AD MAT03FH

a
FEATURES
Dual Matched PNP Transistor
Low Offset Voltage: 100 mV max
Low Noise: 1 nV/√Hz @ 1 kHz max
High Gain: 100 min
High Gain Bandwidth: 190 MHz typ
Tight Gain Matching: 3% max
Excellent Logarithmic Conformance: rBE . 0.3 V typ
Available in Die Form
GENERAL DESCRIPTION
The MAT03 dual monolithic PNP transistor offers excellent
parametric matching and high frequency performance. Low
noise characteristics (1 nV/√Hz max @ 1 kHz), high bandwidth
(190 MHz typical), and low offset voltage (100 µV max), makes
the MAT03 an excellent choice for demanding preamplifier applications. Tight current gain matching (3% max mismatch) and
high current gain (100 min), over a wide range of collector current, makes the MAT03 an excellent choice for current mirrors.
A low value of bulk resistance (typically 0.3 Ω) also makes the
MAT03 an ideal component for applications requiring accurate
logarithmic conformance.
Low Noise, Matched
Dual PNP Transistor
MAT03
PIN CONNECTION
TO-78
(H Suffix)
Each transistor is individually tested to data sheet specifications.
Device performance is guaranteed at 25°C and over the extended
industrial and military temperature ranges. To insure the longterm stability of the matching parameters, internal protection
diodes across the base-emitter junction clamp any reverse baseemitter junction potential. This prevents a base-emitter breakdown condition which can result in degradation of gain and
matching performance due to excessive breakdown current.
REV. B
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617/329-4700
Fax: 617/326-8703
MAT03–SPECIFICATIONS
ELECTRICAL CHARACTERISTICS
Parameter
Current Gain
1
MAT03A
MAT03E
Min Typ Max Min Typ Max
Symbol
Conditions
hFE
VCB = 0 V, –36 V
100
IC = 1 mA
90
IC = 100 µA
80
IC = 10 µA
IC = 100 µA,VCB = 0 V
VCB = 0 V, IC = 100 µA
IC = 100 µA
VCB1 = 0 V
VCB2 = –36 V
VCB = 0 V
IC1 = 10 µA, IC2 = 1 mA
VCB = 0 V
10 µA ≤ IC ≤ 1 mA
IC = 100 µA, VCB = 0 V
Current Gain Matching 2
Offset Voltage3
Offset Voltage Change
vs. Collector Voltage
DhFE
VOS
DVOS/DVCB
Offset Voltage Change
vs. Collector Current
Bulk Resistance
DVOS/DIC
Offset Current
Collector-Base
Leakage Current
Noise Voltage Density 4
IOS
Collector Saturation
Voltage
(@ TA = +258C, unless otherwise noted.)
rBE
ICB0
eN
VCE(SAT)
165
150
120
0.5
40
100
90
80
3
100
165
150
120
0.5
40
11
11
12
12
0.3
0.3
6
150
150
50
50
0.75
0.75
35
VCB = –36 V = VMAX
IC = 1 mA, VCB = 0
fO = 10 Hz
fO = 100 Hz
fO = 1 kHz
fO = 10 kHz
50
0.8
0.7
0.7
0.7
IC = 1 mA, IB = 100 µA
0.025 0.1
MAT03F
Min Typ Max
80
70
60
Units
3
100
165
150
120
0.5
40
6
200
%
µV
11
11
12
12
0.3
0.3
6
150
150
50
50
0.75
0.75
35
11
11
12
12
0.3
0.3
6
200
200
75
75
0.75
0.75
45
µV
µV
µV
µV
Ω
Ω
nA
200
50
200
50
400
pA
2
1
1
1
0.8
0.7
0.7
0.7
0.8
0.7
0.7
0.7
nV/÷ Hz
nV/÷ Hz
nV/÷ Hz
nV/÷ Hz
0.025 0.1
0.025 0.1
V
ELECTRICAL CHARACTERISTICS (at –558C ≤ T ≤ +1258C, unless otherwise noted.)
