® OPA27 OPA37 OPA 27 OPA 27 Ultra-Low Noise Precision OPERATIONAL AMPLIFIERS FEATURES APPLICATIONS ● LOW NOISE: 4.5nV/√Hz max at 1kHz ● PRECISION INSTRUMENTATION ● LOW OFFSET: 100µV max ● LOW DRIFT: 0.4µV/°C ● DATA ACQUISITION ● TEST EQUIPMENT ● HIGH OPEN-LOOP GAIN: 117dB min ● HIGH COMMON-MODE REJECTION: 100dB min ● PROFESSIONAL AUDIO EQUIPMENT ● TRANSDUCER AMPLIFIER ● RADIATION HARD EQUIPMENT ● HIGH POWER SUPPLY REJECTION: 94dB min ● FITS OP-07, OP-05, AD510, AD517 SOCKETS 7 +VCC DESCRIPTION The OPA27/37 is an ultra-low noise, high precision monolithic operational amplifier. Laser-trimmed thin-film resistors provide excellent long-term voltage offset stability and allow superior voltage offset compared to common zener-zap techniques. 8 Trim 1 Trim 6 A unique bias current cancellation circuit allows bias and offset current specifications to be met over the full –55°C to +125°C temperature range. The OPA27 is internally compensated for unity-gain stability. The decompensated OPA37 requires a closedloop gain ≥ 5. Output 2 –In 3 +In The Burr-Brown OPA27/37 is an improved replacement for the industry-standard OP-27/OP-37. 4 –VCC International Airport Industrial Park • Mailing Address: PO Box 11400, Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd., Tucson, AZ 85706 • Tel: (520) 746-1111 • Twx: 910-952-1111 Internet: http://www.burr-brown.com/ • FAXLine: (800) 548-6133 (US/Canada Only) • Cable: BBRCORP • Telex: 066-6491 • FAX: (520) 889-1510 • Immediate Product Info: (800) 548-6132 ® © 1984 Burr-Brown Corporation SBOS135 PDS-466M 1 OPA27, 37 Printed in U.S.A. March, 1998 SPECIFICATIONS At VCC = ±15V and TA = +25°C, unless otherwise noted. OPA27/37G PARAMETER CONDITIONS MIN TYP MAX UNITS 3.8 3.3 3.2 0.09 1.7 1.0 0.4 8.0 5.6 4.5 0.25 0.6 nV/√Hz nV/√Hz nV/√Hz µVp-p pA/√Hz pA/√Hz pA/√Hz ±25 ±0.4 0.4 ±100 ±1.8 (6) 2.0 µV µV/°C µV/mo 120 ±1 ±20 dB µV/V BIAS CURRENT Input Bias Current ±15 ±80 nA OFFSET CURRENT Input Offset Current 10 75 nA INPUT NOISE (6) Voltage, fO = 10Hz fO = 30Hz fO = 1kHz fB = 0.1Hz to 10Hz Current,(1) fO = 10Hz fO = 30Hz fO = 1kHz VOLTAGE (2) OFFSET Input Offset Voltage Average Drift (3) Long Term Stability (4) TA MIN to TA MAX ±VCC = 4 to 18V ±VCC = 4 to 18V Supply Rejection 94 IMPEDANCE Common-Mode VOLTAGE RANGE Common-Mode Input Range Common-Mode Rejection OPEN-LOOP VOLTAGE GAIN, DC FREQUENCY RESPONSE Gain-Bandwidth Product (5) Slew Rate (5) Settling Time, 0.01% RATED OUTPUT Voltage Output Output Resistance Short Circuit Current POWER SUPPLY Rated Voltage Voltage Range, Derated Performance Current, Quiescent 2 || 2.5 GΩ || pF ±11 100 ±12.3 122 V dB RL ≥ 2kΩ RL ≥ 1kΩ 117 124 124 dB dB OPA27 OPA37 VO = ±10V, RL = 2kΩ OPA27, G = +1 OPA37, G = +5 OPA27, G = +1 OPA37, G = +5 5 (6) 45 (6) 8 63 MHz MHz 1.7 (6) 11(6) 1.9 11.9 25 25 V/µs V/µs µs µs ±12 ±10 ±13.8 ±12.8 70 25 V V Ω mA VIN = ±11VDC RL ≥ 2kΩ RL ≥ 600Ω DC, Open Loop RL = 0Ω 60(6) ±15 ±4 IO = 0mADC 3.3 TEMPERATURE RANGE Specification Operating –40 –40 VDC ±22 5.7 VDC mA +85 +85 °C °C NOTES: (1) Measured with industry-standard noise test circuit (Figures 1 and 2). Due to errors introduced by this method, these current noise specifications should be used