Revised September 2000 74ACTQ652 Quiet Series Transceiver/Register General Description Features The ACTQ652 consists of bus transceiver circuits with Dtype flip-flops, and control circuitry arranged for multiplexed transmission of data directly from the input bus or from internal registers. Data on the A or B bus will be clocked into the registers as the appropriate clock pin goes to the HIGH logic level. Output Enable pins (OEAB, OEBA) are provided to control the transceiver function. ■ Guaranteed simultaneous switching noise level and dynamic threshold performance The ACTQ652 utilizes Fairchild FACT Quiet Series technology to guarantee quiet output switching and improved dynamic threshold performance. FACT Quiet Series features GTO output control and undershoot corrector in addition to split ground bus for superior performance. ■ TTL-compatible inputs ■ Guaranteed pin-to-pin skew AC performance ■ Independent registers for A and B buses ■ Multiplexed real-time and stored data ■ Outputs source/sink 24 mA Ordering Code: Order Number 74ACTQ652SC Package Number M24B 74ACTQ652MTC MTC24 74ACTQ652SPC N24C Package Description 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 24-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code. Logic Symbols Connection Diagram IEEE/IEC Pin Descriptions Pin Names Description A0–A7, B0–B7 A and B Inputs/3-STATE Outputs CPAB, CPBA Clock Inputs SAB, SBA Select Inputs OEAB, OEBA Output Enable Inputs FACT, Quiet Series, FACT Quiet Series and GTO are trademarks of Fairchild Semiconductor Corporation. © 2000 Fairchild Semiconductor Corporation DS010933 www.fairchildsemi.com 74ACTQ652 Quiet Series Transceiver/Register June 1991 74ACTQ652 Function Table Inputs Inputs/Outputs (Note 1) Operating Mode OEAB OEBA CPAB CPBA L H H or L H or L L H X H H H L X L L H or L H or L SAB SBA A0 thru A7 B0 thru B7 Input Input X X X X X X Input Not Specified X X Input Output X X Not Specified Input Hold A, Store B X X Output Input Store B in Both Registers Output Input L L X X X L L L X H or L X H H H X X L X H H H or L X H X H L H or L H or L H H Isolation Store A and B Data Store A, Hold B Store A in Both Registers Real-Time B Data to A Bus Store B Data to A Bus Real-Time A Data to B Bus Input Output Stored A Data to B Bus Stored A Data to B Bus and Output Output Stored B Data to A Bus H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial = LOW-to-HIGH Clock Transition Note 1: The data output functions may be enabled or disabled by various signals at OEAB or OEBA inputs. Data input functions are always enabled, i.e., data at the bus pins will be stored on every LOW-to-HIGH transition on the clock inputs. Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 Data on the A or B data bus, or both can be stored in the internal D-type flip-flop by LOW-to-HIGH transitions at the appropriate Clock Inputs (CPAB, CPBA) regardless of the Select or Output Enable Inputs. When SAB and SBA are in the real time transfer mode, it is also possible to store data without using the internal D-type flip-flops by simultaneously enabling OEAB and OEBA. In this configuration each Output reinforces its Input. Thus when all other data sources to the two sets of bus lines are in a HIGH impedance state, each set of bus lines will remain at its last state. In the transceiver mode, data present at the HIGH impedance port may be stored in either the A or B register or both. The select (SAB, SBA) controls can multiplex stored and real-time. The examples in Figure 1 demonstrate the four fundamental bus-management functions that can be performed with the Octal bus transceivers and receivers. Note A: Real-Time Note B: Real-Time Transfer Bus B to Bus A Transfer Bus A to Bus B OEAB OEBA CPAB CPBA L L X X SAB SBA X L OEAB OEBA CPAB CPBA H Note C: Storage H X X SAB SBA L X Note D: Transfer Storage Data to A or B OEAB OEBA CPAB CPBA X H L X L H X X SAB SBA X X X X X X OEAB OEBA CPAB CPBA H L H or L H or L SAB SBA H H FIGURE 1. 3 www.fairchildsemi.com 74ACTQ652 Functional Description 74ACTQ652 Absolute Maximum Ratings(Note 2) Recommended Operating Conditions −0.5V to +7.0V Supply Voltage (VCC) DC Input Diode Current (IIK) VI = −0.5V −20 mA VI = VCC + 0.5V +20 mA DC Input Voltage (VI) Supply Voltage (VCC) 0V to VCC Output Voltage (VO) −0.5V to VCC + 0.5V 0V to VCC −40°C to +85°C Operating Temperature (TA) Minimum Input Edge Rate ∆V/∆t DC Output Diode Current (IOK) VO = −0.5V −20 mA VO = VCC + 0.5V +20 mA DC Output Voltage (VO) 4.5V to 5.5V Input Voltage (VI) VIN from 0.8V to 2.0V VCC @ 4.5V, 5.5V −0.5V to VCC + 0.5V 125 mV/ns DC Output Source ± 50 mA or Sink Current (IO) DC VCC or Ground Current ± 50 mA per Output Pin (ICC or IGND) Storage Temperature (TSTG) Note 2: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specifications. −65°C to +150°C DC Latch-Up Source ± 300 mA or Sink Current Junction Temperature (TJ) 140°C PDIP DC Electrical Characteristics Symbol VIH VIL VOH Parameter VCC TA = +25°C TA = −40°C to +85°C (V) Typ Guaranteed Limits Minimum HIGH Level 4.5 1.5 2.0 Input Voltage 5.5 1.5 2.0 2.0 Maximum LOW Level 