A
Parameter
Symbol
Conditions
Current Gain
hFE
VCB = 0 V, –36 V
IC = 1 mA
IC = 100 µA
IC = 10 µA
IC = 100 µA, VCB = 0 V
IC = 100 µA, VCB = 0 V
IC = 100 µA, VCB = 0 V
Offset Voltage
Offset Voltage Drift5
Offset Current
Breakdown Voltage
VOS
TCVOS
IOS
BVCEO
Min
70
60
50
36
MAT03A
Typ
110
100
85
40
0.3
15
54
Max
Units
150
0.5
85
µV
µV/°C
nA
V
ELECTRICAL CHARACTERISTICS (at –408C ≤ T ≤ +858C, unless otherwise noted.)
A
Parameter
Symbol
Conditions
Current Gain
hFE
VCB = 0 V, –36 V
IC = 1 mA
IC = 100 µA
IC = 10 µA
IC = 100 µA, VCB = 0 V
IC = 100 µA, VCB = 0 V
IC = 100 µA, VCB = 0 V
Offset Voltage
Offset Voltage Drift5
Offset Current
Breakdown Voltage
VOS
TCVOS
IOS
BVCEO
MAT03E
Min Typ Max
MAT03F
Min Typ Max
70
60
50
60
50
40
120
105
90
30 135
0.3 0.5
10 85
36
120
105
90
30 265
0.3 1.0
10 200
36
Units
µV
µV/°C
nA
V
NOTES
1
Current gain is measured at collector-base voltages (V CB) swept from 0 to V MAX at indicated collector current. Typicals are measured at V CB = 0 V.
2Current
gain matching (∆hFE) is defined as: ∆hFE =
100 ( ∆I B ) hFE (min )
IC
.
3Offset
voltage is defined as: V OS = VBE1 – VBE2, where VOS is the differential voltage for I C1 = IC2: VOS = VBE1 – VBE2 =
4
Sample tested. Noise tested and specified as equivalent input voltage for each transistor.
5
Guaranteed by V OS test (TCVOS = VOS/T for VOS ! VBE) where T = 298°K for TA = 25°C.
Specifications subject to change without notice.
–2–
KT
q In
 I C1 
I .
 C2 
REV. B
MAT03
WAFER TEST LIMITS (at 258C, unless otherwise noted.)
Parameter
Symbol
Breakdown Voltage
Offset Voltage
BVCEO
VOS
Current Gain
hFE
Current Gain Match
Offset Voltage Change vs. VCB
∆hFE
∆VOS/∆VCB
Offset Voltage Change
vs. Collector Current
Bulk Resistance
Collector Saturation Voltage
∆VOS/∆IC
rBE
VCE (SAT)
Conditions
MAT03N
Limits
Units
IC = 100 µA, VCB = 0 V
10 µA ≤ IC ≤ 1 mA
IC = 1 mA, VCB = 0 V, –36 V
IC = 10 µA, VCB = 0 V, –36 V
IC = 100 µA, VCB = 0 V
VCB1 = 0 V, IC = 100 µA
VCB2 = –36 V
VCB = 0
IC1 = 10 µA, IC2 = 1 mA
10 µA ≤ IC ≤ 1 mA
IC = 1 mA, IB = 100 µA
36
200
200
80
60
6
200
200
75
75
0.75
0.1
V min
µV max
µV max
min
min
% max
µV max
µV max
µV max
µV max
Ω max
V max
NOTE:
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
DICE CHARACTERISTICS
ABSOLUTE MAXIMUM RATINGS 1
1. COLLECTOR (1 )
2. BASE (1 )
3. EMITTER (1 )
4. COLLECTOR (2)
5. BASE (2)
6. EMITTER (2 )
SUBSTRATE CAN BE
CONNECTED TO V– OR
FLOATED
ORDERING GUIDE1
Model
VOS max
Temperature
(TA = +258C) Range
MAT03AH2 100 µV
MAT03EH 100 µV
MAT03FH 200 µV
–55°C to +125°C
–40°C to +85°C
–40°C to +85°C
Package
Option
TO-78
TO-78
TO-78
Collector-Base Voltage (BVCBO) . . . . . . . . . . . . . . . . . . . . 36 V
Collector-Emitter Voltage (BVCEO) . . . . . . . . . . . . . . . . . . 36 V
Collector-Collector Voltage (BVCC) . . . . . . . . . . . . . . . . . . 36 V
Emitter-Emitter Voltage (BVEE) . . . . . . . . . . . . . . . . . . . . . 36 V
Collector Current (IC) . . . . . . . . . . . . . . . . . . . . . . . . . . 20 mA
Emitter Current (IE) . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 mA
Total Power Dissipation
Ambient Temperature ≤ 70°C2 . . . . . . . . . . . . . . . . 500 mW