for comparison purposes only. (2) Offset voltage specification are measured with automatic test equipment after approximately 0.5 seconds from power turnon. (3) Unnulled or nulled with 8kΩ to 20kΩ potentiometer. (4) Long-term voltage offset vs time trend line does not include warm-up drift. (5) Typical specification only on plastic package units. Slew rate varies on all units due to differing test methods. Minimum specification applies to open-loop test. (6) This parameter guaranteed by design. ® OPA27, 37 2 SPECIFICATIONS At VCC = ±15V and TA = +25°C, unless otherwise noted. OPA27/37G PARAMETER INPUT VOLTAGE (1) Input Offset Voltage Average Drift (2) Supply Rejection CONDITIONS MIN TA MIN to TA MAX ±VCC = 4.5 to 18V ±VCC = 4.5 to 18V 90 (3) TYP MAX UNITS ±48 ±0.4 ±220(3) ±1.8 (3) µV µV/°C 122 dB BIAS CURRENT Input Bias Current ±21 ±150 (3) nA OFFSET CURRENT Input Offset Current E, F, G 20 135 (3) nA VOLTAGE RANGE Common-Mode Input Range Common-Mode Rejection OPEN-LOOP GAIN, DC Open-Loop Voltage Gain RATED OUTPUT Voltage Output Short Circuit Current VIN = ±11VDC ±10.5 (3) 96 (3) ±11.8 122 V dB RL ≥ 2kΩ 113 (3) 120 dB RL = 2kΩ VO = 0VDC ±11.0 (3) ±13.4 25 V mA TEMPERATURE RANGE Specification –40 °C +85 NOTES: (1) Offset voltage specification are measured with automatic test equipment after approximately 0.5s from power turn-on. (2) Unnulled or nulled with 8kΩ to 20kΩ potentiometer. (3) This parameter guaranteed by design. ABSOLUTE MAXIMUM RATINGS Supply Voltage ................................................................................... ±22V Internal Power Dissipation (1) ........................................................ 500mW Input Voltage ...................................................................................... ±VCC Output Short-Circuit Duration (2) ................................................. Indefinite Differential Input Voltage (3) ............................................................. ±0.7V Differential Input Current (3) ........................................................... ±25mA Storage Temperature Range .......................................... –55°C to +125°C Operating Temperature Range ......................................... –40°C to +85°C Lead Temperature: P (soldering, 10s) ....................................................................... +300°C U (soldering, 3s) ......................................................................... +260°C PACKAGE TYPE θJA UNITS 8-Pin Plastic DIP (P) 8-Pin SOIC (U) 100 160 °C/W °C/W NOTES: (1) Maximum package power dissipation vs ambient temperature. (2) To common with ±VCC = 15V. (3) The inputs are protected by back-to-back diodes. Current limiting resistors are not used in order to achieve low noise. If differential input voltage exceeds ±0.7V, the input current should be limited to 25mA. ELECTROSTATIC DISCHARGE SENSITIVITY This integrated circuit can be damaged by ESD. Burr-Brown recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. The information provided herein is believed to be reliable; however, BURR-BROWN assumes no responsibility for inaccuracies or omissions. BURR-BROWN assumes no responsibility for the use of