4.5 1.5 0.8 0.8 Input Voltage 5.5 1.5 0.8 0.8 2.0 Minimum HIGH Level 4.5 4.49 4.4 4.4 Output Voltage 5.5 5.49 5.4 5.4 Units V V V Conditions VOUT = 0.1V or VCC − 0.1V VOUT = 0.1V or VCC − 0.1V IOUT = −50 µA VIN = VIL or VIH VOL 4.5 3.86 3.76 5.5 4.86 4.76 V IOH = −24 mA IOH = −24 mA (Note 3) Maximum LOW Level 4.5 0.001 0.1 0.1 Output Voltage 5.5 0.001 0.1 0.1 4.5 0.36 0.44 5.5 0.36 0.44 5.5 ± 0.1 ± 1.0 µA 5.5 ± 0.6 ± 6.0 µA 1.5 mA VI = VCC − 2.1V V IOUT = 50 µA VIN = VIL or VIH IIN Maximum Input Leakage Current IOZT Maximum I/O Leakage Current IOL = 24 mA IOL = 24 mA (Note 3) VI = VCC, GND VI = VIL, VIH VO = VCC, GND ICCT Maximum ICC/Input 5.5 IOLD Minimum Dynamic 5.5 75 mA VOLD = 1.65V Max IOHD Output Current (Note 4) 5.5 −75 mA VOHD = 3.85V Min ICC Maximum Quiescent 80.0 µA VIN = VCC or GND Supply Current VOLP Maximum HIGH Level Output Noise VOLV Maximum LOW Level Output Noise VIHD Minimum HIGH Level Dynamic Input Voltage VILD Maximum LOW Level Dynamic Input Voltage www.fairchildsemi.com 0.6 V 5.5 5.0 8.0 1.1 1.5 V Figures 2, 3 (Note 5)(Note 6) Figures 2, 3 5.0 −0.6 −1.2 V 5.0 1.9 2.2 V (Note 5)(Note 7) 5.0 1.2 0.8 V (Note 5)(Note 7) 4 (Note 5)(Note 6) 74ACTQ652 DC Electrical Characteristics (Continued) Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 5: PDIP package. Note 6: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND. Note 7: Max number of data inputs (n) switching. (n − 1) inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz. AC Electrical Characteristics Symbol Parameter VCC TA = +25°C (V) CL = 50 pF (Note 8) fMAX Maximum Clock Frequency tPLH Propagation Delay tPHL Clock to Bus tPLH Propagation Delay tPHL Bus to Bus tPLH Propagation Delay tPHL SBA or SAB to A or B tPZH Enable Time tPZL OEBA to A (Note 8) tPHZ Disable Time tPLZ OEBA to A (Note 8) tPZH Enable Time tPZL OEAB to B tPHZ Disable Time tPLZ OEAB to B tS(H) Setup Time, HIGH or tS(L) LOW, Bus to Clock tH(H) Hold Time, HIGH or tH(L) LOW, Bus to Clock tW(H) Clock Pulse Width tW(L) HIGH or LOW tOSHL Output to Output Skew (Note 9) tOSLH A to B, B to A or Min Typ TA = −40°C to +85°C CL = 50 pF Max Min Units Max 5.0 MHz 5.0 2.0 7.0 9.5 2.0 10.0 ns 5.0 2.0 6.5 9.0 2.0 9.5 ns 5.0 2.5 6.5 10.0 2.5 10.5 ns 5.0 2.0 7.0 10.5 2.0 11.0 5.0 1.0 5.0 8.0 1.0 8.5 5.0 2.0 7.0 10.5 2.0 11.0 5.0 1.0 5.0 8.0 1.0 8.5 5.0 3.0 3.0 ns 5.0 1.5 1.5 ns 5.0 4.0 4.0 ns 5.0 0.5 1.0 1.0 ns ns ns Clock to Output Note 8: Voltage Range 5.0 is 5.0V ± 0.5V. Note 9: Skew is defined as the absolute value of the difference between the actual propagation delay for any separate outputs of the same device. The specification applies to any output switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. Capacitance Typ Units CIN Symbol Input Capacitance Parameter 4.5 pF VCC = 5.0V CPD Power Dissipation Capacitance 54 pF VCC = 5.0V 5 Conditions www.fairchildsemi.com 74ACTQ652 FACT Noise Characteristics The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT. VOLP/VOLV and VOHP/V OHV: • Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output voltages using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. Equipment: Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture • Measure VOLP and VOLVon the quiet output during the worst case transition for active and enable. Measure VOHP and VOHV on the quiet output during the worst case active and enable transition. Tektronics Model 7854 Oscilloscope Procedure: 1. Verify Test Fixture Loading: Standard Load 50 pF, 500Ω. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. 2. Deskew the HFS generator so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously. VILD and VIHD: • Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. 3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the correct voltage. • First increase the input LOW voltage level, VIL, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as V ILD. 4. Set the HFS generator to toggle all but one output at a frequency of 1 MHz. Greater frequencies will increase DUT heating and effect the results of the measurement. 5. Set the HFS generator input levels at 0V LOW and 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope. • Next decrease the input HIGH voltage level, VIH until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds V IL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as V IHD. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. Note A: VOHV and VOLP are measured with respect to ground reference. Note B: Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns, tf = 3 ns, skew < 150 ps. FIGURE 2. Quiet Output Noise Voltage Waveforms FIGURE 3. Simultaneous Switching Test Circuit www.fairchildsemi.com 6 74ACTQ652 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M24B 7 www.fairchildsemi.com 74ACTQ652 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 24-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Package Number MTC24 www.fairchildsemi.com 8 74ACTQ652 Quiet Series Transceiver/Register Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N24C Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 9 www.fairchildsemi.com