Operating Temperature Range
MAT03A . . . . . . . . . . . . . . . . . . . . . . . . . . –55°C to +125°C
MAT03E/F . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C
Operating Junction Temperature . . . . . . . . . . –55°C to +150°C
Storage Temperature . . . . . . . . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 60 sec) . . . . . . . . . . . . . +300°C
Junction Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C
NOTES
1
Absolute maximum ratings apply to both DICE and packaged devices.
2
Rating applies to TO-78 not using a heat sink, and LCC; devices in free air only. For
TO-78, derate linearly at 6.3 mW/°C above 70°C ambient temperature; for LCC,
derate at 7.8 mW/°C.
NOTES
1
Burn-in is available on industrial temperature range parts.
2
For devices processed in total compliance to MIL-STD-883, add/883 after part
number. Consult factory for 883 data sheet.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the MAT03 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
REV. B
–3–
WARNING!
ESD SENSITIVE DEVICE
MAT03
Figure 1. Current Gain vs.
Collector Current
Figure 4. Base-Emitter Voltage
vs. Collector Current
Figure 2. Current Gain
vs. Temperature
Figure 5. Small-Signal Input Resistance
(hie) vs. Collector Current
–4–
Figure 3. Gain Bandwidth vs.
Collector Current
Figure 6. Small Signal Output Conductance (hoe) vs. Collector Current
REV. B
MAT03
Figure 7. Saturation Voltage
vs. Collector Current
Figure 8. Noise Voltage Density
vs. Frequency
Figure 10. Total Noise vs. Collector Current
REV. B
Figure 9. Noise Voltage Density
Figure 11. Collector-Base Capacitance vs. VCB
–5–
MAT03
Figure 12. SPICE or SABER Model
APPLICATIONS INFORMATION
MAT03 NOISE MEASUREMENT
MAT03 MODELS
All resistive components (Johnson noise, en2 = 4kTBR, or en =
0.13√R nV/√Hz, where R is in kΩ) and semiconductor junctions
(Shot noise, caused by current flowing through a junction, produces voltage noise in series impedances such as transistorcollector load resistors, In = 0.566 √I pA/√Hz where I is in µA)
contribute to the system input noise.
The MAT03 model (Figure 12) includes parasitic diodes D3
through D6. D1 and D2 are internal protection diodes which
prevent zenering of the base-emitter junctions.
The analysis programs, SPICE and SABER, are primarily used
in evaluating the functional performance of systems. The models are provided only as an aid in utilizing these simulation
programs.
Figure 13 illustrates a technique for measuring the equivalent
input noise voltage of the MAT03. 1 mA of stage current is used
Figure 13. MAT03 Voltage Noise Measurement Circuit
–6–
REV. B
MAT03
to bias each side of the differential pair. The 5 kΩ collector resistors noise contribution is insignificant compared to the voltage noise of the MAT03. Since noise in the signal path is
referred back to the input, this voltage noise is attenuated by the
gain of the circuit. Consequently, the noise contribution of the
collector load resistors is only 0.048 nV/√Hz. This is considerably less than the typical 0.8 nV/√Hz input noise voltage of the
MAT03 transistor.