this information, and all use of such information shall be entirely at the user’s own risk. Prices and specifications are subject to change without notice. No patent rights or licenses to any of the circuits described herein are implied or granted to any third party. BURR-BROWN does not authorize or warrant any BURR-BROWN product for use in life support devices and/or systems. ® 3 OPA27, 37 CONNECTION DIAGRAMS PACKAGE/ORDERING INFORMATION Top View P, U Packages Offset Trim 1 8 Offset Trim –In 2 7 +VCC +In 3 6 Output –VCC 4 5 NC PRODUCT(1) PACKAGE TEMPERATURE RANGE (°C) OPA27GP OPA27GU(2) Plastic SOIC –40 to +85 –40 to +85 OFFSET VOLTAGE MAX (µV), 25°C PACKAGE DRAWING NUMBER(3) ±100 ±100 006 182 NOTE: (1) Packages for OPA37 are same as for OPA27. (2) OPA27GU may be marked OPA27U. Likewise, OPA37GU may be marked OPA37U. (3) For detailed drawing and dimension table, please see end of data sheet, or Appendix C of Burr-Brown IC Data Book. 0.1µF 100kΩ 10Ω 2kΩ DUT 4.3kΩ 4.7µF Voltage Gain Total = 50,000 2.2µF 100kΩ 0.1µF 24.3kΩ NOTE: All capacitor values are for nonpolarized capacitors only. FIGURE 1. 0.1Hz to 10Hz Noise Test Circuit. 0.1Hz TO 10Hz NOISE 1s/div 40nV/div FIGURE 2. Low Frequency Noise. ® OPA27, 37 22µF OPA111 4 Scope x1 RIN = 1MΩ 110kΩ TYPICAL PERFORMANCE CURVES At TA = +25°C, ±VCC = ±15VDC, unless otherwise noted. INPUT OFFSET VOLTAGE CHANGE DUE TO THERMAL SHOCK INPUT OFFSET VOLTAGE WARM-UP DRIFT +20 Offset Voltage Change (µV) Offset Voltage Change (µV) +10 +5 G 0 –5 +10 +25°C 0 TA = +25°C to TA = +70°C Fluid Bath +70°C –10 TO-99 –10 –20 0 1 2 3 4 5 6 –1 +1 +2 +3 +4 +5 Time From Thermal Shock (min) INPUT VOLTAGE NOISE vs NOISE BANDWIDTH (0.1Hz to Indicated Frequency) TOTAL INPUT VOLTAGE NOISE SPECTRAL DENSITY vs SOURCE RESISTANCE 100 80 60 Voltage Noise (nV/√Hz) 10 Voltage Noise (µVrms) 0 Time From Power Turn-On (min) 1 0.1 RS = 0 Ω R1 - 40 + 20 10 8 6 4 R1 RSOURCE = 2 x R 1 10Hz 0.01 Resistor Noise Only 1kHz 2 1 100 1k 10k 100k 100 1k 10k Noise Bandwidth (Hz) Source Resistance (Ω) VOLTAGE NOISE SPECTRAL DENSITY vs SUPPLY VOLTAGE VOLTAGE NOISE SPECTRAL DENSITY vs TEMPERATURE 5 5 3 Voltage Noise (nV/√Hz) Voltage Noise (nV/√Hz) 10Hz 10Hz 4 1kHz 2 1 4 1kHz 3 2 1 0 ±5 ±10 ±15 –75 ±20 –50 –25 0 +25 +50 +75 +100 +125 Ambient Temperature (°C) Supply Voltage (VCC ) ® 5 OPA27, 37 TYPICAL PERFORMANCE CURVES (CONT) At TA = +25°C, ±VCC = ±15VDC, unless otherwise noted. INPUT VOLTAGE NOISE SPECTRAL DENSITY 10 Current Noise Test Circuit 100kΩ 500kΩ 10kΩ en DUT 2 Voltage Noise (nV/√Hz) o 500kΩ 1 0.8 0.6 0.4 In = √(e n )2 – (130nV)2 o 1M Ω x 100 Warning: This industry-standard equation is inaccurate and these figures should be used for comparison purposes only! 0.2 8 6 4 2 0 0.1 100 1k 1 10k 10 OPEN-LOOP FREQUENCY RESPONSE 1k BIAS AND OFFSET CURRENT vs TEMPERATURE 20 140 Absolute Bias Current (nA) 120 Voltage Gain (dB) 100 Frequency (Hz) Frequency (Hz) 100 OPA37 80 OPA27 60 40 20 Bias 15 15 Offset 10 10 5 5 20 0 0 10 100 1k 10k 100k 1M 10M –75 100M –25 0 +25 +50 +75 0 +125 +100 Frequency (Hz) Ambient Temperature (°C) OPA27 CLOSED-LOOP VOLTAGE GAIN AND PHASE SHIFT vs FREQUENCY (G = 100) OPA37 CLOSED-LOOP VOLTAGE GAIN AND PHASE SHIFT