCHRONOUS
CLOCK INPUT
tACO1
ASYNCHRONOUS
CLEAR/PRESET [7]
tRW/tPW
tRR/tPR
tAOH
tRO/tPO
ASYNCHRONOUS REGISTERED
OUTPUTS
tACO2
COMBINATORIAL OUTPUT
FROM ASYNCH. REGISTERED
FEEDBACK
C341-9
Internal Combinatorial
tIN
INPUT PIN
tIO
tPIA
I/O PIN
tEXP
EXPANDER
ARRAY DELAY
tLAC, tLAD
LOGIC ARRAY
INPUT
LOGIC ARRAY
OUTPUT
C341-10
Document #: 38-03034 Rev. *A
Page 10 of 15
CY7C341
Switching Waveforms (continued)
Internal Asynchronous
tAWH
tIOtR
tAWL
tF
CLOCK PIN
tIN
CLOCK INTO
LOGIC ARRAY
tIC
CLOCK FROM
LOGIC ARRAY
tRSU
tRH
DATA FROM
LOGIC ARRAY
tRD,tLATCH
tFD
tCLR,tPRE
tFD
REGISTER OUTPUT
TO LOCAL LAB
LOGIC ARRAY
tPIA
REGISTER OUTPUT
TO ANOTHER LAB
C341-11
Internal Synchronous
tCH
tCL
SYSTEM CLOCK PIN
SYSTEM CLOCK
AT REGISTER
tIH
tICS
tRSU
tRH
DATA FROM
LOGIC ARRAY
C341-12
Internal Synchronous
CLOCK FROM
LOGIC ARRAY
tRD
tOD
DATA FROM
LOGIC ARRAY
tXZ
OUTPUT PIN
tXZ
tZX
HIGH IMPEDANCE
STATE
C341-13
Document #: 38-03034 Rev. *A
Page 11 of 15
CY7C341
Ordering Information
Speed
(ns)
25
30
35
Ordering Code
CY7C341-25HC/HI
Package
Name
Operating
Range
Package Type
H84
84-Lead Windowed Leaded Chip Carrier
CY7C341-25JC/JI
J83
84-Lead Plastic Leaded Chip Carrier
CY7C341-25RC/RI
R84
84-Lead Windowed Pin Grid Array
CY7C341-30HC/HI
H84
84-Lead Windowed Leaded Chip Carrier
CY7C341-30JC/JI
J83
84-Lead Plastic Leaded Chip Carrier
CY7C341-30RC/RI
R84
84-Lead Windowed Pin Grid Array
CY7C341-30HMB
H84
84-Lead Windowed Leaded Chip Carrier
CY7C341-30RMB
R84
84-Lead Windowed Pin Grid Array
CY7C341-35HC/HI
H84
84-Lead Windowed Leaded Chip Carrier
CY7C341-35JC/JI
J83
84-Lead Plastic Leaded Chip Carrier
CY7C341-35RC/RI
R84
84-Lead Windowed Pin Grid Array
CY7C341-35HMB
H84
84-Lead Windowed Leaded Chip Carrier
CY7C341-35RMB
R84
84-Lead Windowed Pin Grid Array
Commercial/Industrial
Commercial/Industrial
Military
Commercial/Industrial
Military
MILITARY SPECIFICATIONS
Group A Subgroup Testing
DC Characteristics
Parameter
Switching Characteristics
Subgroups
Parameter
Subgroups
VOH
1, 2, 3
tPD1
7, 8, 9, 10, 11
VOL
1, 2, 3
tPD2
7, 8, 9, 10, 11
VIH
1, 2, 3
tPD3
7, 8, 9, 10, 11
VIL
1, 2, 3
tCO1
7, 8, 9, 10, 11
IIX
1, 2, 3
tS1
7, 8, 9, 10, 11
IOZ
1, 2, 3
tH
7, 8, 9, 10, 11
ICC1
1, 2, 3
tACO1
7, 8, 9, 10, 11
tACO2
7, 8, 9, 10, 11
tAS1
7, 8, 9, 10, 11
tAH
7, 8, 9, 10, 11
Document #: 38-03034 Rev. *A
Page 12 of 15
CY7C341
Package Diagrams
84-Leaded Windowed Leaded Chip Carrier H84
51-80081
Document #: 38-03034 Rev. *A
Page 13 of 15
CY7C341
Package Diagrams (continued)
84-Lead Plastic Leaded Chip Carrier J83
51-85006-A
84-Lead Windowed Pin Grid Array R84
51-80026-*B
MAX is a registered trademark of Altera Corporation. Warp, Warp Professional, and Warp Enterprise are trademarks of Cypress
Semiconductor Corporation. All products and company names mentioned in this document are the trademarks of their respective
holders.
Document #: 38-03034 Rev. *A
Page 14 of 15
© Cypress Semiconductor Corporation, 2001. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.
CY7C341
Document Title: CY7C341 192-Macrocell MAX® EPLD
Document Number: 38-03034
REV.
ECN NO.
Issue Date
Orig. of
Change
**
106379
06/18/01
SZV
Change from Spec#: 38-00499 to 38-03034
*A
111355
12/17/01
MYN
PGA package diagram dimensions were updated
Document #: 38-03034 Rev. *A
Description of Change
Page 15 of 15