The noise contribution of the OP27 gain stages is also negligible
due to the gain in the signal path. The op amp stages amplify
the input referred noise of the transistors to increase the signal
strength to allow the noise spectral density (ein × 10000) to be
measured with a spectrum analyzer. And, since we assume
equal noise contributions from each transistor in the MAT03,
the output is divided by √2 to determine a single transistor’s
input noise.
Air currents cause small temperature changes that can appear
as low frequency noise. To eliminate this noise source, the
measurement circuit must be thermally isolated. Effects of extraneous noise sources must also be eliminated by totally shielding
the circuit.
SUPER LOW NOISE AMPLIFIER
The circuit in Figure 14a is a super low noise amplifier with
equivalent input voltage noise of 0.32 nV/√Hz. By paralleling
three MAT03 matched pairs, a further reduction of amplifier
noise is attained by a reduction of the base spreading resistance
by a factor of 3, and consequently the noise by √3. Additionally,
the shot noise contribution is reduced by maintaining a high collector current (2 mA/device) which reduces the dynamic emitter
resistance and decreases voltage noise. The voltage noise is inversely proportional to the square root of the stage current, and
current noise increases proportionally to the square root of the
stage current. Accordingly, this amplifier capitalizes on voltage
noise reduction techniques at the expense of increasing the current noise. However, high current noise is not usually important
when dealing with low impedance sources.
Figure 14a. Super Low Noise Amplifier
REV. B
–7–
MAT03
This amplifier exhibits excellent full power ac performance,
0.08% THD into a 600 Ω load, making it suitable for exacting
audio applications (see Figure 14b).
and the VBE of a silicon transistor is predictable and constant (to
a few percent) over a wide temperature range. The voltage difference, approximately 1 V, is dropped across the 250 Ω resistor
which produces a temperature stabilized emitter current.
CURRENT SOURCES
A fundamental requirement for accurate current mirrors and active load stages is matched transistor components. Due to the
excellent VBE matching (the voltage difference between VBE’s
required to equalize collector current) and gain matching, the
MAT03 can be used to implement a variety of standard current
mirrors that can source current into a load such as an amplifier
stage. The advantages of current loads in amplifiers versus resistors is an increase of voltage gain due to higher impedances,
larger signal range, and in many applications a wider signal
bandwidth.
Figure 16 illustrates a cascode current mirror consisting of two
MAT03 transistor pairs.
The cascode current source has a common base transistor in series with the output which causes an increase in output impedance of the current source since VCE stays relatively constant.
High frequency characteristics are improved due to a reduction
of Miller capacitance. The small-signal output impedance can
be determined by consulting “hOF vs. Collector Current” typical
graph. Typical output impedance levels approach the performance of a perfect current source.
Figure 14b. Super Low Noise Amplifier—Total
Harmonic Distortion
LOW NOISE MICROPHONE PREAMPLIFIER
Figure 15 shows a microphone preamplifier that consists of a
MAT03 and a low noise op amp. The input stage operates at a
relatively high quiescent current of 2 mA per side, which reduces
the MAT03 transistor’s voltage noise. The 1/ƒ corner is less than
1 Hz. Total harmonic distortion is under 0.005% for a 10 V p-p
signal from 20 Hz to 20 kHz. The preamp gain is 100, but can be
modified by varying R5 or R6 (VOUT/VIN = R5/R6 + 1).
Considering a typical collector current of 100 µA, we have:
1
roQ3 = 1.0 µMHOS = 1 MΩ
A total input stage emitter current of 4 mA is provided by Q2.
The constant current in Q2 is set by using the forward voltage of
a GaAsP LED as a reference. The difference between this voltage
Figure 15. Low Noise Microphone Preamplifier
–8–
REV. B
MAT03
Q2 and Q3 are in series and operate at the same current levels so
the total output impedance is:
RO = hFE roQ3 @ (160)(1 MΩ) = 160 MΩ.