vs FREQUENCY (G = 100) 50 50 0 ∅ –90 20 Gain 10 –135 0 –180 –10 –225 –20 Voltage Gain (dB) –45 30 0 40 Phase Shift (degrees) 40 Voltage Gain (dB) –50 Absolute Offset Current (nA) 10 –45 30 Ø –90 20 G=5 10 Gain –135 0 –180 –10 –225 –20 10 100 1k 10k 100k 1M 10M 100M 10 Frequency (Hz) 1k 10k 100k Frequency (Hz) ® OPA27, 37 100 6 1M 10M 100M Phase Shift (degrees) Current Noise (pA/√Hz) INPUT CURRENT NOISE SPECTRAL DENSITY 10 8 6 4 TYPICAL PERFORMANCE CURVES (CONT) At TA = +25°C, ±VCC = ±15VDC, unless otherwise noted. POWER SUPPLY REJECTION vs FREQUENCY 140 120 120 Power Supply Rejection (dB) Common-Mode Rejection (dB) COMMON-MODE REJECTION vs FREQUENCY 140 100 80 OPA37 60 OPA27 40 20 0 OPA27 100 –VCC 80 +VCC 60 40 20 0 1 10 100 1k 10k 100k 1M 10M 1 10 100 Frequency (Hz) 1k 10k 100k 1M 10M Frequency (Hz) OPEN-LOOP VOLTAGE GAIN vs TEMPERATURE OPEN-LOOP VOLTAGE GAIN vs SUPPLY VOLTAGE 130 135 Voltage Gain (dB) 125 R L = 600 Ω 120 130 RL = 2kΩ 125 120 115 115 ±5 ±10 ±15 ±20 –75 ±25 –50 –25 0 +25 +50 +75 +100 Supply Voltage (VCC ) Ambient Temperature (°C) SUPPLY CURRENT vs SUPPLY VOLTAGE COMMON-MODE INPUT VOLTAGE RANGE vs SUPPLY VOLTAGE 6 +15 5 +10 Common-Mode Range (V) Supply Current (mA) Voltage Gain (dB) R L = 2k Ω +125°C 4 +25°C 3 –55°C 2 1 0 +125 T A = –55°C T A = +25°C +5 TA = +125°C 0 TA = –55°C TA = +25°C –5 TA = +125°C –10 –15 0 ±5 ±10 ±15 ±20 0 Supply Voltage (VCC ) ±5 ±10 ±15 ±20 Supply Voltage (VCC ) ® 7 OPA27, 37 TYPICAL PERFORMANCE CURVES (CONT) At TA = +25°C, ±VCC = ±15VDC, unless otherwise noted. OPA37 SMALL SIGNAL TRANSIENT RESPONSE +60 +40 +40 Output Voltage (mV) Output Voltage (mV) OPA27 SMALL SIGNAL TRANSIENT RESPONSE +60 +20 0 –20 A VCL = +1 C L = 15pF –40 +20 0 –20 A V = +5 C L = 25pF –40 –60 –60 0 0.5 1 1.5 2 0 2.5 0.2 0.4 OPA27 LARGE SIGNAL TRANSIENT RESPONSE 0.8 1.0 1.2 OPA37 LARGE SIGNAL TRANSIENT RESPONSE +6 +15 +4 +10 Output Voltage (V) Output Voltage (V) 0.6 Time (µs) Time (µs) +2 0 –2 A VCL = +1 –4 +5 0 –5 A V = +5 –10 –6 –15 0 2 4 6 8 10 0 12 Time (µs) 1 2 3 4 5 6 Time (µs) APPLICATIONS INFORMATION OFFSET VOLTAGE ADJUSTMENT THERMOELECTRIC POTENTIALS The OPA27/37 is laser-trimmed to microvolt-level input offset voltage and for very low input offset voltage drift. The OPA27/37 offset voltage is laser-trimmed and will require no further trim for most applications. Offset voltage drift will not be degraded when the input offset is nulled with a 10kΩ trim potentiometer. Other potentiometer values from 1kΩ to 1MΩ can be used but VOS drift will be degraded by an additional 0.1 to 0.2µV/°C. Nulling large system offsets by use of the offset trim adjust will degrade drift performance by approximately 3.3µV/°C per millivolt of offset. Large system offsets can be nulled without drift degradation by input summing. Careful layout and circuit design techniques are necessary to prevent offset and drift errors from external thermoelectric potentials. Dissimilar metal junctions can generate small EMFs if care is not taken to eliminate either their sources (lead-to-PC, wiring, etc.) or their temperature difference. See Figure 11. Short, direct mounting of the OPA27/37 with close spacing of the input pins is highly