Since Q2 buffers Q3, both transistors in the MAT03, Q1 and Q3,
maintain the same collector current. D2 and D3 form a Baker
clamp which prevents Q2 from turning off, thereby improving
the switching speed of the current mirror. The feedback serves
to increase the output impedance and improves accuracy by reducing the base-width modulation which occurs with varying
collector-emitter voltages. Accuracy and linearity performance
of the current pump is summarized in Figure 19.
Figure 16. Cascode Current Source
Figure 17a. Current Matching Circuit
CURRENT MATCHING
The objective of current source or mirror design is generation of
currents that are either matched or must maintain a constant ratio. However, mismatch of base-emitter voltages cause output
current errors. Consider the example of Figure 17a. If the resistors and transistors are equal and the collector voltages are the
same, the collector currents will match precisely. Investigating
the current-matching errors resulting from a nonzero VOS, we
define ∆IC as the current error between the two transistors.
Graph 17b describes the relationship of current matching errors
versus offset voltage for a specified average current IC. Note that
since the relative error between the currents is exponentially proportional to the offset voltage, tight matching is required to design high accuracy current sources. For example, if the offset
voltage is 5 mV at 100 µA collector current, the current matching error would be 20%. Additionally, temperature effects such
as offset drift (3 µV/°C per mV of VOS) will degrade performance
if Q1 and Q2 are not well matched.
Figure 17b. Current Matching Accuracy %
vs. Offset Voltage
DIGITALLY PROGRAMMABLE BIPOLAR CURRENT
PUMP
The circuit of Figure 18 is a digitally programmable current
pump. The current pump incorporates a DAC08, and a fast
Wilson current source using the MAT03. Examining Figure 18,
the DAC08 is set for 2 mA full-scale range so that bipolar current operation of ± 2 mA is achieved. The Wilson current mirror
maintains linearity within the LSB range of the 8-bit DAC08
(± 2 mA/256 = 15.6 µA resolution) as seen in Figure 19. A
negative feedback path established by Q2 regulates the collector
current so that it matches the reference current programmed by
the DAC08.
Collector-emitter voltages across both Q1 and Q3 are matched
by D1, with Q3’s collector-emitter voltage remaining constant,
independent of the voltage across the current source output.
Figure 18. Digitally Programmable Bipolar Current Pump
REV. B
–9–
MAT03
The full-scale output of the DAC08, IOUT, is a linear function
of IREF
IFR =
256
256
256
× IREF, and IOUT + IOUT = IREF
256
The current mirror output is IOUT – IOUT = 1, so that if
IREF = 2 mA:
I = 2 IOUT – 1.992 mA
 Input Code 
= 2  256  (2 mA) – 1.992 mA.


DIGITAL CURRENT PUMP CODING
Figure 19. Digitally Programmable Current
Pump—INL Error as Digital Code
FULL RANGE
HALF-RANGE
ZERO-SCALE
–10–
Digital Input
B1 . . . B8
Output Current
1111 1111
1000 0000
0000 0000
I = 1.992 mA
I = 0.008 mA
I = –1.992 mA
REV. B
MAT03
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
TO-78 Metal Can
REFERENCE PLANE
0.185 (4.70)
0.165 (4.19)
0.750 (19.05)
0.500 (12.70)
0.250 (6.35) MIN
0.100 (2.54) BSC
0.160 (4.06)
0.110 (2.79)
0.050 (1.27) MAX
0.335 (8.51)
0.305 (7.75)
0.370 (9.40)
0.335 (8.51)
4
5
0.200
(5.08)
BSC
0.045 (1.14)
0.010 (0.25)
0.100
(2.54)
BSC
0.021 (0.53)
0.016 (0.41)
BASE & SEATING PLANE
REV. B
6
0.045 (1.14)
0.027 (0.69)
2
0.019 (0.48)
0.016 (0.41)
0.040 (1.02) MAX
3
–11–
1
0.034 (0.86)
0.027 (0.69)
45° BSC
–12–
PRINTED IN U.S.A.
000000000