recommended. Poor layout can result in circuit drifts and offsets which are an order of magnitude greater than the operational amplifier alone. The conventional offset voltage trim circuit is shown in Figure 3. For trimming very small offsets, the higher resolution circuit shown in Figure 4 is recommended. The OPA27/37 can replace 741-type operational amplifiers by removing or modifying the trim circuit. ® OPA27, 37 8 COMPENSATION Although internally compensated for unity-gain stability, the OPA27 may require a small capacitor in parallel with a feedback resistor (RF) which is greater than 2kΩ. This capacitor will compensate the pole generated by RF and CIN and eliminate peaking or oscillation. NOISE: BIPOLAR VERSUS FET Low-noise circuit design requires careful analysis of all noise sources. External noise sources can dominate in many cases, so consider the effect of source resistance on overall operational amplifier noise performance. At low source impedances, the lower voltage noise of a bipolar operational amplifier is superior, but at higher impedances the high current noise of a bipolar amplifier becomes a serious liability. Above about 15kΩ the Burr-Brown OPA111 low-noise FET operational amplifier is recommended for lower total noise than the OPA27 (see Figure 5). INPUT PROTECTION Back-to-back diodes are used for input protection on the OPA27/37. Exceeding a few hundred millivolts differential input signal will cause current to flow and without external current limiting resistors the input will be destroyed. +VCC (1) Accidental static discharge as well as high current can damage the amplifier’s input circuit. Although the unit may still be functional, important parameters such as input offset voltage, drift, and noise may be permanently damaged as will any precision operational amplifier subjected to this abuse. NOTE: (1) 10kΩ to 1MΩ Trim Potentiometer (10kΩ Recommended). 7 8 2 1 Transient conditions can cause feedthrough due to the amplifier’s finite slew rate. When using the OP-27 as a unitygain buffer (follower) a feedback resistor of 1kΩ is recommended (see Figure 6). 6 OPA27/37 3 4 ±4mV Typical Trim Range –VCC RF ≈ 1kΩ FIGURE 3. Offset Voltage Trim. +VCC – (1) NOTE: (1) 1kΩ Trim Potentiometer. 4.7kΩ 7 Input OPA27 + Output 1.9V/µs 4.7kΩ 8 2 1 OPA27/37 FIGURE 6. Pulsed Operation. 6 3 4 G ≈ 40dB at 1kHz. Metal film resistors. Film capacitors. RL and CL per cartridge manufacturer’s recommendations. 100Ω ±280µV Typical Trim Range –VCC FIGURE 4. High Resolution Offset Voltage Trim. Voltage Noise Spectral Density, EO Typical at 1kHz (nV/√Hz) 1k 0.01µF 2 3 OPA111 + Resistor Moving Magnet Cartridge RS OPA111 + Resistor OPA37 6 1µF Output 20kΩ RL CL Resistor Noise Only FIGURE 7. Low-Noise RIAA Preamplifier. 10 Resistor Noise Only 1 100 0.03µF 97.6kΩ OPA27 + Resistor EO 100 7.87kΩ 1kΩ OPA27 + Resistor 1k 10k 100k 1M 1kΩ 10M Input 2 Source Resistance, RS (Ω) 3 EO = √en2 + (inRS)2 + 4kTRS OPA27 6 Output FO = 1kHz FIGURE 8. Unity-Gain Inverting Amplifier. FIGURE 5. Voltage Noise Spectral Density Versus Source Resistance. ® 9 OPA27, 37 G ≈ 50dB at 1kHz. Metal film resistors. Film capacitors. RL and CL per head manufacturer’s recommendations. 1kΩ 1kΩ 2 Input 250Ω 3 100Ω 6 OPA37 4.99kΩ 316kΩ 2 Output 3 500pF RL 0.01µF OPA37 6 1µF 20kΩ CL Magnetic Tape Head FIGURE 10. NAB Tape Head Preamplifier. FIGURE 9. High Slew Rate Unity-Gain Inverting Amplifier. Total Gain = 10 6 10kΩ 10Ω G =1k DUT Offset 10Hz LowPass Filter Chart Recorder 10mV/mm 5mm/s A. 741 noise with circuit well-shielded from air currents and RFI. (Note scale change.) 5µV B. OP-07AH with circuit well-shielded from air currents and RFI. 0.5µV C. OPA27AJ with circuit well-shielded from air currents and RFI. (Represents ultimate OPA27 performance potential.) 0.5µV D. OPA27 with circuit unshielded and exposed to normal lab bench-top air currents. (External thermoelectric potentials far exceed OPA27 noise.) 0.5µV E. OPA27 with heat sink and shield which protects input leads from air currents. Conditions same as (D). 0.5µV FIGURE 11. Low Frequency Noise Comparison. ® OPA27, 37 10 Output 3 –In Gain = 100 6 OPA37 2 For gain = 1000 use INA106 differential amplifier. Bandwidth ≈ 500kHz Burr-Brown INA105 Differential Amplifier RF 5kΩ RG 101Ω 2 25kΩ 5 Input Stage Gain = 1 + 2RF /RG RF 5kΩ 3 2 25kΩ 6 Output 25kΩ 6 OPA37 3 +In 25kΩ 1 FIGURE 12. Low Noise Instrumentation Amplifier. 1kΩ 0.1µF 200Ω 2 500pF 3 0.1µF 6 OPA37 100Ω Output 100kΩ 2 2kΩ 1MΩ 3 EDO 6166 Transducer Frequency Response ≈ 1kHz to 50kHz Dexter 1M Thermopile Detector FIGURE 13. Hydrophone Preamplifier. OPA27 6 Output NOTE: Use metal film resistors and plastic film capacitor. Circuit must be well shielded to achieve low noise. Responsivity ≈ 2.5 x 104V/W Output Noise ≈ 30µVrms, 0.1Hz to 10Hz 20pF FIGURE 14. Long-Wavelength Infrared Detector Amplifier. TTL INPUT GAIN “1” “0” +1 –1 9.76kΩ 500Ω 10kΩ Input D1 D2 2 4.99kΩ S1 S2 3 6 OPA27 Output 8 1 4.75kΩ TTL In Balance Trim 4.75kΩ 1kΩ DG188 Offset Trim +VCC FIGURE 15. High Performance Synchronous Demodulator. ® 11 OPA27, 37 Gain = –1010V/V Full Power Bandwidth ≈ 180kHz Gain Bandwidth ≈ 500MHz Equivalent Noise Resistance ≈ 50Ω Input 20Ω 2kΩ Signal-to-Noise Ratio ∝ √N since amplifier noise is uncorrelated. 2 3 20Ω 6 2kΩ 6 2kΩ OPA37 2kΩ 2 3 20Ω OPA37 2kΩ 2kΩ 2 2 2kΩ 6 3 20Ω OPA37 2 20Ω 6 2kΩ 6 2kΩ OPA37 2kΩ 2 3 OPA37 N = 10 Each OPA37EZ FIGURE 16. Ultra-Low Noise “N” Stage Parallel Amplifier. ® OPA27, 37 OPA37 Output 2kΩ 3 6 3 12 5V 5V +10V Output Output +10V 0V 0V –10V –10V 5µs RS = 50Ω 5µs 1kΩ RS = 50Ω 1kΩ 2 2 Input 3 6 OPA27 3 250Ω Output OPA37 6 Output 500pF Input FIGURE 18. High Slew Rate Unity-Gain Buffer. FIGURE 17. Unity-Gain Buffer. +15V 200Ω 10µF/20V 20kΩ 100Ω 10kΩ + VIRTEC V1000 50Ω Planar Tunnel Input 0.01µF Diode RFC 1 2 3 200Ω OPA37 6 2 Video Output 100µF/20V Tantalum 2 3 OPA27 + 10kΩ 500pF Siemens LHI 948 FIGURE 19. RF Detector and Video Amplifier. 6 Output 10kΩ 3 FIGURE 20. Balanced Pyroelectric Infrared Detector. 4.8V + 1kΩ Airpax Magnetic Pickup 2 3 OPA27 6 0 Output – fOUT ∝ RPM X N Where N = Number of Gear Teeth FIGURE 21. Magnetic Tachometer. ® 13 OPA27, 37 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. Customers are responsible for their applications using TI components. In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof. Copyright 2000, Texas Instruments Incorporated